CN102609340B - 测试数据整理系统及方法 - Google Patents
测试数据整理系统及方法 Download PDFInfo
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- CN102609340B CN102609340B CN201110027360.7A CN201110027360A CN102609340B CN 102609340 B CN102609340 B CN 102609340B CN 201110027360 A CN201110027360 A CN 201110027360A CN 102609340 B CN102609340 B CN 102609340B
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Abstract
Description
主机 | 1 |
显示设备 | 2 |
硬盘 | 10 |
插槽 | 12 |
处理器 | 14 |
存储单元 | 16 |
测试数据整理系统 | 160 |
测试模块 | 1600 |
设置模块 | 1602 |
提示模块 | 1604 |
数据载入模块 | 1606 |
数据整理模块 | 1608 |
数据存储模块 | 1610 |
Claims (3)
Priority Applications (1)
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CN201110027360.7A CN102609340B (zh) | 2011-01-25 | 2011-01-25 | 测试数据整理系统及方法 |
Applications Claiming Priority (1)
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CN201110027360.7A CN102609340B (zh) | 2011-01-25 | 2011-01-25 | 测试数据整理系统及方法 |
Publications (2)
Publication Number | Publication Date |
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CN102609340A CN102609340A (zh) | 2012-07-25 |
CN102609340B true CN102609340B (zh) | 2016-12-07 |
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CN201110027360.7A Active CN102609340B (zh) | 2011-01-25 | 2011-01-25 | 测试数据整理系统及方法 |
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CN (1) | CN102609340B (zh) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN112540881B (zh) * | 2019-09-20 | 2023-11-14 | 深圳宏芯宇电子股份有限公司 | 存储装置测试管理方法以及存储装置测试管理系统 |
CN112905440B (zh) * | 2019-12-04 | 2023-11-14 | 泰科电子(上海)有限公司 | 人工智能质检系统的测试模块和测试方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1896963A (zh) * | 2005-07-11 | 2007-01-17 | 英业达股份有限公司 | 硬盘装置损坏监测方法及系统 |
CN101030159A (zh) * | 2006-02-28 | 2007-09-05 | 环达电脑(上海)有限公司 | 用于测试主板插槽的设备及系统 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH1131380A (ja) * | 1997-07-10 | 1999-02-02 | Ekisupaato Magnetics Kk | Cd−rの検査装置 |
TW561263B (en) * | 2001-03-10 | 2003-11-11 | Samsung Electronics Co Ltd | Parallel test board used in testing semiconductor memory devices |
DE10124923B4 (de) * | 2001-05-21 | 2014-02-06 | Qimonda Ag | Testverfahren zum Testen eines Datenspeichers und Datenspeicher mit integrierter Testdatenkompressionsschaltung |
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Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1896963A (zh) * | 2005-07-11 | 2007-01-17 | 英业达股份有限公司 | 硬盘装置损坏监测方法及系统 |
CN101030159A (zh) * | 2006-02-28 | 2007-09-05 | 环达电脑(上海)有限公司 | 用于测试主板插槽的设备及系统 |
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CN102609340A (zh) | 2012-07-25 |
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Effective date of registration: 20160601 Address after: 518000 Guangdong Province, Shenzhen New District of Longhua City, Dalang street, Hua Sheng Lu Yong Jingxuan commercial building 1608 Applicant after: Jinyang Shenzhen sea Network Intelligent Technology Co., Ltd. Address before: 518109 Guangdong province Shenzhen city Longhua District Dragon Road No. 83 wing group building 11 floor Applicant before: SCIENBIZIP CONSULTING (SHEN ZHEN) CO., LTD. |
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Inventor after: Chen Haibin Inventor before: Lin Shenghan |
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Effective date of registration: 20161031 Address after: 100095 Beijing City, Haidian District Zhongguancun environmental protection park P.Tricuspidata Road No. 5 Building No. 3 hospital Baizhuo building Applicant after: BYZORO NETWORK LTD. Address before: 518000 Guangdong Province, Shenzhen New District of Longhua City, Dalang street, Hua Sheng Lu Yong Jingxuan commercial building 1608 Applicant before: Jinyang Shenzhen sea Network Intelligent Technology Co., Ltd. |
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Denomination of invention: Test data cleansing system and method Effective date of registration: 20180517 Granted publication date: 20161207 Pledgee: Huaxia Bank Beijing branch Wanliu Limited by Share Ltd Pledgor: BYZORO NETWORK LTD. Registration number: 2018990000370 |
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Date of cancellation: 20190715 Granted publication date: 20161207 Pledgee: Huaxia Bank Beijing branch Wanliu Limited by Share Ltd Pledgor: BYZORO NETWORK LTD. Registration number: 2018990000370 |