CN103368640B - Expansion optical module digital diagnostic monitoring improved system - Google Patents
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- 238000013154 diagnostic monitoring Methods 0.000 title claims abstract description 30
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- 150000001875 compounds Chemical class 0.000 claims abstract description 6
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Abstract
A kind of expansion optical module digital diagnostic monitoring improved system, comprising: light-receiving secondary module, light emission secondary module, limiting amplifier, for providing the laser driver of drive current, microcontroller and digital regulation resistance, memory cell to described smooth emission secondary module; Also comprise sampling module and switch module; Switch module comprises field effect transistor, sampling module comprises the first sampling resistor and the second sampling resistor, microcontroller is also for detecting input voltage, when input voltage reaches setting threshold, the conducting of control switch module, sampling module exports the compound electric resistance of the first sampling resistor and the second sampling resistor; Now expanding the numerical diagnostic monitoring range of optical module is the first power bracket.When input voltage is lower than setting threshold, control switch module is ended, and sampling module exports the resistance value of the first sampling resistor.Now expanding the numerical diagnostic monitoring range of optical module is the second power bracket.Therefore, it is possible to increase original monitoring range, and improve monitoring precision.
Description
Technical field
The present invention relates to optical module improvement opportunity, particularly relate to a kind of system improving expansion optical module digital diagnostic monitoring scope and precision.
Background technology
Optical module is divided into DDM(digital diagnostic monitoring, numerical diagnostic) function and without DDM function two kinds, there is DDM function and be namely called intelligent optical module.Utilize intelligentized optical module, network management unit can the temperature of Real-Time Monitoring transceiver module, supply power voltage, laser bias current and transmitting and receiving luminous power.The measurement of these parameters, can help network management unit to find out the position of breaking down in optical fiber link, simplifies maintenance work, improves the reliability of system.
Conventional DDM scheme divides again hardware and microcontroller two kinds, and wherein hardware plan application is simple but lack flexibility, and microcontroller scheme needs to write corresponding software and is configured it and just can uses, and the great advantage based on software is that flexibility is good.General all with microcontroller scheme as Research foundation.
In SFF-8472MSA, specification digital diagnosis function and the detailed content about SFF-8472, comprise range ability, quantization resolution, error requirements etc.
5 parameters that SFF-8472 regulation DDM must monitor:
5 parameters all need carry out analog-to-digital conversion by the ADC of microcontroller becomes 16bit numerical chracter, and therefore range is 0 ~ 65535.Wherein received optical power, utilizing emitted light power, laser bias current all need outside input analog voltage to carry out sample conversion to the ADC of microcontroller; Supply voltage and temperature are generally completed by the transducer that microcontroller is built-in and sample and input ADC.
In practical application, these 4 parameter ranges of utilizing emitted light power, laser bias current, supply voltage, temperature only account for the sub-fraction in gamut, so be easy to the requirement meeting range and error.And the scope of received optical power is usually very wide, such as 155M PIN+TIA receiving sensitivity is very common from-3 to-33dBm.But the microcontroller that optical module is commonly used in the industry is the C8051F33X series of Silicon Laboratories, and its ADC only has 10bit, and " full scale offset error " is maximum reaches ± 15LSB.That is in ideal conditions, range is 0 ~ 1023, can only meet-3 ~-33dBm(1000 doubly) quantisation depth of ± 3dB.But consider offset error, the poorest actual usable range just only has 15 ~ 1023,1023/15=68.2 doubly, if will meet quantization error < ± 3dB, corresponding operable reference optical power only 18.3dB, does not obviously reach total power monitoring requirement.
Because above-mentioned reason, always have a certain proportion of product DDM metrical error in production process not up to standard, usually need to change microcontroller or sampling resistor, thus have impact on production efficiency and add product unsteadiness.
Summary of the invention
Based on this, a kind of avoiding is provided to change the expansion optical module digital diagnostic monitoring improved system that microcontroller just can improve monitoring range and precision.
A kind of expansion optical module digital diagnostic monitoring improved system, comprising: light-receiving secondary module, light emission secondary module, limiting amplifier, for providing the laser driver of drive current, microcontroller and digital regulation resistance, memory cell to described smooth emission secondary module; Also comprise sampling module and switch module;
Described light-receiving secondary module is connected with described limiting amplifier and described microcontroller respectively, described memory cell is connected with described microcontroller, described digital regulation resistance is connected with described laser driver and described microcontroller respectively, and described laser driver is also connected with described smooth emission secondary module;
Described microcontroller comprises ADC interface and I
2c controller; Described ADC interface is connected with the output of described sampling module, and the input of described sampling module is connected with the output of described light-receiving secondary module, described I
2the input of C controller is connected with the output of described limiting amplifier, described I
2the output of C controller is connected with described memory cell;
Described switch module comprises field effect transistor, described sampling module comprises the first sampling resistor and the second sampling resistor, the control end of described field effect transistor is connected with the signal switching output interface of described microcontroller, described second sampling resistor is connected with described field effect transistor, described first sampling resistor is parallel to described second sampling resistor and described field effect transistor two ends, and described first sampling resistor is connected with described ADC interface with the common port of described second sampling resistor;
Described microcontroller is for detecting ADC input voltage, and when described input voltage reaches setting threshold, control described switch module conducting, described sampling module exports the compound electric resistance of the first sampling resistor and the second sampling resistor; When described input voltage is lower than setting threshold, control the cut-off of described switch module, described sampling module exports the resistance value of the first sampling resistor.
Wherein in an embodiment, also comprise filtration module, described filtration module comprises filter capacitor, and described filter capacitor is in parallel with described first sampling resistor.
Wherein in an embodiment, the input voltage range of described ADC interface is 0-2.4V.
Wherein in an embodiment, the resistance value of described first sampling resistor is 100k Ω, and the resistance value of described second sampling resistor is 5k Ω.
Wherein in an embodiment, the setting threshold of described input voltage is 2.4V.
Wherein in an embodiment, described field effect transistor is NMOS tube.
Wherein in an embodiment, the model of described microcontroller is C8051F330.
Above-mentioned expansion optical module digital diagnostic monitoring improved system by increasing the second sampling resistor and switch module between the ADC interface and light-receiving secondary module of microcontroller; Switch module ends lower than during setting threshold at the ADC input voltage of microcontroller, thus control sampling module exports the first sampling resistor, and now expanding the numerical diagnostic monitoring range of optical module is the first power bracket.Switch module greater than or equal to conducting during setting threshold at microcontroller ADC input voltage, thus controls sampling module and exports compound sampling resistance, and now expanding the numerical diagnostic monitoring range of optical module is the second power bracket.Therefore, it is possible to increase original monitoring range, and improve monitoring precision.
Accompanying drawing explanation
Fig. 1 is the module map of expansion optical module digital diagnostic monitoring improved system;
Fig. 2 is the sampling section circuit theory diagrams of photogenerated current signal;
Fig. 3 is the input of ADC interface and the switching signal output schematic diagram of microcontroller;
Fig. 4 is the monitoring error chart before improving;
Fig. 5 is the monitoring error chart after improving.
Embodiment
As shown in Figure 1, be the module map of expansion optical module digital diagnostic monitoring improved system.
A kind of expansion optical module digital diagnostic monitoring improved system, comprising: light-receiving secondary module 110, light emission secondary module 120, limiting amplifier 130, for providing the laser driver 150 of drive current, microcontroller 140 and digital regulation resistance 170, memory cell 160 to described smooth emission secondary module; Also comprise sampling module 180 and switch module 190.
Described light-receiving secondary module 110 is connected with described limiting amplifier 130 and described microcontroller 140 respectively, described memory cell 160 is connected with described microcontroller 140, described digital regulation resistance 170 is connected with described laser driver 150 and described microcontroller 140 respectively, and described laser driver 150 is also connected with described smooth emission secondary module 120.
Described microcontroller 140 comprises ADC interface 142 and I
2c controller 144; Described ADC interface 142 is connected with the output of described sampling module 180, and the input of described sampling module 180 is connected with the output of described light-receiving secondary module 110, described I
2the input of C controller 144 is connected with the output of described limiting amplifier 130, described I
2the output of C controller 144 is connected with described memory cell 160.
Incorporated by reference to Fig. 2 and Fig. 3.Described switch module 190 comprises field effect transistor, described sampling module 180 comprises the first sampling resistor and the second sampling resistor, the control end of described field effect transistor is connected with the signal switching output interface of described microcontroller 140, described second sampling resistor is connected with described field effect transistor, described first sampling resistor is parallel to described second sampling resistor and described field effect transistor two ends, described first sampling resistor is connected with described ADC interface 142 with the common port of described second sampling resistor, namely ADC interface 142 is outputted to from the sample RXPOWER that obtains of light-receiving secondary module 110 through this common port.
Described microcontroller 140 is also for detecting input voltage, and when described input voltage reaches setting threshold, control the conducting of described switch module 190, described sampling module exports the compound electric resistance of the first sampling resistor and the second sampling resistor; When described input voltage is lower than setting threshold, control described switch module 190 and end, described sampling module exports the resistance value of the first sampling resistor.
Driving chip process rear drive semiconductor laser (LD) of the signal of telecommunication that light emission secondary module 120 inputs a constant bit rate through inside or light-emitting diode (LED) launch the modulated light signal of respective rate, its inside, with luminous power automatic control circuit, makes the optical signal power of output keep stable.Light-receiving secondary module 110 is converted to the signal of telecommunication by optical detection diode after the light signal input module of a constant bit rate.The signal of telecommunication of phase code rate is exported after preamplifier.
The effect of optical module is exactly opto-electronic conversion, and transmitting terminal converts light signal to the signal of telecommunication, and after being transmitted by optical fiber, receiving terminal converts the signal of telecommunication to light signal again.
Limiting amplifier 130 exports to next stage circuit after carrying out limited range enlargement for the signal of telecommunication exported by light-receiving secondary module 110.Limiting amplifier 130 can suppress the change at a slow speed of data signal amplitude, and the amplitude of signal also can be suppressed comparatively fast to change.There is not the time constant problem in gain-controlled amplifier.The basic structure of limiting amplifier 130 comprises a series of differential amplification unit and a DC feedback loop.The nonlinear device of current amplifier and so on is usually used in limiting amplifier 130.When adopting field effect transistor to form differential amplifier, its basic circuit form is source-coupled FET logical circuit.
Memory cell 160 is for storing I
2c controller export signal and pass through I
2the downward stage circuit output signal of C bus.
Digital regulation resistance 170 is by I
2c controller, EEPROM, digital resistance form.Digital resistance is the important component part of digital regulation resistance, and it passes through I by microcontroller
2c bus sets its corresponding resistance value, and EEPROM is for storing set point.
The sampling resistor value that switch module 190 exports for controlling sampling module 180.The sampling resistor value that sampling module 180 exports determines the power bracket of expansion optical module digital diagnostic monitoring.
Expansion optical module digital diagnostic monitoring improved system also comprises filtration module, and described filtration module comprises filter capacitor, and described filter capacitor is in parallel with described first sampling resistor.
The input voltage range of described ADC interface is 0-2.4V.
The resistance value of the first sampling resistor is 100k Ω, and the resistance value of described second sampling resistor is 5k Ω.
The setting threshold of input voltage is 2.4V.
Field effect transistor is NMOS tube.
The model of microcontroller is C8051F330.
The circuit theory of sampling module 180: received optical power pilot signal is derived from the photogenerated current signal (RSSI) of photodiode, is converted into voltage parameter input ADC on sampling resistor.Adopt the sampling resistor of high and low two resistances to be switched by condition and realize high and low two ranges, after switching range, be automatically multiplied by resistance multiplying power obtain real ADC value, quantified precision during low light can be ensured, the nominal input voltage range of ADC when also ensureing high light, can not be exceeded.
First recognize that the ADC input voltage range of the F33x series of microcontroller 140 is: 0 ~ 2.4V, 10bit, i.e. 1LSB=2.4V/1024 ≈ 2.34mV.The offset error of the poorest general 15LSB, if meet ± 3dB error requirements, the corresponding quantized value of initial input signal can not be less than 15LSB, i.e. 15*2.34mV=35mV, determine required low wide resistance sampling resistor RL >=35mV/Ipin (L) thus, separately determine the little resistance sampling resistor RH≤2.4V/Ipin (H) needed for high light according to ADC maximum input voltage 2.4V and Ipin (H).
Several the 155Mbps ROSA(light receiving elements according to taking a sample test at random) received optical power and RSSI output current, confirm that the linearity is good, fixing responsiveness is maintained within the scope of whole available optical powers, and according to current value and error expected < ± 3dB, determine the first sampling resistor RL=100K, the second sampling resistor RH=5K, combination multiplying power is 21 times, and two ranges can continuous sampling exponent number=68*21=1428, i.e. 31.5dB scope in theory.
Based on above-mentioned all embodiments, the operation principle of expansion optical module digital diagnostic monitoring improved system is as follows:
The digital diagnosis function of optical module inputs ADC interfaces 142 by 5 parameter signals, carry out quantizing and after algorithm calibration stored in memory cell 160, host computer to read by SFF-8472 agreement according to the value stored and is converted to corresponding analog quantity numerical value.
The electric current that the Imon pin of light-receiving secondary module ROSA flows out and received luminous power proportional (being determined by the responsiveness of PIN/APD and coupling efficiency), current signal, through filter capacitor C33 filtering, the first sampling resistor R25 produces pressure drop.This voltage sends into ADC interface through quantizing and generating the magnitude of power meeting SFF-8472 agreement after computing as RX POWER signal.Because the first sampling resistor R25 value is larger, so very faint electric current just can produce enough voltage signals.
Microcontroller 140 detects ADC input voltage in real time, when this voltage is no more than 2.4V, switching signal output (SWITCH OUT) exports as the low level of LOW is to field effect transistor N-MOSFET gate pole, field effect transistor not conducting, so the first sampling resistor R25 is as sampling resistor during low light, be responsible for this section of power bracket from Pmin to <Pmax.
When increasing along with received optical power, when the ADC input voltage of microcontroller 140 reaches 2.4V, switching signal output (SWITCH OUT) exports as the high level of HI is to field effect transistor N-MOSFET gate pole, field effect transistor conducting.Second sampling resistor R26 entry loop, combined resistance is 100K//5K=4.76K, and resistance is kept to 1/21 of former 100K.When electric current is identical, sampled voltage also reduces to 2.4V/21=114.3mV, the value also corresponding reduction 21 times that ADC interface 142 quantizes, the memory cell 160 so restore after needing to take advantage of the algorithm of 21 to ADC value simultaneously, such received optical power just can continue to increase, just can be saturated until again reach 2.4V, this section of working range is Pmin*21 to Pmax*21.
In order to avoid causing IO to export concussion at switching point because voltage floats, so need software to increase back stagnant condition, be set to 10% time stagnant coefficient in the present embodiment, Absorbable organic halogens work.For preventing secondary misoperation, when controlling to switch output for HI, even if ADC input voltage reaching 2.4V again, also no longer carrying out switching action and quantizing multiplying power process.
Incorporated by reference to the test result chart of Fig. 4 and Fig. 5.By the SFP module of above-mentioned expansion optical module digital diagnostic monitoring improved system design, actual measurement RX POWER monitoring range is basically identical with theory calculate, can reach-33 ~-2dBm, and precision is better than expecting, reaches ± 1dB.
Above-mentioned expansion optical module digital diagnostic monitoring improved system by increasing sampling module 180 and switch module 190 between the ADC interface 142 and light-receiving secondary module 110 of microcontroller 140; Switch module 190 ends lower than during setting threshold at the output voltage of microcontroller 140, thus control sampling module 180 exports the first sampling resistor, and now expanding the numerical diagnostic monitoring range of optical module is the first power bracket.Switch module 190 at microcontroller 140 output voltage greater than or equal to conducting during setting threshold, thus control the compound sampling resistance that sampling module 180 exports the first sampling resistor and the second sampling resistor, now expanding the numerical diagnostic monitoring range of optical module is the second power bracket.Therefore, it is possible to increase original monitoring range, and improve monitoring precision.
The above embodiment only have expressed several execution mode of the present invention, and it describes comparatively concrete and detailed, but therefore can not be interpreted as the restriction to the scope of the claims of the present invention.It should be pointed out that for the person of ordinary skill of the art, without departing from the inventive concept of the premise, can also make some distortion and improvement, these all belong to protection scope of the present invention.Therefore, the protection range of patent of the present invention should be as the criterion with claims.
Claims (8)
1. expand an optical module digital diagnostic monitoring improved system, comprising: light-receiving secondary module, light emission secondary module, limiting amplifier, for providing the laser driver of drive current, microcontroller and digital regulation resistance, memory cell to described smooth emission secondary module; It is characterized in that, also comprise sampling module and switch module;
Described light-receiving secondary module is connected with described limiting amplifier and described microcontroller respectively, described memory cell is connected with described microcontroller, described digital regulation resistance is connected with described laser driver and described microcontroller respectively, and described laser driver is also connected with described smooth emission secondary module;
Described microcontroller comprises ADC interface and I
2c controller; Described ADC interface is connected with the output of described sampling module, and the input of described sampling module is connected with the output of described light-receiving secondary module, described I
2the input of C controller is connected with the output of described limiting amplifier, described I
2the output of C controller is connected with described memory cell;
Described switch module comprises field effect transistor, described sampling module comprises the first sampling resistor and the second sampling resistor, the control end of described field effect transistor is connected with the signal switching output interface of described microcontroller, described second sampling resistor is connected with described field effect transistor, described first sampling resistor be parallel to described second sampling resistor connect with described field effect transistor after two ends, described first sampling resistor is connected with described ADC interface with the common port of described second sampling resistor;
Described microcontroller is also for detecting input voltage, and when described input voltage reaches setting threshold, control described switch module conducting, described sampling module exports the compound electric resistance of the first sampling resistor and the second sampling resistor; When described input voltage is lower than setting threshold, control the cut-off of described switch module, described sampling module exports the resistance value of the first sampling resistor.
2. expansion optical module digital diagnostic monitoring improved system according to claim 1, it is characterized in that, also comprise filtration module, described filtration module comprises filter capacitor, and described filter capacitor is in parallel with described first sampling resistor.
3. expansion optical module digital diagnostic monitoring improved system according to claim 1, is characterized in that, the input voltage range of described ADC interface is 0-2.4V.
4. expansion optical module digital diagnostic monitoring improved system according to claim 1, is characterized in that, the resistance value of described first sampling resistor is 100k Ω, and the resistance value of described second sampling resistor is 5k Ω.
5. expansion optical module digital diagnostic monitoring improved system according to claim 1, is characterized in that, the setting threshold of described input voltage is 2.4V.
6. expansion optical module digital diagnostic monitoring improved system according to claim 1, it is characterized in that, described microcontroller is also for detected temperatures.
7. expansion optical module digital diagnostic monitoring improved system according to claim 1, it is characterized in that, described field effect transistor is NMOS tube.
8. expansion optical module digital diagnostic monitoring improved system according to claim 1, is characterized in that, the model of described microcontroller is C8051F330.
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| CN105553556B (en) * | 2015-12-08 | 2017-12-08 | 深圳天珑无线科技有限公司 | A kind of data transmission method and transmission equipment |
| CN106849890A (en) * | 2016-12-26 | 2017-06-13 | 北京航天易联科技发展有限公司 | A kind of optical fiber security signal collection conditioning amplifying circuit |
| CN107231190A (en) * | 2017-07-21 | 2017-10-03 | 东莞铭普光磁股份有限公司 | A kind of optical power monitoring circuit and method |
| CN111835429B (en) * | 2020-08-04 | 2021-11-09 | 国家电网有限公司信息通信分公司 | Optical module, method for correcting transmitting optical power of optical module and controller |
| CN112511221A (en) * | 2020-10-30 | 2021-03-16 | 武汉联特科技股份有限公司 | Method and equipment for improving receiving and reporting monitoring power range of optical module |
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| CN102185658A (en) * | 2011-05-16 | 2011-09-14 | 浙江工业大学 | Intelligent light receiving and transmitting module capable of automatically adjusting emitted light power |
| CN102394692A (en) * | 2011-10-26 | 2012-03-28 | 索尔思光电（成都）有限公司 | DDMI optical module receiving end monitoring circuit and burst-mode luminous-power monitoring method thereof |
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