CN103645988B - Universalization distributed test system framework - Google Patents

Abstract

Universalization distributed test system framework, belongs to field of automatic testing.Have that testing efficiency is low to solve current centralized automatic festing system framework and distributed test system framework, the problem of poor real and poor universality.It comprises system layer, network-in-dialing layer and instrument layer; System layer is carrier with test computer, contains management, exploitation, the Software tool performing testing and diagnosing required by task and user interface; Network-in-dialing layer adopts each testing apparatus of standard LXI Interface integration and provides information interaction medium; Instrument layer mainly adopts the intelligent instrument supporting LXI interface, provides testing and diagnosing function.System layer and the information interaction form between instrument layer and instrument layer, all follow ATML regular set.It is for building Auto-Test System.

Description

Generalized Distributed Test System Architecture

technical field

The invention relates to a test system architecture, which belongs to the field of automatic test.

Background technique

The automatic test system (Automatic Test System, ATS) with computer technology as the core is an important guarantee for the realization of electronic equipment fault diagnosis, health management and functional testing. Since the 1970s, ATS has generally experienced four development stages: dedicated ATS, rack-stacked ATS, backplane-based modular ATS, and open system architecture ATS. While forming mature technology and serialized products, the problems of ATS test program set (TestProgramSet, TPS) portability (Transportability), test equipment interoperability (Interoperability), and interchangeability (Inter-changeability) have become increasingly prominent, and have been The cost of testing in the whole life cycle of test equipment development, production, deployment and maintenance has expanded rapidly. The generalization of ATS is an important development trend. The degree of generalization of ATS directly determines the system's design cycle, maintenance costs, technical life, test and diagnostic performance, and adaptability to new technologies and the object under test (UnitUnderTest, UUT). In order to promote the generalization of ATS and focus on solving the problems of TPS portability and test equipment interchangeability, the industry has launched ATLAS (Abbreviated Test Language for Avionics System), SCPI (Standard Commands for Programmable Instruments), VPP (VXIPlug&Play), IVI (InterchangeableVirtualInstrument), ATML (AutomaticTestMarkupLanguage ) and other technical specifications, and built a general ATS open system architecture on this basis. At present, the mainstream general-purpose ATS mainly adopts a centralized system architecture, that is, the test computer is the core of the system control, and the control of the system components is realized with the help of virtual test equipment technology and test equipment bus. Under this architecture, the test equipment is only used as the executive body of the test operation. The information processing and coordination control performance of the ATS are directly subject to the test computer and system software. The degree of transformation is not ideal.

After years of technological development and market selection, the key technical standards required to build a generalized ATS have become increasingly mature. However, because they are respectively aimed at a certain aspect or level of ATS generalization, and have different application limitations or technical defects, neither of them can independently construct a general ATS. The effective technical way to realize the generalization of ATS is to build an open system architecture, use commercial standards to define system behaviors and elements, and realize the interchangeability of test equipment and the portability of TPS through standardized system interfaces, services, protocols, and data formats , so that the interoperability between ATS.

In the 1990s, the U.S. Department of Defense (USDepartment of Defense, USDoD) united various military services/arms and SCC20, LXI Alliance, Boeing, Rohde&Schwarz and other standardization organizations or industrial enterprises to jointly carry out the next-generation ATS research work called NxTest, and in 1996 Commencement of joint development of the DoDATS framework. The DoDATS framework adopts a modular design and an open system architecture. With the help of commercial standards such as ABBET, ATML, and STD, it defines more than 20 A key element, comprehensively covering ATS components such as TPS, ATE, UUT. Since the DoDATS framework adopts a large number of commercial technologies and products (Commercial-Off-the-Shelf, COTS), it focuses on the standardization of test information and system interfaces, and can be flexibly adjusted, expanded and upgraded according to technological development and product replacement. At the same time, it further improves the ATS test capability and reduces the test time by absorbing signal-oriented test language, synthetic test equipment, parallel test, comprehensive diagnosis and other advanced test technologies.

At present, the DoDATS framework is the most complete and versatile general-purpose ATS framework in the world, and has been established as a mandatory standard for the ATS of the US military, and has initially formed a serialized and standardized DoDATS family with the military/arms as the unit . The basis for the success of the DoDATS framework is to adopt an open system architecture based on ATML, to replace a single technical standard with a set of commercial standards organized in layers and categories, and to replace the standardization of driver interfaces with signal-oriented information standardization. Therefore, the portability of TPS is better realized, and the difficulty of system management, maintenance and upgrade is reduced. However, as shown in Figure 1, because it follows the operation mechanism and some technical specifications of the centralized ATS, it has prominent technical limitations.

(1) System performance is limited: Due to the centralized system architecture and sequential execution mode, the test computer or zero-slot controller becomes the system center and performance bottleneck, and most of the test equipment is idle and waiting. While prolonging the test time, Indirectly caused the rise of the system cost.

(2) The application of test equipment intelligence and information interoperability is hindered: since the test equipment is only a test actuator, its task management, information processing, and component communication must be completed with the help of a test computer or a zero-slot controller, which wastes some high-end test equipment. At the same time of computing and storage resources, it hinders the application of information interoperability between test equipment and increases the pressure on the system communication backbone.

(3) The software level is bloated: the DoDATS framework still realizes the test equipment control through the VISA or IVI driver, and ATML is only used as an information interface for calling the test equipment driver, rather than an independent interchangeable solution. The software scale and design cost of the system further expansion.

(4) The problem of test equipment interchangeability has not been effectively resolved: because the bottom layer of the system still uses VISA or IVI, and VISA and IVI have poor support for special test equipment, composite function test equipment, and synthetic test equipment, the system's test equipment is interchangeable. The problem has not been substantially improved.

Contents of the invention

The purpose of the present invention is to solve the shortcomings of low test efficiency, poor real-time performance and poor versatility in the current centralized automatic test system architecture and distributed test system architecture. The present invention provides a generalized distributed test system architecture.

The generalized distributed test system architecture of the present invention includes a system layer, a network connection layer and an instrument layer;

The system layer includes a test resource description layer, a test signal mapping layer and a test equipment connectivity layer;

The test resource description layer is used to describe the system components and generate ATML description files;

Described ATML description file comprises test task ATML description file, test equipment ATML description file, test station ATML description file and tested equipment ATML description file;

The test signal mapping layer includes a test task management module, a test resource analysis module, a signal mapping module, a trigger resource analysis module, a test task decomposition module and a test subtask generation module;

The test task management module is used to manage the generated ATML description file, and is also used to create, delete, import/export, search, extract, edit, execute and playback the test task corresponding to the test task ATML description file;

The test resource analysis module is used to summarize and classify the ATML description files of the test equipment, the ATML description files of the test station and the ATML description files of the tested equipment; the ATML description files of the test equipment, the ATML description files of the test station and the ATML description files of the tested equipment are all for testing resources;

The signal mapping module is used to map the test signal in the test task to the test resource, and is also used to map the test process in the test task to the trigger resource;

The trigger resource analysis module is used to collect signals supporting LXI trigger and synchronization functions in the automated test system as trigger resources, and draw system trigger and synchronization resource distribution diagrams according to the test station ATML description file;

The test task decomposition module is used to decompose the mapped test task into multiple test task subsets corresponding to the test equipment in units of test equipment according to the test signal and trigger resources;

The test subtask generating module is used to combine test signals and trigger resources in multiple test task subsets corresponding to the test equipment according to the test process of the test task, and generate corresponding multiple ATML test subtasks in chronological order;

The test equipment connection layer is used to communicate with the instrument layer through the network connection layer;

The network connectivity layer is used to connect the test equipment of the instrument layer with the network of the system layer through the LXI interface, and use ATML to realize the intercommunication of information between the devices;

The function of described LXI interface adopts LXI multifunctional carrier board to realize, and described LXI multifunctional carrier board includes ATML explaining layer, test operation layer and equipment/signal driver layer;

The ATML interpretation layer is used to receive ATML test subtasks issued by the system layer and upload ATML test results to the system layer; it is also used to generate local ATML device description files according to the test resources of each test equipment in the instrument layer and upload them to the system layer , which is also used to parse ATML test subtasks into test sequences;

The test operation layer is used to realize the management and scheduling of the test sequence of the test equipment, and pass the test sequence to the test flow controller of the test equipment one by one; using the sequence, loop and branch test structure of the test flow controller, combined with the test The signal timing relationship maps the test operations in the test sequence to a signal-oriented driver library; it is also used to use the communication modules of each test equipment and adopt the LXI/LAN message multicast mechanism to realize the release of test tasks and test equipment status;

The device/signal driver layer is used to refer to the signal component library of the IEEE1641 standard, package and provide a signal-oriented driver library according to the test device driver and the LXI trigger and synchronization system driver;

The instrument layer is used to drive the signals of LXI trigger and synchronization functions, cooperate with each test equipment to execute the issued ATML test subtasks, and send the ATML test results.

The advantage of the present invention is that, compared with the centralized automatic test system and the existing distributed test system, it has stronger feasibility and technical advantages:

(1) Generalization: The signal-oriented ATML standard set can solve the problem of TPS portability to the greatest extent, and adopt ATML as the communication format of message-based LXI test equipment, and realize the analysis and execution of ATML test information with the help of embedded system and network technology , which can effectively realize the interchangeability and generalization of system components.

(2) Data bandwidth and delay: LXI (typical bandwidth 12.5MB/s or 125MB/s) does not have advantages over PXI/PXIe (typical bandwidth 132 or 4000MB/s), but by using the test equipment's own computing and storage Resources process or store local raw data, and system bandwidth requirements and pressure can be significantly reduced. In addition, using the LXI trigger and synchronization method can reduce the uncertainty of network delay and effectively guarantee the real-time performance of test operations.

(3) Test efficiency: the present invention can realize the management and allocation of multiple test subtasks, thereby realizing distributed parallel testing and improving the utilization rate of test equipment.

(4) System scalability and cost: LAN is the most stable, open and cheap technical standard in the industry, XML is the information exchange standard for W3C applications, and LXI and ATML have inherited their excellent characteristics. Using LXI as the backbone integration system, with the help of ATML to standardize the information of each link, a highly aggregated, low-coupling, and economical general automatic test system can be constructed.

Description of drawings

FIG. 1 is a schematic diagram of the principle of the existing DoDATS architecture.

FIG. 2 is a schematic diagram of the generalized distributed test system architecture described in the first embodiment.

FIG. 3 is a schematic diagram of the principle of the application of the LXI trigger and synchronization method described in the first embodiment.

FIG. 4 is a schematic diagram of the principle of the application of the ATML standard set described in the first embodiment.

detailed description

Specific embodiment one: illustrate this embodiment in conjunction with Fig. 2, the generalized distributed testing system framework described in this embodiment, it comprises system layer, network connectivity layer and instrument layer;

The system layer includes a test resource description layer, a test signal mapping layer and a test equipment connectivity layer;

The test resource description layer is used to describe the system components and generate ATML description files;

Described ATML description file comprises test task ATML description file, test equipment ATML description file, test station ATML description file and tested equipment ATML description file;

The test signal mapping layer includes a test task management module, a test resource analysis module, a signal mapping module, a trigger resource analysis module, a test task decomposition module and a test task generation module;

The test task management module is used to manage the generated ATML description file, and is also used to create, delete, import/export, search, extract, edit, execute and playback the test task corresponding to the test task ATML description file;

The test resource analysis module is used to summarize and classify the ATML description files of the test equipment, the ATML description files of the test station and the ATML description files of the tested equipment; the ATML description files of the test equipment, the ATML description files of the test station and the ATML description files of the tested equipment are all for testing resources;

The signal mapping module is used to map the test signal in the test task to the test resource, and is also used to map the test process in the test task to the trigger resource.

The trigger resource analysis module is used to collect signals supporting LXI trigger and synchronization functions in the automated test system as trigger resources, and draw system trigger and synchronization resource distribution diagrams according to the test station ATML description file;

The test task decomposition module is used to decompose the mapped test task into multiple test task subsets corresponding to the test equipment in units of test equipment according to the test signal and trigger resources;

The test task generation module is used to combine the test signals and trigger resources in multiple test task subsets corresponding to the test equipment according to the test process of the test task, and generate corresponding multiple ATML test subtasks in chronological order;

The test equipment connection layer is used to communicate with the instrument layer through the network connection layer;

The network connectivity layer is used to connect the test equipment of the instrument layer with the network of the system layer through the LXI interface, and use ATML to realize the intercommunication of information between the devices;

The function of described LXI interface adopts LXI multifunctional carrier board to realize, and described LXI multifunctional carrier board includes ATML explaining layer, test operation layer and equipment/signal driver layer;

The ATML interpretation layer is used to receive ATML test subtasks issued by the system layer and upload ATML test results to the system layer; it is also used to generate local ATML device description files according to the test resources of each test equipment in the instrument layer and upload them to the system layer , which is also used to parse ATML test subtasks into test sequences;

The test operation layer is used to realize the management and scheduling of the test sequence of the test equipment, and pass the test sequence to the test flow controller of the test equipment one by one; using the sequence, loop and branch test structure of the test flow controller, combined with the test The signal timing relationship maps the test operations in the test sequence to a signal-oriented driver library; it is also used to use the communication modules of each test equipment and adopt the LXI/LAN message multicast mechanism to realize the release of test tasks and test equipment status;

The device driver layer is used to refer to the signal component library of the IEEE1641 standard, package and provide a signal-oriented driver library according to the driver program of the test equipment and the driver program of the LXI trigger and synchronization system;

The instrument layer is used to drive the signals of LXI trigger and synchronization functions, cooperate with each test equipment to execute the issued ATML test subtasks, and send the ATML test results.

The test signal mapping layer is mainly based on the import of the test resource description layer or the generated ATML file, and realizes the management and scheduling of system test tasks and resources. The provided functions mainly include management and parsing of ATML test descriptions, and are constructed according to the ATML test description files. The test resource library allocates and maps signal-oriented test tasks, generates test subtask files for each test device and conforms to ATML test description standards, etc. This layer is the core of the system layer, which is one of the essential features different from the centralized system architecture.

The ATML test task description file generated in the test resource description layer can be managed uniformly by the test task management module. System users can create, delete, import/export, search, extract, edit, and execute test tasks in the task management module. It is an integrated software environment for interactive operation with users and management of test tasks.

The test resource analysis module is used to summarize and classify the test resources that ATS can provide. The sources of test resources mainly come from two aspects. One is the description of all test signals that the test equipment in the system can provide in the test equipment description Capability, including three types of signals: source, meter and switch, as well as specific indicators of the test signal, such as signal accuracy, amplitude range, bandwidth, etc.; on the other hand, from the test station description and adapter description, whether the tested signal can be effective The ability to connect to test resources provided by the system.

The signal mapping module can match the test task description with the system resources, which is also divided into two aspects, one is to map the test signal in the test task with the test resources provided by the system, and the other is to map the test process in the test task Mapping with the trigger resources of the system, and finally, an algorithm can be used to map the signals and processes in the test task to the test resources of the system one by one.

In this embodiment, the system operation is driven by trigger resources, and the trigger resource analysis module collects the capabilities of LXI trigger and synchronization functions supported by devices in the system, and draws system trigger and synchronization resource distribution diagrams according to the test station description file. Mapping with the test process in the signal mapping module.

The test task decomposition module further processes the results of the signal mapping module, classifies the system test signals and trigger resources related to the test task with test equipment as a unit, and decomposes the test task into subsets related to multiple test equipment.

The test task generation module combines the test signals and trigger signals in the output results of the test task decomposition module according to the test process, and generates ATML test subtasks in chronological order.

As the connection layer between the system layer and the instrument layer, the network connectivity layer is composed of network switch equipment, test equipment LXI interface and network cables (wireless network does not need network cables) and other equipment, through which the equipment in the system is connected together, On the hardware, LAN is used to realize the interconnection between devices, and ATML is used to realize the intercommunication of information between devices. The network switching device can be a commercial switch (supporting the IEEE1588 protocol or not), and the network cable can also be a commercial product. The LXI test equipment can be directly connected to the network, while the previous bus test equipment, such as GPIB, PXI or VXI equipment, can be connected to the network through the LXI bridge device. In the system architecture of the present invention, the LXI bridge device and the bus device connected thereunder are used as an LXI device, and the test bus in the past is only the content bus in the device, such as the LXI-PXI zero slot is exactly the bridge device from the LXI interface to the PXI bus, The PXI system can be used as a multi-function test equipment, and the PXI bus is only used as the internal bus of the multi-function test equipment, and the connection with the system is realized through the LXI-PXI zero slot. Similarly, for VXI equipment, LXI-VXI zero slot can be used to access the system, for GPIB equipment, LXI/GPIB bridge can be used to access the system, and for other standard or custom types of buses, corresponding LXI bridge equipment can also be used to access In the system, for example, we developed the LXI multi-function test equipment using the M module bus as the internal bus of the test equipment.

In order to ensure that the test equipment can well support the system framework of the present invention, the LXI interface of the test equipment should possess several basic capabilities: (1) can receive the information of ATML, and it is correctly analyzed; (2) after the analysis The result can be correctly mapped with the driver program of the test equipment, and the test action can be executed correctly; (3) The test task program can be run correctly according to the test process and test results. According to the above functions, the LXI interface is composed of three layers: ATML interpretation layer, test operation layer and device driver layer. The LXI bridging device used to communicate with the bus test equipment also needs to include the functions of the above three levels.

The system layer uses the test computer as a carrier, and includes software tools and user interfaces required for management, development, and execution of test and diagnosis tasks;

The network connectivity layer adopts the standard LXI interface to integrate various test equipment and provide information interaction media;

The instrument layer mainly uses intelligent test equipment supporting LXI interface to provide test and diagnosis functions.

The information exchange format within the system layer and the instrument layer, as well as between the system layer and the instrument layer, all follow the ATML standard set. For the collaboration between test equipment and the promotion of test tasks, LXI synchronization and trigger methods are used to provide driving signals. Its basic operating principle is as follows.

(1) Application of test equipment intelligence and information interoperability: the system in this embodiment selects test equipment or bus bridges equipped with expandable software systems, and builds a hybrid test system with LXI as the backbone. With the help of computing, storage and network communication resources of test equipment, the distributed processing and exchange of ATML test information is realized.

a) ATML information analysis application: After expanding the software system of test computer, test equipment or bus bridge, ATML analysis technology can be used to realize the generation, release, analysis and execution of ATML files in each system node, and LXILAN messages or other The network communication mechanism realizes the ATML standard information interaction between the system layer and the instrument layer, test equipment and test equipment, thereby promoting the commonality and interchange of system components.

b) Application of processor and storage resources: test equipment or bus bridge can preprocess or temporarily store the original test data, so as to dynamically utilize the idle bandwidth of the system and relieve the bandwidth pressure of the hybrid test system.

c) Application of test resource management: Equipped with test resource manager software, the test equipment or bus bridge can realize the management and deployment of multiple test subtasks, thereby realizing distributed parallel testing and improving the utilization rate of test equipment.

(2) Synchronization and trigger method application: as shown in Figure 3, each test equipment executes the test task step by step with the test operation as the unit, and the execution of the test operation can be divided into two stages: task loading and test execution: in the task loading stage, The test equipment pre-programs the required test sequence and trigger system; in the test execution phase, the external trigger signal will activate the local test equipment to perform the pre-programmed test operation. The test operation execution driven by the synchronization and trigger method, while alleviating the network delay problem, builds a two-level pipeline mechanism, and can use the multicast mechanism triggered by LXI to realize system status broadcast (such as ① and ⑧) and parallel Test (such as ⑥), the system status broadcast is shown in ① and ⑧ in Figure 3, and the parallel test is shown in ⑥.

(3) ATML standard set application and management: as shown in Figure 4, the generalized distributed test system architecture described in this embodiment selects ATML test description (TestDescription), test equipment description (InstrumentDescription), and test station description (TestStationDescription) , test adapter description (TestAdapterDescription), test result (TestResult), etc. as system test information standards. The software design idea of high aggregation and low coupling is adopted, and ATML is used for information interaction, publishing and calling between components or links, which can effectively guarantee the interchangeability and information interoperability of system components.

Embodiment 2: This embodiment is a further limitation of the generalized distributed test system architecture described in Embodiment 1. The test resource description layer includes a graphical TPS development module, a test description generation module, a test equipment discovery module, a test Result management module, test station description generation module and adapter description generation module;

Graphical TPS development module, used to edit test tasks with graphical tools, describe test signals and test procedures of test tasks, and generate graphical TPS for test tasks;

The test description generation module is used to convert the graphical TPS of the generated test task into the ATML description file of the test task;

A test equipment discovery module, used to discover effective automatic test equipment, and obtain the test equipment ATML description file of the automatic test equipment;

The test result management module is used to manage the ATML description file of the test result;

The test station description generation module is used to describe the actual connection relationship between the test station and other components of the automatic test system, and generate the test station ATML description file;

The adapter description generation module is used to describe the actual connection relationship between the device under test and other components of the automatic test system, and generate an ATML description file for the device under test.

The test resource description layer is a description of system components. ATS usually consists of test stations, automatic test equipment (ATE), adapters, and UUTs. In this embodiment, the ATML specification is used to describe each component of the system, which facilitates the unified management of system resources and the allocation and scheduling of test resources. This layer of data provides the basic management information of the system for the test signal mapping layer.

The graphical TPS development module is used as a graphical description tool for test tasks. System users can use graphical tools to intuitively edit test tasks and describe the test signals and test processes involved in the test tasks.

The test description generation module converts the graphical TPS generated by the graphical TPS development tool into the task code described by ATML, which facilitates the unified management and resource mapping of the TPS by the system.

The function of the test equipment discovery module is to discover the effective automatic test equipment (ATE) in the system, and obtain the standard ATML description file of the ATE, which is used for system management and resource mapping.

The function of the test result management module is to manage the ATML description file of the test result, which is convenient for the analysis and management of the test.

The test station description module is mainly a true description of the components and actual connection relationships in the test station, and generates ATML files, which are managed by the system and used for system resource mapping.

The adapter description generation module is a true description of the actual connection relationship between UUT and ATS, and generates ATML files, which are managed uniformly by the system and used for system resource mapping.

The above modules can be implemented with commercial software tools, and can also be developed into individual tool software or integrated tool software according to requirements.

Embodiment 3: This embodiment is a further limitation of the generalized distributed test system architecture described in Embodiment 1 or 2. The test device connection layer includes a test process management module, a test subtask delivery module, a test A result listening module and a virtual device agent module;

The test process management module is used to monitor the execution of multiple ATML test subtasks and control the execution process of the corresponding tasks according to the returned ATML test results. It is also used to control the execution of multiple ATML test subtasks Normal operation without mutual interference;

The test subtask delivery module is used to deliver multiple ATML test subtasks to the corresponding test equipment;

The test result listening module is used to receive and save the ATML test results conforming to the ATML specification according to the requirements of the test task for the test results;

The virtual device agent module is used to replace the non-smart device to receive the ATML test subtask, analyze the task and call the driver of the non-smart device to control the non-smart device to execute the test action.

The test equipment connection layer mainly contains ATML test description and test result description, and realizes communication with the instrument layer through the LXI interface. The functions provided mainly include sending ATML test sub-tasks, receiving test equipment test result descriptions, listening to system operation information in the network, etc. For test equipment that does not integrate the LXI interface, this layer provides an IVI-based virtual device agent to achieve system expansion and compatibility.

The test process management module is aimed at different test targets or different functions of the same target. The system layer contains multiple test tasks. The task execution process can be monitored by this module and the task execution process can be controlled according to the test output results; for multi-task situations, The test process management module should include a multi-task scheduling mechanism to control the normal operation of tasks without interfering with each other and avoid resource access conflicts.

The test subtask sending module sends the subtasks output by the test task generation module in the test signal mapping layer to the corresponding test equipment.

The test result listening module receives and saves the test result description file conforming to the ATML specification according to the test task's requirement for the test result, which is used for the display and analysis of the test result by the system.

For the legacy bus test equipment, the virtual device agent module cannot receive ATML test subtasks and interpret and execute them because of its lack of intelligence. Therefore, a virtual device interface is set in the system layer to replace these non-intelligent tests The device receives ATML subtasks, parses the tasks and invokes the device driver to control the device to perform test actions.

The reason for the technical limitations of the DoDATS framework is the use of a centralized system architecture centered on test computers, and attempts to solve the interchangeability of system components in the form of standardized software interfaces with the help of technologies such as IVI. The emergence of LXI technology and ATML standard set provides a distributed solution for the construction of general ATS, that is, LXI is used as the backbone of the system, and the intelligent test equipment with independent control, communication and information processing capabilities in the system is interconnected through the network. Test information conforming to the ATML standard set organizes its management tasks, interactive information, and collaborative testing. On the one hand, since ATML is adopted as the test information standard of each link of the system, the interchangeability of test equipment can be effectively enhanced by making full use of its signal-oriented characteristics. On the other hand, since the control subjects of the system and test tasks are transformed into intelligent test equipment, the performance pressure of the system can be effectively relieved with the help of computing, storage, triggering and other resources of the test equipment.

Claims (3)

1. Generalized distributed test system architecture, characterized in that, The architecture includes a system layer, a network connectivity layer and an instrument layer; The system layer includes a test resource description layer, a test signal mapping layer and a test equipment connectivity layer; The test resource description layer is used to describe the system components and generate ATML description files; Described ATML description file comprises test task ATML description file, test equipment ATML description file, test station ATML description file and tested equipment ATML description file; The test signal mapping layer includes a test task management module, a test resource analysis module, a signal mapping module, a trigger resource analysis module, a test task decomposition module and a test subtask generation module; The test task management module is used to manage the generated ATML description file, and is also used to create, delete, import/export, search, extract, edit, execute and playback the test task corresponding to the test task ATML description file; The test resource analysis module is used to summarize and classify the ATML description files of the test equipment, the ATML description files of the test station and the ATML description files of the tested equipment; the ATML description files of the test equipment, the ATML description files of the test station and the ATML description files of the tested equipment are all for testing resources; The signal mapping module is used to map the test signal in the test task to the test resource, and is also used to map the test process in the test task to the trigger resource; The trigger resource analysis module is used to collect signals supporting LXI trigger and synchronization functions in the automated test system as trigger resources, and draw system trigger and synchronization resource distribution diagrams according to the test station ATML description file; The test task decomposition module is used to decompose the mapped test task into multiple test task subsets corresponding to the test equipment in units of test equipment according to the test signal and trigger resources; The test subtask generating module is used to combine test signals and trigger resources in multiple test task subsets corresponding to the test equipment according to the test process of the test task, and generate corresponding multiple ATML test subtasks in chronological order; The test equipment connection layer is used to communicate with the instrument layer through the network connection layer; The network connectivity layer is used to connect the test equipment of the instrument layer with the network of the system layer through the LXI interface, and use ATML to realize the intercommunication of information between the devices; The function of described LXI interface adopts LXI multifunctional carrier board to realize, and described LXI multifunctional carrier board includes ATML explaining layer, test operation layer and equipment/signal driver layer; The ATML interpretation layer is used to receive ATML test subtasks issued by the system layer and upload ATML test results to the system layer; it is also used to generate local ATML device description files according to the test resources of each test equipment in the instrument layer and upload them to the system layer , which is also used to parse ATML test subtasks into test sequences; The test operation layer is used to realize the management and scheduling of the test sequence of the test equipment, and pass the test sequence to the test flow controller of the test equipment one by one; using the sequence, loop and branch test structure of the test flow controller, combined with the test The signal timing relationship maps the test operations in the test sequence to a signal-oriented driver library; it is also used to use the communication modules of each test equipment and adopt the LXI/LAN message multicast mechanism to realize the release of test tasks and test equipment status; The device/signal driver layer is used to refer to the signal component library of the IEEE1641 standard, package and provide a signal-oriented driver library according to the test device driver and the LXI trigger and synchronization system driver; The instrument layer is used to drive the signals of LXI trigger and synchronization functions, cooperate with each test equipment to execute the issued ATML test subtasks, and send the ATML test results. 2. The generalized distributed testing system architecture according to claim 1, wherein, The test resource description layer includes a graphical TPS development module, a test description generation module, a test equipment discovery module, a test result management module, a test station description generation module and an adapter description generation module; Graphical TPS development module, used to edit test tasks with graphical tools, describe test signals and test procedures of test tasks, and generate graphical TPS for test tasks; The test description generation module is used to convert the graphical TPS of the generated test task into the ATML description file of the test task; A test equipment discovery module, used to discover effective automatic test equipment, and obtain the test equipment ATML description file of the automatic test equipment; The test result management module is used to manage the ATML description file of the test result; The test station description generation module is used to describe the actual connection relationship between the test station and other components of the automatic test system, and generate the test station ATML description file; The adapter description generation module is used to describe the actual connection relationship between the device under test and other components of the automatic test system, and generate an ATML description file for the device under test. 3. The generalized distributed testing system architecture according to claim 1, wherein: The test device connection layer includes a test process management module, a test subtask delivery module, a test result listening module and a virtual device agent module; The test process management module is used to monitor the execution of multiple ATML test subtasks and control the execution process of the corresponding tasks according to the returned ATML test results. It is also used to control the execution of multiple ATML test subtasks Normal operation without mutual interference; The test subtask delivery module is used to deliver multiple ATML test subtasks to the corresponding test equipment; The test result listening module is used to receive and save the ATML test results conforming to the ATML specification according to the requirements of the test task for the test results; The virtual device agent module is used to replace the non-smart device to receive the ATML test subtask, parse the ATML test subtask and call the driver of the non-smart device to control the non-smart device to execute the test action.