CN103399015B - Pathological section scanner and slide glass platform positioning precision measuring method thereof and device - Google Patents

Abstract

A pathological slice scanner and a method and device for measuring positioning accuracy of a slide platform, the method includes: loading a characteristic slice on the slide platform; controlling the slide platform to move to a first designated position; acquiring the The first image of the feature slice; after controlling the slide platform to leave the first specified position, then control the slide platform to move to the first specified position; after m times of controlling the slide platform to repeatedly position , acquire the second image of the feature slice; compare the first image with the second image; calculate the slide according to the resolution of the platform positioning device and the offset of the n feature points The accuracy of platform repeat positioning. The present invention acquires images of characteristic slices on the slide platform through the imaging equipment of the pathological slice scanner, avoids the influence of the position change of the laser equipment or the infrared equipment on the measurement results, and thus improves the accuracy of the measurement.

Description

Method and device for measuring positioning accuracy of pathological slice scanner and its loading platform

technical field

The invention relates to the technical field of medical instruments, in particular to a method and device for measuring the positioning accuracy of a pathological slice scanner and a slide platform thereof.

Background technique

As a powerful tool for exploring the microscopic world, the optical microscope has long been used in various medical diagnosis and scientific experimental research. In recent years, with the rapid development of computer processing technology and image processing technology, technologies such as on-line control of microscopes and automatic acquisition of microscopic images have been realized. The digital pathology slide scanner was also born.

Digital pathological slide scanners have very high requirements for the positioning accuracy of the high-precision slide platform (referred to as: slide platform), and a slight deviation may lead to unclear scanning of pathological slides. While the digital pathology slide scanner needs to constantly change the position of the slide platform during scanning. Therefore, accurate positioning of the slide platform is particularly important, and how to measure the repeat positioning accuracy of the slide platform of a digital pathological slide scanner is an urgent problem to be solved.

In the prior art, laser or infrared rays are usually used to detect whether the loading platform has moved to a designated position, so as to further judge whether the repeated positioning of the loading platform is accurate.

The disadvantage of the above solution is: during the measurement process, it is necessary to ensure that the position of the laser device or the infrared device does not change. Since the positioning error of the loading platform is usually at the micron level or even at the nanometer level, a small displacement of the laser device or infrared device will cause a huge error in the measurement, which brings inconvenience to the measurement work. A little carelessness may lead to inaccurate measurement results. At the same time, due to the addition of laser equipment or infrared equipment, the cost of the measurement equipment is also high.

Contents of the invention

The present invention solves the technical problem that measurement errors are likely to be caused by changes in the position of laser equipment or infrared equipment during the measurement process in the prior art method for measuring the repeated positioning accuracy of the slide platform of a digital pathological slide scanner.

In order to solve the above problems, an embodiment of the present invention provides a method for measuring the positioning accuracy of a slide platform of a pathological slide scanner, including:

Loading a feature slice on the slide platform, the feature slice includes n feature points, where n is a natural number;

controlling the slide platform to move to a first designated position;

The first image of the characteristic slice is acquired by the imaging device arranged on the pathological slide scanner, the relative position of the imaging device and the pathological slide scanner is unchanged, and the first image records the slide The position information of the feature points mentioned before the repeated positioning of the platform;

After controlling the slide platform to leave the first specified position, then control the slide platform to move to the first specified position, this step is performed m times, m is a natural number;

After controlling the repeated positioning of the slide platform for m times, acquiring a second image of the characteristic slice through the imaging device, the second image records the position information of the feature points after the repeated positioning of the slide platform;

comparing the first image with the second image to obtain offsets respectively corresponding to the n feature points;

Calculate the repeat positioning accuracy of the slide platform according to the resolution of the platform positioning device and the offsets of the n feature points, and the platform positioning device is used to indicate the movement of the slide platform.

Optionally, the feature slice is a slice with a black cross printed on a white background, the feature slice includes 5 feature points, and the center and 4 endpoints of the cross are used as the 5 feature points.

Optionally, the pathological slide scanner is a digital pathological slide scanner, the imaging device is a digital imaging device, and both the first image and the second image are digital images.

Optionally, the accuracy of repeated positioning of the slide platform is calculated according to the following formula:

${\mathrm{<span\; class="notranslate">\; A</span>}}_{\mathrm{<span\; class="notranslate">\; x</span>}}<span\; class="notranslate">\; =</span>\frac{{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; x</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}}<span\; class="notranslate">\; -</span>{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; x</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}\mathrm{<span\; class="notranslate">\; 0</span>}}}{\mathrm{<span\; class="notranslate">\; no</span>}<span\; class="notranslate">\; \&times;</span>{\mathrm{<span\; class="notranslate">\; R</span>}}_{\mathrm{<span\; class="notranslate">\; x</span>}}}$

${\mathrm{<span\; class="notranslate">\; A</span>}}_{\mathrm{<span\; class="notranslate">\; the\; y</span>}}<span\; class="notranslate">\; =</span>\frac{{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; the\; y</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}}<span\; class="notranslate">\; -</span>{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; the\; y</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}\mathrm{<span\; class="notranslate">\; 0</span>}}}{\mathrm{<span\; class="notranslate">\; no</span>}<span\; class="notranslate">\; \&times;</span>{\mathrm{<span\; class="notranslate">\; R</span>}}_{\mathrm{<span\; class="notranslate">\; the\; y</span>}}}$

Among them, A _x represents the accuracy on the abscissa, A _y represents the accuracy on the ordinate, n represents the number of feature points, R _x represents the resolution of the platform positioning equipment on the abscissa, and R _y represents the platform on the ordinate target device resolution, Indicates the sum of the abscissas of the n feature points after repeated positioning of the slide platform, Indicates the sum of the abscissas of the n feature points before the repeated positioning of the slide platform, Indicates the sum of the ordinates of the n feature points after repeated positioning of the slide platform, Indicates the sum of the ordinates of the n feature points before repeated positioning of the slide platform.

In order to solve the above problems, an embodiment of the present invention also provides a device for measuring the positioning accuracy of a slide platform of a pathological slide scanner, including:

A loading unit, configured to load a feature slice on the slide platform, the feature slice includes n feature points, where n is a natural number;

a first control unit, configured to control the slide platform to move to a first designated position after the loading unit performs an operation;

A first image acquisition unit, configured to acquire a first image of the characteristic slice through an imaging device arranged on the pathological slice scanner after the first control unit performs an operation, the imaging device is connected with the pathological slice The relative position of the slice scanner remains unchanged, and the first image records the position information of the feature points before repeated positioning of the slide platform;

The second control unit is configured to control the slide platform to move to the first specified position after the first image acquisition unit executes the operation and the slide platform leaves the first specified position. Steps are performed m times, m is a natural number;

The second image acquisition unit is configured to acquire a second image of the characteristic slice through the imaging device after the second control unit controls the repeated positioning of the slide platform m times, and the second image records the The position information of the feature points after repeated positioning of the slide platform;

A comparison unit, after the second image acquisition unit performs the operation, compares the first image with the second image to obtain offsets respectively corresponding to the n feature points;

A calculation unit, configured to calculate the repeat positioning accuracy of the slide platform according to the resolution of the platform positioning device and the offset of the n feature points after the comparison unit performs the operation, and the platform positioning device uses To instruct the movement of the slide platform.

Optionally, the feature slice is a slice with a black cross printed on a white background, the feature slice includes 5 feature points, and the center and 4 endpoints of the cross are used as the 5 feature points.

Optionally, the pathological slide scanner is a digital pathological slide scanner, the imaging device is a digital imaging device, and both the first image and the second image are digital images.

Optionally, the accuracy of repeated positioning of the slide platform is calculated according to the following formula:

${\mathrm{<span\; class="notranslate">\; A</span>}}_{\mathrm{<span\; class="notranslate">\; x</span>}}<span\; class="notranslate">\; =</span>\frac{{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; x</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}}<span\; class="notranslate">\; -</span>{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; x</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}\mathrm{<span\; class="notranslate">\; 0</span>}}}{\mathrm{<span\; class="notranslate">\; no</span>}<span\; class="notranslate">\; \&times;</span>{\mathrm{<span\; class="notranslate">\; R</span>}}_{\mathrm{<span\; class="notranslate">\; x</span>}}}$

${\mathrm{<span\; class="notranslate">\; A</span>}}_{\mathrm{<span\; class="notranslate">\; the\; y</span>}}<span\; class="notranslate">\; =</span>\frac{{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; the\; y</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}}<span\; class="notranslate">\; -</span>{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; the\; y</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}\mathrm{<span\; class="notranslate">\; 0</span>}}}{\mathrm{<span\; class="notranslate">\; no</span>}<span\; class="notranslate">\; \&times;</span>{\mathrm{<span\; class="notranslate">\; R</span>}}_{\mathrm{<span\; class="notranslate">\; the\; y</span>}}}$

Among them, A _x represents the accuracy on the abscissa, A _y represents the accuracy on the ordinate, n represents the number of feature points, R _x represents the resolution of the platform positioning equipment on the abscissa, and R _y represents the platform on the ordinate target device resolution, Indicates the sum of the abscissas of the n feature points after repeated positioning of the slide platform, Indicates the sum of the abscissas of the n feature points before the repeated positioning of the slide platform, Indicates the sum of the ordinates of the n feature points after repeated positioning of the slide platform, Indicates the sum of the ordinates of the n feature points before repeated positioning of the slide platform.

In order to solve the above problems, an embodiment of the present invention further provides a pathological slice scanner, including an imaging device arranged on the pathological slice scanner, the relative position of the imaging device and the pathological slice scanner remains unchanged, so The imaging device is used to acquire images of characteristic slices loaded on the slide platform of the pathological slide scanner, and further includes the positioning accuracy measuring device of the slide slide platform of the pathological slide scanner.

Compared with the prior art, the technical solution of the present invention has the following beneficial effects:

The images of the characteristic slices on the slide platform are obtained through the camera equipment of the pathological slide scanner, which avoids the influence of the position changes of the laser equipment or infrared equipment on the measurement results, thereby improving the accuracy of the measurement. At the same time, The cost of the measuring equipment is also reduced.

Further, the feature slice is a slice with a black cross printed on a white background, and the center and 4 endpoints of the cross are used as the 5 feature points, so that the positioning and reading of the feature points are more accurate and convenient .

Further, the imaging device is a digital imaging device, the first image and the second image are digital images, and the calculation is performed in units of pixels, so that the accuracy of the measurement can reach the pixel level, further improving the accuracy of the measurement. accuracy.

Description of drawings

Fig. 1 is a schematic diagram of a pathological slice scanner in an embodiment of the present invention;

Fig. 2 is a flow chart of a method for measuring positioning accuracy of a slide platform of a pathological slice scanner in Embodiment 1 of the present invention;

Fig. 3 is a structural block diagram of the measuring device for positioning accuracy of the slide platform of the pathological slice scanner in the second embodiment of the present invention.

Detailed ways

As shown in Figure 1, in the embodiment of the present invention, the pathological slide scanner includes a slide platform 102 and an imaging device 104, the slide platform 102 is located on the working platform 101, and a characteristic slice is loaded on the slide platform 102 103; the imaging device 104 is located above the loading platform 102, and obtains the image of the feature slice 103 loaded on the loading platform 102 from top to bottom through the objective lens 105; the imaging equipment 104 is set on the On the pathological slide scanner, during the measurement process, the relative position between the imaging device 104 and the pathological slide scanner does not change.

The solution provided in the embodiment of the present invention is used to measure the accuracy of repeated positioning of the slide platform of the pathological slide scanner at the same position, that is: first control the slide platform to leave the first designated position, and then control the slide The platform moves to the first specified position, compares whether the slide platform can be positioned at the same position before and after the repeated positioning operation, measures the error value of the repeated positioning, and combines the platform The resolution of the positioning device is used to calculate the accuracy of repeated positioning.

It can be seen from the above scheme that in the embodiment of the present invention, the image of the characteristic slices on the slide platform is obtained through the camera equipment of the pathological slice scanner, which avoids the change of the position of the laser equipment or infrared equipment from affecting the measurement results. The impact, thereby improving the accuracy of measurement, at the same time, also reduces the cost of measuring equipment.

In order to enable those skilled in the art to better understand and implement the present invention, specific embodiments will be described in detail below with reference to the accompanying drawings.

Embodiment one

Referring to the flow chart of the method for measuring the positioning accuracy of the slide platform of the pathological slide scanner shown in Figure 2, the specific steps are described in detail below:

S201. Load a feature slice on the slide platform, where the feature slice includes n feature points, where n is a natural number.

In order to make subsequent data reading work more accurate and convenient, characteristic slices can be used for measurement. An image with a relatively large contrast between the foreground color and the background color may be set on the feature slice, and the corners of the pattern on the image may be relatively sharp. For example, a slice with a black cross printed on a white background can be used as a feature slice. Take n feature points on the feature slice, where n is a natural number, for example, the center and 4 endpoints of the cross can be taken as feature points, totaling 5 feature points.

It can be seen from the above scheme that in this embodiment, the feature slice is a slice with a black cross printed on a white background, and the center and four endpoints of the cross are used as the five feature points, so that the feature points Positioning and reading are more accurate and convenient.

It can be understood that the feature slice is not limited to a slice printed with a specific pattern, and any slice can be used as long as several points on the slice can be taken as feature points. Usually, the more feature points are taken, the higher the measurement accuracy will be.

S202. Control the slide platform to move to a first designated position.

The first designated position is not limited to a specific position, as long as the imaging device can acquire images of characteristic slices on the slide platform. Considering that the slide platform is usually placed in the middle of the working platform during actual use, the first designated position may be a certain position in the middle of the working platform.

In a specific implementation, the working platform and the pathological slice scanner may be integrally formed, or the pathological slice scanner may be detachably fixed on the working platform. During the test, the positions of the working platform and the pathological slide scanner do not change.

S203. Obtain a first image of the characteristic slice through an imaging device arranged on the pathological slice scanner, the relative position of the imaging device and the pathological slice scanner remains unchanged, and the first image records the The slide platform repeatedly locates the position information of the aforementioned feature points.

The pathological slide scanner has its own imaging device, and the relative position between the imaging device and the pathological slide scanner does not change during the testing process. The imaging device is located above the slide platform, and acquires images of characteristic slices loaded on the slide platform from top to bottom through the objective lens.

In order to better simulate the actual application of the pathological slide scanner, in a specific implementation, the imaging device can be set next to the optical microscope of the pathological slide scanner, and face the same direction as the optical microscope. direction.

It can be seen from the above scheme that in this embodiment, the image of the characteristic slice on the slide platform is obtained through the camera equipment of the pathological slice scanner, which avoids the change of the position of the laser device or the infrared device on the measurement results. Influence, thereby improving the accuracy of the measurement, at the same time, also reduces the cost of the measurement equipment.

The action of acquiring images by the imaging device can be performed according to an operator's instruction, and the operator's instruction can be issued through a button provided on the pathological slide scanner, or can be issued through a software method.

The images obtained by the imaging device can be stored in the memory of the external computer, and subsequent tasks such as comparison and calculation can also be performed by the external computer.

It can be understood that the pathological slide scanner can also have its own memory and processor, so that it does not need an external computer to realize corresponding functions by itself.

S204. Control the slide platform to move to the first specified position after controlling the slide platform to leave the first specified position. This step is performed m times, where m is a natural number.

After the slide platform is controlled to leave the first specified position, the slide platform is then controlled to move to the first specified position. This step is "repeat positioning".

In order to reduce the impact of previous positioning on subsequent positioning, this step can be performed m times, where m is a natural number. In a specific implementation, it may be hundreds or thousands of times.

S205. After controlling the repeated positioning of the slide platform for m times, acquire a second image of the characteristic slice through the imaging device, and the second image records the position of the feature point after the repeated positioning of the slide platform information.

The second image is used for comparison with the first image in a subsequent step, and then the repeat positioning accuracy of the slide platform is calculated. The manner of acquiring and storing the second image is similar to that of the first image.

S206. Compare the first image with the second image to obtain offsets respectively corresponding to the n feature points.

Identify the feature points on the first image and the second image, obtain the offset between the position of the feature point on the first image and the position on the second image, and each feature point All correspond to an offset, therefore, n offsets can be obtained.

Since the first image and the second image are recorded as two-dimensional images, a two-dimensional coordinate system can be established to obtain the offset of the feature points on the x-axis and the offset on the y-axis respectively quantity. In order to simplify the calculation, the x-axis and y-axis perpendicular to each other can be taken.

In the case that the imaging device is a digital imaging device, the offset can be calculated by pixel difference. For example, when the camera device uses a 40x objective lens to take pictures, every 100 pixels on the image captured by the camera device represent a length of 25 microns on the object to be photographed (every 1 mm on the image is 100 pixels).

It can be seen from the above solution that in this embodiment, the imaging device is a digital imaging device, the first image and the second image are both digital images, and the calculation is performed in units of pixels, so that the accuracy measurement can be Reaching the pixel level further improves the accuracy of measurement.

S207. Calculate the repeat positioning accuracy of the slide platform according to the resolution of the platform positioning device and the offsets of the n feature points, where the platform positioning device is used to instruct the movement of the slide platform.

In a specific implementation, the platform positioning device may be a grating ruler. The grating is a sheet composed of strip lenses, and the grating ruler can be used to indicate the movement of the slide platform. The resolution of the grating ruler determines the unit distance that the loading platform moves, and further determines the maximum error value that may be caused by each movement of the loading platform. For example, when a grating ruler with a resolution of 0.05 μm is used to instruct the movement of the slide platform, each movement of the slide platform may cause a maximum error of 0.05 μm. By calculating the ratio of the offset to the maximum error value, the repeat positioning accuracy of the slide platform can be obtained.

In specific implementation, the following formula can be used to calculate the repeat positioning accuracy of the slide platform:

${\mathrm{<span\; class="notranslate">\; A</span>}}_{\mathrm{<span\; class="notranslate">\; x</span>}}<span\; class="notranslate">\; =</span>\frac{{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; x</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}}<span\; class="notranslate">\; -</span>{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; x</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}\mathrm{<span\; class="notranslate">\; 0</span>}}}{\mathrm{<span\; class="notranslate">\; no</span>}<span\; class="notranslate">\; \&times;</span>{\mathrm{<span\; class="notranslate">\; R</span>}}_{\mathrm{<span\; class="notranslate">\; x</span>}}}$

${\mathrm{<span\; class="notranslate">\; A</span>}}_{\mathrm{<span\; class="notranslate">\; the\; y</span>}}<span\; class="notranslate">\; =</span>\frac{{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; the\; y</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}}<span\; class="notranslate">\; -</span>{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; the\; y</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}\mathrm{<span\; class="notranslate">\; 0</span>}}}{\mathrm{<span\; class="notranslate">\; no</span>}<span\; class="notranslate">\; \&times;</span>{\mathrm{<span\; class="notranslate">\; R</span>}}_{\mathrm{<span\; class="notranslate">\; the\; y</span>}}}$

Among them, A _x represents the accuracy on the abscissa, A _y represents the accuracy on the ordinate, n represents the number of feature points, R _x represents the resolution of the platform positioning equipment on the abscissa, and R _y represents the platform on the ordinate target device resolution, Indicates the sum of the abscissas of the n feature points after repeated positioning of the slide platform, Indicates the sum of the abscissas of the n feature points before the repeated positioning of the slide platform, Indicates the sum of the ordinates of the n feature points after repeated positioning of the slide platform, Indicates the sum of the ordinates of the n feature points before repeated positioning of the slide platform.

Embodiment two

Referring to the structural block diagram of the measuring device for positioning accuracy of the slide platform of the pathological slide scanner shown in Figure 3, the measuring device includes: a loading unit, a first control unit, a first image acquisition unit, a second control unit, and a second image acquisition unit , comparison unit and calculation unit, wherein:

A loading unit, configured to load a feature slice on the slide platform, the feature slice includes n feature points, where n is a natural number;

a first control unit, configured to control the slide platform to move to a first designated position after the loading unit performs an operation;

A first image acquisition unit, configured to acquire a first image of the characteristic slice through an imaging device arranged on the pathological slice scanner after the first control unit performs an operation, the imaging device is connected with the pathological slice The relative position of the slice scanner remains unchanged, and the first image records the position information of the feature points before repeated positioning of the slide platform;

The second control unit is configured to control the slide platform to move to the first specified position after the first image acquisition unit executes the operation and the slide platform leaves the first specified position. Steps are performed m times, m is a natural number;

The second image acquisition unit is configured to acquire a second image of the characteristic slice through the imaging device after the second control unit controls the repeated positioning of the slide platform m times, and the second image records the The position information of the feature points after repeated positioning of the slide platform;

A comparison unit, after the second image acquisition unit performs the operation, compares the first image with the second image to obtain offsets respectively corresponding to the n feature points;

A calculation unit, configured to calculate the repeat positioning accuracy of the slide platform according to the resolution of the platform positioning device and the offset of the n feature points after the comparison unit performs the operation, and the platform positioning device uses To instruct the movement of the slide platform.

It can be seen from the above scheme that in this embodiment, the image of the characteristic slice on the slide platform is obtained through the camera equipment of the pathological slice scanner, which avoids the change of the position of the laser device or the infrared device on the measurement results. Influence, thereby improving the accuracy of the measurement, at the same time, also reduces the cost of the measurement equipment.

In a specific implementation, the feature slice is a slice with a black cross printed on a white background, the feature slice includes 5 feature points, and the center and 4 endpoints of the cross are used as the 5 feature points.

It can be seen from the above scheme that in this embodiment, the feature slice is a slice with a black cross printed on a white background, and the center and four endpoints of the cross are used as the five feature points, so that the feature points Positioning and reading are more accurate and convenient.

In a specific implementation, the pathological slide scanner is a digital pathological slide scanner, the imaging device is a digital imaging device, and both the first image and the second image are digital images.

It can be seen from the above solution that in this embodiment, the imaging device is a digital imaging device, the first image and the second image are both digital images, and the calculation is performed in units of pixels, so that the accuracy measurement can be Reaching the pixel level further improves the accuracy of measurement.

In specific implementation, the following formula can be used to calculate the repeat positioning accuracy of the slide platform:

${\mathrm{<span\; class="notranslate">\; A</span>}}_{\mathrm{<span\; class="notranslate">\; x</span>}}<span\; class="notranslate">\; =</span>\frac{{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; x</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}}<span\; class="notranslate">\; -</span>{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; x</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}\mathrm{<span\; class="notranslate">\; 0</span>}}}{\mathrm{<span\; class="notranslate">\; no</span>}<span\; class="notranslate">\; \&times;</span>{\mathrm{<span\; class="notranslate">\; R</span>}}_{\mathrm{<span\; class="notranslate">\; x</span>}}}$

${\mathrm{<span\; class="notranslate">\; A</span>}}_{\mathrm{<span\; class="notranslate">\; the\; y</span>}}<span\; class="notranslate">\; =</span>\frac{{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; the\; y</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}}<span\; class="notranslate">\; -</span>{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; the\; y</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}\mathrm{<span\; class="notranslate">\; 0</span>}}}{\mathrm{<span\; class="notranslate">\; no</span>}<span\; class="notranslate">\; \&times;</span>{\mathrm{<span\; class="notranslate">\; R</span>}}_{\mathrm{<span\; class="notranslate">\; the\; y</span>}}}$

Among them, A _x represents the accuracy on the abscissa, A _y represents the accuracy on the ordinate, n represents the number of feature points, R _x represents the resolution of the platform positioning equipment on the abscissa, and R _y represents the platform on the ordinate target device resolution, Indicates the sum of the abscissas of the n feature points after repeated positioning of the slide platform, Indicates the sum of the abscissas of the n feature points before the repeated positioning of the slide platform, Indicates the sum of the ordinates of the n feature points after repeated positioning of the slide platform, Indicates the sum of the ordinates of the n feature points before repeated positioning of the slide platform.

Embodiment Three

As shown in Figure 1, in the present embodiment, the pathological slide scanner includes a slide platform 102 and an imaging device 104, the slide platform 102 is located on a working platform 101, and a characteristic slice 103 is loaded on the slide platform 102 The imaging device 104 is located above the slide platform 102, and the image of the feature slice 103 loaded on the slide platform 102 is acquired from top to bottom through the objective lens 105; the imaging equipment 104 is arranged on the pathology On the slide scanner, during the measurement process, the relative position of the imaging device 104 and the pathological slide scanner does not change.

The pathological slice scanner also includes the positioning accuracy measurement device of the pathological slice scanner slide platform provided in the second implementation, and the positioning accuracy measurement method of the pathological slide scanner slide platform provided in the first embodiment is used to measure the repeated positioning of the slide platform accuracy.

In a specific implementation, the pathological slide scanner may be a digital pathological slide scanner.

It can be seen from the above scheme that in this embodiment, the image of the characteristic slice on the slide platform is obtained through the camera equipment of the pathological slice scanner, which avoids the change of the position of the laser device or the infrared device on the measurement results. Influence, thereby improving the accuracy of the measurement, at the same time, also reduces the cost of the measurement equipment.

Those of ordinary skill in the art can understand that all or part of the steps in the various methods of the above-mentioned embodiments can be completed by instructing related hardware through a program, and the program can be stored in a computer-readable storage medium, and the storage medium can include: ROM, RAM, disk or CD, etc.

Although the present invention is disclosed above, the present invention is not limited thereto. Any person skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention, so the protection scope of the present invention should be based on the scope defined in the claims.

Claims (9)

1. A method for measuring positioning accuracy of a pathological slide scanner loading platform, is characterized in that, the accuracy that the slide loading platform of a pathological slide scanner is repeatedly positioned at the same position is measured, including: Loading a feature slice on the slide platform, the feature slice includes n feature points, where n is a natural number; controlling the slide platform to move to a first designated position; The first image of the characteristic slice is acquired by the imaging device arranged on the pathological slide scanner, the relative position of the imaging device and the pathological slide scanner is unchanged, and the first image records the slide The position information of the feature points mentioned before the repeated positioning of the platform; After controlling the slide platform to leave the first specified position, then control the slide platform to move to the first specified position, this step is performed m times, m is a natural number; After controlling the repeated positioning of the slide platform for m times, acquiring a second image of the characteristic slice through the imaging device, the second image records the position information of the feature points after the repeated positioning of the slide platform; comparing the first image with the second image to obtain offsets respectively corresponding to the n feature points; According to the resolution of the platform positioning device and the offsets of the n feature points, the repeat positioning accuracy of the slide platform is calculated, wherein the platform positioning device is a grating ruler, and the grating ruler is used to indicate the The movement of the slide platform, the resolution of the grating ruler determines the maximum error value that may be caused by each movement of the slide platform. By calculating the ratio of the offset to the maximum error value, the repetition rate of the slide platform is obtained. Positioning accuracy. 2. The method for measuring positioning accuracy of a pathological slide scanner slide platform as claimed in claim 1, wherein the feature slice is a slice with a black cross printed on a white background, and the feature slice includes 5 feature points, Take the center and 4 endpoints of the cross as the 5 feature points. 3. The method for measuring positioning accuracy of a slide platform of a pathological slice scanner according to claim 1, wherein the pathological slice scanner is a digital pathological slice scanner, the imaging device is a digital imaging device, and the first The first image and the second image are both digital images. 4. the method for measuring the positioning accuracy of the slide platform of the pathological slide scanner as claimed in claim 1, is characterized in that, calculates the accuracy of repeated positioning of the slide platform according to the following formula: ${\mathrm{<span\; class="notranslate">\; A</span>}}_{\mathrm{<span\; class="notranslate">\; x</span>}}<span\; class="notranslate">\; =</span>\frac{{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; x</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}}<span\; class="notranslate">\; -</span>{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; x</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}\mathrm{<span\; class="notranslate">\; 0</span>}}}{\mathrm{<span\; class="notranslate">\; no</span>}<span\; class="notranslate">\; \&times;</span>{\mathrm{<span\; class="notranslate">\; R</span>}}_{\mathrm{<span\; class="notranslate">\; x</span>}}}$ ${\mathrm{<span\; class="notranslate">\; A</span>}}_{\mathrm{<span\; class="notranslate">\; the\; y</span>}}<span\; class="notranslate">\; =</span>\frac{{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; the\; y</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}}<span\; class="notranslate">\; -</span>{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; the\; y</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}\mathrm{<span\; class="notranslate">\; 0</span>}}}{\mathrm{<span\; class="notranslate">\; no</span>}<span\; class="notranslate">\; \&times;</span>{\mathrm{<span\; class="notranslate">\; R</span>}}_{\mathrm{<span\; class="notranslate">\; the\; y</span>}}}$ Among them, A _x represents the accuracy on the abscissa, A _y represents the accuracy on the ordinate, n represents the number of feature points, R _x represents the resolution of the platform positioning equipment on the abscissa, and R _y represents the platform on the ordinate target device resolution, Indicates the sum of the abscissas of the n feature points after repeated positioning of the slide platform, Indicates the sum of the abscissas of the n feature points before the repeated positioning of the slide platform, Indicates the sum of the ordinates of the n feature points after repeated positioning of the slide platform, Indicates the sum of the ordinates of the n feature points before repeated positioning of the slide platform. 5. A device for measuring the positioning accuracy of the slide platform of a pathological slide scanner, characterized in that the accuracy of repeatedly positioning the slide platform of the pathological slide scanner at the same position is measured, including: A loading unit, configured to load a feature slice on the slide platform, the feature slice includes n feature points, where n is a natural number; a first control unit, configured to control the slide platform to move to a first designated position after the loading unit performs an operation; A first image acquisition unit, configured to acquire a first image of the characteristic slice through an imaging device arranged on the pathological slice scanner after the first control unit performs an operation, the imaging device is connected with the pathological slice The relative position of the slice scanner remains unchanged, and the first image records the position information of the feature points before repeated positioning of the slide platform; The second control unit is configured to control the slide platform to move to the first specified position after the first image acquisition unit executes the operation and the slide platform leaves the first specified position. Steps are performed m times, m is a natural number; The second image acquisition unit is configured to acquire a second image of the characteristic slice through the imaging device after the second control unit controls the repeated positioning of the slide platform m times, and the second image records the The position information of the feature points after repeated positioning of the slide platform; A comparison unit, after the second image acquisition unit performs the operation, compares the first image with the second image to obtain offsets respectively corresponding to the n feature points; A calculation unit, configured to calculate the repeat positioning accuracy of the slide platform according to the resolution of the platform positioning device and the offsets of the n feature points after the comparison unit performs the operation, wherein the platform positioning The equipment is a grating ruler, and the grating ruler is used to indicate the movement of the loading platform. The resolution of the grating ruler determines the maximum error value that may be caused by each movement of the loading platform. By calculating the offset relative to the The ratio of the above-mentioned maximum error value obtains the accuracy of the repeated positioning of the slide platform. 6. The device for measuring positioning accuracy of the slide platform of a pathological slide scanner as claimed in claim 5, wherein the feature slice is a slice with a black cross printed on a white background, and the feature slice includes 5 feature points, Take the center and 4 endpoints of the cross as the 5 feature points. 7. The device for measuring positioning accuracy of a slide platform of a pathological slice scanner according to claim 5, wherein the pathological slice scanner is a digital pathological slice scanner, the imaging device is a digital imaging device, and the first The first image and the second image are both digital images. 8. The device for measuring the positioning accuracy of the slide platform of a pathological slide scanner as claimed in claim 5, wherein the repeat positioning accuracy of the slide platform is calculated according to the following formula: ${\mathrm{<span\; class="notranslate">\; A</span>}}_{\mathrm{<span\; class="notranslate">\; x</span>}}<span\; class="notranslate">\; =</span>\frac{{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; x</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}}<span\; class="notranslate">\; -</span>{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; x</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}\mathrm{<span\; class="notranslate">\; 0</span>}}}{\mathrm{<span\; class="notranslate">\; no</span>}<span\; class="notranslate">\; \&times;</span>{\mathrm{<span\; class="notranslate">\; R</span>}}_{\mathrm{<span\; class="notranslate">\; x</span>}}}$ ${\mathrm{<span\; class="notranslate">\; A</span>}}_{\mathrm{<span\; class="notranslate">\; the\; y</span>}}<span\; class="notranslate">\; =</span>\frac{{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; the\; y</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}}<span\; class="notranslate">\; -</span>{\mathrm{<span\; class="notranslate">\; \&Sigma;</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}<span\; class="notranslate">\; =</span>\mathrm{<span\; class="notranslate">\; 1</span>}}^{\mathrm{<span\; class="notranslate">\; no</span>}}{\mathrm{<span\; class="notranslate">\; the\; y</span>}}_{\mathrm{<span\; class="notranslate">\; i</span>}\mathrm{<span\; class="notranslate">\; 0</span>}}}{\mathrm{<span\; class="notranslate">\; no</span>}<span\; class="notranslate">\; \&times;</span>{\mathrm{<span\; class="notranslate">\; R</span>}}_{\mathrm{<span\; class="notranslate">\; the\; y</span>}}}$ Among them, A _x represents the accuracy on the abscissa, A _y represents the accuracy on the ordinate, n represents the number of feature points, R _x represents the resolution of the platform positioning equipment on the abscissa, and R _y represents the platform on the ordinate target device resolution, Indicates the sum of the abscissas of the n feature points after repeated positioning of the slide platform, Indicates the sum of the abscissas of the n feature points before the repeated positioning of the slide platform, Indicates the sum of the ordinates of the n feature points after repeated positioning of the slide platform, Indicates the sum of the ordinates of the n feature points before repeated positioning of the slide platform. 9. A pathological slice scanner, characterized in that it includes an imaging device arranged on the pathological slice scanner, the relative position of the imaging device and the pathological slice scanner remains unchanged, and the imaging device is used for The acquisition of images of characteristic slices loaded on the slide platform of the pathological slide scanner also includes the device for measuring positioning accuracy of the slide slide platform of the pathological slide scanner according to any one of claims 5 to 8.