CN102809610A - Phased array ultrasonic testing method based on improved dynamic depth focusing - Google Patents
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Abstract
本发明属于无损检测技术领域,具体为一种基于改进的动态深度聚焦的相控阵超声检测方法,该方法包括相控阵超声发射和接收步骤、缺陷判别步骤、延迟时间计算步骤、回波信号后处理步骤以及B型图重构步骤共五个步骤。本发明将超声回波信号准确聚焦到缺陷位置,可以解决当缺陷反射回波信号的信噪比过低时所造成的缺陷识别困难的问题;本发明可以有效解决由于被检工件的材料不均匀导致理想焦点与实际焦点存在偏差的问题,对于分层介质和各向异性介质的相控阵超声检测,可以有效提高检测分辨率;本发明还可以减少相控阵探伤仪等硬件系统误差所引起的超声成像结果模糊、畸变问题,提高相控阵超声成像质量。
The invention belongs to the technical field of nondestructive testing, and specifically relates to a phased array ultrasonic testing method based on improved dynamic depth focusing. There are five steps in the post-processing step and the B-type map reconstruction step. The invention accurately focuses the ultrasonic echo signal to the defect position, which can solve the problem of difficult defect identification caused when the signal-to-noise ratio of the defect reflection echo signal is too low; The problem of deviation between the ideal focus and the actual focus, for the phased array ultrasonic detection of layered media and anisotropic media, can effectively improve the detection resolution; the invention can also reduce hardware system errors caused by phased array flaw detectors, etc. The ultrasonic imaging results are blurred and distorted, and the quality of phased array ultrasonic imaging is improved.
Description
技术领域 technical field
本发明属于无损检测技术领域,具体涉及一种基于改进的动态深度聚焦的相控阵超声检测方法。The invention belongs to the technical field of nondestructive testing, and in particular relates to a phased array ultrasonic testing method based on improved dynamic depth focusing.
背景技术 Background technique
无损检测(nondestructive testing)简称NDT,是以不损害被检验对象的适应性能为前提,应用多种物理原理和化学现象,对各种工程材料、零部件、结构件进行有效的检验和测试,借以评价他们的连续性、完整性、安全可靠性及某些物理性能。常规的五大无损检测方法主要有射线检测、超声检测、渗透检测、磁粉检测、涡流检测。Non-destructive testing (nondestructive testing), referred to as NDT, is based on the premise of not damaging the adaptability of the object to be tested, and uses a variety of physical principles and chemical phenomena to carry out effective inspection and testing of various engineering materials, parts, and structural parts. Evaluate their continuity, integrity, safety reliability and certain physical properties. The five conventional non-destructive testing methods mainly include radiographic testing, ultrasonic testing, penetrant testing, magnetic particle testing, and eddy current testing.
超声检测(UT)是利用探头激励超声波经过耦合剂耦合后传进待检工件中,当超声波遇到缺陷时会产生反射、折射等现象,通过分析反射波或透射波的能量幅值、声速、信号频率的变化等方式来进行检测。Ultrasonic testing (UT) is to use the probe to stimulate the ultrasonic wave to be transmitted into the workpiece to be inspected after being coupled by the coupling agent. When the ultrasonic wave encounters a defect, reflection and refraction will occur. By analyzing the energy amplitude, sound velocity, and The change of signal frequency and other methods are used to detect.
相控阵超声检测技术是通过电子方式控制换能器阵列中各阵元,按照一定的延迟时间,规则地发射和接收超声波,从而控制超声波束在被检工件中偏转和聚焦,来实现对材料的无损检测,其包括相控阵超声发射和接收两部分。相控阵超声发射的工作原理基于惠更斯-菲涅尔原理,当各阵元被同频率的脉冲激励时,所发射的超声波将发生干涉形成合成波阵面,从而在空间中形成稳定的超声场;如果改变各阵元的激励脉冲时间,使它们按照一定的延迟时间发射,则根据惠更斯原理,所发射的超声波会在空间叠加合成新的波阵面,从而实现声束偏转或聚焦等特性。根据互易原理,相控阵接收时也是用延迟的方法来达到的,按照回波到达各阵元的时间差对各阵元接收信息进行延时补偿,然后叠加起来,从而获得某目标方向上的反射回波;同时,通过各阵元的相位、幅值控制以及声束形成等方法,可形成动态聚焦、变孔径、变迹等多种相控效果。Phased array ultrasonic testing technology is to electronically control each array element in the transducer array, and regularly transmit and receive ultrasonic waves according to a certain delay time, so as to control the deflection and focus of the ultrasonic beam in the workpiece to be inspected, so as to realize the inspection of materials. Non-destructive testing, which includes phased array ultrasonic transmitting and receiving two parts. The working principle of phased array ultrasonic transmission is based on the Huygens-Fresnel principle. When each array element is excited by the pulse of the same frequency, the transmitted ultrasonic waves will interfere to form a synthetic wave front, thereby forming a stable wave front in space. Ultrasonic field; if the excitation pulse time of each array element is changed so that they are emitted according to a certain delay time, then according to the Huygens principle, the emitted ultrasonic waves will be superimposed in space to synthesize a new wave front, thereby realizing sound beam deflection or features such as focus. According to the principle of reciprocity, the reception of phased array is also achieved by delay method. According to the time difference when the echo arrives at each array element, the delay compensation is performed on the received information of each array element, and then superimposed to obtain the target direction. Reflection echo; at the same time, through the phase and amplitude control of each array element and sound beam forming and other methods, various phase control effects such as dynamic focusing, variable aperture, and apodization can be formed.
在相控阵超声检测时,由于被检测材料的实际声速与假定声速存在偏差,或被检测材料存在粗晶、各向异性、非均匀等情况导致超声信号传播时声束的非均匀性,都会引起超声信号传播过程中相控阵超声合成信号的畸变,从而导致缺陷检测时声束聚焦和声束合成的困难,严重影响了相控阵超声成像的空间分辨率和对比度。During phased array ultrasonic testing, due to the deviation between the actual sound velocity of the tested material and the assumed sound velocity, or the presence of coarse grains, anisotropy, and non-uniformity in the tested material, the non-uniformity of the sound beam when the ultrasonic signal propagates will cause It causes the distortion of the phased array ultrasonic synthesis signal in the process of ultrasonic signal propagation, which leads to the difficulty of beam focusing and beam synthesis during defect detection, and seriously affects the spatial resolution and contrast of phased array ultrasonic imaging.
发明内容Contents of the invention
针对现有技术中存在的问题,本发明提出一种基于改进的动态深度聚焦的相控阵超声检测方法,采用相控阵直探头中各阵元接收的超声回波信号作为反馈信号,通过提取信号中的缺陷信息获得缺陷回波到达距离缺陷最近的几个相邻阵元的时间差值,然后根据这几个阵元的时间差值,无需再次激励超声波,只需对这几个阵元的接收信号进行延迟处理,便使这几个阵元所接收的回波信号聚焦在缺陷位置。根据实际接收的回波信号来调整阵元的接收延迟时间,实现声束在缺陷位置的准确聚焦,可以有效提高缺陷的检测分辨率。Aiming at the problems existing in the prior art, the present invention proposes a phased array ultrasonic detection method based on improved dynamic depth focusing, using the ultrasonic echo signal received by each array element in the phased array straight probe as the feedback signal, and extracting The defect information in the signal obtains the time difference of the defect echo arriving at several adjacent array elements closest to the defect, and then according to the time difference of these array elements, there is no need to re-energize the ultrasonic wave, only need to Delay processing is performed on the received signals, so that the echo signals received by these array elements are focused on the defect position. The receiving delay time of the array element is adjusted according to the actually received echo signal to realize accurate focusing of the sound beam at the defect position, which can effectively improve the detection resolution of the defect.
本发明提出一种基于改进的动态深度聚焦的相控阵超声检测方法,其中,该检测方法需要的检测装置包括相控阵超声探伤仪和相控阵直探头,其中相控阵超声探伤仪与相控阵直探头电连接,相控阵直探头是具有多个阵元晶片的一维线性探头。检测方法具体包括以下几个步骤:The present invention proposes a phased array ultrasonic detection method based on improved dynamic depth focusing, wherein the detection device required by the detection method includes a phased array ultrasonic flaw detector and a phased array straight probe, wherein the phased array ultrasonic flaw detector and The phased array straight probe is electrically connected, and the phased array straight probe is a one-dimensional linear probe with multiple array elements. The detection method specifically includes the following steps:
步骤一、相控阵超声发射和接收步骤。首先,设置相控阵探伤仪,进行相控阵线形电子扫描,设置一次发射/接收超声波所选取的阵元个数(该值一般为相控阵直探头阵元个数的1/4)和线形电子扫描的步进值(该值取1个阵元),同时设置相控阵直探头发射超声波聚焦位置为被检测工件下表面(该值由被检测工件的厚度所决定),相控阵直探头接收超声回波信号方式为动态深度聚焦(DDF)方式,动态深度聚焦方式的设置包括起始聚焦深度、终止聚焦深度和聚焦深度步进三个参数,起始聚焦深度和终止聚焦深度由被检测工件的厚度所决定,聚焦深度步进由要求的检测精度决定,该方式可以使来自不同聚焦深度位置的超声回波信号处于聚焦状态。通过上述设置,相控阵探伤仪将相控阵直探头中相邻的多个阵元成为一个发射阵列孔径,对每个阵列孔径中的所有阵元进行控制,阵列孔径中的各个阵元按照相控阵探伤仪计算好的延迟时间值发射超声波,同时,该阵列孔径中的各个阵元均接收超声回波信号,这些超声回波信号中包含有被检测工件上下表面的反射回波以及缺陷的反射回波,按照相控阵探伤仪计算好的动态深度聚焦时的各聚焦深度位置的延迟时间值,将该阵列孔径中各个阵元所接收的超声回波信号做动态深度聚焦处理合并为一束超声信号,定义为该阵列孔径的超声合成信号。依次控制各个阵列孔径发射和接收超声波,即可获得各个阵列孔径的超声合成信号。
步骤二、缺陷判别步骤。对步骤一中各阵列孔径获得的超声合成信号中的数据用亮度(或颜色)来表征,得到被检测工件的一个二维截面图,即为B型显示,由于B型显示图中包含有被检测工件上下表面的反射回波的信息,因此从B型图中可确定出缺陷的二维位置信息;
步骤三、延迟时间计算步骤。根据步骤二中初步判别的缺陷位置信息,选定距离该缺陷位置最近的一个阵列孔径,根据该阵列孔径中的各个阵元在步骤一中所接收的超声回波信号,在该缺陷位置处加矩形时间窗或数字信号处理中任意用于提取给定区间内信息的窗函数,提取该缺陷位置的回波信息。然后,根据该阵列孔径中各个阵元接收相同缺陷反射的超声回波信号具有相关性的原理,利用互相关法,计算超声波从该缺陷位置到达该阵列孔径中各个阵元的时间差值;
互相关法的具体操作包括以下几个步骤:The specific operation of the cross-correlation method includes the following steps:
(1)选取距离该缺陷位置最近的一个阵列孔径,以该阵列孔径中距离该缺陷最近的一个阵元在步骤一中所接收的超声回波信号的数据作为参考信号x(n)(n=0,1,2…N-1),取该阵列孔径中的其它任一阵元在步骤一中所接收的超声回波信号的数据作为被测信号y(n)(n=0,1,2…N-1),n表示序列中的位置,N为步骤一中各阵元接收超声回波信号的采集点数,对于厚度为h,纵波声速为c的被检测工件,当相控阵超声探伤仪的采样频率为M时,N=(2h/c)*M;(1) Select an array aperture closest to the defect position, and use the data of the ultrasonic echo signal received by the array element closest to the defect in
(2)设置循环相关运算的循环周期长度为L,L≥2N-1,将参考信号x(n)(n=0,1,2…N-1)和被测信号y(n)(n=0,1,2…N-1)分别补零至长度为L;对补零后的参考信号x(n)(n=0,1,2…L-1)和补零后的被测信号y(n)(n=0,1,2…L-1)进行快速傅里叶变换(FFT)得到X(k)(k=0,1,2…L-1)和Y(k)(k=0,1,2…L-1),其中X(k)表示补零后的参考信号x(n)从时域信号做快速傅里叶变换(FFT)后变为频域信号的序列,Y(k)表示补零后的被测信号y(n)从时域信号做快速傅里叶变换(FFT)后变为频域信号的序列,k表示傅里叶变换后X(k)和Y(k)序列中的位置;(2) Set the cycle length of the cyclic correlation operation to L, L≥2N-1, the reference signal x(n)(n=0,1,2...N-1) and the measured signal y(n)(n =0,1,2…N-1) respectively padding to length L; for the reference signal x(n)(n=0,1,2…L-1) after zero padding and the measured signal x(n) after zero padding Signal y(n)(n=0,1,2...L-1) undergoes fast Fourier transform (FFT) to obtain X(k)(k=0,1,2...L-1) and Y(k) (k=0,1,2...L-1), where X(k) represents the zero-filled reference signal x(n) from the time-domain signal to the frequency-domain signal after Fast Fourier Transform (FFT) Sequence, Y(k) represents the sequence of the measured signal y(n) after the zero padding is changed from the time domain signal to the frequency domain signal after the fast Fourier transform (FFT), k represents the X(k ) and the position in the Y(k) sequence;
(3)对X(k)做共轭运算,将共轭运算结果与Y(k)作复数相乘,复数相乘后的结果为互相关函数R(k),再对R(k)作快速傅里叶反变换(IFFT),提取其实部R(τ),则R(k)取最大值时所对应的实部R(τ)中的τ就是所要求的参考信号和被测信号的时间差值。(3) Perform conjugate operation on X(k), multiply the result of the conjugate operation with Y(k) by complex numbers, the result of multiplication by complex numbers is the cross-correlation function R(k), and then perform R(k) Inverse Fast Fourier Transform (IFFT) extracts the real part R(τ), then the τ in the real part R(τ) corresponding to the maximum value of R(k) is the required reference signal and the measured signal time difference.
(4)分别依次将该阵列孔径中的其它阵元在步骤一中所接收超声回波信号的数据作为被测信号进行(1)~(3)的计算,求得该阵列孔径中各个阵元相对于参考信号的时间差值,这些时间差值即为所选定阵列孔径中各个阵元接收缺陷反射回波信号的延迟时间。(4) The data of the ultrasonic echo signals received by other array elements in the array aperture in
步骤四、回波信号后处理步骤。取步骤一设置动态深度聚焦时的各聚焦深度位置中距离缺陷最近的一个聚焦深度位置的延迟时间值,用步骤三中获得的所选定的阵列孔径中各个阵元的延迟时间值代替,保持其它聚焦深度位置的延迟时间值不变,则使所选定的阵列孔径中各阵元所接收的超声回波信号聚焦到缺陷位置。按照上述处理后的延迟时间值对所选定的阵列孔径中各阵元接收的超声回波信号进行重新合成处理,形成该阵列孔径新的超声合成信号;
步骤五、B型图重构步骤。将步骤四中所选定的阵列孔径所形成的新的超声合成信号替代步骤一中该阵列孔径获得的超声合成信号,并重新绘制B型图用于缺陷识别。Step five, the reconstruction step of the B-type graph. Replace the ultrasonic composite signal obtained by the array aperture in
本发明提出的相控阵超声检测方法不但应用于仅存在一个缺陷的被检测工件的检测,还应用于存在两个以上缺陷的被检测工件的检测。The phased array ultrasonic detection method proposed by the present invention is not only applied to the detection of the detected workpiece with only one defect, but also applicable to the detection of the detected workpiece with more than two defects.
本发明的优点在于:The advantages of the present invention are:
(1)本发明提出一种基于改进的动态深度聚焦的相控阵超声检测方法,将超声回波信号准确聚焦到缺陷位置,可以解决当缺陷反射回波信号的信噪比过低时所造成的缺陷识别困难的问题;(1) The present invention proposes a phased array ultrasonic detection method based on improved dynamic depth focusing, which can accurately focus the ultrasonic echo signal to the defect position, and can solve the problem caused by the low signal-to-noise ratio of the defect reflected echo signal. The problem of difficult defect identification;
(2)本发明提出一种基于改进的动态深度聚焦的相控阵超声检测方法,可以有效解决由于被检工件的材料不均匀导致理想焦点与实际焦点存在偏差的问题,对于分层介质和各向异性介质的相控阵超声检测,可以有效提高检测分辨率;(2) The present invention proposes a phased array ultrasonic detection method based on improved dynamic depth focusing, which can effectively solve the problem of deviation between the ideal focus and the actual focus due to the uneven material of the workpiece to be inspected. For layered media and various Phased array ultrasonic testing of anisotropic media can effectively improve the detection resolution;
(3)本发明提出一种基于改进的动态深度聚焦的相控阵超声检测方法,可以减少相控阵探伤仪等硬件系统误差所引起的超声成像结果模糊、畸变等问题,提高相控阵超声成像质量。(3) The present invention proposes a phased array ultrasonic detection method based on improved dynamic depth focusing, which can reduce the blurring and distortion of ultrasonic imaging results caused by hardware system errors such as phased array flaw detectors, and improve the quality of phased array ultrasonic detection. image quality.
附图说明 Description of drawings
图1示出了相控阵线形扫描方式;Fig. 1 shows the phased array linear scanning mode;
图2示出了相控阵动态深度聚焦方式;Fig. 2 shows the phased array dynamic depth focusing mode;
图3示出了相控阵动态深度聚焦时超声回波信号的合成方式;Fig. 3 shows the synthesis method of the ultrasonic echo signal during the phased array dynamic depth focusing;
图4示出了距离缺陷最近的阵列孔径的确定方法;Fig. 4 shows the determination method of the array aperture closest to the defect;
图5示出了针对缺陷位置进行聚焦位置调整的示意图。Fig. 5 shows a schematic diagram of adjusting a focus position for a defect position.
具体实施方式 Detailed ways
下面将结合附图和实施例对本发明作进一步的详细说明。The present invention will be further described in detail with reference to the accompanying drawings and embodiments.
本发明采用相控阵直探头检测被检测工件,通过对相邻几个阵元接收的超声回波信号进行处理获得缺陷回波到达这几个阵元的时间差值,然后对这几个阵元接收信号进行延迟处理使接收回波信号聚焦在缺陷位置,该检测方法有效的修正了被检材料声速不均匀、实际声速与假定声速存在偏差等问题,提高了聚焦点的精度。The invention uses a phased array straight probe to detect the workpiece to be detected, and obtains the time difference of the defect echo arriving at these several array elements by processing the ultrasonic echo signals received by several adjacent array elements, and then Delay processing is performed on the received signal to focus the received echo signal on the defect position. This detection method effectively corrects the problems of uneven sound velocity of the tested material, deviation between the actual sound velocity and the assumed sound velocity, and improves the accuracy of the focus point.
本发明提出一种基于改进的动态深度聚焦的相控阵超声检测方法,其中,该检测方法需要的检测装置包括相控阵超声探伤仪和相控阵直探头,其中相控阵超声探伤仪与相控阵直探头电连接,相控阵直探头是具有多个阵元晶片的一维线性探头。检测方法具体包括以下几个步骤:The present invention proposes a phased array ultrasonic detection method based on improved dynamic depth focusing, wherein the detection device required by the detection method includes a phased array ultrasonic flaw detector and a phased array straight probe, wherein the phased array ultrasonic flaw detector and The phased array straight probe is electrically connected, and the phased array straight probe is a one-dimensional linear probe with multiple array elements. The detection method specifically includes the following steps:
步骤一、相控阵超声发射和接收步骤。首先,设置相控阵探伤仪,进行相控阵线形电子扫描,设置一次发射/接收超声波所选取的阵元个数(该值一般为相控阵直探头阵元个数的1/4)和线形电子扫描的步进值(该值取1个阵元),同时设置相控阵直探头发射超声波聚焦位置为被检测工件下表面(该值由被检测工件的厚度所决定),相控阵直探头接收超声回波信号方式为动态深度聚焦(DDF)方式,动态深度聚焦方式的设置包括起始聚焦深度、终止聚焦深度和聚焦深度步进三个参数,起始聚焦深度和终止聚焦深度由被检测工件的厚度所决定,聚焦深度步进由要求的检测精度决定,该方式可以使来自不同聚焦深度位置的超声回波信号处于聚焦状态。通过上述设置,相控阵探伤仪将相控阵直探头中相邻的多个阵元成为一个发射阵列孔径,对每个阵列孔径中的所有阵元进行控制,阵列孔径中的各个阵元按照相控阵探伤仪计算好的延迟时间值发射超声波,同时,该阵列孔径中的各个阵元均接收超声回波信号,这些超声回波信号中包含有被检测工件上下表面的反射回波以及缺陷的反射回波,按照相控阵探伤仪计算好的动态深度聚焦时的各聚焦深度位置的延迟时间值,将该阵列孔径中各个阵元所接收的超声回波信号做动态深度聚焦处理合并为一束超声信号,定义为该阵列孔径的超声合成信号。依次控制各个阵列孔径发射和接收超声波,即可获得各个阵列孔径的超声合成信号。
步骤二、缺陷判别步骤。对步骤一中各阵列孔径获得的超声合成信号中的数据用亮度(或颜色)来表征,得到被检测工件的一个二维截面图,即为B型显示,由于B型显示图中包含有被检测工件上下表面的反射回波的信息,因此从B型图中可确定出缺陷的二维位置信息。
步骤三、延迟时间计算步骤。根据步骤二中初步判别的缺陷位置信息,选定距离该缺陷位置最近的一个阵列孔径,根据该阵列孔径中的各个阵元在步骤一中所接收的超声回波信号,在该缺陷位置处加矩形时间窗或数字信号处理中任意用于提取给定区间内信息的窗函数,提取该缺陷位置的回波信息。然后,根据该阵列孔径中各个阵元接收相同缺陷反射的超声回波信号具有相关性的原理,利用互相关法,计算超声波从该缺陷位置到达该阵列孔径中各个阵元的时间差值。
互相关法的具体操作包括以下几个步骤:The specific operation of the cross-correlation method includes the following steps:
(1)选取距离该缺陷位置最近的一个阵列孔径,以该阵列孔径中距离该缺陷最近的一个阵元在步骤一中所接收的超声回波信号的数据作为参考信号x(n)(n=0,1,2…N-1),取该阵列孔径中的其它任一阵元在步骤一中所接收的超声回波信号的数据作为被测信号y(n)(n=0,1,2…N-1),n表示序列中的位置,N为步骤一中各阵元接收超声回波信号的采集点数,对于厚度为h,纵波声速为c的被检测工件,当相控阵超声探伤仪的采样频率为M时,N=(2h/c)*M;(1) Select an array aperture closest to the defect position, and use the data of the ultrasonic echo signal received by the array element closest to the defect in
(2)设置循环相关运算的循环周期长度为L,L≥2N-1,将参考信号x(n)(n=0,1,2…N-1)和被测信号y(n)(n=0,1,2…N-1)分别补零至长度为L;对补零后的参考信号x(n)(n=0,1,2…L-1)和补零后的被测信号y(n)(n=0,1,2…L-1)进行快速傅里叶变换(FFT)得到X(k)(k=0,1,2…L-1)和Y(k)(k=0,1,2…L-1),其中X(k)表示补零后的参考信号x(n)从时域信号做快速傅里叶变换(FFT)后变为频域信号的序列,Y(k)表示补零后的被测信号y(n)从时域信号做快速傅里叶变换(FFT)后变为频域信号的序列,k表示傅里叶变换后X(k)和Y(k)序列中的位置;(2) Set the cycle length of the cyclic correlation operation to L, L≥2N-1, the reference signal x(n)(n=0,1,2...N-1) and the measured signal y(n)(n =0,1,2…N-1) respectively padding to length L; for the reference signal x(n)(n=0,1,2…L-1) after zero padding and the measured signal x(n) after zero padding Signal y(n)(n=0,1,2...L-1) undergoes fast Fourier transform (FFT) to obtain X(k)(k=0,1,2...L-1) and Y(k) (k=0,1,2...L-1), where X(k) represents the zero-filled reference signal x(n) from the time-domain signal to the frequency-domain signal after Fast Fourier Transform (FFT) Sequence, Y(k) represents the sequence of the measured signal y(n) after the zero padding is changed from the time domain signal to the frequency domain signal after the fast Fourier transform (FFT), k represents the X(k ) and the position in the Y(k) sequence;
(3)对X(k)做共轭运算,将共轭运算结果与Y(k)作复数相乘,复数相乘后的结果为互相关函数R(k),再对R(k)作快速傅里叶反变换(IFFT),提取其实部R(τ),则R(k)取最大值时所对应的实部R(τ)中的τ就是所要求的参考信号和被测信号的时间差值;(3) Perform conjugate operation on X(k), multiply the result of the conjugate operation with Y(k) by complex numbers, the result of multiplication by complex numbers is the cross-correlation function R(k), and then perform R(k) Inverse Fast Fourier Transform (IFFT) extracts the real part R(τ), then the τ in the real part R(τ) corresponding to the maximum value of R(k) is the required reference signal and the measured signal time difference;
(4)分别依次将该阵列孔径中的其它阵元在步骤一中所接收超声回波信号的数据作为被测信号进行(1)~(3)的计算,求得该阵列孔径中各个阵元相对于参考信号的时间差值,这些时间差值即为所选定阵列孔径中各个阵元接收缺陷反射回波信号的延迟时间。(4) The data of the ultrasonic echo signals received by other array elements in the array aperture in
步骤四、回波信号后处理步骤。取步骤一设置动态深度聚焦时的各聚焦深度位置中距离缺陷最近的一个聚焦深度位置的延迟时间值,用步骤三中获得的所选定的阵列孔径中各个阵元的延迟时间值代替,其它聚焦深度位置的延迟时间值保持不变,则使所选定的阵列孔径中各阵元所接收的超声回波信号聚焦到缺陷位置。按照上述处理后的延迟时间值对所选定的阵列孔径中各阵元接收的超声回波信号进行重新合成处理,形成该阵列孔径新的超声合成信号。
步骤五、B型图重构步骤。将步骤四中所选定的阵列孔径所形成的新的超声合成信号替代步骤一中该阵列孔径获得的超声合成信号,并重新绘制B型图用于缺陷识别。Step five, the reconstruction step of the B-type graph. Replace the ultrasonic composite signal obtained by the array aperture in
本发明提出的相控阵超声检测方法不但应用于仅存在一个缺陷的被检测工件的检测,还应用于存在两个以上缺陷的被检测工件的检测。The phased array ultrasonic detection method proposed by the present invention is not only applied to the detection of the detected workpiece with only one defect, but also applicable to the detection of the detected workpiece with more than two defects.
实施例:本实施例提出一种基于改进的动态深度聚焦的相控阵超声检测方法,包括以下几个步骤: Embodiment: This embodiment proposes a phased array ultrasonic detection method based on improved dynamic depth focusing, including the following steps:
步骤一、以一个包含E个(32个)阵元晶片的相控阵一维线性直探头为例,采用相控阵线形电子扫描方式发射超声波,首先,取第1~E/4号(1~8号)阵元,将这E/4个阵元组成第1个阵列孔径,计算该阵列孔径中各阵元的延迟时间,使各阵元发射的超声波束垂直聚焦入射到被检测工件的下表面。然后,分别选取相控阵直探头中第2~(E/4+1)号(2~9号)、3~(E/4+2)号(3~10号)、4~(E/4+3)号(4~11号)…(3E/4+1)~E号(25~32号)阵元组成不同的阵列孔径,则E个阵元晶片的探头共包含3E/4+1个(25个)阵列孔径,先由第1个阵列孔径完成发射和接收超声波束的任务,接着由第2个阵列孔径完成收发任务,如此继续下去,使3E/4+1个阵列孔径依次轮流完成收发,从而实现对该相控阵直探头覆盖的工件范围内的全面扫查。相控阵的线形电子扫描方式如图1所示,图中以E个阵元晶片的相控阵直探头为例,取其中几个阵元晶片成为一个阵列孔径,沿线形扫描方向依次顺序发射超声波。
采用相控阵动态深度聚焦(DDF)方式接收超声回波信号,动态深度聚焦方式通过设置相控阵探伤仪的起始聚焦深度、终止聚焦深度和聚焦深度步进三个参数来实现,其中起始聚焦深度和终止聚焦深度由被检测工件的厚度所决定,聚焦深度步进由要求的检测精度决定。通过上述设置,相控阵探伤仪首先计算不同聚焦深度位置反射的超声回波信号到达各阵列孔径中各阵元的延迟时间值,然后在各阵列孔径的各阵元接收回波信号后,通过控制动态深度聚焦的各聚焦深度位置的延迟时间值,就可以使来自不同聚焦深度位置的回波声束处于聚焦状态,相控阵的动态深度聚焦方式如图2所示,图中示出了一个阵列孔径做动态深度聚焦时各聚焦深度位置。依次对各阵列孔径中各阵元所接收信号进行合成处理,获得3E/4+1个阵列孔径的超声合成信号,其中一个阵列孔径的信号合成方式如图3所示,图中分别以动态深度聚焦中第1个和第2个聚焦深度位置为例,示出了将一个阵列孔径中各个阵元接收的超声回波信号做动态深度聚焦处理合并为一束超声信号的过程。The phased array dynamic depth focusing (DDF) method is used to receive ultrasonic echo signals. The dynamic depth focusing method is realized by setting the initial focus depth, end focus depth and focus depth step of the phased array flaw detector. The initial focus depth and end focus depth are determined by the thickness of the workpiece to be detected, and the focus depth step is determined by the required detection accuracy. Through the above settings, the phased array flaw detector first calculates the delay time value of the ultrasonic echo signals reflected at different focal depth positions to reach each array element in each array aperture, and then after each array element receives the echo signal, through By controlling the delay time value of each focus depth position of dynamic depth focus, the echo beams from different focus depth positions can be in focus. The dynamic depth focus mode of phased array is shown in Figure 2, which shows Each focal depth position when an array aperture performs dynamic depth focusing. The signals received by each array element in each array aperture are synthesized in turn to obtain ultrasonic synthesized signals of 3E/4+1 array apertures. The signal synthesis method of one array aperture is shown in Figure 3, and the dynamic depth Taking the first and second focal depth positions in focusing as an example, it shows the process of combining ultrasonic echo signals received by each array element in an array aperture into a beam of ultrasonic signals through dynamic depth focusing processing.
步骤二、对步骤一中各阵列孔径获得的超声合成信号中的数据用亮度(或颜色)来表征,得到被检测工件的一个二维截面图,即为B型显示,由于B型显示图中包含有被检测工件上下表面的反射回波的信息,因此从B型图中可确定出缺陷的二维位置信息。
步骤三、延迟时间计算步骤。根据步骤二中初步判别的缺陷位置信息,选定距离该缺陷最近的一个阵列孔径,根据该阵列孔径中各阵元所接收的回波信号,提取该缺陷位置的回波信息,根据所确定的该缺陷的位置信息,对所选定阵列孔径中各阵元在步骤一中所接收的超声回波信号在缺陷位置处加矩形时间窗,即对时间窗范围外的采样值加权为0,时间窗范围内的采样值加权为1。其中矩形时间窗的中心位置由初步确定的该缺陷位置到所选定阵列孔径中各阵元的位置来确定。
一个阵列孔径发射时,该阵列孔径中各阵元所接收的同一个缺陷的回波信号,虽然在时间上存在差异性,但由于来自同一个反射体,且在声学参数基本相同的介质中传播,因此具有相关性,利用这个相关性可以估算所选定的阵列孔径中各阵元接收缺陷反射回波信号的时间差值,具体操作为:When an array aperture transmits, although the echo signals of the same defect received by each array element in the array aperture have differences in time, they come from the same reflector and propagate in a medium with basically the same acoustic parameters. , so there is a correlation, which can be used to estimate the time difference of each array element in the selected array aperture receiving the defect reflection echo signal, and the specific operation is as follows:
(1)选取距离该缺陷位置最近的一个阵列孔径,以该阵列孔径中距离该缺陷最近的一个阵元在步骤一中所接收的超声回波信号的数据作为参考信号,定义为x(n)(n=0,1,2…N-1),取该阵列孔径中的其它任一阵元在步骤一中所接收的超声回波信号的数据作为被测信号,定义为y(n)(n=0,1,2…N-1),如图4所示,图中以32个阵元晶片的相控阵直探头为例,其中距离缺陷位置最近的阵列孔径为第18个阵列孔径(第18~25号阵元),以距离缺陷最近的一个阵元(第21号阵元)所接收的超声回波信号的数据作为参考信号,其余阵元(第18~20和22~25号阵元)中任一阵元在步骤一中所接收的超声回波信号的数据作为被测信号。其中的N值是接收超声回波信号的采集点数,由被测工件的实际声程所决定,对于厚度为h,纵波声速为c的被测工件,当相控阵探伤设备的采样频率为M时,N=(2h/c)*M。例如60mm厚,纵波声速为5900m/s的被测工件,当相控阵探伤设备的采样频率为100MHz时,N的取值为2034;(1) Select an array aperture closest to the defect position, and use the data of the ultrasonic echo signal received by the array element closest to the defect in
(2)设置循环相关运算的循环周期长度为L,L≥2N-1,将x(n)(n=0,1,2…N-1)和y(n)(n=0,1,2…N-1)分别补零至长度为L,则变为x(n)(n=0,1,2…L-1)和y(n)(n=0,1,2…L-1);(2) Set the cycle length of the cycle correlation operation to L, L≥2N-1, set x(n)(n=0,1,2...N-1) and y(n)(n=0,1, 2…N-1) are filled with zeros until the length is L, then it becomes x(n)(n=0,1,2…L-1) and y(n)(n=0,1,2…L- 1);
(3)对x(n)(n=0,1,2…L-1)和y(n)(n=0,1,2…L-1)分别进行快速傅里叶变换(FFT)得到X(k)(k=0,1,2…,L-1)和Y(k)(k=0,1,2…,L-1);(3) Perform Fast Fourier Transform (FFT) on x(n)(n=0,1,2...L-1) and y(n)(n=0,1,2...L-1) respectively to get X(k)(k=0,1,2...,L-1) and Y(k)(k=0,1,2...,L-1);
(4)对X(k)做共轭运算,将共轭运算结果与Y(k)作复数相乘,将复数相乘的结果定义为自相关函数R(k),对R(k)再作快速傅里叶反变换(IFFT),提取其实部R(τ),则R(k)取最大值时所对应的实部R(τ)中的τ就是所要求的该被测信号和参考信号的时间差值。(4) Perform conjugate operation on X(k), multiply the result of the conjugate operation with Y(k), and define the result of complex multiplication as the autocorrelation function R(k), and then calculate R(k) Perform inverse fast Fourier transform (IFFT) to extract its real part R(τ), then τ in the real part R(τ) corresponding to the maximum value of R(k) is the required measured signal and reference The time difference of the signal.
分别取其余E/4-2个被测通道所接收超声回波信号的数据作为被测信号,采用上述4个步骤,可以求得各被测信号相对于参考信号的时间差值,这些时间差值即为所选定阵列孔径中各阵元的延迟时间。Take the data of the ultrasonic echo signals received by the remaining E/4-2 measured channels as the measured signal, and use the above four steps to obtain the time difference of each measured signal relative to the reference signal. These time differences The value is the delay time of each element in the selected array aperture.
步骤四、取步骤一设置动态深度聚焦时的各聚焦深度位置中距离缺陷最近的一个聚焦深度位置的延迟时间值,用步骤三中获得的所选定的阵列孔径中各个阵元的延迟时间值代替,其它聚焦深度位置的延迟时间值保持不变,则使所选定的阵列孔径中各阵元所接收的超声回波信号聚焦到缺陷位置,如图5所示将一个阵列孔径做动态深度聚焦时各聚焦深度位置中距离缺陷最近的聚焦深度位置由缺陷位置所代替,而保持其它聚焦深度位置不变。根据上述处理后的延迟时间值,对各阵元所接收回波信号重新进行合成处理,获得该阵列孔径的新的超声合成信号。
步骤五、将该阵列孔径合成的新的超声回波信号,代替步骤一中开始扫描时该阵列孔径的超声回波信号,保持其他阵列孔径的超声回波信号不变,重新绘制B型图。
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