CN103560066B - Micro scanning time-space resolution measuring system - Google Patents
Micro scanning time-space resolution measuring system Download PDFInfo
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- CN103560066B CN103560066B CN201310556482.4A CN201310556482A CN103560066B CN 103560066 B CN103560066 B CN 103560066B CN 201310556482 A CN201310556482 A CN 201310556482A CN 103560066 B CN103560066 B CN 103560066B
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- micro scanning
- microchannel plate
- measuring system
- pcb substrate
- space resolution
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- 239000000758 substrate Substances 0.000 claims abstract description 19
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims abstract description 16
- 102000029749 Microtubule Human genes 0.000 claims description 8
- 108091022875 Microtubule Proteins 0.000 claims description 8
- 210000004688 microtubule Anatomy 0.000 claims description 8
- 230000000694 effects Effects 0.000 description 6
- 238000003384 imaging method Methods 0.000 description 6
- 238000009432 framing Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 230000003321 amplification Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
Landscapes
- Measurement Of Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
Abstract
A kind of micro scanning time-space resolution measuring system, comprises high voltage source, gate pulse ganerator and micro scanning image converter tube.Micro scanning image converter tube wherein comprise disc flange, coaxial connector, PCB substrate, phosphor screen, without gain microchannel plate, cathode microstrip, external booster and Visible-light CCD.Adopt micro scanning time-space resolution measuring system of the present invention, the photoelectron transit time of outgoing is little, while realization is better than the spatial discrimination of 5 μm, and can the time resolution of significantly elevator system.
Description
Technical field
The present invention relates to the gate framing technology in ultrahigh speed imaging technique, particularly relate to a kind of micro scanning time-space resolution measuring system.
Background technology
Ultrahigh speed imaging is the important tool that the mankind explore outfield.In a way, imaging technique level can determine the level that physics is familiar with.The various dimensions photographic means of high time resolution and high-space resolution is realized under same system, can for exploring the experimental observation means that the fields such as ultra-high speed physical phenomena, plasma physics evolution, cosmogony, biodynamics research provide crucial.In current ultrahigh speed imaging technique, mainly contain two kinds of technology realization means: one is strip-scanning technology, this technology can realize one dimension time resolution and the one-dimensional space is differentiated; Another kind is gate framing technology, and it to provide two-dimensional space to differentiate at present, can realize time-resolved unique technical means simultaneously.
The principle of gate framing technology is by electric pulse gating cathode microstrip, and the gate realizing X-ray is taken a picture, and is obtained the transient images of enough brightness afterwards by image intensifier electron gain.Because both there is time resolution, can two-dimensional imaging be realized again, in laser-produced fusion, plasma physics, fast ignition and astrophysics, obtain extensive use.But in imaging process, the photoelectron produced by X-ray irradiation microstrip line is under the effect of electric field, the microtubule inwall clashing into image intensifier produces secondary electron, secondary electron has certain angle of departure, when by micropore, the secondary electron running orbit of the different angle of departure is different, and thus the transit time is also different, the disperse of this transit time significantly reduces time resolution, constrains the application of gate framing technology.
Summary of the invention
Object of the present invention, exactly in order to overcome the shortcoming of existing gate framing technology in spatial discrimination, provides a kind of micro scanning time-space resolution measuring system.
In order to achieve the above object, present invention employs following technical scheme: a kind of micro scanning time-space resolution measuring system, high time-space resolution two dimensional image for x-ray source is measured, comprise high voltage source and gate pulse ganerator, also comprise micro scanning image converter tube, this micro scanning image converter tube comprise disc flange, coaxial connector, PCB substrate, phosphor screen, without gain microchannel plate, cathode microstrip, external booster and Visible-light CCD; Coaxial connector is arranged on disc flange; PCB substrate is close to and is fixed on the outer face of disc flange; Phosphor screen is held in the central opening of disc flange; Be held in the central opening of PCB substrate without gain microchannel plate, its outer surface flushes with the outer surface of PCB substrate; Cathode microstrip is sputtered at the outer surface without gain microchannel plate and PCB substrate, and its terminal is connected with coaxial connector; External booster is close to fluoroscopic medial surface and is placed; The medial surface that Visible-light CCD is close to external booster is placed.
Described high voltage source is pulsed high voltage generator, and output pulse waveform is square wave.
The strobe pulse that described gate pulse ganerator exports is slope high-voltage pulse.
Described is rounded without gain microchannel plate entirety, and the opening shape of wherein each microtubule is square.
Described cathode microstrip is equally spaced is sputtered at PCB substrate and the outer surface without gain microchannel plate.
Described phosphor screen and without the spacing being provided with 0.2mm-1mm between gain microchannel plate.
Described phosphor screen and without the spacing being provided with 0.6mm between gain microchannel plate.
Compared with prior art, the present invention has following advantage and disadvantage:
1. measuring system of the present invention uses and carries out gating without gain microchannel plate to photoelectron, and the photoelectron transit time of outgoing is little, can the time resolution of significantly elevator system, while the outgoing photoelectronic angle of divergence little, can the spatial discrimination of elevator system.
2. adopt measuring system of the present invention, after photoelectron experience ramp voltage accelerates, there is higher energy, can well distinguish with noise thus, obtain good signal-to noise ratio and export and high dynamic range.
3. adopt measuring system of the present invention, the loss that slope high-voltage pulse transmits in cathode microstrip is little, and the consistency of signal response is good.
Accompanying drawing explanation
Fig. 1 is the structural representation of the micro scanning image converter tube in micro scanning time-space resolution measuring system of the present invention.
Fig. 2 is the flexible PCB in Fig. 1, the combination schematic diagram without gain microchannel plate and cathode microstrip.
Fig. 3 is the scanning theory figure of single microtubule.
Fig. 4 is the waveform forward position schematic diagram of slope high-voltage pulse.
Shown in figure, 1 is PCB substrate, and 2 is cathode microstrip, and 3 is without gain microchannel plate, and 4 is phosphor screen, and 5 is external booster, and 6 is Visible-light CCD, and 7 is disc flange, and 8 is coaxial connector, and 9 is slope high-voltage pulse, and 10 is microtubule, and 11 is square-wave pulse.
Embodiment
See Fig. 1, coordinate see Fig. 2, Fig. 3, Fig. 4, micro scanning time-space resolution measuring system of the present invention, its work energy section is 0.1keV-10keV.This measuring system comprises high voltage source, gate pulse ganerator and micro scanning image converter tube.Wherein, the structural representation of micro scanning image converter tube as indicated with 1, comprise PCB substrate 1, cathode microstrip 2, without gain microchannel plate 3, phosphor screen 4, external booster 5, Visible-light CCD 6, disc flange 7 and coaxial connector 8.
Be held in the central opening of PCB substrate 1 without gain microchannel plate 3, surface flushes with PCB substrate 1, cathode microstrip 2 is parallel, equally spaced to be sputtered at without gain microchannel plate 3 and PCB substrate 1 surface, cathode microstrip terminal is connected with coaxial connector 8, for transmitting electric impulse signal, as shown in Figure 2.PCB substrate 1 is close to and is fixed on disc flange 7 end face, disc flange 7 center opened round mouth, and phosphor screen 4 is held in the central opening of disc flange 7, and be 0.2-1mm with the spacing without gain microchannel plate 3, preferred 0.6mm, fixes with vacuum compound.External booster 5 is close to phosphor screen 4 exit facet and is placed, and the exit facet that Visible-light CCD 6 is close to external booster 5 is placed.
The slope high voltage pulse waveform schematic diagram that the micro scanning principle of this measuring system and gate pulse ganerator export as shown in Figure 3, Figure 4.Produce photoelectron after the incident cathode microstrip 2 of X-ray, photoelectron, moving without in the microtubule 10 of gain microchannel plate 3, moves to phosphor screen under the effect of slope high-voltage pulse 9.Owing to being subject to microtubule 10 spatial limitation, be in voltage V
1electronics (e under effect
1), the conduit wall to transmit direction moves by its movement locus, and collision rift is absorbed; Be in voltage V
3electronics (e under effect
3), the opposite direction conduit wall to transmit direction moves by its movement locus, and collision rift is also absorbed.Only be in voltage V
2electronics (e under effect
2) meet outgoing condition, directly from microtubule 10 rear end outgoing, phosphor screen 4 surface could be incided under the effect of square-wave pulse 11, after the visible ray that phosphor screen 4 produces carries out signal amplification by external booster 5, received acquisition image by Visible-light CCD 6.
Claims (4)
1. a micro scanning time-space resolution measuring system, high time-space resolution two dimensional image for x-ray source is measured, comprise high voltage source and gate pulse ganerator, it is characterized in that: also comprise micro scanning image converter tube, this micro scanning image converter tube comprise disc flange, coaxial connector, PCB substrate, phosphor screen, without gain microchannel plate, cathode microstrip, external booster and Visible-light CCD; Coaxial connector is arranged on disc flange; PCB substrate is close to and is fixed on the outer face of disc flange; Phosphor screen is held in the central opening of disc flange; Be held in the central opening of PCB substrate without gain microchannel plate, its outer surface flushes with the outer surface of PCB substrate; Cathode microstrip is sputtered at the outer surface without gain microchannel plate and PCB substrate, and its terminal is connected with coaxial connector; External booster is close to fluoroscopic medial surface and is placed; The medial surface that Visible-light CCD is close to external booster is placed;
The strobe pulse that described gate pulse ganerator exports is slope high-voltage pulse;
Described is rounded without gain microchannel plate entirety, and the opening shape of wherein each microtubule is square;
Described phosphor screen and without the spacing being provided with 0.2mm-1mm between gain microchannel plate.
2. micro scanning time-space resolution measuring system according to claim 1, is characterized in that: described high voltage source is pulsed high voltage generator, and output pulse waveform is square wave.
3. micro scanning time-space resolution measuring system according to claim 1, is characterized in that: described cathode microstrip is sputtered at PCB substrate and the outer surface without gain microchannel plate equally spacedly.
4. micro scanning time-space resolution measuring system according to claim 1, is characterized in that: described phosphor screen and without the spacing being provided with 0.6mm between gain microchannel plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310556482.4A CN103560066B (en) | 2013-11-11 | 2013-11-11 | Micro scanning time-space resolution measuring system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310556482.4A CN103560066B (en) | 2013-11-11 | 2013-11-11 | Micro scanning time-space resolution measuring system |
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| Publication Number | Publication Date |
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| CN103560066A CN103560066A (en) | 2014-02-05 |
| CN103560066B true CN103560066B (en) | 2016-04-13 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310556482.4A Expired - Fee Related CN103560066B (en) | 2013-11-11 | 2013-11-11 | Micro scanning time-space resolution measuring system |
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Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108183057B (en) * | 2018-01-10 | 2024-03-19 | 深圳大学 | Gain-free microchannel plate image converter tube and gating X-ray framing camera |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1051626A (en) * | 1989-11-09 | 1991-05-22 | 中国科学院西安光学精密机械研究所 | Pickle dividing technique for soft X-ray microstrip travelling wave focal plane shutter picosecond image converter |
| US5369267A (en) * | 1993-05-18 | 1994-11-29 | Intevac, Inc. | Microchannel image intensifier tube with novel sealing feature |
| CN1664981A (en) * | 2004-12-31 | 2005-09-07 | 中国科学院西安光学精密机械研究所 | Reflection type travelling wave gating framing image converter tube |
| CN2773749Y (en) * | 2005-07-26 | 2006-04-19 | 中国科学院西安光学精密机械研究所 | Travelling wave gating framing camera for X-ray micro-channel plate |
-
2013
- 2013-11-11 CN CN201310556482.4A patent/CN103560066B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1051626A (en) * | 1989-11-09 | 1991-05-22 | 中国科学院西安光学精密机械研究所 | Pickle dividing technique for soft X-ray microstrip travelling wave focal plane shutter picosecond image converter |
| US5369267A (en) * | 1993-05-18 | 1994-11-29 | Intevac, Inc. | Microchannel image intensifier tube with novel sealing feature |
| CN1664981A (en) * | 2004-12-31 | 2005-09-07 | 中国科学院西安光学精密机械研究所 | Reflection type travelling wave gating framing image converter tube |
| CN2773749Y (en) * | 2005-07-26 | 2006-04-19 | 中国科学院西安光学精密机械研究所 | Travelling wave gating framing camera for X-ray micro-channel plate |
Non-Patent Citations (1)
| Title |
|---|
| 四通道X射线MCP行波选通分幅相机;山冰，常增虎，刘进元等;《光子学报》;19970531;第26卷(第5期);第449-455页 * |
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| CN103560066A (en) | 2014-02-05 |
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