CN103344899B - A kind of scaling method of photoelectricity voltage-current characteristic parameter of back contacts solar cell - Google Patents
A kind of scaling method of photoelectricity voltage-current characteristic parameter of back contacts solar cell Download PDFInfo
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- CN103344899B CN103344899B CN201310267604.8A CN201310267604A CN103344899B CN 103344899 B CN103344899 B CN 103344899B CN 201310267604 A CN201310267604 A CN 201310267604A CN 103344899 B CN103344899 B CN 103344899B
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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Abstract
The invention discloses a kind of scaling method of photoelectricity voltage-current characteristic parameter of back contacts solar cell, comprise the steps: that (1) arranges insulating barrier relative to the position of each sensitive surface electrode on the shady face of back contacts solar cell to be calibrated; (2) the one-level tap of the conventional solar cell demarcated by professional institution is adopted, sensitive surface electrode test probe, shady face electrode test probe are contacted respectively sensitive surface electrode and the shady face electrode of described one-level tap, by revising the software parameter of test platform, make the measured value of one-level tap consistent with calibration value; (3) sensitive surface electrode test probe, shady face electrode test probe are contacted respectively sensitive surface electrode and the shady face electrode of back contacts solar cell to be calibrated, measured value is calibration value.This invention exploits a kind of method that one-level tap based on conventional solar cell demarcates the photoelectricity voltage-current characteristic parameter of back contacts solar cell, achieve the demarcation of variety classes solar cell.
Description
Technical field
The present invention relates to a kind of scaling method of photoelectricity voltage-current characteristic parameter of back contacts solar cell, belong to technical field of solar.
Background technology
Along with the extensive use of solar module, photovoltaic generation more and more occupies important proportion in new forms of energy, obtains develop rapidly.Solar power generating device is also called solar cell or photovoltaic cell, and its electricity generating principle is the photovoltaic effect of based semiconductor PN junction.
Double contact battery is a kind of general solar cell, and the method for demarcating this cell photoelectric voltage-current characteristic parameter is the demarcation between similar solar cell.The both positive and negative polarity of double contact solar cell is placed in light and shady face respectively, when demarcating the photoelectricity voltage-current characteristic parameter of such battery, normally by the one-level tap of the solar cell of the same type demarcated by professional institution, with sensitive surface electrode test probe 20, shady face electrode test probe 40 contacts sensitive surface electrode 10 and the shady face electrode 30 of one-level tap respectively, shown in accompanying drawing 1, by revising the software parameter of test platform, make the measured value of one-level tap consistent with calibration value, when measuring other similar solar cells so again, also the photoelectricity voltage-current characteristic parameter of other similar solar cells has just been demarcated.
Along with the development of solar energy generation technology, in order to improve the efficiency of the photoelectric conversion of the sun, people have developed the back contacts solar cell of new class, be characterized in that the sensitive surface of solar cell reduces or do not arrange electrode, and by technological means, the electric current that script sensitive surface produces is guided to shady face, and positive and negative electrode is set in shady face relevant position, thus the shading of sensitive surface can be reduced, increase photoelectric conversion efficiency, and be beneficial to being interconnected between photocell.
For this class battery, electrode due to sensitive surface runs through and extends to shady face, and when adopting the testing equipment of above-mentioned routine to detect, positive and negative probe is needed to contact sensitive surface electrode and shady face electrode respectively, arrangement due to probe is tight and fixing, therefore can touch sensitive surface electrode and the shady face electrode at the back side at the probe of shady face simultaneously, thus cause short circuit.
For addressing this problem, existing way is that test probe is all arranged on the back side, and the both positive and negative polarity of probe contacts shady face electrode respectively and runs through and extend to the sensitive surface electrode of shady face, as shown in Figure 2.But this test mode needs and the diverse test platform of conventional solar cell and one-level tap.
Summary of the invention
The object of the invention is to provide a kind of scaling method of photoelectricity voltage-current characteristic parameter of back contacts solar cell.
For achieving the above object, the technical solution used in the present invention is: a kind of scaling method of photoelectricity voltage-current characteristic parameter of back contacts solar cell, comprises the steps:
(1) on the shady face of back contacts solar cell to be calibrated, insulating barrier is set relative to the position of each sensitive surface electrode, each sensitive surface electrode on shady face is insulated;
(2) the one-level tap of the conventional solar cell demarcated by professional institution is adopted, sensitive surface electrode test probe, shady face electrode test probe are contacted respectively sensitive surface electrode and the shady face electrode of described one-level tap, by revising the software parameter of test platform, make the measured value of one-level tap consistent with calibration value;
(3) sensitive surface electrode test probe, shady face electrode test probe are contacted respectively sensitive surface electrode and the shady face electrode of back contacts solar cell to be calibrated, measured value is calibration value.
Above, in described step (3), shady face electrode test probe can contact back surface field, backplate and the insulating barrier on shady face.
In technique scheme, in described step (1) coverage of insulating barrier be sensitive surface electrode and and back surface field between interval region.Mainly there is the back contacts solar cell of emitter junction in this, prevents test probe from contacting back side emitter knot and produce short circuit phenomenon for the back side.
Due to the employing of technique scheme, compared with prior art, tool of the present invention has the following advantages:
1. this invention exploits a kind of method that one-level tap based on conventional solar cell demarcates the photoelectricity voltage-current characteristic parameter of back contacts solar cell, achieve the demarcation of variety classes solar cell, avoid transformation or research and develop new test platform, thus greatly having saved cost.
2. the present invention arranges insulating barrier relative to the position of each sensitive surface electrode on shady face, avoids the phenomenon that probes touch produces short circuit, achieves and demarcate back contacts solar cell on conventionally test platform, the positive realistic meaning had.
3. scaling method of the present invention is simple, and cost is low, is suitable for applying.
Accompanying drawing explanation
Accompanying drawing 1 is the conventionally test figure of double contact solar cell in background technology;
Accompanying drawing 2 is the back side resolution chart of back contacts solar cell in background technology;
Accompanying drawing 3 is the resolution chart of the back contacts solar cell of the embodiment of the present invention one.
Wherein: 10, sensitive surface electrode; 20, sensitive surface electrode test probe; 30, shady face electrode; 40, shady face electrode test probe; 50, insulating material.
Embodiment
Below in conjunction with embodiment, the invention will be further described:
Embodiment one
Shown in Figure 3, a kind of scaling method of photoelectricity voltage-current characteristic parameter of back contacts solar cell, comprises the steps:
Step one, covers back contacts solar cell to be calibrated with insulating tape and runs through and the sensitive surface electrode extending to shady face, shady face electrode and sensitive surface electrode are insulated;
Step 2, by the one-level tap of the four grid line solar cells demarcated by professional institution, the probe up and down of test platform is contacted respectively sensitive surface electrode and the shady face electrode of one-level tap, by revising the software parameter of test platform, make the measured value of one-level tap consistent with calibration value;
Step 3, the probe up and down of test platform is contacted respectively sensitive surface electrode and the shady face metallic region of back contacts solar cell to be calibrated, measured value is calibration value.
Claims (1)
1. a scaling method for the photoelectricity voltage-current characteristic parameter of back contacts solar cell, is characterized in that, comprise the steps:
(1) on the shady face of back contacts solar cell to be calibrated, insulating barrier is set relative to the position of each sensitive surface electrode, each sensitive surface electrode on shady face is insulated;
(2) the one-level tap of the conventional solar cell demarcated by professional institution is adopted, sensitive surface electrode test probe (20), shady face electrode test probe (40) are contacted respectively sensitive surface electrode and the shady face electrode of described one-level tap, by revising the software parameter of test platform, make the measured value of one-level tap consistent with calibration value;
(3) sensitive surface electrode test probe (20), shady face electrode test probe (40) are contacted respectively sensitive surface electrode and the shady face electrode of back contacts solar cell to be calibrated, measured value is calibration value;
In described step (1) coverage of insulating barrier be sensitive surface electrode and and back surface field between interval region.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201310267604.8A CN103344899B (en) | 2013-06-28 | 2013-06-28 | A kind of scaling method of photoelectricity voltage-current characteristic parameter of back contacts solar cell |
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| CN201310267604.8A CN103344899B (en) | 2013-06-28 | 2013-06-28 | A kind of scaling method of photoelectricity voltage-current characteristic parameter of back contacts solar cell |
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| CN103344899A CN103344899A (en) | 2013-10-09 |
| CN103344899B true CN103344899B (en) | 2016-01-13 |
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| CN104882498B (en) * | 2015-05-14 | 2018-02-16 | 苏州阿特斯阳光电力科技有限公司 | A kind of PERC solar cells |
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| US6876187B2 (en) * | 2000-07-04 | 2005-04-05 | Canon Kabushiki Kaisha | Method and apparatus for measuring photoelectric conversion characteristics |
| CN101975917A (en) * | 2010-10-09 | 2011-02-16 | 中国电子科技集团公司第四十八研究所 | Electric test desk for testing crystal silicon solar cells |
| CN102520330B (en) * | 2011-12-01 | 2014-01-22 | 华中科技大学 | Volt-ampere characteristic testing system of solar cell photovoltaic device |
| CN102646728B (en) * | 2012-05-02 | 2015-11-11 | 苏州阿特斯阳光电力科技有限公司 | Back electrode structure of a kind of back contact silicon solar battery sheet and preparation method thereof |
| CN102778643B (en) * | 2012-07-12 | 2014-10-29 | 华中科技大学 | Equipment and method for measuring photovoltaic conversion characteristic parameters of photovoltaic solar battery |
| CN202837489U (en) * | 2012-10-09 | 2013-03-27 | 苏州阿特斯阳光电力科技有限公司 | Back contact solar cell quantum efficiency detecting system |
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