CN103175633A - Electron temperature measuring circuit with self-regulating function - Google Patents
Electron temperature measuring circuit with self-regulating function Download PDFInfo
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Abstract
The invention discloses an electron temperature measuring circuit with a self-regulating function. The electron temperature measuring circuit comprises a thermistor, a reference resistor, an oscillating circuit module, a temperature measuring counting module, a memory module, a measuring information output module, a self-regulating module and a testing switch, wherein the thermistor and the reference resistor are connected with the measuring information output module through the oscillating circuit module, the temperature measuring counting module and the memory module; the oscillating circuit module is connected with the self-regulating module and the temperature measuring counting module respectively through the testing switch; and output signals of the self-regulating module are sent to the memory module. By means of the electron temperature measuring circuit with the self-regulating function, thermistor temperature curves preset inside can be self-regulated according to central resistance values of the thermistor, correction factors can be saved, and therefore temperature curves of the thermistor with different central resistance values can be better fitted, and measuring errors are reduced while testing costs are reduced; and additionally, the electron temperature measuring circuit is simple in structure and practical, stable and reliable in working performances and wide in application range.
Description
Technical field
The present invention relates to the temperature survey field, particularly the electron temperature measurement technical field, specifically refer to a kind of electron temperature measurement circuit with self-regulating function.
Background technology
In prior art, electronic thermometer is generally that temperature and resistance relation that the center resistance is the thermistor of a specific electrical resistance (for example specified temp is 37 ℃, and the center resistance is 30K) are deposited in internal storage.But the center resistance of thermistor allows the error of 1% (29.7K is to 30.3K) usually, and due to the nonlinear characteristic of thermistor itself, the thermistor of concentricity resistance not, its temperature curve is not identical, and the default temperature curve of chip internal is unique, thereby causes the error measured.
See also shown in Figure 1ly, it is the module diagram of traditional electric body-temperature metering circuit, and RS is thermistor, and RF is reference resistance.According to the RC vibration theory, the thermometric counting module is counted respectively the waveform of reference resistance and thermistor.Suppose in identical Measuring Time, reference resistance RF to be count down to a certain fixed value N
37, RS count down to N1 to thermistor, satisfies formula N
37* T
RF=N1 * T
RSAccording to count results
Due to this algorithm oscillation-damped device constant k substantially
oscImpact, so be proportional to resistance value oscillation period,
According to the value of N1, search corresponding temperature in the ROM look-up table, export by output module.Due to 37 ℃ of the normally specified temps of storing in the ROM look-up table, the center resistance is the temperature curve of the thermistor of 30K, and external reference resistance 30K normally.Therefore 37 ℃ the time, N1=N
37But because the center resistance error of thermistor is generally 1% (29.7K is to 30.3K), its temperature curve of the thermistor of concentricity resistance is not identical, thereby has caused the error of measuring.
Therefore roughly there are two kinds of improvement ways when production test:
The one, in when test, fully according to the curve of the thermistor of reality, the temperature curve of rewritting circuit inside;
The 2nd, at the built-in resistance of circuit and capacitance compensation network and switch control logic or built-in parameter list, utilize outside corrective system to choose suitable compensation combination, to utilize to increase voltage, the modes such as current fusing keep selected parameter group.
Rewriteeing temperature curve fully needs to expend a large amount of debug times aborning, utilizes outside corrective system to carry out the support that parametric compensation needs outside software and hardware, has increased production cost.
Summary of the invention
The objective of the invention is to have overcome above-mentioned shortcoming of the prior art, provide a kind of can be according to the default thermistor curve of the center resistance self-regulation of thermistor, better realize match not the thermistor of concentricity resistance temperature curve, significantly reduce testing cost, obviously reduce the electron temperature measurement circuit that measuring error, simple and practical, stable and reliable working performance, the scope of application have self-regulating function comparatively widely.
In order to realize above-mentioned purpose, the electron temperature measurement circuit with self-regulating function of the present invention has following formation:
this has the electron temperature measurement circuit of self-regulating function, comprise thermistor, reference resistance, the oscillatory circuit module, the thermometric counting module, memory module and metrical information output module, described thermistor and reference resistance are all by described oscillatory circuit module, the thermometric counting module, memory module is connected with described metrical information output module, its principal feature is, also comprise self-regulation module and test change-over switch in described circuit structure, described oscillatory circuit module is connected with the thermometric counting module with described self-regulation module respectively by described test change-over switch, and the output signal of described self-regulation module is delivered to described memory module, this self-regulation module is according to the center resistance of described thermistor and the oscillation frequency of reference resistance, temperature curve default in described memory module is revised, and correction factor is preserved.
This self-regulation module that has in the electron temperature measurement circuit of self-regulating function comprises:
Counting unit is connected with described test change-over switch, is used in same time, the central value of described thermistor and the waveform of reference resistance being counted;
Comparer is connected with described counting unit, is used for relatively count results, obtains correction factor α;
The correction factor storage unit is connected with described comparer, is used for storage correction factor α.
This center resistance error with the thermistor in the electron temperature measurement circuit of self-regulating function is for ± 1% the time, and the scope of described correction factor α is 0.99～1.01.
This has the duty of the test switching switch control circuit in the electron temperature measurement circuit of self-regulating function, when this test change-over switch is set to test pattern, the central value of described thermistor and the oscillation frequency of reference resistance are delivered to described self-regulation module, produce correction factor α; When this test change-over switch is set to normally use pattern, the oscillation frequency of described thermistor and reference resistance is delivered to described thermometric counting module, according to count results, and in conjunction with described correction factor α, find out correct corresponding temperature in described memory module.
This oscillatory circuit module that has in the electron temperature measurement circuit of self-regulating function is the RC oscillator.
This memory module that has in the electron temperature measurement circuit of self-regulating function is the ROM storer.
Adopted the electron temperature measurement circuit with self-regulating function of this invention, because it does not need to rely on outside software and hardware, can be according to the center resistance of thermistor, the thermistor temp curve of self-regulation internal preset, and correction factor can be preserved, thereby better match is the temperature curve of the thermistor of concentricity resistance not, when reducing testing cost, reduced measuring error, and also simple and practical, stable and reliable working performance, the scope of application are comparatively extensive.
Description of drawings
Fig. 1 is temperature measuring circuit high-level schematic functional block diagram of the prior art.
Fig. 2 is the electron temperature measurement circuit function module schematic diagram with self-regulating function of the present invention.
Fig. 3 is the built-in function cell schematics of the self-regulation module in the electron temperature measurement circuit with self-regulating function of the present invention.
Embodiment
In order more clearly to understand technology contents of the present invention, describe in detail especially exemplified by following examples.
see also Fig. 2 and shown in Figure 3, this has the electron temperature measurement circuit of self-regulating function, comprise thermistor, reference resistance, the oscillatory circuit module, the thermometric counting module, memory module and metrical information output module, described thermistor and reference resistance are all by described oscillatory circuit module, the thermometric counting module, memory module is connected with described metrical information output module, wherein, also comprise self-regulation module and test change-over switch in described circuit structure, described oscillatory circuit module is connected with the thermometric counting module with described self-regulation module respectively by described test change-over switch, and the output signal of described self-regulation module is delivered to described memory module, this self-regulation module is according to the center resistance of described thermistor and the oscillation frequency of reference resistance, temperature curve default in described memory module is revised, and correction factor is preserved.
Wherein, described self-regulation module comprises:
(1) counting unit is connected with described test change-over switch, is used in same time, the central value of described thermistor and the waveform of reference resistance being counted;
(2) comparer is connected with described counting unit, is used for relatively count results, obtains correction factor α;
(3) correction factor storage unit is connected with described comparer, is used for storage correction factor α.
Simultaneously, when the center resistance error of described thermistor was ± 1%, the scope of described correction factor α was 0.99～1.01; The duty of described test switching switch control circuit, when this test change-over switch was set to test pattern, the central value of described thermistor and the oscillation frequency of reference resistance were delivered to described self-regulation module, produced correction factor α; When this test change-over switch is set to normally use pattern, the oscillation frequency of described thermistor and reference resistance is delivered to described thermometric counting module, according to count results, and in conjunction with described correction factor α, find out correct corresponding temperature in described memory module.
In the middle of reality was used, the related self-regulation of thermometer measure circuit of the present invention was the production field for factory, is in order to solve the bad problem of thermistor consistance.And in test process, the default temperature curve of chip internal is revised, namely preserve, can not revise again.
The thermistor that wherein relates to, reference resistance are by the RC oscillatory circuit, directly become clock signal, be used for rolling counters forward, simultaneously, the present invention is by the comparison to the rolling counters forward result, obtain concrete corrected parameter, the standard temperature curve that prestores in ROM is modified, and preserve.
The following formula table of use that the resistance-temperature characteristics of general thermistor can be similar to shows:
Wherein: T (K)=t (℃)+273.15
Resistance when R0---temperature is T0
Resistance when R---temperature is T
In fact, thermistor constant B is not what fix, therefore uses formula calculated resistance value in larger temperature range, can have larger error.Such as the body temperature meter is generally chosen 32 ℃～44 ℃ as surveying range, the performance of this interval thermistor approaches linear.
The oscillation frequency of RC oscillator is:
Wherein the oscillator constant is:
In following formula, V
H, V
LBe Schmidt trigger transition high level and low level, V
DDBe supply voltage.
See also shown in Figure 2 be of the present invention can self-regulating electric body-temperature metering circuit.This circuit has comprised a self-regulation module and test change-over switch TEST.Work as TEST=1, circuit enters test pattern, and the central value of thermistor and the oscillation frequency of reference resistance enter the self-regulation module, through processing, obtains correction factor, and preserves.Work as TEST=0, circuit enters normal use pattern, and the oscillation frequency of thermistor and reference resistance enters the thermometric counting module, according to count results, and in conjunction with correction factor, finds out correct corresponding temperature in ROM.
Fig. 3 is a specific embodiment of the self-regulation module that comprises of electric body-temperature metering circuit of the present invention, can comprise counting module, comparer and correction factor storage unit.When the central value of thermistor and the oscillation frequency of reference resistance enter the self-regulation module, counter is counted oscillator signal in same time respectively, at one time in, the count value of the oscillator signal of thermistor central value is N2.In comparing unit with the N of N2 and standard
37Compare, control module is stored in correction factor α in the correction factor storage unit according to comparative result, and the temperature curve in circuit is revised.
When electric body-temperature metering circuit normal operation of the present invention, the number of oscillation of supposing the thermistor waveform is N1, so is modified to N1+N by this corrected parameter
37(1-a).During higher than reference resistance, according to the RC vibration, the oscillation frequency of thermistor is lower than the oscillation frequency of reference resistance, N2＜N when the central value of thermistor
37, correction factor a＜1.During lower than reference resistance, according to the RC vibration, the oscillation frequency of thermistor is higher than the oscillation frequency of reference resistance, N2＞N when the central value of thermistor
37, correction factor a＞1.When the central value of thermistor equals reference resistance, N2=N
37, correction factor a=1.When the center resistance error of thermistor was generally 1% (29.7K is to 30.3K), the scope of correction factor a was 0.99～1.01.
Of the present invention can self-regulating thermometer measure circuit, wherein comprised a self-regulation module and test change-over switch TEST.
This can self-regulating thermometer measure circuit in, but the duty of described test change-over switch TEST control circuit.As test change-over switch TEST=1, circuit enters test pattern, and the central value of thermistor and the oscillation frequency of reference resistance enter the self-regulation module, produce correction factor α.As test TEST=0, circuit enters normal use pattern, and the oscillation frequency of thermistor and reference resistance enters the thermometric counting module, according to count results, and in conjunction with correction factor α, finds out correct corresponding temperature in ROM.
This can self-regulating thermometer measure circuit in the self-regulation module comprise:
Counting module is used in same time, the central value of thermistor and the waveform of reference resistance being counted;
Comparer is used for count results is compared, and obtains correction factor α;
The correction factor storage unit is used for storage correction factor α.
Adopted the above-mentioned electron temperature measurement circuit with self-regulating function, because it does not need to rely on outside software and hardware, can be according to the center resistance of thermistor, the thermistor temp curve of self-regulation internal preset, and correction factor can be preserved, thereby better match is the temperature curve of the thermistor of concentricity resistance not, when reducing testing cost, reduced measuring error, and also simple and practical, stable and reliable working performance, the scope of application are comparatively extensive.
In this instructions, the present invention is described with reference to its specific embodiment.But, still can make various modifications and conversion obviously and not deviate from the spirit and scope of the present invention.Therefore, instructions and accompanying drawing are regarded in an illustrative, rather than a restrictive.
Claims (6)
1. electron temperature measurement circuit with self-regulating function, comprise thermistor, reference resistance, the oscillatory circuit module, the thermometric counting module, memory module and metrical information output module, described thermistor and reference resistance are all by described oscillatory circuit module, the thermometric counting module, memory module is connected with described metrical information output module, it is characterized in that, also comprise self-regulation module and test change-over switch in described circuit structure, described oscillatory circuit module is connected with the thermometric counting module with described self-regulation module respectively by described test change-over switch, and the output signal of described self-regulation module is delivered to described memory module, this self-regulation module is according to the center resistance of described thermistor and the oscillation frequency of reference resistance, temperature curve default in described memory module is revised, and correction factor is preserved.
2. the electron temperature measurement circuit with self-regulating function according to claim 1, is characterized in that, described self-regulation module comprises:
Counting unit is connected with described test change-over switch, is used in same time, the central value of described thermistor and the waveform of reference resistance being counted;
Comparer is connected with described counting unit, is used for relatively count results, obtains correction factor α;
The correction factor storage unit is connected with described comparer, is used for storage correction factor α.
3. the electron temperature measurement circuit with self-regulating function according to claim 2, is characterized in that, when the center resistance error of described thermistor was ± 1%, the scope of described correction factor α was 0.99～1.01.
4. the described electron temperature measurement circuit with self-regulating function of any one according to claim 1 to 3, it is characterized in that, the duty of described test switching switch control circuit, when this test change-over switch is set to test pattern, the central value of described thermistor and the oscillation frequency of reference resistance are delivered to described self-regulation module, produce correction factor α; When this test change-over switch is set to normally use pattern, the oscillation frequency of described thermistor and reference resistance is delivered to described thermometric counting module, according to count results, and in conjunction with described correction factor α, find out correct corresponding temperature in described memory module.
5. the described electron temperature measurement circuit with self-regulating function of any one according to claim 1 to 3, is characterized in that, described oscillatory circuit module is the RC oscillator.
6. the described electron temperature measurement circuit with self-regulating function of any one according to claim 1 to 3, is characterized in that, described memory module is the ROM storer.
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107884096A (en) * | 2017-11-09 | 2018-04-06 | 无锡华润矽科微电子有限公司 | The automatic calibrating method and equipment of electronic temperature measurement equipment with micro-control unit |
| CN112729590A (en) * | 2020-12-25 | 2021-04-30 | 中国科学院微电子研究所 | Temperature sensor reading device, temperature reading method, and electronic apparatus |
| CN113532680A (en) * | 2021-06-03 | 2021-10-22 | 上海润欣科技股份有限公司 | Thermometer chip and thermometer |
| CN114689199A (en) * | 2020-12-29 | 2022-07-01 | 华润微集成电路(无锡)有限公司 | Prediction type electronic thermometer circuit structure for realizing temperature compensation |
| CN115342939A (en) * | 2021-05-13 | 2022-11-15 | 华润微集成电路(无锡)有限公司 | Circuit structure of electronic thermometer |
| CN118376867A (en) * | 2024-06-25 | 2024-07-23 | 东方电子股份有限公司 | Automatic testing device and method for power distribution terminal |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101398334A (en) * | 2007-09-29 | 2009-04-01 | 联兴微系统科技股份有限公司 | Temperature sensing element correction method and correction system |
| JP2010230579A (en) * | 2009-03-27 | 2010-10-14 | Terumo Corp | Electronic thermometer and operation control method |
| CN202075060U (en) * | 2011-05-19 | 2011-12-14 | 樱花卫厨（中国）股份有限公司 | Temperature measuring device of numerical control sterilizing cabinet |
| CN202442811U (en) * | 2011-12-21 | 2012-09-19 | 无锡华润矽科微电子有限公司 | Structure of electronic temperature measurement circuit |
-
2011
- 2011-12-21 CN CN201110434184.9A patent/CN103175633B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101398334A (en) * | 2007-09-29 | 2009-04-01 | 联兴微系统科技股份有限公司 | Temperature sensing element correction method and correction system |
| JP2010230579A (en) * | 2009-03-27 | 2010-10-14 | Terumo Corp | Electronic thermometer and operation control method |
| CN202075060U (en) * | 2011-05-19 | 2011-12-14 | 樱花卫厨（中国）股份有限公司 | Temperature measuring device of numerical control sterilizing cabinet |
| CN202442811U (en) * | 2011-12-21 | 2012-09-19 | 无锡华润矽科微电子有限公司 | Structure of electronic temperature measurement circuit |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107884096A (en) * | 2017-11-09 | 2018-04-06 | 无锡华润矽科微电子有限公司 | The automatic calibrating method and equipment of electronic temperature measurement equipment with micro-control unit |
| CN112729590A (en) * | 2020-12-25 | 2021-04-30 | 中国科学院微电子研究所 | Temperature sensor reading device, temperature reading method, and electronic apparatus |
| CN114689199A (en) * | 2020-12-29 | 2022-07-01 | 华润微集成电路(无锡)有限公司 | Prediction type electronic thermometer circuit structure for realizing temperature compensation |
| WO2022142237A1 (en) * | 2020-12-29 | 2022-07-07 | 华润微集成电路(无锡)有限公司 | Predictive-type electronic body temperature thermometer circuit structure implementing temperature compensation |
| US11976986B2 (en) | 2020-12-29 | 2024-05-07 | CRM ICBG (Wuxi) Co., Ltd. | Predictive electronic thermometer circuit structure capable of temperature compensation |
| CN115342939A (en) * | 2021-05-13 | 2022-11-15 | 华润微集成电路(无锡)有限公司 | Circuit structure of electronic thermometer |
| CN113532680A (en) * | 2021-06-03 | 2021-10-22 | 上海润欣科技股份有限公司 | Thermometer chip and thermometer |
| CN118376867A (en) * | 2024-06-25 | 2024-07-23 | 东方电子股份有限公司 | Automatic testing device and method for power distribution terminal |
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Address after: 214135 -6, Linghu Avenue, Wuxi Taihu international science and Technology Park, Wuxi, Jiangsu, China, 180 Patentee after: China Resources micro integrated circuit (Wuxi) Co., Ltd Address before: No.180-22, Linghu Avenue, Wuxi, Jiangsu 214000 Patentee before: WUXI CHINA RESOURCES SEMICO Co.,Ltd. |