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CN103235189A - High-precision micro resistor measurement method based on double-current voltage ratio method and measurement system for realizing method - Google Patents

High-precision micro resistor measurement method based on double-current voltage ratio method and measurement system for realizing method Download PDF

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CN103235189A
CN103235189A CN2013101569335A CN201310156933A CN103235189A CN 103235189 A CN103235189 A CN 103235189A CN 2013101569335 A CN2013101569335 A CN 2013101569335A CN 201310156933 A CN201310156933 A CN 201310156933A CN 103235189 A CN103235189 A CN 103235189A
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聂洪岩
王永红
魏新劳
陈庆国
池明赫
王新宇
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Harbin University of Science and Technology
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Abstract

一种基于双电流电压比率法的微电阻高精度测量方法及实现该方法的测量系统,涉及一种电阻的高精度测量方法及其系统,具体涉及一种微小电阻的检测方法及其系统,目的是为了解决现有微电阻测量技术中电源精度以及叠加在被测量的微电压信号上的直流干扰对测量精度的影响的问题,本发明的测量系统包括被测电阻、标准电阻、可调限流电阻、可控电源、滤波放大器、A/D转换器、单片机系统、显示器和操作键盘,首先,采用电压比率法消除电源对测量精度的影响,其次,通过双电流法消除被测电阻的阻值上的直流干扰电压,本发明适用于微电阻测量技术领域。

Figure 201310156933

A high-precision measurement method for micro-resistance based on a double-current-voltage ratio method and a measurement system for realizing the method, it relates to a high-precision measurement method and system for resistance, and specifically relates to a detection method and system for micro-resistance. In order to solve the problem of power supply accuracy and the influence of DC interference superimposed on the measured micro-voltage signal on the measurement accuracy in the existing micro-resistance measurement technology, the measurement system of the present invention includes a measured resistance, a standard resistance, an adjustable current limiting Resistors, controllable power supplies, filter amplifiers, A/D converters, single-chip microcomputer systems, displays and operating keyboards, firstly, use the voltage ratio method to eliminate the influence of the power supply on the measurement accuracy, and secondly, use the double current method to eliminate the resistance value of the measured resistor The DC interference voltage above, the invention is applicable to the technical field of micro-resistance measurement.

Figure 201310156933

Description

A kind of based on double-current voltage ratio method little resistance high-precision measuring method and realize the measuring system of this method
Technical field
The present invention relates to a kind of high-precision measuring method and system thereof of resistance, be specifically related to a kind of detection method and system thereof of small resistance.
Background technology
In the electrical engineering field, often run into the problem of microresistivity survey, as the conductor material resistivity measurement, unit length conductor DC resistance measurement etc.Since this slightly resistance often be in tens μ Ω to the tens m Ω orders of magnitude, measure relatively difficulty.At present, the microresistivity survey instrument that provides on the market is generally direct-flow double bridge and digital micro-OHM meter.Direct-flow double bridge needs balance adjustment, and the measurement automaticity is low and influenced by adjustable element variation and human factor; Digital micro-OHM meter generally adopts constant current source and high accuracy number voltage measurement technology, measures automaticity, measuring speed and accuracy of measurement height, and the trend that progressively substitutes direct-flow double bridge is arranged.In the development process of digital micro-OHM meter, main difficult point is the making of high precise current source, data acquisition and the Anti-Jamming Technique of high precision micro voltage signal.Wherein high precise current source is made difficulty, influences the class of accuracy of microresistivity survey always; The data acquisition of high precision micro voltage can utilize the high performance operational amplifier and the high-order A/D converter that provide on the market to solve; Interference generally comprises electric field interference, magnetic interference and direct current and disturbs, the interference of electromagnetic field can effectively suppress by the method for shielding and filtering, direct current disturbs and directly is superimposed upon on the measured micro voltage signal, little resistance is accurately measured produced very large influence, and rejection ratio is difficult.
In the voltage ratio method is measured ultimate principle, can suppress to exchange interference effectively by technology such as shielding and filtering, ignored the influence of direct current interference to measurement.Thermoelectrical potential, amplifying circuit imbalance and the temperature of measuring the loop floated etc. and to be formed direct current and disturb, and is superimposed upon in the measured voltage drop, because measured voltage drop is faint, the direct current of stack disturbs and can produce very large measuring error, and existing measuring method all can't be eliminated.Find by actual measurement, see for a long time that this direct current disturbs factor affecting such as being subjected to temperature variation can produce certain fluctuation.
Summary of the invention
The objective of the invention is to disturb problem to the influence of measuring accuracy in order to solve power supply precision in the existing microresistivity survey technology and to be superimposed upon direct current on the measured micro voltage signal, the present invention proposes a kind of little resistance high-precision measuring method based on double-current voltage ratio method and realize the measuring system of this method.
A kind of little resistance high-precision measuring method based on double-current voltage ratio method, detailed process is as follows, at first, the power supply outgoing side that measured resistance, fixed value resistance and adjustable current-limiting resistance is connected on controllable direct current power supply constitutes the series connection closed-loop path, the output voltage of described controllable direct current power supply is E, and the resistance of measured resistance is R X, the resistance of fixed value resistance is R 0, the resistance of adjustable current-limiting resistance is R 1, adopt the measurement of four-wire ohm measuring method to obtain the measuring voltage U at fixed value resistance two ends 1, the measured resistance two ends measuring voltage U 2With the electric current I of series connection closed-loop path, calculate the resistance R of measured resistance X,
Secondly, eliminate the resistance R of measured resistance by the double-current method XOn interference voltages, to eliminate disturb the resistance R of back measured resistance X
Present embodiment adopts the voltage ratio method to eliminate the influence of the measured resistance measuring accuracy of output voltage E of controllable direct current power supply, the resistance R of fixed value resistance XKnown, for the resistance R of demarcating measured resistance X, adjustable current-limiting resistance is used for the size of control survey electric current I.
The described resistance that calculates measured resistance, its detailed process is, according to formula Calculate the resistance R that obtains measured resistance X
Described formula
Figure BDA00003126109200022
R 0Be according to formula I = E R 1 + R 0 + R x = U 1 R 0 = U 2 R x Derivation obtains.
The described resistance R that eliminates measured resistance by the double-current method XOn interference voltages, to eliminate disturb the resistance R of back measured resistance X, its detailed process is as follows:
The output voltage that controllable direct current power supply is set is respectively E 1And E 2, and E 1Greater than E 2,
When the output voltage of controllable direct current power supply is E 1, the electric current of this series connection closed-loop path correspondence is I 1, the voltage of measuring the fixed value resistance two ends obtains measuring voltage U 11, the voltage of measuring the measured resistance two ends obtains measuring voltage U 21,
When the output voltage of controllable direct current power supply is E 2, the electric current of this series connection closed-loop path correspondence is I 2, the voltage of measuring the fixed value resistance two ends obtains measuring voltage U 12, the voltage of measuring the measured resistance two ends obtains measuring voltage U 22, according to formula
Figure BDA00003126109200024
Calculate and obtain to eliminate the resistance R that disturbs the back measured resistance X
The described resistance R that eliminates measured resistance by the double-current method of present embodiment XOn interference voltages, to eliminate disturb the resistance R of back measured resistance XPrinciple be:
When the output voltage of controllable direct current power supply is E 1, the electric current of this series connection closed-loop path correspondence is I 1, the voltage of measuring the fixed value resistance two ends obtains measuring voltage U 11, the voltage acquisition measuring voltage of measuring the measured resistance two ends is U 21,
U is then arranged 11=U 01+ E S1(3),
U 21=U x1+E s2 (4),
Wherein, U 01Be the virtual voltage at fixed value resistance two ends, U X1Be the virtual voltage at measured resistance two ends, E S1Be measuring voltage U 11On interference voltages, E S2Be measuring voltage U 21On interference voltages;
When the output voltage of controllable direct current power supply is E 2, the electric current of this series connection closed-loop path correspondence is I 2, the voltage of measuring the fixed value resistance two ends obtains measuring voltage U 12, the voltage of measuring measured resistance 1 two ends obtains measuring voltage U 22,
U is then arranged 12=U 02+ E S3(5),
U 22=U x2+E s4 (6),
Wherein, U 02Be the virtual voltage at fixed value resistance two ends, U X2Be the virtual voltage at measured resistance two ends, E S3Be measuring voltage U 12On interference voltages, E S4Be measuring voltage U 22On interference voltages;
Wherein, E S1=E S3, E S2=E S4
Calculate U by formula (3), (4), (5) and (6) 11-U 12=U 01-U 02=R 0(I 1-I 2) (7),
U 21-U 22=U X1-U X2=R x(I 1-I 2) (8),
Arrangement formula (7) and formula (8), R x = R 0 U 01 - U 02 U x 1 - U x 2 = R 0 U 21 - U 22 U 11 - U 12 .
From formula
Figure BDA00003126109200032
In can draw, adopt the double-current method to eliminate interference voltages to the influence of measuring accuracy.
Described electric current I 1And I 2Pulsewidth identical, be 1 second.
Described electric current I 1Amplitude be 1A.
Described electric current I 2Amplitude be 5A.
Described electric current I 1And I 2Continuous alternately output has constituted the cycle and is 2 seconds periodic current.
Realize a kind of measuring system of the little resistance high-precision measuring method based on double-current voltage ratio method, described measuring system comprises measured resistance, fixed value resistance, adjustable current-limiting resistance, controllable electric power, filter amplifier, A/D converter, Single Chip Microcomputer (SCM) system, display and operation keyboard, one end ground connection of described measured resistance, the other end of measured resistance is connected with an end of fixed value resistance, the other end of this fixed value resistance is connected with an end of adjustable current-limiting resistance, the other end of adjustable current-limiting resistance is connected with the positive source output terminal of controllable electric power, the power cathode input end of controllable electric power is connected with the voltage control signal output terminal of Single Chip Microcomputer (SCM) system, adopt the four-wire ohm measuring method to gather the terminal voltage signal of fixed value resistance, and this voltage signal is sent to filter amplifier; Adopt the four-wire ohm measuring method to gather the terminal voltage signal of measured resistance, and this voltage signal is sent to filter amplifier; The signal output part of filter amplifier is connected with the input end of analog signal of A/D converter, the digital signal output end of described A/D converter is connected with the collection signal input part of Single Chip Microcomputer (SCM) system, the demonstration signal output part of described Single Chip Microcomputer (SCM) system is connected with the signal input part of display, and described operation keyboard signal output part is connected with the signal input part of Single Chip Microcomputer (SCM) system.
Of the present invention a kind of based on double-current voltage ratio method little resistance high-precision measuring method and realize that the beneficial effect that the measuring system of this method is brought is: adopt the voltage ratio method to eliminate power supply to the influence of measuring accuracy, adopt the double-current method to eliminate the direct current interference to the influence of measuring accuracy, it has the strong and accurate high characteristics of measurement of antijamming capability, its antijamming capability has improved more than 30%, and accuracy of measurement can reach 0.1 micro-ohm level.
Description of drawings
Fig. 1 is the equivalent circuit diagram of the described a kind of little resistance high-precision measuring method based on double-current voltage ratio method of embodiment one.
Fig. 2 is in the embodiment three, when the output voltage of controllable direct current power supply is E 1The time, the equivalent circuit diagram of described a kind of little resistance high-precision measuring method based on double-current voltage ratio method.
Fig. 3 is for realizing the measuring principle of measurement system block diagram of the described a kind of little resistance high-precision measuring method based on double-current voltage ratio method of embodiment one.
Embodiment
Embodiment one: the described a kind of little resistance high-precision measuring method based on double-current voltage ratio method of present embodiment, detailed process is as follows, at first, the power supply outgoing side that measured resistance 1, fixed value resistance 2 and adjustable current-limiting resistance 3 is connected on controllable direct current power supply constitutes the series connection closed-loop path, the output voltage of described controllable direct current power supply is E, and the resistance of measured resistance 1 is R X, the resistance of fixed value resistance 2 is R 0, the resistance of adjustable current-limiting resistance 3 is R 1, adopt the measurement of four-wire ohm measuring method to obtain the measuring voltage U at fixed value resistance 2 two ends 1, measured resistance 1 two ends measuring voltage U 2With the electric current I of series connection closed-loop path, calculate the resistance R of measured resistance 1 X,
Secondly, eliminate the resistance R of measured resistance 1 by the double-current method XOn interference voltages, to eliminate disturb the resistance R of back measured resistance 1 X
Present embodiment adopts the voltage ratio method to eliminate the influence of measured resistance 1 measuring accuracy of output voltage E of controllable direct current power supply, the resistance R of fixed value resistance 2 XKnown, for the resistance R of demarcating measured resistance 1 X, adjustable current-limiting resistance 3 is used for the size of control survey electric current I.
Embodiment two: present embodiment is described referring to Fig. 1, the difference of the described a kind of little resistance high-precision measuring method based on double-current voltage ratio method of present embodiment and embodiment one is, the described resistance that calculates measured resistance 1, its detailed process is, according to formula
Figure BDA00003126109200051
Calculate the resistance R that obtains measured resistance 1 X
Described formula R 0Be according to formula I = E R 1 + R 0 + R x = U 1 R 0 = U 2 R x ; Derivation obtains.
Embodiment three: present embodiment is described referring to Fig. 2, the difference of the described a kind of little resistance high-precision measuring method based on double-current voltage ratio method of present embodiment and embodiment one is the described resistance R that eliminates measured resistance 1 by the double-current method XOn interference voltages, to eliminate disturb the resistance R of back measured resistance 1 X, its detailed process is as follows:
The output voltage that controllable direct current power supply is set is respectively E 1And E 2, and E 1Greater than E 2,
When the output voltage of controllable direct current power supply is E 1, the electric current of this series connection closed-loop path correspondence is I 1, the voltage of measuring fixed value resistance 2 two ends obtains measuring voltage U 11, the voltage of measuring measured resistance 1 two ends obtains measuring voltage U 21,
When the output voltage of controllable direct current power supply is E 2, the electric current of this series connection closed-loop path correspondence is I 2, the voltage of measuring fixed value resistance 2 two ends obtains measuring voltage U 12, the voltage of measuring measured resistance 1 two ends obtains measuring voltage U 22, according to formula
Figure BDA00003126109200054
Calculate and obtain to eliminate the resistance R that disturbs back measured resistance 1 X
The described resistance R that eliminates measured resistance 1 by the double-current method of present embodiment XOn interference voltages, to eliminate disturb the resistance R of back measured resistance 1 XPrinciple be:
When the output voltage of controllable direct current power supply is E 1, the electric current of this series connection closed-loop path correspondence is I 1, the voltage of measuring fixed value resistance 2 two ends obtains measuring voltage U 11, the voltage acquisition measuring voltage of measuring measured resistance 1 two ends is U 21,
U is then arranged 11=U 01+ E S1(3),
U 21=U x1+E s2 (4),
Wherein, U 01Be the virtual voltage at fixed value resistance 2 two ends, U X1Be the virtual voltage at measured resistance 1 two ends, E S1Be measuring voltage U 11On interference voltages, E S2Be measuring voltage U 21On interference voltages;
When the output voltage of controllable direct current power supply is E 2, the electric current of this series connection closed-loop path correspondence is I 2, the voltage of measuring fixed value resistance 2 two ends obtains measuring voltage U 12, the voltage of measuring measured resistance 1 two ends obtains measuring voltage U 22,
U is then arranged 12=U 02+ E S3(5),
U 22=U x2+E s4 (6),
Wherein, U 02Be the virtual voltage at fixed value resistance 2 two ends, U X2Be the virtual voltage at measured resistance 2 two ends, E S3Be measuring voltage U 12On interference voltages, E S4Be measuring voltage U 22On interference voltages;
Wherein, E S1=E S3, E S2=E S4
Calculate U by formula (3), (4), (5) and (6) 11-U 12=U 01-U 02=R 0(I 1-I 2) (7),
U 21-U 22=U X1-U X2=R x(I 1-I 2) (8),
Arrangement formula (7) and formula (8), R x = R 0 U 01 - U 02 U x 1 - U x 2 = R 0 U 21 - U 22 U 11 - U 12 .
From formula In can draw, adopt the double-current method to eliminate interference voltages to the influence of measuring accuracy.
Embodiment four: referring to Fig. 2 present embodiment is described, the difference of the described a kind of little resistance high-precision measuring method based on double-current voltage ratio method of present embodiment and embodiment three is described electric current I 1And I 2Pulsewidth identical, be 1 second.
Embodiment five: referring to Fig. 2 present embodiment is described, the difference of the described a kind of little resistance high-precision measuring method based on double-current voltage ratio method of present embodiment and embodiment three is described electric current I 1Amplitude be 1A.
Embodiment six: referring to Fig. 2 present embodiment is described, the difference of the described a kind of little resistance high-precision measuring method based on double-current voltage ratio method of present embodiment and embodiment three is described electric current I 2Amplitude be 5A.
Embodiment seven: referring to Fig. 2 present embodiment is described, the difference of the described a kind of little resistance high-precision measuring method based on double-current voltage ratio method of present embodiment and embodiment three is described electric current I 1And I 2Continuous alternately output has constituted the cycle and is 2 seconds periodic current.
Embodiment eight: present embodiment is described referring to Fig. 3, present embodiment realizes the measuring system of the described a kind of little resistance high-precision measuring method based on double-current voltage ratio method of embodiment one, described measuring system comprises measured resistance 1, fixed value resistance 2, adjustable current-limiting resistance 3, controllable electric power 9, filter amplifier 4, A/D converter 5, Single Chip Microcomputer (SCM) system 6, display 7 and operation keyboard 8, one end ground connection of described measured resistance 1, the other end of measured resistance 1 is connected with an end of fixed value resistance 2, the other end of this fixed value resistance 2 is connected with an end of adjustable current-limiting resistance 3, the other end of adjustable current-limiting resistance 3 is connected with the positive source output terminal of controllable electric power 9, the power cathode input end of controllable electric power 9 is connected with the voltage control signal output terminal of Single Chip Microcomputer (SCM) system 6, adopt the four-wire ohm measuring method to gather the terminal voltage signal of fixed value resistance 2, and this voltage signal is sent to filter amplifier 4; Adopt the four-wire ohm measuring method to gather the terminal voltage signal of measured resistance 1, and this voltage signal is sent to filter amplifier 4; The signal output part of filter amplifier 4 is connected with the input end of analog signal of A/D converter 5, the digital signal output end of described A/D converter 5 is connected with the collection signal input part of Single Chip Microcomputer (SCM) system 6, the demonstration signal output part of described Single Chip Microcomputer (SCM) system 6 is connected with the signal input part of display 7, and described operation keyboard 8 signal output parts are connected with the signal input part of Single Chip Microcomputer (SCM) system 6.

Claims (8)

1. little resistance high-precision measuring method based on double-current voltage ratio method, it is characterized in that, detailed process is as follows, at first, the power supply outgoing side that measured resistance (1), fixed value resistance (2) and adjustable current-limiting resistance (3) is connected on controllable direct current power supply constitutes the series connection closed-loop path, the output voltage of described controllable direct current power supply is E, and the resistance of measured resistance (1) is R X, the resistance of fixed value resistance (2) is R 0, the resistance of adjustable current-limiting resistance (3) is R 1, adopt the measurement of four-wire ohm measuring method to obtain the measuring voltage U at fixed value resistance (2) two ends 1, measured resistance (1) two ends measuring voltage U 2With the electric current I of series connection closed-loop path, calculate the resistance R of measured resistance (1) X,
Secondly, eliminate the resistance R of measured resistance (1) by the double-current method XOn interference voltages, to eliminate disturb the resistance R of back measured resistance (1) X
2. a kind of little resistance high-precision measuring method based on double-current voltage ratio method according to claim 1 is characterized in that, the described resistance that calculates measured resistance (1), and its detailed process is, according to formula R 0, calculate the resistance R that obtains measured resistance (1) X
3. a kind of little resistance high-precision measuring method based on double-current voltage ratio method according to claim 1 is characterized in that, the described resistance R that eliminates measured resistance (1) by the double-current method XOn interference voltages, to eliminate disturb the resistance R of back measured resistance (1) X, its detailed process is as follows:
The output voltage that controllable direct current power supply is set is respectively E 1And E 2, and E 1Greater than E 2,
When the output voltage of controllable direct current power supply is E 1, the electric current of this series connection closed-loop path correspondence is I 1, the voltage of measuring fixed value resistance (2) two ends obtains measuring voltage U 11, the voltage of measuring measured resistance (1) two ends obtains measuring voltage U 21,
When the output voltage of controllable direct current power supply is E 2, the electric current of this series connection closed-loop path correspondence is I 2, the voltage of measuring fixed value resistance (2) two ends obtains measuring voltage U 12, the voltage of measuring measured resistance (1) two ends obtains measuring voltage U 22, according to formula
Figure FDA00003126109100012
Calculate and obtain to eliminate the resistance R that disturbs back measured resistance (1) X
4. a kind of little resistance high-precision measuring method based on double-current voltage ratio method according to claim 3 is characterized in that described electric current I 1And I 2Pulsewidth identical, be 1 second.
5. a kind of little resistance high-precision measuring method based on double-current voltage ratio method according to claim 3 is characterized in that described electric current I 1Amplitude be 1A.
6. a kind of little resistance high-precision measuring method based on double-current voltage ratio method according to claim 3 is characterized in that described electric current I 2Amplitude be 5A.
7. a kind of little resistance high-precision measuring method based on double-current voltage ratio method according to claim 3 is characterized in that electric current I 1And I 2Continuous alternately output has constituted the cycle and is 2 seconds periodic current.
8. realize the measuring system of the described a kind of little resistance high-precision measuring method based on double-current voltage ratio method of claim 1, it is characterized in that, described measuring system comprises measured resistance (1), fixed value resistance (2), adjustable current-limiting resistance (3), controllable electric power (9), filter amplifier (4), A/D converter (5), Single Chip Microcomputer (SCM) system (6), display (7) and operation keyboard (8), one end ground connection of described measured resistance (1), the other end of measured resistance (1) is connected with an end of fixed value resistance (2), the other end of this fixed value resistance (2) is connected with an end of adjustable current-limiting resistance (3), the other end of adjustable current-limiting resistance (3) is connected with the positive source output terminal of controllable electric power (9), the power cathode input end of controllable electric power (9) is connected with the voltage control signal output terminal of Single Chip Microcomputer (SCM) system (6), adopt the four-wire ohm measuring method to gather the terminal voltage signal of fixed value resistance (2), and this voltage signal is sent to filter amplifier (4); Adopt the four-wire ohm measuring method to gather the terminal voltage signal of measured resistance (1), and this voltage signal is sent to filter amplifier (4); The signal output part of filter amplifier (4) is connected with the input end of analog signal of A/D converter (5), the digital signal output end of described A/D converter (5) is connected with the collection signal input part of Single Chip Microcomputer (SCM) system (6), the demonstration signal output part of described Single Chip Microcomputer (SCM) system (6) is connected with the signal input part of display (7), and described operation keyboard (8) signal output part is connected with the signal input part of Single Chip Microcomputer (SCM) system (6).
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Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103412191A (en) * 2013-08-26 2013-11-27 甘肃农业大学 Minitype resistance measurement system
CN105021944A (en) * 2015-07-17 2015-11-04 上海斐讯数据通信技术有限公司 A low-resistance continuity test device and method
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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101021557A (en) * 2007-03-09 2007-08-22 西安四方机电有限责任公司 Apparatus and method for measuring micro-phm level electric resistance
CN101498749A (en) * 2008-02-01 2009-08-05 凯迈(洛阳)测控有限公司 Accurate resistor measuring apparatus and method thereof
CN101706534A (en) * 2009-11-30 2010-05-12 江南机器(集团)有限公司 Low resistance admeasuring apparatus
CN101887092A (en) * 2010-06-25 2010-11-17 房慧龙 Resistance measurement method with wide temperature range, wide measurement range, high precision and low cost
CN102288831A (en) * 2011-05-16 2011-12-21 钟小梅 Low-cost high-accuracy resistance measuring system and measuring method thereof

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101021557A (en) * 2007-03-09 2007-08-22 西安四方机电有限责任公司 Apparatus and method for measuring micro-phm level electric resistance
CN101498749A (en) * 2008-02-01 2009-08-05 凯迈(洛阳)测控有限公司 Accurate resistor measuring apparatus and method thereof
CN101706534A (en) * 2009-11-30 2010-05-12 江南机器(集团)有限公司 Low resistance admeasuring apparatus
CN101887092A (en) * 2010-06-25 2010-11-17 房慧龙 Resistance measurement method with wide temperature range, wide measurement range, high precision and low cost
CN102288831A (en) * 2011-05-16 2011-12-21 钟小梅 Low-cost high-accuracy resistance measuring system and measuring method thereof

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
陈炯等: "新型电缆导体直流电阻测量仪的研制", 《电线电缆》 *

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CN105021944B (en) * 2015-07-17 2018-01-16 上海斐讯数据通信技术有限公司 A kind of low resistance connectivity testing device and method
CN106645955A (en) * 2016-09-20 2017-05-10 青岛时创智能技术有限公司 Test circuit for measuring relay contact ultralow impedance
CN106291066A (en) * 2016-10-31 2017-01-04 西安交通大学 A kind of DC high voltage based on divider time sharing sampling is measured and correction system and method
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CN108152592B (en) * 2017-12-27 2020-04-03 北京航天测控技术有限公司 Lead impedance measurement system
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CN109854414B (en) * 2018-12-11 2021-05-04 西安航天动力测控技术研究所 Safety ignition mechanism unit tester
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CN111830322B (en) * 2020-05-28 2022-12-16 江苏省送变电有限公司 GIL conductor electric connection state evaluation device
CN112327057A (en) * 2020-12-03 2021-02-05 常州同惠电子股份有限公司 On-resistance testing method for wire tester
CN113589046A (en) * 2021-09-06 2021-11-02 天津津航计算技术研究所 High-precision resistance signal acquisition circuit applied to aviation electromechanical products
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CN118980862A (en) * 2024-09-11 2024-11-19 中国计量科学研究院 A resistance precision measurement system and method based on synchronous sampling

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