CN103808982A - Voltage probe - Google Patents
Voltage probe Download PDFInfo
- Publication number
- CN103808982A CN103808982A CN201210455441.1A CN201210455441A CN103808982A CN 103808982 A CN103808982 A CN 103808982A CN 201210455441 A CN201210455441 A CN 201210455441A CN 103808982 A CN103808982 A CN 103808982A
- Authority
- CN
- China
- Prior art keywords
- probe
- metal probe
- handle
- described metal
- insulation shielding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 title claims abstract description 234
- 239000002184 metal Substances 0.000 claims abstract description 190
- 229910052751 metal Inorganic materials 0.000 claims abstract description 190
- 238000009413 insulation Methods 0.000 claims abstract description 69
- 238000012360 testing method Methods 0.000 abstract description 21
- 238000005516 engineering process Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 230000002452 interceptive effect Effects 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 239000000696 magnetic material Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229910000863 Ferronickel Inorganic materials 0.000 description 1
- 239000004568 cement Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 238000007373 indentation Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Images
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
An embodiment of the invention provides a voltage probe. The voltage probe comprises a metal probe, a probe body, a metal probe handle and an insulation shielding outer sleeve. One end of the insulation shielding outer sleeve and the tail end of the metal probe handle are connected onto the probe body respectively, the insulation shielding outer sleeve and the metal probe handle are on the same side, and the insulation shielding outer sleeve is disposed on the outer side of the metal probe handle. The head end of the metal probe handle is connected with the tail end of the metal probe, a hole is formed in the other end of the insulation shielding outer sleeve, and the head end of the metal probe penetrates the hole to be exposed out of the insulation shielding outer sleeve. The insulation shielding outer sleeve covers the metal probe handle and the tail end of the metal probe and is connected with the two sides of the metal probe handle. By means of the voltage probe, the technical problem that the test accuracy is reduced due to interference among a plurality of voltage probes when test points in short distance are measured in the prior art is solved.
Description
Technical field
The present invention relates to electronic measuring technology field, particularly a kind of voltage probe.
Background technology
So-called voltage probe is defined as connecting the conductor between measured point and measuring equipment, under normal circumstances, existing voltage probe comprises probe body and probe (being metal probe) two parts, wherein, described probe is " ten " font, can in probe body, plug, when normal use, card power by probe body fixes, and probe is outside exposed, directly touches position, measured point.While use, probe can be extracted and collected.
Existing voltage probe, because the front end (near probe side) of voltage probe body is all metal with probe, directly outside exposed when use, be easily subject to outside electromagnetic interference.Particularly, in the time having two or more test point close together, while using voltage probe to measure, between each voltage probe, can produce and disturb, cause tested waveform quality variation, thereby reduced the accuracy of test signal sequential.
Summary of the invention
A kind of voltage probe is provided in the embodiment of the present invention, to solve in prior art in the time that the nearer test point of adjusting the distance is measured, owing to interfering with each other between multiple voltage probes, the technical matters that causes test accuracy to reduce.
In order to solve the problems of the technologies described above, the embodiment of the invention discloses following technical scheme:
First aspect provides a kind of voltage probe, comprise: metal probe, probe body, metal probe handle and insulation shielding overcoat, wherein, the tail end of one end of described insulation shielding overcoat and metal probe handle is connected on described probe body, described insulation shielding overcoat and described metal probe handle homonymy, and described insulation shielding overcoat is positioned at the outside of described metal probe handle; The head end of described metal probe handle is connected with the tail end of described metal probe, the other end of described insulation shielding overcoat has hole, the head end of described metal probe is through described hole, be emerging in outside described insulation shielding overcoat, the tail end of described insulation shielding overcoat coated metal probe handle and metal probe, and be connected on the both sides of described metal probe handle.
In the possible implementation of the first of first aspect, the head end of described metal probe handle comprises with the connected mode that the tail end of described metal probe is connected: be fixedly connected with, elasticity connect or one-body molded.
In the implementation that comprehensively the first of first aspect or first aspect is possible, in the possible implementation of the second of first aspect, described elasticity is connected to: connect by elastomeric element.
In the possible implementation of the first of comprehensive first aspect or first aspect or the second, in the third possible implementation of first aspect, describedly connect specifically and comprise by elastomeric element:
One end of described elastomeric element with one end of the head end of described metal probe handle for being fixedly connected with, the other end with the tail end of described metal probe for being fixedly connected with; Or
One end of the head end of one end of described elastomeric element and described metal probe handle is Elastic Contact, and the tail end of the other end and described metal probe is Elastic Contact.
In the 4th kind of possible implementation of first aspect, the tail end of described insulation shielding overcoat coated metal probe handle and metal probe, and the connected mode being connected on the both sides of described metal probe handle comprises: clamping or be fixedly connected with.
In conjunction with the first of first aspect or first aspect, the second, the third or the 4th kind of possible implementation; in the 5th kind of possible implementation; described insulation shielding overcoat comprises: insulation protection overcoat and shielding magnet ring; wherein, described shielding magnet ring is connected on the inner side of described insulation protection overcoat.
In conjunction with the first of first aspect or first aspect, the second, the third, the 4th kind or the 5th kind of possible implementation, in the 6th kind of possible implementation, also comprise: the metal sleeve that is positioned at described insulation shielding overcoat inside, one end of described metal sleeve has hole, the hole that the hole that the head end of described metal probe is opened through one end of described metal sleeve successively and the other end of described insulation shielding overcoat are opened; The other end of described metal sleeve is connected on the both sides of described metal probe handle.
In conjunction with the first of first aspect or first aspect, the second, the third, the 4th kind, the 5th kind or the 6th kind of possible implementation, in the 7th kind of possible implementation, the diameter of the tail end of the described metal probe being connected with the head end of described metal probe handle is greater than the diameter in the hole of one end of described metal sleeve opening, and is less than or equal to the diameter of the head end of described metal probe handle.
In conjunction with the first of first aspect or first aspect, the second, the third, the 4th kind, the 5th kind, the 6th kind or the 7th kind of possible implementation, in the 8th kind of possible implementation, the connected mode that the tail end of described metal probe handle is connected on described probe body is clamping or is fixedly connected with.
In conjunction with the first of first aspect or first aspect, the second, the third, the 4th kind, the 5th kind, the 6th kind the 7th kind or the 8th kind of possible implementation, in the 9th kind of possible implementation, the diameter of the tail end of the described metal probe being connected with the head end of described metal probe handle is greater than the diameter of the head end of described metal probe.
As shown from the above technical solution, in the embodiment of the present invention, owing to having added insulation shielding overcoat outward at metal probe, in the time using metal probe to test multiple in-plant test points, described insulation shielding overcoat can cover appearing outer metal probe, thus shielding external interference, can also solve measurement of near distance time, the technical matters interfering with each other between multiple voltage probes, thus the accuracy of testing improved.Further, because the head end of metal probe handle and the tail end of described metal probe are connected by elasticity, described metal probe can free-extension, so that in the time of proper testing, described insulation shielding overcoat can cover appearing outer metal probe completely, shield external interference completely, the technical matters having interfered with each other between the probe of metal probe while having solved test, thus improve the accuracy of testing.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, to the accompanying drawing of required use in embodiment be briefly described below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skills, do not paying under the prerequisite of creative work, can also obtain according to these accompanying drawings other accompanying drawing.
A kind of section of structure of a kind of voltage probe that Fig. 1 provides for the embodiment of the present invention;
The another kind of section of structure of a kind of voltage probe that Fig. 2 provides for the embodiment of the present invention;
Another section of structure of a kind of voltage probe that Fig. 3 provides for the embodiment of the present invention.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out to clear, complete description, obviously, described embodiment is only the present invention's part embodiment, rather than whole embodiment.Based on the embodiment in the present invention, those of ordinary skills, not making the every other embodiment obtaining under creative work prerequisite, belong to the scope of protection of the invention.
Refer to Fig. 1, the section of structure of a kind of voltage probe that Fig. 1 provides for the embodiment of the present invention.Described voltage probe comprises: metal probe 11, probe body 12, metal probe handle 13 and insulation shielding overcoat 14, wherein, the tail end of one end of described insulation shielding overcoat 14 and metal probe handle 13 is connected on described probe body 12, described insulation shielding overcoat 14 and described metal probe handle 13 homonymies, and described insulation shielding overcoat 14 is positioned at the outside of described metal probe handle 13; The head end of described metal probe handle 13 is connected with the tail end of described metal probe 11, the other end of described insulation shielding overcoat 14 has hole 141, the head end of described metal probe 11 is through described hole 141, be emerging in outside described insulation shielding overcoat 14, the tail end of described insulation shielding overcoat 14 coated metal probe handles 13 and metal probe 11, and be connected on the both sides of described metal probe handle 13.
In this embodiment, described probe body 12, for fixing metal probe handle 13; Wherein, the tail end of metal probe handle 13 is connected on probe body 12, and its connected mode, can be clamping, can be to be also fixedly connected with, or one-body molded etc.Wherein, described in, be fixedly connected with specifically and comprise: can connect by screw-nut, also can be bolted, can also be threaded etc.Certainly, can also comprise other the mode that is fixedly connected with, the present embodiment is not restricted.Wherein, the tail end of described metal probe handle and described probe body can be integrated, and other parts in metal probe can be dismantled, certainly, this integrated connected mode, metal probe handle and probe body can be collectively referred to as parts, also can be divided into two parts, and the present embodiment is not restricted.Wherein, for the mode of clamping, one end of described probe body is provided with groove, and the tail end of described metal probe handle is just in time connected in the groove on described probe body.
Wherein, in this embodiment, described probe body is identical with the mechanism of the probe body of prior art, and this has been to know technology for a person skilled in the art, do not repeat them here,
Described metal probe handle 13, for fixing metal probe 11, wherein, the sectional view of described metal probe handle 13 is generally cross, but is not limited to this.Wherein, the tail end of described metal probe handle 13 is connected on probe body 12, as mentioned above can clamping, also can be fixedly connected with or one-body molded etc.The head end of described metal probe handle 13 is connected with the tail end of metal probe 11; The head end of described metal probe handle 13 can be for being fixedly connected with the connected mode of the tail end of metal probe 11, can be also that elasticity connects.Wherein, described in, be fixedly connected with specifically and comprise: can connect by screw-nut, also can be bolted, can also be threaded etc.Wherein, described elasticity connects, and can be specifically to connect by elastomeric element, and described elastomeric element is such as spring etc.Described metal probe handle and metal probe can be also integrated, be that the head end of described metal probe handle and the tail end of described metal probe are integrated, certainly, this integrated connected mode, metal probe handle and metal probe can be collectively referred to as parts, also can be divided into two parts, the present embodiment is not restricted.
Described insulation shielding overcoat 14, in the time using metal probe to contact tested pilot, shields the interference between exposed metal probe.One end of insulation shielding overcoat 14 is connected on probe body 12, the other end is for the tail end of coated metal probe handle 13 and metal probe 11, and be connected on the both sides of described metal probe handle 13, the head end of metal probe 11 is exposed in insulation shielding overcoat 14 outsides through the hole 141 on insulation shielding overcoat 14.Insulation shielding overcoat 14 is for shielding the interference between multiple metal probes.Described insulation shielding overcoat can be north glue overcoat, can be also other overcoats for shield electromagnetic interference etc., and the present embodiment is not restricted.
Wherein, one end of described insulation shielding overcoat 14 is connected on probe body 12, and its connected mode can be fixedly connected with, and also can be enclosed within on described probe body 12, but be not limited to this, can also be other connected mode.The tail end of described insulation shielding overcoat 14 coated metals probe handles 13 and metal probe 11, and the connected mode being connected on the both sides of described metal probe handle 13 comprises: clamping or be fixedly connected with.
Described metal probe 11, during for normal use, contacts tested pilot.Wherein, the tail end of described metal probe 11 is connected with the head end of described metal probe handle 13, and connected mode can be for being fixedly connected with or elasticity connects, or one-body molded.Wherein, when metal probe 11 and metal probe handle 13 are that elasticity is while being connected, described elasticity connects and specifically can connect by elastomeric element, such as metal spring etc., described metal spring can be at the interior free-extension of insulation shielding overcoat 14 by external pressure, thereby makes metal probe free-extension in insulation shielding overcoat.
In the embodiment of the present invention, due at the outer insulation shielding overcoat 14 that added of metal probe 11, in the time using metal probe to test multiple in-plant test points, described insulation shielding overcoat can cover appearing outer metal probe, thereby shielding external interference, can also solve measurement of near distance time, the technical matters interfering with each other between multiple voltage probes, thus improve the accuracy of testing.
Optionally, in the above-described embodiments, the diameter of the tail end of described metal probe is greater than the diameter of the head end of described metal probe.
In this embodiment, if the head end of metal probe handle and the tail end of described metal probe are connected by elasticity, described metal probe can free-extension.In the time of proper testing, described insulation shielding overcoat can cover appearing outer metal probe completely, shields external interference completely, the technical matters having interfered with each other between the probe of metal probe while having solved test, thus improve the accuracy of testing.
Also refer to Fig. 2, the section of structure of the another kind of voltage probe providing for the embodiment of the present invention, on the basis of above-described embodiment, the tail end of insulation shielding overcoat coated metal probe handle 13 and metal probe 11 in this embodiment, and to be fixedly connected on the both sides of described metal probe handle 13 as example, but be not limited to this.Voltage probe can also comprise: the metal sleeve 21 that is positioned at described insulation shielding overcoat 14 inside, one end of described metal sleeve 21 has hole 211, the hole 141 that the hole 211 that the head end of described metal probe 11 is opened through one end of described metal sleeve 21 successively and the other end of described insulation shielding overcoat 14 are opened; The other end of described metal sleeve 21 is connected on the both sides of described metal probe handle 13.
Wherein, in the present embodiment, the head end of the tail end of described metal probe 11 and metal probe handle 13 to be to be connected to example explanation by metal spring 22, but is not limited to this.
Optionally, in the present embodiment, be provided with groove 23 with described probe body, it is example that the tail end of described metal probe handle is connected in the groove 23 on described probe body, but is not limited to this.
Described metal spring 22, is subject under the effect of external force free-extension in metal sleeve for metal probe.
Described metal sleeve 21 is for fixing metal probe 11 and metal spring 22, and described metal sleeve 21 can be connected with metal probe handle 13 by screw thread, and the present embodiment is as an example of this connected mode example but is not limited to this.
Described metal probe 11, in the time normally using, contacts tested pilot; By external pressure can be in metal sleeve free-extension.
In this embodiment, the shape of described metal probe handle is cross under normal circumstances, but is not limited to this.
That is to say; in this embodiment; in order to protect metal probe can eject/spring in the hole putting through described insulation shielding outward; inside at described insulation shielding overcoat has increased metal sleeve; the diameter of one end that the slightly larger in diameter of described metal sleeve is connected with metal probe elasticity in described metal probe handle, is less than the internal diameter of described insulation shielding overcoat.
Also refer to Fig. 3; another structural representation of the voltage probe that Fig. 3 provides for the embodiment of the present invention; this embodiment is on basis embodiment illustrated in fig. 2; described insulation shielding overcoat 14 comprises: insulation protection overcoat 142 and shielding magnet ring 143; wherein, described shielding magnet ring 143 is connected on described insulation protection overcoat 142 inner sides, and its connected mode can be the connected modes such as laminating or screw thread; can also comprise other connected modes, the present embodiment is not restricted.
Wherein, in this embodiment, insulation protection overcoat is used for wrapping up bare metal part of the present invention and shielding magnet ring.The material of described insulation protection overcoat can be the insulating material such as plastic cement.
Wherein, described shielding magnet ring, for encasing metal sleeve part, realizes shielding interference function, and its material can be the magnetic material such as iron sial or ferronickel magnetic, but is not limited to this, can also comprise other magnetic materials.That is to say, described shielding magnet ring 143 can better shield the phase mutual interference between multiple test points.
Wherein, in this embodiment, the shape of described metal probe handle can be cross, certainly, can be also other shapes, and the present embodiment is not restricted.
Based on above-described embodiment, below with metal probe and metal probe handle take elastic connection way as example, such as by spring etc., the erection sequence of the voltage probe providing in the embodiment of the present invention is as follows: first, metal probe and spring are put into metal sleeve successively, then, described metal sleeve and cross metal probe handle are fixed by screw thread, then metal probe handle is inserted in the probe body such as (such as clamping); Finally, shielding magnet ring and insulation protection overcoat are enclosed within on metal sleeve successively.
It uses the process of voltage probe to be: when use; by the probe point of metal probe in tested pilot; under the effect of external force; in metal probe indentation metal sleeve; be subject to shielding shielding and the protection of magnet ring and insulation protection overcoat, thereby reach the effect of disturbing between the probe of shielding external interference and multiple test points.Make tested signal more accurate, thus the accuracy that has improved timing sequence test.
The above is only the preferred embodiment of the present invention; it should be pointed out that for those skilled in the art, under the premise without departing from the principles of the invention; can also make some improvements and modifications, these improvements and modifications also should be considered as protection scope of the present invention.
Claims (10)
1. a voltage probe, it is characterized in that, comprise: metal probe, probe body, metal probe handle and insulation shielding overcoat, wherein, the tail end of one end of described insulation shielding overcoat and metal probe handle is connected on described probe body, described insulation shielding overcoat and described metal probe handle homonymy, and described insulation shielding overcoat is positioned at the outside of described metal probe handle; The head end of described metal probe handle is connected with the tail end of described metal probe, the other end of described insulation shielding overcoat has hole, the head end of described metal probe is through described hole, be emerging in outside described insulation shielding overcoat, the tail end of described insulation shielding overcoat coated metal probe handle and metal probe, is connected on the both sides of described metal probe handle.
2. voltage probe according to claim 1, is characterized in that, the head end of described metal probe handle comprises with the connected mode that the tail end of described metal probe is connected: be fixedly connected with, elasticity connect or one-body molded.
3. voltage probe according to claim 2, is characterized in that, described elasticity is connected to: connect by elastomeric element.
4. voltage probe according to claim 3, is characterized in that, is describedly connected specifically and is comprised by elastomeric element:
One end of described elastomeric element with the head end of described metal probe handle for being fixedly connected with, the other end with the tail end of described metal probe for being fixedly connected with; Or
The head end of one end of described elastomeric element and described metal probe handle is Elastic Contact, and the tail end of the other end and described metal probe is Elastic Contact.
5. voltage probe according to claim 1, is characterized in that, the tail end of described insulation shielding overcoat coated metal probe handle and metal probe, and the connected mode being connected on the both sides of described metal probe handle comprises: clamping or be fixedly connected with.
6. according to the voltage probe described in claim 1 to 5 any one, it is characterized in that, described insulation shielding overcoat comprises: insulation protection overcoat and shielding magnet ring, wherein, described shielding magnet ring is connected on the inner side of described insulation protection overcoat.
7. according to the voltage probe described in claim 1 to 5 any one, it is characterized in that, also comprise: the metal sleeve that is positioned at described insulation shielding overcoat inside, one end of described metal sleeve has hole, the hole that open the hole that the head end of described metal probe is opened through one end of described metal sleeve successively and one end of described insulation shielding overcoat; The other end of described metal sleeve is connected on the both sides of described metal probe handle.
8. voltage probe according to claim 7, is characterized in that, the diameter of the tail end of described metal probe is greater than the diameter in the hole of one end of described metal sleeve opening, and is less than or equal to the diameter of the head end of described metal probe handle.
9. according to the voltage probe described in claim 1 to 5 any one, it is characterized in that, the connected mode that the tail end of described metal probe handle is connected on described probe body is clamping or is fixedly connected with.
10. according to the voltage probe described in claim 1 to 5 any one, it is characterized in that, the diameter of the tail end of the described metal probe being connected with the head end of described metal probe handle is greater than the diameter of the head end of described metal probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210455441.1A CN103808982A (en) | 2012-11-14 | 2012-11-14 | Voltage probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210455441.1A CN103808982A (en) | 2012-11-14 | 2012-11-14 | Voltage probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103808982A true CN103808982A (en) | 2014-05-21 |
Family
ID=50706053
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210455441.1A Pending CN103808982A (en) | 2012-11-14 | 2012-11-14 | Voltage probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103808982A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106841768A (en) * | 2017-03-22 | 2017-06-13 | 国家电网公司 | A kind of insulated conductor voltage tester |
| CN107271731A (en) * | 2017-06-22 | 2017-10-20 | 国网浙江义乌市供电公司 | It is a kind of can wirelessly transmitting data clamp on amperemeter |
| CN108352337A (en) * | 2015-10-30 | 2018-07-31 | 德州仪器公司 | Magnetic screen probe card |
| CN109154628A (en) * | 2016-04-04 | 2019-01-04 | 伊顿智能动力有限公司 | integrated voltage sensor |
| CN109239475A (en) * | 2018-10-18 | 2019-01-18 | 广州供电局有限公司 | Scalable probe apparatus for surface potential measurement |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB587343A (en) * | 1945-01-06 | 1947-04-22 | Cyril Harry Broad | Improvements in or relating to appliances for use in making electrical tests |
| CN2239625Y (en) * | 1995-12-27 | 1996-11-06 | 谭明生 | Protective testing rod with concealed probe |
| CN2476026Y (en) * | 2001-04-06 | 2002-02-06 | 南京长盛仪器有限公司 | Testing gun |
| CN1936595A (en) * | 2006-09-05 | 2007-03-28 | 杭州高特电子设备有限公司 | Coaxial multi-detection-point detecting rod |
| JP2007248133A (en) * | 2006-03-14 | 2007-09-27 | Hioki Ee Corp | Probe and measuring apparatus |
| CN201110927Y (en) * | 2007-11-02 | 2008-09-03 | 振展科技股份有限公司 | Tooth hole detection probe structure |
| CN201355367Y (en) * | 2009-02-26 | 2009-12-02 | 沈芳珍 | Test probe |
| CN101614756A (en) * | 2008-06-27 | 2009-12-30 | 鸿富锦精密工业（深圳）有限公司 | Probe of tester |
| CN101788574A (en) * | 2009-01-22 | 2010-07-28 | 弗卢克公司 | Test probe with retractable insulative sleeve |
| JP2011174846A (en) * | 2010-02-25 | 2011-09-08 | Hioki Ee Corp | Probe system for measurement and probe cap |
-
2012
- 2012-11-14 CN CN201210455441.1A patent/CN103808982A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB587343A (en) * | 1945-01-06 | 1947-04-22 | Cyril Harry Broad | Improvements in or relating to appliances for use in making electrical tests |
| CN2239625Y (en) * | 1995-12-27 | 1996-11-06 | 谭明生 | Protective testing rod with concealed probe |
| CN2476026Y (en) * | 2001-04-06 | 2002-02-06 | 南京长盛仪器有限公司 | Testing gun |
| JP2007248133A (en) * | 2006-03-14 | 2007-09-27 | Hioki Ee Corp | Probe and measuring apparatus |
| CN1936595A (en) * | 2006-09-05 | 2007-03-28 | 杭州高特电子设备有限公司 | Coaxial multi-detection-point detecting rod |
| CN201110927Y (en) * | 2007-11-02 | 2008-09-03 | 振展科技股份有限公司 | Tooth hole detection probe structure |
| CN101614756A (en) * | 2008-06-27 | 2009-12-30 | 鸿富锦精密工业（深圳）有限公司 | Probe of tester |
| CN101788574A (en) * | 2009-01-22 | 2010-07-28 | 弗卢克公司 | Test probe with retractable insulative sleeve |
| CN201355367Y (en) * | 2009-02-26 | 2009-12-02 | 沈芳珍 | Test probe |
| JP2011174846A (en) * | 2010-02-25 | 2011-09-08 | Hioki Ee Corp | Probe system for measurement and probe cap |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108352337A (en) * | 2015-10-30 | 2018-07-31 | 德州仪器公司 | Magnetic screen probe card |
| CN108352337B (en) * | 2015-10-30 | 2023-05-16 | 德州仪器公司 | Method and system for forming integrated circuit die |
| CN109154628A (en) * | 2016-04-04 | 2019-01-04 | 伊顿智能动力有限公司 | integrated voltage sensor |
| CN109154628B (en) * | 2016-04-04 | 2021-03-19 | 伊顿智能动力有限公司 | Integrated voltage sensor |
| CN106841768A (en) * | 2017-03-22 | 2017-06-13 | 国家电网公司 | A kind of insulated conductor voltage tester |
| CN106841768B (en) * | 2017-03-22 | 2018-10-30 | 国家电网公司 | A kind of insulated conductor voltage tester |
| CN107271731A (en) * | 2017-06-22 | 2017-10-20 | 国网浙江义乌市供电公司 | It is a kind of can wirelessly transmitting data clamp on amperemeter |
| CN109239475A (en) * | 2018-10-18 | 2019-01-18 | 广州供电局有限公司 | Scalable probe apparatus for surface potential measurement |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103808982A (en) | Voltage probe | |
| JP2008216145A (en) | Partial discharge detection method | |
| CN202599329U (en) | Coating thickness measuring instrument | |
| KR102549276B1 (en) | Reflectometry system for detecting faults on reinforced multipoint connectors in electrical networks | |
| CN111220855B (en) | Method for measuring conducted interference signal in strong electromagnetic environment | |
| EP3654043B1 (en) | Multi-use test lead | |
| CN203870132U (en) | Probe connection rod, probe device and electrical test device | |
| CN203705493U (en) | Oscilloscope probe for testing ripple waves | |
| CN203259600U (en) | Near field measuring tool for electromagnetic field | |
| CN203275522U (en) | Novel breaker loop resistor testing clamp | |
| CN205120840U (en) | Near field magnetoelectric sensor | |
| CN202216984U (en) | Electrical measuring instrument | |
| CN206601408U (en) | Test splice and tester | |
| CN206311657U (en) | A kind of Rogowski coil transient current sensor | |
| CN102243255B (en) | Insulating property isothermal relaxation current method microcurrent testing adapter for high-voltage apparatus | |
| CN202502123U (en) | A four-wire instrument test pen | |
| CN204203301U (en) | A kind of simple and easy radio frequency testing pen | |
| CN103743999B (en) | A kind of device and method searching electric wire breakpoint location | |
| CN202382848U (en) | Portable vibration signal analyzer | |
| US20180120376A1 (en) | Probing apparatus for tapping electric signals | |
| CN110531170A (en) | Shielded cable shielding attenuation measurement method | |
| US9081036B2 (en) | Adjustable measurement device | |
| CN207780168U (en) | A kind of insulation voltage-withstand test tooling | |
| CN208013260U (en) | Automobile circuit tests Integrated Probe | |
| CN201126442Y (en) | Multi-core type watch pen |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20140521 |