CN103185847B - Auxiliary testing device - Google Patents

Abstract

An auxiliary test device is suitable for an object to be tested. The auxiliary test device includes a power supply unit, a storage unit and a control unit. The power supply unit is used to provide multiple voltages, wherein these voltages are different from each other. The storage unit is used to store a power timing table and an analog signal generation table corresponding to the object to be tested. The control unit is coupled to the storage unit and the power supply unit, and is used to provide multiple power timing control signals according to the power timing table, so that the power supply unit sequentially provides the aforementioned voltages to the object to be tested according to these power timing control signals, and provides analog signals corresponding to the object to be tested to the object to be tested according to the analog signal generation table, and the control unit receives multiple status signals generated by the object to be tested in response to the aforementioned voltages and analog signals.

Description

Auxiliary test device

technical field

The invention relates to a testing device, in particular to an auxiliary testing device.

Background technique

Generally speaking, computer systems on the market are usually tested for their various performance indicators before shipment. Some models are designed with multi-module (such as memory module and CPU module) and multi-layer architecture, and the test function can only be performed after the whole machine is assembled.

Due to the large size of the combined machine and the limitation of the test equipment, it is impossible to perform the test of the whole machine when performing the In-Circuit Testing (ICT) test. Therefore, the test equipment can only support a single board for power-on testing, that is, the power supply is directly connected to a single module, and the power supplied to the single module is changed or adjusted through the power supply. The module can perform power-on test normally.

However, the aforementioned testing method for a single board cannot control the start-up sequence of the proper power supply and the operating signals required by a single module. Moreover, without considering whether the object under test (such as the motherboard) is allowed to be powered on and not protected against incorrect power sequence, the power supply cannot effectively control the output to The power supply of the object under test. In this way, not only the potential probability of damage to the components of the DUT is increased, but also the production cost is additionally increased.

Contents of the invention

In view of the above problems, the object of the present invention is to provide an auxiliary test device, so that the DUT can be powered on according to the correct power supply sequence and give the DUT a corresponding analog signal to perform a single module test without the need to Test after machine integration, thereby reducing the damage probability of circuit components of the DUT and increasing the convenience of testing.

An auxiliary test device of the present invention is suitable for a test object. The auxiliary testing device includes a power supply unit, a storage unit and a control unit. The power supply unit is used to provide multiple voltages, wherein the aforementioned voltages are different from each other. The storage unit is used for storing the power sequence table and the analog signal generation table corresponding to the DUT. The control unit is coupled to the storage unit and the power supply unit, and is used to provide multiple power supply sequence control signals according to the power supply sequence table, so that the power supply unit sequentially provides the aforementioned voltages to the object under test according to the aforementioned power sequence control signals, and generates according to the analog signal. The table provides an analog signal corresponding to the object under test to the object under test, and the control unit receives a plurality of state signals generated by the object under test in response to the aforementioned voltage and the analog signal.

In an embodiment, the aforementioned auxiliary testing device further includes an updating unit. The update unit is coupled to the storage unit and is used for receiving and updating the power timing table and the analog signal generation table according to the update signal.

In one embodiment, the aforementioned auxiliary testing device further includes a display unit. The display unit is coupled to the control unit for receiving the aforementioned state signal through the control unit to display the aforementioned state signal.

In one embodiment, the aforementioned storage unit is further used to store another power timing table and another analog signal generation table corresponding to the DUT, and the auxiliary testing device further includes a detection unit. The detection unit is coupled to the control unit for detecting the type of the object to be tested to generate a detection signal. Wherein, the control unit is used for receiving and according to the detection signal, selecting and according to the power timing table and the analog signal generating table or another power timing table and another analog signal generating table to provide the aforementioned power timing signal and analog signal.

In one embodiment, the aforementioned control unit and storage unit are configured in a complex programmable logic device (Complex Programming Logic Device, CPLD).

In the auxiliary test device of the present invention, after the auxiliary test device is connected to the object to be tested, according to the power supply sequence corresponding to the object to be tested, the operating voltage corresponding to the power supply sequence is sequentially provided, so that the object to be tested can be based on its correct power supply sequence. Power on and provide the analog signal corresponding to the DUT. In this way, a single module test can be performed without combining the whole machine to test, so as to reduce the damage probability of the circuit components of the DUT and increase the convenience of the test.

The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments, but not as a limitation of the present invention.

Description of drawings

Fig. 1 is the block diagram of auxiliary testing device of the present invention;

Fig. 2 is a block diagram of another auxiliary testing device of the present invention.

Among them, reference signs

100, 200 auxiliary test device

110, 210 power supply unit

120, 220 storage units

130, 230 control unit

180, 280 DUT

240 display units

250 detection units

260 update units

Detailed ways

Below in conjunction with accompanying drawing, structural principle and working principle of the present invention are specifically described:

Please refer to FIG. 1 , which is a block diagram of the auxiliary testing device of the present invention. The auxiliary test device 100 of the present embodiment is suitable for a unit under test (UUT) 180, wherein the unit under test 180 is, for example, a memory module (DIMM module), a central processing unit module (CPU module), a main input and output board (MainI) /Oboard) and other individual veneers, but the present invention is not limited thereto.

The auxiliary test device 100 includes a power unit 110 , a storage unit 120 and a control unit 130 . The power unit 110 is used for providing multiple voltages, wherein the voltages are different from each other. Wherein, the foregoing voltage is, for example, 3.3V, 5V, 12V, etc., but the present invention is not limited thereto. The storage unit 120 is used for storing a power supply timing table and an analog signal generation table corresponding to the object under test 180 . Among them, the power sequence table, for example, records the power-on sequence of the object under test 180 from power-on to normal operation, and the analog signal generation table, for example, records the power good (PowerGood) signal before the initial program of the object under test 180 or the signal of the pre-component .

The control unit 130 is coupled to the storage unit 120 and the power unit 110 for providing a plurality of power timing control signals according to the power timing table, and providing the power timing control signals to the power unit 110 . Assuming that the voltage output sequence recorded in the power timing table is, for example, 12V, 5V, and 3.3V, the control unit 130 provides the corresponding power timing control signals of 12V, 5V, and 3.3V accordingly.

Then, the power supply unit 110 sequentially provides the working voltage required by the object under test 180 to the object under test 180 according to the power sequence control signal, so that the object under test 180 can operate from the power-on stage to the normal operation stage. That is to say, the power supply unit 110 sequentially provides the aforementioned voltages of 12V, 5V, and 3.3V to the DUT 180 according to the aforementioned power timing control signal, so as to ensure that the DUT 180 can operate in the correct power timing.

In addition, the control unit 130 also provides an analog signal to the object under test 180 according to the analog signal generation table. Wherein, the analog signal may be a PowerGood signal of a previous stage or a signal of a pre-component, that is, a signal provided by other modules related to the DUT 180 . For example, the initialization of the memory module requires a confirmation signal of the presence of the CPU. That is to say, if the object under test 180 is assumed to be a memory module, the control unit 130 will provide a confirmation signal of the existence of the central processing unit, and then the object under test 180 will perform an initial procedure.

In addition to providing the power sequence control signal and the analog signal, the control unit 130 can also receive a plurality of status signals generated by the DUT 180 in response to the voltage and the analog signal provided by the voltage unit 110 . Wherein, the aforementioned status signal is, for example, a power supply correct or error status signal, an initial program correct or error status signal, and the like. That is to say, when the circuit element in the object under test 180 receives the voltage of 12V and operates, it will return the correct or wrong state signal corresponding to the voltage of 12V to the control unit 130; when the circuit element in the object under test 180 After the voltage of 5V is received and processed, a correct or incorrect state signal corresponding to the 5V will be sent back to the control unit 130; the rest can be analogized. That is to say, in this embodiment, the control unit 130 can monitor the power-on sequence and initial program process of the object under test 180 and the operation status of the components in the object under test 180 corresponding to the aforementioned voltages and analog signals.

In addition, the control unit 130 may, for example, store the aforementioned status signal in the storage unit 120 . In this way, the user can read the information stored in the storage unit 120 to know whether the object under test 180 has been executed to a normal operation state, and accordingly use the main test device to perform subsequent measurements on the object under test 180 .

In this embodiment, the storage unit 120 and the control unit 130 can be realized by a complex programmable logic device (Complex Programming Logic Device, CPLD).

The auxiliary test device 100 of this embodiment can provide the voltage corresponding to the power-on sequence of the object under test 180 and the analog signal to the object under test 180, so that the object under test 180 can still have all the modules without combining other modules. After the assembly, the power-on program and the initial program are operated, so that the object under test 180 can be tested independently with a single module (memory module or CPU module). In this way, the damage probability of the circuit elements of the object under test can be reduced, and the convenience of testing can be increased.

Please refer to FIG. 2 , which is a block diagram of another auxiliary testing device of the present invention. The auxiliary testing device 200 of this embodiment is suitable for a unit under test (UUT) 280 . The auxiliary test device 200 includes a power unit 210 , a storage unit 220 , a control unit 230 , a display unit 240 , a detection unit 250 and an update unit 260 .

The power unit 210 is used for providing multiple voltages, wherein the voltages are different from each other. Wherein, the aforementioned voltage is, for example, 3.3V, 5V, 12V and so on. The storage unit 220 is used for storing the power timing table and another power timing table and the analog signal generation table and another analog signal generation table corresponding to the DUT 280 . That is to say, the storage unit 220 can store the power timing table and the analog signal generation table required by two different types of DUTs 280 . The aforementioned power timing table and analog signal generation table are only two examples, but the present invention is not limited thereto. The user can adjust the power timing table and analog signal in the storage unit 220 according to the type of the object under test 280. The number of generated tables.

The control unit 230 is coupled to the storage unit 220 and the power supply unit 210 for providing a plurality of power timing control signals and analog signals according to the power timing table and the analog signal generation table or another power timing table and another analog signal generation table. Next, the power supply unit 210 sequentially provides voltages to the object under test 280 according to the aforementioned power sequence control signal. Moreover, the control unit 230 can also provide the required analog signal corresponding to the object under test 280 according to the analog signal generation table. The control unit 230 receives a plurality of state signals generated by the object under test 280 in response to the aforementioned voltage and analog signals.

The display unit 240 is coupled to the control unit 230 for receiving the status signal returned by the object under test 280 through the control unit 230 to display the status signal. In this way, the user can know whether an error has occurred in the object under test 280 through the status displayed on the display unit 240 , and then perform corresponding processing on the object under test 280 .

The detection unit 250 is coupled to the control unit 230 for detecting the type of the object under test 280 to generate a detection signal. For example, the detection unit 250 can be configured with a multi-pin connection port, so that when the detection unit 250 is connected to the object under test 280 through the connection port, the detection unit 250 can detect the number and position of the pins connected to the connection port. The type of the object 280, such as a memory module or a CPU module. Afterwards, the detection unit 250 generates a corresponding detection signal and sends it to the control unit 230 .

Next, the control unit 230 can select a power timing table and an analog signal generation table or another power timing table and another analog signal generation table corresponding to the detection signal in the storage unit 220 according to the detection signal, and provide relevant power accordingly. timing signals as well as analog signals. For example, the memory module corresponds to a power timing table and an analog signal generation table, and the CPU module corresponds to another power timing table and another analog signal generation table.

In addition, the update unit 260 is coupled to the storage unit 220 for receiving and updating the power timing table and the analog signal generation table stored in the storage unit 220 according to the update signal. That is to say, the user can update the version and quantity of the power timing table and the analog signal generation table stored in the storage unit 220 through the updating unit 260 . In this way, the convenience of use can be increased. In this embodiment, the control unit 230 and the storage unit 220 can be realized by complex programmable logic devices.

In the auxiliary test device of the embodiment of the present invention, after the auxiliary test device is connected to the object under test, it generates a corresponding power sequence control signal according to the power sequence corresponding to the object under test, so as to sequentially provide voltage to the object under test , so that the DUT can be powered on according to its correct power sequence, and provide the analog signal corresponding to the DUT. In this way, a single module test can be carried out without the need to test the whole machine after assembly, so as to reduce the damage probability of the circuit components of the DUT. In addition, the auxiliary test device can also display the status of the power-on sequence process, and provide the voltage and analog signal corresponding to the power sequence required by the DUT according to the type of the DUT, and can update the version and quantity of the power sequence table, and then Can increase the convenience of testing.

Of course, the present invention can also have other various embodiments, and those skilled in the art can make various corresponding changes and deformations according to the present invention without departing from the spirit and essence of the present invention, but these corresponding Changes and deformations should belong to the scope of protection of the appended claims of the present invention.

Claims (3)

1. An auxiliary test device, suitable for a test object, is characterized in that, the auxiliary test device comprises: a power supply unit for providing multiple voltages, wherein the voltages are different from each other; a storage unit for storing a power supply timing table and an analog signal generation table corresponding to the DUT; A control unit, coupled to the storage unit and the power supply unit, is used to provide a plurality of power supply timing control signals according to the power supply timing table, so that the power supply unit sequentially provides the voltages to the power supply sequence according to the power supply timing control signals The object under test, and according to the analog signal generation table, an analog signal corresponding to the object under test is provided to the object under test, and the control unit receives the response of the object under test to the voltage and the analog signal generated by the multiple a status signal; an update unit, coupled to the storage unit, for receiving and updating the power timing table and the analog signal generation table according to an update signal; and A display unit, coupled to the control unit, is used for receiving the status signals through the control unit to display the status signals. 2. The auxiliary test device according to claim 1, wherein the storage unit is also used to store another power supply timing table and another analog signal generation table corresponding to the DUT, and the auxiliary test device also include: a detection unit for detecting the type of the analyte to generate a detection signal; Wherein, the control unit is used for receiving and according to the detection signal, selecting and providing the power timing signals according to the power timing table and the analog signal generation table or the other power timing table and the other analog signal generation table and the analog signal. 3. The auxiliary test device according to claim 1, wherein the control unit and the storage unit are configured in a complex programmable logic device.