CN102331633A - Mother substrate used for detecting winding of array and detecting method thereof - Google Patents
Mother substrate used for detecting winding of array and detecting method thereof Download PDFInfo
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- CN102331633A CN102331633A CN201110281927A CN201110281927A CN102331633A CN 102331633 A CN102331633 A CN 102331633A CN 201110281927 A CN201110281927 A CN 201110281927A CN 201110281927 A CN201110281927 A CN 201110281927A CN 102331633 A CN102331633 A CN 102331633A
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- 239000000758 substrate Substances 0.000 title claims abstract description 59
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- 238000012360 testing method Methods 0.000 claims abstract description 104
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Abstract
The invention provides a mother substrate used for detecting winding of an array and a detecting method thereof. The mother substrate consists of a liquid crystal panel array and a testing area, wherein the liquid crystal panel array comprises m rows and n columns of liquid crystal panels, an array winding is arranged between grid electrode driving areas and source electrode driving areas in the liquid crystal panels, and the testing area further comprises a testing pad group and a testing line group which are electrically connected with each other. In addition, the testing line group penetrates through the area at which the liquid crystal panel array and the testing pad area are positioned. The array winding and the testing line group are electrically connected by virtue of an outgoing line group so as to detect the array winding in the liquid crystal panels, one end of the outgoing line group is electrically connected to the array winding of the liquid crystal panel, and the other end of the outgoing line group is electrically connected to the testing line group. Furthermore, the detection method is used for detecting the situation of the array winding by means of the outgoing line group through a detection system with strong observability.
Description
[technical field]
The present invention relates to a kind of mother substrate and detect on it array coiling group (Wire On Array in liquid crystal panel; WOA) method, particularly a kind of mother substrate of the p-wire group (shorting bar) that array coiling group in the liquid crystal panel is led to periphery and utilize the strong detection system array coiling group of a kind of observation to do the method for detection.
[background technology]
At LCD (Liquid Crystal Display; LCD) under the technological increasingly mature overall situation; The liquid crystal panel manufacturer of all parts of the world when developing more display techniques of upgrading, will guarantee the most basic panel yield for promoting from the competitive power in this field undoubtedly.
In the processing procedure of liquid crystal panel, generally be at a big glass substrate, also claim mother substrate (mother substrate), on produce a plurality of liquid crystal panels (Unit Cell), those liquid crystal panels are array distribution.Split processing procedure (Cutting Process) through cutting of later stage afterwards and cut apart, obtain a plurality of independently liquid crystal panels.Resulting liquid crystal panel number is relevant with the size of mother substrate usually from the mother substrate, and along with the lifting of modern liquid crystal panel production algebraically, the size of mother substrate is done bigger and bigger, and the disposable liquid crystal panel number of doing has also just increased.Thereby the cost of liquid crystal panel reduces relatively, makes lcd technology come into daily life more.Also diversification of the application of liquid crystal panel in addition, present LCD, the utilization on the mobile phone display screen have been widely known.
Please with reference to Fig. 1, Fig. 1 is the vertical view of the mother substrate of prior art.Mother substrate 10 is provided with a liquid crystal panel array 11, a test section 12.Be provided with a plurality of liquid crystal panels 110 in this liquid crystal panel array 11, and those display panels 110 press m capable with the n column distribution, so that number is m * n is individual.Be provided with a plurality of testing cushion groups 120 in this test section 12, and each testing cushion group 120 further comprises testing cushion 120a, testing cushion 120b, testing cushion 120c, testing cushion 120d and testing cushion 120e.Between a plurality of liquid crystal panels of a plurality of p-wire groups 13 in liquid crystal panel array 11 and test section 12 and the liquid crystal panel array 110, and electrically connect with testing cushion group 120 respectively.Specifically please with reference to shown in Fig. 1 a.
In Fig. 1 a, Fig. 1 a is the enlarged drawing of single liquid crystal panel among Fig. 1.In liquid crystal panel 110, be provided with viewing area 111, gate driving district 121, source drive district 131 and array coiling group 141.In the periphery of liquid crystal panel 110, p-wire group 130 includes p-wire 130a, p-wire 130b, p-wire 130c, p-wire 130d and p-wire 130e.For making whole mother substrate 10 through a plurality of testing cushion group 130 external voltages of going up; Be electrically connected at that testing cushion 120b, p-wire 130c are electrically connected at testing cushion 120c, p-wire 130c is electrically connected at testing cushion 120d so there is p-wire 130a to be electrically connected at testing cushion 120a, p-wire 130b, and p-wire 130e is electrically connected at testing cushion 120e.
In common liquid crystal panel, mainly be distributed with three types of workspaces, i.e. perimeter circuit district, drive circuit area and viewing area.Wherein, the perimeter circuit district comprises the circuit of a plurality of positions, as the cabling between the cabling between drive circuit area and the pixel region, a plurality of driving circuit and some flexible circuit boards (Flexible Printed Circuit, FPC).There is necessary relation in those workspaces: at first FPC connects external-connected port, and with the outer signal voltage transmission to driving circuit, driving circuit is again through the demonstration that required image is carried out in the line traffic control viewing area of walking between itself and the viewing area then.Therefore, these three types of workspaces interdepend in the operate as normal of liquid crystal panel, and are indispensable, and it is necessary therefore it being carried out strict wireline inspection.
In the whole processing procedure of a liquid crystal panel,, more ripe to the relative perimeter circuit of the detection of viewing area according to present detection means.FPC in the perimeter circuit is just attached to the corresponding driving circuit region in the module stage, so split processing procedure (Cutting Process) before cutting, more is that the circuit that directly is made on the substrate is done detection.Yet in the detection of circuit, more be in module group procedure (Module Process) in this respect, relevant chip placing after corresponding drive zone, is just detected.There is the consequence that is difficult to expect in such detection, if just detect the perimeter circuit existing problems this moment, the chip for driving of settling before then can making is scrapped, and has caused the cost waste exactly.Later the phase is carried out corresponding laser repair to the problem perimeter circuit if come round, and can increase manufacturing cost equally.So, can reach better effect if fruit can detect perimeter circuit in the early stage that panel is made.
[summary of the invention]
The present invention provides a kind of mother substrate; It effectively utilizes the p-wire group, and extra increase extension line group leads to peripheral test line group with array coiling group in the liquid crystal panel, sees through the strong detection system of observation again; Such as Phototronics; Array coiling group is done accurate reliability and is detected, and avoids the later stage to adopt laser repair, reduces unnecessary cost waste and corresponding raising and produces yield.
The present invention proposes a kind of mother substrate that is used for detecting the coiling of liquid crystal panel array, comprises a liquid crystal panel array, a test section and an extension line group.The liquid crystal panel array further is made up of the liquid crystal panel that comprises a viewing area, a gate driving district, one source pole drive zone and an array coiling group.The test section is arranged at the periphery of liquid crystal panel array, and it further comprises p-wire group and the testing cushion group that is electrically connected to each other, and the p-wire group is through the zone between the liquid crystal panel of zone between test section and liquid crystal panel array or liquid crystal panel array.The p-wire group comprises many p-wires, and the testing cushion group comprises a plurality of testing cushion.The extension line group is arranged between the array coiling group and p-wire group of liquid crystal panel, and an end and array coiling group electrically connect, and the other end and p-wire group electrically connect.The extension line group comprises many extension lines.
Among one of the present invention's the embodiment, the p-wire group in the above-mentioned liquid crystal panel array is electrically connected to the testing cushion group in the test section.
Among one of the present invention's the embodiment, above-mentioned array coiling is electrically connected to an end of extension line separately, and wherein the array coiling is connected to different extension lines and does not repeat.
Among one of the present invention's the embodiment, the other end of above-mentioned extension line is electrically connected at the p-wire in the p-wire group separately, and wherein extension line is connected to many p-wires and does not repeat.
Among one of the present invention's the embodiment, the other end of above-mentioned extension line is electrically connected at the p-wire in the p-wire group separately, and wherein extension line is connected to many p-wires and part repetition.
Among one of the present invention's the embodiment, the other end of above-mentioned extension line is electrically connected at the p-wire in the p-wire group separately, and wherein extension line is connected to same p-wire.
Among one of the present invention's the embodiment, in the above-mentioned liquid crystal panel array, one group of p-wire group is electrically connected to one group of testing cushion group.
One of the present invention's is in the instance, in the above-mentioned liquid crystal panel array, organizes the p-wire group more and is electrically connected to same group of testing cushion group.
The present invention provides the method for array coiling group in a kind of liquid crystal panel that detects mother substrate in addition, comprises at first, and above-mentioned mother substrate and detection system are provided; Secondly, with the testing cushion group of the electrical pressing of probe frame on mother substrate of detection system, and open display; Voltage on the selectively unlocking testing cushion group then; Again, the voltage on the unlatching regulator; Again, the light source of the detector of open detection system, the collocation regulator scans liquid crystal panel, sees through the display of detection system at last, analyzes and judge the situation of array coiling group in the liquid crystal panel.
According to the above, detection person can be directly observes the situation of array coiling group in the liquid crystal panel of mother substrate through detection system, more can do detection to the short-circuit condition or the open-circuit condition of array coiling.Prior advantage is that through this detection method, detection person can accurately find out the array coiling and have unusual position.
For letting the above-mentioned feature and advantage of the present invention can be more obviously understandable, hereinafter is special lifts embodiment, and cooperates appended graphic elaborating as follows.
[description of drawings]
Fig. 1 is the vertical view of the mother substrate of prior art;
Fig. 1 a is the enlarged drawing of single liquid crystal panel;
Fig. 2 is the vertical view of mother substrate of the present invention;
Fig. 2 a is the synoptic diagram of first embodiment of extension line syndeton of the present invention;
Fig. 2 b is the synoptic diagram of second embodiment of extension line syndeton of the present invention;
Fig. 2 c is the synoptic diagram of the 3rd embodiment of extension line syndeton of the present invention;
Fig. 3 is the side view that the present invention detects with required detection system;
Fig. 4 is the schematic flow sheet of detection method of the present invention;
Fig. 5 is the synoptic diagram of first embodiment of detection method of the present invention;
Fig. 6 is the synoptic diagram of second embodiment of detection method of the present invention.
[embodiment]
This description does not limit the scope of the invention.The m, the n that at first have in the liquid crystal panel array of m * n structure can get arbitrary value, because in actual production, m, n can change under certain value condition each other; Then, " in regular turn " speech of in instructions, mentioning, being not restricted to is the electric connection of being done by same letter numbering in the present embodiment, more can refer to the electric connection of doing according to the order of certain rule; Secondly; The extension line number that array coiling number that the p-wire number that the testing cushion number that the testing cushion group that relates in this instructions comprises, p-wire group comprise, array coiling group comprise and extension line group comprise; Be not restricted to number shown in the accompanying drawing, it is decided according to actual production is required.
First embodiment
At first please with reference to Fig. 2, and simultaneously with reference to Fig. 2 a, Fig. 2 is the schematic top plan view of mother substrate of the present invention, and Fig. 2 a is the synoptic diagram of first embodiment of extension line of the present invention and p-wire syndeton, and the while can be regarded the enlarged drawing of single liquid crystal panel on the mother substrate as.In Fig. 2, mother substrate 20 is provided with a liquid crystal panel array 21, a test section 22.Be provided with a plurality of liquid crystal panels 210 in this liquid crystal panel array 21, and those liquid crystal panels 210 are pressed the capable n column distribution of m in this liquid crystal panel array 21, so number is m * n.Be provided with a plurality of testing cushion groups 220 in this test section 22, and each testing cushion group 220 further comprises testing cushion 220a, testing cushion 220b, testing cushion 220c, testing cushion 220d and testing cushion 220e.A plurality of p-wire groups 230 are through the zone between liquid crystal panel 210 and the test section 22, or the zone between a plurality of liquid crystal panels 210 in the liquid crystal panel array 21, and electrically connect with testing cushion group 220.Specifically please with reference to shown in Fig. 2 a.
Among Fig. 2 a; P-wire group 230 is arranged outside liquid crystal panel 210; P-wire group 230 comprises p-wire 230a, p-wire 230b, p-wire 230c, p-wire 230d and p-wire 230e; Make mother substrate 20 through the testing cushion group 220 external voltages of going up for reaching simultaneously; Have p-wire group 230 and testing cushion group 220 to electrically connect, have particularly: p-wire 230a is electrically connected at testing cushion 220a, p-wire 230b and is electrically connected at that testing cushion 220b, p-wire 230c are electrically connected at testing cushion 220c, p-wire 230d is electrically connected at testing cushion 220d, and p-wire 230e is electrically connected at testing cushion 220e.Viewing area 211, gate driving district 221, source drive district 231 are arranged and as the array coiling group of perimeter circuit in liquid crystal panel 210.Like the array coiling group 250 that Fig. 2 a is illustrated, it is electrically connected at gate driving district 221 and source drive district 231.For detecting array coiling group 250 shown in Fig. 2 a, the present invention is designed with an extension line group 240 on this mother substrate 20, and one of which end and array coiling group 250 electrically connect, and the other end and p-wire group 230 electrically connect.Wherein, this extension line group 240 comprises extension line 240a, extension line 240b, extension line 240c, extension line 240d and extension line 240e.In Fig. 2 a, shown a kind of syndeton of extension line, extension line group 240 1 ends that electrically connect with p-wire group 230 have following syndeton: have array coiling 250a electrically to lead to p-wire 230a through extension line 240a; Array coiling 250b electrically leads to p-wire 230b through extension line 240b; Array coiling 250c electrically leads to p-wire 230c through extension line 240c; Array coiling 250d electrically leads to p-wire 230d through extension line 240d; Array coiling 250e electrically leads to p-wire 230e through extension line 240e.Certainly, from the same idea of present embodiment, that is to say that extension line electrically connects by man-to-man relation and p-wire, all is within the scope of the invention.
Then the present invention needs by a detection system Phototronics array coiling group in the liquid crystal panel to be detected, and please with reference to Fig. 3, Fig. 3 is the side view that the present invention detects with required detection system.Among Fig. 3, this detection system 30 functional module from bottom to top includes a probe frame 31 (Probe Frame), a regulator 32 (Modulator), a detector 33 (Detector) and a display (not shown).In addition, further include a reflection horizon 321 and a liquid crystal layer 322 in the regulator 32; Detector 33 also further comprises a light source (not shown) and a receiving element (not shown); Other has a display (not shown) signal to be connected in detector 330.Use mother substrate shown in Figure 2; Working mechanism in this simple declaration detection system 30: it is through the voltage of testing cushion group 220 on the selectively unlocking mother substrate 20 (the testing cushion group of being made up of testing cushion 220a, testing cushion 220b, testing cushion 220c, testing cushion 220d and testing cushion 220e 220 as shown in Figure 3); For liquid crystal panel 210 to be detected provides voltage; Utilize the voltage difference between test solution crystal panel 210 and the regulator 32; The liquid crystal layer 321 that orders about in the regulator 32 deflects, and the light of being up to from the light source of detector 33 afterwards has reflection horizon 322 reflection on regulator 32, this reflected light wear long overshoot liquid crystal layer 322; Accept by the receiving element of detector 33 again, carry out image through display at last and show.This detection system 30 has an advantage when doing wireline inspection; Promptly only voltage need be provided on the line; Need not to make circuit to form current return; Just can correspondingly demonstrate the image of corresponding line through this detection system 30, so detection person can find the position of unusual circuit more accurately.
Please with reference to Fig. 4, Fig. 4 is the schematic flow sheet of detection method of the present invention again.At first, carry out S41, the 31 electrical pressings of probe frame in the testing cushion group 220 around mother substrate 20 peripheries, are opened display; Then carry out S42, optionally open testing cushion group 220 through probe frame 31 by the detection demand, this moment external voltage just successively through testing cushion group 220, p-wire group 230 and extension line group 240, finally deliver on the array coiling group in the liquid crystal panel 210 214; Execution in step S43 opens the voltage on the regulator 32 then, has voltage difference between liquid crystal panel 210 that this moment is tested and the regulator 32, and the liquid crystal layer 321 in the regulator 32 just can deflect under the driving of voltage difference; At last, through step S44, the probe source of opening on the detector 33 scans regulator 32, can demonstrate on the display thereupon the circuit image of array coiling in the liquid crystal panel of surveying 210, at this moment, but just Direct observation image of detection person and is done and is analyzed S45.Through as above step, just accomplish detection to a liquid crystal panel, through step S46, next one liquid crystal panel 210 to be measured is done detection again, finish up to final detection.
Second embodiment
Please with reference to Fig. 2, this embodiment difference is the syndeton of extension line and p-wire once more, please refer to Fig. 2 b.
Fig. 2 b is the synoptic diagram of second embodiment of extension line of the present invention and p-wire syndeton.In Fig. 2 b, p-wire group 230 is arranged outside liquid crystal panel 210, p-wire group 230 comprises p-wire 230a, p-wire 230b, p-wire 230c, p-wire 230d and p-wire 230e.Make mother substrate 20 through the testing cushion group 220 external voltages of going up for reaching simultaneously; There are p-wire group 230 and p-wire group 220 to electrically connect; Have particularly: p-wire 230a is electrically connected at testing cushion 220a, p-wire 230b and is electrically connected at that testing cushion 220b, p-wire 230c are electrically connected at testing cushion 220c, p-wire 230d is electrically connected at testing cushion 220d, and p-wire 230e is electrically connected at testing cushion 220e.Array coiling group 250, gate driving district 221 and source drive district 231 are arranged in liquid crystal panel 210 and organize around choosing as the array of perimeter circuit.Like the array coiling group 250 that Fig. 2 b is illustrated, it is electrically connected at gate driving district 221 and source drive district 231.For detecting array coiling group 250 shown in Fig. 2 b, the present invention is designed with an extension line group 340 on this mother substrate 20, and one of which end and array coiling group 250 electrically connect, and the other end and p-wire group 230 electrically connect.Wherein, this extension line group 340 comprises extension line 340a, extension line 340b, extension line 340c, extension line 340d and extension line 340e.In Fig. 2 b, shown the syndeton of another kind of extension line and p-wire, extension line group 340 1 ends that electrically connect with p-wire group 230 have following syndeton: have array coiling 250a electrically to lead to p-wire 230c through extension line 340a; Array coiling 250b electrically leads to p-wire 230d through extension line 340b; Array coiling 250c electrically leads to p-wire 230e through extension line 340c; Array coiling 250d electrically leads to p-wire 230e through extension line 340d; Array coiling 250e is electrically connected at p-wire 230e through extension line 340e.Certainly, from the same idea of present embodiment, that is to say that the part extension line electrically connects by many-to-one relation and p-wire, the part extension line all is within the scope of the invention by man-to-man relation and p-wire electric connection.
Afterwards when detecting the liquid crystal panel 210 of structure shown in Fig. 2 b, the detection system 30 shown in Figure 3 of arranging in pairs or groups, and detect by step shown in Figure 4 and get final product, its description is identical with first embodiment, so can repeat no more at this with reference to first embodiment enforcement.
The 3rd embodiment
Please with reference to Fig. 2, this embodiment difference is the syndeton of extension line and p-wire once more, please refer to Fig. 2 c.
Fig. 2 c is the synoptic diagram of the 3rd embodiment of extension line of the present invention and p-wire syndeton.In Fig. 2 c, p-wire group 230 is arranged outside liquid crystal panel 210, this p-wire group 230 includes p-wire 230a, p-wire 230b, p-wire 230c, p-wire 230d and p-wire 230e.Make whole mother substrate 20 through the testing cushion group 214 external voltages of going up for reaching simultaneously; Have p-wire 230a to be electrically connected at testing cushion 220a, p-wire 230b and be electrically connected at that testing cushion 220b, p-wire 230c are electrically connected at testing cushion 220c, p-wire 230d is electrically connected at testing cushion 220d, and p-wire 230e is electrically connected at testing cushion 220e.Array coiling group 250, gate driving district 221, source drive district 231 are arranged and as the array coiling group of perimeter circuit in liquid crystal panel 210.Like the array coiling group 250 that Fig. 2 c is illustrated, it is electrically connected at gate driving district 221 and source drive district 231.For detecting array coiling group 250 shown in Fig. 2 c, the present invention is designed with an extension line group 440 on this mother substrate 20, and one of which end and array coiling group 250 electrically connect, and the other end and p-wire group 230 electrically connect.Wherein, this extension line group 440 comprises extension line 440a, extension line 440b, extension line 440c, extension line 440d and extension line 440e.In Fig. 2 c, shown the syndeton of another kind of extension line and p-wire, extension line group 440 1 ends that electrically connect with p-wire group 230 have following syndeton: have array coiling 250a electrically to lead to p-wire 230e through extension line 440a; Array coiling 250b electrically leads to p-wire 230e through extension line 440b; Array coiling 250c electrically leads to p-wire 230e through extension line 440c; Array coiling 250d electrically leads to p-wire 230e through extension line 440d; Array coiling 250e electrically leads to p-wire 230e through extension line 440e.Certainly, from the same idea of present embodiment, that is to say that extension line electrically connects by many-to-one relation and p-wire, all is within the scope of the invention.
Afterwards when detecting the liquid crystal panel 210 of structure shown in Fig. 2 c, the detection system 30 shown in Figure 3 of arranging in pairs or groups, and detect by step shown in Figure 4 and get final product, its description is identical with first embodiment, so can repeat no more at this with reference to first embodiment enforcement.
In the present invention, other provides high efficiency detection method, further demonstrates several kinds and can do the method that high-level efficiency detects.
In addition, mother substrate 20 as shown in Figure 2, p-wire group 230 also has another kind of syndeton with testing cushion group 220, and please with reference to Fig. 6, Fig. 6 is the synoptic diagram of second embodiment of detection method of the present invention.In the mother substrate design initial; We can do electric connection with two p-wire groups 230 simultaneously with a testing cushion group 220; And will be separately the p-wire group 230 corresponding institutes liquid crystal panel 210 of being expert at do electric connection by one of syndeton of aforementioned three kinds of extension lines and p-wire, half testing cushion group 220 capable of using like this detects all liquid crystal panels 210 in the whole liquid crystal panel array 21.Certainly; From similarly considering; Can need according to actual detected, a testing cushion group 220 is done electric connection with the p-wire group 23 more than three and three simultaneously, so just realize opening the voltage on the less testing cushion group 220; Reach the more purpose of multirow liquid crystal panel 210 detections, also play energy-conservation effect.
What be worth mentioning at last is, the extension line group that designs on the mother substrate of the present invention, and can be after detecting step and accomplishing cut to split in the processing procedure is cut off, and no longer as his usefulness, can not exert an influence during follow-up processing procedure and product used.
The present invention's most preferred embodiment has disclosed as above; So be not in order to limiting the present invention, anyly be familiar with this art, in spirit that does not break away from the present invention and scope; When can doing a little change and retouching, so the present invention's protection domain is as the criterion when looking claims scope person of defining.
Claims (11)
1. mother substrate that is used for detecting liquid crystal panel array coiling group, this mother substrate comprises:
One liquid crystal panel array, it is made up of a plurality of liquid crystal panel, and this liquid crystal panel comprises:
One viewing area, a gate driving district, one source pole drive zone and an array coiling group, wherein array coiling group is made up of many strip array coilings;
One test section, it is arranged at the periphery of this liquid crystal panel array, and this test section comprises:
An one p-wire group and a testing cushion group; Wherein this p-wire group and this testing cushion group are electrically connected to each other; And this p-wire group is through the zone between the liquid crystal panel of zone between this test section and this liquid crystal panel array or liquid crystal panel array; This p-wire group is made up of many p-wires again, and this testing cushion group is made up of a plurality of testing cushion; And
One extension line group, it is arranged between the array coiling group and this p-wire group of this liquid crystal panel, and this extension line group one end and the electric connection of this array coiling group, and the other end and this p-wire group electrically connect, and wherein this extension line group is made up of many extension lines.
2. be used for detecting the mother substrate of liquid crystal panel array coiling group according to claim 1, it is characterized in that: those array coilings are electrically connected to those extension line one ends separately, and wherein those array coilings are connected to different extension lines and do not repeat.
3. be used for detecting the mother substrate of liquid crystal panel array coiling group according to claim 1, it is characterized in that: those extension line other ends are electrically connected at the p-wire in this p-wire group separately, and wherein those extension lines are connected to many p-wires and do not repeat.
4. like the said mother substrate that is used for detecting liquid crystal panel array coiling group of claim 3, it is characterized in that: the other end of those extension lines is electrically connected to the order of those p-wires for connecting in regular turn.
5. be used for detecting the mother substrate of liquid crystal panel array coiling group according to claim 1, it is characterized in that: those extension line other ends are electrically connected at the p-wire in this p-wire group separately, and wherein those extension lines are connected to same p-wire.
6. be used for detecting the mother substrate of liquid crystal panel array coiling group according to claim 1, it is characterized in that: those extension line other ends are electrically connected at the p-wire in this p-wire group separately, and wherein those extension lines are connected to many p-wires and part repetition.
7. be used for detecting the mother substrate of liquid crystal panel array coiling group according to claim 1, it is characterized in that: in this liquid crystal panel array, be electrically connected to a testing cushion group respectively with the corresponding respectively p-wire group of respectively organizing of each row liquid crystal panel.
8. be used for detecting the mother substrate of liquid crystal panel array coiling group according to claim 1, it is characterized in that: in this liquid crystal panel array, be electrically connected to same testing cushion group with the corresponding respectively many groups p-wire group of each row liquid crystal panel.
9. method that is used for detecting the liquid crystal panel array coiling group of mother substrate, it may further comprise the steps:
One mother substrate and a detection system are provided;
With the electrical pressing of probe frame this testing cushion group on this mother substrate of this detection system, and open display;
Through surveying the voltage on the frame selectively unlocking testing cushion group;
Open the voltage on the regulator;
Open the light source of the detector of this detection system, the collocation regulator scans liquid crystal panel;
See through the display of this detection system, analyze and judge the situation of array coiling group in the liquid crystal panel.
10. like the said method that is used for detecting the liquid crystal panel array coiling group of mother substrate of claim 9; It is characterized in that: the p-wire group with the liquid crystal panel of delegation in this mother substrate is electrically connected to same group of testing cushion to same group of testing cushion group, is able to test simultaneously the array coiling situation with delegation's liquid crystal panel.
11. like the said method that is used for detecting the liquid crystal panel array coiling group of mother substrate of claim 9; It is characterized in that: the p-wire group of the liquid crystal panel of multirow is electrically connected to same group of testing cushion group in this mother substrate, is able to test simultaneously the array coiling situation of the liquid crystal panel of multirow.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110281927A CN102331633A (en) | 2011-09-21 | 2011-09-21 | Mother substrate used for detecting winding of array and detecting method thereof |
| TW100137784A TWI578059B (en) | 2011-09-21 | 2011-10-18 | A mother substrate including detecting wires on array and a method for detecting the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110281927A CN102331633A (en) | 2011-09-21 | 2011-09-21 | Mother substrate used for detecting winding of array and detecting method thereof |
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| CN102331633A true CN102331633A (en) | 2012-01-25 |
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| CN201110281927A Pending CN102331633A (en) | 2011-09-21 | 2011-09-21 | Mother substrate used for detecting winding of array and detecting method thereof |
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| CN (1) | CN102331633A (en) |
| TW (1) | TWI578059B (en) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102789076A (en) * | 2012-08-01 | 2012-11-21 | 深圳市华星光电技术有限公司 | Detection circuit and manufacturing method for liquid crystal display panel |
| CN103018936A (en) * | 2012-12-14 | 2013-04-03 | 京东方科技集团股份有限公司 | Probe framework of detection equipment for array substrate and detection equipment |
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| CN104656292A (en) * | 2015-03-17 | 2015-05-27 | 京东方科技集团股份有限公司 | Array substrate and manufacturing method thereof, display panel and testing method thereof, and display device |
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| CN102789076B (en) * | 2012-08-01 | 2016-02-03 | 深圳市华星光电技术有限公司 | The method for making of a kind of detection line and display panels |
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| CN102789076A (en) * | 2012-08-01 | 2012-11-21 | 深圳市华星光电技术有限公司 | Detection circuit and manufacturing method for liquid crystal display panel |
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| CN103018936B (en) * | 2012-12-14 | 2015-12-02 | 京东方科技集团股份有限公司 | A kind of prober frame of array substrate detection equipment and checkout equipment |
| CN103995370A (en) * | 2014-05-29 | 2014-08-20 | 深圳市华星光电技术有限公司 | Wiring device of detecting terminals and liquid crystal display |
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| CN104656292B (en) * | 2015-03-17 | 2018-04-17 | 京东方科技集团股份有限公司 | Array base palte and manufacture method, display panel and its test method, display device |
| CN105607316A (en) * | 2016-03-22 | 2016-05-25 | 京东方科技集团股份有限公司 | Array substrate mother board and display panel mother board |
| WO2017161893A1 (en) * | 2016-03-22 | 2017-09-28 | Boe Technology Group Co., Ltd. | Array substrate motherboard, display panel motherboard, and fabricating method thereof |
| US10254602B2 (en) | 2016-03-22 | 2019-04-09 | Boe Technology Group Co., Ltd | Array substrate motherboard, display panel motherboard, and fabricating method thereof |
| US10558101B2 (en) | 2016-03-22 | 2020-02-11 | Boe Technology Group Co., Ltd. | Array substrate motherboard, display panel motherboard, and fabricating method thereof |
| WO2019010753A1 (en) * | 2017-07-12 | 2019-01-17 | 深圳市华星光电半导体显示技术有限公司 | Goa test circuit and goa test method |
| US10262564B2 (en) | 2017-07-12 | 2019-04-16 | Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd | Test circuit of gate driver on array and test method of gate driver on array |
| CN108362712A (en) * | 2018-03-14 | 2018-08-03 | 京东方科技集团股份有限公司 | A kind of substrate motherboard and its detection method |
| US10943344B2 (en) | 2018-03-14 | 2021-03-09 | Boe Technology Group Co., Ltd. | Detection method for display panel motherboard and display panel motherboard |
| CN109102768A (en) * | 2018-09-26 | 2018-12-28 | 京东方科技集团股份有限公司 | A kind of array substrate motherboard and its detection method |
| CN109102768B (en) * | 2018-09-26 | 2022-01-28 | 京东方科技集团股份有限公司 | Array substrate mother board and detection method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI578059B (en) | 2017-04-11 |
| TW201314292A (en) | 2013-04-01 |
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