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CN102779533B - FeRhPt laminated film that a kind of phase transition temperature is adjustable and preparation method thereof - Google Patents

FeRhPt laminated film that a kind of phase transition temperature is adjustable and preparation method thereof Download PDF

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CN102779533B
CN102779533B CN201210251569.6A CN201210251569A CN102779533B CN 102779533 B CN102779533 B CN 102779533B CN 201210251569 A CN201210251569 A CN 201210251569A CN 102779533 B CN102779533 B CN 102779533B
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ferhpt
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phase transition
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CN102779533A (en
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陆伟
陈哲
何晨冲
严彪
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Tongji University
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Abstract

本发明涉及磁性材料领域,具体公开了一种相变温度可调的FeRhPt复合薄膜及其制备方法,本发明的相变温度可调的FeRhPt复合薄膜,包括单晶MgO基板以及其上的(FeRh)100-XPtX合金薄膜,其中x的取值范围为0<x<20。本发明通过采用单晶MgO(001)基板实现了FeRhPt薄膜的外延生长以及垂直取向,获得较为完美的CsCl有序结构;并且通过退火处理诱发FeRhPt复合薄膜完成的有序化,使材料具有反铁磁/铁磁相变,并制备获得一系列相变温度可调的FeRhPt复合薄膜。本发明具有制备方法简单、材料性能好等优点,适用于相变温度可调的FeRhPt复合薄膜的制备。The invention relates to the field of magnetic materials, and specifically discloses a FeRhPt composite thin film with adjustable phase transition temperature and a preparation method thereof. The FeRhPt composite thin film with adjustable phase transition temperature of the present invention includes a single crystal MgO substrate and (FeRh ) 100-X Pt X alloy film, where the range of x is 0<x<20. The present invention realizes the epitaxial growth and vertical orientation of the FeRhPt film by using a single crystal MgO (001) substrate, and obtains a relatively perfect CsCl ordered structure; and induces the ordering of the FeRhPt composite film through annealing treatment, so that the material has anti-iron Magnetic/ferromagnetic phase transition, and a series of FeRhPt composite thin films with adjustable phase transition temperature were prepared. The invention has the advantages of simple preparation method, good material performance and the like, and is suitable for the preparation of FeRhPt composite film with adjustable phase transition temperature.

Description

一种相变温度可调的FeRhPt复合薄膜及其制备方法A kind of FeRhPt composite film with adjustable phase transition temperature and preparation method thereof

技术领域 technical field

本发明涉及磁性材料领域,具体公开了一种相变温度可调的FeRhPt复合薄膜及其制备方法。The invention relates to the field of magnetic materials, and specifically discloses an FeRhPt composite thin film with adjustable phase transition temperature and a preparation method thereof.

背景技术 Background technique

现有研究已经发现,在一个较低的温度范围内(330K~350K)FeRh合金具有一个从反铁磁到铁磁的一级相变。这一相转变被认为是与Fe50Rh50合金的CsCl型体心立方结构有关。Existing studies have found that in a lower temperature range (330K ~ 350K) FeRh alloy has a first-order phase transition from antiferromagnetic to ferromagnetic. This phase transition is considered to be related to the CsCl-type body-centered cubic structure of the Fe50Rh50 alloy.

Fallot在1938年第一次发现具有CsCl结构的有序FeRh基合金有一级反铁磁/铁磁相变。从室温加热到相变温度(大约为350K),有序的FeRh合金经历了一个从AFM到FM的磁相变,同时有一个10K左右的磁滞后(J.LommelandJ.Kouvel,J.Appl.Phys.,Vol.38,pp1263~1264,1967)。进一步研究发现相变过程中伴随着1%-2%的晶胞体积膨胀、电阻率的降低和一个很大的熵变。另外,在J.Appl.Phys.,Vol.74,pp3328,1993;J.Appl.Phys.,Vol.90,pp6251,2001以及IEEETran.Magn.,vol.40,pp2537,2004等文献中也研究了FeRh合金的相变。利用FeRh有序合金的反铁磁/铁磁一级相变行为,J.Thiele等(IEEETran.Magn.,vol.40,pp2537,2004)开发了用于热辅助磁记录的FeRh/FePt双层薄膜;Zhou等(美国专利US20090052092A1)开发了含有FeRh层的垂直磁记录磁头;E.Fullerton等(美国专利US007372116B2)开发了具有热辅助翻转的磁随即存储器单元。Fallot discovered for the first time in 1938 that ordered FeRh-based alloys with a CsCl structure had a first-order antiferromagnetic/ferromagnetic phase transition. Heating from room temperature to the phase transition temperature (about 350K), the ordered FeRh alloy undergoes a magnetic phase transition from AFM to FM, with a magnetic hysteresis of about 10K (J.LommelandJ.Kouvel, J.Appl.Phys ., Vol.38, pp1263~1264, 1967). Further research found that the phase transition process is accompanied by a 1%-2% unit cell volume expansion, a decrease in resistivity, and a large entropy change. In addition, it is also studied in J.Appl.Phys., Vol.74, pp3328, 1993; J.Appl.Phys., Vol.90, pp6251, 2001 and IEEETran.Magn., vol.40, pp2537, 2004 and other documents Phase transformation of FeRh alloy. Taking advantage of the antiferromagnetic/ferromagnetic first-order phase transition behavior of FeRh ordered alloys, J. Thiele et al. (IEEETran.Magn., vol.40, pp2537, 2004) developed a FeRh/FePt bilayer for heat-assisted magnetic recording Thin films; Zhou et al. (US Patent US20090052092A1) developed a perpendicular magnetic recording head containing a FeRh layer; E.Fullerton et al. (US Patent US007372116B2) developed a magnetic random memory cell with thermally assisted flipping.

通常情况下,CsCl结构的有序FeRh合金反铁磁/铁磁相变的温度在350K左右。但是其相变温度对样品的成分很敏感,可以通过掺杂来调节。添加少量的Ir或者Pt能提高相变温度而加入少量的Pd能降低相变温度。通过调节FeRh基合金的反铁磁/铁磁相变温度,那么在,可以使该合金具有更广泛技术应用的可能性,比如热辅助磁记录介质、自旋阀、磁制冷以及微纳电机械系统等。Normally, the temperature of antiferromagnetic/ferromagnetic phase transition of ordered FeRh alloy with CsCl structure is around 350K. However, its phase transition temperature is sensitive to the composition of the sample and can be adjusted by doping. Adding a small amount of Ir or Pt can increase the phase transition temperature and adding a small amount of Pd can lower the phase transition temperature. By adjusting the antiferromagnetic/ferromagnetic phase transition temperature of the FeRh-based alloy, the alloy can be used in a wider range of technologies, such as heat-assisted magnetic recording media, spin valves, magnetic refrigeration and micro-nano electromechanical system etc.

发明内容 Contents of the invention

本发明的目的在于克服现有技术的缺陷,通过在FeRh合金薄膜中添加不同量的Pt来调节合金薄膜的反铁磁/铁磁相变温度,提供一种相变温度可调的FeRhPt复合薄膜及其制备方法,使其满足在更广范围上的技术应用。The purpose of the present invention is to overcome the defects of the prior art, by adding different amounts of Pt in the FeRh alloy film to adjust the antiferromagnetic/ferromagnetic phase transition temperature of the alloy film, to provide a FeRhPt composite film with adjustable phase transition temperature And its preparation method makes it meet the technical application in a wider range.

本发明第一方面公开了一种相变温度可调的FeRhPt复合薄膜,包括单晶MgO(001)基板以及其上的(FeRh)100-XPtX合金薄膜,并且x的取值范围为0<x<20。The first aspect of the present invention discloses a FeRhPt composite thin film with adjustable phase transition temperature, including a single crystal MgO (001) substrate and a (FeRh) 100-X Pt X alloy thin film on it, and the value range of x is 0 <x<20.

较优的,所述(FeRh)100-XPtX合金薄膜厚度为5~100nm。Preferably, the thickness of the (FeRh) 100-X Pt X alloy thin film is 5-100 nm.

本发明第二方面公开了前述相变温度可调的FeRhPt复合薄膜的制备方法,步骤为:The second aspect of the present invention discloses the preparation method of the aforementioned FeRhPt composite film with adjustable phase transition temperature, the steps are:

1)薄膜的沉积:通过沉积法在单晶(001)MgO基板上沉积(FeRh)100-XPtX合金薄膜,其中x的取值范围为0<x<20;1) Deposition of thin film: Deposit (FeRh) 100-X Pt X alloy thin film on single crystal (001) MgO substrate by deposition method, where the value range of x is 0<x<20;

2)退火处理:基板自然冷却后,在真空中对沉积获得的薄膜进行退火处理得到FeRhPt复合薄膜。2) Annealing treatment: After the substrate is naturally cooled, the deposited thin film is annealed in vacuum to obtain a FeRhPt composite thin film.

较优的,所述沉积法为物理气相沉积法。Preferably, the deposition method is physical vapor deposition.

更优的,所述沉积法为磁控溅射沉积法。More preferably, the deposition method is magnetron sputtering deposition method.

所述磁控溅射沉积法为:采用Fe50Rh50合金靶材和Pt靶材共溅射的方法,在氩气气氛中进行溅射。The magnetron sputtering deposition method is as follows: a co-sputtering method of Fe 50 Rh 50 alloy target and Pt target is used, and the sputtering is carried out in an argon atmosphere.

最优的,所述磁控溅射沉积法的条件为:溅射时基板温度100~500℃;溅射腔的背底真空度0.7×10-5~×10-5Pa,溅射时氩气气压1~20Pa。 Optimally , the conditions of the magnetron sputtering deposition method are: the temperature of the substrate during sputtering is 100-500 °C; Air pressure 1 ~ 20Pa.

最优的,磁控溅射沉积法溅射过程中基板以5转/分钟~30转/分钟的速率旋转。Optimally, during the sputtering process of the magnetron sputtering deposition method, the substrate rotates at a rate of 5 rpm to 30 rpm.

较优的,所述退火处理的条件为:真空度1×10-5~10×10-5Pa,退火温度400~700℃,退火时间0.5~4小时。Preferably, the conditions of the annealing treatment are: a vacuum degree of 1×10 -5 to 10×10 -5 Pa, an annealing temperature of 400-700° C., and an annealing time of 0.5-4 hours.

本发明第三方面公开了前述相变温度可调的FeRhPt复合薄膜作为磁记录介质的应用。The third aspect of the present invention discloses the application of the aforementioned FeRhPt composite film with adjustable phase transition temperature as a magnetic recording medium.

本发明采用单晶MgO(001)作为基板,主要是为了实现FeRhPt薄膜的外延生长以及垂直取向,获得较为完美的CsCl有序结构;此外本发明的制备方法还通过退火处理诱发FeRhPt复合薄膜完成的有序化,具有反铁磁/铁磁相变,最终获得一系列反铁磁/铁磁相变温度可调的FeRhPt复合薄膜,使该合金具有更广泛技术应用的可能性。本发明的制备方法简单、制备的材料性能好,极适用于相变温度可调的FeRhPt复合薄膜的制备。The present invention uses single crystal MgO (001) as the substrate, mainly to realize the epitaxial growth and vertical orientation of the FeRhPt thin film, and to obtain a relatively perfect CsCl ordered structure; in addition, the preparation method of the present invention is also induced by annealing to complete the FeRhPt composite thin film Ordered, with antiferromagnetic/ferromagnetic phase transition, and finally a series of FeRhPt composite thin films with adjustable antiferromagnetic/ferromagnetic phase transition temperature, which makes the alloy have the possibility of wider technical application. The preparation method of the present invention is simple, the prepared material has good performance, and is very suitable for the preparation of FeRhPt composite film with adjustable phase transition temperature.

附图说明 Description of drawings

图1:FeRhPt复合薄膜的磁化强度与温度的关系图Figure 1: The relationship between magnetization and temperature of FeRhPt composite thin film

图2:X射线衍射图谱Figure 2: X-ray Diffraction Pattern

具体实施方式 detailed description

下面结合具体实施例进一步阐述本发明,应理解,实施例仅用于说明本发明而不用于限制本发明的保护范围。The present invention will be further described below in conjunction with specific examples. It should be understood that the examples are only used to illustrate the present invention and are not intended to limit the protection scope of the present invention.

实施例1Example 1

1.实验方法1. Experimental method

1)首先将单晶MgO(001)基板利用超声清洗装置在酒精溶液中清洗,并用压缩空气吹干,用镊子将清洗吹干后的MgO基板安放在溅射室样品底座上。1) Firstly, the single crystal MgO (001) substrate was cleaned in an alcohol solution with an ultrasonic cleaning device, and dried with compressed air. The cleaned and dried MgO substrate was placed on the sample base of the sputtering chamber with tweezers.

2)待溅射腔背底真空达到2×10-5Pa时利用射频磁控溅射技术在洁净的MgO基板上通过共溅射技术,采用Fe50Rh50合金靶材和Pt靶材共溅射的方法,沉积(FeRh)95Pt5合金薄膜(化学式中的数值为摩尔比),其厚度在50nm。在溅射时,基板温度为100℃。溅射时氩气气压为10Pa。在溅射过程中,基板以12转/分钟的速率旋转。2) When the vacuum at the back of the sputtering chamber reaches 2×10 -5 Pa, use radio frequency magnetron sputtering technology to pass co-sputtering technology on a clean MgO substrate, using Fe 50 Rh 50 alloy target and Pt target co-sputtering The deposition method is to deposit (FeRh) 95 Pt 5 alloy film (the value in the chemical formula is the molar ratio), and its thickness is 50nm. During sputtering, the substrate temperature was 100°C. Argon gas pressure was 10 Pa during sputtering. During sputtering, the substrate was rotated at a rate of 12 rpm.

3)溅射结束后,将基板自然冷却至室温,然后放入真空退火炉中进行退火热处理。真空退火炉的背底真空度为10×10-5Pa,退火温度为700℃,退火时间为0.5小时。3) After sputtering, the substrate is naturally cooled to room temperature, and then placed in a vacuum annealing furnace for annealing heat treatment. The background vacuum degree of the vacuum annealing furnace is 10×10 -5 Pa, the annealing temperature is 700° C., and the annealing time is 0.5 hour.

2.实验结果2. Experimental results

经检测,制备出的薄膜反铁磁/铁磁相变温度约为450K,居里温度约为650K,(FeRh)95Pt5复合薄膜磁化强度与温度的关系曲线如图1所示。After testing, the antiferromagnetic/ferromagnetic phase transition temperature of the prepared thin film is about 450K, and the Curie temperature is about 650K. The relationship between magnetization and temperature of (FeRh) 95 Pt 5 composite thin film is shown in Figure 1.

实施例2Example 2

1.实验方法1. Experimental method

1)首先将单晶MgO(001)基板利用超声清洗装置在酒精溶液中清洗,并用压缩空气吹干。用镊子将清洗吹干后的MgO基板安放在溅射室样品底座上。1) First, the single crystal MgO (001) substrate was cleaned in an alcohol solution using an ultrasonic cleaning device, and dried with compressed air. Place the cleaned and dried MgO substrate on the sample base of the sputtering chamber with tweezers.

2)待溅射腔背底真空达到0.7×10-5Pa时利用射频磁控溅射技术在洁净的MgO基板上通过共溅射技术,采用Fe50Rh50合金靶材和Pt靶材共溅射的方法,沉积(FeRh)90Pt10合金薄膜(化学式中的数值为摩尔比),其厚度在100nm。在溅射时,基板温度为350℃。溅射时氩气气压为20Pa。在溅射过程中,基板以5转/分钟的速率旋转。2) When the vacuum at the back of the sputtering chamber reaches 0.7×10 -5 Pa, use radio frequency magnetron sputtering technology to pass co-sputtering technology on a clean MgO substrate, using Fe 50 Rh 50 alloy target and Pt target co-sputtering By means of radiation, deposit (FeRh) 90 Pt 10 alloy film (the value in the chemical formula is the molar ratio), and its thickness is 100nm. During sputtering, the substrate temperature was 350°C. Argon gas pressure was 20 Pa during sputtering. During sputtering, the substrate was rotated at a rate of 5 rpm.

3)溅射结束后,将基板自然冷却至室温,然后放入真空退火炉中进行退火热处理。真空退火炉的背底真空度为5×10-5Pa,退火温度为500℃,退火时间为2小时。3) After sputtering, the substrate is naturally cooled to room temperature, and then placed in a vacuum annealing furnace for annealing heat treatment. The background vacuum degree of the vacuum annealing furnace is 5×10 -5 Pa, the annealing temperature is 500° C., and the annealing time is 2 hours.

2.实验结果2. Experimental results

经检测,制备出的薄膜反铁磁/铁磁相变温度约为490K,居里温度约为600K。其磁化强度与温度的关系曲线如图1所示。After detection, the antiferromagnetic/ferromagnetic phase transition temperature of the prepared thin film is about 490K, and the Curie temperature is about 600K. The relationship between magnetization and temperature is shown in Figure 1.

实施例3Example 3

1.实验方法1. Experimental method

1)首先将单晶MgO(001)基板利用超声清洗装置在酒精溶液中清洗,并用压缩空气吹干。用镊子将清洗吹干后的MgO基板安放在溅射室样品底座上。1) First, the single crystal MgO (001) substrate was cleaned in an alcohol solution using an ultrasonic cleaning device, and dried with compressed air. Place the cleaned and dried MgO substrate on the sample base of the sputtering chamber with tweezers.

2)待溅射腔背底真空达到5×10-5Pa时利用射频磁控溅射技术在洁净的MgO基板上通过共溅射技术,采用Fe50Rh50合金靶材和Pt靶材共溅射的方法,沉积(FeRh)85Pt15合金薄膜(化学式中的数值为摩尔比),其厚度在5nm。在溅射时,基板温度为500℃。溅射时氩气气压为1.0Pa。在溅射过程中,基板以30转/分钟的速率旋转。2) When the vacuum at the back of the sputtering chamber reaches 5×10 -5 Pa, use radio frequency magnetron sputtering technology to pass co-sputtering technology on a clean MgO substrate, using Fe 50 Rh 50 alloy target and Pt target co-sputtering By means of radiation, deposit (FeRh) 85 Pt 15 alloy film (the value in the chemical formula is the molar ratio), and its thickness is 5nm. During sputtering, the substrate temperature was 500°C. Argon gas pressure was 1.0 Pa during sputtering. During sputtering, the substrate was rotated at a rate of 30 rpm.

3)溅射结束后,将基板自然冷却至室温,然后放入真空退火炉中进行退火热处理。真空退火炉的背底真空度为1×10-5Pa,退火温度为400℃,退火时间为4小时。3) After sputtering, the substrate is naturally cooled to room temperature, and then placed in a vacuum annealing furnace for annealing heat treatment. The background vacuum degree of the vacuum annealing furnace is 1×10 -5 Pa, the annealing temperature is 400° C., and the annealing time is 4 hours.

2.实验结果2. Experimental results

经检测,制备出的薄膜反铁磁/铁磁相变约为520K,居里温度约为570K。其磁化强度与温度的关系曲线如图1所示。After testing, the antiferromagnetic/ferromagnetic phase transition of the prepared thin film is about 520K, and the Curie temperature is about 570K. The relationship between magnetization and temperature is shown in Figure 1.

从实施例1-3材料磁化强度与温度的关系曲线图可以看出,制备出来的FeRhPt薄膜均具有反铁磁/铁磁相变;其相变温度随着Pt含量的增加而升高,居里温度随着Pt含量的增加而降低,且伴随着相变的热滞后宽度随着Pt含量增多而减小。As can be seen from the relationship curves between the magnetization and temperature of the materials in Examples 1-3, the prepared FeRhPt films all have antiferromagnetic/ferromagnetic phase transitions; the phase transition temperature increases with the increase of the Pt content, ranking first The Li temperature decreases with the increase of Pt content, and the thermal hysteresis width accompanying the phase transition decreases with the increase of Pt content.

图2所示的X射线衍射表明薄膜具有垂直取向的CsCl型的体心立方结构,表明利用磁控溅射方法制备FeRhPt薄膜,再经过后续热处理可以获得具有CsCl有序结构、垂直取向且相变温度可调等特点的FeRhPt薄膜,适用于未来热辅助磁记录介质、自旋阀、磁制冷以及微纳电机械系统等的应用。The X-ray diffraction shown in Figure 2 shows that the film has a vertically oriented CsCl type body-centered cubic structure, indicating that the FeRhPt film is prepared by magnetron sputtering, and then after subsequent heat treatment can obtain a CsCl ordered structure, vertical orientation and phase transition. The FeRhPt thin film with adjustable temperature is suitable for applications such as heat-assisted magnetic recording media, spin valves, magnetic refrigeration, and micro-nano electromechanical systems in the future.

以上所述,仅为本发明的较佳实施例,并非对本发明任何形式上和实质上的限制,应当指出,对于本技术领域的普通技术人员,在不脱离本发明方法的前提下,还将可以做出若干改进和补充,这些改进和补充也应视为本发明的保护范围。凡熟悉本专业的技术人员,在不脱离本发明的精神和范围的情况下,当可利用以上所揭示的技术内容而做出的些许更动、修饰与演变的等同变化,均为本发明的等效实施例;同时,凡依据本发明的实质技术对上述实施例所作的任何等同变化的更动、修饰与演变,均仍属于本发明的技术方案的范围内。The above description is only a preferred embodiment of the present invention, and is not intended to limit the present invention in any form and in essence. Several improvements and supplements can be made, and these improvements and supplements should also be regarded as the protection scope of the present invention. Those who are familiar with this profession, without departing from the spirit and scope of the present invention, when they can use the technical content disclosed above to make some changes, modifications and equivalent changes of evolution, are all included in the present invention. Equivalent embodiments; at the same time, all changes, modifications and evolutions of any equivalent changes made to the above-mentioned embodiments according to the substantive technology of the present invention still belong to the scope of the technical solution of the present invention.

Claims (6)

1. the FeRhPt laminated film that phase transition temperature is adjustable, comprises monocrystalline MgO (001) substrate and (FeRh) on it 100-Xpt xalloy firm, and the span of x is 10<x<15; The FeRhPt laminated film that described phase transition temperature is adjustable is that the method by comprising the following steps prepares:
1) deposition of film: deposit (FeRh) by sedimentation on monocrystalline MgO (001) substrate 100-Xpt xalloy firm, wherein the span of x is 10<x<15;
2) annealing in process: after substrate cools naturally, the film obtained deposition in a vacuum carries out annealing in process and obtains FeRhPt laminated film;
Described sedimentation is magnetron sputtering deposition method;
The condition of described magnetron sputtering deposition method is: sputtering time substrate temperature 100 ~ 500 DEG C; The back end vacuum tightness 0.7 × 10 of sputtering chamber -5~ 5 × 10 -5pa, ar pressure 1 ~ 20Pa during sputtering;
In magnetron sputtering deposition method sputter procedure, substrate rotates with the speed of 5 revs/min ~ 30 revs/min;
Step 2) condition of described annealing in process is: vacuum tightness 1 × 10 -5~ 10 × 10 -5pa, annealing temperature 400 ~ 700 DEG C, annealing time 0.5 ~ 4 hour;
Described (FeRh) 100-Xpt xalloy firm thickness is 5 ~ 100nm; Described FeRhPt laminated film has the body-centered cubic structure of vertical orientated CsCl type.
2. the preparation method of FeRhPt laminated film according to claim 1, step is:
1) deposition of film: deposit (FeRh) by sedimentation on monocrystalline MgO (001) substrate 100-Xpt xalloy firm, wherein the span of x is 10<x<15;
2) annealing in process: after substrate cools naturally, the film obtained deposition in a vacuum carries out annealing in process and obtains FeRhPt laminated film;
Step 1) described sedimentation is magnetron sputtering deposition method.
3. preparation method as claimed in claim 2, it is characterized in that, the condition of described magnetron sputtering deposition method is: sputtering time substrate temperature 100 ~ 500 DEG C; The back end vacuum tightness 0.7 × 10 of sputtering chamber -5~ 5 × 10 -5pa, ar pressure 1 ~ 20Pa during sputtering.
4. preparation method as claimed in claim 2, it is characterized in that, in magnetron sputtering deposition method sputter procedure, substrate rotates with the speed of 5 revs/min ~ 30 revs/min.
5. preparation method as claimed in claim 2, is characterized in that, step 2) condition of described annealing in process is: vacuum tightness 1 × 10 -5~ 10 × 10 -5pa, annealing temperature 400 ~ 700 DEG C, annealing time 0.5 ~ 4 hour.
6. FeRhPt laminated film according to claim 1 is as the application of magnetic recording media.
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