Summary of the invention
In view of this, be necessary to provide a kind of SAS interface testing tool that can make things convenient for the SAS interface on the accurate Test Host plate.
A kind of SAS interface testing tool; It comprises the public head of the anti-level of a SAS connector, at least one transmission cable and at least one SMA property; Said at least one transmission cable one end and said SAS connector electrically connect; The public head of the anti-level of the said at least one transmission cable other end and said at least one SMA property electrically connects (public 103 of the anti-level of said SMA property is the abbreviation of Sub-Miniature-A, and it is a kind of pipe straight coupling).Said SAS connector be used for motherboard on the SAS interface dock, the public head of the anti-level of said at least one SMA property is used to be connected to testing tool.
Compared with prior art, the SAS connector of SAS interface testing tool of the present invention can be directly with motherboard on the SAS interface dock, and be connected to testing tool, convenient test, accurately, and efficient is high through the public head of SMA.
Embodiment
To combine accompanying drawing that the present invention is done further explain below.
See also Fig. 1, a kind of SAS interface testing tool 10 provided by the invention, it is used for the signal of a motherboard to be tested 20 is transferred to an oscillograph 40.
Said SAS interface testing tool 10 comprises public 103 of the anti-level of a SAS connector 101, transmission cable 102, SMA property.Said transmission cable 102 1 ends and said SAS connector 101 electrically connect, and public 103 of the anti-level of said transmission cable 102 other ends and said SMA property electrically connects.Public 103 of the anti-level of said SMA property is the abbreviation of Sub-Miniature-A, and it is a kind of cylindrical joint.Public 103 contact pin that is provided with internal thread and is positioned at the central shaft position of the anti-level of said SMA property.It is understandable that public 103 of the anti-level of said SMA property also can be to be provided with external thread, the central shaft position is provided with the structure of jack.SAS connector 101 is used to be connected to a SAS interface 30 on the motherboard 20 to be tested.Public 103 of the anti-level of SMA property is used to connect oscillograph 40.Transmission cable 102 links to each other with SAS connector 101 and public 103 of the anti-level of SMA property through welding manner.
Said SAS connector 101 comprises at least one insulating body (not shown), and plurality of conductive terminals (not shown), and wherein said conducting terminal has a plurality of signal terminals (not shown).
Said transmission cable 102 is copper material preferably; Be provided with 4 pairs promptly 8; Said transmission cable 102 is connected to the weld part of the signal terminal of SAS connector 101 through welding manner, and the other end of said transmission cable 102 is connected to public 103 of the anti-level of SMA property through welding manner.
In this embodiment, each transmission cable 102 connects public 103 of the anti-level of SMA property respectively, and promptly SAS interface testing tool 10 is provided with public 103 of the anti-level of 8 SMA property altogether.
Said oscillograph 40 is a kind of testing tool, its be provided with 8 with the corresponding oscillograph input end 401 of the public head of the anti-level of SMA property.For example, public 103 of the anti-level of said SMA property has internal thread for the pipe shape and is positioned at the structure of the contact pin of central shaft position, and then oscillograph input end 401 has external thread for the pipe shape and is positioned at the structure of the jack of central shaft position.Said oscillograph 40 is used for the signal through SAS interface 30 Test Host plates 20, and said signal comprises parameters such as eye pattern, voltage transitions rate Slew Rate and Jitter.Jitter comes from a reference event and the deviation of ideal time, and reference event is the differential zero crossings mouth (differential zero crossing) of electron event and the nominal threshold level power level of optical system.Jitter is made up of determinacy content and Gauss's (at random) content.
SAS interface 30 on the motherboard 20 also is a SAS connector, and the SAS connector 101 with SAS interface testing tool 10 during test is inserted to the SAS interface 30 on the motherboard 20, and public 103 of the anti-level of SMA property is inserted to oscillograph input end 401.Power up the above-mentioned various parameters of testing under the situation through oscillograph 40 at motherboard 20.
Public 103 warp test of the anti-level of the SMA that the present invention adopts property, its impedance is 90.11926ohm~100.0917ohm.Penetration loss at 3GHz is 0.81425dB, is 0.87483dB at the penetration loss of 4GHz, consume maximum frequency point 3.7GHz, and penetrating consume is 1.605dB.Therefore, when the SAS interface signal on 10 pairs of motherboards 20 of SAS interface testing tool of the present invention was tested, external interference was little, can test desired parameters more accurately, and made simply convenient test.
It is understandable that those skilled in the art also can do other variation etc. and be used for design of the present invention in spirit of the present invention, as long as it does not depart from technique effect of the present invention and all can.These all should be included within the present invention's scope required for protection according to the variation that the present invention's spirit is done.