[go: up one dir, main page]

CN102419213A - Hartmann wavefront sensor based on diffraction grating arrays - Google Patents

Hartmann wavefront sensor based on diffraction grating arrays Download PDF

Info

Publication number
CN102419213A
CN102419213A CN2011104301292A CN201110430129A CN102419213A CN 102419213 A CN102419213 A CN 102419213A CN 2011104301292 A CN2011104301292 A CN 2011104301292A CN 201110430129 A CN201110430129 A CN 201110430129A CN 102419213 A CN102419213 A CN 102419213A
Authority
CN
China
Prior art keywords
array
diffraction gratings
gratings
fourier transform
transform lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2011104301292A
Other languages
Chinese (zh)
Inventor
冯国英
杜永兆
李洪儒
周寿桓
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sichuan University
Original Assignee
Sichuan University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sichuan University filed Critical Sichuan University
Priority to CN2011104301292A priority Critical patent/CN102419213A/en
Publication of CN102419213A publication Critical patent/CN102419213A/en
Pending legal-status Critical Current

Links

Images

Landscapes

  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

本发明涉及一种基于衍射光栅阵列的哈特曼波前传感器。该传感器包括光学匹配系统、第一和第二傅立叶透镜、CCD1和CCD2探测器;还包括分光镜、第一衍射光栅阵列和第二衍射光栅阵列。第一和第二衍射光栅阵列均由变空间频率的子光栅紧密排列组成,并分别与紧贴前面或后面的第一和第二傅立叶透镜耦合实现波前孔径分割;通过选取子光栅的衍射级数控制各子波前孔径聚焦光斑在CCD探测器的动态范围,以达到高精度条件下实现调整哈特曼波前传感器测量动态范围目的。本发明克服了现有哈特曼中测量精度与动态范围之间不可调和的矛盾问题;且结构简单、性能稳定、应用性强;适用于光学加工检测、各类高功率激光波前相位和光束质量检测等领域。

Figure 201110430129

The invention relates to a Hartmann wavefront sensor based on a diffraction grating array. The sensor includes an optical matching system, first and second Fourier lenses, CCD1 and CCD2 detectors; and also includes a beam splitter, a first diffraction grating array and a second diffraction grating array. Both the first and second diffraction grating arrays are composed of closely arranged sub-gratings of variable spatial frequency, and are respectively coupled with the first and second Fourier lenses close to the front or back to realize wavefront aperture division; by selecting the diffraction order of the sub-gratings The number controls the dynamic range of each sub-wavefront aperture focusing spot on the CCD detector to achieve the purpose of adjusting the dynamic range of the Hartmann wavefront sensor measurement under high-precision conditions. The invention overcomes the irreconcilable contradiction between measurement accuracy and dynamic range in the existing Hartmann; and has simple structure, stable performance and strong applicability; it is suitable for optical processing detection, various high-power laser wavefront phases and light beams Quality testing and other fields.

Figure 201110430129

Description

Hartmann wave front sensor based on array of diffraction gratings
Technical field
The present invention relates to the dynamic Wavefront sensor of a kind of optics, particularly a kind of high precision and the adjustable Hartmann wave front sensor of measurement dynamic range based on array of diffraction gratings belong to the optical detection field.
Background technology
Hartmann wave front sensor is the dynamic wavefront detecting instrument of a kind of effective optics.It is widely used in the wave front aberration and the beam quality comprehensive detection of high power laser light, high recurrent frequency pulse laser, particularly among ADAPTIVE OPTICS SYSTEMS.It adopts the calibration of desired reference wavefront in advance; And do not need reference light wave when measuring at the scene; So do not have wavefront interferometer such high to environment requirement; Therefore it is for high power laser system, and especially the Real-time and Dynamic Detection of high recurrent frequency pulse laser distorted wavefront aberration is a highly effective instrument.The Hartmann wave front sensor its working principles is to utilize wavefront aperture segmentation element and focusing optical element that incident wavefront is divided into the wavelet front aperture, like Shack-Hartmann's array, and it is focused on the photosensitive target surface of photodetector; Or through optical imaging system the focal plane hot spot of each wavelet front aperture is imaged in the photosensitive target surface of photodetector; Form the hot spot lattice array; Through computing machine the facula information that photodetector receives is handled at last; Calculate the wavelet front aperture and assemble the center of gravity and the side-play amount of demarcation center of gravity on x, y direction of luminous point; The wavefront slope information of trying to achieve each wavelet front aperture by the focal length and the side-play amount size of wavelet front aperture is again distributed by wavefront slope signal reconstruct testing laser Beam Wave-Front at last.
Traditional Hartmann wave front sensor adopts sub-array of apertures of lenticule and CCD photodetector fixed coupling structure usually.Chinese invention patent, its Granted publication CN11189774C disclose a kind of Hartmann's optics Wavefront sensor, are structure noted earlier, and it is made up of through the mechanical system fixed coupling sub-array of apertures of lenticule and ccd detector together.But the spatial resolution of this Hartmann wave front sensor is confirmed by the sub-aperture number of microlens array; Its defective is: key parameters such as its measuring accuracy, spatial resolution and measurement dynamic range can only be unique definite by Hartmann's structural parameters, and can not adjust accordingly according to the needs of measuring.
And detect in the application at the optical measurement and the laser beam quality of reality; Requirement to Hartmann wave front sensor not only will have big measurement dynamic range; And high measuring accuracy to be arranged; Adapting to different optical component side shape error change amplitude, or to adapt to the dissimilar laser beam wave front aberrations and the detection of beam quality.Like Chinese patent number is the patent of ZL 02123756.5; A kind of dynamic range and adjustable Hartmann wave front sensor of measuring accuracy measured disclosed; Front or the back of cutting apart the array of taking a sample on the corrugated; Or the conjugate position of cutting apart the array of taking a sample with the corrugated in the optical match system add to be measured sub-aperture gating control element; The gating that leads to the photon aperture through the sampling in the sub-aperture of control survey is controlled the sampling period that the array of taking a sample is cut apart on the corrugated, to reach the purpose of the measurement dynamic range of adjusting the Hartmann.The defective of this patent is: measure sub-aperture gating control element and make that not only the structure of Hartmann wave front sensor is complicated more; And control the sampling period that the array of taking a sample is cut apart on the corrugated through the gating in the sub-aperture of control survey; When improving Hartmann wave front sensor measurement dynamic range, also reduced its measuring accuracy.Document is arranged: Large-dynamic-range Shack-Hartmann wavefront sensor for highly aberrated eyes. (Journal of Biomedical Optics again; Vol.11 (3): 030502-1-3030502-3; Author: Geunyoung Yoon; Seth Pantanelli; Lana J.Nagy) propose to measure dynamic range to improve the Hartmann, but but it has reduced the measuring accuracy of Hartmann wave front sensor when improving the measurement dynamic range through add before a controllable logical photomask in the wavefront division aperture.Also has document: Measurement and compensation of optical aberrations using a single spatial light modulator. (OPTICS EXPRESS; Vol.15; No.23, pp.15287-15292, author: Justo Arines; Vicente Dur á n; Zbigniew Jaroszewicz etc.) propose through before cutting apart the sub-aperture of wavefront, adding a LCD space light modulator realizing movably mask function, thereby improve Hartmann's measurement dynamic range, but this practice faces the defective that reduces the Hartmann wave front sensor measuring accuracy equally.
Summary of the invention
The object of the invention is just in order to overcome in the existing Hartmann wave front sensor; It is measured between dynamic range and the measuring accuracy and has the problem of contradiction, and provide a kind of simple in structure, application is strong with adaptability, can adjust the Hartmann wave front sensor that the while can keep high measurement accuracy based on the measurement dynamic range of array of diffraction gratings.
Basic design philosophy of the present invention is: design the adjustable high precision Hartmann wave front sensor of a kind of measurement dynamic range based on array of diffraction gratings.This Hartmann wave front sensor comprises optical match system, spectroscope, wavefront aperture segmentation element first array of diffraction gratings and second array of diffraction gratings, first fourier transform lens and second fourier transform lens, CCD1 detector and CCD2 detector.Described two array of diffraction gratings closely rearrange by the sub-gratings that becomes spatial frequency, and promptly the grating spatial frequency of the sub-gratings of the change spatial frequency of two array of diffraction gratings on diagonal is according to 1,2; 3...N; Perhaps N, N-1, the rule alternation of N-2...1; And remaining grating spatial frequency that becomes the sub-gratings of spatial frequency distributes about its any diagonal rotational symmetry.First array of diffraction gratings and second array of diffraction gratings realize the wavefront aperture segmentation with first fourier transform lens and the coupling of second fourier transform lens that front or back are close to respectively; Choose said two array of diffraction gratings neutron grating diffration progression through control and control the dynamic range of the focal beam spot of each wavelet front aperture at two ccd detector photosensitive target surfaces; Keeping under the high-acruracy survey condition to reach, realizing the purpose of the measurement dynamic range of adjustment Hartmann wave front sensor simultaneously.
For realizing above-mentioned purpose of the present invention, the technical scheme that the present invention adopts following technical measures to constitute realizes.
A kind of Hartmann wave front sensor based on array of diffraction gratings of the present invention comprises optical match system, CCD1 detector and CCD2 detector, first fourier transform lens and second fourier transform lens; It is characterized in that adding after also being included in the optical match system spectroscope that is used for beam split; In spectroscope transmission plane, the first fourier transform lens front or back; And be close to first fourier transform lens and add wavefront aperture segmentation element first array of diffraction gratings; In spectroscope reflecting surface, the second fourier transform lens front or back, and be close to second fourier transform lens and add wavefront aperture segmentation element second array of diffraction gratings; Array of diffraction gratings and fourier transform lens coupling realize the wavefront aperture segmentation; Said spectroscope is divided into two bundles with testing laser, and a branch of through forming the focal beam spot array behind first array of diffraction gratings and first fourier transform lens, the focal beam spot array is positioned at the CCD1 detector collection at place, the first fourier transform lens focal plane; Another bundle is through forming the focal beam spot array behind second array of diffraction gratings and second fourier transform lens, the focal beam spot array is positioned at the CCD2 detector collection at place, the second fourier transform lens focal plane; After CCD1 detector and CCD2 detector obtain the slope information on the testing laser wavefront orthogonal directions respectively,, can obtain the Global Information of testing laser wavefront by just restructural testing laser wavefront distribution situation of the slope information on the orthogonal directions.
In the technique scheme, said first array of diffraction gratings and second array of diffraction gratings are closely to be rearranged by the sub-gratings that becomes spatial frequency, and they realize the wavefront aperture segmentation with first fourier transform lens and the second fourier transform lens close-coupled respectively; Can control the measurement dynamic range of each wavelet front aperture focal beam spot through the diffraction progression of choosing sub-gratings, to reach the purpose that can keep Hartmann's high-acruracy survey when the adjustment Hartmann wave front sensor is measured dynamic range again at CCD1 detector and CCD2 detector photosensitive target surface.
In the technique scheme; The grating spatial frequency of the change spatial frequency sub-gratings on said first array of diffraction gratings distributes about its any diagonal rotational symmetry, and the grating spatial frequency of the sub-gratings on the said diagonal is according to 1,2; 3...N; Perhaps N, N-1, the rule alternation of N-2...1.
In the technique scheme; The grating spatial frequency distribution of the grating spatial frequency of the change spatial frequency sub-gratings on said second array of diffraction gratings and the change spatial frequency sub-gratings on first array of diffraction gratings is identical, but their placement location is vertical each other.
In the technique scheme, the sub-gratings structure of the change spatial frequency of described first array of diffraction gratings and second array of diffraction gratings can adopt the amplitude type diffraction grating, or adopts the phase type diffraction grating.
In the technique scheme, the sub-gratings structure of the change spatial frequency of described first array of diffraction gratings and second array of diffraction gratings can adopt the phase type diffraction grating of two-dimentional serrate microprism, perhaps adopts LCD space light modulator.
In the technique scheme, described spectroscope can be dull and stereotyped spectroscope, perhaps is Amici prism.
In the technique scheme, the measuring accuracy of said Hartmann wave front sensor is confirmed by the sub-gratings aperture number of first array of diffraction gratings and second array of diffraction gratings.
When Hartmann wave front sensor according to the invention was n when the diffraction progression of choosing sub-gratings, the measurement dynamic range of Hartmann wave front sensor enlarged D nDoubly, shown in (1):
D n = n cos θ 1 cos θ n - - - ( 1 )
Wherein n is the order of diffraction of the sub-gratings of grating array; θ 1Be first order angle of diffraction; θ nIt is n order diffraction angle.
The present invention compared with prior art has following characteristics and useful technique effect:
1, the disclosed Hartmann wave front sensor of the present invention based on array of diffraction gratings; Because its wavefront aperture segmentation element-array of diffraction gratings closely rearranges by becoming the spatial frequency sub-gratings; And realize the Beam Wave-Front aperture segmentation with the fourier transform lens close-coupled; Wavelet front aperture light beam focuses on the photosensitive target surface of ccd detector through fourier transform lens, has overcome the focal length inhomogeneous influence that the Hartmann wave front sensor measuring accuracy is produced in microlens array lenticule unit in the prior art.
2, the disclosed Hartmann wave front sensor of the present invention based on array of diffraction gratings; Owing to adopt the array of diffraction gratings that becomes spatial frequency as wavefront aperture segmentation element; Choose array of diffraction gratings neutron grating diffration progression through control and control the dynamic range of the focal beam spot of each wavelet front aperture at the ccd detector photosensitive target surface, it measures the adjustable purpose of dynamic range keeping realizing Hartmann wave front sensor simultaneously under the high precision condition to reach.
3, the disclosed Hartmann wave front sensor based on array of diffraction gratings of the present invention is because its measuring accuracy confirms that by the sub-aperture number of wavefront of cutting apart of array of diffraction gratings promptly the sub-gratings number of array of diffraction gratings is confirmed.Therefore can realize adjusting the purpose that Hartmann wave front sensor is measured dynamic range at the diffraction progression that keeps under the constant prerequisite of measuring accuracy choosing sub-gratings through control.
4, the disclosed Hartmann wave front sensor of the present invention based on array of diffraction gratings, it is simple in structure, stable performance and processing technology are prone to realize; Can satisfy the wave-front optical aberration measurement requirement of different frequency and P-V value; Thereby be applicable to the online detection of laser beam wavefront such as light processing detection, high power laser light, pulse laser.
Description of drawings
Fig. 1 the present invention is based on that first array of diffraction gratings and second array of diffraction gratings lay respectively at the first fourier transform lens front and the second fourier transform lens preceding structure synoptic diagram in the Hartmann wave front sensor of array of diffraction gratings;
Fig. 2 is sub-gratings 4 * 4 array synoptic diagram of the change spatial frequency of the present invention's first array of diffraction gratings;
Fig. 3 is sub-gratings 4 * 4 array synoptic diagram of the change spatial frequency of the present invention's second array of diffraction gratings;
Fig. 4 be the diffraction progression of sub-gratings of the present invention's first array of diffraction gratings that ccd detector receives when desirable plane wave front for+1 ,+3 o'clock spot array figure;
The sub-gratings diffraction progression that ccd detector received first array of diffraction gratings when Fig. 5 was actual measurement of the present invention for+1 ,+3 o'clock spot array synoptic diagram; Wherein, figure (a) spot array that the ccd detector during for+1 grade receives for the diffraction progression of sub-gratings, figure (b) spot array that the ccd detector during for+3 grades receives for the diffraction progression of sub-gratings.
Fig. 6 the present invention is based on the structural representation that first array of diffraction gratings and second array of diffraction gratings in the Hartmann wave front sensor of array of diffraction gratings lay respectively at first fourier transform lens back and the second fourier transform lens back.
Among the figure, 1-optical match system, 2-spectroscope, 3-first array of diffraction gratings, 4-first fourier transform lens, 5-CCD1 detector, 6-second array of diffraction gratings, 7-second fourier transform lens, 8-CCD2 detector.
Embodiment
Below in conjunction with accompanying drawing, and Hartmann wave front sensor of the present invention is done further explain, but it only is used to explain concrete embodiments more of the present invention, and should not be construed as any qualification protection domain of the present invention through specific embodiment.
Embodiment one
In this instance; The change spatial frequency sub-gratings structure of said first array of diffraction gratings 3 and second array of diffraction gratings 6 adopts the LCD space light modulator of the pure phase modulation (PM) of electrical addressing; Optical match system 1 employing enlargement factor is 5 telescopic system; Spectroscope 2 adopts and passes through inverse ratio is 5: 5 dull and stereotyped spectroscope, and in order to eliminate the extra wavefront distortion that fourier transform lens is introduced, it is the anaberration lens of 100mm that first fourier transform lens 4 and second fourier transform lens 7 all adopt focal length; It is MVC-II 1M that CCD1 detector 5 all adopts model with CCD2 detector 8, and pixel size is 1024 * 1280 area array CCD photodetector.
As shown in Figure 1; The present invention is based on the Hartmann wave front sensor of array of diffraction gratings; The spectroscope 2 that comprises optical match system 1 and back thereof, spectroscope 2 transmission planes are first array of diffraction gratings 3 of being close to first fourier transform lens, 4 fronts, and CCD1 detector 5 places first fourier transform lens, 4 back; Spectroscope 2 reflectings surface are second array of diffraction gratings 6 of being close to second fourier transform lens, 7 fronts, and CCD2 detector 8 places second fourier transform lens, 7 back.Said first array of diffraction gratings 3 and second array of diffraction gratings 6 realize the wavefront aperture segmentation with first fourier transform lens 4 and second fourier transform lens, 7 close-coupled that its front is close to respectively; When laser wave front aberration or laser beam quality are carried out comprehensive detection; After testing laser is realized the laser beam coupling to different caliber size through optical match system 1; Be divided into two bundles by spectroscope 2; Wherein a branch of illumination is mapped on first array of diffraction gratings 3, and through 4 imagings of first fourier transform lens, the overall optical beam orifice is evenly cut apart and on the photosensitive target surface of the CCD1 detector 5 that is positioned at place, first fourier transform lens, 4 focal planes, formed the focal beam spot array; Another light beam then is to shine on second array of diffraction gratings 6; And through 7 imagings of second fourier transform lens, the overall optical beam orifice is evenly cut apart and on the photosensitive target surface of the CCD2 detector 8 that is positioned at place, second fourier transform lens, 7 focal planes, is formed the focal beam spot array.
Through computing machine the facula information that CCD1 detector 5 receives is handled, calculated the center of gravity (x of each wavelet front aperture focal beam spot i, y i) and demarcate center of gravity (x 0, y 0) x, the offset x on the y direction i, Δ y iAfter; Consider that simultaneously diffraction grating beam split ability is relevant with incident laser wavetilt direction, the most responsive in the optical grating diffraction direction; Therefore in order to make that side-play amount is unified on same direction before each wavelet, can be the optical grating diffraction direction through rotating to the direction vertical to original coordinates x direction with each sub-gratings cutting, i.e. the most responsive direction of grating beam splitting.Can obtain the offset X on the directions X in the new coordinate system by Rotating Transition of Coordinate formula (2) i:
Δ X i = Δ x i cos ( θ i ) + Δ y i sin ( θ i ) Δ Y i = Δ x i cos ( θ i ) - Δ y i sin ( θ i ) - - - ( 2 )
θ wherein iBe the angle of each wavelet front aperture rotation of coordinate, i.e. the angle of each sub-gratings cutting direction and original coordinates direction in first array of diffraction gratings 3, θ iValue can confirm by the x of sub-gratings, spatial frequency on the y direction.In like manner, the facula information that CCD2 detector 8 receives is handled, can be obtained testing laser wavefront offset Y on the Y direction in new coordinate system equally through computing machine i
Therefore, can obtain wavefront slope G on testing laser wavefront X, the Y direction Xi, G YiBe respectively:
G Xi = ΔX i λf , G Yi = ΔY i λf - - - ( 3 )
In the formula, λ is the wavelength of testing laser, and f is the focal length of first fourier transform lens 4 and second fourier transform lens 7; Last overall treatment is distributed by the wavefront slope signal reconstruct testing laser wavefront that formula (3) obtains.
As shown in Figure 2; The change spatial frequency sub-gratings of first array of diffraction gratings 3 is 4 * 4 array synoptic diagram; Each sub-gratings is about its any diagonal rotational symmetry arranged distribution among Fig. 2, and the sub-gratings spatial frequency on its diagonal all satisfies 1,2; 3...N the rule alternation, its detail parameters is shown in table one; Each the corresponding sub-gratings cutting direction and the angle theta of x axle iShown in table two.
The sub-gratings spatial frequency distribution situation of table one first array of diffraction gratings (unit: 1/ micron)
Figure BDA0000122747550000064
Each the sub-gratings cutting direction of table two first array of diffraction gratings and the angle theta of x axle i(unit: degree)
Figure BDA0000122747550000072
As shown in Figure 3; The change spatial frequency sub-gratings of second array of diffraction gratings 6 is 4 * 4 arrays; Can know that through Fig. 3 and Fig. 2 comparison second array of diffraction gratings 6 is revolved to turn 90 degrees by first array of diffraction gratings 3 and obtained, therefore second array of diffraction gratings and the first array of diffraction gratings structural parameters are in full accord; Therefore the function of their realizations is also just the same, just is respectively applied for the slope information that obtains on testing laser wavefront X, the Y direction.Therefore the concrete parameter about second array of diffraction gratings 6 here just no longer specifies, and only further specifies practical implementation process of the present invention to first array of diffraction gratings 3 as embodiment in describing in the back.
As shown in Figure 4; The sub-gratings diffraction progression of first array of diffraction gratings 3 that CCD1 detector 5 receives when not having wavefront distortion ideal plane wavefront for+1 ,+3 o'clock hot spot; Can find out that to choose diffraction progression high more; The space dynamic range of sub-hot spot increases, and therefore can select different diffraction pattern arrays to measure the purpose of dynamic range to realize the adjustment Hartmann wave front sensor according to the needs in the practical application.
The P-V value of supposing Wave-front phase to be measured in the actual measurement is 15 λ, then the CCD1 detector 5 sub-gratings diffraction progression that receives first array of diffraction gratings for+1 ,+3 o'clock spot array is as shown in Figure 5.The spot array that CCD1 detector 5 photosensitive target surfaces when the diffraction progression of the sub-gratings of choosing is+1 grade receive shown in Fig. 5 (a), can find out that the hot spot that has has surmounted sub-aperture dynamic range separately, has promptly exceeded Hartmann's spatial resolving power; And when choosing sub-gratings diffraction progression for+3 the time, shown in Fig. 5 (b), each of spot array hot spot still is in sub-pore diameter range separately; Through (a) in the comparison diagram 5 and (b) two width of cloth figure can find out, can keep the high measurement accuracy condition be issued to the purpose that the adjustment Hartmann wave front sensor is measured dynamic range through selecting different sub-gratings diffraction progression.
Embodiment two
In this instance; The change spatial frequency sub-gratings structure of said first array of diffraction gratings 3 and second array of diffraction gratings 6 adopts the amplitude-modulated LCD space light modulator of electrical addressing; Optical match system 1 adopts the adjustable telescopic system that is enlarged into multiple 5; Spectroscope 2 employing splitting ratios are 5: 5 Amici prism, and in order to eliminate the extra wavefront distortion that fourier transform lens is introduced, it is the anaberration lens of 100mm that first fourier transform lens 4 and second fourier transform lens 7 all adopt focal length; It is MVC-II 1M that CCD1 detector 5 all adopts model with CCD2 detector 8, and pixel size is 1024 * 1280 area array CCD photodetector.
As shown in Figure 6; The present invention is based on the Hartmann wave front sensor of array of diffraction gratings; The spectroscope 2 that comprises optical match system 1 and back thereof, spectroscope 2 transmission planes are first array of diffraction gratings 3 of being close to first fourier transform lens, 4 back, and CCD1 detector 5 places first fourier transform lens, 4 back; Spectroscope 2 reflectings surface are second array of diffraction gratings 6 of being close to second fourier transform lens, 7 back, and CCD2 detector 8 places second fourier transform lens, 7 back.Said first array of diffraction gratings 3 and second array of diffraction gratings 6 realize wavefront aperture segmentation with its first fourier transform lens 4 be close to and second fourier transform lens, 7 close-coupled at the back respectively; When laser wave front aberration or laser beam quality are carried out comprehensive detection; After testing laser is realized the laser beam coupling to different caliber size through optical match system 1; Be divided into two bundles through Amici prism 2; Wherein a branch of illumination is mapped on first array of diffraction gratings 3, and through 4 imagings of first fourier transform lens, the overall optical beam orifice is evenly cut apart and on the photosensitive target surface of the CCD1 detector 5 that is positioned at place, first fourier transform lens, 4 focal planes, formed the focal beam spot array; Another light beam then is to shine on second array of diffraction gratings 6; And through 7 imagings of second fourier transform lens, the overall optical beam orifice is evenly cut apart and on the photosensitive target surface of the CCD2 detector 8 that is positioned at place, second fourier transform lens, 7 focal planes, is formed the focal beam spot array.Likewise the facula information that CCD1 detector 5 and CCD2 detector 8 receive is handled, calculated the offset X of center of gravity on X, Y direction of wavelet front aperture focal beam spot respectively through computing machine i, Δ Y i, the wavefront slope information of trying to achieve each wavelet front aperture by the focal length and the side-play amount size of wavelet front aperture is again distributed by wavefront slope signal reconstruct testing laser wavefront at last.

Claims (8)

1. the Hartmann wave front sensor based on array of diffraction gratings comprises optical match system (1), CCD1 detector (5) and CCD2 detector (8), first fourier transform lens (4) and second fourier transform lens (7); It is characterized in that also being included in optical match system (1) and add a spectroscope (2) afterwards; Transmission plane, first fourier transform lens (4) front or back in spectroscope (2); And be close to first fourier transform lens (4) and add first array of diffraction gratings (3); Reflecting surface, second fourier transform lens (7) front or back in spectroscope (2), and be close to second fourier transform lens (7) and add second array of diffraction gratings (6); Said array of diffraction gratings and fourier transform lens coupling realize the wavefront aperture segmentation; Said spectroscope (2) is divided into two bundles with testing laser; A branch of through first array of diffraction gratings (3) and first fourier transform lens (4) back formation focal beam spot array, the focal beam spot array is positioned at the CCD1 detector (5) at place, first fourier transform lens (4) focal plane and gathers; Another bundle forms the focal beam spot array through second array of diffraction gratings (6) and second fourier transform lens (7) back, and the focal beam spot array is positioned at the CCD2 detector (8) at place, second fourier transform lens (7) focal plane and gathers; After CCD1 detector (5) and CCD2 detector (8) obtain the slope information on the testing laser wavefront orthogonal directions respectively, by just restructural testing laser wavefront distribution situation of the slope information on the orthogonal directions.
2. the Hartmann wave front sensor based on array of diffraction gratings according to claim 1; It is characterized in that said first array of diffraction gratings (3) and second array of diffraction gratings (6) are closely to be rearranged by the sub-gratings that becomes spatial frequency, they realize the wavefront aperture segmentation with first fourier transform lens (4) and second fourier transform lens (7) close-coupled respectively; Each wavelet front aperture focal beam spot of diffraction progression may command through choosing sub-gratings is in the dynamic range of two ccd detector photosensitive target surfaces.
3. the Hartmann wave front sensor based on array of diffraction gratings according to claim 1 and 2; The grating spatial frequency that it is characterized in that the change spatial frequency sub-gratings on said first array of diffraction gratings (3) distributes about its any diagonal rotational symmetry, and the grating spatial frequency of the sub-gratings on the diagonal is according to 1,2; 3...N; Perhaps N, N-1, the rule alternation of N-2...1.
4. the Hartmann wave front sensor based on array of diffraction gratings according to claim 1 and 2; The grating spatial frequency distribution that it is characterized in that the change spatial frequency sub-gratings on said second array of diffraction gratings (6) and first array of diffraction gratings (3) is identical, but vertical each other with first array of diffraction gratings (3) placement location.
5. according to claim 1 or 2 or 4 described Hartmann wave front sensors based on array of diffraction gratings; The sub-gratings structure that it is characterized in that the change spatial frequency of said first array of diffraction gratings (3) and second array of diffraction gratings (6) adopts the amplitude type diffraction grating, or adopts the phase type diffraction grating.
6. the Hartmann wave front sensor based on array of diffraction gratings according to claim 5; The sub-gratings structure that it is characterized in that the change spatial frequency of described first array of diffraction gratings (3) and second array of diffraction gratings (6) adopts the phase type diffraction grating of two-dimentional serrate microprism, or adopts LCD space light modulator.
7. the Hartmann wave front sensor based on array of diffraction gratings according to claim 1 is characterized in that described spectroscope (2) is dull and stereotyped spectroscope, or Amici prism.
8. the Hartmann wave front sensor based on array of diffraction gratings according to claim 1, first array of diffraction gratings (3) that it is characterized in that adding in the said Hartmann wave front sensor and the sub-gratings aperture number of second array of diffraction gratings (6) are confirmed the measuring accuracy of Hartmann wave front sensor.
CN2011104301292A 2011-12-20 2011-12-20 Hartmann wavefront sensor based on diffraction grating arrays Pending CN102419213A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2011104301292A CN102419213A (en) 2011-12-20 2011-12-20 Hartmann wavefront sensor based on diffraction grating arrays

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2011104301292A CN102419213A (en) 2011-12-20 2011-12-20 Hartmann wavefront sensor based on diffraction grating arrays

Publications (1)

Publication Number Publication Date
CN102419213A true CN102419213A (en) 2012-04-18

Family

ID=45943734

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2011104301292A Pending CN102419213A (en) 2011-12-20 2011-12-20 Hartmann wavefront sensor based on diffraction grating arrays

Country Status (1)

Country Link
CN (1) CN102419213A (en)

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102914373A (en) * 2012-11-20 2013-02-06 天津理工大学 Hartmann wave-front sensor based on micro-cylindrical lens array
CN103557947A (en) * 2013-10-30 2014-02-05 东南大学 Double-mode wave-front sensor capable of conducting automatic alignment and measuring method thereof
CN103945143A (en) * 2014-04-25 2014-07-23 西北核技术研究所 Signal receiving device capable of widening dynamic range of image sensor
CN104198053A (en) * 2014-08-19 2014-12-10 北京理工大学 Wavefront detection method based on sub-wavelength grating array wavefront sensor
CN104508586A (en) * 2012-07-04 2015-04-08 奥普拓塞斯有限公司 Reconfigurable optical processing system
CN106767391A (en) * 2016-12-23 2017-05-31 浙江大学 The sensitivity intensifier and method of four wavefront lateral shearing interference Wavefront sensors
CN106969846A (en) * 2016-01-13 2017-07-21 南京理工大学 Laser moda measurement light beam M is decomposed using spatial light modulator2The device of the factor
EP3410211A1 (en) * 2017-05-31 2018-12-05 Stichting VU Methods and apparatus for predicting performance of a measurement method, measurement method and apparatus
WO2018219585A1 (en) * 2017-05-31 2018-12-06 Stichting Nederlandse Wetenschappelijk Onderzoek Instituten Methods and apparatus for predicting performance of a measurement method, measurement method and apparatus
CN109141254A (en) * 2018-10-15 2019-01-04 西安交通大学 A kind of integrated diffraction grating formula high stability laser displacement sensor
JP2019500628A (en) * 2015-12-12 2019-01-10 ザ セクレタリー,デパートメント オブ エレクトロニクス アンド インフォメーション テクノロジー(ディーイーアイティーワイ) System, apparatus and method for monitoring surface profile and / or thickness measurements in thin films
CN110261067A (en) * 2012-05-30 2019-09-20 株式会社尼康 Wavefront measuring method and device and exposure method and device
EP3964809A1 (en) * 2020-09-02 2022-03-09 Stichting VU Wavefront metrology sensor and mask therefor, method for optimizing a mask and associated apparatuses
CN114777933A (en) * 2022-06-20 2022-07-22 中国工程物理研究院应用电子学研究所 Mesh-free large dynamic range Hartmann wavefront measuring device and measuring method
CN115031929A (en) * 2022-06-13 2022-09-09 浙江大学 A fast in-situ detection method of large-aperture laser wavefront based on Legendre diffraction integral
CN115183886A (en) * 2022-07-11 2022-10-14 中国科学院光电技术研究所 Wavefront sensor based on defocused grating array

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4518854A (en) * 1982-06-17 1985-05-21 Itek Corporation Combined shearing interferometer and Hartmann wavefront sensor
CN1465968A (en) * 2002-06-24 2004-01-07 中国科学院光电技术研究所 A Hartmann Wavefront Sensor with Adjustable Dynamic Range and Measurement Accuracy
CN1601230A (en) * 2003-09-28 2005-03-30 中国科学院光电技术研究所 Hartmann wavefront sensor for optical detection based on microprism array
CN1796949A (en) * 2004-12-22 2006-07-05 中国科学院光电技术研究所 PSD type Hartmann-shack wave front sensor based on microprism array

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4518854A (en) * 1982-06-17 1985-05-21 Itek Corporation Combined shearing interferometer and Hartmann wavefront sensor
CN1465968A (en) * 2002-06-24 2004-01-07 中国科学院光电技术研究所 A Hartmann Wavefront Sensor with Adjustable Dynamic Range and Measurement Accuracy
CN1601230A (en) * 2003-09-28 2005-03-30 中国科学院光电技术研究所 Hartmann wavefront sensor for optical detection based on microprism array
CN1796949A (en) * 2004-12-22 2006-07-05 中国科学院光电技术研究所 PSD type Hartmann-shack wave front sensor based on microprism array

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
沈洪斌等: "基于扭曲光栅的曲率波前传感器", 《传感器世界》 *

Cited By (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110261067A (en) * 2012-05-30 2019-09-20 株式会社尼康 Wavefront measuring method and device and exposure method and device
CN104508586A (en) * 2012-07-04 2015-04-08 奥普拓塞斯有限公司 Reconfigurable optical processing system
CN102914373A (en) * 2012-11-20 2013-02-06 天津理工大学 Hartmann wave-front sensor based on micro-cylindrical lens array
CN103557947A (en) * 2013-10-30 2014-02-05 东南大学 Double-mode wave-front sensor capable of conducting automatic alignment and measuring method thereof
CN103557947B (en) * 2013-10-30 2015-10-14 东南大学 A kind of self-aligning double mode Wavefront sensor and measuring method
CN103945143A (en) * 2014-04-25 2014-07-23 西北核技术研究所 Signal receiving device capable of widening dynamic range of image sensor
CN104198053A (en) * 2014-08-19 2014-12-10 北京理工大学 Wavefront detection method based on sub-wavelength grating array wavefront sensor
CN104198053B (en) * 2014-08-19 2017-03-22 北京理工大学 Wavefront detection method based on sub-wavelength grating array wavefront sensor
JP2019500628A (en) * 2015-12-12 2019-01-10 ザ セクレタリー,デパートメント オブ エレクトロニクス アンド インフォメーション テクノロジー(ディーイーアイティーワイ) System, apparatus and method for monitoring surface profile and / or thickness measurements in thin films
CN106969846A (en) * 2016-01-13 2017-07-21 南京理工大学 Laser moda measurement light beam M is decomposed using spatial light modulator2The device of the factor
CN106767391A (en) * 2016-12-23 2017-05-31 浙江大学 The sensitivity intensifier and method of four wavefront lateral shearing interference Wavefront sensors
IL270977B1 (en) * 2017-05-31 2023-09-01 Asml Netherlands Bv Methods and apparatus for predicting performance of a measurement method, measurement method and apparatus
WO2018219585A1 (en) * 2017-05-31 2018-12-06 Stichting Nederlandse Wetenschappelijk Onderzoek Instituten Methods and apparatus for predicting performance of a measurement method, measurement method and apparatus
TWI686675B (en) * 2017-05-31 2020-03-01 荷蘭商Asml荷蘭公司 Methods and apparatus for predicting performance of a measurement method, measurement method and apparatus
US10648919B2 (en) 2017-05-31 2020-05-12 Asml Netherlands B.V. Methods and apparatus for predicting performance of a measurement method, measurement method and apparatus
TWI735056B (en) * 2017-05-31 2021-08-01 荷蘭商Asml荷蘭公司 Methods and apparatus for predicting performance of a measurement method, measurement method and apparatus
EP3410211A1 (en) * 2017-05-31 2018-12-05 Stichting VU Methods and apparatus for predicting performance of a measurement method, measurement method and apparatus
IL270977B2 (en) * 2017-05-31 2024-01-01 Asml Netherlands Bv Methods and device for predicting performance of measurement method, measurement method and device
US11391677B2 (en) 2017-05-31 2022-07-19 Asml Netherlands B. V. Methods and apparatus for predicting performance of a measurement method, measurement method and apparatus
CN109141254A (en) * 2018-10-15 2019-01-04 西安交通大学 A kind of integrated diffraction grating formula high stability laser displacement sensor
EP3964809A1 (en) * 2020-09-02 2022-03-09 Stichting VU Wavefront metrology sensor and mask therefor, method for optimizing a mask and associated apparatuses
WO2022048899A1 (en) * 2020-09-02 2022-03-10 Stichting Vu Wavefront metrology sensor and mask therefor, method for optimizing a mask and associated apparatuses
TWI861701B (en) * 2020-09-02 2024-11-11 荷蘭Vu基金會 Method and assembly for retrieving wavefront information of a radiation, related non-transitory computer program product, processor and associated storage medium, and metrology device
CN115031929A (en) * 2022-06-13 2022-09-09 浙江大学 A fast in-situ detection method of large-aperture laser wavefront based on Legendre diffraction integral
CN114777933B (en) * 2022-06-20 2022-09-20 中国工程物理研究院应用电子学研究所 Mesh-free large dynamic range Hartmann wavefront measuring device and measuring method
CN114777933A (en) * 2022-06-20 2022-07-22 中国工程物理研究院应用电子学研究所 Mesh-free large dynamic range Hartmann wavefront measuring device and measuring method
CN115183886A (en) * 2022-07-11 2022-10-14 中国科学院光电技术研究所 Wavefront sensor based on defocused grating array

Similar Documents

Publication Publication Date Title
CN102419213A (en) Hartmann wavefront sensor based on diffraction grating arrays
CN202420688U (en) Hartmann wavefront sensor based on diffraction grating arrays
CN102331303B (en) Phase difference wavefront sensor based on grating
CN106441085B (en) A kind of double carrier frequency are total to railway digital holographic microphotography device and microscopic method
CN107167244B (en) Device and method for measuring polarization state parameters based on diffraction phase co-channel digital holography
CN102967380B (en) Hartmann wavefront sensor based on unit photosensitive detector array
DE102015207431A1 (en) A surface shape sensing device and method utilizing a diffraction wavefront of an aperture stop stitch measurement
CN101762331B (en) Common-path radial shearing interferometer based on four-step spatial phase shift
CN105423911A (en) Common-path digital holographic microscopic device and method based on optical grating defocusing
CN102679907A (en) High-precision differential interference measuring system and method based on LED light source
CN102914373A (en) Hartmann wave-front sensor based on micro-cylindrical lens array
CN105865339A (en) Dioptrate phase-shifting interference and confocal micro-displacement measuring device
CN107144351B (en) A kind of broadband full polarization imaging method based on Mach Zehnder interferometer
CN103557948A (en) Optical system wavefront measurement device and method based on circular carrier frequency phase demodulation method
CN104913848B (en) All-Stokes parameter white light double-Sagnac polarization imaging interferometer
CN107388986A (en) Double-view field digital holographic detection device and method based on two-dimensional phase grating and point diffraction
CN103256990B (en) A kind of diffraction pyramid wave-front sensor
CN107101724A (en) A kind of polarization state measuring equipment holographic based on common railway digital and method
CN107101722A (en) A kind of broadband linear polarization imaging method based on Mach Zehnder interferometer
CN102538866A (en) Surface three-dimensional measurement system with tunable beat-wave linear scanning
CN104931141B (en) A kind of white light double Sagnac polarization imaging methods of full stokes parameter
CN107421641B (en) A kind of broadband full polarization imaging device based on Mach Zehnder interferometer
CN102288385A (en) Calibration method for photoelectric response characteristic of two-dimensional imaging device
CN104819780A (en) Non-common-optical-path loop radial shear polarization phase shift interferometer
CN107515103B (en) A focus detection device and method using ring grating

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20120418