CN103091590B - A kind of series capacitance detection method and equipment - Google Patents

Abstract

The invention discloses a series capacitance detection method and equipment, relates to the technical field of capacitance, and can improve the reliability of the series application of the capacitance. The method for detecting the series capacitance includes: detecting each capacitance in the series capacitance at the same time; judging whether there is a failure capacitor in the series capacitance, and the failure capacitance is a capacitance in a short circuit state, an open circuit state or an aging state of capacitance; When there is a failed capacitor in the series capacitor, replace the failed capacitor with a backup capacitor. The invention is used for detecting the series capacitance.

Description

Method and device for detecting series capacitance

technical field

The invention relates to the technical field of capacitance, in particular to a method and equipment for detecting series capacitance.

Background technique

A supercapacitor is a device with a relatively large capacitance value. It has the same characteristics of fast charging and fast discharging as ordinary capacitors, and it also has the same characteristics of storing electric energy as batteries. The capacitance value of supercapacitor is relatively large, but its withstand voltage value is relatively low, that is, the voltage value that supercapacitor can withstand is relatively low, generally 2V to 3V, but at present, most electrical equipment requires higher voltage than 3V , if a supercapacitor is used to provide electrical energy for electrical equipment, it is necessary to connect multiple supercapacitors in series to form a supercapacitor module to increase the withstand voltage of the supercapacitor.

When supercapacitors are connected in series to form a supercapacitor module, if any supercapacitor in the supercapacitor module is in a short-circuit state, the voltage of other supercapacitors in the supercapacitor module will rise, or even exceed its withstand voltage value, causing the supercapacitor to fail; Any one of the supercapacitors in an open state will cause the entire series circuit to lose the return path, resulting in the loss of discharge capacity of the supercapacitor; any one of the supercapacitors in a state of capacitance aging will increase the voltage of the supercapacitor, even exceeding its withstand voltage. Therefore, it is particularly important to detect the state of the capacitor when it is applied in series. It should be noted that the capacitance aging refers to a state in which the capacitance value of the capacitor decreases compared with the initial capacitance value after the capacitor is used for a period of time.

In the prior art, when detecting series capacitors, the capacitors in the series capacitors must be replaced with spare capacitors first, and then it is detected whether the replaced capacitors fail, and the above process is repeated until all the capacitors in the series capacitors are detected, but , the reliability of the series capacitor in application is determined by the probability that the series capacitor can be in a normal working state, and the above capacitance detection method needs to replace each capacitor in the series capacitor with a spare capacitor one by one, and then detect the replaced capacitor , The test cycle is long, and the capacitance detection equipment cannot detect the failed capacitor in time, so that the series capacitor cannot quickly restore the normal working state, so the reliability of the capacitor in series application is low.

Contents of the invention

Embodiments of the present invention provide a method and device for detecting series capacitors, which can improve reliability when capacitors are used in series.

In order to achieve the above object, embodiments of the present invention adopt the following technical solutions:

In a first aspect, an embodiment of the present invention provides a method for detecting a series capacitance, including:

Simultaneous detection of each capacitor in the series capacitor;

Judging whether there is a failed capacitor in the series capacitor, the failed capacitor is a capacitor in a short-circuit state, an open-circuit state, or an aging state of capacitance;

When there is a failed capacitor in the series capacitor, replace the failed capacitor with a backup capacitor.

In combination with the first possible implementation manner of the first aspect, the simultaneous detection of each capacitance in the series capacitance includes:

At the same time, the voltage values of the positive and negative electrodes of each capacitor in the series capacitors are detected.

With reference to the first aspect or the first possible implementation of the first aspect, in the second possible implementation, the judging whether there is a failed capacitor in the series capacitor includes:

If there is a capacitor with the same positive and negative voltage values in the series capacitor, it is judged that the capacitor with the same positive and negative voltage values is a failed capacitor in a short circuit state.

With reference to the first aspect or the first possible implementation of the first aspect, in a third possible implementation, the judging whether there is a failed capacitor in the series capacitor includes:

After the charging of the series capacitor is completed, if there is a capacitor whose voltage value fluctuates in the series capacitor, it is judged that the capacitor whose positive voltage value fluctuates and the negative voltage value remains unchanged is a failed capacitor in an open circuit state, so The fluctuation of the above-mentioned voltage value refers to the change of the voltage value beyond the normal voltage range on the basis of the normal voltage value after charging;

Or after stopping charging the series capacitor and discharging the series capacitor, if the voltage value of the positive pole in the series capacitor drops beyond the preset range within a preset period of time and the voltage value of the negative pole remains unchanged It is judged that the capacitor whose positive voltage value drops beyond a preset range and negative voltage value remains unchanged within a preset time period is a failed capacitor in an open circuit state.

With reference to the first aspect or the first possible implementation manner of the first aspect, in a fourth possible implementation manner, the judging whether there is a failed capacitor in the series capacitor includes:

During the charging process of the series capacitor, if there is a capacitor whose positive voltage value is equal to the steady-state threshold and negative voltage value is 0 in the series capacitor, it is judged that the positive voltage value is equal to the steady-state threshold and the negative voltage value is 0. is a failed capacitor in an open circuit state.

With reference to the first aspect or the first possible implementation of the first aspect, in a fifth possible implementation, the judging whether there is a failed capacitor in the series capacitor includes:

After the charging of the series capacitor is completed, control the discharge of k series capacitors in the series capacitor, wherein the series capacitor includes n capacitors, n≥2, 2≤k≤n;

Obtaining the capacitance values of the k series capacitors according to the discharge time, discharge start voltage and discharge termination voltage of the k series capacitors;

bypassing one of the k capacitors to be measured in series to obtain k-1 capacitors in series;

controlling the discharge of the k-1 capacitors connected in series;

Obtaining the capacitance values of the k-1 capacitors connected in series according to the discharge time, the discharge start voltage and the discharge termination voltage of the k-1 capacitors connected in series;

Obtaining the measured capacitance value of the capacitor to be measured according to the capacitance values of the k capacitors connected in series and the capacitance values of the k-1 capacitors connected in series;

Comparing the measured capacitance value of the capacitor to be measured with an available capacitance value threshold of the capacitor to be measured, where the available capacitance value threshold refers to the lowest capacitance value at which the capacitor is in an available state;

If the measured capacitance value of the capacitor under test is less than the usable capacitance value threshold of the capacitor, it is determined that the capacitor under test is in a capacity aging state.

In a second aspect, an embodiment of the present invention provides a series capacitance detection device, including:

a detection unit, configured to simultaneously detect each capacitor in the series capacitor;

A judging unit, configured to judge whether there is a failed capacitor in the series capacitor according to the detection result of the detecting unit, and the failed capacitor is a capacitor in a short-circuit state, an open-circuit state, or a capacitance aging state;

A control unit, configured to replace the failed capacitor with a spare capacitor when the judging unit judges that there is a failed capacitor in the series capacitor.

In a first possible implementation manner in combination with the second aspect, the detection unit is specifically configured to:

At the same time, the voltage values of the positive and negative electrodes of each capacitor in the series capacitors are detected.

With reference to the second aspect or the first possible implementation manner of the second aspect, in a second possible implementation manner, the series capacitance detection device further includes:

A secondary power supply, the secondary power supply is connected to the series capacitor and used to charge the series capacitor.

With reference to the second aspect or the first or second possible implementation manner of the second aspect, in a third possible implementation manner, the judging unit is specifically configured to:

If there is a capacitor with the same positive and negative voltage values in the series capacitor, it is judged that the capacitor with the same positive and negative voltage values is a failed capacitor in a short circuit state.

With reference to the second aspect or the first or second possible implementation manner of the second aspect, in a fourth possible implementation manner, the judging unit is specifically configured to:

After the charging of the series capacitor is completed, if there is a capacitor whose voltage value fluctuates in the series capacitor, it is judged that the capacitor whose positive voltage value fluctuates and the negative voltage value remains unchanged is a failed capacitor in an open circuit state, so The fluctuation of the above-mentioned voltage value refers to the change of the voltage value beyond the normal voltage range on the basis of the normal voltage value after charging;

Or, after stopping charging the series capacitor and discharging the series capacitor, if the voltage value of the positive pole in the series capacitor drops beyond the preset range and the voltage value of the negative pole is not It is judged that the capacitor whose positive electrode voltage value drops within a preset range and whose negative electrode voltage value remains unchanged within a preset time period is a failed capacitor in an open circuit state.

With reference to the second aspect or the first or second possible implementation manner of the second aspect, in a fifth possible implementation manner, the judging unit is specifically configured to:

During the charging process of the series capacitor, if there is a capacitor whose positive voltage value is equal to the steady-state threshold and negative voltage value is 0 in the series capacitor, it is judged that the positive voltage value is equal to the steady-state threshold and the negative voltage value is 0. is a failed capacitor in an open circuit state.

With reference to the second aspect or the first or second possible implementation manner of the second aspect, in a sixth possible implementation manner, the judging unit is specifically configured to:

After the charging of the series capacitor is completed, control the discharge of k series capacitors in the series capacitor, wherein the series capacitor includes n capacitors, n≥2, 2≤k≤n;

Obtaining the capacitance values of the k series capacitors according to the discharge time, discharge start voltage and discharge termination voltage of the k series capacitors;

bypassing one of the k capacitors to be measured in series to obtain k-1 capacitors in series;

controlling the discharge of the k-1 capacitors connected in series;

Obtaining the capacitance values of the k-1 capacitors connected in series according to the discharge time, the discharge start voltage and the discharge termination voltage of the k-1 capacitors connected in series;

Obtaining the measured capacitance value of the capacitor to be measured according to the capacitance values of the k capacitors connected in series and the capacitance values of the k-1 capacitors connected in series;

comparing the measured capacitance value of the capacitor under test with an available capacitance value threshold of the capacitor under test;

If the measured capacitance value of the capacitor under test is less than the usable capacitance value threshold of the capacitor, it is determined that the capacitor under test is in a capacity aging state.

In a third aspect, an embodiment of the present invention provides a series capacitance detection device, the series capacitance detection device is connected to a series capacitance, and the series capacitance includes n capacitances, n≥2;

The series capacitance detection equipment includes:

At least one complex programmable logic device CPLD, the CPLD is used to detect each capacitor in the series capacitor at the same time, and judge whether there is a failed capacitor in the series capacitor, and the failed capacitor is in a short circuit state, an open circuit state or a capacitance value For a capacitor in an aging state, when there is a failed capacitor in the series capacitor, control to replace the failed capacitor with a backup capacitor.

In a first possible implementation in combination with the third aspect, the CPLD includes m analog-to-digital converter ADC pins, and the m ADC pins are respectively connected to positive and negative electrodes of the n capacitors in the series capacitors. Negative pole connection, wherein, the xth ADC pin and the x+1th ADC pin among the m ADC pins of the CPLD are respectively connected to the negative pole and the positive pole of the xth capacitance in the series capacitor, using At the same time, the voltage value of the negative electrode and the positive electrode of the xth capacitor in the series capacitor are detected, the 2≤m≤n, the 1≤x≤m.

In combination with the third aspect or the first possible implementation manner of the third aspect, in the second possible implementation manner, the CPLD is specifically used for:

If there is a capacitor with the same positive and negative voltage values in the series capacitor, it is judged that the capacitor with the same positive and negative voltage values is a failed capacitor in a short circuit state.

In combination with the third aspect or the first possible implementation manner of the third aspect, in the third possible implementation manner, the CPLD is specifically used for:

After the charging of the series capacitor is completed, if there is a capacitor whose voltage value fluctuates in the series capacitor, it is judged that the capacitor whose positive voltage value fluctuates and the negative voltage value remains unchanged is a failed capacitor in an open circuit state, so The fluctuation of the above-mentioned voltage value refers to the change of the voltage value beyond the normal voltage range on the basis of the normal voltage value after charging;

Or after stopping charging the series capacitor and discharging the series capacitor, if the voltage value of the positive pole in the series capacitor drops beyond the preset range within a preset period of time and the voltage value of the negative pole remains unchanged It is judged that the capacitor whose positive voltage value drops beyond a preset range and negative voltage value remains unchanged within a preset time period is a failed capacitor in an open circuit state.

In combination with the third aspect or the first possible implementation manner of the third aspect, in a fourth possible implementation manner, the CPLD is specifically used for:

During the charging process of the series capacitor, if there is a capacitor whose positive voltage value is equal to the steady-state threshold and negative voltage value is 0 in the series capacitor, it is judged that the positive voltage value is equal to the steady-state threshold and the negative voltage value is 0. is a failed capacitor in an open circuit state.

In combination with the third aspect or the first possible implementation manner of the third aspect, in a fifth possible implementation manner, the CPLD is specifically used for:

After the charging of the series capacitor is completed, control the discharge of k series capacitors in the series capacitor, wherein the series capacitor includes n capacitors, n≥2, 2≤k≤n;

Obtaining the capacitance values of the k series capacitors according to the discharge time, discharge start voltage and discharge termination voltage of the k series capacitors;

bypassing one of the k capacitors to be measured in series to obtain k-1 capacitors in series;

controlling the discharge of the k-1 capacitors connected in series;

Obtaining the capacitance values of the k-1 capacitors connected in series according to the discharge time, the discharge start voltage and the discharge termination voltage of the k-1 capacitors connected in series;

Obtaining the measured capacitance value of the capacitor to be measured according to the capacitance values of the k capacitors connected in series and the capacitance values of the k-1 capacitors connected in series;

Comparing the measured capacitance value of the capacitor to be measured with an available capacitance value threshold of the capacitor to be measured, where the available capacitance value threshold refers to the lowest capacitance value at which the capacitor is in an available state;

If the measured capacitance value of the capacitor under test is less than the usable capacitance value threshold of the capacitor, it is determined that the capacitor under test is in a capacity aging state.

With reference to the fifth possible implementation manner of the third aspect to the third aspect, in a sixth possible implementation manner, the detection device further includes:

n P-channel metal-oxide-semiconductor PMOSs, each of which is connected to the general-purpose input and output GPIO pins of the CPLD and a capacitor in the series circuit, for when there is a failure capacitor in the series capacitor, The conduction is controlled by the CPLD through the GPIO pin, so that the failure capacitor is bypassed;

N-channel metal-oxide-semiconductor NMOS, the NMOS is connected to the GPIO pin of the CPLD and a backup capacitor, and is used to control cut-off by the CPLD through the GPIO pin when there is a failure capacitor in the series capacitor , replacing the failed capacitor with the backup capacitor;

Then, the CPLD is also used to control the conduction of the PMOS to bypass the failure capacitor through the GPIO pin when there is a failure capacitor in the series capacitor, and control the cut-off of the NMOS to replace the backup capacitor with the backup capacitor. failed capacitors.

With reference to the third aspect to the sixth possible implementation manner of the third aspect, in a seventh possible implementation manner, the detection device further includes:

DC-to-DC power supply DC-DC, one end of the DC-DC is connected to the GPIO pin of the CPLD, and the other end is connected to the series capacitor, which is used to connect the series capacitor under the control of the GPIO pin of the CPLD. Capacitor charging.

With reference to the third aspect to the seventh possible implementation manner of the third aspect, in an eighth possible implementation manner, the detection device further includes:

A bipolar junction transistor BJT, the base of the BJT is connected to the pin GPIO of the CPLD, the emitter of the BJT is grounded, and the collector of the BJT is connected to the series capacitor for controlling the series capacitor discharge.

A method and device for detecting series capacitors provided by the embodiments of the present invention detect each capacitor in the series capacitor at the same time, and judge whether there is a failed capacitor in the series capacitor, and the failed capacitor is in a short circuit state, an open circuit state, or a capacitor. The capacitance of the aging state; when there is a failure capacitor in the series capacitor, replace the failure capacitor with a backup capacitor. Compared with the prior art, instead of using a backup capacitor to replace each capacitor in the series capacitor one by one, and then replace the capacitor to be used Instead of detecting the replaced capacitor, each capacitor in the series capacitor is detected at the same time. When the failed capacitor is detected, the failed capacitor is replaced with the spare capacitor, which can detect the failed capacitor in time and replace the failed capacitor with the spare capacitor, so that the series capacitor Quick return to normal operation, thus improving reliability when capacitors are used in series.

Description of drawings

FIG. 1 is a flow chart of a method for detecting series capacitance provided by Embodiment 1 of the present invention;

2 is a flow chart of a method for detecting whether there is a failed capacitor in a short circuit state in a series capacitor provided by Embodiment 1 of the present invention;

3 is a schematic diagram of a series capacitance detection device provided by Embodiment 1 of the present invention;

4 is a flow chart of a method for detecting whether there is a failed capacitor in an open circuit state in the series capacitor provided by Embodiment 1 of the present invention;

5 is a waveform diagram of a failed capacitor in an open circuit state in a series capacitor provided by Embodiment 1 of the present invention;

6 is a waveform diagram of another series capacitor provided by Embodiment 1 of the present invention, where there is a failed capacitor in an open circuit state;

7 is a flowchart of a method for detecting whether there is a failed capacitor in a capacitance aging state in a series capacitor provided by Embodiment 1 of the present invention;

8 is a flow chart of a method for detecting whether there is a failed capacitor in a short circuit state in the series capacitor during the charging process of the series capacitor provided by Embodiment 1 of the present invention;

9 is a flow chart of a method for detecting whether there is an open-circuit failure capacitor in the series capacitor during the charging process of the series capacitor provided by Embodiment 1 of the present invention;

FIG. 10 is a schematic diagram of another series capacitance detection device provided by Embodiment 2 of the present invention;

FIG. 11 is a schematic diagram of another series capacitance detection device provided by Embodiment 2 of the present invention;

FIG. 12 is a schematic diagram of yet another series capacitance detection device provided by Embodiment 2 of the present invention.

Detailed ways

The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

Example 1:

An embodiment of the present invention provides a method for detecting a series capacitor, as shown in FIG. 1 , including:

101. The series capacitance detection device detects each capacitance in the series capacitance at the same time.

Preferably, the series capacitance detection device simultaneously detects the voltage values of the positive and negative poles of each of the series capacitances.

102. The series capacitance detection device judges whether there is a failed capacitor in the series capacitor, and the failed capacitor is a capacitor in a short circuit state, an open circuit state, or a capacitance aging state.

Preferably, during the charging process of the series capacitor or after the charging of the series capacitor is completed, it can be judged that the voltage values of the positive and negative electrodes are equal according to whether there is a capacitor with the same voltage value of the positive and negative electrodes in the series capacitor. The capacitance of is a failure capacitor in a short circuit state. It should be noted that, during the charging process of the series capacitors, since the series capacitors are being charged, the voltage value of each of the series capacitors in the series capacitors is less than the steady-state threshold. After the charging of the series capacitors is completed, due to the The charging process has been completed, so the voltage value of each of the series capacitors is less than or equal to the steady-state threshold, and the voltage values in the two states are not equal. The steady-state threshold is the maximum voltage value that the series capacitor reaches during charging. Therefore, in the charging process of the series capacitor or after the charging of the series capacitor is completed, according to whether there is a capacitor with equal positive and negative voltage values in the series capacitor, that is, there is a capacitor whose voltage between the positive and negative electrodes is 0, It is judged that the capacitor whose positive and negative voltage values are equal is a failed capacitor in a short circuit state. Specifically, during the charging process of the series capacitor or after the charging of the series capacitor is completed, if there is a capacitor with the same positive and negative voltage values in the series capacitor, it is determined that the capacitor with the same positive and negative voltage values is a failed capacitor in a short circuit state.

Preferably, after the charging of the series capacitor is completed, if there is a capacitor whose voltage value fluctuates in the series capacitor, it is judged that the capacitor whose voltage value of the positive electrode fluctuates and the voltage value of the negative electrode remains unchanged is a failure in an open circuit state. Capacitor, the voltage value fluctuates means that there is a voltage value change beyond the normal voltage range on the basis of the normal voltage value after charging, that is, the difference between the voltage value and the original voltage value exceeds the normal range, for example, the positive electrode of a certain capacitor After the charging is completed, the voltage value should remain unchanged. Under normal circumstances, the variation range of the voltage value should not exceed ±5% of the original voltage value. If the difference between the voltage and the original voltage value exceeds the original voltage value 5%, it can be considered that the voltage value of the capacitor has a voltage value change beyond the normal voltage range, that is, fluctuations have occurred.

Or after stopping charging the series capacitor and discharging the series capacitor, if the voltage value of the positive pole in the series capacitor drops beyond the preset range within a preset period of time and the voltage value of the negative pole remains unchanged It is judged that the capacitor whose positive voltage value drops beyond a preset range and negative voltage value remains unchanged within a preset time period is a failed capacitor in an open circuit state.

Preferably, during the charging process of the series capacitor, if there is a capacitor whose positive voltage value is equal to the steady-state threshold and negative voltage value is 0 in the series capacitor, it is judged that the positive voltage value is equal to the steady-state threshold and the negative voltage value is A capacitor with 0 is a failed capacitor in an open circuit state.

Preferably, after the charging of the series capacitors is completed, control the discharge of k series capacitors in the series capacitors, wherein the series capacitors include n capacitors, n≥2, 2≤k≤n; according to the The discharge time, the initial voltage of the discharge and the termination voltage of the discharge of the k series capacitors are used to obtain the capacitance value of the k series capacitors; one of the capacitors to be measured in the k series capacitors is bypassed to obtain k- 1 capacitor in series; controlling the discharge of the k-1 capacitors in series; obtaining the k-1 capacitors in series according to the discharge time, the starting voltage of the discharge and the termination voltage of the discharge of the k-1 capacitors in series the capacitance value of the capacitance; obtain the measured capacitance value of the capacitance to be measured according to the capacitance value of the k series capacitances and the capacitance values of the k-1 series capacitances; the measurement capacitance of the capacitance to be measured The value is compared with the available capacitance value threshold value of the capacitor to be measured, and the available capacitance value threshold value refers to the lowest capacitance value of the capacitor in an available state; if the measured capacitance value of the capacitor to be measured is less than the available capacitance value of the capacitor Threshold value, judging that the capacitor under test is in a capacity aging state.

103. When there is a failed capacitor in the series capacitor, the device for detecting the series capacitor replaces the failed capacitor with a backup capacitor.

In this way, each capacitor in the series capacitor is detected at the same time, and it is judged whether there is a failure capacitor in the series capacitor, and the failure capacitor is a capacitor in a short circuit state, an open circuit state or a capacitance aging state; When there is a failed capacitor in the battery, replace the failed capacitor with a backup capacitor. Compared with the prior art, instead of replacing each capacitor in the series capacitor with a backup capacitor one by one, and then detecting the replaced capacitor, the capacitor in series Each capacitor in the system is detected at the same time. When a failed capacitor is detected, the failed capacitor is replaced with a spare capacitor, which can detect the failed capacitor in time and replace the failed capacitor with a spare capacitor, so that the series capacitor can quickly return to normal working status. Therefore, the capacitance is improved. Reliability when used in series.

It should be noted that both the power supply and the series capacitor can be connected to the electrical equipment to provide electrical energy to the electrical equipment. Generally, the power supply is connected to the electrical equipment to provide electrical energy to the electrical equipment. At this time, the power supply The voltage value is greater than the voltage value of the series capacitor. When the power supply fails, for example, when the voltage value of the power supply is lower than the voltage value of the series capacitor, the series capacitor conducts with the electrical equipment to provide electrical energy to the electrical equipment. , the series capacitor at this time is in the state of charging completion, that is, the charging process is completed. Therefore, it is necessary to detect each of the series capacitors in the series capacitors, and judge whether there is a failure capacitor in a short circuit state, an open circuit state, and a capacity aging state in the series capacitors through the detection results, so as to ensure that the series capacitors can normally charge to all capacitors in series. The electrical equipment mentioned above provides electrical energy.

Specifically, the embodiment of the present invention also provides a series capacitance detection method, as shown in FIG. 2 , including:

In FIG. 2 of the embodiment of the present invention, it is assumed that the series capacitor detection device shown in FIG. 3 is used to detect whether there is a failed capacitor in the series capacitor. In Fig. 3, the series capacitance detecting device includes: a CPLD (Complex Programmable Logic Device, complex programmable logic device), and 6 ADC (Analog to Digital Converter, analog-to-digital converter) pins of the CPLD are ADC5, ADC4 , ADC3, ADC2, ADC1 and ADC0, the ADC5, ADC4, ADC3, ADC2, ADC1 and ADC0 are respectively connected to the positive and negative poles of five capacitors C5, C4, C3, C2 and C1 in the series capacitor, for example, the Among the 6 ADC pins of the CPLD, the third ADC pin ADC3 and the fourth ADC pin ADC4 are respectively connected to the negative pole and the positive pole of the fourth capacitor C4 in the series capacitor, which are used to control the fourth capacitor at the same time The voltage value of the negative pole of C4 and the voltage value of the positive pole are detected.

The five PMOS (Positive channel Metal Oxide Semiconductor, P-channel Metal Oxide Semiconductor) are Q5, Q4, Q3, Q2 and Q1, and the gates G of the Q5, Q4, Q3, Q2 and Q1 are respectively connected to the five CPLD GPIO (General Purpose Input/Output, general purpose input and output) pins GPIO5, GPIO4, GPIO3, GPIO2 and GPIO1 are connected, and the source S of the Q5, Q4, Q3, Q2 and Q1 are respectively connected to five capacitors C5, The positive poles of C4, C3, C2 and C1 are connected, and the drains D of the Q5, Q4, Q3, Q2 and Q1 are respectively connected to the negative poles of five capacitors C5, C4, C3, C2 and C1 in the series capacitors for When there is a failed capacitor in the series capacitor, the CPLD controls the conduction of the PMOS connected to the positive and negative poles of the failed capacitor through the GPIO pin, so as to bypass the failed capacitor.

A backup capacitor C0 is used to replace the failed capacitor when there is a failed capacitor in the series capacitor.

An NMOS (Negative channel Metal Oxide Semiconductor, N-channel Metal Oxide Semiconductor) is Q0, the gate G of the Q0 is connected to the GPIO0 pin of the CPLD, and the source S of the Q0 is connected to the positive electrode of the backup capacitor C0 connected, the drain D of the Q0 is connected to the negative pole of the backup capacitor C0, for when there is a failure capacitor in the series capacitor, the CPLD controls the cut-off of the NMOS Q0 through the GPIO0 pin, so that the backup capacitor can be replaced the failed capacitor.

A DC-DC (direct current to direct current, direct current to direct current power supply), one end of the DC-DC is connected to the seventh GPIO pin GPIO6 of the CPLD, and the other end is connected to five series capacitors, as shown in Figure 3 , the other end of the DC-DC is connected to the anode of the capacitor C5 for charging the series capacitor under the control of the pin GPIO6 of the CPLD.

A BJT (Bipolar Junction Transistor, bipolar junction transistor), the base B of the BJT is connected to the 8th GPIO pin GPIO7 of the CPLD, the emitter E of the BJT is grounded, and the collector C of the BJT is connected to the ground. The series capacitor is connected. In FIG. 3 , the collector C of the BJT is connected to the positive electrode of the capacitor C5 for controlling the discharge of the series capacitor.

It should be noted that there may also be multiple backup capacitors in FIG. 3 , and the number of backup capacitors may be equal to the number of capacitors in the series capacitors. The capacitors in Figure 3 are connected in the order of C0, C1, C2, C3, C4, and C5. The negative pole of C0 is connected to the ground, and the positive pole of C5 is connected to the DC-DC output. This is only an example, and other connections can also be used in practical applications. order. Of course, the numbers of GPIOs, ADCs, capacitors, and PMOSs in this embodiment are only examples, and appropriate numbers can be selected according to actual needs in specific applications.

After the charging of the series capacitor is completed, in FIG. 2 of the embodiment of the present invention, the series capacitor detection device shown in FIG. 3 is used to detect whether there is a failed capacitor in a short circuit state in the series capacitor, and the specific steps are as follows:

201. The CPLD controls the DC-DC to turn on through the GPIO6 pin, so that the series capacitor is charged until the charging is completed.

202. The six ADC pins of the CPLD simultaneously detect the positive and negative voltage values of the five capacitors in series.

Specifically, as shown in Figure 3, after the charging of the series capacitor is completed, the six ADC pins ADC5, ADC4, ADC3, ADC2, ADC1 and ADC0 of the CPLD respectively charge the five capacitors C5, C4, C3 and C2 in the series capacitor. The positive and negative voltage values of C1 and C1 are detected. Among them, the pin ADC5 detects the positive voltage value of the capacitor C5, which is recorded as V5; the pin ADC4 detects the negative electrode of the capacitor C5 and the voltage of the capacitor C4. The voltage value of the positive pole is recorded as V4; the pin ADC3 detects the voltage value of the negative pole of the capacitor C4 and the positive pole of the capacitor C3, and the voltage value is recorded as V3; the pin ADC2 detects the negative pole of the capacitor C3 And the voltage value of the positive pole of the capacitor C2, the voltage value is recorded as V2; the pin ADC1 detects the voltage value of the negative pole of the capacitor C2 and the positive pole of the capacitor C1, and the voltage value is recorded as V1; the pin ADC0 detects is The voltage value of the negative electrode of the capacitor C1 is denoted as V0.

203. If there is a capacitor with equal positive and negative voltage values in the series capacitor, determine that the capacitor with equal positive and negative voltage values is a failed capacitor in a short circuit state.

For example, when the capacitors C5, C4, C3, C2 and C1 are working normally, assuming that the voltage V5 of the positive pole of C5 is 12V, because there will be a voltage equalizing circuit for the capacitor in the series application, so in normal operation , the voltages detected by ADC5 to ADC0, that is, V5 to V0 should be 12V, 9.6V, 7.2V, 4.8V, 2.4V and 0V respectively. If the series capacitor is in operation, the voltages detected by ADC5 to ADC0 are respectively 12V, 9V, 9V, 6V, 3V and 0V, the voltage value V4 detected by ADC4 is equal to the voltage value V3 detected by ADC3, that is, there is a capacitor C4 with equal positive and negative voltage values in the series capacitor, and it is judged that the positive , and the capacitor C4 with the same negative voltage value is a failed capacitor in a short-circuit state.

204. The CPLD controls the conduction of the NMOS Q0 through the GPIO0 pin, and replaces the failed capacitor with the backup capacitor C0.

As an example, assuming that the failed capacitor is C5, the process of replacing the failed capacitor C5 with a backup capacitor C0 is specifically: the CPLD controls the conduction between the source S of the PMOS Q5 and the positive electrode of the failed capacitor C5 through the GPIO5 pin, and controls The drain D of the PMOS Q5 is connected to the negative pole of the failed capacitor C5, the current in the series capacitor passes through the source S of the PMOS Q5 in turn, the gate G and the drain D flow into the series capacitor from the positive pole of the capacitor C4, so that the failed capacitor C5 is bypassed, the CPLD controls the source S of the NMOS Q0 and the positive electrode of the backup capacitor C0 to cut off through the GPIO0 pin, and controls the drain D of the NMOS Q0 to cut off the negative electrode of the backup capacitor C0, and the current in the series capacitor is directly from the backup capacitor The positive electrode of C0 flows in, so that the backup capacitor C0 is connected to the series capacitor, and the failed capacitor C5 is replaced by the backup capacitor C0.

In this way, the series capacitor detection equipment shown in Figure 3 is used to detect whether there is a failed capacitor in a short-circuit state in the series capacitor, and when there is a failed capacitor in a short-circuit state in the series capacitor, replace the capacitor in a short-circuit state with a spare capacitor. The failed capacitors can detect the failed capacitors in the short-circuit state in time and replace the failed capacitors in the short-circuit state with spare capacitors, so that the series capacitors can quickly return to normal working conditions. Therefore, the reliability of capacitors in series applications is improved.

The embodiment of the present invention also provides a series capacitance detection method, as shown in FIG. 4, including:

After the charging of the series capacitor is completed, in FIG. 4 of the embodiment of the present invention, it is still assumed that the series capacitor detection device shown in FIG. 3 is used to detect whether there is a failure capacitor in an open circuit state in the series capacitor.

401. The CPLD controls the DC-DC to turn on through the GPIO6 pin, so that the series capacitor is charged until the charging is completed.

402. The six ADC pins of the CPLD simultaneously detect the positive and negative voltage values of the five capacitors in series.

Specifically, as shown in Figure 3, after the charging of the series capacitor is completed, use the 6 ADC pins ADC5, ADC4, ADC3, ADC2, ADC1 and ADC0 of the CPLD to charge the five capacitors C5, C4, C3, The positive and negative voltage values of C2 and C1 are detected. Among them, the pin ADC5 detects the positive voltage value of the capacitor C5, which is recorded as V5; the pin ADC4 detects the negative electrode of the capacitor C5 and the capacitor C4. The voltage value of the positive pole of the capacitor is recorded as V4; the pin ADC3 detects the voltage value of the negative pole of the capacitor C4 and the positive pole of the capacitor C3, and the voltage value is recorded as V3; the pin ADC2 detects the voltage value of the capacitor C3 The voltage value of the negative pole and the positive pole of the capacitor C2 is recorded as V2; the pin ADC1 detects the voltage value of the negative pole of the capacitor C2 and the positive pole of the capacitor C1, and the voltage value is recorded as V1; the pin ADC0 detects is the voltage value of the negative electrode of the capacitor C1, and this voltage value is denoted as V0.

403. If there is a capacitor whose voltage value fluctuates in the series capacitor, it is judged that the voltage value of the positive electrode fluctuates, and the capacitor whose voltage value of the negative electrode remains unchanged is a failed capacitor in an open circuit state. The voltage value fluctuates means On the basis of the normal voltage value after charging, there is a voltage value change beyond the normal voltage change range.

For example, if the detection circuit shown in Figure 3 is used to detect the series capacitor, when the 6 ADC pins ADC5, ADC4, ADC3, ADC2, ADC1 and ADC0 of the CPLD respectively detect the five capacitors C5, C4, When detecting the positive and negative voltage values of C3, C2 and C1, if the voltage values detected by ADC5, ADC4, ADC3, ADC2, ADC1 and ADC0 are one of the voltage values V5, V4, V3, V2, V1 and V0 If there is fluctuation, it is judged that the voltage value of the positive electrode fluctuates, and the capacitor whose voltage value of the negative electrode remains unchanged is a failed capacitor in an open circuit state.

For example, as shown in Figure 5, when the capacitor C3 is in an open state, the six ADC pins ADC5, ADC4, ADC3, ADC2, ADC1 and ADC0 of the CPLD are respectively connected to the five capacitors C5, C4, C3 and C2 in the series capacitor. and C1 positive and negative voltage value detection result graph, the horizontal axis in the figure is the detection time t, the vertical axis is the detected voltage value V, the voltage values of capacitors C4 and C3 fluctuate during the time period from t1 to t2, and the capacitance The voltage values of C2 and C1 are basically unchanged. It can be judged that the voltage value of the positive electrode fluctuates, and the capacitor C3 whose voltage value of the negative electrode remains unchanged is a failed capacitor in an open circuit state. Since the fluctuation of the voltage value of the capacitor in the series capacitor is generally small, judging whether there is an open-circuit failure capacitor in the series capacitor according to whether the voltage value fluctuates is only a test method in the embodiment, and the result of the judgment may not be enough precise.

In addition, in addition to the methods provided in 401-403, the embodiment of the present invention also provides another method for judging whether there is an open-circuit failure capacitor in the series capacitor, the method is: stop charging the series capacitor, and After the series capacitor is discharged, if there is a capacitor in the series capacitor whose positive voltage value drops beyond the preset range and the negative voltage value remains unchanged within the preset time period, it is judged that the capacitor within the preset time period A capacitor whose positive electrode voltage drops beyond a preset range and whose negative electrode voltage value remains unchanged is a failed capacitor in an open circuit state.

Specifically, after the CPLD controls the DC-DC shutdown through the GPIO6 pin to stop charging the series capacitor, and the CPLD controls the BJT conduction through the GPIO7 pin to discharge the series capacitor, then observe the CPLD within a preset time period. The detection results of the positive and negative voltage values of the five capacitors C5, C4, C3, C2 and C1 in the series capacitors respectively by each ADC pin ADC5, ADC4, ADC3, ADC2, ADC1 and ADC0, if the 5 capacitors in the series capacitor The voltage value of the positive electrode of one of the capacitors C5, C4, C3, C2 and C1 suddenly drops beyond the preset range and the voltage value of the negative electrode remains unchanged, then judge the voltage value of the positive electrode within the preset time period Capacitors that suddenly drop beyond the preset range and whose negative voltage value remains unchanged are open-circuit failed capacitors. For example, assuming that the preset range is between 99% of the normal voltage value and the normal voltage value, and assuming that the normal voltage value of the capacitor C3 is 7V, then when the preset range of the capacitor C3 is changed between 6.93V and 7V, all belong to Within the normal variation range, but within the preset time period, the voltage value of the positive pole of capacitor C3 suddenly changes to 5V and the voltage value of the negative pole remains unchanged. It is judged that the voltage value of the positive pole suddenly drops beyond the preset range and the voltage of the negative pole Capacitor C3 with constant value is a failure capacitor in an open circuit state. As shown in Figure 6, when the capacitor C3 is in an open circuit state, the six ADC pins ADC5, ADC4, ADC3, ADC2, ADC1 and ADC0 of the CPLD are connected to the series capacitors respectively. The results of detection of positive and negative voltage values of the five capacitors C5, C4, C3, C2 and C1, the horizontal axis in the figure is the detection time t, the vertical axis is the detected voltage value V, and the voltage value of capacitor C3 at time t1 7V, stop charging the series capacitor at time t1, and the voltage values of capacitors C4 and C3 have changed during the time period from t2 to t3, among which, the voltage value of capacitor C3 changes to 5V, and the voltage values of capacitors C2 and C1 are basically constant.

404. The CPLD controls the conduction of the NMOS Q0 through the GPIO0 pin, and replaces the failed capacitor with the spare capacitor C0.

As an example, assuming that the failed capacitor is C5, the process of replacing the failed capacitor C5 with a backup capacitor C0 is specifically: the CPLD controls the conduction between the source S of the PMOS Q5 and the positive electrode of the failed capacitor C5 through the GPIO5 pin, and controls The drain D of the PMOS Q5 is connected to the negative pole of the failed capacitor C5, the current in the series capacitor passes through the source S of the PMOS Q5 in turn, the gate G and the drain D flow into the series capacitor from the positive pole of the capacitor C4, so that the failed capacitor C5 is bypassed, the CPLD controls the source S of the NMOS Q0 and the positive electrode of the backup capacitor C0 to cut off through the GPIO0 pin, and controls the drain D of the NMOS Q0 to cut off the negative electrode of the backup capacitor C0, and the current in the series capacitor is directly from the backup capacitor The positive electrode of C0 flows in, so that the backup capacitor C0 is connected to the series capacitor, and the failed capacitor C5 is replaced by the backup capacitor C0.

In this way, the series capacitor detection device shown in Figure 3 is used to detect whether there is a failed capacitor in the open circuit state in the series capacitor, and when there is a failed capacitor in the open circuit state in the series capacitor, replace the open circuit state with a spare capacitor The failure capacitor can detect the failure capacitor in the open circuit state in time and replace the failure capacitor in the open circuit state with the spare capacitor, so that the series capacitor can quickly return to the normal working state, thus improving the reliability of the capacitor series application.

The embodiment of the present invention also provides a series capacitance detection method, as shown in FIG. 7 , including:

After the charging of the series capacitor is completed, in FIG. 7 of the embodiment of the present invention, it is still assumed that the series capacitor detection device shown in FIG. 3 is used to detect whether there is a failed capacitor in a capacity aging state in the series capacitor.

701. The CPLD controls the DC-DC to turn on through the GPIO6 pin, so that the series capacitor is charged until the charging is completed.

702. The CPLD controls the BJT to be turned on through the GPIO7 pin, so as to discharge the five series-connected capacitors in the series-connected capacitors.

Specifically, after the charging of the series capacitor is completed, the CPLD controls the BJT conduction through the GPIO7 pin to discharge the five capacitors C5, C4, C3, C2 and C1 in the series capacitor, and record the discharge time T1, discharge time of the series capacitor The starting voltage Va and the discharge termination voltage Vb.

It should be noted that, during the discharge process of the series capacitor, it is still necessary to ensure that the series capacitor can provide electric energy to the electric equipment, so the termination voltage Vb of the discharge of the series capacitor cannot be lower than the preset first voltage threshold, the first The voltage threshold is the minimum voltage value that ensures that the series capacitor can provide electric energy to the electric equipment.

703. Obtain capacitance values of the five capacitors connected in series according to the discharge time, the discharge start voltage, and the discharge end voltage of the five capacitors connected in series.

Specifically, according to the formula T1=-CRln(Vb/Va), the overall capacitance value C15 of the five series capacitors is calculated, wherein, T1 is the discharge time of the series capacitor; Va is the initial voltage of the discharge of the series capacitor ; Vb is the termination voltage of the discharge of the series capacitor.

704. The CPLD bypasses one of the five capacitors to be measured through the GPIO pin to obtain four capacitors in series.

For example, assuming that the capacitor C5 is the capacitor to be measured, that is, the capacitor C5 in the series capacitors is bypassed to obtain 4 series capacitors. Specifically, the CPLD controls the conduction between the source S of the PMOS Q5 and the positive pole of the failure capacitor C5 through the GPIO5 pin, and controls the conduction between the drain D of the PMOS Q5 and the negative pole of the failure capacitor C5, and the current in the series capacitor passes through The source S, gate G and drain D of PMOS Q5 flow into the series capacitor from the positive pole of capacitor C4, bypassing the failed capacitor C5, and obtaining 4 series capacitors composed of capacitors C4, C3, C2 and C1.

It should be noted that, in order to ensure that the series capacitor has enough power for the discharge test, the CPLD needs to control the GPIO6 pin of the CPLD to turn on the DC-DC during the discharge process to charge the series capacitor so that the voltage of the series capacitor returns to the preset value. The second voltage threshold, the second voltage threshold is the lowest voltage value to ensure that the series capacitor has enough power to perform the discharge test.

705. The CPLD controls the BJT to be turned on through the GPIO7 pin, so as to discharge the four capacitors connected in series.

Specifically, the CPLD controls the conduction of the BJT through the GPIO7 pin to discharge the four capacitors C4, C3, C2 and C1 in the series capacitor, and record the discharge time T2 of the series capacitor, the starting voltage Vc of the discharge and the termination of the discharge Voltage Vd.

It should be noted that, during the discharge process of the four series capacitors, it is still necessary to ensure that the series capacitors can provide electric energy to the electrical equipment, so the termination voltage Vd of the discharge of the series capacitors cannot be lower than the preset first voltage threshold. The first voltage threshold is the lowest voltage value that ensures that the series capacitor can provide electric energy to the electric device.

706. Obtain the capacitance values of the four capacitors connected in series according to the discharge time, the discharge start voltage, and the discharge end voltage of the four capacitors connected in series.

Specifically, according to the formula T2=-CRln(Vd/Vc), the overall capacitance value C14 of the 4 series capacitors is calculated, wherein T2 is the discharge time of the series capacitor; Vc is the initial voltage of the discharge of the series capacitor ; Vd is the termination voltage of the discharge of the series capacitor.

707. Obtain a measured capacitance value of the capacitor to be measured according to the capacitance values of the four capacitors connected in series and the capacitance values of the four capacitors connected in series.

Specifically, according to the formula To calculate the capacitance value of the capacitor C5 to be tested, wherein C15 is the overall capacitance value of the 5 series capacitors in the series capacitor; C14 is the overall capacitance value of the 4 series capacitors in the series capacitor.

708. Compare the measured capacitance value of the capacitor under test with an available capacitance value threshold of the capacitor under test.

Assuming that the capacitor C5 is the capacitor to be tested, and the available capacitance threshold of C5 is 500 kΩ, compare the capacitance value _C5 of the capacitor C5 to be tested with the available capacitance threshold of the capacitor C5.

709. If the measured capacitance value of the capacitor under test is less than the usable capacitance value threshold of the capacitor, determine that the capacitor under test is a failed capacitor in a capacity aging state.

If the capacitance value C5 of the capacitor _C5 to be tested is less than the usable capacitance value threshold of the capacitor C5 by 500 kΩ, it is judged that the capacitor C5 whose capacitance value is less than the usable capacitance value threshold value of the capacitor to be tested is a failure capacitor in a capacity aging state .

710. The CPLD controls the conduction of the NMOS Q0 through the GPIO0 pin, and replaces the failed capacitor with the backup capacitor C0.

As an example, assuming that the failed capacitor is C5, the process of replacing the failed capacitor C5 with a backup capacitor C0 is specifically: the CPLD controls the conduction between the source S of the PMOS Q5 and the positive electrode of the failed capacitor C5 through the GPIO5 pin, and controls The drain D of the PMOS Q5 is connected to the negative pole of the failed capacitor C5, the current in the series capacitor passes through the source S of the PMOS Q5 in turn, the gate G and the drain D flow into the series capacitor from the positive pole of the capacitor C4, so that the failed capacitor C5 is bypassed, the CPLD controls the source S of the NMOS Q0 and the positive electrode of the backup capacitor C0 to cut off through the GPIO0 pin, and controls the drain D of the NMOS Q0 to cut off the negative electrode of the backup capacitor C0, and the current in the series capacitor is directly from the backup capacitor The positive electrode of C0 flows in, so that the backup capacitor C0 is connected to the series capacitor, and the failed capacitor C5 is replaced by the backup capacitor C0.

In this way, the series capacitor detection equipment shown in Figure 3 is used to detect whether there is a failed capacitor in the state of capacitance aging in the series capacitor. The failed capacitors in the capacity aging state can detect the failed capacitors in the capacity aging state in time and replace the failed capacitors in the capacity aging state with spare capacitors, so that the series capacitors can quickly return to the normal working state. Therefore, the capacitance is improved. Reliability when used in series.

It should be noted that the method for detecting the series capacitor provided by the embodiment of the present invention can also detect the series capacitor during the charging process of the series capacitor, and judge whether there is a failed capacitor in a short circuit state in the series capacitor.

The embodiment of the present invention also provides a series capacitance detection method, as shown in FIG. 8 , including:

In the charging process of the series capacitor, in FIG. 8 of the embodiment of the present invention, it is still assumed that the series capacitor detection device shown in FIG. 3 is used to detect whether there is a failed capacitor in a short circuit state in the series capacitor.

801. The CPLD controls the DC-DC to turn on through the GPIO6 pin to charge the series capacitor.

802. The six ADC pins of the CPLD simultaneously detect the positive and negative voltage values of the five capacitors in series.

Specifically, as shown in Figure 3, during the charging process of the series capacitor, the 6 ADC pins ADC5, ADC4, ADC3, ADC2, ADC1 and ADC0 of the CPLD are used to charge the five capacitors C5, C4, C3, The positive and negative voltage values of C2 and C1 are detected. Among them, the pin ADC5 detects the positive voltage value of the capacitor C5, which is recorded as V5; the pin ADC4 detects the negative electrode of the capacitor C5 and the capacitor C4. The voltage value of the positive pole of the capacitor is recorded as V4; the pin ADC3 detects the voltage value of the negative pole of the capacitor C4 and the positive pole of the capacitor C3, and the voltage value is recorded as V3; the pin ADC2 detects the voltage value of the capacitor C3 The voltage value of the negative pole and the positive pole of the capacitor C2 is recorded as V2; the pin ADC1 detects the voltage value of the negative pole of the capacitor C2 and the positive pole of the capacitor C1, and the voltage value is recorded as V1; the pin ADC0 detects is the voltage value of the negative electrode of the capacitor C1, and this voltage value is denoted as V0.

803. If there is a capacitor whose positive and negative voltages are equal to and less than a steady-state threshold in the series capacitor, determine that the capacitor whose positive and negative voltages are equal and less than the steady-state threshold is a failed capacitor in a short-circuit state.

As an example, when the capacitors C5, C4, C3, C2 and C1 are working normally, assume that the voltage V5 of the positive electrode of C5 is 8V at time t0 during the charging process, because there will be a voltage equalizing circuit for the capacitors in series applications. Therefore, at time t0 during the normal charging process, the voltages detected by ADC5 to ADC0, that is, V5 to V0 should be 8V, 6.4V, 4.8V, 3.2V, 1.6V and 0V, assuming the steady state of V4 and V3 The threshold is 9V. If the series capacitor is in operation, the voltages detected by ADC5 to ADC0 are 8V, 6V, 6V, 4V, 2V and 0V respectively, and the voltage value V4 detected by ADC4 is equal to the voltage value V3 detected by ADC3 are both 6V and less than the steady-state threshold of 9V, then there is a capacitor C4 whose positive and negative voltages are equal to and less than the steady-state threshold in the series capacitor, and the capacitors whose positive and negative voltages are equal to and less than the steady-state threshold are judged C4 is a failed capacitor in a short circuit state.

804. The CPLD controls the conduction of the NMOS Q0 through the GPIO0 pin, and replaces the failed capacitor with the backup capacitor C0.

As an example, assuming that the failed capacitor is C5, the process of replacing the failed capacitor C5 with a backup capacitor C0 is specifically: the CPLD controls the conduction between the source S of the PMOS Q5 and the positive electrode of the failed capacitor C5 through the GPIO5 pin, and controls The drain D of the PMOS Q5 is connected to the negative pole of the failed capacitor C5, the current in the series capacitor passes through the source S of the PMOS Q5 in turn, the gate G and the drain D flow into the series capacitor from the positive pole of the capacitor C4, so that the failed capacitor C5 is bypassed, the CPLD controls the source S of the NMOS Q0 and the positive electrode of the backup capacitor C0 to cut off through the GPIO0 pin, and controls the drain D of the NMOS Q0 to cut off the negative electrode of the backup capacitor C0, and the current in the series capacitor is directly from the backup capacitor The positive electrode of C0 flows in, so that the backup capacitor C0 is connected to the series capacitor, and the failed capacitor C5 is replaced by the backup capacitor C0.

In this way, the series capacitor is detected during the charging process of the series capacitor. When there is a failed capacitor in the short-circuit state in the series capacitor, the backup capacitor is used to replace the failed capacitor in the short-circuit state, which can be detected in time. The failed capacitor in the short-circuit state is replaced by the backup capacitor, so that the series capacitor can quickly recover to the normal working state, thus improving the reliability of the capacitor in series application.

The method for detecting the series capacitance provided by the embodiment of the present invention can also detect the series capacitance during the charging process of the series capacitance, and judge whether there is an open-circuit failure capacitance in the series capacitance.

The embodiment of the present invention also provides a series capacitance detection method, as shown in FIG. 9 , including:

In the charging process of the series capacitor, in FIG. 9 of the embodiment of the present invention, it is still assumed that the series capacitor detection device shown in FIG. 3 is used to detect whether there is a failed capacitor in an open circuit state in the series capacitor.

901. The CPLD controls the DC-DC to turn on through the GPIO6 pin to charge the series capacitor.

902. The six ADC pins of the CPLD simultaneously detect the positive and negative voltage values of the five capacitors in series.

Specifically, as shown in Figure 3, during the charging process of the series capacitor, the 6 ADC pins ADC5, ADC4, ADC3, ADC2, ADC1 and ADC0 of the CPLD are used to charge the five capacitors C5, C4, C3, The positive and negative voltage values of C2 and C1 are detected. Among them, the pin ADC5 detects the positive voltage value of the capacitor C5, which is recorded as V5; the pin ADC4 detects the negative electrode of the capacitor C5 and the capacitor C4. The voltage value of the positive pole of the capacitor is recorded as V4; the pin ADC3 detects the voltage value of the negative pole of the capacitor C4 and the positive pole of the capacitor C3, and the voltage value is recorded as V3; the pin ADC2 detects the voltage value of the capacitor C3 The voltage value of the negative pole and the positive pole of the capacitor C2 is recorded as V2; the pin ADC1 detects the voltage value of the negative pole of the capacitor C2 and the positive pole of the capacitor C1, and the voltage value is recorded as V1; the pin ADC0 detects is the voltage value of the negative electrode of the capacitor C1, and this voltage value is denoted as V0.

903. If there is a capacitor whose positive voltage value is equal to the steady-state threshold and negative voltage value is 0 in the series capacitor, determine that the capacitor whose positive voltage value is equal to the steady-state threshold and negative voltage value is 0 is a failed capacitor in an open circuit state .

For example, if the detection circuit shown in Figure 3 is used to detect the series capacitor, when the 6 ADC pins ADC5, ADC4, ADC3, ADC2, ADC1 and ADC0 of the CPLD respectively detect the five capacitors C5, C4, When detecting the positive and negative voltage values of C3, C2, and C1, if ADC5, ADC4, ADC3, ADC2, ADC1, and ADC0 detect that the positive voltage value of one of the five capacitors in the series capacitor is equal to the steady state The threshold value and the voltage value of the negative pole are 0, and it is judged that the capacitor with the voltage value of the positive pole equal to the steady-state threshold and the voltage value of the negative pole is 0 is a failed capacitor in an open circuit state.

It should be noted that when the series capacitor is first charged, the voltage values of the positive and negative poles of each series capacitor in the series capacitor are 0. If there is an open-circuit failure capacitor in the series capacitor during the charging process, then The voltage value of the positive pole of the failed capacitor in the open circuit state and the capacitor connected in series with the positive side will rise to the steady-state threshold at the moment when the failed capacitor in the open circuit state appears, while the negative pole of the failed capacitor in the open circuit state and the capacitor connected in series with the negative side The voltage value is 0.

For example, as shown in Table 1, assuming that the steady-state threshold value of the series capacitor is 11.5V and the initial voltage value is 0V, if the voltage values detected by ADC5, ADC4, ADC3, ADC2, and ADC1 are V5, V4, V3, V2, and V1 are both equal to the steady-state threshold of 11.5V, and the voltage value V0 detected by ADC0 is 0V. It is judged that the positive electrode voltage value V1 of the series capacitor is equal to the steady-state threshold value and the negative electrode voltage value V0 is 0. The capacitor C1 is an open-circuit failure capacitor , that is, when V5=V4=V3=V2=V1=11.5V, V0=0V, the capacitor C1 is a failure capacitor in an open circuit state.

If the voltage values V5, V4, V3 and V2 detected by ADC5, ADC4, ADC3 and ADC2 are equal to the steady-state threshold of 11.5V, the voltage values V1 and V0 detected by ADC1 and ADC0 are equal, and V0=V1=0V, determine the series capacitance The positive pole voltage value V2 is equal to the steady-state threshold value, and the capacitor C2 whose negative pole voltage value V1 is 0 is a failure capacitor in an open circuit state, that is, when V5=V4=V3=V2=11.5V, V1=V0=0V, the capacitor C2 is a failed capacitor in an open circuit state.

If the voltage values V5, V4 and V3 measured by ADC5, ADC4 and ADC3 are equal to the steady-state threshold 11.5V, and the voltage values V2, V1 and V0 detected by ADC2, ADC1 and ADC0 are equal, V0=V1=V2=0V, judge In the series capacitor, the positive voltage value V3 is equal to the steady-state threshold and the negative voltage value V2 is 0. The capacitor C3 is a failure capacitor in an open circuit state, that is, when V5=V4=V3=11.5V, V2=V1=V0=0V, Capacitor C3 is a failure capacitor in an open circuit state.

If the voltage values V5 and V4 measured by ADC5 and ADC4 are equal to the steady state threshold 11.5V, the voltage values V3, V2, V1 and V0 detected by ADC3, ADC2, ADC1 and ADC0 are equal, V3=V2=V1=V0=0V , it is judged that the capacitor C4 whose positive electrode voltage value V4 is equal to the steady-state threshold and the negative electrode voltage value V3 is 0 in the series capacitor is a failure capacitor in an open circuit state, that is, when V5=V4=11.5V, V3=V2=V1=V0=0V When , the capacitor C4 is a failure capacitor in an open circuit state.

If the voltage value V5 detected by ADC5 is equal to the steady state threshold 11.5V, the voltage values V4, V3, V2, V1 and V0 detected by ADC4, ADC3, ADC2, ADC1 and ADC0 are equal, V4=V3=V2=V1=V0= 0V, judging that the positive voltage value V5 of the series capacitor is equal to the steady-state threshold and the negative voltage value V4 is 0. The capacitor C5 is an open-circuit failure capacitor, that is, when V5=11.5V, V4=V3=V2=V1=V0= At 0V, capacitor C5 is a failure capacitor in an open circuit state.

Table 1:

904. The CPLD controls the conduction of the NMOS Q0 through the GPIO0 pin, and replaces the failed capacitor with the backup capacitor C0.

As an example, assuming that the failed capacitor is C5, the process of replacing the failed capacitor C5 with a backup capacitor C0 is specifically: the CPLD controls the conduction between the source S of the PMOS Q5 and the positive electrode of the failed capacitor C5 through the GPIO5 pin, and controls The drain D of the PMOS Q5 is connected to the negative pole of the failed capacitor C5, the current in the series capacitor passes through the source S of the PMOS Q5 in turn, the gate G and the drain D flow into the series capacitor from the positive pole of the capacitor C4, so that the failed capacitor C5 is bypassed, the CPLD controls the source S of the NMOS Q0 and the positive electrode of the backup capacitor C0 to cut off through the GPIO0 pin, and controls the drain D of the NMOS Q0 to cut off the negative electrode of the backup capacitor C0, and the current in the series capacitor is directly from the backup capacitor The positive electrode of C0 flows in, so that the backup capacitor C0 is connected to the series capacitor, and the failed capacitor C5 is replaced by the backup capacitor C0.

In this way, the series capacitor is detected during the charging process of the series capacitor. When there is a failed capacitor in the open circuit state in the series capacitor, the backup capacitor is used to replace the failed capacitor in the open circuit state, so that it can be detected in time. The failure capacitor in the open circuit state is replaced by the backup capacitor, so that the series capacitor can quickly recover to the normal working state, thus improving the reliability of the capacitor in series application.

Example 2:

An embodiment of the present invention provides a series capacitance detection device 100, as shown in FIG. 10 , including:

The detecting unit 1001 is configured to simultaneously detect each capacitor in the series capacitor.

Preferably, the detection unit 1001 is specifically used for:

At the same time, the voltage values of the positive and negative electrodes of each capacitor in the series capacitors are detected.

The judging unit 1002 is configured to judge whether there is a failure capacitor in the series capacitor according to the detection result of the detection unit 1001, and the failure capacitor is a capacitor in a short circuit state, an open circuit state or a capacitance aging state.

Preferably, the judging unit 1002 is specifically configured to:

If there is a capacitor with the same positive and negative voltage values in the series capacitor, it is judged that the capacitor with the same positive and negative voltage values is a failed capacitor in a short circuit state.

Preferably, the judging unit 1002 is specifically configured to:

After the charging of the series capacitor is completed, if there is a capacitor whose voltage value fluctuates in the series capacitor, it is judged that the capacitor whose positive voltage value fluctuates and the negative voltage value remains unchanged is a failed capacitor in an open circuit state, so The fluctuation of the above-mentioned voltage value refers to the change of the voltage value beyond the normal voltage range on the basis of the normal voltage value after charging.

Preferably, the judging unit 1002 is specifically configured to:

After stopping charging the series capacitor and discharging the series capacitor, if the voltage value of the positive electrode in the series capacitor drops beyond the preset range and the voltage value of the negative electrode remains unchanged within the preset time period For a capacitor, it is judged that the capacitor whose positive electrode voltage value drops beyond a preset range and whose negative electrode voltage value remains unchanged within a preset time period is a failed capacitor in an open circuit state.

Preferably, the judging unit 1002 is specifically configured to:

During the charging process of the series capacitor, if there is a capacitor whose positive voltage value is equal to the steady-state threshold and negative voltage value is 0 in the series capacitor, it is judged that the positive voltage value is equal to the steady-state threshold and the negative voltage value is 0. is a failed capacitor in an open circuit state.

Preferably, the judging unit 1002 is specifically configured to:

After the charging of the series capacitors is completed, discharge of k series capacitors in the series capacitors is controlled, wherein the series capacitors include n capacitors, n≥2, 2≤k≤n.

Capacitance values of the k capacitors connected in series are obtained according to the discharge time, the discharge start voltage and the discharge end voltage of the k capacitors connected in series.

One of the k capacitors connected in series is bypassed to obtain k-1 capacitors connected in series.

Controlling the discharge of the k-1 capacitors connected in series.

Capacitance values of the k-1 capacitors connected in series are obtained according to the discharge time, the discharge start voltage and the discharge end voltage of the k-1 capacitors connected in series.

The measured capacitance value of the capacitor to be measured is obtained according to the capacitance values of the k capacitors connected in series and the capacitance values of the k-1 capacitors connected in series.

The measured capacitance value of the capacitor to be measured is compared with an available capacitance value threshold of the capacitor to be measured, and the available capacitance value threshold refers to the lowest capacitance value at which the capacitor is in a usable state.

If the measured capacitance value of the capacitor under test is less than the usable capacitance value threshold of the capacitor, it is determined that the capacitor under test is in a capacity aging state.

The control unit 1003 is configured to replace the failed capacitor with a spare capacitor when the judging unit 1002 judges that there is a failed capacitor in the series capacitor.

As shown in Figure 11, the series capacitance detection device 100 also includes:

A secondary power supply 1004, the secondary power supply is connected to the series capacitor and used to charge the series capacitor.

In this way, the detection unit detects each capacitor in the series capacitor at the same time, and the judging unit judges whether there is a failure capacitor in the series capacitor, and the failure capacitor is a capacitor in a short circuit state, an open circuit state, or an aging state of capacitance; When there is a failed capacitor in the series capacitor, replace the failed capacitor with a backup capacitor. Compared with the prior art, instead of replacing each capacitor in the series capacitor with a backup capacitor one by one, and then detecting the replaced capacitor, It is to detect each capacitor in the series capacitor at the same time. When the failed capacitor is detected, replace the failed capacitor with the spare capacitor, which can detect the failed capacitor in time and replace the failed capacitor with the spare capacitor, so that the series capacitor can quickly return to normal working state, so , which improves the reliability when capacitors are used in series.

Example 3:

An embodiment of the present invention provides a series capacitance detection device, as shown in FIG. 12 , including:

The series capacitance detection device is connected to the series capacitance, and the series capacitance includes n capacitances which are capacitances C1, C2, ..., Cn, n≥2;

The series capacitance detection equipment includes:

At least one complex programmable logic device CPLD1101, the CPLD1101 is used to detect each capacitor in the series capacitor at the same time, and judge whether there is a failed capacitor in the series capacitor, and the failed capacitor is in a short circuit state, an open circuit state or a capacitance value For a capacitor in an aging state, when there is a failed capacitor in the series capacitor, control to replace the failed capacitor with a backup capacitor.

The CPLD1101 is specifically used for:

If there is a capacitor with the same positive and negative voltage values in the series capacitor, it is determined that the capacitor with the same positive and negative voltage values is a failed capacitor in a short circuit state.

The CPLD1101 is specifically used for:

After the charging of the series capacitor is completed, if there is a capacitor whose voltage value fluctuates in the series capacitor, it is judged that the capacitor whose positive voltage value fluctuates and the negative voltage value remains unchanged is a failed capacitor in an open circuit state, so The fluctuation of the above-mentioned voltage value refers to the change of the voltage value beyond the normal voltage range on the basis of the normal voltage value after charging.

Or after stopping charging the series capacitor and discharging the series capacitor, if the voltage value of the positive pole in the series capacitor drops beyond the preset range within a preset time period and the voltage value of the negative pole remains unchanged It is judged that the capacitor whose positive voltage value drops beyond a preset range and negative voltage value remains unchanged within a preset time period is a failed capacitor in an open circuit state.

The CPLD1101 is specifically used for:

During the charging process of the series capacitor, if there is a capacitor whose positive voltage value is equal to the steady-state threshold and negative voltage value is 0 in the series capacitor, it is judged that the positive voltage value is equal to the steady-state threshold and the negative voltage value is 0. is a failed capacitor in an open circuit state.

The CPLD11O1 is specifically used for:

After the charging of the series capacitors is completed, control the discharge of k series capacitors in the series capacitors, wherein the series capacitors include n capacitors, n≥2, 2≤k≤n; according to the k The discharge time of the capacitance in series, the initial voltage of discharge and the termination voltage of discharge obtain the capacitance value of the k series capacitances; bypass one of the k series capacitances to obtain k-1 series capacitances Capacitance; control the discharge of the k-1 capacitors in series; obtain the k-1 capacitors in series according to the discharge time of the k-1 capacitors in series, the starting voltage of the discharge and the termination voltage of the discharge capacitance value; obtain the measured capacitance value of the capacitor to be measured according to the capacitance value of the k series capacitors and the capacitance value of the k-1 series capacitors; combine the measured capacitance value of the capacitor to be measured with the The available capacitance value threshold value of the capacitor to be measured is compared, and the available capacitance value threshold value refers to the lowest capacitance value of the capacitor in an available state; if the measured capacitance value of the capacitor to be measured is less than the available capacitance value threshold value of the capacitor, judge The capacitor under test is in a capacity aging state.

The CPLD1101 includes m analog-to-digital converter ADC pins, and the m ADC pins are ADC0, ADC1, ADC2,..., ADCm-1 and n capacitors C1, C2,..., The positive and negative poles of Cn are connected, wherein the second ADC pin ADC1 and the third ADC pin ADC2 of the m ADC pins of the CPLD1101 are respectively connected to the negative pole of the second capacitor C2 in the series capacitor connected to the positive pole, and used to simultaneously detect the voltage value of the negative pole and the positive pole of the second capacitor C2 in the series capacitor, said 2≤m≤n, said 1≤x≤m.

The detection device also includes: n PMOS1102 are Q1, Q2, ..., Qn, and the gate G of each PMOS is respectively connected to n-1 GPIO pins GPIO1, GPIO2, ..., GPIOn-1 of the CPLD1101, The source S of each PMOS is respectively connected to the anodes of n capacitors C1, C2, ..., Cn in the series capacitors, and the drain D of each PMOS is respectively connected to the n capacitors C1, C2, ..., Cn in the series capacitors. The negative connection of the negative electrode is used to control the PMOS Q1, Q2,..., One or more of Qn are turned on, bypassing the dead capacitor.

NMOS1103, the NMOS1103 is connected to the GPIO0 pin of the CPLD and the backup capacitor C0, and is used to control the cut-off of the NMOS1103 by the CPLD1101 through the GPIO0 pin when there is a failure capacitor in the series capacitor. A backup capacitor C0 replaces the failed capacitor.

The CPLD1101 is also used to control the conduction of the PMOS1102 to bypass the failed capacitor through the GPIO pin when there is a failed capacitor in the series capacitor, and control the cut-off of the NMOS1103 to replace the failed capacitor with the backup capacitor. capacitance.

It should be noted that the NMOS of the series capacitance detection device provided in the embodiment of the present invention is Q0, and the backup capacitor is C0. In an actual application scenario, there may be multiple NMOSs and multiple backup capacitors, so The number of NMOSs may be equal to the number of PMOSs, and the number of backup capacitors may be equal to the number of capacitors in the series capacitors.

The detection device also includes: a DC-to-DC power supply DC-DC1104, one end of the DC-DC1104 is connected to the GPIO pin GPIOn of the CPLD1101, and the other end is connected to the series capacitor for use in the GPIOn tube of the CPLD1101. pin to charge the series capacitor.

The detection device also includes: BJT1105, the base B of the BJT1105 is connected to the GPIO pin GPIOn+1 of the CPLD1101, the emitter E of the BJT1105 is grounded, and the collector C of the BJT1105 is connected to the series capacitor connected to control the discharge of the series capacitor.

In this way, the series capacitance detection device detects each capacitance in the series capacitance at the same time, and judges whether there is a failure capacitor in the series capacitance, and the failure capacitance is a capacitance in a short circuit state, an open circuit state or an aging state of capacitance; When there is a failed capacitor in the series capacitor, replace the failed capacitor with a backup capacitor. Compared with the prior art, instead of replacing each capacitor in the series capacitor with a backup capacitor one by one, and then detecting the replaced capacitor, Instead, each capacitor in the series capacitor is detected at the same time. When a failed capacitor is detected, the failed capacitor is replaced with a spare capacitor, which can detect the failed capacitor in time and replace the failed capacitor with a spare capacitor, so that the series capacitor can quickly return to normal working state. Therefore, reliability when capacitors are used in series is improved.

Those skilled in the art can clearly understand that for the convenience and brevity of the description, the specific working process of the above-described system, device and unit can refer to the corresponding process in the foregoing method embodiment, which will not be repeated here.

In the several embodiments provided in this application, it should be understood that the disclosed system, device and method can be implemented in other ways. For example, the device embodiments described above are only illustrative. For example, the division of the units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or May be integrated into another system, or some features may be ignored, or not implemented. In another point, the mutual coupling or direct coupling or communication connection shown or discussed may be through some interfaces, and the indirect coupling or communication connection of devices or units may be in electrical, mechanical or other forms.

The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place, or may be distributed to multiple network units. Part or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, each unit may be physically included separately, or two or more units may be integrated into one unit. The above-mentioned integrated units can be implemented in the form of hardware, or in the form of hardware plus software functional units.

The above is only a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Anyone skilled in the art can easily think of changes or substitutions within the technical scope disclosed in the present invention. Should be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.

Claims (14)

1. a series capacitance detection method, is characterized in that, comprising:

Each electric capacity in series capacitance is detected simultaneously;

Judge whether there is inefficacy electric capacity in described series capacitance, described inefficacy electric capacity is the electric capacity being in short-circuit condition, open-circuit condition or capacitance ageing state;

When there is inefficacy electric capacity in described series capacitance, control idle capacity replaces described inefficacy electric capacity;

Wherein, describedly detection carried out to each electric capacity in series capacitance simultaneously comprise:

The magnitude of voltage of the positive and negative electrode of each electric capacity in described series capacitance is detected simultaneously;

Describedly judge that whether there is inefficacy electric capacity in described series capacitance comprises:

After described series capacitance charging complete, the electric capacity that magnitude of voltage has fluctuation if exist in described series capacitance, judge that the magnitude of voltage of positive pole has fluctuation, electric capacity that the magnitude of voltage of negative pole is constant is the inefficacy electric capacity being in open-circuit condition, there is the magnitude of voltage change exceeding normal voltage variation range on the basis that described magnitude of voltage has fluctuation to refer to normal voltage value after charging;

Or in stopping, described series capacitance is charged, and to after described series capacitance electric discharge, if there is the magnitude of voltage of positive pole in preset time period in described series capacitance have the decline that exceeds preset range and the constant electric capacity of the magnitude of voltage of negative pole, judge described in preset time period the magnitude of voltage of positive pole have the decline that exceeds preset range and the constant electric capacity of the magnitude of voltage of negative pole is the inefficacy electric capacity being in open-circuit condition.

2. a series capacitance detection method, is characterized in that, comprising:

Each electric capacity in series capacitance is detected simultaneously;

Judge whether there is inefficacy electric capacity in described series capacitance, described inefficacy electric capacity is the electric capacity being in short-circuit condition, open-circuit condition or capacitance ageing state;

When there is inefficacy electric capacity in described series capacitance, control idle capacity replaces described inefficacy electric capacity;

Wherein, describedly detection carried out to each electric capacity in series capacitance simultaneously comprise:

The magnitude of voltage of the positive and negative electrode of each electric capacity in described series capacitance is detected simultaneously;

Describedly judge that whether there is inefficacy electric capacity in described series capacitance comprises:

In described series capacitance charging process, if exist in described series capacitance, cathode voltage value equals stable state threshold value, negative battery voltage is the electric capacity of 0, judges that the electric capacity that described cathode voltage value equals stable state threshold value, negative battery voltage is 0 is the inefficacy electric capacity being in open-circuit condition.

3. a series capacitance detection method, is characterized in that, comprising:

Each electric capacity in series capacitance is detected simultaneously;

Judge whether there is inefficacy electric capacity in described series capacitance, described inefficacy electric capacity is the electric capacity being in short-circuit condition, open-circuit condition or capacitance ageing state;

When there is inefficacy electric capacity in described series capacitance, control idle capacity replaces described inefficacy electric capacity;

Wherein, describedly detection carried out to each electric capacity in series capacitance simultaneously comprise:

The magnitude of voltage of the positive and negative electrode of each electric capacity in described series capacitance is detected simultaneously;

Describedly judge that whether there is inefficacy electric capacity in described series capacitance comprises:

After described series capacitance charging complete, control the capacitor discharge of k series connection in described series capacitance, wherein, described series capacitance comprises n electric capacity, n >=2,2≤k≤n;

The capacitance of the electric capacity that described k is connected is obtained according to the discharge time of electric capacity of described k series connection, the final voltage of the starting potential of electric discharge and electric discharge;

A testing capacitance in the electric capacity of k described in bypass series connection obtains the electric capacity of k-1 series connection;

Control the capacitor discharge of described k-1 series connection;

The capacitance of the electric capacity that described k-1 is connected is obtained according to the discharge time of electric capacity of described k-1 series connection, the final voltage of the starting potential of electric discharge and electric discharge;

The measurement capacitance of described testing capacitance is obtained according to the capacitance of the electric capacity of described k series connection and the capacitance of described k-1 electric capacity of connecting;

The available capacity value threshold value of the measurement capacitance of described testing capacitance and described testing capacitance compared, described available capacity value threshold value refers to that electric capacity is in the minimum capacitance value of upstate;

If the measurement capacitance of described testing capacitance is less than the available capacity value threshold value of described testing capacitance, judge that described testing capacitance is in capacitance ageing state.

4. a series capacitance checkout equipment, is characterized in that, comprising:

Detecting unit, for detecting each electric capacity in series capacitance simultaneously;

Judging unit, for judging whether there is inefficacy electric capacity in described series capacitance according to the testing result of described detecting unit, described inefficacy electric capacity is the electric capacity being in short-circuit condition, open-circuit condition or capacitance ageing state;

Control module, during for judging to there is inefficacy electric capacity in described series capacitance at described judging unit, control idle capacity replaces described inefficacy electric capacity;

Wherein, described detecting unit specifically for:

The magnitude of voltage of the positive and negative electrode of each electric capacity in described series capacitance is detected simultaneously;

Described judging unit specifically for:

After described series capacitance charging complete, the electric capacity that magnitude of voltage has fluctuation if exist in described series capacitance, judge that the magnitude of voltage of positive pole has fluctuation, electric capacity that the magnitude of voltage of negative pole is constant is the inefficacy electric capacity being in open-circuit condition, there is the magnitude of voltage change exceeding normal voltage variation range on the basis that described magnitude of voltage has fluctuation to refer to normal voltage value after charging;

Or, in stopping, described series capacitance is charged, and to after described series capacitance electric discharge, if there is the magnitude of voltage of positive pole in preset time period in described series capacitance have the decline that exceeds preset range and the constant electric capacity of the magnitude of voltage of negative pole, judge described in preset time period the magnitude of voltage of positive pole have the decline that exceeds preset range and the constant electric capacity of the magnitude of voltage of negative pole is the inefficacy electric capacity being in open-circuit condition.

5. a series capacitance checkout equipment, is characterized in that, comprising:

Detecting unit, for detecting each electric capacity in series capacitance simultaneously;

Judging unit, for judging whether there is inefficacy electric capacity in described series capacitance according to the testing result of described detecting unit, described inefficacy electric capacity is the electric capacity being in short-circuit condition, open-circuit condition or capacitance ageing state;

Control module, during for judging to there is inefficacy electric capacity in described series capacitance at described judging unit, control idle capacity replaces described inefficacy electric capacity;

Wherein, described detecting unit specifically for:

The magnitude of voltage of the positive and negative electrode of each electric capacity in described series capacitance is detected simultaneously;

Described judging unit specifically for:

In described series capacitance charging process, if exist in described series capacitance, cathode voltage value equals stable state threshold value, negative battery voltage is the electric capacity of 0, judges that the electric capacity that described cathode voltage value equals stable state threshold value, negative battery voltage is 0 is the inefficacy electric capacity being in open-circuit condition.

6. a series capacitance checkout equipment, is characterized in that, comprising:

Detecting unit, for detecting each electric capacity in series capacitance simultaneously;

Judging unit, for judging whether there is inefficacy electric capacity in described series capacitance according to the testing result of described detecting unit, described inefficacy electric capacity is the electric capacity being in short-circuit condition, open-circuit condition or capacitance ageing state;

Control module, during for judging to there is inefficacy electric capacity in described series capacitance at described judging unit, control idle capacity replaces described inefficacy electric capacity;

Wherein, described detecting unit specifically for:

The magnitude of voltage of the positive and negative electrode of each electric capacity in described series capacitance is detected simultaneously;

Described judging unit specifically for:

After described series capacitance charging complete, control the capacitor discharge of k series connection in described series capacitance, wherein, described series capacitance comprises n electric capacity, n >=2,2≤k≤n;

The capacitance of the electric capacity that described k is connected is obtained according to the discharge time of electric capacity of described k series connection, the final voltage of the starting potential of electric discharge and electric discharge;

A testing capacitance in the electric capacity of k described in bypass series connection obtains the electric capacity of k-1 series connection;

Control the capacitor discharge of described k-1 series connection;

The capacitance of the electric capacity that described k-1 is connected is obtained according to the discharge time of electric capacity of described k-1 series connection, the final voltage of the starting potential of electric discharge and electric discharge;

The measurement capacitance of described testing capacitance is obtained according to the capacitance of the electric capacity of described k series connection and the capacitance of described k-1 electric capacity of connecting;

The available capacity value threshold value of the measurement capacitance of described testing capacitance and described testing capacitance compared, described available capacity value threshold value refers to that electric capacity is in the minimum capacitance value of upstate;

If the measurement capacitance of described testing capacitance is less than the available capacity value threshold value of described testing capacitance, judge that described testing capacitance is in capacitance ageing state.

7., according to the arbitrary described series capacitance checkout equipment of claim 5 to 8, it is characterized in that, described series capacitance checkout equipment also comprises:

Secondary power supply, described secondary power supply is connected with described series capacitance, for charging to described series capacitance.

8. a series capacitance checkout equipment, is characterized in that, described series capacitance checkout equipment is connected with series capacitance, and described series capacitance comprises n electric capacity, n >=2;

Described series capacitance checkout equipment comprises:

At least one complex programmable logic device (CPLD), described CPLD is used for detecting each electric capacity in series capacitance simultaneously, judge whether there is inefficacy electric capacity in described series capacitance, described inefficacy electric capacity is the electric capacity being in short-circuit condition, open-circuit condition or capacitance ageing state, when there is inefficacy electric capacity in described series capacitance, control idle capacity replaces described inefficacy electric capacity;

Wherein, described CPLD comprises m analog-digital converter ADC pin, described m ADC pin is connected with the positive and negative electrode of the electric capacity of the n in described series capacitance respectively, wherein, an xth ADC pin in m the ADC pin of described CPLD and a (x+1)th ADC pin are connected with the negative pole of the electric capacity of the xth in described series capacitance and positive pole respectively, for detecting the magnitude of voltage of negative pole of the electric capacity of the xth in described series capacitance and the magnitude of voltage of positive pole simultaneously, described 2≤m≤n, described 1≤x≤m;

Described CPLD specifically for:

If there is the electric capacity that the magnitude of voltage of positive and negative electrode is equal in described series capacitance, judge that the electric capacity that the magnitude of voltage of described positive and negative electrode is equal is the inefficacy electric capacity being in short-circuit condition;

Described series capacitance checkout equipment also comprises:

N P-channel metal-oxide-semiconductor PMOS, the electric capacity exported in GPIO pin, described series circuit is connected each PMOS with the universal input of described CPLD respectively, during for there is inefficacy electric capacity in described series capacitance, control conducting by described CPLD by GPIO pin, make described inefficacy capacitive bypass;

N NMOS N-channel MOS N NMOS, GPIO pin, the idle capacity of described NMOS and described CPLD are connected, during for there is inefficacy electric capacity in described series capacitance, controlling cut-off by described CPLD by GPIO pin, replacing described inefficacy electric capacity with described idle capacity;

Then, described CPLD, time also for there is inefficacy electric capacity by GPIO pin in described series capacitance, controlling described PMOS conducting and making described inefficacy capacitive bypass, controls described NMOS cut-off and replaces described inefficacy electric capacity with described idle capacity.

9. a series capacitance checkout equipment, is characterized in that, described series capacitance checkout equipment is connected with series capacitance, and described series capacitance comprises n electric capacity, n >=2;

Described series capacitance checkout equipment comprises:

At least one complex programmable logic device (CPLD), described CPLD is used for detecting each electric capacity in series capacitance simultaneously, judge whether there is inefficacy electric capacity in described series capacitance, described inefficacy electric capacity is the electric capacity being in short-circuit condition, open-circuit condition or capacitance ageing state, when there is inefficacy electric capacity in described series capacitance, control idle capacity replaces described inefficacy electric capacity;

Wherein, described CPLD comprises m analog-digital converter ADC pin, described m ADC pin is connected with the positive and negative electrode of the electric capacity of the n in described series capacitance respectively, wherein, an xth ADC pin in m the ADC pin of described CPLD and a (x+1)th ADC pin are connected with the negative pole of the electric capacity of the xth in described series capacitance and positive pole respectively, for detecting the magnitude of voltage of negative pole of the electric capacity of the xth in described series capacitance and the magnitude of voltage of positive pole simultaneously, described 2≤m≤n, described 1≤x≤m;

Described CPLD specifically for:

After described series capacitance charging complete, the electric capacity that magnitude of voltage has fluctuation if exist in described series capacitance, judge that the magnitude of voltage of positive pole has fluctuation, electric capacity that the magnitude of voltage of negative pole is constant is the inefficacy electric capacity being in open-circuit condition, there is the magnitude of voltage change exceeding normal voltage variation range on the basis that described magnitude of voltage has fluctuation to refer to normal voltage value after charging;

Or in stopping, described series capacitance is charged, and to after described series capacitance electric discharge, if there is the magnitude of voltage of positive pole in preset time period in described series capacitance have the decline that exceeds preset range and the constant electric capacity of the magnitude of voltage of negative pole, judge described in preset time period the magnitude of voltage of positive pole have the decline that exceeds preset range and the constant electric capacity of the magnitude of voltage of negative pole is the inefficacy electric capacity being in open-circuit condition.

10. a series capacitance checkout equipment, is characterized in that, described series capacitance checkout equipment is connected with series capacitance, and described series capacitance comprises n electric capacity, n >=2;

Described series capacitance checkout equipment comprises:

At least one complex programmable logic device (CPLD), described CPLD is used for detecting each electric capacity in series capacitance simultaneously, judge whether there is inefficacy electric capacity in described series capacitance, described inefficacy electric capacity is the electric capacity being in short-circuit condition, open-circuit condition or capacitance ageing state, when there is inefficacy electric capacity in described series capacitance, control idle capacity replaces described inefficacy electric capacity;

Wherein, described CPLD comprises m analog-digital converter ADC pin, described m ADC pin is connected with the positive and negative electrode of the electric capacity of the n in described series capacitance respectively, wherein, an xth ADC pin in m the ADC pin of described CPLD and a (x+1)th ADC pin are connected with the negative pole of the electric capacity of the xth in described series capacitance and positive pole respectively, for detecting the magnitude of voltage of negative pole of the electric capacity of the xth in described series capacitance and the magnitude of voltage of positive pole simultaneously, described 2≤m≤n, described 1≤x≤m;

Described CPLD specifically for:

In described series capacitance charging process, if exist in described series capacitance, cathode voltage value equals stable state threshold value, negative battery voltage is the electric capacity of 0, judges that the electric capacity that described cathode voltage value equals stable state threshold value, negative battery voltage is 0 is the inefficacy electric capacity being in open-circuit condition.

11. 1 kinds of series capacitance checkout equipments, is characterized in that, described series capacitance checkout equipment is connected with series capacitance, and described series capacitance comprises n electric capacity, n >=2;

Described series capacitance checkout equipment comprises:

At least one complex programmable logic device (CPLD), described CPLD is used for detecting each electric capacity in series capacitance simultaneously, judge whether there is inefficacy electric capacity in described series capacitance, described inefficacy electric capacity is the electric capacity being in short-circuit condition, open-circuit condition or capacitance ageing state, when there is inefficacy electric capacity in described series capacitance, control idle capacity replaces described inefficacy electric capacity;

Wherein, described CPLD comprises m analog-digital converter ADC pin, described m ADC pin is connected with the positive and negative electrode of the electric capacity of the n in described series capacitance respectively, wherein, an xth ADC pin in m the ADC pin of described CPLD and a (x+1)th ADC pin are connected with the negative pole of the electric capacity of the xth in described series capacitance and positive pole respectively, for detecting the magnitude of voltage of negative pole of the electric capacity of the xth in described series capacitance and the magnitude of voltage of positive pole simultaneously, described 2≤m≤n, described 1≤x≤m;

Described CPLD specifically for:

After described series capacitance charging complete, control the capacitor discharge of k series connection in described series capacitance, wherein, described series capacitance comprises n electric capacity, n >=2,2≤k≤n;

The capacitance of the electric capacity that described k is connected is obtained according to the discharge time of electric capacity of described k series connection, the final voltage of the starting potential of electric discharge and electric discharge;

A testing capacitance in the electric capacity of k described in bypass series connection obtains the electric capacity of k-1 series connection;

Control the capacitor discharge of described k-1 series connection;

The capacitance of the electric capacity that described k-1 is connected is obtained according to the discharge time of electric capacity of described k-1 series connection, the final voltage of the starting potential of electric discharge and electric discharge;

The measurement capacitance of described testing capacitance is obtained according to the capacitance of the electric capacity of described k series connection and the capacitance of described k-1 electric capacity of connecting;

The available capacity value threshold value of the measurement capacitance of described testing capacitance and described testing capacitance compared, described available capacity value threshold value refers to that electric capacity is in the minimum capacitance value of upstate;

If the measurement capacitance of described testing capacitance is less than the available capacity value threshold value of described testing capacitance, judge that described testing capacitance is in capacitance ageing state.

12., according to the arbitrary described series capacitance checkout equipment of claim 9 to 11, is characterized in that, also comprise:

N P-channel metal-oxide-semiconductor PMOS, the electric capacity exported in GPIO pin, described series circuit is connected each PMOS with the universal input of described CPLD respectively, during for there is inefficacy electric capacity in described series capacitance, control conducting by described CPLD by GPIO pin, make described inefficacy capacitive bypass;

N NMOS N-channel MOS N NMOS, GPIO pin, the idle capacity of described NMOS and described CPLD are connected, during for there is inefficacy electric capacity in described series capacitance, controlling cut-off by described CPLD by GPIO pin, replacing described inefficacy electric capacity with described idle capacity;

Then, described CPLD, time also for there is inefficacy electric capacity by GPIO pin in described series capacitance, controlling described PMOS conducting and making described inefficacy capacitive bypass, controls described NMOS cut-off and replaces described inefficacy electric capacity with described idle capacity.

Series capacitance checkout equipment described in 13. according to Claim 8 to 11 are arbitrary, is characterized in that, also comprise:

Direct current is to direct supply DC-DC, and described DC-DC one end is connected with the GPIO pin of described CPLD, and the other end is connected with described series capacitance, for charging to described series capacitance under the control of the GPIO pin of described CPLD.

Series capacitance checkout equipment described in 14. according to Claim 8 to 11 are arbitrary, is characterized in that, also comprise:

The base stage of bipolar junction transistor BJT, described BJT is connected with the pin GPIO of described CPLD, the grounded emitter of described BJT, and the collector of described BJT is connected with described series capacitance, for controlling the electric discharge of described series capacitance.