CN102834735A - Crystalline scintillator consisting of rare earth halogenide, with a polished reactive face - Google Patents
Crystalline scintillator consisting of rare earth halogenide, with a polished reactive face Download PDFInfo
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- CN102834735A CN102834735A CN2010800597811A CN201080059781A CN102834735A CN 102834735 A CN102834735 A CN 102834735A CN 2010800597811 A CN2010800597811 A CN 2010800597811A CN 201080059781 A CN201080059781 A CN 201080059781A CN 102834735 A CN102834735 A CN 102834735A
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- 229910052761 rare earth metal Inorganic materials 0.000 title claims abstract description 20
- 150000002910 rare earth metals Chemical class 0.000 title claims abstract description 4
- 238000005498 polishing Methods 0.000 claims abstract description 67
- 239000013078 crystal Substances 0.000 claims abstract description 63
- 239000000463 material Substances 0.000 claims abstract description 45
- 230000005855 radiation Effects 0.000 claims abstract description 40
- 239000002245 particle Substances 0.000 claims description 28
- 238000003776 cleavage reaction Methods 0.000 claims description 16
- -1 rare earth halide Chemical class 0.000 claims description 16
- 230000007017 scission Effects 0.000 claims description 16
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 12
- 230000008878 coupling Effects 0.000 claims description 9
- 238000010168 coupling process Methods 0.000 claims description 9
- 238000005859 coupling reaction Methods 0.000 claims description 9
- 229910052684 Cerium Inorganic materials 0.000 claims description 6
- 229910052777 Praseodymium Inorganic materials 0.000 claims description 6
- 229910052746 lanthanum Inorganic materials 0.000 claims description 5
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 claims description 5
- 238000000034 method Methods 0.000 claims description 5
- 239000000203 mixture Substances 0.000 claims description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 5
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 claims description 3
- 230000005484 gravity Effects 0.000 claims description 3
- XKUYOJZZLGFZTC-UHFFFAOYSA-K lanthanum(iii) bromide Chemical compound Br[La](Br)Br XKUYOJZZLGFZTC-UHFFFAOYSA-K 0.000 claims description 3
- ICAKDTKJOYSXGC-UHFFFAOYSA-K lanthanum(iii) chloride Chemical compound Cl[La](Cl)Cl ICAKDTKJOYSXGC-UHFFFAOYSA-K 0.000 claims description 3
- PUDIUYLPXJFUGB-UHFFFAOYSA-N praseodymium atom Chemical compound [Pr] PUDIUYLPXJFUGB-UHFFFAOYSA-N 0.000 claims description 3
- CPELXLSAUQHCOX-UHFFFAOYSA-M Bromide Chemical compound [Br-] CPELXLSAUQHCOX-UHFFFAOYSA-M 0.000 claims description 2
- 150000001805 chlorine compounds Chemical group 0.000 claims 1
- 230000003993 interaction Effects 0.000 claims 1
- FVAUCKIRQBBSSJ-UHFFFAOYSA-M sodium iodide Chemical compound [Na+].[I-] FVAUCKIRQBBSSJ-UHFFFAOYSA-M 0.000 description 27
- PNEYBMLMFCGWSK-UHFFFAOYSA-N Alumina Chemical compound [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 20
- 235000009518 sodium iodide Nutrition 0.000 description 9
- 238000005259 measurement Methods 0.000 description 5
- 230000003595 spectral effect Effects 0.000 description 5
- 238000001514 detection method Methods 0.000 description 4
- 229910003460 diamond Inorganic materials 0.000 description 4
- 239000010432 diamond Substances 0.000 description 4
- 239000000428 dust Substances 0.000 description 4
- 238000003754 machining Methods 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 238000002600 positron emission tomography Methods 0.000 description 4
- 238000001228 spectrum Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 230000026030 halogenation Effects 0.000 description 3
- 238000005658 halogenation reaction Methods 0.000 description 3
- 238000005422 blasting Methods 0.000 description 2
- 229910001651 emery Inorganic materials 0.000 description 2
- 239000004744 fabric Substances 0.000 description 2
- 125000005843 halogen group Chemical group 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 229910052708 sodium Inorganic materials 0.000 description 2
- 239000011734 sodium Substances 0.000 description 2
- 229910052716 thallium Inorganic materials 0.000 description 2
- BKVIYDNLLOSFOA-UHFFFAOYSA-N thallium Chemical compound [Tl] BKVIYDNLLOSFOA-UHFFFAOYSA-N 0.000 description 2
- CYNYIHKIEHGYOZ-UHFFFAOYSA-N 1-bromopropane Chemical compound CCCBr CYNYIHKIEHGYOZ-UHFFFAOYSA-N 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- 241000675108 Citrus tangerina Species 0.000 description 1
- 229910052693 Europium Inorganic materials 0.000 description 1
- 241000662429 Fenerbahce Species 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- 244000137852 Petrea volubilis Species 0.000 description 1
- 206010067623 Radiation interaction Diseases 0.000 description 1
- 208000037656 Respiratory Sounds Diseases 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- LBDSXVIYZYSRII-IGMARMGPSA-N alpha-particle Chemical compound [4He+2] LBDSXVIYZYSRII-IGMARMGPSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 229910052794 bromium Inorganic materials 0.000 description 1
- 229910052792 caesium Inorganic materials 0.000 description 1
- XQPRBTXUXXVTKB-UHFFFAOYSA-M caesium iodide Chemical compound [I-].[Cs+] XQPRBTXUXXVTKB-UHFFFAOYSA-M 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000007865 diluting Methods 0.000 description 1
- 230000008034 disappearance Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- OGPBJKLSAFTDLK-UHFFFAOYSA-N europium atom Chemical compound [Eu] OGPBJKLSAFTDLK-UHFFFAOYSA-N 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 239000012634 fragment Substances 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 229910052740 iodine Inorganic materials 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 229910052747 lanthanoid Inorganic materials 0.000 description 1
- 150000002602 lanthanoids Chemical class 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- SNMVRZFUUCLYTO-UHFFFAOYSA-N n-propyl chloride Chemical compound CCCCl SNMVRZFUUCLYTO-UHFFFAOYSA-N 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 238000004451 qualitative analysis Methods 0.000 description 1
- 238000004445 quantitative analysis Methods 0.000 description 1
- 238000002601 radiography Methods 0.000 description 1
- 229910052701 rubidium Inorganic materials 0.000 description 1
- 229910052706 scandium Inorganic materials 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
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- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Luminescent Compositions (AREA)
Abstract
The invention relates to a monocrystalline scintillator material comprising at least 50 mass % of rare earth halogenide and a first polished face. Said material is incorporated into an ionising radiation detector comprising a photoreceiver that is optically coupled to the material by a face different from the first polished face. The material provides a good energy resolution and a strong light intensity. The polishing can be carried out irrespective of the crystalline orientation of the crystal. The loss of material as a result of the orientation is therefore eliminated.
Description
The present invention relates to comprise the scintillator field of rare earth halide, be used to detect low energy X ray and gamma-rays and ionizing particle.
Ionising radiation (comprises ionizing particle; Especially for example proton, neutron, electronics, α particle, ion, and X ray or gamma-rays) use single crystal scintillator to detect usually, single crystal scintillator is converted into light with incident radiation; Light is used photoreceiver subsequently, converts electric signal into like photomultiplier.Especially the mix monocrystalline of halogenation lanthanum of cesium iodide or doping praseodymium or cerium of sodium iodide (hereinafter being called NaI (Tl)), sodium contaminated or thallium of thallium of used scintillator.Crystal based on the halogenation lanthanum is the object of recent work always, like those disclosed among US 7067815, US 7067816, US 05/188914, US 06/104880 and the US 07/241284.These crystal are promising aspect light intensity and resolution, but because their hydroscopicity is taken every caution against error them.
X ray, gamma-rays and low energy particle conventionally detect through scintillator crystals, and it is the most widely used to be NaI (Tl).Because the character of the radiation (ray or particle) that will analyze---penetrating material only simplely, several atomic layers are most important before the plane of crystal place.These layers must correctly reproduce and the inconsistent lattice of the work on this surface.In the prior art, the surface that therefore with generation the crystal structure of below is kept perfectly the crystal cleavage.Therefore, cleavage (surface cliv é e) surface is as the responsive surface of detecting.Under the situation of NaI (Tl), can not replace cleavage with another kind of method, because this can cause detecting the very big deterioration (little light that the energy resolution of difference and scintillator send is with respect to adopting the result that cleavage obtained) of quality.
Scintillator of new generation based on rare earth halide has appearred in recent years.They especially are described among US 7067815, US 7233006, US 7067816 and the US 7250609.This type of scintillator is commercially available and has cleaved surface as radiation receiving surface.Rare earth halide emission 300 to 530 nanometer wavelength range.Halogenation lanthanum emission 300 to 400 nanometers of doping Pr or Ce.
Therefore crystal must be chosen to be at the crystal that is orientated on the correct direction so that implement the cleavage operation on the one hand along preferred crystal face cleavage, optimizes the performance relevant with final use on the other hand.The orientation of this necessity has reduced productive rate, because the material of incorrect orientation can't use.The cleavage operation also may be failed (may produce fragment or crackle), and this also can produce waste material.
US 5013921 has instructed the purposes of scintillator material in radiography is used with polished surface, and it needs the energy of about 60keV usually.The surface that is used to detect and directly be placed on scintillator based on the photodiode of amorphous hydrogenated silicon.These photodiodes are obviously responsive more than 550 nano wave lengths.
UA 80507 has instructed the europium alkali doped halogenide single crystal scintillator of polishing.
WO 2009/129534 has instructed a kind of crystal, and therefore its polished surface does not need very fine polishing towards photoelectric detector.In addition, in the document, polished surface is arranged in identical plane with sandblast or uneven surface.
US 2005/0104001 has instructed polishing to be used for the crystal of PET (positron emission tomography) purposes.Do not explain the degree of polishing and the purposes of polished surface.In PET used, incident radiation had the energy of 511keV.Can not infer its low energy character by the character of crystal in PET.
Have been found that now and under situation, can use polishing to replace cleavage, and can not reduce its fundamental property, the amount of the light that sends like energy resolution or scintillator based on the crystal of rare earth halide.In addition, no matter how the crystal orientation of crystal can implement this polishing.Need not again this crystal to be orientated (be about to its location, make the radiation sensitive face of expection conform to cleavage plane).Prevented the spillage of material that this orientation causes.Compare with the conventional cleavage of using impact to separate two crystal faces, can reproduce manyly through the surface smoothness that polishing obtains.
Thus, the present invention at first relates to the rare earth halide that comprises at least 50 weight % and comprises the single crystal scintillator material of the polished surface that is called " first face of polishing ".This polished surface can be unique polished face.But, also can polish at least one other face of this monocrystalline.
The material of polishing of the present invention can obtain good low-energy radiation measurement performance, because the present invention has kept the excellent crystal quality at the little degree of depth place of lower face.Low-energy radiation and crystal interact under this degree of depth just.
The desired properties parameter is that energy resolution (is known as PHR; Be pulse height resolution) and peak/paddy (P/V) ratio, it obtains divided by the source peak value that exists in the low channel (left side at the peak, source) and the least count between the noise peak through the counting that detects under the peak maximum with ionized radiation source; P/V is higher than more, and signal to noise ratio (S/N ratio) is good more.Through the spectral measurement energy resolution PHR of record demonstration as the activity in the source of energy function, this spectrum has been described a peak, and the halfwidth at this peak draws PHR divided by energy (horizontal ordinate of peak maximum); PHR is low more, and spectral resolution is good more.
Can pass through with the Fe under the 5.9keV
55Source measurement PHR and P/V recently estimate the scintillation properties (PHR and P/V) of this monocrystalline.If use the Fe under the 5.9keV
55The excellent in luminous characteristics during source uses the characteristics of luminescence in other source also good (still having different PHR of possibility and P/V value) so.
Those skilled in the art think the Fe under 5.9keV
55Following performance is satisfactory under the situation in source: PHR≤50% and P/V>=35.
Term " low energy X ray " and " low-energy " are interpreted as and are meant and are in 1 to 100keV, are more particularly 1 to 50keV and even be more particularly 1 to 10keV radiation.The invention still further relates to detecting device detected energy of the present invention in the above the purposes of the radiation in the scope of giving.The invention still further relates to and use detecting device of the present invention to detect the method for this type of radiation, settle first of polishing in case with ionising radiation interact (that is, it is the plane of incidence).
No matter how the crystal orientation of this scintillator material all can make the polished surface (" first face of polishing ") of crystal of the present invention.Suitable polishing can obtain through machinery and chemical action.Usually, at first in machining, promptly remove major part from formed surface in the working angles and process thickness.With respect to target size, this crystal has the thickness surplus.After cutting, at first use emery cloth, for example grinding should the surface for 280 granularity emery cloths (opening number per square inch of granularity=in filtering the screen cloth of this abrasive particle).Then polish.The polishing of adopting among the present invention is more complicated than needing the polishing (polished surface turns to photoreceiver) that simple optical when coupling adopt.Especially when polish end, use the abrasive particle and the potpourri of alcohol advantageously to polish.For this reason, possibly grind this crystal through crystal being pressed to slightly buffing machine (for example using the potpourri of pure and mild aluminium oxide).Alcohol advantageously is ethanol.Follow-up polishing step comprises meticulousr polishing operation: rubbing this crystal equably on the whole surface at buffing machine quite subtly with the potpourri of pure and mild diamond dust on the bearing and do not exert pressure.Continue and should operate, up to any projection, cut, even fine cut and the disappearance of especially any " tangerine peel " outward appearance.In final polishing operation, polishing is this time carried out with the diamond dust of decrement, though still in alcohol.In alcohol, fully wash this buffing machine in advance.As if played positive role with the indivisible water in the alcohol (for example at the water that is used for based on the alcohol about 0.1% of the crystal of lanthanum bromide or lanthanum chloride) that is present in, because water dissolves this material very slightly when the latter is hydroscopicity (this is the situation of these crystal).Preferably, alcohol contains the water of 0.01 to 1 weight %.Usually on the bearing of buffing machine, rub this crystal lentamente repeatedly.Advantageously, the abrasive particle (aluminium oxide, diamond dust, silit or the like) that uses during polish end has 4 microns or littler diameter (each abrasive particle can be contained in the spheroid of 4 micron diameters).This particle preferably has 3 microns or littler diameter (each abrasive particle can be contained in the spheroid of 3 micron diameters).Again more preferably, the abrasive particle that uses during polish end is thin at least like 0-2 micron grade particle, this means that this particle has 2 microns or littler diameter (each abrasive particle can be contained in the spheroid of 2 micron diameters).The abrasive particle that uses during polish end is preferably processed by adamas.For example, for last polishing step, the diamond dust of about 20 milligrams of 0-2 micron grade can be used for 10 cm diameter buffing machines.
When polished surface is exposed to from the Fe under the 5.9keV
55During the radiation in source, can control the polishing quality of " first face of polishing " through measured energy resolution PHR and signal to noise ratio (S/N ratio) (as hereinafter is explained with Fig. 2, measure P/V than).Therefore; First face to polishing carries out the meticulous polishing (amount of abrasive particle in the size through reducing abrasive particle gradually, the alcohol; And through improving the duration of polishing gradually), preferably be lower than 55% up to PHR, even be lower than 50%---when this face is exposed to from the Fe under the 5.9keV
55During the radiation in source.It is enough meticulous preferably to be somebody's turn to do polishing, consequently works as this polished surface and is exposed to from the Fe under the 5.9keV
55During the radiation in source, the P/V ratio is 35% or bigger, even 40% or bigger, even 45% or bigger.First of preferred this polishing be meticulous to be polished to is enough to make energy resolution PHR to equal 107% of energy resolution that the monocrystalline to same composition and same external form records at the most; Except that replace first of said polishing with cleavage plane (this can be any cleavage plane and any crystal orientation, because the character of cleavage plane can this PHR of appreciable impact).
0.1 millimeter to 1.5 millimeters material thickness is removed in all these surperficial preparation works (after the machining, up to obtaining final polished surface).
, poor (d é pourvue) carry out whole operation in containing the atmosphere of moisture.After removing the processing thickness of crystal, first preliminary detection low energy ray of polishing or particle.
This crystal is incorporated in the detecting device subsequently.This detecting device comprises this scintillator crystals and photoreceiver.First face of polishing is the plane of incidence of ionising radiation.The face opposite with the plane of incidence is optional to be coupled on the entrance window of light guide or photoreceiver (like photomultiplier or photodiode)---and this face can be described as " coupling surface ".Usually, first face of polishing is parallel to coupling surface.Usually first face of polishing contains the point of the said coupling surface center of gravity of distance crystal farthest.If coupling surface is a disk, the center of gravity of this coupling surface is the center of this disk.Coupling surface is normally put down.
Size to crystal does not have particular restriction.Usually, the latter has 25 cubic millimeters to 1000 cubic centimetres volume.This crystal can be an Any shape, like parallelepipedon, right cylinder, truncated pyramid or truncated cone.The radiation plane of incidence (" first face of polishing ") is polished to improve low energy ionising radiation interactional quality in scintillator.This face is normally smooth.Confirm other surperficial smooth finish of crystal by optical considerations: they also can be (this make it possible to through the total internal reflection direct light) or coarse (to produce scattering effect) of polishing.When they were polished, their preparation needn't be followed such scheme, because their polishing does not require same quality (or fineness).Here, polishing can be an one step, for example uses alcohol/alumina mixture.The abrasive particle that is used at least one face except that first that polishes can be the aluminium oxide of 0-10 micron grade, this means that this aluminium oxide particles has 10 microns or littler diameter (each abrasive particle can be contained in the spheroid of 10 micron diameters).Also possibly use the aluminium oxide of 0-2 micron grade, this means that this aluminium oxide particles has 2 microns or littler diameter (each abrasive particle can be contained in the spheroid of 2 micron diameters).
This crystal can be incorporated in the simple assembly (radiation entrance window, crystal and be used to extract the light guide of passage of scintillation light) into; Or incorporate (crystal of radiation entrance window, polishing and photoreceiver have or do not have electronic equipment) in the more complicated assembly into.
Crystal is a monocrystalline.It makes it contain the rare earth halide of at least 50 weight % based on rare earth halide.
Especially, crystal is formed and is met formula A
nLn
pX
(3p+n), wherein: Ln represents one or more REEs, promptly is selected from Y, Sc and is extended to the element of the lanthanide series of Lu by La; The X representative is selected from one or more halogen atoms of Cl, Br and I; A represents one or more alkaline metal, like Li, Na, K, Rb or Cs; And n and p be make n more than or equal to 0 and be less than or equal to 3 with p more than or equal to 1 numeral.
Especially, rare earth halide can be chloride or bromide.Rare earth can be a lanthanum.Rare earth halide can be the lanthanum bromide or the lanthanum chloride of doping praseodymium or cerium.
The invention particularly relates to P6
3The crystal of the hexagonal crystallographic texture of/m space group, it especially comprises LaCl
3, CeCl
3, NdCl
3, PrCl
3, SmCl
3, EuCl
3, GdCl
3, LaBr
3, CeBr
3, PrBr
3And these halid at least two kinds potpourris (LaCl especially
3And LaBr
3, this potpourri possibly used adulterant, mixes like Ce or Pr), these halogenide possibly used adulterant, mix like Ce or Pr.
Crystal of the present invention serves as the scintillator material that the detection ionising radiation is used.It is for the low-energy radiation detection advantageous particularly that requires high count rate (because the duration of the light pulse of rare earth halide crystal than other scintillator material, shorter like NaI (Tl)) and spectral resolution good (equaling the spectral resolution of NaI (Tl) at least).As the potential application of this crystal, can mention being incorporated into Xray fluorescence spectrometer (being used for the quantitative and qualitative analysis of material) and being used for the detection of physical phenomenon (by the X ray of emissions such as synchrotron) and/or the detecting device of sign.
Fig. 1 has shown based on the scintillator crystals 1 of rare earth halide and the assembly of photomultiplier 2.The end face 3 of crystal is the sensitive area that receives ionising radiation.Meticulous polished surface is first of polishing.Dotted line 4 shows that the crystal cleavage plane is random arrangement, needn't meet the plane of face 3.Face 5 is the faces that are coupled on the photomultiplier 2.This assembly is sealed in the shell that does not show subsequently.
Fig. 2 has shown under the situation (prior art) of the NaI crystal with cleaved surface, Fe under 5.9keV
55The exemplary spectrum in source.(en ordonn é e on a) shows the counting that records through counter to the y axle, and (en abscisse on a) has shown at the passage that uses multichannel analyzer (MCA) analysis back by the voltage of optical receiver transmission the x axle.The level of the light that the passage unit's direct representation on the x axle is sent by scintillator material.The maximal value at this peak has provided the P value of P/V ratio.This paddy has provided the V value of P/V ratio.Here peak-paddy is 73 than P/V, and energy resolution (PHR) is 35%.
Embodiment
With NaI (Tl) and LaCl
3(Ce) crystal machining (latter is sold with trade mark BrilLanCe 350 by Saint-Gobain Crystals and Detectors) becomes diameter to be 30.0 millimeters, highly to be 3.5 millimeters disk, on the face of wanting to polish, comprises 0.25 millimeter thickness surplus.For machining, this crystal has random orientation:
-polish in the above described manner this sensitivity, the radiation plane of incidence (first face of polishing); With
-the face that will be coupled on the photoelectric detector (its for photomultiplier) also polishes, but carries out with so complicated mode with simpler, even be used in the alumina lap of diluting in the alcohol---and this polishing only has optical function.
For relatively, make same crystal, but have the sensitive area that obtains through cleavage.For relatively, also prepared the sample that has blasting treatment or scrape the ionising radiation receiving plane of nuzzle up (nuzzling up) with sand paper.
With epoxy resin the face opposite with the radiation plane of incidence bonded on the photocathode window of photomultiplier.This assembly is presented among Fig. 1.This assembly is sealed in the shell subsequently.
Energy resolution (PHR) and peak-paddy are organized in the table 1 than (P/V) measurement result, for Fe luminous under 5.9keV
55The source.
Table 1
In this table:
-PHR is energy resolution (pulse height resolution).This measurement comprises that record shows that this spectrum has been described a peak as the spectrum of the activity in the source of energy function, and the halfwidth at this peak obtains divided by energy (horizontal ordinate of peak maximum) that PHR---PHR is low more, and spectral resolution is good more.Provide the mean value of 10 samples; With
-P/V representative " peak-paddy than ", to be the counting that detects under the peak maximum through the source obtain divided by the source peak value of existence in the low channel (left side at the peak of 5.9keV) and the least count between the noise peak for it---and P/V is higher than more, and signal to noise ratio (S/N ratio) is good more.Provide the mean value of 10 samples.
Those skilled in the art think that following performance is satisfactory under the situation in the Fe55 source under 5.9keV: PHR≤50% and P/V>=35.
Under the situation of polishing NaI (Tl), the amount of the light of extraction is too little, so that the peak, source can't be discerned on noise, this is that this table is claimed the reason of " immeasurability ".In addition, the crystal of its ionising radiation interaction face blasting treatment or coated abrasive working can not provide available signal.
The performance parameter that adopts identical photomultiplier and record under 22 ℃ temperature with identical detecting devices is listed in this table.
Claims (23)
1. single crystal scintillator material comprises the rare earth halide of at least 50 weight %, it is characterized in that it comprises first, and said first meticulous being polished to is enough to make that first face when said polishing is exposed to from the Fe under the 5.9KeV
55Energy resolution PHR is lower than 55% during the radiation in source.
2. like aforementioned claim material required for protection, it is characterized in that said rare earth halide is chloride or bromide.
3. like one of aforementioned claim material required for protection, it is characterized in that said rare earth is a lanthanum.
4. like one of aforementioned claim material required for protection, it is characterized in that said rare earth halide is the lanthanum bromide or the lanthanum chloride of doping praseodymium or cerium.
5. like one of aforementioned claim material required for protection, it is characterized in that using diameter in the polishing ending is first that 4 centimetres or littler particle polish said polishing.
6. like aforementioned claim material required for protection, it is characterized in that using diameter in the polishing ending is first that 3 centimetres or littler particle polish said polishing.
7. like aforementioned claim material required for protection, it is characterized in that using diameter in the polishing ending is first that 2 centimetres or littler particle polish said polishing.
8. as one of aforementioned claim material required for protection, it is characterized in that polishing first of said polishing with abrasive particle and pure potpourri in the polishing ending.
9. like aforementioned claim material required for protection, it is characterized in that said alcohol contains the water of 0.01 to 1 weight %.
10. like one of aforementioned claim material required for protection, it is characterized in that first meticulous being polished to of said polishing is enough to make that first face when said polishing is exposed to from the Fe under the 5.9KeV
55Energy resolution PHR is lower than 50% during the radiation in source.
11., it is characterized in that first meticulous being polished to of said polishing is enough to make that first face when said polishing is exposed to from the Fe under the 5.9KeV like one of aforementioned claim material required for protection
55Peak-paddy is 35% or higher than P/V during the radiation in source.
12., it is characterized in that first meticulous being polished to of said polishing is enough to make that first face when said polishing is exposed to from the Fe under the 5.9KeV like aforementioned claim material required for protection
55Peak-paddy is 40% or higher than P/V during the radiation in source.
13., it is characterized in that first meticulous being polished to of said polishing is enough to make that first face when said polishing is exposed to from the Fe under the 5.9KeV like aforementioned claim material required for protection
55Peak-paddy is 45% or higher than P/V during the radiation in source.
14. like one of aforementioned claim material required for protection; It is characterized in that except that replace first of said polishing with cleavage plane first of said polishing be meticulous to be polished to is enough to make energy resolution PHR to equal 107% of energy resolution that the monocrystalline to same composition and same external form records at the most.
15. ionising radiation detecting device; Comprise photoreceiver and single crystal scintillator material; Said single crystal scintillator material comprises the rare earth halide of at least 50 weight %, and comprises first of polishing, and said photoreceiver is optional through being different from a face of first of said polishing; Be called coupling surface, be coupled on the said material.
16., it is characterized in that said scintillator material is the scintillator material of one of aforementioned scintillator material claim like aforementioned claim detecting device required for protection.
17., it is characterized in that first face of said polishing contains the point of the said coupling surface center of gravity of distance scintillator material farthest like one of aforementioned two claims detecting device required for protection.
18., be used for detected energy and be 1 to 100keV radiation like the purposes of one of aforesaid detector claim detecting device required for protection.
19. aforementioned claim purposes required for protection, the energy that it is characterized in that said radiation are 1 to 50keV.
20. aforementioned claim purposes required for protection, the energy that it is characterized in that said radiation are 1 to 10keV.
21., be used to detect ionizing particle like the purposes of one of aforesaid detector claim detecting device required for protection.
22. detected energy is the method for 1 to 100keV radiation; It is characterized in that first interaction of the polishing of said radiation and scintillator material; Photoreceiver is optional to be coupled on the said scintillator material through a face of first that is different from said polishing; Said scintillator material is converted into light with the radiation of incident, uses said photoreceiver to convert said light into electric signal.
23. aforementioned claim method required for protection is characterized in that said scintillator material is the scintillator material of one of aforementioned scintillator material claim.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0959620 | 2009-12-28 | ||
| FR0959620A FR2954760B1 (en) | 2009-12-28 | 2009-12-28 | CRYSTALLINE CRYSTALLINE RARE EARTHENESS HALIDE SCINTILLATOR WITH POLISHED SENSITIVE SIDE |
| PCT/FR2010/052875 WO2011080468A2 (en) | 2009-12-28 | 2010-12-22 | Crystalline scintillator consisting of rare earth halogenide, with a polished reactive face |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102834735A true CN102834735A (en) | 2012-12-19 |
| CN102834735B CN102834735B (en) | 2017-09-15 |
Family
ID=42333512
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201080059781.1A Expired - Fee Related CN102834735B (en) | 2009-12-28 | 2010-12-22 | The scintillator of the rare earth halide crystal of sensitive area with polishing |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US9229118B2 (en) |
| EP (1) | EP2519836A2 (en) |
| JP (1) | JP5992832B2 (en) |
| CN (1) | CN102834735B (en) |
| FR (1) | FR2954760B1 (en) |
| WO (1) | WO2011080468A2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108139492A (en) * | 2015-10-09 | 2018-06-08 | 克莱托斯波尔公司 | Shorten the material of the method for the scintillation response of the centre of luminescence and the scintillator with the scintillation response shortened |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10809393B2 (en) * | 2015-04-23 | 2020-10-20 | Fermi Research Alliance, Llc | Monocrystal-based microchannel plate image intensifier |
| US10125312B2 (en) * | 2016-09-06 | 2018-11-13 | Ut-Battelle, Llc | Divalent-ion-doped single crystal alkali halide scintillators |
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| US3837882A (en) * | 1971-09-02 | 1974-09-24 | Kewanee Oil Co | Optical bodies with non-epitaxially grown crystals on surface |
| US20050104001A1 (en) * | 2003-09-24 | 2005-05-19 | Radiation Monitoring Devices, Inc. | Very fast doped LaBr3 scintillators and time-of-flight PET |
| WO2009129534A2 (en) * | 2008-04-18 | 2009-10-22 | Saint-Gobain Ceramics & Plastics, Inc. | Scintillation detector and method of making |
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| JPS6034709B2 (en) * | 1975-11-28 | 1985-08-10 | 株式会社日立メデイコ | Anger-type γ camera |
| EP0360886A1 (en) | 1988-09-26 | 1990-04-04 | Siemens Aktiengesellschaft | X-ray detector |
| JPH0627847B2 (en) * | 1989-12-15 | 1994-04-13 | 浜松ホトニクス株式会社 | Radiation detector |
| JPH0961533A (en) * | 1995-08-25 | 1997-03-07 | Hamamatsu Photonics Kk | Scintillator and scintillation detector |
| EP1566421B1 (en) * | 1998-12-25 | 2014-12-10 | Hitachi Chemical Company, Ltd. | CMP abrasive, liquid additive for CMP abrasive and method for polishing substrate. |
| US6534771B1 (en) | 1999-06-08 | 2003-03-18 | Saint Gobain Industrial Ceramics, Inc. | Gamma camera plate assembly for PET and SPECT imaging |
| NL1014401C2 (en) | 2000-02-17 | 2001-09-04 | Stichting Tech Wetenschapp | Cerium-containing inorganic scintillator material. |
| FR2840926B1 (en) | 2002-06-12 | 2005-03-04 | Saint Gobain Cristaux Detecteu | USE OF A CRUSH WITH CARBON FOR CRYSTAL GROWTH COMPRISING A RARE EARTH HALIDE |
| FR2847594B1 (en) | 2002-11-27 | 2004-12-24 | Saint Gobain Cristaux Detecteu | PREPARATION OF RARE EARTH HALIDE BLOCKS |
| US20040178346A1 (en) | 2003-03-12 | 2004-09-16 | Williams James R. | Oil well logging sensor |
| FR2869115B1 (en) | 2004-04-14 | 2006-05-26 | Saint Gobain Cristaux Detecteu | RARE EARTH-BASED SCINTILLATOR MATERIAL WITH REDUCED NUCLEAR BACKGROUND NOISE |
| US7304309B2 (en) * | 2005-03-14 | 2007-12-04 | Avraham Suhami | Radiation detectors |
| US20080188914A1 (en) | 2007-02-01 | 2008-08-07 | Candela Corporation | Detachable handpiece |
| US7884316B1 (en) * | 2007-03-21 | 2011-02-08 | Saint-Gobain Ceramics & Plastics, Inc. | Scintillator device |
| US20100163735A1 (en) | 2008-12-29 | 2010-07-01 | Saint-Gobain Ceramics & Plastics, Inc. | Rare-earth materials, scintillator crystals, and ruggedized scintillator devices incorporating such crystals |
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2009
- 2009-12-28 FR FR0959620A patent/FR2954760B1/en not_active Expired - Fee Related
-
2010
- 2010-12-22 JP JP2012546487A patent/JP5992832B2/en not_active Expired - Fee Related
- 2010-12-22 EP EP10809028A patent/EP2519836A2/en not_active Ceased
- 2010-12-22 WO PCT/FR2010/052875 patent/WO2011080468A2/en active Application Filing
- 2010-12-22 CN CN201080059781.1A patent/CN102834735B/en not_active Expired - Fee Related
- 2010-12-22 US US13/519,834 patent/US9229118B2/en not_active Expired - Fee Related
-
2015
- 2015-12-03 US US14/958,748 patent/US9880294B2/en not_active Expired - Fee Related
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| US3837882A (en) * | 1971-09-02 | 1974-09-24 | Kewanee Oil Co | Optical bodies with non-epitaxially grown crystals on surface |
| US20050104001A1 (en) * | 2003-09-24 | 2005-05-19 | Radiation Monitoring Devices, Inc. | Very fast doped LaBr3 scintillators and time-of-flight PET |
| WO2009129534A2 (en) * | 2008-04-18 | 2009-10-22 | Saint-Gobain Ceramics & Plastics, Inc. | Scintillation detector and method of making |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108139492A (en) * | 2015-10-09 | 2018-06-08 | 克莱托斯波尔公司 | Shorten the material of the method for the scintillation response of the centre of luminescence and the scintillator with the scintillation response shortened |
| CN108139492B (en) * | 2015-10-09 | 2021-06-04 | 克莱托斯波尔公司 | Method for shortening scintillation response of luminescence center and material of scintillator with shortened scintillation response |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102834735B (en) | 2017-09-15 |
| WO2011080468A3 (en) | 2011-08-25 |
| US9880294B2 (en) | 2018-01-30 |
| JP5992832B2 (en) | 2016-09-14 |
| US20160084965A1 (en) | 2016-03-24 |
| EP2519836A2 (en) | 2012-11-07 |
| FR2954760A1 (en) | 2011-07-01 |
| US9229118B2 (en) | 2016-01-05 |
| JP2013515829A (en) | 2013-05-09 |
| FR2954760B1 (en) | 2013-12-27 |
| US20120286165A1 (en) | 2012-11-15 |
| WO2011080468A2 (en) | 2011-07-07 |
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