CN102775185A - Dielectric adjustable lead niobate thin film material - Google Patents
Dielectric adjustable lead niobate thin film material Download PDFInfo
- Publication number
- CN102775185A CN102775185A CN2012102615923A CN201210261592A CN102775185A CN 102775185 A CN102775185 A CN 102775185A CN 2012102615923 A CN2012102615923 A CN 2012102615923A CN 201210261592 A CN201210261592 A CN 201210261592A CN 102775185 A CN102775185 A CN 102775185A
- Authority
- CN
- China
- Prior art keywords
- citric acid
- dielectric
- lead
- niobium
- aqueous solution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000463 material Substances 0.000 title claims abstract description 18
- 239000010409 thin film Substances 0.000 title claims abstract description 9
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid Chemical compound OC(=O)CC(O)(C(O)=O)CC(O)=O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 claims abstract description 69
- 239000010408 film Substances 0.000 claims abstract description 31
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 claims abstract description 24
- 239000007864 aqueous solution Substances 0.000 claims abstract description 19
- 229910052758 niobium Inorganic materials 0.000 claims abstract description 16
- 239000010955 niobium Substances 0.000 claims abstract description 16
- 239000000758 substrate Substances 0.000 claims abstract description 16
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims abstract description 13
- 238000002360 preparation method Methods 0.000 claims abstract description 10
- 239000002243 precursor Substances 0.000 claims abstract description 8
- 239000000243 solution Substances 0.000 claims abstract description 8
- 239000000126 substance Substances 0.000 claims abstract description 5
- 238000003756 stirring Methods 0.000 claims description 9
- RLJMLMKIBZAXJO-UHFFFAOYSA-N lead nitrate Chemical compound [O-][N+](=O)O[Pb]O[N+]([O-])=O RLJMLMKIBZAXJO-UHFFFAOYSA-N 0.000 claims description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 6
- HJSAVSHUKKYRIX-UHFFFAOYSA-N 2-hydroxypropane-1,2,3-tricarboxylic acid;niobium Chemical compound [Nb].OC(=O)CC(O)(C(O)=O)CC(O)=O HJSAVSHUKKYRIX-UHFFFAOYSA-N 0.000 claims description 3
- 239000002253 acid Substances 0.000 claims description 3
- 238000003916 acid precipitation Methods 0.000 claims description 3
- 235000011114 ammonium hydroxide Nutrition 0.000 claims description 3
- 239000008367 deionised water Substances 0.000 claims description 3
- 229910021641 deionized water Inorganic materials 0.000 claims description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-N hydrofluoric acid Substances F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 claims description 3
- 239000007788 liquid Substances 0.000 claims description 3
- QPJSUIGXIBEQAC-UHFFFAOYSA-N n-(2,4-dichloro-5-propan-2-yloxyphenyl)acetamide Chemical compound CC(C)OC1=CC(NC(C)=O)=C(Cl)C=C1Cl QPJSUIGXIBEQAC-UHFFFAOYSA-N 0.000 claims description 3
- -1 niobium ion Chemical class 0.000 claims description 3
- 239000002244 precipitate Substances 0.000 claims description 3
- 238000000967 suction filtration Methods 0.000 claims description 3
- 239000011521 glass Substances 0.000 claims description 2
- 238000000034 method Methods 0.000 abstract description 4
- 238000010438 heat treatment Methods 0.000 abstract 2
- 238000012360 testing method Methods 0.000 description 5
- 239000003990 capacitor Substances 0.000 description 3
- 239000002994 raw material Substances 0.000 description 3
- 229910052797 bismuth Inorganic materials 0.000 description 2
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 239000003989 dielectric material Substances 0.000 description 2
- 229910052454 barium strontium titanate Inorganic materials 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000012776 electronic material Substances 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Landscapes
- Inorganic Compounds Of Heavy Metals (AREA)
- Inorganic Insulating Materials (AREA)
Abstract
本发明公开了一种介电可调的铌酸铅薄膜材料,其化学式及摩尔含量为:PbxNb2O5+x其中x=1.05~1.35。制备方法为:首先制备铅和铌的柠檬酸水溶液,再于该溶液中加入乙二醇,得前驱体溶胶;再将前躯体溶胶滴在基片上,经匀胶,干燥,热处理,重复制备多层薄膜,再于500~700℃热处理0.5~2h,得到介电可调的铌酸铅介质薄膜。本发明的综合性能优于目前研究最广泛的BST薄膜和BZN薄膜,其介电常数为350~440,介电损耗为0.005~0.0007,500kV/cm偏压下的调谐率为25%~30%,优值≥100;本发明的方法具有精确控制薄膜化学组分的优点;本发明工艺简单、成本低廉、具有良好的应用前景。The invention discloses a lead niobate thin film material with adjustable dielectric. Its chemical formula and molar content are: Pb x Nb 2 O 5+x where x=1.05-1.35. The preparation method is as follows: first prepare the citric acid aqueous solution of lead and niobium, then add ethylene glycol to the solution to obtain the precursor sol; then drop the precursor sol on the substrate, homogenize the gel, dry, heat treatment, and repeatedly prepare multiple sols. Layer thin film, and then heat treatment at 500~700°C for 0.5~2h to obtain dielectrically adjustable lead niobate dielectric thin film. The comprehensive performance of the present invention is better than that of BST film and BZN film which are the most widely studied at present. Its dielectric constant is 350~440, dielectric loss is 0.005~0.0007, and the tuning rate under 500kV/cm bias is 25%~30%. , the figure of merit ≥ 100; the method of the invention has the advantages of precisely controlling the chemical components of the film; the process of the invention is simple, the cost is low, and it has good application prospects.
Description
技术领域 technical field
本发明是关于电子元器件的,特别涉及一种用于微波调谐元器件的铌酸铅薄膜及其制备方法。The invention relates to electronic components, in particular to a lead niobate thin film used for microwave tuning components and a preparation method thereof.
背景技术 Background technique
随着微波通信系统的快速发展,人们对微波器件,尤其是微波调谐器件提出了更高的要求。响应速度快、尺寸小、频带宽、灵敏度高、工作电压低的微波器件是目前和下一代通信系统必不可少的的组成部分。这些要求给目前的电子材料与元器件带来了巨大的挑战。With the rapid development of microwave communication systems, people put forward higher requirements for microwave devices, especially microwave tuning devices. Microwave devices with fast response speed, small size, wide frequency band, high sensitivity, and low operating voltage are indispensable components of current and next-generation communication systems. These requirements have brought great challenges to current electronic materials and components.
微波介电可调材料在微波可调元器件领域有着广阔的应用前景,如相控阵天线上的移相器、谐振器、滤波器等。就材料体系而言,钙钛矿结构的钛酸锶钡BST(BaxSr1-xTiO3)基材料与铋基立方焦绿石结构的Bi1.5ZnNb1.5O7(BZN)和Bi1.5MgNb1.5O7(BMN)材料是目前研究较多的两类介电可调微波介质材料。BST基薄膜材料的特点是介电调谐率高,但介电损耗大通常tgδ>0.01,报道的最小损耗为0.005。而微波器件要求介质材料有较低的介电损耗,介电损耗降低有利于减小器件的插入损耗。铋基立方焦绿石结构的BZN与BMN材料也具有介电可调性,并且其介电损耗比BST低。但是,使该类材料达到较高的调谐率需要的偏压很高,例如BZN薄膜的调谐率为29.2%时需要1.2MV/cm的场强,调谐率为55%时则需要2.4MV/cm的场强。如此高的操作电场对器件的可靠性提出了极高的要求。因此,开发具有低介电损耗并且在较低的场强下也具有较高调谐率的新材料体系已成为当前压控微波材料与器件领域的迫切需求。Microwave dielectric tunable materials have broad application prospects in the field of microwave tunable components, such as phase shifters, resonators, and filters on phased array antennas. As far as the material system is concerned, perovskite-structured barium strontium titanate BST (Ba x Sr 1-x TiO 3 )-based materials and bismuth-based cubic pyrochlore-structured Bi 1.5 ZnNb 1.5 O 7 (BZN) and Bi 1.5 MgNb 1.5 O 7 (BMN) materials are two types of dielectrically tunable microwave dielectric materials that have been studied more at present. BST-based thin film materials are characterized by high dielectric tuning rate, but large dielectric loss, usually tgδ>0.01, and the reported minimum loss is 0.005. Microwave devices require dielectric materials with low dielectric loss, and the reduction of dielectric loss is conducive to reducing the insertion loss of the device. BZN and BMN materials with bismuth-based cubic pyrochlore structure also have dielectric tunability, and their dielectric loss is lower than that of BST. However, the bias voltage required to achieve a high tuning rate for this type of material is very high. For example, when the tuning rate of BZN film is 29.2%, a field strength of 1.2MV/cm is required, and when the tuning rate is 55%, it needs 2.4MV/cm field strength. Such a high operating electric field places extremely high requirements on the reliability of the device. Therefore, it has become an urgent need in the field of voltage-controlled microwave materials and devices to develop new material systems with low dielectric loss and high tuning rate at low field strength.
发明内容 Contents of the invention
本发明的目的在于提供一种高调谐率、低损耗的介电可调的铌酸铅薄膜材料及其制备方法。The object of the present invention is to provide a lead niobate thin film material with high tuning rate and low loss and adjustable dielectric and its preparation method.
本发明通过如下技术方案予以实现。The present invention is realized through the following technical solutions.
一种介电可调的铌酸铅薄膜材料,其化学式及摩尔含量为:PbxNb2O5+x其中x=1.05~1.35。A lead niobate film material with adjustable dielectric, its chemical formula and molar content are: Pb x Nb 2 O 5+x where x=1.05-1.35.
上述介电可调的铌酸铅薄膜材料的制备方法,具有如下步骤:The preparation method of the dielectrically adjustable lead niobate film material has the following steps:
(1)配制铌的柠檬酸水溶液(1) Preparation of citric acid aqueous solution of niobium
(a)根据PbxNb2O5+x其中x=1.05~1.35的化学计量比称取Nb2O5,将Nb2O5放入氢氟酸中,水浴加热至Nb2O5全部溶解;(a) Weigh Nb 2 O 5 according to the stoichiometric ratio of Pb x Nb 2 O 5+x where x=1.05~1.35, put Nb 2 O 5 into hydrofluoric acid , heat in water bath until Nb 2 O 5 is completely dissolved ;
(b)向上述溶液中加入氨水生成铌酸沉淀;(b) adding ammoniacal liquor to generate niobic acid precipitation in above-mentioned solution;
(c)抽滤洗涤上述沉淀,然后将铌酸加入柠檬酸的水溶液中,得到铌的柠檬酸水溶液,其中铌离子与柠檬酸的摩尔比为1:2~1:6。(c) Wash the above precipitate by suction filtration, then add niobic acid into the aqueous solution of citric acid to obtain an aqueous solution of niobium citric acid, wherein the molar ratio of niobium ion to citric acid is 1:2~1:6.
(2)按PbxNb2O5+x其中x=1.05~1.35的化学计量比称取硝酸铅,加入去离子水中,搅拌至充分溶解,得到硝酸铅的水溶液。(2) Weigh lead nitrate according to the stoichiometric ratio of Pb x Nb 2 O 5+x where x=1.05~1.35, add it into deionized water, stir until fully dissolved, and obtain an aqueous solution of lead nitrate.
(3)将步骤(1)配置的铌的柠檬酸溶液加入步骤(2)配置的液体中,搅拌均匀得铅和铌的柠檬酸水溶液。(3) Add the citric acid solution of niobium prepared in step (1) into the liquid prepared in step (2), and stir evenly to obtain an aqueous solution of citric acid of lead and niobium.
(4)步骤(3)制得的铅和铌的柠檬酸水溶液中加入乙二醇,加热搅拌,得前驱体溶胶,柠檬酸与乙二醇的摩尔为1:1~1:4。(4) Add ethylene glycol to the citric acid aqueous solution of lead and niobium prepared in step (3), heat and stir to obtain a precursor sol, and the molar ratio of citric acid to ethylene glycol is 1:1~1:4.
(5)将步骤(4)配置的前躯体溶胶滴在基片上,用台式匀胶机匀胶,使溶胶均匀地涂覆在基片上,然后在热板上干燥;(5) Drop the precursor sol prepared in step (4) on the substrate, and use a desktop homogenizer to evenly coat the sol on the substrate, and then dry it on a hot plate;
(6)将步骤(5)干燥后的薄膜在500~700℃进行热处理;(6) heat-treating the dried film in step (5) at 500-700°C;
(7)重复步骤(5)、(6)制备多层薄膜;(7) Repeat steps (5) and (6) to prepare multilayer films;
(8)将制备的多层薄膜在500~700℃热处理0.5~2h,得到介电可调的铌酸铅介质薄膜。(8) heat-treat the prepared multilayer film at 500-700° C. for 0.5-2 hours to obtain a lead niobate dielectric film with adjustable dielectric.
所述步骤(5)的基片为ITO玻璃基片或覆有电极的Si基片。The substrate in the step (5) is an ITO glass substrate or a Si substrate covered with electrodes.
本发明公开的PbxNb2O5+x(x=1.05~1.35)铌酸铅介电可调薄膜具有高调谐率和低介电损耗,其介电常数为350~440,介电损耗为0.005~0.0007,500kV/cm偏压下的调谐率为25%~30%,优值≥100,综合性能优于目前研究最广泛的BST薄膜和BZN薄膜;本发明提供的方法具有精确控制薄膜化学组分的优点;本发明的制备工艺流程简单、成本低廉、具有良好的应用前景。The Pb x Nb 2 O 5+x (x=1.05~1.35) lead niobate dielectric adjustable thin film disclosed by the present invention has high tuning rate and low dielectric loss, its dielectric constant is 350~440, and the dielectric loss is 0.005~0.0007, the tuning rate under 500kV/cm bias is 25%~30%, the figure of merit ≥ 100, the overall performance is better than the most widely studied BST film and BZN film at present; the method provided by the invention has the ability to precisely control the film chemical The advantages of the components; the preparation process of the present invention is simple, low in cost and has good application prospects.
具体实施方式 Detailed ways
下面通过具体实施例对本发明做进一步描述,本发明所用原料均为市售分析纯原料。The present invention will be further described by specific examples below, and the raw materials used in the present invention are commercially available analytically pure raw materials.
本发明介电可调的铌酸铅薄膜材料的制备方法,具有如下步骤:The preparation method of the dielectrically adjustable lead niobate film material of the present invention has the following steps:
(1)配制铌的柠檬酸水溶液(1) Preparation of citric acid aqueous solution of niobium
(a)根据PbxNb2O5+x其中x=1.05~1.35的化学计量比称取Nb2O5,将Nb2O5放入氢氟酸中,水浴加热至Nb2O5全部溶解;(a) Weigh Nb 2 O 5 according to the stoichiometric ratio of Pb x Nb 2 O 5+x where x=1.05~1.35, put Nb 2 O 5 into hydrofluoric acid , heat in water bath until Nb 2 O 5 is completely dissolved ;
(b)向上述溶液中加入氨水生成铌酸沉淀;(b) adding ammoniacal liquor to generate niobic acid precipitation in above-mentioned solution;
(c)抽滤洗涤上述沉淀,然后将铌酸加入柠檬酸的水溶液中,得到铌的柠檬酸水溶液,其中铌离子与柠檬酸的摩尔比为1:2~1:6。(c) Wash the above precipitate by suction filtration, then add niobic acid into the aqueous solution of citric acid to obtain an aqueous solution of niobium citric acid, wherein the molar ratio of niobium ion to citric acid is 1:2~1:6.
(2)按PbxNb2O5+x其中x=1.05~1.35的化学计量比称取硝酸铅,加入去离子水中,搅拌至充分溶解,得到硝酸铅的水溶液。(2) Weigh lead nitrate according to the stoichiometric ratio of Pb x Nb 2 O 5+x where x=1.05~1.35, add it into deionized water, stir until fully dissolved, and obtain an aqueous solution of lead nitrate.
(3)将步骤(1)配置的铌的柠檬酸溶液加入步骤(2)配置的液体中,搅拌均匀得铅和铌的柠檬酸水溶液。(3) Add the citric acid solution of niobium prepared in step (1) into the liquid prepared in step (2), and stir evenly to obtain an aqueous solution of citric acid of lead and niobium.
(4)步骤(3)制得的铅和铌的柠檬酸水溶液中加入乙二醇,加热搅拌,得前驱体溶胶,柠檬酸与乙二醇的摩尔为1:1~1:4。(4) Add ethylene glycol to the citric acid aqueous solution of lead and niobium prepared in step (3), heat and stir to obtain a precursor sol, and the molar ratio of citric acid to ethylene glycol is 1:1~1:4.
(5)将步骤(4)配置的前躯体溶胶滴在基片上,用台式匀胶机匀胶,使溶胶均匀地涂覆在基片上,然后在热板上干燥;所述的基片为ITO玻璃基片或覆有电极的Si基片;(5) Drop the precursor sol configured in step (4) on the substrate, and use a desktop homogenizer to evenly coat the sol on the substrate, and then dry it on a hot plate; the substrate is ITO Glass substrate or Si substrate covered with electrodes;
(6)将步骤(5)干燥后的薄膜在500~700℃进行热处理;(6) heat-treating the dried film in step (5) at 500-700°C;
(7)重复步骤(5)、(6)制备多层薄膜;(7) Repeat steps (5) and (6) to prepare multilayer films;
(8)将制备的多层薄膜在500~700℃热处理0.5~2h,得到介电可调的铌酸铅介质薄膜。本发明具体实施例的原料用量关系见表1。(8) heat-treat the prepared multilayer film at 500-700° C. for 0.5-2 hours to obtain a lead niobate dielectric film with adjustable dielectric. The raw material consumption relation of specific embodiment of the present invention is shown in Table 1.
表1Table 1
本发明采用介电性能测试系统测试并计算薄膜的介电常数、介电损耗和调谐率。The invention uses a dielectric performance testing system to test and calculate the dielectric constant, dielectric loss and tuning rate of the film.
本发明的检测设备和检测方法如下:Detection equipment and detection method of the present invention are as follows:
使用与探针台连接的Agilent4285A LCR测试仪测量薄膜电容器的电容量C和介电损耗tanδ(测试频率为1MHz),并通过下面的公式计算介电常数ε:Use the Agilent4285A LCR tester connected to the probe station to measure the capacitance C and dielectric loss tanδ of the film capacitor (the test frequency is 1MHz), and calculate the dielectric constant ε by the following formula:
其中,C为薄膜电容器的电容量,单位为pF;d为薄膜厚度,单位为cm;D为薄膜电容器的介质直径,单位为cm。Among them, C is the capacitance of the film capacitor, the unit is pF; d is the film thickness, the unit is cm; D is the dielectric diameter of the film capacitor, the unit is cm.
通过下面的公式计算调谐率η:The tuning ratio η is calculated by the following formula:
其中,ε0为没有外加偏压时薄膜的介电常数;εE为外加偏压场强E时薄膜的介电常数。Among them, ε 0 is the dielectric constant of the film when there is no external bias; ε E is the dielectric constant of the film when the bias field strength E is applied.
通过下面的公式计算优值FOM:The figure of merit FOM is calculated by the following formula:
FOM=η/tanδFOM=η/tanδ
上述实施例的介电性能测试结果详见表2,介电性能的测试频率为1MHz,外加偏压场强为500kV/cm。The test results of the dielectric properties of the above embodiments are shown in Table 2. The test frequency of the dielectric properties is 1 MHz, and the applied bias field strength is 500 kV/cm.
表2Table 2
本发明并不局限于上述实施例,很多细节的变化时可能的,但这并不因此违背本发明的范围和精神。The present invention is not limited to the above-described embodiments, and changes in many details are possible without departing from the scope and spirit of the present invention.
Claims (2)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2012102615923A CN102775185A (en) | 2012-07-26 | 2012-07-26 | Dielectric adjustable lead niobate thin film material |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2012102615923A CN102775185A (en) | 2012-07-26 | 2012-07-26 | Dielectric adjustable lead niobate thin film material |
Publications (1)
Publication Number | Publication Date |
---|---|
CN102775185A true CN102775185A (en) | 2012-11-14 |
Family
ID=47120323
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2012102615923A Pending CN102775185A (en) | 2012-07-26 | 2012-07-26 | Dielectric adjustable lead niobate thin film material |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN102775185A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107177859A (en) * | 2017-05-18 | 2017-09-19 | 辽宁大学 | Pb3Nb4O13The preparation method of light anode material |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101428856A (en) * | 2008-11-27 | 2009-05-13 | 天津大学 | Process for producing silver tantalate niobate nano-powder |
CN101531528A (en) * | 2009-04-13 | 2009-09-16 | 天津大学 | Method for preparing magnesium niobate microwave ceramic powder on the basis of sol-gel technique |
CN102249307A (en) * | 2011-05-06 | 2011-11-23 | 天津大学 | Preparation method of Bi1.5MgNb1.5O7 (BMN) dielectric film |
-
2012
- 2012-07-26 CN CN2012102615923A patent/CN102775185A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101428856A (en) * | 2008-11-27 | 2009-05-13 | 天津大学 | Process for producing silver tantalate niobate nano-powder |
CN101531528A (en) * | 2009-04-13 | 2009-09-16 | 天津大学 | Method for preparing magnesium niobate microwave ceramic powder on the basis of sol-gel technique |
CN102249307A (en) * | 2011-05-06 | 2011-11-23 | 天津大学 | Preparation method of Bi1.5MgNb1.5O7 (BMN) dielectric film |
Non-Patent Citations (1)
Title |
---|
MEHDI MIRSANEH ET AL.: "High throughput synthesis and characterization of the PbnNb2O5+n (0.5<n<4.1) system on a single chip", 《ACTA MATERIALIA》 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107177859A (en) * | 2017-05-18 | 2017-09-19 | 辽宁大学 | Pb3Nb4O13The preparation method of light anode material |
CN107177859B (en) * | 2017-05-18 | 2019-05-10 | 辽宁大学 | Preparation method of Pb3Nb4O13 photoanode material |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN102249307B (en) | Preparation method of Bi1.5MgNb1.5O7 (BMN) dielectric film | |
Li et al. | Atomic layer engineering of high-κ ferroelectricity in 2D perovskites | |
Xu et al. | Dielectric properties and energy-storage performance of (Na0. 5Bi0. 5) TiO3–SrTiO3 thick films derived from polyvinylpyrrolidone-modified chemical solution | |
CN105753472B (en) | The niobic acid barium potassium base glass ceramics energy storage material of high energy storage density and preparation and application | |
Singh et al. | Effect of annealing atmosphere on leakage and dielectric characteristics of multiferroic gallium ferrite | |
Yang et al. | High energy storage density achieved in Bi3+-Li+ co-doped SrTi0. 99Mn0. 01O3 thin film via ionic pair doping-engineering | |
KR101398553B1 (en) | Niobate dielectric composition and nano sheet thin film using the same | |
CN103426632A (en) | Medium voltage-controlled microwave varactor with coplanar interdigitated electrode and manufacturing method thereof | |
CN103387391B (en) | Preparation method for laminated dielectric thin films containing tantalum/niobium by adopting aqueous solution gel method | |
Puli et al. | Dielectric breakdown of BaO–B2O3–ZnO–[(BaZr0. 2Ti0. 80) O3] 0.85 [(Ba0. 70Ca0. 30) TiO3] 0.15 glass-ceramic composites | |
Wu et al. | Proton conducting zeolite films for low-voltage oxide-based electric-double-layer thin-film transistors and logic gates | |
CN109166730A (en) | A kind of unleaded dielectric film capacitor flexible and preparation method thereof of the wide high energy storage of temperature | |
CN106935398B (en) | A kind of bismuth strontium titanate doping thin film capacitor and preparation method thereof | |
CN108892503A (en) | A kind of high electric card effect thin-film material and preparation method thereof | |
CN101070427A (en) | Method for preparing strontium-barium titanate/polymide dielectric adjustable composite material thick film | |
Sun et al. | Colossal dielectric behavior and dielectric anomalies in Sr 2 TiCrO 6 ceramics | |
CN102775185A (en) | Dielectric adjustable lead niobate thin film material | |
Khalfallaoui et al. | Characterization of doped BST thin films deposited by sol-gel for tunable microwave devices | |
CN103833352B (en) | A kind of preparation method of auto-doping strontium titanate ferroelectric membranc | |
Chung et al. | (Pb, Sr) TiO3 thin films for a ULSI DRAM capacitor prepared by liquid source misted chemical deposition | |
CN104073790A (en) | Preparation method of oriented BMN film | |
KR101495093B1 (en) | Bithmuth niobate dielectric composition having high dielectric permittivity and low dielectric loss | |
CN108492987B (en) | A kind of solid film capacitor with self-healing function and preparation method thereof | |
CN104029432B (en) | The preparation method of BST/BMN/BST multi-layer compound film | |
CN104134541A (en) | Full-transparent film voltage controlled varactor and preparation method thereof |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C12 | Rejection of a patent application after its publication | ||
RJ01 | Rejection of invention patent application after publication |
Application publication date: 20121114 |