CN103323712A - Testing method of power consumption of electric device - Google Patents
Testing method of power consumption of electric device Download PDFInfo
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- CN103323712A CN103323712A CN2013102317774A CN201310231777A CN103323712A CN 103323712 A CN103323712 A CN 103323712A CN 2013102317774 A CN2013102317774 A CN 2013102317774A CN 201310231777 A CN201310231777 A CN 201310231777A CN 103323712 A CN103323712 A CN 103323712A
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Abstract
The invention provides a testing method of the power consumption of an electric device. The electric device comprises a system power supply and a voltage converting chip. The voltage converting chip converts the supply power supply into at least one DCDC output power supply and/or one LDO output power supply. According to the testing method, an external power supply is added to a DCDC or LDO output power supply circuit, the voltage of the external power supply is higher than the voltage of the DCDC or LDO output power supply, and at the moment, power of the DCDC or LDO output power supply circuit is provided by the external power supply; the difference between the power consumption before the external power supply is added to the system power supply end and the power consumption after the external power supply is added to the system power supply end is the power consumption of the DCDC or LDO output power supply circuit at the system power supply end; the power consumption of the power supply circuit of the external power supply is the power consumption of the DCDC or LDO output power supply circuit. The testing method is easy and convenient to operate actually and accurate in testing results.
Description
Technical field
The present invention relates to a kind of method of testing of electronic equipment power consumption, be specifically related to the method for testing of electronic product power consumptions such as a kind of PDA, MOBILE PHONE.
Background technology
Electronic products such as PDA, MOBILE PHONE all can relate to power consumption analysis, traditional test is to add measuring resistance at each electric power loop, this can only be applied in product development stage, real product is influenced by fabric swatch, cabling, can not add resistance, so need a kind of method that does not change power consumption test under PCB device, the layout situation.
As shown in Figure 1, PDA, the sketch of system's power supply of electronic products such as MOBILE PHONE, it can be summed up as and comprise power supply (a 2.9～4.2V of system, among the figure for 3.8V) and a voltage transitions chip (the voltage transitions chip is discrete DCDC, LDO, or integrated DCDC, the power management unit(Power Management Unit of LDO), be called for short PMU or PMIC), described voltage transitions chip is converted to one the road or above DCDC out-put supply and/or one road or above LDO out-put supply with described system power supply, usually the DCDC out-put supply comprises that (voltage is lower than 2.0V at least one VDD power supply, among the figure for 1.0V) and/or at least one VCCDR power supply (voltage is lower than 2.0V, be 1.8V among the figure), the LDO out-put supply is generally the VCCIO power supply about 3.0V.Among the figure, i1, i2, i3, i4 represent the electric current on the corresponding current supply circuit; R1, R2, R3, R4 are for being reserved in the resistance of 0.1 Ω on the corresponding current supply circuit before testing, dot2, dot3, dot4 are the test point in each loop.
When analyzing the power consumption of electronic products such as PDA, MOBILE PHONE, may not reserve the testing current resistance of 0.1 Ω on the tested loop, cause power consumption test to carry out smoothly.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of method of testing of electronic equipment power consumption, and practical operation is simple and convenient, but and test result more accurate.
The present invention is achieved in that a kind of method of testing of electronic equipment power consumption, described electronic equipment comprises system's power supply and a voltage transitions chip, described voltage transitions chip is converted at least one road DCDC out-put supply and/or at least one road LDO out-put supply with described system power supply, wherein: described method of testing is to add an external power source at DCDC output current supply circuit or LDO output current supply circuit, the voltage of this external power source is higher than the voltage of described DCDC out-put supply or the voltage of LDO out-put supply, thereby make the blocking-up of this DCDC out-put supply or LDO out-put supply, this moment, this DCDC output current supply circuit or LDO output current supply circuit were provided by described external power source, formed the external power source loop; The power consumption difference of the forward and backward described system power supply end that adds of described external power source then, be this DCDC, LDO output current supply circuit in the power consumption of system's power supply end, and the power consumption on the described external power source loop is the power consumption on this DCDC output current supply circuit or the LDO output current supply circuit.
Further, when test was in the electronic equipment power consumption of system standby state, the value of the voltage of described external power source was: than the DCDC output supply voltage on the tested loop or the big 0.02～0.05V of LDO output supply voltage; When test was in the electronic equipment power consumption of system running state, the value of the voltage of described external power source was: be as the criterion with the DCDC out-put supply on the tested loop of enough cut-outs or LDO out-put supply, but must not exceed the tolerance range in this tested loop.When test is in the electronic equipment power consumption of system running state, in practical operation, the voltage of described external power source will slowly increase on the basis of the magnitude of voltage of the DCDC output supply voltage on this tested loop or LDO output supply voltage, avoid surpassing the tolerance range in this tested loop simultaneously, until satisfying till externally the current value of power end no longer reduces.
Further, the concrete preparation method of the power consumption difference of the forward and backward described system power supply end that described external power source adds is: the current value of successively directly measuring the forward and backward described system power supply end of described external power source adding, calculate the difference of these two current values then, be converted into power consumption again and get final product; The concrete preparation method of power consumption on the described external power source loop is: directly measure the current value on the described external power source loop, be converted into power consumption then and get final product.
The present invention has following advantage: the present invention is the principle according to DCDC, LDO, after its output voltage is determined, backfeed loop can check actual output voltage situation, if voltage is on the low side, the corresponding current supply circuit of DCDC, LDO can be opened, and begins the power supply of DCDC, LDO output loop and makes that output voltage is corresponding to be raised; If voltage is higher, DCDC, LDO system can close current supply circuit, the corresponding reduction of voltage this moment.Therefore utilize the impressed voltage method to measure power consumption on each power supply output loop, make the voltage of external power source be higher than the voltage of DCDC out-put supply or the voltage of LDO out-put supply, thereby make the blocking-up of this DCDC out-put supply or LDO out-put supply, this moment, this DCDC output current supply circuit or LDO output current supply circuit were provided by described external power source, formed the external power source loop; The power consumption difference of the forward and backward described system power supply end that adds of described external power source then, be this DCDC, LDO output current supply circuit in the power consumption of power end, and the power consumption on the described external power source loop is the power consumption on this DCDC output current supply circuit or the LDO output current supply circuit.The inventive method practical operation is simple and convenient, but and test result more accurate.
Description of drawings
The present invention is further illustrated in conjunction with the embodiments with reference to the accompanying drawings.
Fig. 1 is system's power supply sketch of existing electronic product.
Fig. 2 is system's power supply sketch of test mode electronic product of the present invention.
Embodiment
As shown in Figure 2, the method for testing of electronic equipment power consumption of the present invention is to realize test in the test point of system's feed circuit of original electronic product adding an external power source.Described electronic equipment comprises system's power supply and a voltage transitions chip, described voltage transitions chip is converted at least one road DCDC out-put supply and/or at least one road LDO out-put supply with described system power supply, described method of testing is to add an external power source at DCDC output current supply circuit or LDO output current supply circuit, the voltage of a little higher than described DCDC out-put supply of the voltage of this external power source or the voltage of LDO out-put supply, thereby make the blocking-up of this DCDC out-put supply or LDO out-put supply, this moment, this DCDC output current supply circuit or LDO output current supply circuit were provided by described external power source, formed the external power source loop; The power consumption difference of the forward and backward described system power supply end that adds of described external power source then, be this DCDC, LDO output current supply circuit in the power consumption of system's power supply end, and the power consumption on the described external power source loop is the power consumption on this DCDC output current supply circuit or the LDO output current supply circuit.
When test was in the electronic equipment power consumption of system standby state, the value of the voltage of described external power source was: than the DCDC output supply voltage on the tested loop or the big 0.02～0.05V of LDO output supply voltage; When test was in the electronic equipment power consumption of system running state, the value of the voltage of described external power source was: be as the criterion with the DCDC out-put supply on the tested loop of enough cut-outs or LDO out-put supply, but must not exceed the tolerance range in this tested loop.When test is in the electronic equipment power consumption of system running state, electric current and voltage when system moves on each road all can be bigger, in order to improve test accuracy, we will guarantee that the voltage of external power source is enough big, in practical operation, the voltage of described external power source will slowly increase on the basis of the magnitude of voltage of the DCDC output supply voltage on this tested loop or LDO output supply voltage, avoid surpassing the tolerance range in this tested loop simultaneously, until satisfying till externally the current value of power end no longer reduces, the voltage that this moment, external power source provided is the blocking voltage of test output loop.
The concrete preparation method of the power consumption difference of the forward and backward described system power supply end that described external power source adds is: the current value of successively directly measuring the forward and backward described system power supply end of described external power source adding, calculate the difference of these two current values then, be converted into power consumption again and get final product; The concrete preparation method of power consumption on the described external power source loop is: directly measure the current value on the described external power source loop, be converted into power consumption then and get final product.
As shown in Figure 2, be that example is described as follows with test vdd road power consumption:
Need use two power supplys during test, be respectively system's power supply and the external power source of electronic equipment.
Suppose that tested loop is the output loop of the vdd power supply power supply of the 1.0V on the voltage transitions chip Pmu, test point is dot2, and system's power supply terminal voltage is 3.8V, and system is in holding state, external power source can be selected 1.02～1.05V for use, and present embodiment is selected the external power source of 1.02V for use.Concrete testing procedure is as follows:
1, power to system by system's power supply, system enters test scene after starting, and the value by reometer read-out system power supply end current i 1 is designated as current10.
2, the output voltage with external power source is adjusted into 1.02V, and makes external power source passes through tested points dot2 impressed voltage is provided for the VDD road.Because the output voltage of external power source is higher than the VDD1.0V voltage of voltage transitions chip pmu output, so the output voltage of the VDD1.0V of voltage transitions chip pmu is blocked, this moment, system's power supply no longer was the power supply of VDD road.This moment is the current value of read-out system power supply end i1 again, is designated as current11, reads the output current of external power source simultaneously, is designated as current20.
3, calculating the power end electric current that the VDD road consumes this moment is the difference of current10-current11, and consumed current is current20 on the VDD loop.
Attention: two electric currents (being difference and the current20 of current10-current11) of this method test be approximate value (namely when the output loop electric current during less than 300ma two current errors 5% be approximate value with in, when the output loop electric current greater than 300ma, the more big precision of electric current is more low, but maximum error is approximate value 10% with in), therefore, can be used as the reference of a platform power consumption situation fully.
In sum, the present invention utilizes the impressed voltage method to measure each power consumption of power supply on output loop, and practical operation is simple and convenient, but and test result more accurate.
Though more than described the specific embodiment of the present invention; but being familiar with those skilled in the art is to be understood that; our described specific embodiment is illustrative; rather than for the restriction to scope of the present invention; those of ordinary skill in the art are in modification and the variation of the equivalence of doing according to spirit of the present invention, all should be encompassed in the scope that claim of the present invention protects.
Claims (4)
1. the method for testing of an electronic equipment power consumption, described electronic equipment comprises system's power supply and a voltage transitions chip, described voltage transitions chip is converted at least one road DCDC out-put supply and/or at least one road LDO out-put supply with described system power supply, it is characterized in that: described method of testing is to add an external power source at DCDC output current supply circuit or LDO output current supply circuit, the voltage of this external power source is higher than the voltage of described DCDC out-put supply or the voltage of LDO out-put supply, thereby make the blocking-up of this DCDC out-put supply or LDO out-put supply, this moment, this DCDC output current supply circuit or LDO output current supply circuit were provided by described external power source, formed the external power source loop; The power consumption difference of the forward and backward described system power supply end that adds of described external power source then, be this DCDC, LDO output current supply circuit in the power consumption of system's power supply end, and the power consumption on the described external power source loop is the power consumption on this DCDC output current supply circuit or the LDO output current supply circuit.
2. the method for testing of electronic equipment power consumption according to claim 1 is characterized in that:
When test was in the electronic equipment power consumption of system standby state, the value of the voltage of described external power source was: than the DCDC output supply voltage on the tested loop or the big 0.02～0.05V of LDO output supply voltage;
When test was in the electronic equipment power consumption of system running state, the value of the voltage of described external power source was: be as the criterion with the DCDC out-put supply on the tested loop of enough cut-outs or LDO out-put supply, but must not exceed the tolerance range in this tested loop.
3. the method for testing of electronic equipment power consumption according to claim 2, it is characterized in that: when test is in the electronic equipment power consumption of system running state, in practical operation, the voltage of described external power source will slowly increase on the basis of the magnitude of voltage of the DCDC output supply voltage on this tested loop or LDO output supply voltage, avoid surpassing the tolerance range in this tested loop simultaneously, until satisfying till externally the current value of power end no longer reduces.
4. the method for testing of electronic equipment power consumption according to claim 1 is characterized in that:
The concrete preparation method of the power consumption difference of the forward and backward described system power supply end that described external power source adds is: the current value of successively directly measuring the forward and backward described system power supply end of described external power source adding, calculate the difference of these two current values then, be converted into power consumption again and get final product;
The concrete preparation method of power consumption on the described external power source loop is: directly measure the current value on the described external power source loop, be converted into power consumption then and get final product.
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| CN2013102317774A CN103323712A (en) | 2013-06-09 | 2013-06-09 | Testing method of power consumption of electric device |
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| CN2013102317774A CN103323712A (en) | 2013-06-09 | 2013-06-09 | Testing method of power consumption of electric device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN116027103A (en) * | 2023-03-29 | 2023-04-28 | 荣耀终端有限公司 | Power consumption detection circuit, power consumption detection chip and terminal equipment |
| CN117590063A (en) * | 2024-01-18 | 2024-02-23 | 荣耀终端有限公司 | Power consumption test circuit, power consumption test method, electronic equipment and storage medium |
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| CN1425137A (en) * | 2000-04-18 | 2003-06-18 | 富士通西门子电脑股份有限公司 | Circuit arrangement for measuring current consumption of transistor-controlled load |
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| CN101923110A (en) * | 2009-06-09 | 2010-12-22 | 比亚迪股份有限公司 | A method and device for detecting abnormal current in a circuit |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN116027103A (en) * | 2023-03-29 | 2023-04-28 | 荣耀终端有限公司 | Power consumption detection circuit, power consumption detection chip and terminal equipment |
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| CN117590063A (en) * | 2024-01-18 | 2024-02-23 | 荣耀终端有限公司 | Power consumption test circuit, power consumption test method, electronic equipment and storage medium |
| CN117590063B (en) * | 2024-01-18 | 2024-06-04 | 荣耀终端有限公司 | Power consumption test circuit, power consumption test method, electronic device and storage medium |
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Application publication date: 20130925 |