CN102879749B - Diamond fretsaw direct-current power supply test system - Google Patents
Diamond fretsaw direct-current power supply test system Download PDFInfo
- Publication number
- CN102879749B CN102879749B CN201210354430.4A CN201210354430A CN102879749B CN 102879749 B CN102879749 B CN 102879749B CN 201210354430 A CN201210354430 A CN 201210354430A CN 102879749 B CN102879749 B CN 102879749B
- Authority
- CN
- China
- Prior art keywords
- circuit
- source
- output
- power supply
- connects
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a diamond fretsaw direct-current power supply test system, which comprises a direct-current power supply parameter acquisition system and a processing analysis system, wherein a direct-current power supply required to be tested is inserted into a socket; the socket is connected with an external power supply; a control start-stop circuit is connected between the external power supply and the socket; the signal output terminals of an input loop current acquisition circuit of the direct-current power supply, an output voltage acquisition circuit of the direct-current power supply and an output current acquisition circuit of the direct-current power supply are connected with a signal input terminal of a central processing unit; and a communication terminal of the central processing unit is communicated with the processing analysis system through a communication module. The diamond fretsaw direct-current power supply test system can simultaneously test input loop current, output current, output voltage and internal temperature of the direct-current power supply and judges the stability and power consumption of the direct-current power supply from the parameters, so as to determine the quality of the direct-current power supply and timely replace the direct-current power supply, as a result, the normalization of the direct-current power supply of diamond fretsaw equipment is ensured. The diamond fretsaw direct-current power supply test system has higher stability and reliability, and facilitates the popularization and application.
Description
Technical field
The present invention relates to dc source test macro, particularly relate to a kind of diamond fretsaw dc source test macro.
Background technology
At present, dc source kind is on the market a lot, constant pressure and flow and all possess adjustability, and equipment use producer is difficult to the performance quality differentiating dc source.The performance quality of dc source can judge from several aspect below: the first, stability: whether voltage (electric current) stability that dc source exports meets the technical requirement of production technology; The second, whether the power consumption of dc source is lower, to save electric energy; Whether the temperature rise of the 3rd dc source is too fast, and equipment operating temperature weighs an important indicator of performance quality, and in the temperature too high life-span directly affecting product, temperature is too high is the key factor causing electronic component aged deterioration.And the quality of the dc source that diamond wire saw equipment uses directly has influence on the quality of equipment, therefore ensure that dc source is normally very important thing.
Summary of the invention
The object of this invention is to provide a kind of diamond fretsaw dc source test macro, measure the parameter of dc source, the normal use of guarantee fund's diamond wire saw equipment.
The present invention adopts following technical proposals: a kind of diamond fretsaw dc source test macro, comprise dc source parameter acquisition system and Treatment Analysis system, described dc source parameter acquisition system comprises the control switching on/off circuit for start and stop test macro, for connecting the socket of dc source, the input circuit current collection circuit of dc source, the output voltage Acquisition Circuit of dc source, the output current Acquisition Circuit of dc source, CPU, the dc source of required test inserts socket, socket is connected with external power supply, described control switching on/off circuit connects between external power supply and socket, the input circuit current collection circuit of described dc source, the output voltage Acquisition Circuit of dc source, the signal output part of the output current Acquisition Circuit of dc source is all connected with the signal input part of CPU, the communication terminal of described CPU is by communication module and Treatment Analysis system communication.
Described dc source parameter acquisition system also includes the temperature collection circuit gathering dc source internal temperature, and temperature collection circuit is arranged on dc source inside, and the signal output part of temperature collection circuit is connected with the signal input part of CPU.
The input circuit current collection circuit of described dc source comprises current sampling circuit and accurate full-wave rectifying circuit, described current sampling circuit is connected to the input of dc source, the output of current sampling circuit connects the input of accurate full-wave rectifying circuit, and the output of accurate full-wave rectifying circuit connects CPU by A/D change-over circuit.
Described current sampling circuit and and accurate full-wave rectifying circuit between be connected with isolating transformer.
The output voltage Acquisition Circuit of described dc source comprises voltage sampling circuit and the first in-phase amplification circuit, voltage sampling circuit is connected to the load outputs of dc source, the output of voltage sampling circuit connects the input of the first in-phase amplification circuit, and the output of the first in-phase amplification circuit connects CPU by A/D change-over circuit.
The output current Acquisition Circuit of described dc source comprises current sampling circuit and the second in-phase amplification circuit, current sampling circuit is connected to the load outputs of dc source, the output of current sampling circuit connects the input of the second in-phase amplification circuit, and the output of the second in-phase amplification circuit connects CPU by A/D change-over circuit.
Dc source fictitious load control circuit is connected with between the signal output part of described CPU and voltage sampling circuit.
Described fictitious load control circuit comprises the capacitor charging circuit, triode, the voltage follower that are made up of resistance and electric capacity, the base stage of described triode connects the signal output part of CPU, the grounded emitter of triode, 5V power supply is accessed after the colelctor electrode contact resistance of triode, the colelctor electrode of triode is connected electric capacity with between emitter stage, the colelctor electrode of triode connects the in-phase input end of voltage follower, and inverting input connects voltage sampling circuit after connecting its output.
Described Treatment Analysis system is computer.
Diamond fretsaw dc source test macro of the present invention tests input circuit electric current, output current, the output voltage of dc source simultaneously, and internal temperature, stability, the power consumption of dc source can be learnt from these parameters, thus judge the quality of dc source, timely replacing, the dc source of guarantee fund's diamond wire saw equipment normal.Stability of the present invention, reliability are higher, are applicable to promoting the use of.
Accompanying drawing explanation
Fig. 1 is circuit theory diagrams of the present invention;
Fig. 2 is the program flow diagram of CPU of the present invention.
Detailed description of the invention
A kind of diamond fretsaw dc source of the present invention test macro, comprise dc source parameter acquisition system and Treatment Analysis system, described dc source parameter acquisition system comprises the control switching on/off circuit for start and stop test macro, for connecting the socket of dc source, the input circuit current collection circuit of dc source, the output voltage Acquisition Circuit of dc source, the output current Acquisition Circuit of dc source, gather the temperature collection circuit of dc source internal temperature, CPU, described Treatment Analysis system is computer, the communication terminal of described CPU is by communication module and Treatment Analysis system communication.
As shown in Figure 1, the dc source of required test inserts socket CZ, socket CZ is connected with external power supply AC220V, described control switching on/off circuit connects between external power supply AC220V and socket CZ, control start-stop circuit to be made up of triode Q1, relay J 1, diode D3, CPU U 1 exports conducting or the shutoff that control signal controls triode Q1, thus the normally opened contact of control relay is closed or disconnect, and reaches the object of start and stop input power circuit.Temperature collection circuit adopt U3(18B20), be arranged on dc source inside, U3(18B20) signal output part be connected with the signal input part of CPU U1.
The input circuit current collection circuit of described dc source comprises current sampling circuit and accurate full-wave rectifying circuit, described current sampling circuit is resistance R1, R1 is connected to the input of dc source, and the electric current of input circuit can be calculated by the voltage drop above R1; The output of R1 connects the input of accurate full-wave rectifying circuit by isolating transformer T1, isolating transformer T1 is 1 to 1 type transformer, in order to the voltage isolation on R1 is passed to accurate full-wave rectifying circuit, accurate full-wave rectifying circuit comprises amplifier U2A, U2B(LM358), R2 to R8, R16, diode D1, D2, R16 and electric capacity C6, convert AC signal to stable direct current signal, the output of accurate full-wave rectifying circuit is by A/D change-over circuit U2(TLC2543) connect CPU U1.
The output voltage Acquisition Circuit of described dc source comprises voltage sampling circuit and the first in-phase amplification circuit, voltage sampling circuit comprises power field effect pipe Q3, resistance R23, the load outputs of dc source is connected to after both series connection, wherein the drain electrode of power field effect pipe Q3 connects positive output end, resistance R23 connects negative output terminal, the drain electrode of power field effect pipe Q3 connects the first in-phase amplification circuit U5B(LM358) in-phase input end, inverting input connects output by electric capacity C17, also pass through R18, adjustable resistance RP1 connects output, the output of the first in-phase amplification circuit U5B is by A/D change-over circuit U2(TLC2543) connect CPU U1.
The output current Acquisition Circuit of described dc source comprises current sampling circuit and the second in-phase amplification circuit, current sampling circuit is power field effect pipe Q3, resistance R23, the source electrode of power field effect pipe Q3 connects the in-phase input end of the second in-phase amplification circuit U6B by R24, voltage above resistance R23 is amplified, voltage after amplifying is input to in-phase input end, inverting input connects output by electric capacity C16, also pass through R27, adjustable resistance RP2 connects output, the output of the second in-phase amplification circuit U6B is by A/D change-over circuit U2(TLC2543) connect CPU U1.
Dc source fictitious load control circuit is connected with between the signal output part of described CPU U1 and dc source load outputs, described fictitious load control circuit comprises the capacitor charging circuit be made up of resistance R21 and electric capacity C15, triode Q2, voltage follower U5A, the base stage of described triode Q2 connects the signal output part of CPU U1 by resistance R20, the grounded emitter of triode Q2, 5V power supply is accessed after colelctor electrode contact resistance R20, electric capacity C15 is connected between colelctor electrode with emitter stage, colelctor electrode connects the in-phase input end of voltage follower U5A, connected the grid of power field effect pipe Q3 by resistance R22 after inverting input connects its output.Voltage above electric capacity C15 can be raised to 5 volts in time slowly, when CPU exports high level to triode Q2, and triode Q2 conducting, electric energy above electric capacity C15 is released, when CPU output low level, triode Q2 ends, and electric capacity C15 charges again.Voltage above electric capacity C15 is added in the in-phase input end of U5A, and the output of U5A is added to the gate electrodes of power field effect pipe Q3 by resistance R22.Along with the voltage above electric capacity C15 is different, resistance between the drain electrode of power field effect pipe Q3, source electrode will change, now, the power supply of test has just quite connect one can the load of changes in resistance value, as long as paired pulses sequential is controlled, just can obtain corresponding resistance value, and the load of change.
The present invention carries out work by flow process as shown in Figure 2, is calculated the size of power supply power consumption, and is temporally added up, can also calculate the height of the conversion efficiency of power supply, whether meet power conservation requirement by the size measuring input circuit electric current; CPU can obtain continually varying resistance value by control simulation load control circuit, for the exporting change situation of the DC voltage and current of power supply under testing power supply load situation of change, the change adjustment sensitivity of power supply, stability therefrom can be judged; A period of time under dc source operates in specific pattern, measure power source internal temperature rise situation, the quality of the temperature parameter of power supply can be understood.CPU by the parameter (source current, temperature, load current, load voltage) that collects by communication module U4 and data line transfer to computer, various parameter march line drawing is painted by software by computer, then data analysis in addition, can to forms picture archive, data result is preserved etc.
Claims (5)
1. a diamond fretsaw dc source test macro, it is characterized in that: comprise dc source parameter acquisition system and Treatment Analysis system, described dc source parameter acquisition system comprises the control switching on/off circuit for start and stop test macro, for connecting the socket of dc source, the input circuit current collection circuit of dc source, the output voltage Acquisition Circuit of dc source, the output current Acquisition Circuit of dc source, CPU, the dc source of required test inserts described socket, described socket is also connected with external power supply, described control switching on/off circuit connects between external power supply and socket, the input circuit current collection circuit of described dc source, the output voltage Acquisition Circuit of dc source, the signal output part of the output current Acquisition Circuit of dc source is all connected with the signal input part of CPU, the communication terminal of described CPU is by communication module and Treatment Analysis system communication,
The output voltage Acquisition Circuit of wherein said dc source comprises sample circuit and the first in-phase amplification circuit, described sample circuit comprises power field effect pipe Q3, resistance R23, the load outputs of dc source is connected to after both series connection, wherein the drain electrode of power field effect pipe Q3 connects positive output end, resistance R23 connects negative output terminal, the drain electrode of power field effect pipe Q3 connects the in-phase input end of the first in-phase amplification circuit U5B, the inverting input of the first in-phase amplification circuit U5B connects output by electric capacity C17, the inverting input of the first in-phase amplification circuit U5B also passes through R18, adjustable resistance RP1 connects output, the output of the first in-phase amplification circuit U5B connects CPU by A/D change-over circuit,
The output current Acquisition Circuit of described dc source comprises described sample circuit and the second in-phase amplification circuit, described sample circuit is connected to the load outputs of dc source, described sample circuit is power field effect pipe Q3, resistance R23, the source electrode of power field effect pipe Q3 connects the in-phase input end of the second in-phase amplification circuit U6B by R24, voltage above resistance R23 is amplified, voltage after amplifying is input to in-phase input end, the inverting input of the second in-phase amplification circuit U6B connects output by electric capacity C16, the inverting input of the second in-phase amplification circuit U6B also passes through R27, adjustable resistance RP2 connects output, the output of the second in-phase amplification circuit U6B connects CPU by A/D change-over circuit,
Dc source fictitious load control circuit is connected with between the signal output part of described CPU and described sample circuit,
Described fictitious load control circuit comprises the capacitor charging circuit be made up of resistance R21 and electric capacity C15, triode Q2, voltage follower U5A, the base stage of described triode Q2 connects the signal output part of CPU U1 by resistance R20, the grounded emitter of triode Q2, 5V power supply is accessed after colelctor electrode contact resistance R20, electric capacity C15 is connected between colelctor electrode with emitter stage, colelctor electrode connects the in-phase input end of voltage follower U5A, connected the grid of power field effect pipe Q3 by resistance R22 after the inverting input of voltage follower U5A connects its output, voltage above electric capacity C15 can be raised to 5 volts in time slowly, when CPU exports high level to triode Q2, triode Q2 conducting, electric energy above electric capacity C15 is released, when CPU output low level, triode Q2 ends, electric capacity C15 charges again, voltage above electric capacity C15 is added in the in-phase input end of U5A, the output of U5A is added to the gate electrodes of power field effect pipe Q3 by resistance R22.
2. diamond fretsaw dc source test macro according to claim 1, it is characterized in that: described dc source parameter acquisition system also includes the temperature collection circuit gathering dc source internal temperature, temperature collection circuit is arranged on dc source inside, and the signal output part of temperature collection circuit is connected with the signal input part of CPU.
3. diamond fretsaw dc source test macro according to claim 2, it is characterized in that: the input circuit current collection circuit of described dc source comprises current sampling circuit and accurate full-wave rectifying circuit, described current sampling circuit is connected to the input of dc source, the output of current sampling circuit connects the input of accurate full-wave rectifying circuit, and the output of accurate full-wave rectifying circuit connects CPU by A/D change-over circuit.
4. diamond fretsaw dc source test macro according to claim 3, is characterized in that: described current sampling circuit and and accurate full-wave rectifying circuit between be connected with isolating transformer.
5. diamond fretsaw dc source test macro according to claim 4, is characterized in that: described Treatment Analysis system is computer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210354430.4A CN102879749B (en) | 2012-09-22 | 2012-09-22 | Diamond fretsaw direct-current power supply test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210354430.4A CN102879749B (en) | 2012-09-22 | 2012-09-22 | Diamond fretsaw direct-current power supply test system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102879749A CN102879749A (en) | 2013-01-16 |
| CN102879749B true CN102879749B (en) | 2015-04-29 |
Family
ID=47481145
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210354430.4A Expired - Fee Related CN102879749B (en) | 2012-09-22 | 2012-09-22 | Diamond fretsaw direct-current power supply test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102879749B (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103439996B (en) * | 2013-09-10 | 2016-06-15 | 华晶精密制造股份有限公司 | The special three-in-one band data communication facility temperature controller of diamond fretsaw |
| CN103744031B (en) * | 2013-12-13 | 2017-01-11 | 珠海瑞捷电气股份有限公司 | Power supply detection apparatus |
| CN110208722A (en) * | 2019-07-15 | 2019-09-06 | 珠海格力电器股份有限公司 | Device and method for detecting stability of direct current power supply |
| CN112666485B (en) * | 2020-11-25 | 2022-07-29 | 山东云海国创云计算装备产业创新中心有限公司 | Power stability analysis device and power system |
| CN115201713B (en) * | 2022-07-11 | 2024-08-02 | 国家电网有限公司 | A comprehensive tester for DC power supply characteristics of substation |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5710701A (en) * | 1995-07-31 | 1998-01-20 | Deli Usa, L.P. | Method and apparatus for power supply testing |
| CN201540362U (en) * | 2009-09-04 | 2010-08-04 | 江苏紫金万成自动化控制设备有限公司 | DC power parameter automatic testing device |
| CN101975885A (en) * | 2010-08-24 | 2011-02-16 | 浙江涵普电力科技有限公司 | Comprehensive electric energy detector for direct-current power supplies |
-
2012
- 2012-09-22 CN CN201210354430.4A patent/CN102879749B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5710701A (en) * | 1995-07-31 | 1998-01-20 | Deli Usa, L.P. | Method and apparatus for power supply testing |
| CN201540362U (en) * | 2009-09-04 | 2010-08-04 | 江苏紫金万成自动化控制设备有限公司 | DC power parameter automatic testing device |
| CN101975885A (en) * | 2010-08-24 | 2011-02-16 | 浙江涵普电力科技有限公司 | Comprehensive electric energy detector for direct-current power supplies |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102879749A (en) | 2013-01-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102879749B (en) | Diamond fretsaw direct-current power supply test system | |
| CN102393501B (en) | MOSFET reliability test analysis system and method thereof | |
| CN112540307B (en) | Military power battery charge-discharge performance test system | |
| CN105356528A (en) | Battery management system | |
| CN101551437A (en) | Device for testing solar cell parameter | |
| CN105071453A (en) | Battery management system | |
| CN105676141B (en) | A kind of battery capacity on-line measurement system and its measuring method based on damped oscillation | |
| CN108732524B (en) | Automatic calibration circuit and system for formation and grading test power supply | |
| CN207457464U (en) | A kind of accumulator wireless monitor system based on technology of Internet of things | |
| CN204679622U (en) | Three-phase smart energy meter communication interface load capacity test device with communication module | |
| CN205353342U (en) | Single -phase carrier wave smart electric meter communication module interface load bearing capability tester | |
| CN206805286U (en) | A kind of device of DCS system simulations amount signal acquisition browsing real-time data | |
| CN106533360A (en) | Portable outdoor power test device and test method for photovoltaic assemblies | |
| CN205787054U (en) | Nuclear magnetic resonance, NMR water detector discharge and recharge power supply testing device | |
| CN202119468U (en) | Portable on-line test and fault diagnosis system | |
| CN109322819B (en) | An online energy efficiency test and energy consumption analysis system and method for a pump system | |
| CN209104280U (en) | Distributed Test System for Solid Oxide Fuel Cells | |
| CN214894655U (en) | A measuring device for measuring anti-embolism degree of plant xylem using pneumatic method | |
| CN103412204B (en) | A kind of servicing unit of electrical product plug discharge test | |
| CN202929175U (en) | Cell electric quantity measuring instrument | |
| CN208224003U (en) | A kind of biochemical methane potentiality self-operated measuring unit | |
| CN101782387A (en) | Remote hydrographic water resource data collecting and processing system | |
| CN2916607Y (en) | Portable circuit breaker mechanical characteristic tester | |
| CN2399735Y (en) | Computer controlled insulation monitor | |
| CN104375093A (en) | Storage battery performance tester and implementation method of storage battery performance tester |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee | ||
| CP03 | Change of name, title or address |
Address after: 450000, Zhengzhou economic and Technological Development Zone, Henan, North four road north, Tenth Avenue West (Henan export processing zone) Patentee after: SINO-CRYSTAL PRECISION MANUFACTURING CO.,LTD. Address before: 450000, Zhengzhou Economic Development Zone, Zhengzhou, Henan, four north of the road, tenth west of the street Patentee before: Sino-crystal Precision Manufacturing Co.,Ltd. |
|
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150429 Termination date: 20210922 |