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CN102662090A - Automatic position error correction method - Google Patents

Automatic position error correction method Download PDF

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Publication number
CN102662090A
CN102662090A CN2012101216023A CN201210121602A CN102662090A CN 102662090 A CN102662090 A CN 102662090A CN 2012101216023 A CN2012101216023 A CN 2012101216023A CN 201210121602 A CN201210121602 A CN 201210121602A CN 102662090 A CN102662090 A CN 102662090A
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CN
China
Prior art keywords
test
pen
image
measured target
control unit
Prior art date
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Granted
Application number
CN2012101216023A
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Chinese (zh)
Other versions
CN102662090B (en
Inventor
白荣光
生拥宏
周东方
白栋
林竞羽
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HENAN ZHENGTAIXIN INNOVATION BASE CO Ltd
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HENAN ZHENGTAIXIN INNOVATION BASE CO Ltd
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Filing date
Publication date
Application filed by HENAN ZHENGTAIXIN INNOVATION BASE CO Ltd filed Critical HENAN ZHENGTAIXIN INNOVATION BASE CO Ltd
Priority to CN201210121602.3A priority Critical patent/CN102662090B/en
Publication of CN102662090A publication Critical patent/CN102662090A/en
Application granted granted Critical
Publication of CN102662090B publication Critical patent/CN102662090B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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  • Tests Of Electronic Circuits (AREA)

Abstract

The invention discloses an automatic position error correction method; a central control unit controls the moving mechanism of a testing exploratory pen to drive the testing exploratory pen to move to a target test point; when the testing exploratory pen drops, the central control unit can control a camera to take photos, so that the distance errors triangle x and triangle y between a point at which the testing exploratory pen is to drop and a tested target point are automatically calculated and corrected; and the testing exploratory pen drops after correction, so that the testing exploratory pen can accurately drop onto a tested point, and a test result is precise.

Description

A kind of site error automatic correcting method
Technical field
The present invention relates to the error correcting method field, relate in particular to a kind of site error automatic correcting method.
Background technology
At present, the use of electronic product is more and more, and electronic product often need carry out fault diagnosis to circuit board wherein when breaking down.For the one Chinese patent application file of " CN 101806857A " a kind of online fault diagnostic apparatus for circuit board is disclosed like publication number; Include the host computer that is used to carry out online signal Processing and fault diagnosis and be used to the slave computer that the circuit-under-test plate provides desired signal and uploads detecting information, host computer is connected with slave computer employing universal serial bus and communicates by letter.Host computer adopts portable notebook computer; Interior dress fault diagnosis expert system software; The slave computer function comprises generation control and the test data collection and the analysis ratiocination etc. of pumping signal, carries out the fault diagnosis of circuit board or components and parts in conjunction with fault diagnosis expert system.Receive on the interfacing equipment of slave computer when the circuit-under-test plate after; Apply various pumping signals by the PC control slave computer to the circuit-under-test plate; Carry out the collection of response signal then,, start fault diagnosis expert system according to collection result; Localization of fault to replaceable components and parts, is realized the on-line fault diagnosis to electronic devices and components.Can know by foregoing; Present board failure diagnosis all is to visit pen through signal-testing apparatus, signal excitation device, test circuit board is carried out fault diagnosis; But all need artificial use test to visit pen impact point is surveyed, thereby the leg signal of the components and parts on the circuit board is carried out data acquisition.The not only waste of manpower of method that pen is tested is visited in this artificial use test, and occurs mistake easily, and is very inconvenient.In addition, test visit falling of pen a little do not have with the measured target point on identical position, have the appearance of distance error, and the appearance of distance error can cause the out of true as a result of fault diagnosis.
Summary of the invention
The purpose of this invention is to provide a kind of site error automatic correcting method, can make test visit pen and accurately fall the measured target point.
The present invention can be implemented as a kind of site error automatic correcting method, may further comprise the steps:
(1), during the fault diagnosis test development; When pen arrival measured target point is visited in test; Central control unit control camera is to being to take pictures in the scope at center with the measured target point; And automatically the photo of taking is extracted needed characteristics of image, then the characteristics of image that extracts is stored in the central control unit; Repeat said process, until the extraction of the characteristics of image of accomplishing all measured target points;
(2), in the process of fault diagnosis; In the time of near test spy pen moves to measured target point, central control unit control camera is taken pictures to carrying out the scene around the measured target point, and carries out image characteristics extraction to taking pictures automatically; It is right that characteristics of image that extracts and the middle institute of step (1) image stored characteristic are carried out aspect ratio; The difference right according to aspect ratio is calculated distance error Δ x, the Δ y that pen and measured target point are visited in test automatically by central control unit, and the motion that central control unit is visited to test sends round-off error order and carries out error correction; Compensation Δ x, Δ y make test visit pen and accurately move to the measured target point.
Described characteristics of image is components and parts shape, components and parts pin, connecting line shape and the mutual relationship information between them of circuit-under-test plate.
When the present invention drives test and visits pen and move near the target test point through mechanical arm or robot, visit before pen falls when test, central control unit can be controlled camera and take pictures; Automatically calculate test and visit a point that will fall and the distance error Δ x of measured target point; Δ y, and revising automatically, after the correction again drop test visit pen; Guarantee to test the spy pen and accurately fall the measured point, guarantee the accurate of test result.
Description of drawings
Fig. 1 visits the structural representation of pen for motion among the present invention and test;
Fig. 2 is the position view of test spy pen among the present invention with circuit-under-test plate and camera.
Embodiment
Like Fig. 1, shown in Figure 2, the test described in the present invention is visited pen and is driven motion by mechanical arm or robot.When needs were taken pictures, central control unit sends control signal took pictures camera 20, and camera 20 is selected suitable pixel value for use according to the accuracy requirement difference.Camera 20 and test are visited between the pen 4 has tilt angle theta, and the purpose of tilt angle theta is to guarantee that camera 20 can correctly photograph certain limit that impact point is the center and not tested explorations 4 blocked.
The present invention through aspect ratio to, computed range error, carry out the method for error correction, realized that test visits pen 4 and fall measured target point 40 exactly.The concrete grammar step is described below:
(1) during the fault diagnosis test development; When pen arrival measured target point is visited in test; Central control unit control camera is to being to take pictures in the scope at center with the measured target point; And automatically the photo of taking is extracted needed characteristics of image, then the characteristics of image that extracts is stored in the central control unit; Repeat said process, until the extraction of the characteristics of image of accomplishing all measured target points;
(3), in the process of fault diagnosis; In the time of near test spy pen moves to measured target point, central control unit control camera is taken pictures to carrying out the scene around the measured target point, and carries out image characteristics extraction to taking pictures automatically; It is right that characteristics of image that extracts and the middle institute of step (2) image stored characteristic are carried out aspect ratio; The difference right according to aspect ratio is calculated distance error Δ x, the Δ y that pen and measured target point are visited in test automatically by central control unit, and the motion that central control unit is visited to test sends round-off error order and carries out error correction; Compensation Δ x, Δ y make test visit pen and accurately move to the measured target point.
Described characteristics of image is components and parts shape, components and parts pin, connecting line shape and the mutual relationship information between them of circuit-under-test plate.
As shown in Figure 1, be that a kind of (but being not limited only to this kind) test is visited pen 4 by the instance of mechanical arm drive in directions X, Y direction, the motion of Z direction.Mechanical arm constitutes one to motion 22, Z to motion 23 to motion 21, Y by X; X all is fixed with first servomotor 11, second servomotor 12 and three servomotor 13 that are used for drive motion motion to motion 22, Z to the end of motion 23 to motion 21, Y, and central control unit is controlled first servomotor 11, second servomotor 12 and 13 motions of the 3rd servomotor through servo-control system.Camera 20 is installed in Z on motion 23, and camera 20 is connected with central control unit through usb bus, and the image signal output end of camera 20 is connected with the signal input part of central control unit, and central control unit is a computing machine.Wherein first servomotor 11 connects Z to motion 23 through rotating the translation converting means, makes Z drive the spy pen to motion 23 and moves at directions X; Second servomotor 12 connects X to motion 21 through rotating translation device, and X is moved in the Y direction to motion 21; The 3rd servomotor 13 connects card extender 5 through rotating translation device; Visiting a support 3 is installed on the card extender 5; It is fixing by visiting a support 3 that pen 4 is visited in described test, and the probe of visiting pen exposes in the bottom of visiting a support 3, visits pen 4 and move in the Z direction thereby make card extender 5 drive test.Therefore mechanical arm has guaranteed that test spy pen 4 can move on directions X, Y direction, Z direction, and the signal output part that pen 4 is visited in test is connected with signal transmssion line 9.Wherein the rotation translation converting means described in the present embodiment is the device that converts the rotation of servomotor into the straight line translation, adopts ball-screw to accomplish.Is that example describe to motion 21 in the motion of Y direction with X: second servomotor 12 rotates drive Y and is rotated to motion 22 inner ball-screws; Thereby the nut on the drive ball-screw carries out Y to motion; Nut is fixedly connected to motion 21 with X through card extender 10, also carries out Y to motion thereby drive X to motion 21.Z is the same at the motion principle of Z direction at the motion and the card extender 5 of directions X to motion 23, repeats no more at this.

Claims (2)

1. site error automatic correcting method is characterized in that: may further comprise the steps:
(1), in the test development process; When pen arrival measured target point is visited in test; Central control unit control camera is to being to take pictures in the scope at center with the measured target point; And automatically the photo of taking is extracted needed characteristics of image, then the characteristics of image that extracts is stored in the central control unit; Repeat said process, the extraction of the characteristics of image in the scope of accomplishing all measured target points;
(2), in the process of fault diagnosis; In the time of near test spy pen moves to measured target point, central control unit control camera is taken pictures to carrying out the scene around the measured target point, and carries out image characteristics extraction to taking pictures automatically; It is right that characteristics of image that extracts and the middle institute of step (1) image stored characteristic are carried out aspect ratio; The difference right according to aspect ratio is calculated distance error Δ x, the Δ y that pen and measured target point are visited in test automatically by central control unit, and the motion that central control unit is visited to test sends round-off error order and carries out error correction; Compensation Δ x, Δ y make test visit pen and accurately move to the measured target point.
2. site error automatic correcting method according to claim 1 is characterized in that: described characteristics of image is components and parts shape, components and parts pin, connecting line shape and the mutual relationship information between them of circuit-under-test plate.
CN201210121602.3A 2012-04-24 2012-04-24 A kind of site error automatic correcting method Expired - Fee Related CN102662090B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201210121602.3A CN102662090B (en) 2012-04-24 2012-04-24 A kind of site error automatic correcting method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201210121602.3A CN102662090B (en) 2012-04-24 2012-04-24 A kind of site error automatic correcting method

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CN102662090A true CN102662090A (en) 2012-09-12
CN102662090B CN102662090B (en) 2015-08-05

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110686847A (en) * 2019-10-16 2020-01-14 深圳同兴达科技股份有限公司 Automatic steel ball impact testing method

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0592878A2 (en) * 1992-10-15 1994-04-20 Eckhard Dr. Ehlermann Method and device for inspecting probe cards for testing integrated circuits
JP2002122630A (en) * 2000-10-17 2002-04-26 Ando Electric Co Ltd Ic tester adjustment device
CN1555100A (en) * 2003-12-25 2004-12-15 上海交通大学 Ultra-thin space solar cell glue coating and packaging integrated robot
CN1746667A (en) * 2004-09-06 2006-03-15 欧姆龙株式会社 Substrate inspection method and apparatus
CN101568844A (en) * 2006-12-26 2009-10-28 东京毅力科创株式会社 Probe inspecting device, displacement correcting method, information processor, information processing method, and program
CN201514459U (en) * 2009-03-23 2010-06-23 常州新区爱立德电子有限公司 Chip test desk
US20100194418A1 (en) * 2009-02-03 2010-08-05 Seung-Yong Oh Method of correcting a position of a prober
KR20110072584A (en) * 2009-12-23 2011-06-29 양 전자시스템 주식회사 Probe drive with automatic position compensation of probe pins

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0592878A2 (en) * 1992-10-15 1994-04-20 Eckhard Dr. Ehlermann Method and device for inspecting probe cards for testing integrated circuits
JP2002122630A (en) * 2000-10-17 2002-04-26 Ando Electric Co Ltd Ic tester adjustment device
CN1555100A (en) * 2003-12-25 2004-12-15 上海交通大学 Ultra-thin space solar cell glue coating and packaging integrated robot
CN1746667A (en) * 2004-09-06 2006-03-15 欧姆龙株式会社 Substrate inspection method and apparatus
CN101568844A (en) * 2006-12-26 2009-10-28 东京毅力科创株式会社 Probe inspecting device, displacement correcting method, information processor, information processing method, and program
US20100194418A1 (en) * 2009-02-03 2010-08-05 Seung-Yong Oh Method of correcting a position of a prober
CN201514459U (en) * 2009-03-23 2010-06-23 常州新区爱立德电子有限公司 Chip test desk
KR20110072584A (en) * 2009-12-23 2011-06-29 양 전자시스템 주식회사 Probe drive with automatic position compensation of probe pins

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110686847A (en) * 2019-10-16 2020-01-14 深圳同兴达科技股份有限公司 Automatic steel ball impact testing method

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