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CN102358614A - A kind of processing method of graphene nano pattern - Google Patents

A kind of processing method of graphene nano pattern Download PDF

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CN102358614A
CN102358614A CN2011103218067A CN201110321806A CN102358614A CN 102358614 A CN102358614 A CN 102358614A CN 2011103218067 A CN2011103218067 A CN 2011103218067A CN 201110321806 A CN201110321806 A CN 201110321806A CN 102358614 A CN102358614 A CN 102358614A
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graphene
etching
plasma
orientation
hydrogen
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张广宇
时东霞
史志文
张连昌
杨蓉
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Institute of Physics of CAS
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Abstract

The invention relates to a processing method of graphene nano-patterns. The method comprises the following steps of: forming artificial defects on graphene; and carrying out anisotropic etching on the graphene by using hydrogen-containing plasma. According to the method disclosed by the invention, the nano-level graphene structure can be processed in a controllable way, the precision can reach below 10nm, and the graphene nanostructure with an atom-level smooth zigzag edge structure can be obtained.

Description

一种石墨烯纳米图案的加工方法A kind of processing method of graphene nano pattern

技术领域 technical field

本发明属于微纳加工领域,尤其涉及一种石墨烯纳米图案的加工方法。The invention belongs to the field of micro-nano processing, in particular to a method for processing graphene nano-patterns.

背景技术 Background technique

由晶体石墨的一个或少数几个原子层构成的具有纳米厚度的石墨片称为石墨烯。Graphite sheets with a nanometer thickness composed of one or a few atomic layers of crystalline graphite are called graphene.

2004年,英国科学家首次在实验室制备出单层石墨烯(Science 306,666(2004))。单层石墨烯中的电子属于无质量的狄拉克费米子,因此该材料的发现为利用凝聚态材料研究量子电动力学和相对论效应开辟了一条全新的途径。石墨烯中的电子迁移率高达200000cm2V-1s-1,是一种制造高速电子器件的理想材料。石墨烯纳米结构的电学性质同时受到边缘结构和量子限域效应的影响。石墨烯纳米结构的边缘结构分为armchair(扶手椅)边缘和zigzag(锯齿形)边缘两种(见图1)。其中zigzag边缘具有的表面态倾向于使其更加导电,而量子限域效应则倾向于使石墨烯出现带隙变得不导电。另外,具有zigzag边缘结构的石墨烯纳米结构边缘处的电子还会出现自旋极化现象,可应用于自旋电子学领域。In 2004, British scientists prepared single-layer graphene in the laboratory for the first time (Science 306, 666 (2004)). The electrons in single-layer graphene belong to massless Dirac fermions, so the discovery of this material opens up a new way to use condensed matter materials to study quantum electrodynamics and relativistic effects. The electron mobility in graphene is as high as 200,000 cm 2 V -1 s -1 , which is an ideal material for manufacturing high-speed electronic devices. The electrical properties of graphene nanostructures are affected by both edge structures and quantum confinement effects. The edge structures of graphene nanostructures are divided into armchair (armchair) edge and zigzag (zigzag) edge (see Figure 1). The surface states at the zigzag edge tend to make it more conductive, while the quantum confinement effect tends to make graphene non-conductive with a band gap. In addition, the electrons at the edge of the graphene nanostructure with the zigzag edge structure also exhibit spin polarization, which can be applied to the field of spintronics.

现有技术中有一些加工石墨烯纳米结构的方法的报道,主要包括:石墨烯超声振荡法,碳纳米管剥离法,碳基分子键合法,电子束曝光-氧等离子刻蚀法。其中,前三种方法虽然可以加工出纳米级的石墨烯结构,但是其结构图案都是不可控的。最后一种方法是一种可控性很好的方法,但是其加工精度很难达到十纳米以下。另外,上述这些方法都不能得到具有原子级平整zigzag边缘结构的石墨烯纳米结构。In the prior art, there are some reports on methods for processing graphene nanostructures, mainly including: graphene ultrasonic oscillation method, carbon nanotube stripping method, carbon-based molecular bonding method, electron beam exposure-oxygen plasma etching method. Among them, although the first three methods can process nanoscale graphene structures, their structural patterns are uncontrollable. The last method is a method with good controllability, but its processing accuracy is difficult to reach less than ten nanometers. In addition, none of the above methods can obtain graphene nanostructures with atomically flat zigzag edge structures.

发明内容 Contents of the invention

因此,本发明的目的在于提供一种石墨烯纳米图案的加工方法,能够可控地加工出纳米级的石墨烯结构,精度可达到十纳米以下,且能够得到具有原子级平整的zigzag边缘结构的石墨烯纳米结构。Therefore, the object of the present invention is to provide a kind of processing method of graphene nano-pattern, can controllably process out the graphene structure of nanoscale, precision can reach below ten nanometers, and can obtain the zigzag edge structure with atomic level smooth Graphene nanostructures.

本发明人经研究发现,通过在石墨烯上形成人工缺陷并用含氢等离子体对该石墨烯进行各向异性刻蚀,经过刻蚀的石墨烯上会出现一些正六角形的孔洞,而不是通常等离子体刻蚀得到的圆形孔洞,从而获得所需的zigzag边缘结构。The inventors have found through research that by forming artificial defects on graphene and anisotropically etching the graphene with hydrogen-containing plasma, some regular hexagonal holes will appear on the etched graphene instead of the usual plasma The circular hole obtained by bulk etching can obtain the desired zigzag edge structure.

根据上述发现,本发明提供了一种石墨烯纳米图案的加工方法,包括:According to above-mentioned finding, the present invention provides a kind of processing method of graphene nano-pattern, comprising:

在石墨烯上形成人工缺陷;Formation of artificial defects on graphene;

用含氢等离子体对该石墨烯进行各向异性刻蚀。The graphene is anisotropically etched with hydrogen-containing plasma.

根据本发明提供的石墨烯纳米图案的加工方法,其中所述人工缺陷包括孔。According to the processing method of graphene nano pattern provided by the present invention, wherein the artificial defects include holes.

根据本发明提供的石墨烯纳米图案的加工方法,其中所述人工缺陷可以排列成点阵图案。According to the method for processing graphene nano-patterns provided by the present invention, the artificial defects can be arranged in a lattice pattern.

根据本发明提供的石墨烯纳米图案的加工方法,其中所述点阵图案可以为三角点阵或矩形点阵。According to the method for processing graphene nano-patterns provided by the present invention, the lattice pattern may be a triangular lattice or a rectangular lattice.

根据本发明提供的石墨烯纳米图案的加工方法,其中人工缺陷可以通过光刻、纳米压印、机械冲击、激光扫描而形成。According to the method for processing graphene nano-patterns provided by the present invention, artificial defects can be formed by photolithography, nano-imprinting, mechanical impact, and laser scanning.

根据本发明提供的石墨烯纳米图案的加工方法,其中用含氢等离子体对石墨烯的各向异性刻蚀,使人工缺陷逐渐增大,直到形成所需图案为止。According to the method for processing graphene nano-patterns provided by the present invention, the anisotropic etching of graphene with hydrogen-containing plasma gradually increases artificial defects until a desired pattern is formed.

根据本发明提供的石墨烯纳米图案的加工方法,其中所述含氢等离子体刻蚀的参数为:反应温度,室温至520℃;气压,小于1Torr;等离子体功率,30-120W;刻蚀速度,小于15nm/分钟。According to the method for processing graphene nanopatterns provided by the present invention, the parameters of the hydrogen-containing plasma etching are: reaction temperature, room temperature to 520°C; air pressure, less than 1 Torr; plasma power, 30-120W; etching speed , less than 15nm/min.

根据本发明提供的石墨烯纳米图案的加工方法,还包括确定石墨烯晶格取向,并设计所述人工缺陷的点阵图案的取向与石墨烯晶格取向之间的夹角。According to the processing method of the graphene nano-pattern provided by the present invention, it also includes determining the orientation of the graphene lattice, and designing the angle between the orientation of the lattice pattern of the artificial defect and the orientation of the graphene lattice.

根据本发明提供的石墨烯纳米图案的加工方法,其中确定石墨烯晶格取向的方法包括:According to the processing method of graphene nano-pattern provided by the present invention, wherein the method for determining graphene lattice orientation comprises:

在石墨烯片上刻蚀出一个小孔;Etching a small hole in the graphene sheet;

用含氢等离子体刻蚀,将这个小孔扩展成六角形大孔,根据该六角形大孔的边缘的取向来确定石墨烯的晶格取向。The small hole is expanded into a hexagonal macropore by etching with a hydrogen-containing plasma, and the lattice orientation of the graphene is determined according to the orientation of the edges of the hexagonal macropore.

根据本发明提供的石墨烯纳米图案的加工方法,其中含氢等离子体包括氢气、甲烷、乙烯、水蒸气等含氢气体所生成的等离子体。According to the method for processing graphene nano-patterns provided by the present invention, the hydrogen-containing plasma includes plasma generated by hydrogen-containing gases such as hydrogen, methane, ethylene, and water vapor.

本发明提供的方法可以得到纳米尺寸的各种石墨烯结构,包括量子点、纳米带、超晶格结构,而且这些石墨烯纳米结构都具有原子级平整的zigzag边缘结构。本发明提供的方法具有很好的可控性,得益于含氢等离子体对一些有机污染物的刻蚀清除作用,用这种方法加工出的石墨烯纳米结构表面十分干净。且该方法与现有的半导体加工工艺兼容。The method provided by the invention can obtain various graphene structures of nanometer size, including quantum dots, nanobelts, and superlattice structures, and these graphene nanostructures all have atomic-level flat zigzag edge structures. The method provided by the invention has good controllability, benefiting from the etching and removing effect of the hydrogen-containing plasma on some organic pollutants, the surface of the graphene nanostructure processed by the method is very clean. And the method is compatible with the existing semiconductor processing technology.

另外,本方法可用于器件集成,批量生产石墨烯纳米结构器件。这些具有原子级平整zigzag边缘结构的各种石墨烯纳米图案的加工不仅为研究石墨烯尺寸限制效应提供了一种有效可控的方法,同时为研究zigzag边缘态对器件物性的影响提供了一种可靠的途径,包括单电子量子点器件、场效应管器件、自旋极化的量子器件、室温下的弹道输运器件、量子霍尔效应器件等。In addition, the method can be used for device integration and mass production of graphene nanostructure devices. The processing of various graphene nanopatterns with atomically flat zigzag edge structures not only provides an effective and controllable method for studying the size confinement effect of graphene, but also provides a method for studying the influence of zigzag edge states on the physical properties of devices. Reliable approaches, including single-electron quantum dot devices, field effect transistor devices, spin-polarized quantum devices, ballistic transport devices at room temperature, quantum Hall effect devices, etc.

附图说明 Description of drawings

以下参照附图对本发明实施例作进一步说明,其中:Embodiments of the present invention will be further described below with reference to the accompanying drawings, wherein:

图1为石墨烯的zigzag边缘结构和armchair边缘结构的示意图;Fig. 1 is the schematic diagram of zigzag edge structure and armchair edge structure of graphene;

图2为根据实施例1提供的加工方法的步骤示意图;Fig. 2 is a schematic diagram of the steps of the processing method provided according to embodiment 1;

图3为石墨烯晶格结构示意图;Fig. 3 is a schematic diagram of graphene lattice structure;

图4为正方点阵图案示意图;Fig. 4 is a schematic diagram of a square lattice pattern;

图5为根据实施例1的方法得到的一种石墨烯纳米带的原子力显微图像;Fig. 5 is the atomic force microscopy image of a kind of graphene nanoribbon obtained according to the method for embodiment 1;

图6三角点阵图案示意图;Fig. 6 schematic diagram of triangular lattice pattern;

图7为根据实施例2的方法得到的一种石墨烯超晶格的原子力显微图像;Fig. 7 is the atomic force microscopic image of a kind of graphene superlattice obtained according to the method for embodiment 2;

图8为根据实施例2的方法得到的一种石墨烯量子点的原子力显微图像;Fig. 8 is the atomic force microscope image of a kind of graphene quantum dot obtained according to the method for embodiment 2;

图9为根据实施例3的方法得到的一种石墨烯超晶格的原子力显微图像。Fig. 9 is an atomic force microscopy image of a graphene superlattice obtained according to the method of Example 3.

具体实施方式 Detailed ways

本发明提供的加工方法主要包括两个主要步骤:Processing method provided by the invention mainly comprises two main steps:

(1)人工缺陷的设计与加工;(1) Design and processing of artificial defects;

(2)含氢等离子各向异性刻蚀。(2) Hydrogen-containing plasma anisotropic etching.

含氢等离子体对石墨烯在面内有各向异性的刻蚀效果,即经过刻蚀的石墨烯上会出现一些正六角形的孔洞,而不是通常等离子体刻蚀得到的圆形孔洞。在一片单晶石墨烯上的这些六角形的孔洞的取向都是一致的。因为zigzag边缘在石墨烯的所有边缘结构中是最稳定的,所以含氢等离子体刻蚀以后剩下的边缘结构都是zigzag型的,而且边缘的粗糙度在原子级水平上。Hydrogen-containing plasma has an anisotropic etching effect on graphene in the plane, that is, some regular hexagonal holes will appear on the etched graphene, instead of the circular holes usually obtained by plasma etching. The orientation of these hexagonal holes on a sheet of single-crystal graphene is consistent. Because the zigzag edge is the most stable among all the edge structures of graphene, the remaining edge structure after hydrogen-containing plasma etching is zigzag type, and the roughness of the edge is at the atomic level.

含氢等离子体对石墨烯的刻蚀效应来自于氢等离子体与石墨烯中的碳原子发生化学反应生成气态的碳氢化合物。这个反应过程比较缓和,而且其强度可以通过刻蚀条件来精确控制。由于处在石墨烯片内部和边缘上的碳原子的化学稳定性有差异,因此可以通过控制刻蚀条件使得刻蚀只发生在石墨烯的缺陷和边缘处。根据含氢等离子的这个刻蚀特点,可制造人工缺陷来控制刻蚀发生的区域,得到所需的样品结构。The etching effect of hydrogen-containing plasma on graphene comes from the chemical reaction between hydrogen plasma and carbon atoms in graphene to generate gaseous hydrocarbons. This reaction process is relatively mild, and its strength can be precisely controlled by etching conditions. Since the chemical stability of carbon atoms inside and on the edge of the graphene sheet is different, it is possible to control the etching conditions so that the etching only occurs at the defects and edges of the graphene. According to this etching characteristic of hydrogen-containing plasma, artificial defects can be manufactured to control the area where etching occurs, and the desired sample structure can be obtained.

根据需要加工的样品形貌,首先设计制备出具备一定分布特点的人工缺陷,然后用含氢等离子体进行刻蚀使得这些人工缺陷长大并变成六角形,逐渐刻蚀掉石墨烯片中那些不需要的地方,最终得到所需的石墨烯纳米结构图案。因为同一片石墨烯上的六角形的孔洞的取向都是一致的,因此最后得到的石墨烯纳米结构图案主要取决于人工缺陷阵列的结构以及人工缺陷阵列的取向与石墨烯晶向之间的角度。According to the shape of the sample to be processed, artificial defects with certain distribution characteristics are first designed and prepared, and then etched with hydrogen-containing plasma to make these artificial defects grow up and become hexagonal, and gradually etch away those in the graphene sheet. Where it is not desired, the desired graphene nanostructure pattern is finally obtained. Because the orientation of the hexagonal holes on the same graphene is consistent, the final graphene nanostructure pattern mainly depends on the structure of the artificial defect array and the angle between the orientation of the artificial defect array and the graphene crystal orientation. .

人工缺陷例如可利用传统的微纳加工技术来形成,例如通过标准的电子束曝光结合氧等离子刻蚀的方法在石墨烯上制备出直径约为几十纳米孔洞,作为人工缺陷。这些传统的微纳加工技术可以精确地控制这些人工缺陷的形状、位置和分布。For example, artificial defects can be formed using traditional micro-nano processing techniques, for example, holes with a diameter of tens of nanometers are prepared on graphene by standard electron beam exposure combined with oxygen plasma etching as artificial defects. These traditional micro-nanofabrication techniques can precisely control the shape, location and distribution of these artificial defects.

可以通过控制刻蚀条件来调节含氢等离子体对石墨烯的刻蚀速率。较为缓慢的刻蚀速率使得在纳米尺度上精确控制样品尺寸成为可能。含氢等离子体和石墨烯的优选反应条件为反应温度:室温至520℃,气压:小于1Torr,等离子体功率:30-120W,刻蚀速度:小于15nm/分钟。The etching rate of graphene by hydrogen-containing plasma can be adjusted by controlling the etching conditions. The slower etching rate makes it possible to precisely control the sample size at the nanometer scale. The preferred reaction conditions of hydrogen-containing plasma and graphene are reaction temperature: room temperature to 520°C, pressure: less than 1 Torr, plasma power: 30-120W, etching speed: less than 15nm/min.

下面提供几种不同的实施例,在这些实施例中,这些实施例仅为示例性的,根据本发明对下列实施例做出的改进对于本领域技术人员来说是显而易见的,因此同样落入本发明的范围。Several different embodiments are provided below, and in these embodiments, these embodiments are exemplary only, and it is obvious to those skilled in the art that the improvement that the following embodiments are made according to the present invention, therefore also fall into scope of the invention.

实施例1Example 1

参照图2a至图2d所示,本实施例提供一种石墨烯纳米图案的加工方法,包括:Referring to Figures 2a to 2d, the present embodiment provides a method for processing graphene nanopatterns, including:

1)如图2a所示,通过机械剥离法把石墨烯片2转移到具有300nm氧化层的硅片基底1上(300nm SiO2/Si),因为机械剥离法得到的石墨烯片的边缘多为zigzag边,因此可通过石墨烯的边缘来确定石墨烯的晶向,石墨烯的晶格结构如图3所示,其中可用a1和a2来表示石墨烯的晶向;1) As shown in Figure 2a, the graphene sheet 2 is transferred to the silicon substrate 1 (300nm SiO 2 /Si) with a 300nm oxide layer by mechanical exfoliation, because the edges of graphene sheets obtained by mechanical exfoliation are mostly zigzag edge, so the crystal orientation of graphene can be determined by the edge of graphene, the lattice structure of graphene is as shown in Figure 3, wherein a 1 and a 2 can be used to represent the crystal orientation of graphene;

2)在样品上旋涂一层PMMA光刻胶3,用电子束曝光以及显影技术在光刻胶上形成多个圆孔,圆孔直径为50nm,如图2b所示,该多个圆孔排列成如图4所示的正方点阵图案,并使该正方点阵的取向c1平行于石墨烯晶向a12) Spin-coat a layer of PMMA photoresist 3 on the sample, and form a plurality of circular holes on the photoresist with electron beam exposure and development technology, and the diameter of the circular holes is 50nm, as shown in Figure 2b, the plurality of circular holes Arranged into a square lattice pattern as shown in Figure 4, and make the orientation c 1 of the square lattice parallel to the graphene crystal direction a 1 ;

3)用氧等离子体进行刻蚀,将光刻胶上的正方点阵图案转移到石墨烯上(如图2c所示),然后用丙酮将光刻胶清洗干净;3) Etching with oxygen plasma, transferring the square lattice pattern on the photoresist to graphene (as shown in Figure 2c), and then cleaning the photoresist with acetone;

4)用氢等离子体进行刻蚀,刻蚀温度为450℃,气压0.3Torr,氢等离子体功率为50W,刻蚀速度为5nm/min,使多个圆孔逐渐扩大,形成如图2d所示的多个六角形孔。4) Etching with hydrogen plasma, the etching temperature is 450°C, the gas pressure is 0.3Torr, the hydrogen plasma power is 50W, and the etching speed is 5nm/min, so that multiple round holes are gradually enlarged, forming a shape as shown in Figure 2d multiple hexagonal holes.

因为zigzag边缘在石墨烯的所有边缘结构中是最稳定的,所以氢等离子体刻蚀以后剩下的边缘结构都是zigzag型的。Because the zigzag edge is the most stable among all the edge structures of graphene, the remaining edge structures after hydrogen plasma etching are of the zigzag type.

根据本实施例,可以在步骤4)的基础上进行步骤5)继续用氢等离子体进行刻蚀,进一步扩大六角形孔,从而形成如图5所示的图案,精确控制刻蚀时间,在相邻两个六角形孔之间形成纳米级宽度的石墨烯纳米带。According to this embodiment, step 5) can be carried out on the basis of step 4) to continue etching with hydrogen plasma to further expand the hexagonal hole, thereby forming a pattern as shown in Figure 5, and precisely controlling the etching time. A graphene nanoribbon with a nanoscale width is formed between two adjacent hexagonal holes.

根据本实施例,可以在步骤5)的基础上进行步骤6)进一步用氢等离子体进行刻蚀,刻蚀掉相邻两个六角形孔之间的石墨烯纳米带,形成孤立的石墨烯量子点阵列,其中每一量子点为平行四边形。According to this embodiment, step 6) can be further etched with hydrogen plasma on the basis of step 5), and the graphene nanoribbons between two adjacent hexagonal holes are etched away to form isolated graphene quantum A dot array, wherein each quantum dot is a parallelogram.

根据本实施例,除氢等离子体外,还可以采用甲烷、乙烯、水蒸气等其他含氢气体进行刻蚀以形成石墨烯图案。According to this embodiment, in addition to hydrogen plasma, other hydrogen-containing gases such as methane, ethylene, and water vapor can also be used for etching to form graphene patterns.

由于含氢等离子体对石墨烯在面内有各向异性的刻蚀效果,因此经过刻蚀的人工缺陷将扩展成正六角形的孔洞,且正六角形孔洞的取向与石墨烯的晶格取向呈固定的角度,图3中用虚线1、虚线2以及箭头表示出六角形孔洞的扩展方向,同一片石墨烯内所有的六角形的孔洞的取向都是一致的,因此最后得到的石墨烯纳米结构图案主要取决于人工缺陷阵列的结构以及人工缺陷阵列的取向与石墨烯晶向之间的角度,下文通过其他实施例来介绍其他的人工缺陷阵列的结构所得到的其他图案。Due to the anisotropic etching effect of hydrogen-containing plasma on graphene in the plane, the etched artificial defects will expand into regular hexagonal holes, and the orientation of the regular hexagonal holes is fixed to the lattice orientation of graphene. In Fig. 3, the dotted line 1, the dotted line 2 and the arrow show the expansion direction of the hexagonal hole, and the orientations of all the hexagonal holes in the same graphene are consistent, so the graphene nanostructure pattern obtained at last Mainly depend on the structure of the artificial defect array and the angle between the orientation of the artificial defect array and the graphene crystal direction, other patterns obtained by other structures of the artificial defect array will be introduced below through other embodiments.

实施例2Example 2

本实施例提供一种石墨烯纳米图案的加工方法,包括:The present embodiment provides a kind of processing method of graphene nano-pattern, comprising:

1)通过机械剥离法把石墨烯片转移到具有300nm氧化层的硅片基底上(300nm SiO2/Si),通过石墨烯的边缘来确定石墨烯的晶向,石墨烯的晶向如图3中的a1和a2所示;1) Transfer the graphene sheet to a silicon wafer substrate (300nm SiO 2 /Si) with a 300nm oxide layer by mechanical exfoliation, and determine the crystal orientation of the graphene through the edge of the graphene. The crystal orientation of the graphene is shown in Figure 3 shown in a 1 and a 2 in;

2)在样品上旋涂一层PMMA光刻胶,用电子束曝光以及显影技术在光刻胶上形成多个圆孔,圆孔直径为50nm,该多个圆孔排列成如图6所示的三角点阵图案,并使该三角点阵的取向b1平行于石墨烯晶向a12) Spin-coat a layer of PMMA photoresist on the sample, and form a plurality of circular holes on the photoresist with electron beam exposure and development technology, the diameter of the circular holes is 50nm, and the multiple circular holes are arranged as shown in Figure 6 triangular lattice pattern, and make the orientation b 1 of the triangular lattice parallel to the graphene crystal direction a 1 ;

3)用氧等离子体进行刻蚀,将光刻胶上的三角点阵图案转移到石墨烯上,然后用丙酮将光刻胶清洗干净;3) Etching with oxygen plasma, transferring the triangular lattice pattern on the photoresist to the graphene, and then cleaning the photoresist with acetone;

4)用甲烷等离子体进行刻蚀,刻蚀温度为500℃,气压0.4Torr,等离子体功率为100W,刻蚀速度为8nm/min,使多个圆孔逐渐扩大,形成如图7所示的多个六角形孔,从而得到一种石墨烯超晶格结构。4) Etching is carried out with methane plasma, the etching temperature is 500°C, the pressure is 0.4Torr, the plasma power is 100W, and the etching speed is 8nm/min, so that multiple round holes are gradually enlarged, forming the Multiple hexagonal holes, resulting in a graphene superlattice structure.

根据本实施例,可以在步骤4)的基础上进行步骤5)继续用甲烷等离子体进行刻蚀,进一步扩大六角形孔,使各个六角形孔相互交叠,从而形成如图8所示的石墨烯量子点阵列。According to this embodiment, step 5) can be carried out on the basis of step 4) and continue to be etched with methane plasma to further expand the hexagonal holes so that each hexagonal hole overlaps each other, thereby forming graphite as shown in Figure 8 ene quantum dot array.

实施例3Example 3

本实施例提供一种石墨烯纳米图案的加工方法,与实施例2提供的方法基本相同,其区别在于所设计的三角点阵图案中点阵的取向与石墨烯晶向之间的角度不同,使b1与a1呈30°夹角,用甲烷等离子体进行刻蚀后,形成如图9所示的蜂窝状的石墨烯超晶格结构。The present embodiment provides a kind of processing method of graphene nano pattern, and the method that embodiment 2 provides is basically the same, and its difference is that the orientation of lattice in the designed triangular lattice pattern and the angle between graphene crystal direction are different, Make b 1 and a 1 form an included angle of 30°, and after etching with methane plasma, a honeycomb graphene superlattice structure as shown in FIG. 9 is formed.

根据本实施例,在形成如图9所示的蜂窝状的石墨烯超晶格结构后,还可以进行进一步的甲烷等离子体刻蚀,从而在相邻的两个六角形孔之间形成石墨烯纳米带。According to this embodiment, after forming the honeycomb graphene superlattice structure as shown in Figure 9, further methane plasma etching can also be carried out, thereby forming graphene between two adjacent hexagonal holes nanobelt.

实施例4Example 4

本实施例提供另一种石墨烯纳米图案的加工方法,与上述实施例的区别在于石墨烯晶向的确定方式,上述实施例中均通过石墨烯的边缘来确定石墨烯的晶向,这种方法确定的石墨烯晶向通常比较粗糙,本实施例提供一种新的方法,能够更精确地控制人工缺陷阵列的取向与石墨烯晶向之间的角度。This embodiment provides another method for processing graphene nanopatterns. The difference from the above-mentioned embodiments lies in the way of determining the crystal orientation of graphene. In the above-mentioned embodiments, the crystal orientation of graphene is determined by the edge of graphene. The graphene crystal orientation determined by the method is generally rough, and this embodiment provides a new method, which can more precisely control the angle between the orientation of the artificial defect array and the graphene crystal orientation.

本实施例提供的石墨烯纳米图案的加工方法,包括:The processing method of the graphene nano-pattern provided in this embodiment includes:

1)通过机械剥离法把石墨烯片转移到具有300nm氧化层的硅片基底上(300nm SiO2/Si);1) transfer the graphene sheet to a silicon substrate with a 300nm oxide layer (300nm SiO 2 /Si) by mechanical exfoliation;

2)在石墨烯片上刻蚀出一个小孔;2) Etching a small hole on the graphene sheet;

3)用氢等离子体刻蚀,将这个小孔扩展成六角形大孔,根据该六角形大孔的边缘的取向来确定石墨烯的晶格取向;3) with hydrogen plasma etching, the small hole is expanded into a hexagonal macropore, and the lattice orientation of graphene is determined according to the orientation of the edge of the hexagonal macropore;

4)在样品上旋涂一层PMMA光刻胶,用电子束曝光以及显影技术在光刻胶上形成多个圆孔,圆孔直径为50nm,该多个圆孔排列成如图4所示的正方点阵图案,并使该正方点阵的取向c1平行于石墨烯晶向a14) Spin-coat a layer of PMMA photoresist on the sample, and form a plurality of circular holes on the photoresist with electron beam exposure and development technology, the diameter of the circular holes is 50nm, and the multiple circular holes are arranged as shown in Figure 4 square lattice pattern, and make the orientation c 1 of the square lattice parallel to the graphene crystal direction a 1 ;

5)用氧等离子体进行刻蚀,将光刻胶上的正方点阵图案转移到石墨烯上,然后用丙酮将光刻胶清洗干净;5) Etching with oxygen plasma, transferring the square lattice pattern on the photoresist to the graphene, and then cleaning the photoresist with acetone;

6)用氢等离子体进行刻蚀,刻蚀温度为400℃,气压0.35Torr,氢等离子体功率为50W,刻蚀速度为4nm/min,使多个圆孔逐渐扩大,形成如图2d所示的多个六角形孔。6) Etching with hydrogen plasma, the etching temperature is 400°C, the gas pressure is 0.35Torr, the hydrogen plasma power is 50W, and the etching speed is 4nm/min, so that multiple round holes are gradually enlarged, forming the shape shown in Figure 2d multiple hexagonal holes.

本实施例中,也可以将人工缺陷点阵的结构设计成实施例2和3中的三角点阵,通过调整点阵取向和石墨烯取向之间的角度同样可以得到实施例2或3所得到的图案。In this embodiment, the structure of the artificial defect lattice can also be designed as the triangular lattice in Embodiment 2 and 3, and the angle obtained in Embodiment 2 or 3 can also be obtained by adjusting the angle between the lattice orientation and the graphene orientation. picture of.

根据本发明的一个实施例,其中还可以利用除机械法之外的其他方法把石墨烯片转移到基底上,该基底也不限于具有300nm氧化层的硅片,可以根据实际应用而选择其他材料的基底。According to an embodiment of the present invention, wherein the graphene sheet can also be transferred to the substrate by means other than the mechanical method, the substrate is not limited to a silicon wafer with a 300nm oxide layer, and other materials can be selected according to practical applications base.

根据本发明的一个实施例,其中人工缺陷的点阵图案不限于三角点阵和矩形点阵,点阵排列方向与石墨烯晶向之间的角度也不限于上述实施例中所描述的角度,本领域技术人员能够容易地根据所需石墨烯图案而设计出合适的点阵图案以及合适的角度。According to an embodiment of the present invention, the lattice patterns of artificial defects are not limited to triangular lattices and rectangular lattices, and the angle between the arrangement direction of lattices and the graphene crystal orientation is not limited to the angles described in the above-mentioned embodiments, Those skilled in the art can easily design a suitable lattice pattern and a suitable angle according to the desired graphene pattern.

根据本发明的一个实施例,其中人工缺陷的制造方法不限于光刻,也可以利用其他方法制造,如纳米压印、机械冲击、激光扫描等。人工缺陷的形状也不限于圆孔,也可以为方形孔、锥形孔等。According to an embodiment of the present invention, the manufacturing method of artificial defects is not limited to photolithography, and other methods can also be used, such as nanoimprinting, mechanical impact, laser scanning, etc. The shape of the artificial defect is not limited to a round hole, and may also be a square hole, a tapered hole, or the like.

根据本发明的一个实施例,其中人工缺陷的大小在几十至几百纳米。According to an embodiment of the present invention, the size of the artificial defect is tens to hundreds of nanometers.

根据本发明的一个实施例,含氢等离子体进行刻蚀的温度优选在室温至520℃,气压优选小于1Torr,含氢等离子体的功率优选在30-120W,蚀刻速度优选在15nm/min以下。According to an embodiment of the present invention, the etching temperature of the hydrogen-containing plasma is preferably from room temperature to 520° C., the pressure is preferably less than 1 Torr, the power of the hydrogen-containing plasma is preferably 30-120 W, and the etching rate is preferably below 15 nm/min.

最后所应说明的是,以上实施例仅用以说明本发明的技术方案而非限制。尽管参照实施例对本发明进行了详细说明,本领域的普通技术人员应当理解,对本发明的技术方案进行修改或者等同替换,都不脱离本发明技术方案的精神和范围,其均应涵盖在本发明的权利要求范围当中。Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than limit them. Although the present invention has been described in detail with reference to the embodiments, those skilled in the art should understand that modifications or equivalent replacements to the technical solutions of the present invention do not depart from the spirit and scope of the technical solutions of the present invention, and all of them should be included in the scope of the present invention. within the scope of the claims.

Claims (10)

1. the processing method of a graphene nano pattern comprises:
On Graphene, form artificial defect;
With containing hydrogen plasma this Graphene is carried out anisotropic etching.
2. method according to claim 1, wherein said artificial defect comprises the hole.
3. method according to claim 1, wherein said artificial defect can be arranged in the dot matrix pattern.
4. method according to claim 3, wherein said dot matrix pattern can be triangle dot matrix or rectangular lattice.
5. method according to claim 1, wherein artificial defect can form through photoetching, nano impression, mechanical shock, laser scanning.
6. method according to claim 1 wherein with containing the anisotropic etching of hydrogen plasma to Graphene, increases artificial defect gradually, till forming required pattern.
7. method according to claim 1, the parameter of wherein said hydrogeneous plasma etching is: reaction temperature, room temperature to 520 ℃; Air pressure is less than 1Torr; Plasma power, 30-120W; Etching speed was less than 15nm/ minute.
8. method according to claim 3 also comprises and confirms the Graphene crystal lattice orientation, and designs orientation and the angle between the Graphene crystal lattice orientation of the dot matrix pattern of said artificial defect.
9. method according to claim 8, confirm that wherein the method for Graphene crystal lattice orientation comprises:
On graphene film, etch an aperture;
Use hydrogeneous plasma etching, this aperture is extended to the hexagon macropore, confirm the crystal lattice orientation of Graphene according to the orientation at the edge of this hexagon macropore.
10. according to claim 1,6,7 or 9 described methods, wherein contain the plasma that hydrogen plasma comprises that hydrogen, methane, ethene, steam generate.
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