CN103675634A - Method for testing IGBT (Insulated Gate Bipolar Transistor) based on LabVIEW - Google Patents
Method for testing IGBT (Insulated Gate Bipolar Transistor) based on LabVIEW Download PDFInfo
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Abstract
The invention provides a method for testing an IGBT (Insulated Gate Bipolar Transistor) based on a LabVIEW (Laboratory Virtual Instrumentation Engineering Workbench). The method comprises the following steps: firstly, connecting a processing module, an oscilloscope, a data acquisition module and an IGBT signal monitoring and modulating board; then controlling the data acquisition module through the processing module to sequentially send a first pulse in a first width and a second pulse in a second width to the IGBT signal monitoring and modulating board; secondly, collecting a current signal and a voltage signal which are generated by the IGBT signal monitoring and modulating board and converting the current signal and the voltage signal to a current waveform and a voltage waveform through the oscilloscope, and then sending the current waveform and the voltage waveform to the processing module; finally, analyzing the current waveform and the voltage waveform through the processing module so as to determine whether the tested IGBT meets the technical parameter requirements of a device. The method has the advantages of automation in test process, flexible control, safe and reliable test process, convenience in data analysis, high data traceability and the like.
Description
Technical field
The present invention relates to the method for testing of a kind of IGBT, particularly relate to a kind of IGBT method of testing based on LabVIEW.
Background technology
IGBT (Insulated Gate Bipolar Transistor), insulated gate bipolar transistor, the compound full-control type voltage driven type power semiconductor device being comprised of BJT (double pole triode) and MOS (insulating gate type field effect tube), has the advantage of the high input impedance of MOSFET and low conduction voltage drop two aspects of GTR concurrently.GTR saturation pressure reduces, and current carrying density is large, but drive current is larger; MOSFET driving power is very little, and switching speed is fast, but conduction voltage drop is large, and current carrying density is little.IGBT combines the advantage of above two kinds of devices, and the little and saturation pressure of driving power reduces.Be applicable to being very much applied to DC voltage and be 600V and above converter system as fields such as alternating current generator, frequency converter, Switching Power Supply, lighting circuit, Traction Drives.
In recent years, electronics industry development power component and system, and in power electronics industry, use the quantity of IGBT device also to increase rapidly.The manufacturer of semiconductor and power product all wishes to have the cost of good efficiency and lower industrial process in these have the process of producing product of IGBT device, thereby the perfect control that all must obtain of the control procedure from the research and development of product to final product quality.For reaching the above object, it is extremely important that the test of product relatively becomes, and accurately essential and reliable.For in production run, testing apparatus must possess various feature and coordinate different testing requirements.The characteristic that research and development slip-stick artist need to know product is so that its design, the personnel that produce need quick and easy-to-use instrument, to accelerate their procedure for producing, the characteristic of the product that quality control personnel need to check that they combine and the result of collecting them are done statistical study.
Conventionally IGBT has corresponding databook, but in fact, parameter described in databook is to get based on some given external parameter tests, and external parameter in practical application is all that each is discrepant, so these parameters can not be brought direct use a bit.In design, will obtain parameter under actual conditions need to realize by testing.
The method major part of test I GBT switch behavioral parameters is dipulse method of testing at present, is generally by oscillograph, multimeter, signal generator, the instrument manual measurements such as reometer.But above dipulse method of testing, the general manual measurement method that adopts, inefficiency, because signal is high pressure, high electric current, so security is low, and data analysis is very complicated, although data can preserve by the USB interface on oscillograph, but initial conditions cannot be preserved simultaneously, need follow-up edit, therefore likely produce the randomness mistake of bringing due to people's fatigue.
Summary of the invention
The shortcoming of prior art, the object of the present invention is to provide a kind of IGBT method of testing based on LabVIEW in view of the above, for solving the inefficiency of prior art to IGBT test, and the problem such as security is low, data analysis more complicated.
For achieving the above object and other relevant objects, the invention provides a kind of IGBT method of testing based on LabVIEW, described method of testing at least comprises the following steps:
1) provide processing module, oscillograph, data acquisition module and IGBT signal monitoring conditioning plate, connect successively described processing module, data acquisition module, IGBT signal monitoring conditioning plate and oscillograph, and connect described oscillograph and described processing module;
2) by described processing module, control described data acquisition module and to described IGBT signal monitoring conditioning plate, send the first pulse of the first width and the second pulse of the second width successively;
3) current signal and the voltage signal that by described oscillograph, described IGBT signal monitoring conditioning plate are produced gather and are converted to current waveform and voltage waveform, are then sent to described processing module;
4) by described processing module, described current waveform and voltage waveform are analyzed, to determine whether tested IGBT meets the technical parameter requirement of device.
In the IGBT method of testing based on LabVIEW of the present invention, control and data processing software that described processing module adopts are the upper computer software based on LabVIEW.
In the IGBT method of testing based on LabVIEW of the present invention, described step 2) in, also comprise that current signal and voltage signal by described data collecting module collected IGBT signal monitoring conditioning plate are sent to described processing module, so that described IGBT signal monitoring conditioning plate is monitored in real time, and when abnormal signal, turn-off the step of test circuit.
In the IGBT method of testing based on LabVIEW of the present invention, described step 2) in, by the first pulse, the IGBT test circuit in IGBT signal monitoring conditioning plate is charged to predetermined current, by the second pulse, described IGBT test circuit is carried out to switch motion under described predetermined current.
In the IGBT method of testing based on LabVIEW of the present invention, described IGBT test circuit at least comprises storage capacitor, an IGBT and the 2nd IGBT of series connection, the driver that is parallel to the inductance of a described IGBT and is connected in the 2nd IGBT.
Further, described step 2) comprising:
2-1) described driver sends out the first pulse to the gate pole of described the 2nd IGBT, make IGBT circuit turn-on, the electromotive force of storage capacitor is added on inductance, control described the first pulse time chien shih inductance Current rise to predetermined current value, stop pulse turn-offs IGBT circuit;
2-2) described driver sends out the second pulse to the gate pole of described the 2nd IGBT, make the conducting again of IGBT circuit, the fly-wheel diode of IGBT enters reverse recovery, and reverse recovery current passes IGBT, and surveys this reverse recovery current by oscillographic current probe;
2-3) stop the second pulse, IGBT circuit is turn-offed again, and survey the now electric current of IGBT circuit by oscillographic current probe.
Preferably, the width of described the first pulse is 1us ~ 2ms, and the width of described the second pulse is 0.1us ~ 100us.
As a preferred version of the IGBT method of testing based on LabVIEW of the present invention, described storage capacitor is connected with a high-voltage power supply, described step 2) before transmission the first pulse, also comprise the step of charging to described storage capacitor by described high-voltage power supply.
As a preferred version of the IGBT method of testing based on LabVIEW of the present invention, described step 4) also comprises the step that the analysis result of data that described processing module is received from oscillograph and data is stored.
As mentioned above, the invention provides a kind of IGBT method of testing based on LabVIEW, first processing module, oscillograph, data acquisition module and IGBT signal monitoring conditioning plate are connected, then by described processing module, control data acquisition module and to described IGBT signal monitoring conditioning plate, send the first pulse of the first width and the second pulse of the second width successively; Then the current signal and the voltage signal that by described oscillograph, described IGBT signal monitoring conditioning plate are produced gather and are converted to current waveform and voltage waveform, are then sent to described processing module; Finally by described processing module, described current waveform and voltage waveform are analyzed, to determine whether tested IGBT meets the technical parameter requirement of device.The present invention has following beneficial effect: 1) control flexibly: utilize upper computer software to control the width of two pulses, first pulse makes IGBT reach certain electric current, pulse width is 1us ~ 2ms, can change flexibly, second pulse, makes IGBT on prospective current, carry out switch motion, and 0.1us ~ 100us is adjustable flexibly, two recurrent intervals also can be controlled with upper computer software, and 1us ~ 20us is adjustable flexibly; Upper computer software is communicated by letter based on LAN with oscillograph or GPIB communicates by letter, observation IGBT dynamic perfromance waveform, and automatically carry out infinitesimal analysis computing according to family curve, and draw the dynamic characteristic parameter of IGBT, judge that whether the dynamic perfromance of IGBT is qualified; 2) dual safety is controlled: when applying driving voltage to IGBT, time is controlled very accurate, if the long damage that likely causes IGBT of IGBT opening time, therefore dual safety guarantees extremely important, native system carries special detection single-chip microcomputer, and whether the width of Real-Time Monitoring dipulse is identical with default width, if there is inconsistent, turn-off immediately output, guarantee safety; 3) data analysis is convenient: the curve that IGBT dynamic characteristic test obtains can calculate automatically by software, directly draws test result and is presented on host computer interface; 4) retrospective is good: after having tested, have data keeping records, data preservation meeting preserves all initial conditions and test result in the lump, is convenient to follow-up IGBT be analyzed, and retrospective is good.
Accompanying drawing explanation
Fig. 1 is shown as the schematic flow sheet of the IGBT method of testing based on LabVIEW of the present invention.
Fig. 2 is shown as the proving installation structural representation of the IGBT method of testing based on LabVIEW of the present invention.
Fig. 3 is shown as the IGBT signal monitoring conditioning plate electrical block diagram in the IGBT method of testing proving installation based on LabVIEW of the present invention.
Fig. 4 is shown as the IGBT method of testing test sequence schematic diagram based on LabVIEW of the present invention.
Element numbers explanation
10 processing modules
11 data acquisition modules
12IGBT signal monitoring conditioning plate
13 oscillographs
121 storage capacitors
122 the one IGBT
123 IGBT
124 inductance
125 drivers
126 power modules
127 high-voltage power supplies
128 high tension protection circuits
129 monitor protective device
S1 ~ S4 step 1) ~ step 4)
Embodiment
Below, by specific instantiation explanation embodiments of the present invention, those skilled in the art can understand other advantages of the present invention and effect easily by the disclosed content of this instructions.The present invention can also be implemented or be applied by other different embodiment, and the every details in this instructions also can be based on different viewpoints and application, carries out various modifications or change not deviating under spirit of the present invention.
Refer to Fig. 1 ~ Fig. 4.It should be noted that, the diagram providing in the present embodiment only illustrates basic conception of the present invention in a schematic way, satisfy and only show with assembly relevant in the present invention in graphic but not component count, shape and size drafting while implementing according to reality, during its actual enforcement, kenel, quantity and the ratio of each assembly can be a kind of random change, and its assembly layout kenel also may be more complicated.
As shown in Fig. 1 ~ Fig. 4, the present embodiment provides a kind of IGBT method of testing based on LabVIEW, and described method of testing at least comprises the following steps:
As shown in Fig. 1 ~ Fig. 3, first carry out step 1) S1, processing module 10, oscillograph 13, data acquisition module 11 and IGBT signal monitoring conditioning plate 12 are provided, connect successively described processing module 10, data acquisition module 11, IGBT signal monitoring conditioning plate 12 and oscillograph 13, and connect described oscillograph 13 and described processing module 10.
Described processing module 10 at least comprises processor and storer, and control and data processing software that described processing module 10 adopts are the upper computer software based on LabVIEW, and can complete the storage of the transmission of control signal, the analyzing and processing of data and data.
Described oscillograph 13 energy Real-Time Monitoring current signal and voltage signals, and convert it into current waveform and voltage waveform.
Described data acquisition module 11 can be to transmitted signal when receiving the control signal of described processor, and can carry out the collection of electric current and voltage signal to described IGBT signal monitoring conditioning plate 12.
As shown in Figure 3, described IGBT signal monitoring conditioning plate 12 at least comprise series connection storage capacitor 121, an IGBT122 and the 2nd IGBT123, be parallel to the inductance 124 of a described IGBT122 and be connected in the 2nd IGBT123 driver 125, be connected in the power module 126 of a described IGBT122 and be connected in described storage capacitor 121, for the high-voltage power supply 127 of voltage is provided to described storage capacitor 121.In the present embodiment, described power module 126 adopts programmable power supply, and it comprises a regulated power supply, the voltage isolator that is connected in the power management module of this regulated power supply and is connected in described power management module.Described inductance 124 adopts air-core inductance.
Described storage capacitor 121 is connected with high tension protection circuit 128, can be for when normally working, test circuit discharging the electric weight of described storage capacitor 121, and also can be for discharge the electric weight of described storage capacitor 121 when circuit needs emergent stopping.
Whether described driver 125 is connected with a dipulse and monitors protective device 129, for monitoring test circuit under dipulse signal, normally work.
As shown in Fig. 1 ~ Fig. 4, then carry out step 2) S2, controls described data acquisition module 11 by described processing module 10 and to described IGBT signal monitoring conditioning plate 12, sends the first pulse of the first width and the second pulse of the second width successively.
In the present embodiment, by the first pulse, the IGBT test circuit in IGBT signal monitoring conditioning plate 12 is charged to predetermined current, by the second pulse, described IGBT test circuit is carried out to switch motion under described predetermined current.
Particularly, this step comprises following sub-step:
2-1) described driver 125 sends out the first pulse to the door of described the 2nd IGBT123, make IGBT circuit turn-on, the electromotive force of storage capacitor 121 is added on inductance 124, control described the first pulse time chien shih inductance 124 Current rise to predetermined current value, stop pulse turn-offs IGBT circuit.
Now, the electric current of described inductance 124 is linear and rises, and current expression is: I=U*T1/L.Wherein, U is the voltage at memory capacitance two ends, and L is inductance, T
1it is the time of the first pulse.Visible, in the process of the first pulse, the numerical value of inductive current determines by U and L, and when U and L determine, the numerical value of electric current determines by T1, and the time is longer, and electric current is larger.Therefore can be according to the described predetermined current value of the autonomous setting of this formula.In the present embodiment, the time of described the first pulse is 1us ~ 2ms, and in a concrete implementation process, adopting the time of the first pulse is 1ms.
2-2) described driver 125 sends out the second pulse to described the 2nd IGBT123 door, make the conducting again of IGBT circuit, the fly-wheel diode of IGBT enters reverse recovery, and reverse recovery current passes IGBT, and surveys this reverse recovery current by the current probe of oscillograph 13.
In the process of the second pulse, emphasis is the opening process of observing IGBT.Reverse recovery current is important monitored object, and the form of this reverse recovery current directly has influence on many important indicators of commutation course.In the present embodiment, the time of described the second pulse is 0.1us ~ 100us, and in a concrete implementation process, the time of described the second pulse is 5us.
2-3) stop the second pulse, IGBT circuit is turn-offed again, and survey the now electric current of IGBT circuit by the current probe of oscillograph 13.When IGBT circuit turn-offs, electric current is larger, because the existence of bus stray inductance can produce certain due to voltage spikes, this process emphasis is the turn off process of observing IGBT.The due to voltage spikes that diode reverse recovery current stray inductance produces is important monitored object.
It should be noted that, this step also comprises the step to described storage capacitor 121 chargings by described high-voltage power supply 127 before sending the first pulse, can charge to described storage capacitor 121 saturated, also can charge to according to demand default voltage.The leading indicator of described storage capacitor 121 is sizes of its withstand voltage and capacity.In the situation that capacity and withstand voltage all meet the demands, equivalent internal resistance ESR and the equivalent inductance ESL of described storage capacitor 121 are the smaller the better.High withstand voltage is collector and the maximum rated withstand voltage of voltage Vce between emitter (driver HP1 and driver HP2 are 650V) that covers IGBT in order to meet, large capacity is to meet the demand to electric current in test event, because the electric current fan-out capability of high-voltage power supply 127 only has 0.5A, can not supplement in short-term the loss of capacitance charge.In short circuit experiment, HP2 need to provide larger electric weight, if electric capacity is little, voltage on bus falls can be very severe, therefore the capacity of the storage capacitor 121 adopting in the present embodiment is 1800uF, maximum voltage is reduced to 13V, busbar voltage at most only falls 5%, can regard this storage capacitor 121 as constant pressure source.
For avoiding the saturated IGBT of causing of inductance in test to be easily burned, in the present embodiment, described inductance 124 is used air-core inductance.The different sensibility reciprocal of coiling can be simulated the switch current intelligence in different loads situation.Known (wherein according to formula: I=U*Ton/L, I is the electric current of coil, U is coil both end voltage, Ton is conduction time, L is the inductance of coil), current waveform that can easier acquisition Different Slope under certain voltage, can adopt inductance that inductance value is less to carry out two kinds of short-circuit conditions of Simulation with I GBT.
In the present embodiment, described step 2) also comprise that the current signal and the voltage signal that by described data acquisition module 11, gather IGBT signal monitoring conditioning plate 12 are sent to described processing module 10, so that described IGBT signal monitoring conditioning plate 12 is monitored in real time, and when abnormal signal, turn-off the step of test circuit.In a concrete implementation process, when listening to the time of dipulse and the deviation of target setting, surpass 1us, close the output of pulse signal.
The time interval between described the first pulse and the second pulse is controlled by described processing module, and to guarantee its accuracy, in the present embodiment, the described time interval is 1us ~ 20us, and adjustable flexibly.
As shown in Fig. 1 ~ Fig. 3, then carry out step 3), the current signal and the voltage signal that by 13 pairs of described IGBT signal monitoring conditioning plates 12 of described oscillograph, produce gather and are converted to current waveform and voltage waveform, are then sent to described processing module 10.
As shown in Fig. 1 ~ Fig. 3,4) by 10 pairs of described current waveforms of described processing module and voltage waveform, analyze, to determine whether tested IGBT meets the technical parameter requirement of device.
In the present embodiment, described step 4) also comprises the step that the analysis result of data that described processing module 10 is received from oscillograph 13 and data is stored, and this step can be so that follow-uply analyze IGBT, and retrospective is good.
Fig. 4 is shown as the collector of implementation process relevant parameters pulse voltage Vge, an IGBT of the present embodiment and the monitoring sequential chart of the electric current I c of the voltage Vce between emitter and IGBT collector, in t0 ~ t1 stage, to IGBT, send the first pulse Vge, Vce is zero, and electric current I c linearly rises; In t1 ~ t2 stage, the first pulse Vge is closed, and Vge is zero, and Vce rises and is constant substantially, and electric current I c is zero; In t2 ~ t3 stage, to IGBT, send the second pulse Vge, electric current I c through collector is reverse recovery current, it is linear with the burst length and rises, when t3 closes the second pulse constantly, because the existence of bus stray inductance produces certain due to voltage spikes, this voltage sword cutting edge of a knife or a sword easily causes puncturing of IGBT, is important monitoring target of this stage.If the monitoring parameter value in each stage is consistent or basically identical with preset value, can judge that this IGBT passes, if the parameter value monitoring is large or breakdown in observation process with preset value deviation, this IGBT does not meet request for utilization.
In sum, the invention provides a kind of IGBT method of testing based on LabVIEW, first processing module, oscillograph, data acquisition module and IGBT signal monitoring conditioning plate are connected, then by described processing module, control data acquisition module and to described IGBT signal monitoring conditioning plate, send the first pulse of the first width and the second pulse of the second width successively; Then the current signal and the voltage signal that by described oscillograph, described IGBT signal monitoring conditioning plate are produced gather and are converted to current waveform and voltage waveform, are then sent to described processing module; Finally by described processing module, described current waveform and voltage waveform are analyzed, to determine whether tested IGBT meets the technical parameter requirement of device.The present invention has following beneficial effect: 1) control flexibly: utilize upper computer software to control the width of two pulses, first pulse makes IGBT reach certain electric current, pulse width is 1us ~ 2ms, can change flexibly, second pulse, makes IGBT on prospective current, carry out switch motion, and 0.1us ~ 100us is adjustable flexibly, two recurrent intervals also can be controlled with upper computer software, and 1us ~ 20us is adjustable flexibly; Utilize upper computer software to communicate by letter with oscillograph, observation IGBT dynamic perfromance waveform, and automatically carry out infinitesimal analysis computing according to family curve, and judge that whether the dynamic perfromance of IGBT is qualified; 2) dual safety is controlled: when applying driving voltage to IGBT, time is controlled very accurate, if the long damage that likely causes IGBT of IGBT opening time, therefore dual safety guarantees extremely important, native system carries special monitoring singlechip, and whether the width of Real-Time Monitoring dipulse is identical with default width, if there is inconsistent, turn-off immediately output, guarantee safety; 3) data analysis is convenient: the curve that IGBT dynamic characteristic test obtains can calculate automatically by software, directly draws test result and is presented on host computer interface; 4) retrospective is good: after having tested, have data keeping records, data preservation meeting preserves all initial conditions and test result in the lump, is convenient to follow-up IGBT be analyzed, and retrospective is good.Visible, the present invention has effectively overcome various shortcoming of the prior art and tool high industrial utilization.
Above-described embodiment is illustrative principle of the present invention and effect thereof only, but not for limiting the present invention.Any person skilled in the art scholar all can, under spirit of the present invention and category, modify or change above-described embodiment.Therefore, such as in affiliated technical field, have and conventionally know that the knowledgeable, not departing from all equivalence modifications that complete under disclosed spirit and technological thought or changing, must be contained by claim of the present invention.
Claims (9)
1. the IGBT method of testing based on LabVIEW, is characterized in that, described method of testing at least comprises the following steps:
1) provide processing module, oscillograph, data acquisition module and IGBT signal monitoring conditioning plate, connect successively described processing module, data acquisition module, IGBT signal monitoring conditioning plate and oscillograph, and connect described oscillograph and described processing module;
2) by described processing module, control described data acquisition module and to described IGBT signal monitoring conditioning plate, send the first pulse of the first width and the second pulse of the second width successively;
3) current signal and the voltage signal that by described oscillograph, described IGBT signal monitoring conditioning plate are produced gather and are converted to current waveform and voltage waveform, are then sent to described processing module;
4) by described processing module, described current waveform and voltage waveform are analyzed, to determine whether tested IGBT meets the technical parameter requirement of device.
2. the IGBT method of testing based on LabVIEW according to claim 1, is characterized in that: the control that described processing module adopts and data processing software are the upper computer software based on LabVIEW.
3. the IGBT method of testing based on LabVIEW according to claim 1, it is characterized in that: described step 2), also comprise that current signal and voltage signal by described data collecting module collected IGBT signal monitoring conditioning plate are sent to described processing module, so that described IGBT signal monitoring conditioning plate is monitored in real time, and when abnormal signal, turn-off the step of test circuit.
4. the IGBT method of testing based on LabVIEW according to claim 1, it is characterized in that: described step 2), by the first pulse, the IGBT test circuit in IGBT signal monitoring conditioning plate is charged to predetermined current, by the second pulse, described IGBT test circuit is carried out to switch motion under described predetermined current.
5. the IGBT method of testing based on LabVIEW according to claim 4, is characterized in that: described IGBT test circuit at least comprises storage capacitor, an IGBT and the 2nd IGBT of series connection, the driver that is parallel to the inductance of a described IGBT and is connected in the 2nd IGBT.
6. the IGBT method of testing based on LabVIEW according to claim 5, is characterized in that: described step 2) comprising:
2-1) described driver sends out the first pulse to the door of described the 2nd IGBT, make IGBT circuit turn-on, the electromotive force of storage capacitor is added on inductance, control described the first pulse time chien shih inductance Current rise to predetermined current value, stop pulse turn-offs IGBT circuit;
2-2) described driver sends out the second pulse to described the 2nd IGBT door, makes the conducting again of IGBT circuit, and the fly-wheel diode of IGBT enters reverse recovery, and reverse recovery current passes IGBT, and surveys this reverse recovery current by oscillographic current probe;
2-3) stop the second pulse, IGBT circuit is turn-offed again, and survey the now electric current of IGBT circuit by oscillographic current probe.
7. the IGBT method of testing based on LabVIEW according to claim 6, is characterized in that: the width of described the first pulse is 1us ~ 2ms, and the width of described the second pulse is 0.1us ~ 100us.
8. the IGBT method of testing of LabVIEW according to claim 5, is characterized in that: described storage capacitor is connected with a high-voltage power supply described step 2) before transmission the first pulse, also comprise the step of charging to described storage capacitor by described high-voltage power supply.
9. the IGBT method of testing based on LabVIEW according to claim 1, is characterized in that: described step 4) also comprises the step that the analysis result of data that described processing module is received from oscillograph and data is stored.
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