CN103365330A - Reference voltage/current generator - Google Patents
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Abstract
Description
技术领域 technical field
本发明涉及一种参考电压/电流产生装置,且特别是一种可同时产生温度无关的参考电压及参考电流的参考电压/电流产生装置。The invention relates to a reference voltage/current generating device, in particular to a reference voltage/current generating device capable of simultaneously generating temperature-independent reference voltage and reference current.
背景技术 Background technique
在科技发展日新月异的现今时代中,温度无关供电电路被开发出来,以针对多种具温度敏感特性的负载电路进行供电操作。一般来说,现有的温度无关供电电路应用多个具有不同温度特性的子单元,例如是一个可提供正温度系数电信号的子单元及一个可提供负温度系数电信号的子单元;并将此正温度系数电信号及此负温度系数电信号进行加总,藉此提供与温度变化实质上无关的参考电信号。然而,如何设计出更便利的温度无关供电电路,以针对相关的具温度敏感特性的负载电路提供更理想的温度无关电信号,为业界不断致力的方向之一。In today's era of rapid technological development, temperature-independent power supply circuits have been developed to provide power for various load circuits with temperature-sensitive characteristics. Generally speaking, the existing temperature-independent power supply circuit uses a plurality of subunits with different temperature characteristics, for example, a subunit that can provide an electrical signal with a positive temperature coefficient and a subunit that can provide an electrical signal with a negative temperature coefficient; and The positive temperature coefficient electrical signal and the negative temperature coefficient electrical signal are summed to provide a reference electrical signal that is substantially independent of temperature changes. However, how to design a more convenient temperature-independent power supply circuit to provide a more ideal temperature-independent electrical signal for the relevant load circuit with temperature-sensitive characteristics is one of the directions that the industry is constantly working on.
发明内容 Contents of the invention
本揭露提出一种参考电压/电流产生装置,其具有噪声抵抗能力较高的优点。此参考电压/电流产生装置中的温度无关电压源可使用操作于饱和区的N通道MOS晶体管作为电流偏压晶体管,其偏压电流较不容易因为供电电压扰动而跟着变动,故参考电压/电流产生装置可产生较稳定的参考电压。This disclosure proposes a reference voltage/current generating device, which has the advantage of high noise immunity. The temperature-independent voltage source in this reference voltage/current generating device can use an N-channel MOS transistor operating in the saturation region as a current bias transistor, and its bias current is less likely to change due to supply voltage disturbances, so the reference voltage/current The generating device can generate a relatively stable reference voltage.
根据本揭露的第一方面,提出一种参考电压/电流产生装置,包括温度无关电压源、镜射单元电压转电流单元及电流合成单元。温度无关电压源根据具有负温度系数的接面压差产生具有正温度系数的第一电流及具有零温度系数的参考电压。镜射单元耦接至温度无关电压源,并根据第一电流镜射得到具有正温度系数的第二电流,并依据第二电流产生具有负温度系数的接面电压。电压转电流单元耦接至镜射单元,并将接面电压转换得到具有负温度系数的第三电流。电流合成单元耦接至镜射单元以镜射第二电流得到第四电流,及耦接至电压转电流单元以镜射第三电流得到第五电流,并将第四电流与第五电流合成为具有零温度系数的参考电流。According to a first aspect of the present disclosure, a reference voltage/current generating device is provided, including a temperature-independent voltage source, a mirror unit, a voltage-to-current unit, and a current synthesis unit. The temperature independent voltage source generates a first current with a positive temperature coefficient and a reference voltage with a zero temperature coefficient according to the junction pressure difference with a negative temperature coefficient. The mirroring unit is coupled to a temperature-independent voltage source, mirrors the first current to obtain a second current with a positive temperature coefficient, and generates a junction voltage with a negative temperature coefficient according to the second current. The voltage-to-current unit is coupled to the mirror unit, and converts the junction voltage to obtain a third current with a negative temperature coefficient. The current combining unit is coupled to the mirroring unit to mirror the second current to obtain a fourth current, and is coupled to the voltage-to-current unit to mirror the third current to obtain a fifth current, and synthesizes the fourth current and the fifth current into Reference current with zero temperature coefficient.
为了对本发明的上述及其他方面有更佳的了解,下文特举优选实施例,并配合附图,作详细说明如下:In order to have a better understanding of the above-mentioned and other aspects of the present invention, the preferred embodiments are specifically cited below, together with the accompanying drawings, and are described in detail as follows:
附图说明 Description of drawings
图1绘示依照本发明实施例的参考电压/电流产生装置的电路图。FIG. 1 is a circuit diagram of a reference voltage/current generating device according to an embodiment of the present invention.
图2绘示依照本发明实施例的参考电压/电流产生装置的另一电路图。FIG. 2 is another circuit diagram of a reference voltage/current generating device according to an embodiment of the present invention.
图3绘示依照本发明实施例的参考电压/电流产生装置的再一电路图。FIG. 3 is another circuit diagram of a reference voltage/current generating device according to an embodiment of the present invention.
【主要元件符号说明】[Description of main component symbols]
1、2、4:参考电压/电流产生装置1, 2, 4: Reference voltage/current generating device
100、120、140:温度无关电压源100, 120, 140: temperature independent voltage source
101、121、141:运算放大器101, 121, 141: operational amplifiers
102、122、142:带隙参考电路102, 122, 142: band gap reference circuit
M1:偏压金属氧化物半导体晶体管M1: Bias Metal-Oxide-Semiconductor Transistor
A、B、No:节点A, B, No: nodes
R1-R3:电阻R1-R3: Resistors
Q1、Q2:接面晶体管Q1, Q2: junction transistors
200、220、240:镜射单元200, 220, 240: mirror unit
M2:镜射金属氧化物半导体晶体管M2: mirror metal oxide semiconductor transistor
R4:电阻R4: Resistor
D:节点D: node
Q3:接面晶体管Q3: junction transistor
300、320、340:电压转电流单元300, 320, 340: voltage to current unit
301、321、341:运算放大器301, 321, 341: operational amplifiers
R5:电阻R5R5: Resistor R5
C:节点C: node
M7:偏压金属氧化物半导体晶体管M7: Bias Metal-Oxide-Semiconductor Transistor
400、420、440:电流合成单元400, 420, 440: current synthesis unit
401、402、421、422、441、442:镜射单元401, 402, 421, 422, 441, 442: Mirror unit
E:合成节点E: synthesis node
M3-M6:晶体管M3-M6: Transistors
Q1’、Q2′:接面晶体管Q1', Q2': Junction transistors
Q1”、Q2″:接面晶体管Q1", Q2": Junction transistors
具体实施方式 Detailed ways
在本发明的范例实施例中,参考电压/电流产生装置具有噪声抵抗能力较高的优点。在一些实施例中,参考电压/电流产生装置中的温度无关电压源使用操作于饱和区的N通道MOS晶体管作为电流偏压晶体管,其偏压电流较不容易因为供电电压扰动而跟着变动,故参考电压/电流产生装置可产生较稳定的参考电压。为更清楚地了解本发明,以下将配合附图,以至少一范例实施例来作详细说明。此外,以下实施例中所提到的连接用语,例如:耦接或连接等,仅是参考附加图式用以例示说明,并非用来限制实际上两个元件之间的连接关系是直接耦接或间接耦接。In the exemplary embodiment of the present invention, the reference voltage/current generating device has the advantage of high noise immunity. In some embodiments, the temperature-independent voltage source in the reference voltage/current generating device uses an N-channel MOS transistor operating in the saturation region as a current bias transistor, and its bias current is less likely to follow fluctuations due to supply voltage disturbances, so The reference voltage/current generating device can generate a relatively stable reference voltage. In order to understand the present invention more clearly, at least one exemplary embodiment will be described in detail below with reference to the accompanying drawings. In addition, the connection terms mentioned in the following embodiments, such as: coupling or connection, etc., are only used for illustration with reference to the attached drawings, and are not used to limit the fact that the connection relationship between two elements is direct coupling. or indirect coupling.
请参照图1,其绘示依照本发明实施例的参考电压/电流产生装置的电路图。本实施例的参考电压/电流产生装置1包括温度无关电压源100、镜射单元200、电压转电流单元300及电流合成单元400,其中温度无关电压源100与镜射单元200耦接;镜射单元200与电压转电流单元300及电流合成单元400耦接;电压转电流单元300更与电流合成单元400耦接。Please refer to FIG. 1 , which shows a circuit diagram of a reference voltage/current generating device according to an embodiment of the present invention. The reference voltage/
温度无关电压源100根据具有负温度系数N的接面压差VBE,产生具有正温度系数P的电流I1以及具有零温度系数的参考电压Vref。举例来说,温度无关电压源100包括运算放大器101、偏压金属氧化物半导体晶体管M1及带隙参考电路102。带隙参考电路102包括节点A、B、No、电阻R1-R3及接面晶体管Q1及Q2,其中电阻R2及R3分别耦接在节点B及No之间及节点A及No之间;接面晶体管Q1及Q2例如为PNP双载子接面晶体管(Bipolar Junction Transistor,BJT),其的射极分别耦接至节点A及分别经由电阻R1耦接至节点B,基极与集极接收接地电压GND。The temperature
运算放大器101具有正极性输入端、负极性输入端及输出端,其中正极性及负极性输入端分别耦接至节点A及B。偏压金属氧化物半导体晶体管101的栅极耦接至运算放大器101的输出端,以响应于运算放大器101输出端的电压电平Vb来产生电流I1。The
优选地,偏压金属氧化物半导体晶体管101为N通道金属氧化物半导体晶体管,其的漏极接收供电电压VDD,源极耦接至节点No。据此,即便供电电压VDD因噪声或其他不理想因素而发生电平不稳定的情形时,供电电压VDD的电平波动仅会对应地使偏压金属氧化物半导体晶体管101的漏极电平发生波动,而不会影响到偏压金属氧化物半导体晶体管101的栅极及源极电平。此外,对于操作在饱和区中的金属氧化物半导体晶体管来说,其的漏极电流大小主要与其的栅极-源极电压差相关,而实质上不与其的漏极电压相关。据此,利用N通道金属氧化物半导体晶体管来实现温度无关电压源100中的偏压金属氧化物半导体晶体管101,可使本实施例的温度无关电压源100对于供电电压VDD具有实质上较高的噪声抵抗能力,而即便在供电电压VDD的电平不稳定的情况下,温度无关电压源100仍能有效地提供稳定的电流I1。Preferably, the bias metal-oxide-
带隙参考电路102系经由节点A、B及No分别耦接至运算放大器101的正极性输入端、负极性输出端及偏压金属氧化物半导体晶体管M1的源极。带隙参考电路102产生接面压差VBE,并根据电流I1与接面压差VBE得到参考电压Vref。The
进一步来说,接面压差VBE例如为接面晶体管Q1的基极-源极电压VBE1及接面晶体管Q2的基极-源极电压VBE2的差,其可以下列方程式表示:Further, the junction voltage difference V BE is, for example, the difference between the base-source voltage V BE1 of the junction transistor Q1 and the base-source voltage V BE2 of the junction transistor Q2, which can be expressed by the following equation:
其中K、T及q分别为波尔兹曼常数(Boltzmann Constant)、绝对温度值及单位电荷常数;IS1及IS2分别为接面晶体管Q1及Q2的饱和电流值;IQ1及IQ2分别为流经接面晶体管Q1及Q2的射极电流。Among them, K, T and q are Boltzmann constant (Boltzmann Constant), absolute temperature value and unit charge constant; I S1 and I S2 are the saturation current values of junction transistors Q1 and Q2 respectively; I Q1 and I Q2 are respectively is the emitter current flowing through the junction transistors Q1 and Q2.
假设接面晶体管Q2及Q1的饱和电流IS2及IS1的比值为M∶1,且射极电流IQ1及IQ2为实质上相等,则可依据上述方程式进行推导,以下列方程式分别表达射极电流IQ1、IQ2及参考电压Vref:Assuming that the ratio of the saturation currents I S2 and I S1 of the junction transistors Q2 and Q1 is M:1, and the emitter currents I Q1 and I Q2 are substantially equal, the derivation can be carried out according to the above equations, and the emitter currents can be expressed by the following equations respectively: Pole current I Q1 , I Q2 and reference voltage Vref:
其中M为正实数。对于参考电压Vref来说,其方程式等号右侧第一项及第二项分别对应至负温度系数N及对应至正温度系数P。据此,经由调整参考电压Vref方程式中的第一项及第二项的比例可使其对应的负温度系数N及正温度系数P相互抵销,使得参考电压Vref具有实质上等于零的温度系数。where M is a positive real number. For the reference voltage Vref, the first term and the second term on the right side of the equation correspond to the negative temperature coefficient N and the positive temperature coefficient P, respectively. Accordingly, by adjusting the ratio of the first term and the second term in the reference voltage Vref equation, the corresponding negative temperature coefficient N and positive temperature coefficient P can cancel each other out, so that the reference voltage Vref has a temperature coefficient substantially equal to zero.
镜射单元200根据电流I1镜射得到具有正温度系数P的电流I2,并依据电流I2产生具有负温度系数N的接面电压VBE3。镜射单元200例如包括镜射金属氧化物半导体晶体管M2、电阻R4、节点D及接面晶体管Q3,其中镜射金属氧化物半导体晶体管M2的源极耦接至电阻R4的一端,电阻R4的另一端耦接至节点D;接面晶体管Q3的射极耦接至节点D。The
镜射金属氧化物半导体晶体管M2的栅极耦接至偏压金属氧化物半导体晶体管M1的栅极,使得镜射金属氧化物半导体晶体管M2及偏压金属氧化物半导体晶体管M1栅极均接收运算放大器101的输出端提供的电压电平Vb,而将电流I1镜射得到电流I2。当电流I2决定之后,即决定接面晶体管Q3的接面电压VBE3的大小。换句话说,接面晶体管Q3依据电流I2来产生接面电压VBE3。值得注意的是,在一优选实施例中,可安排镜射单元200中的镜射金属氧化物半导体晶体管M2、电阻R4及接面晶体管Q3与温度无关电压源100中的偏压金属氧化物半导体晶体管M1、电阻R3及接面晶体管Q1具有对应的结构,且各对应的元件具有实质上相同的元件特性。换句话说,偏压金属氧化物半导体晶体管M1及镜射金属氧化物半导体晶体管M2、电阻R4及R3与接面晶体管Q3及Q1分别为实质上相同的电路元件。据此,经由针对偏压金属氧化物半导体晶体管M1及镜射金属氧化物半导体晶体管M2施加实质上相同的电压电平Vb,可在镜射单元200端映射得具有正温度系数P的电流I2(实质上等于电流I1)及具有负温度系数N的接面电压VBE3(实质上等于接面电压VBE1)。换句话说,镜射单元200不仅是镜射电流I1,更可镜射接面电压VBE1。The gate of the mirrored MOS transistor M2 is coupled to the gate of the biased MOS transistor M1 such that both the gates of the mirrored MOS transistor M2 and the biased MOS transistor M1 receive the operational amplifier The voltage level Vb provided by the output terminal of 101 mirrors the current I1 to obtain the current I2. After the current I2 is determined, the magnitude of the junction voltage V BE3 of the junction transistor Q3 is determined. In other words, the junction transistor Q3 generates the junction voltage V BE3 according to the current I2. It should be noted that, in a preferred embodiment, the mirroring MOS transistor M2, the resistor R4 and the junction transistor Q3 in the
电压转电流单元300将接面电压VBE3转换得到具有负温度系数N的电流I3。举例来说,电压电流转换单元300包括运算放大器301、电阻R5、节点C及偏压金属氧化物半导体晶体管M7。运算放大器301的正极性输入端、负极性输入端及输出端分别耦接至镜射电路200的节点D、节点C及耦接至偏压金属氧化物半导体晶体管M7的栅极;偏压金属氧化物半导体晶体管M7的源极耦接节点C;电阻R5的两端分别耦接至节点C及接收接地电压GND。The voltage-to-
运算放大器301实质上使节点C及D为虚短路(Virtual Shorted),以使得节点C与接面电压VBE3具有实质上相同的电平。据此,电阻R5响应于施加于其两端的接面电压VBE3产生具有负温度系数N的电流I3。The
电流合成单元400镜射电流I2得到电流IPTAT,以及镜射电流I3得到电流ICTAT,并将电流IPTAT及ICTAT合成为具有零温度系数的参考电流Iref。电流合成单元400包括电流镜单元401、402及合成节点E。电流镜单元401耦接至镜射单元200与合成节点E之间,以镜射电流I2得到电流IPTAT。举例来说,电流镜单元401包括晶体管M4及M3,其的源极接收供电电压VDD,栅极相互耦接,漏极分别耦接至合成节点E及耦接至镜射金属氧化物半导体晶体管M2的漏极。The
电流镜单元402耦接至电压转电流单元300与合成节点E之间,以镜射电流I3得到电流ICTAT。举例来说,电流镜单元402包括晶体管M6及M5,其的源极接收供电电压VDD,栅极相互耦接,漏极分别耦接至合成节点E及耦接至偏压金属氧化物半导体晶体管M7的漏极。The
综合以上,本实施例的参考电压/电流产生装置1可同时提供实质上具有零温度系数的参考电流Iref及参考电压Vref。In summary, the reference voltage/
在本实施例中,虽仅以参考电压/电流产生装置1具有如图1所示的电路结构的情形为例作说明,然而,本实施例的参考电压/电疗产生装置1并不局限于此。在其他例子中,电压转电流单元300中的运算放大器301的正极性输入端也可耦接至温度无关电压源100中的节点A,藉此经由虚短路效应使得节点C对应地具有接面电压VBE1。In this embodiment, although the reference voltage/
在另一个例子中,温度无关电压源120及镜射单元220中的接面晶体管Q1′至Q3′也可改以NPN BJT来实现,如图2所示。在再一个例子中,温度无关电压源140及镜射单元240中的接面晶体管Q1″至Q3″的耦接关系也可具有如图3所示的结构。In another example, the junction transistors Q1 ′ to Q3 ′ in the temperature-
本实施例的参考电压/电流产生装置应用温度无关电压源,来提供具正温度系数的第一电流、具负温度系数的接面压差及零温度系数的参考电压。本实施例的参考电压/电流产生装置还应用镜射单元来根据第一电流及接面压差镜射得到具此正温度系数的第二电流及据此负温度系数的接面电压,并应用电压转电流单元来根据此接面电压得到具有此负温度系数的第三电流。本实施例的参考电压/电流产生装置还应用电流合成单元,来分别根据此第二电流及第三电流分别镜射得到具此正温度系数的第四电流及据此负温度系数的第五电流,并据以合成得到实质上具零温度系数的参考电流。据此,相较于传统参考电压或参考电流装置,本实施例的参考电压/电流产生装置可同时提供实质上具零温度系数的参考电压及参考电流的优点。The reference voltage/current generating device of this embodiment uses a temperature-independent voltage source to provide the first current with a positive temperature coefficient, the junction voltage difference with a negative temperature coefficient, and the reference voltage with a zero temperature coefficient. The reference voltage/current generating device of this embodiment also uses a mirroring unit to mirror the first current and the junction voltage difference to obtain the second current with the positive temperature coefficient and the junction voltage with the negative temperature coefficient accordingly, and apply The voltage-to-current unit obtains the third current with the negative temperature coefficient according to the junction voltage. The reference voltage/current generating device of this embodiment also employs a current synthesis unit to obtain the fourth current with the positive temperature coefficient and the fifth current with the negative temperature coefficient according to the second current and the third current respectively by mirroring. , and synthesized accordingly to obtain a reference current with substantially zero temperature coefficient. Accordingly, compared with conventional reference voltage or reference current devices, the reference voltage/current generating device of this embodiment can simultaneously provide the advantages of a reference voltage and a reference current with substantially zero temperature coefficient.
此外,在本实施例的参考电压/电流产生装置的温度无关电压源中,使用N通道MOS晶体管作为电流偏压晶体管,其中此N通道MOS晶体管经由其的漏极来接收供电电压VDD。据此,即便供电电压VDD因噪声或其他不理想因素而发生电平不稳定的情形时,其电平波动仅会对应地使此偏压金属氧化物半导体晶体管的漏极电平发生波动,而不会影响到偏压金属氧化物半导体晶体管101的栅极及源极电平及其偏压电流。据此,相较于传统参考电压或参考电流产生装置,本发明部分实施例的参考电压/电流产生装置更具有噪声抵抗能力较高的优点。In addition, in the temperature-independent voltage source of the reference voltage/current generating device of this embodiment, an N-channel MOS transistor is used as a current bias transistor, wherein the N-channel MOS transistor receives the supply voltage VDD through its drain. Accordingly, even if the level of the power supply voltage VDD is unstable due to noise or other unfavorable factors, its level fluctuation will only correspondingly cause the drain level of the bias metal-oxide-semiconductor transistor to fluctuate, and The gate and source levels of the bias metal-oxide-
综上所述,虽然本发明已以优选实施例公开如上,然其并非用以限定本发明。本领域技术人员在不脱离本发明的精神和范围内,当可作各种的更动与润饰。因此,本发明的保护范围当视所附权利要求书所界定者为准。In summary, although the present invention has been disclosed as above with preferred embodiments, it is not intended to limit the present invention. Those skilled in the art may make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention should be defined by the appended claims.
Claims (9)
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Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104460805A (en) * | 2014-12-17 | 2015-03-25 | 内蒙古科技大学 | Reference current source with low temperature coefficient and low power supply voltage coefficient |
CN107066023A (en) * | 2015-11-16 | 2017-08-18 | 德州仪器德国股份有限公司 | Low voltage-current mode band-gap circuit and method |
CN111665897A (en) * | 2020-06-19 | 2020-09-15 | 浙江驰拓科技有限公司 | Voltage stabilizing power supply circuit with negative temperature coefficient |
CN112416044A (en) * | 2020-12-03 | 2021-02-26 | 电子科技大学 | Voltage reference circuit with high power supply rejection ratio |
CN112558672A (en) * | 2020-12-24 | 2021-03-26 | 上海贝岭股份有限公司 | Reference current source and chip comprising same |
CN113778162A (en) * | 2021-10-27 | 2021-12-10 | 北京士模微电子有限责任公司 | Bandgap reference voltage generating circuit, integrated circuit, and electronic device |
CN116149420A (en) * | 2023-03-10 | 2023-05-23 | 上海艾为电子技术股份有限公司 | A Zero Temperature Drift Current Generating Circuit |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006031246A (en) * | 2004-07-14 | 2006-02-02 | Seiko Epson Corp | Reference current generator |
CN101042591A (en) * | 2006-03-24 | 2007-09-26 | 智原科技股份有限公司 | Bandgap reference circuit for low supply voltage and method for supplying bandgap reference current |
US20090261893A1 (en) * | 2008-04-17 | 2009-10-22 | Noriyasu Kumazaki | Semiconductor device including cell transistor and cell capacitor |
US20100117721A1 (en) * | 2008-11-12 | 2010-05-13 | Novatek Microelectronics Corp. | Generator and method for generating reference voltage and reference current |
CN102354250A (en) * | 2011-08-25 | 2012-02-15 | 西安电子科技大学 | Band-gap reference circuit applied to passive ultra-high frequency radio frequency identification device (UHFRFID) label chip |
TW201214080A (en) * | 2010-09-21 | 2012-04-01 | Novatek Microelectronics Corp | Circuit and method for generating reference voltage and reference current |
-
2012
- 2012-04-09 CN CN201210102047XA patent/CN103365330A/en active Pending
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006031246A (en) * | 2004-07-14 | 2006-02-02 | Seiko Epson Corp | Reference current generator |
CN101042591A (en) * | 2006-03-24 | 2007-09-26 | 智原科技股份有限公司 | Bandgap reference circuit for low supply voltage and method for supplying bandgap reference current |
US20090261893A1 (en) * | 2008-04-17 | 2009-10-22 | Noriyasu Kumazaki | Semiconductor device including cell transistor and cell capacitor |
US20100117721A1 (en) * | 2008-11-12 | 2010-05-13 | Novatek Microelectronics Corp. | Generator and method for generating reference voltage and reference current |
TW201214080A (en) * | 2010-09-21 | 2012-04-01 | Novatek Microelectronics Corp | Circuit and method for generating reference voltage and reference current |
CN102354250A (en) * | 2011-08-25 | 2012-02-15 | 西安电子科技大学 | Band-gap reference circuit applied to passive ultra-high frequency radio frequency identification device (UHFRFID) label chip |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104460805A (en) * | 2014-12-17 | 2015-03-25 | 内蒙古科技大学 | Reference current source with low temperature coefficient and low power supply voltage coefficient |
CN107066023A (en) * | 2015-11-16 | 2017-08-18 | 德州仪器德国股份有限公司 | Low voltage-current mode band-gap circuit and method |
CN111665897A (en) * | 2020-06-19 | 2020-09-15 | 浙江驰拓科技有限公司 | Voltage stabilizing power supply circuit with negative temperature coefficient |
CN112416044A (en) * | 2020-12-03 | 2021-02-26 | 电子科技大学 | Voltage reference circuit with high power supply rejection ratio |
CN112558672A (en) * | 2020-12-24 | 2021-03-26 | 上海贝岭股份有限公司 | Reference current source and chip comprising same |
CN113778162A (en) * | 2021-10-27 | 2021-12-10 | 北京士模微电子有限责任公司 | Bandgap reference voltage generating circuit, integrated circuit, and electronic device |
CN116149420A (en) * | 2023-03-10 | 2023-05-23 | 上海艾为电子技术股份有限公司 | A Zero Temperature Drift Current Generating Circuit |
CN116149420B (en) * | 2023-03-10 | 2024-11-26 | 上海艾为电子技术股份有限公司 | A zero temperature drift current generating circuit |
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