CN102610708B - How to make light-emitting diodes - Google Patents
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- CN102610708B CN102610708B CN201110030383.3A CN201110030383A CN102610708B CN 102610708 B CN102610708 B CN 102610708B CN 201110030383 A CN201110030383 A CN 201110030383A CN 102610708 B CN102610708 B CN 102610708B
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- 239000011265 semifinished product Substances 0.000 claims abstract description 42
- 238000000034 method Methods 0.000 claims abstract description 41
- 238000004519 manufacturing process Methods 0.000 claims abstract description 32
- 238000005520 cutting process Methods 0.000 claims abstract description 21
- 230000015572 biosynthetic process Effects 0.000 claims abstract description 19
- 239000000126 substance Substances 0.000 claims abstract description 19
- 238000002791 soaking Methods 0.000 claims abstract description 9
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 6
- 239000001301 oxygen Substances 0.000 claims abstract description 6
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 6
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 claims abstract 6
- 239000000243 solution Substances 0.000 claims description 32
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 claims description 15
- 238000002955 isolation Methods 0.000 claims description 14
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 claims description 11
- 229910052751 metal Inorganic materials 0.000 claims description 10
- 239000002184 metal Substances 0.000 claims description 10
- 229910001218 Gallium arsenide Inorganic materials 0.000 claims description 9
- 238000006243 chemical reaction Methods 0.000 claims description 9
- 239000011259 mixed solution Substances 0.000 claims description 7
- 229910052733 gallium Inorganic materials 0.000 claims description 5
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 claims description 4
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 claims description 4
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 4
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 claims description 4
- 229910052782 aluminium Inorganic materials 0.000 claims description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 4
- 229910052785 arsenic Inorganic materials 0.000 claims description 4
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 claims description 4
- 229910000413 arsenic oxide Inorganic materials 0.000 claims description 3
- 229960002594 arsenic trioxide Drugs 0.000 claims description 3
- 239000003795 chemical substances by application Substances 0.000 claims description 3
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 2
- 229910005191 Ga 2 O 3 Inorganic materials 0.000 claims description 2
- 229910021529 ammonia Inorganic materials 0.000 claims description 2
- KTTMEOWBIWLMSE-UHFFFAOYSA-N diarsenic trioxide Chemical compound O1[As](O2)O[As]3O[As]1O[As]2O3 KTTMEOWBIWLMSE-UHFFFAOYSA-N 0.000 claims description 2
- AJNVQOSZGJRYEI-UHFFFAOYSA-N digallium;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Ga+3].[Ga+3] AJNVQOSZGJRYEI-UHFFFAOYSA-N 0.000 claims description 2
- 238000005530 etching Methods 0.000 claims description 2
- 229910001195 gallium oxide Inorganic materials 0.000 claims description 2
- 238000002156 mixing Methods 0.000 claims description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims description 2
- 229920002120 photoresistant polymer Polymers 0.000 claims description 2
- 125000006850 spacer group Chemical group 0.000 claims description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 2
- 238000002161 passivation Methods 0.000 description 21
- FTWRSWRBSVXQPI-UHFFFAOYSA-N alumanylidynearsane;gallanylidynearsane Chemical compound [As]#[Al].[As]#[Ga] FTWRSWRBSVXQPI-UHFFFAOYSA-N 0.000 description 14
- 230000000694 effects Effects 0.000 description 3
- 238000007654 immersion Methods 0.000 description 3
- 239000000047 product Substances 0.000 description 3
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 2
- 235000011114 ammonium hydroxide Nutrition 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 239000012670 alkaline solution Substances 0.000 description 1
- 238000005275 alloying Methods 0.000 description 1
- MDPILPRLPQYEEN-UHFFFAOYSA-N aluminium arsenide Chemical compound [As]#[Al] MDPILPRLPQYEEN-UHFFFAOYSA-N 0.000 description 1
- 238000003486 chemical etching Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 239000011359 shock absorbing material Substances 0.000 description 1
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Abstract
Description
技术领域 technical field
本发明是关于一种发光二极管的制法,特别是指一种能提升发光二极管在高湿度下的寿命的发光二极管的制法。The invention relates to a method for manufacturing a light-emitting diode, in particular to a method for making a light-emitting diode that can increase the lifespan of the light-emitting diode under high humidity.
背景技术 Background technique
由于发光二极管(LED:Light Emitting Diode)具有体积小、耗电低以及寿命长等优点,因此目前已广泛应用于家电、车辆、计算机外设产品、通讯产品以及照明产品等上,发光二极管已然成为新世代的光源,其重要性不言可喻。Due to the advantages of small size, low power consumption and long life, light-emitting diodes (LED: Light Emitting Diode) have been widely used in home appliances, vehicles, computer peripheral products, communication products and lighting products. The importance of the new generation of light sources cannot be overstated.
至于上述发光二极管(俗称:晶粒)的制造,请参阅图1所示,现有的制法包含:前段制程(此为已知,故不另赘述,亦未绘制图式)S101、制作电极S102以及切割S103,换言之,现有的制法是在完成电极的制作之后,接着即进行切割,切割后即形成一颗颗如图2所示的发光二极管成品,该发光二极管1包括一铝砷化镓(AlGaAs)层11、一背面金属(Back side metal)层13以及一位于该铝砷化镓层11和背面金属层13之间的砷化镓(GaAs)层12,且还包括一设置于该铝砷化镓层11表面的电极(Bonding Pad)14。As for the manufacture of the above-mentioned light-emitting diode (commonly known as: crystal grain), please refer to Figure 1. The existing manufacturing method includes: the previous process (this is known, so it will not be described in detail, and the drawing is not drawn) S101, making electrodes S102 and cutting S103, in other words, the existing manufacturing method is to cut after the electrode is made, and after cutting, the finished light-emitting diodes as shown in Figure 2 are formed. The light-emitting diode 1 includes an aluminum arsenic Gallium (AlGaAs) layer 11, a back side metal (Back side metal) layer 13 and a gallium arsenide (GaAs) layer 12 between the aluminum gallium arsenide layer 11 and the back side metal layer 13, and also includes a set An electrode (Bonding Pad) 14 on the surface of the AlGaAs layer 11.
惟,由于中国台湾四面环海,空气中的湿度较高,导致易于造成发光二极管的寿命偏短,更遑论世界上具有较高湿度的国家、地区亦所在多有,在此发光二极管已被高度应用的现在,如何解决发光二极管寿命偏短的问题,早已刻不容缓。However, since Taiwan, China is surrounded by the sea, the humidity in the air is relatively high, which will easily cause the lifespan of LEDs to be short, not to mention that there are many countries and regions with relatively high humidity in the world, where LEDs have been highly used. Now that it is applied, how to solve the problem of short service life of light-emitting diodes has long been urgent.
因此,如何设计出一种可提高发光二极管在高湿度下的寿命的本发明制法,乃为本案发明人所亟欲解决的一大课题。Therefore, how to design a manufacturing method of the present invention that can increase the lifetime of the light-emitting diode under high humidity is a major problem that the inventors of the present case desire to solve.
发明内容 Contents of the invention
本发明的目的之一是在于提供一种可在预定处形成氧化层(即:钝化层)的发光二极管的制法,用以提升发光二极管在高湿度下的寿命。One of the objectives of the present invention is to provide a method for manufacturing a light-emitting diode capable of forming an oxide layer (ie, a passivation layer) at a predetermined location, so as to increase the lifespan of the light-emitting diode under high humidity.
本发明的目的之二则在于提供一种可提升氧化层(即:钝化层)均匀度的发光二极管的制法,用以让发光二极管在高湿度下提升寿命的效果,能因为氧化层(即:钝化层)的越均匀而越好。The second object of the present invention is to provide a method for manufacturing a light-emitting diode that can improve the uniformity of the oxide layer (i.e., the passivation layer), so as to improve the lifespan of the light-emitting diode under high humidity. That is: the more uniform the passivation layer, the better.
为达上述目的,本发明提供一种发光二极管的制法,包含:前段制程、制作电极以及切割步骤,且制作电极后形成半成品,其特征在于:在该制作电极步骤与切割步骤之间进一步包含一化学成膜步骤,该化学成膜步骤包括:提供一溶液,该溶液为碱性且含氧量高;以及,浸泡,将所述半成品浸泡于该溶液中,使半成品本身与溶液产生反应,而于该半成品的预定处形成一层氧化层。由此,乃能提高发光二极管在高湿度下的寿命。In order to achieve the above-mentioned purpose, the present invention provides a method for manufacturing a light-emitting diode, comprising: a front-stage process, making electrodes and cutting steps, and forming a semi-finished product after making electrodes, characterized in that: between the making electrodes step and the cutting step further includes A chemical film forming step, the chemical film forming step includes: providing a solution, the solution is alkaline and has a high oxygen content; and soaking, soaking the semi-finished product in the solution, so that the semi-finished product itself reacts with the solution, And a layer of oxide layer is formed on the predetermined position of the semi-finished product. Therefore, the lifetime of the light emitting diode under high humidity can be improved.
较佳者,本发明发光二极管的制法,进一步包含有均匀手段,该均匀手段是在让所述氧化层的形成能更为均匀。由此,以让发光二极管在高湿度下提升寿命的效果,能因为氧化层的越均匀而越好。Preferably, the manufacturing method of the light emitting diode of the present invention further includes a uniform means, and the uniform means is to make the formation of the oxide layer more uniform. Therefore, the effect of increasing the lifespan of the light-emitting diode under high humidity can be better because the oxide layer is more uniform.
附图说明 Description of drawings
图1为现有制法的流程图。Fig. 1 is the flow chart of existing preparation method.
图2为依据现有制法所制出的发光二极管的结构示意图。FIG. 2 is a schematic structural diagram of a light-emitting diode manufactured according to a conventional manufacturing method.
图3为本发明制法第一实施例的流程图。Fig. 3 is a flowchart of the first embodiment of the method of the present invention.
图4为本发明制法第二实施例的流程图。Fig. 4 is a flow chart of the second embodiment of the method of the present invention.
图5为依据本发明制法所制出的发光二极管的结构示意图。Fig. 5 is a schematic structural view of a light-emitting diode manufactured according to the method of the present invention.
图6为本发明于浸泡时所使用的控制装置的结构示意图。Fig. 6 is a schematic structural view of the control device used in soaking according to the present invention.
图7为本发明制法于隔离控制时的示意图。Fig. 7 is a schematic diagram of the method of the present invention under isolation control.
主要元件符号说明Description of main component symbols
1 发光二极管1 LED
11 铝砷化镓层 12 砷化镓层11 AlGaAs layer 12 GaAs layer
13 背面金属层 14 电极13 back metal layer 14 electrodes
2 发光二极管2 LEDs
21 铝砷化镓层 22 砷化镓层21 AlGaAs layer 22 GaAs layer
23 背面金属层 24 电极23 back metal layer 24 electrodes
25 钝化层 26 沟槽25 Passivation layer 26 Groove
27 砷化镓27 gallium arsenide
3 控制装置3 control device
31 基座 32 斜架31 Base 32 Inclined frame
33 容器 331 溶液液面 34 摆放制具33 container 331 solution liquid level 34 placing tool
4 隔离剂4 release agent
S301 前段制程S301 Front-end process
S303 制作电极S303 Making electrodes
S305 化学成膜S305 chemical film formation
S307 切割S307 cutting
S401 前段制程S401 Front-end process
S403 制作电极S403 Making electrodes
S405 均匀手段S405 Uniform means
S407 化学成膜S407 chemical film formation
S409 切割S409 cutting
具体实施方式 Detailed ways
为了能够更进一步了解本发明的特征、特点和技术内容,请参阅以下有关本发明的详细说明与附图,惟所附图式仅提供参考与说明用,非用以限制本发明。In order to further understand the features, features and technical content of the present invention, please refer to the following detailed description and accompanying drawings of the present invention, but the accompanying drawings are provided for reference and illustration only, and are not intended to limit the present invention.
本发明提供一种发光二极管的制法,主要是在发光二极管上形成一混合的氧化层,此层即标示为钝化(Passivation)层,以可提高发光二极管在高湿度下的寿命,而且还能提升发光二极管的轴向亮度。如图3、图4所示是在分别揭示本发明制法的第一、二实施例。The invention provides a method for making a light-emitting diode, mainly forming a mixed oxide layer on the light-emitting diode, which is marked as a passivation (Passivation) layer, so as to improve the life of the light-emitting diode under high humidity, and also The axial brightness of the light-emitting diode can be improved. As shown in Fig. 3 and Fig. 4, the first and second embodiments of the method of the present invention are disclosed respectively.
<第一实施例><First embodiment>
请参阅图3、图5所示的本发明第一实施例,本发明制法包含:前段制程(例如:黄光、化学蚀刻或清洗、蒸镀以及合金等)S301、制作电极S303以及切割步骤S307,且制成如图5所示的电极24后形成半成品,本发明的特征则在于:在该制作电极S303与切割S307两步骤之间进一步包含一化学成膜S305步骤,该化学成膜S305步骤包括:Please refer to the first embodiment of the present invention shown in Fig. 3 and Fig. 5. The method of the present invention includes: front-end process (for example: yellow light, chemical etching or cleaning, evaporation and alloying, etc.) S301, making electrodes S303 and cutting steps S307, and after making the electrode 24 as shown in Figure 5 to form a semi-finished product, the feature of the present invention is: a chemical film forming S305 step is further included between the two steps of making the electrode S303 and cutting S307, the chemical film forming S305 Steps include:
提供一溶液,该溶液为一碱性且含氧量高(例如:以双氧水H2O2计大于28%的含氧量,即属于高含氧量)的溶液;以及,Provide a solution, the solution is an alkaline solution with a high oxygen content (for example: an oxygen content greater than 28% based on hydrogen peroxide H 2 O 2 , which is a high oxygen content solution); and,
浸泡,将所述半成品浸泡于该溶液中,使半成品本身与溶液产生反应,而于该半成品的预定处形成一层氧化层,此一氧化层即标示为钝化层25。Soaking means immersing the semi-finished product in the solution so that the semi-finished product itself reacts with the solution to form an oxide layer at the predetermined position of the semi-finished product. This oxide layer is marked as a passivation layer 25 .
其中,该发光二极管2的半成品包括了铝砷化镓层21和砷化镓层22,因此,该半成品本身乃具有铝、镓和砷等材质,该铝、镓和砷是与所述溶液反应而形成所述的氧化层(铝镓砷氧化层),此一氧化层即标示为钝化层25,而该半成品本身与溶液的化学反应式为:Wherein, the semi-finished product of the light-emitting diode 2 includes an aluminum gallium arsenide layer 21 and a gallium arsenide layer 22, therefore, the semi-finished product itself has materials such as aluminum, gallium and arsenic, and the aluminum, gallium and arsenic react with the solution And form described oxide layer (aluminium-gallium-arsenic oxide layer), this oxide layer promptly marks as passivation layer 25, and the chemical reaction formula of this semi-finished product itself and solution is:
2Al3++6OH-→2Al2(OH)3→Al2O3+3H2 2Al 3+ +6OH - →2Al 2 (OH) 3 →Al 2 O 3 +3H 2
2Ga3++6OH-→2Ga2(OH)3→Ga2O3+3H2 2Ga 3+ +6OH - →2Ga 2 (OH) 3 →Ga 2 O 3 +3H 2
2As3++6OH-→2As2(OH)3→As2O3+3H2 2As 3+ +6OH - →2As 2 (OH) 3 →As 2 O 3 +3H 2
,用以得到氧化铝、氧化镓和氧化砷而混合成所述的氧化层,此一氧化层即标示为钝化层25。该溶液为氨水和双氧水的混合溶液(如下):, used to obtain aluminum oxide, gallium oxide and arsenic oxide mixed into the oxide layer, this oxide layer is marked as the passivation layer 25 . The solution is a mixed solution of ammonia and hydrogen peroxide (as follows):
NH4OH:H2O2 NH 4 OH:H 2 O 2
,而由于氨水相对于双氧水的比例过高会对发光二极管2产生破坏,但若比例过低又相对增加了制程时间,因此,该混合溶液中的氨水和双氧水的比例为1∶50~1∶150。, and because the ratio of ammonia water to hydrogen peroxide is too high, it will damage the light-emitting diode 2, but if the ratio is too low, the process time will be relatively increased. Therefore, the ratio of ammonia water to hydrogen peroxide in the mixed solution is 1:50~1: 150.
请参阅图5所示,依本发明制法所制出的发光二极管2包括一铝砷化镓(AlGaAs)层21、一背面金属(Back side metal)层23以及一位于该铝砷化镓层2l和背面金属层23之间的砷化镓(GaAs)层22,且还包括一设置于该铝砷化镓层21表面的电极(Bonding Pad)24以及一亦形成于该铝砷化镓层2l表面的钝化层25。Please refer to Fig. 5, the light-emitting diode 2 manufactured by the method of the present invention includes an aluminum gallium arsenide (AlGaAs) layer 21, a back side metal (Back side metal) layer 23 and a layer located on the aluminum gallium arsenide layer. 21 and the gallium arsenide (GaAs) layer 22 between the back metal layer 23, and also includes an electrode (Bonding Pad) 24 arranged on the surface of the aluminum gallium arsenide layer 21 and an electrode (Bonding Pad) 24 also formed on the aluminum gallium arsenide layer Passivation layer 25 on the surface of 2l.
<第二实施例><Second Embodiment>
由于所形成的钝化层25是越均匀效果越好,因此,请参阅图4、图5所示,本发明第二实施例的发光二极管的制法是较第一实施例还多了均匀手段S405,亦即本发明第二实施例的制法包含:前段制程S401、制作电极S403、均匀手段S405、化学成膜S407以及切割步骤S409。Since the formed passivation layer 25 is more uniform, the effect is better. Therefore, please refer to FIG. 4 and FIG. S405, that is, the manufacturing method of the second embodiment of the present invention includes: front-end process S401, electrode fabrication S403, uniform means S405, chemical film formation S407, and cutting step S409.
该均匀手段S405包括:表面氧化物的移除、低温控制、角度控制、浸泡控制以及隔离控制。The uniform means S405 includes: surface oxide removal, low temperature control, angle control, immersion control and isolation control.
其中的表面氧化物的移除:是在移除该半成品的预定处表面上的氧化物,较佳者,是在化学成膜前:以稀释氢氟酸(HF:H2O)的混合溶液来处理所述半成品的表面,或以硫酸、双氧水和水(H2SO4∶H2O2∶H2O)采3∶1∶1的比例混合形成的混合溶液来处理所述半成品的表面,所述的氧化层(钝化层25)即形成于此一表面。The removal of the surface oxide: remove the oxide on the surface of the semi-finished product, preferably before chemical film formation: dilute the mixed solution of hydrofluoric acid (HF:H 2 O) to treat the surface of the semi-finished product, or use a mixed solution formed by mixing sulfuric acid, hydrogen peroxide and water (H 2 SO 4 : H 2 O 2 :H 2 O) in a ratio of 3:1:1 to treat the surface of the semi-finished product , the oxide layer (passivation layer 25) is formed on this surface.
其中的低温控制:由于高温成膜(即:形成钝化层25)的均匀性差,而低温成膜则可得到较佳的均匀性,且对于钝化层25的厚度的管控亦较容易,因此,所述的低温控制是将温度控制在5℃以上、25℃以下。Among them, low temperature control: due to the poor uniformity of high temperature film formation (that is: formation of passivation layer 25), and low temperature film formation can obtain better uniformity, and it is also easier to control the thickness of passivation layer 25, so , the low temperature control is to control the temperature above 5°C and below 25°C.
其中的角度控制和浸泡控制:由于成膜(即:形成钝化层25)时,所述溶液会产生气泡,气泡则会影响成膜的均匀性,因此需给予一角度以避免因为气泡而造成不均匀,该角度控制是在控制该半成品的摆放角度须与地平面间存在有5~35度的倾斜角度。至于浸泡控制,则在控制溶液须完全盖过所述的半成品。请参阅图6所示的控制装置3,其包括一基座31、设于该基座31上的斜架32、承载于该斜架32上的容器33以及收容于该容器33内的摆放制具34,所述斜架32具有5~35度的倾斜角度,发光二极管的半成品摆放于该摆放制具34上,而容器33内则还收容有所述的溶液,并使溶液液面331高于该半成品,换言之,通过此一控制装置3能同时达到角度控制和浸泡控制。至于基座31,由于成膜时须静置且避免震动(否则将易于造成钝化层25的脱落),因此该基座31是以吸震材质为佳。Angle control and immersion control wherein: when forming a film (i.e. forming a passivation layer 25), the solution will generate air bubbles, which will affect the uniformity of film formation, so it is necessary to give an angle to avoid the formation of bubbles caused by air bubbles. Uneven, the angle control is to control the placement angle of the semi-finished product to have an inclination angle of 5-35 degrees from the ground plane. As for immersion control, the control solution must completely cover the semi-finished product. Please refer to the control device 3 shown in Figure 6, which includes a base 31, a slant frame 32 mounted on the pedestal 31, a container 33 carried on the slant frame 32, and a container housed in the container 33. Tool 34, the inclined frame 32 has an inclination angle of 5-35 degrees, the semi-finished products of light emitting diodes are placed on the tool 34, and the solution is also contained in the container 33, and the solution is liquid The surface 331 is higher than the semi-finished product, in other words, angle control and soaking control can be achieved at the same time through this control device 3 . As for the base 31 , it is better to use a shock-absorbing material for the base 31 because it must be left still and avoid vibrations during film formation (otherwise the passivation layer 25 will easily fall off).
其中的隔离控制:假设该半成品的预定处与所述溶液之间具有第一反应速率,而该半成品的其它处与溶液之间具有第二反应速率,则该隔离控制必须在该半成品的预定处与其它处之间予以隔离,因为不同的反应速率,将会使所形成的钝化层25不均匀。如本发明实施例所示,由于部分制程会造成砷化镓层22裸露,且砷化镓层22与溶液的反应速率远大于表面铝砷化镓层21,故此二者之间必须隔离才能增加均匀性(当然,必要时所述的隔离控制亦可用来保护电极)。请参阅图7所示,该隔离控制则包括:Isolation control among them: Assuming that there is a first reaction rate between the predetermined place of the semi-finished product and the solution, and a second reaction rate between other places of the semi-finished product and the solution, the isolation control must be at the predetermined place of the semi-finished product The passivation layer 25 is formed unevenly because of different reaction rates. As shown in the embodiment of the present invention, because part of the process will cause the gallium arsenide layer 22 to be exposed, and the reaction rate between the gallium arsenide layer 22 and the solution is much higher than that of the surface aluminum gallium arsenide layer 21, so the two must be isolated to increase Uniformity (of course, the isolation control described above can also be used to protect the electrodes if necessary). Please refer to Figure 7, the isolation control includes:
于该铝砷化镓层21的表面形成有多道沟槽26;以及A plurality of grooves 26 are formed on the surface of the AlGaAs layer 21; and
于各该沟槽26内填入隔离剂(例如:光阻等)4而做为隔离之用。由此,本发明制法于隔离控制之后接着进行化学成膜S407步骤而形成钝化层25,于化学成膜S407步骤之后则须去除所填入的该些隔离剂4,以利于本发明制法的最后步骤:切割S409的进行,换言之,所述切割S409是依据该些沟槽26来做为切割的预定切割线,切割后即形成在图7中所示的一颗颗的发光二极管2。其中,所述的该这些沟槽26是通过半切或平台蚀刻来形成;所述的该些沟槽26的深度是及于该砷化镓层22。An isolator (for example: photoresist, etc.) 4 is filled in each of the trenches 26 for isolation. Thus, the method of the present invention carries out the step of chemical film formation S407 to form the passivation layer 25 after the isolation control. After the step of chemical film formation S407, the spacers 4 filled in must be removed to facilitate the production of the present invention. The final step of the method: the cutting S409, in other words, the cutting S409 is based on these grooves 26 as the predetermined cutting line for cutting, and after cutting, the individual light-emitting diodes 2 shown in FIG. 7 are formed. . Wherein, the grooves 26 are formed by half-cutting or mesa etching; the depth of the grooves 26 reaches the GaAs layer 22 .
综上所述,本发明发光二极管的制法的特点在于:通过在铝砷化镓层21的表面形成有混合的氧化层,且此一氧化层标示为钝化层25,用以提高发光二极管2在高湿度下的寿命,且所形成的钝化层25越均匀,则提高发光二极管2寿命的效果越好,甚至于还能提升发光二极管2的轴向亮度;再者,依据本发明制法所形成的钝化层25,还具有成本低的特点。To sum up, the characteristic of the manufacturing method of the light-emitting diode of the present invention is that a mixed oxide layer is formed on the surface of the aluminum gallium arsenide layer 21, and this oxide layer is marked as a passivation layer 25 to improve the performance of the light-emitting diode. 2 life under high humidity, and the more uniform the formed passivation layer 25 is, the better the effect of improving the life of the light emitting diode 2 is, and even the axial brightness of the light emitting diode 2 can be improved; moreover, according to the present invention The passivation layer 25 formed by the method also has the characteristics of low cost.
以上所述,仅为本发明的较佳可行实施例而已,非因此即局限本发明的专利范围,举凡运用本发明说明书及图式内容所为的等效结构变化,均理同包含于本发明的权利范围内,合予陈明。The above is only a preferred feasible embodiment of the present invention, and does not limit the patent scope of the present invention. All equivalent structural changes made by using the description and drawings of the present invention are all included in the present invention. Within the scope of rights, I agree with Chen Ming.
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US5214306A (en) * | 1991-01-29 | 1993-05-25 | Sanyo Electric Co., Ltd. | Light emitting diode |
EP0645829A1 (en) * | 1993-09-24 | 1995-03-29 | Shin-Etsu Handotai Company Limited | A method for manufacturing a semiconductor light emitting device |
US6197609B1 (en) * | 1998-09-07 | 2001-03-06 | Rohm Co., Ltd. | Method for manufacturing semiconductor light emitting device |
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US5214306A (en) * | 1991-01-29 | 1993-05-25 | Sanyo Electric Co., Ltd. | Light emitting diode |
EP0645829A1 (en) * | 1993-09-24 | 1995-03-29 | Shin-Etsu Handotai Company Limited | A method for manufacturing a semiconductor light emitting device |
US6197609B1 (en) * | 1998-09-07 | 2001-03-06 | Rohm Co., Ltd. | Method for manufacturing semiconductor light emitting device |
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