CN104090199A - Device for simulating poor power contact phenomenon in use process of electric appliance - Google Patents
Device for simulating poor power contact phenomenon in use process of electric appliance Download PDFInfo
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- CN104090199A CN104090199A CN201410321341.9A CN201410321341A CN104090199A CN 104090199 A CN104090199 A CN 104090199A CN 201410321341 A CN201410321341 A CN 201410321341A CN 104090199 A CN104090199 A CN 104090199A
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- circuit
- relay
- power supply
- described relay
- loose contact
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- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention discloses a device for simulating the phenomenon of poor power supply contact in the use process of an electric appliance, which comprises: the control end of the relay is connected with the single chip microcomputer circuit through the relay drive circuit, the controlled end of the relay is connected with a live wire of a test sample machine, the key circuit and the display circuit are connected with the single chip microcomputer circuit, and the power supply circuit is connected with the single chip microcomputer circuit, the relay drive circuit and the display circuit. The device for simulating the poor contact phenomenon of the power supply in the use process of the electrical appliance provided by the invention realizes the simulation of the poor contact phenomenon of the power supply under the condition of high safety guarantee; moreover, the key circuit can adjust the running time and frequency times, so that power supplies with different peak currents can be obtained, and the high precision of a test result is ensured; in addition, the device has simple structure, low cost and convenient operation.
Description
Technical field
The present invention relates to test unit, particularly relate to the device of power supply loose contact phenomenon in a kind of analog electronics use procedure.
Background technology
Frequently there is the phenomenon of power supply loose contact in the electrical equipment such as air-conditioning, power supply loose contact moment can produce peak point current, very easily causes the controller of electrical equipment to break down, and causes product repair rate high in reality is used (operation) process.This phenomenon of power supply loose contact in use occurring for simulating the electrical equipment such as air-conditioning, and this phenomenon is attached in test, electrical equipment reliabilities of operation in the situation that of power supply loose contact such as checking air-conditioning, to reach the object that improves the electric properties such as air-conditioning, be necessary to carry out the test of power supply loose contact related fields, but at present test in this respect be blank.
Summary of the invention
For above-mentioned prior art present situation, technical matters to be solved by this invention is, provide the device of power supply loose contact phenomenon in a kind of analog electronics use procedure, by this device high security, power supply loose contact phenomenon in analog electronics use procedure accurately.
In order to solve the problems of the technologies described above, the device of power supply loose contact phenomenon in a kind of analog electronics use procedure provided by the present invention, comprise: single chip circuit, relay drive circuit, relay, key circuit, display circuit and power circuit, the control end of described relay is connected with described single chip circuit through described relay drive circuit, the controlled terminal of described relay is connected with the live wire of test prototype, described key circuit is connected with described single chip circuit with described display circuit, described power circuit and described single chip circuit, described relay drive circuit is connected with described display circuit.
Therein in an embodiment, described relay drive circuit comprises that relay drives chip, described relay drives the signal input interface of chip and the signal output interface of described single chip circuit to be connected, and described relay drives the signal output interface of chip and the control end of described relay to be connected.
In an embodiment, described relay drive circuit also comprises diode therein, and described diode is in parallel with the control end of described relay.
In an embodiment, described relay drive circuit also comprises filter capacitor therein, and described filtering circuit is in parallel with the control end of described relay.
In an embodiment, described relay drive circuit also comprises light emitting diode and dropping resistor therein, in parallel with the control end of described relay after described light emitting diode and the series connection of described dropping resistor.
In an embodiment, described relay is more than two therein, and all described relays drive the signal output interface of chip to be connected with described relay respectively.
In an embodiment, the action response time of described relay is 0.01～0.99 second therein.
Therein in an embodiment, the rated current >=30A of described relay.
In an embodiment, in described analog electronics use procedure, the device of power supply loose contact phenomenon also comprises therein:
Communicating circuit, described communicating circuit is connected with described single chip circuit.
In an embodiment, described display circuit comprises display driver circuit and digital display tube therein, and described digital display tube is connected with described single chip circuit through described display driver circuit.
The device of power supply loose contact phenomenon in analog electronics use procedure provided by the invention, by single chip circuit pilot relay, carry out lead to → disconnected → logical switching of moment, that test prototype live wire is synchronously completed is logical → disconnected → logical switching, circuit obtains crest voltage and electric current in the handoff procedure of moment, thereby realized the in the situation that of high safety guarantee analog power loose contact phenomenon; And, by key circuit, can adjust working time, frequency number of times, can obtain the power supply of different peak point currents, guaranteed the high precision of test result; In addition, this apparatus structure is simple, with low cost, easy to operate.
The beneficial effect that additional technical feature of the present invention has will partly describe in this instructions embodiment.
Accompanying drawing explanation
Fig. 1 is the circuit block diagram of the device of power supply loose contact phenomenon in the analog electronics use procedure in one of them embodiment of the present invention;
Fig. 2 is the circuit diagram of the single chip circuit in the embodiment of the present invention;
Fig. 3 is the circuit diagram of the relay drive circuit in the embodiment of the present invention;
Fig. 4 is the circuit diagram of the display circuit in the embodiment of the present invention;
Fig. 5 is the circuit diagram of the key circuit in the embodiment of the present invention;
Fig. 6 is the circuit diagram of the communicating circuit in the embodiment of the present invention;
Fig. 7 is the circuit diagram of the power circuit in the embodiment of the present invention.
Embodiment
Below with reference to accompanying drawing, also the present invention is described in detail in conjunction with the embodiments.It should be noted that, in the situation that not conflicting, the feature in following embodiment and embodiment can combine mutually.
As shown in Figure 1, in analog electronics use procedure in one of them embodiment of the present invention, the device of power supply loose contact phenomenon comprises: single chip circuit 10, relay drive circuit 20, some relays 30, key circuit 50, display circuit 40 and power circuit 70, wherein, the control end of described relay 30 is connected with described single chip circuit 10 through described relay drive circuit 20, the controlled terminal of described relay 30 is connected with the live wire of testing air conditioner model machine, when described single chip circuit 10 brings into operation, the time setting by judgement, frequency number of times carries out corresponding actions, logical by 30 moments of action control relay, disconnected, described key circuit 50 is connected with described single chip circuit 10 with described display circuit 40, and described key circuit 50 is for adjusting working time, frequency number of times, and described display circuit 40 is for showing working time, frequency number of times, described power circuit 70 is connected with described single chip circuit 10, described relay drive circuit 20 and described display circuit 40, is whole device power supply.
Figure 2 shows that the circuit diagram of the single chip circuit 10 in the present embodiment, single chip circuit 10 adopts ATWL16L single-chip microcomputer.
Figure 3 shows that the circuit diagram of the relay drive circuit 20 in the present embodiment.Relay drive circuit 20 comprises that relay drives chip, described relay drives signal input interface PD4, PD5, PD6, the PD7 of chip to be connected with signal output interface PD4, PD5, PD6, the PD7 of single-chip microcomputer respectively, and described relay drives the signal output interface 15,16 of chip to be connected with the control end of two relays respectively.Preferably, described relay drive circuit 20 also comprises diode D15, D17, and described diode D15, D17 are in parallel with the control end of described relay 30.By diode D15, D17, absorb the electromotive force that relay coil produces, prevent that electromotive force from damaging relay and driving chip.Preferably, described relay drive circuit 20 also comprises filter capacitor C8, C9, and described filtering circuit is in parallel with the control end of described relay.By filter capacitor C8, C9, absorb the peak point current that the quick break-make of relay produces, prevent that peak point current from causing relay misoperation work.Preferably, described relay drive circuit 20 also comprises light emitting diode D16, D18 and dropping resistor R8, R9, in parallel with the control end of described relay 30 after described light emitting diode D16, D18 and described dropping resistor R8, R9 series connection.By light emitting diode D16, D18 are convenient, from visual observation relay, whether work.For high precision analog power loose contact phenomenon, the action response time of described relay 30 is 0.01～0.99 second.In order to prevent that relay is burned, the rated current >=30A of described relay 30.Preferably, the quantity of described relay 30 is more than two, can test many testing air conditioner model machines so simultaneously, and efficiency is high.
Figure 4 shows that the circuit diagram of the display circuit 40 in the present embodiment.Described display circuit 40 comprises display driver circuit and digital display tube, and described digital display tube is connected with described single chip circuit 10 through described display driver circuit.Display circuit 40 adopts digital display tube, can reduce installation cost.
Figure 5 shows that the circuit diagram of the key circuit 50 in the present embodiment.By 50 adjust operation times of key circuit, frequency number of times.
Preferably, also comprise communicating circuit 60, described communicating circuit 60 is connected with described single chip circuit 10.By communicating circuit 60 by the data transmission of process of the test to computer record.Figure 6 shows that the circuit diagram of the communicating circuit 60 in the present embodiment.
Power circuit 70 provides power supply for whole device.Figure 7 shows that the circuit diagram of the power circuit 70 in the present embodiment.
To sum up, the device of power supply loose contact phenomenon in the analog electronics use procedure of the embodiment of the present invention, by single chip circuit 10 pilot relays, carry out lead to → disconnected → logical switching of moment, that test prototype live wire is synchronously completed is logical → disconnected → logical switching, circuit obtains crest voltage and electric current in the handoff procedure of moment, thereby realized the in the situation that of high safety guarantee analog power loose contact phenomenon; And, by key circuit 50, can adjust working time, frequency number of times, can obtain the power supply of different peak point currents, guaranteed the high precision of test result; In addition, this apparatus structure is simple, with low cost, easy to operate.
The above embodiment has only expressed several embodiment of the present invention, and it describes comparatively concrete and detailed, but can not therefore be interpreted as the restriction to the scope of the claims of the present invention.It should be pointed out that for the person of ordinary skill of the art, without departing from the inventive concept of the premise, can also make some distortion and improvement, these all belong to protection scope of the present invention.
Claims (10)
1. the device of power supply loose contact phenomenon in an analog electronics use procedure, it is characterized in that, comprise: single chip circuit, relay drive circuit, relay, key circuit, display circuit and power circuit, the control end of described relay is connected with described single chip circuit through described relay drive circuit, the controlled terminal of described relay is connected with the live wire of test prototype, described key circuit is connected with described single chip circuit with described display circuit, described power circuit and described single chip circuit, described relay drive circuit is connected with described display circuit.
2. the device of power supply loose contact phenomenon in analog electronics use procedure according to claim 1, it is characterized in that, described relay drive circuit comprises that relay drives chip, described relay drives the signal input interface of chip and the signal output interface of described single chip circuit to be connected, and described relay drives the signal output interface of chip and the control end of described relay to be connected.
3. the device of power supply loose contact phenomenon in analog electronics use procedure according to claim 2, is characterized in that, described relay drive circuit also comprises diode, and described diode is in parallel with the control end of described relay.
4. the device of power supply loose contact phenomenon in analog electronics use procedure according to claim 2, is characterized in that, described relay drive circuit also comprises filter capacitor, and described filtering circuit is in parallel with the control end of described relay.
5. the device of power supply loose contact phenomenon in analog electronics use procedure according to claim 2, it is characterized in that, described relay drive circuit also comprises light emitting diode and dropping resistor, in parallel with the control end of described relay after described light emitting diode and the series connection of described dropping resistor.
6. the device of power supply loose contact phenomenon in analog electronics use procedure according to claim 2, is characterized in that, described relay is more than two, and all described relays drive the signal output interface of chip to be connected with described relay respectively.
7. according to the device of power supply loose contact phenomenon in the analog electronics use procedure described in any one in claim 1 to 6, it is characterized in that, the action response time of described relay is 0.01～0.99 second.
8. according to the device of power supply loose contact phenomenon in the analog electronics use procedure described in any one in claim 1 to 6, it is characterized in that the rated current >=30A of described relay.
9. the device of power supply loose contact phenomenon in analog electronics use procedure according to claim 1, is characterized in that, also comprises:
Communicating circuit, described communicating circuit is connected with described single chip circuit.
10. the device of power supply loose contact phenomenon in analog electronics use procedure according to claim 1, it is characterized in that, described display circuit comprises display driver circuit and digital display tube, and described digital display tube is connected with described single chip circuit through described display driver circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410321341.9A CN104090199B (en) | 2014-07-07 | 2014-07-07 | Device for simulating poor power contact phenomenon in use process of electric appliance |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410321341.9A CN104090199B (en) | 2014-07-07 | 2014-07-07 | Device for simulating poor power contact phenomenon in use process of electric appliance |
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| Publication Number | Publication Date |
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| CN104090199A true CN104090199A (en) | 2014-10-08 |
| CN104090199B CN104090199B (en) | 2017-01-18 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201410321341.9A Expired - Fee Related CN104090199B (en) | 2014-07-07 | 2014-07-07 | Device for simulating poor power contact phenomenon in use process of electric appliance |
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| CN (1) | CN104090199B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104345240A (en) * | 2014-12-01 | 2015-02-11 | 合肥市航嘉电子技术有限公司 | Power plugging and unplugging and capacitance surge simulation tester |
| CN112255564A (en) * | 2020-10-23 | 2021-01-22 | 中国长城科技集团股份有限公司 | Power input contact failure simulator |
| CN115755689A (en) * | 2022-11-14 | 2023-03-07 | 北京航天发射技术研究所 | Power supply display control system and method |
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| JPH11337609A (en) * | 1998-05-26 | 1999-12-10 | Aisin Seiki Co Ltd | Detector for detecting disconnection of electric wire connector |
| CN101029917A (en) * | 2007-03-21 | 2007-09-05 | 华为技术有限公司 | Circuit-state analog device and system for testing apparatus functions |
| CN201191475Y (en) * | 2008-04-16 | 2009-02-04 | 深圳市风向标科技有限公司 | Intelligent fault setting kit |
| CN202190052U (en) * | 2011-08-17 | 2012-04-11 | 佛山市中格威电子有限公司 | Testing circuit for leakage current protection |
| DE102011077449A1 (en) * | 2011-06-14 | 2012-12-20 | Robert Bosch Gmbh | Apparatus for simulating electrical loose contact, has control unit that drives parallel switching of different groups of resistors in different operating states |
| CN204044272U (en) * | 2014-07-07 | 2014-12-24 | 珠海格力电器股份有限公司 | Device for simulating poor power contact phenomenon in use process of electric appliance |
-
2014
- 2014-07-07 CN CN201410321341.9A patent/CN104090199B/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11337609A (en) * | 1998-05-26 | 1999-12-10 | Aisin Seiki Co Ltd | Detector for detecting disconnection of electric wire connector |
| CN101029917A (en) * | 2007-03-21 | 2007-09-05 | 华为技术有限公司 | Circuit-state analog device and system for testing apparatus functions |
| CN201191475Y (en) * | 2008-04-16 | 2009-02-04 | 深圳市风向标科技有限公司 | Intelligent fault setting kit |
| DE102011077449A1 (en) * | 2011-06-14 | 2012-12-20 | Robert Bosch Gmbh | Apparatus for simulating electrical loose contact, has control unit that drives parallel switching of different groups of resistors in different operating states |
| CN202190052U (en) * | 2011-08-17 | 2012-04-11 | 佛山市中格威电子有限公司 | Testing circuit for leakage current protection |
| CN204044272U (en) * | 2014-07-07 | 2014-12-24 | 珠海格力电器股份有限公司 | Device for simulating poor power contact phenomenon in use process of electric appliance |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104345240A (en) * | 2014-12-01 | 2015-02-11 | 合肥市航嘉电子技术有限公司 | Power plugging and unplugging and capacitance surge simulation tester |
| CN104345240B (en) * | 2014-12-01 | 2017-03-15 | 合肥市航嘉电子技术有限公司 | A kind of analog power plug and the tester of electric capacity impact test |
| CN112255564A (en) * | 2020-10-23 | 2021-01-22 | 中国长城科技集团股份有限公司 | Power input contact failure simulator |
| CN115755689A (en) * | 2022-11-14 | 2023-03-07 | 北京航天发射技术研究所 | Power supply display control system and method |
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| CN104090199B (en) | 2017-01-18 |
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Granted publication date: 20170118 |