CN102323043B - Vertical testing scheme of light emitting diode - Google Patents
Vertical testing scheme of light emitting diode Download PDFInfo
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- CN102323043B CN102323043B CN2011102740420A CN201110274042A CN102323043B CN 102323043 B CN102323043 B CN 102323043B CN 2011102740420 A CN2011102740420 A CN 2011102740420A CN 201110274042 A CN201110274042 A CN 201110274042A CN 102323043 B CN102323043 B CN 102323043B
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- light emitting
- emitting diode
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- 238000012360 testing method Methods 0.000 title claims abstract description 24
- 239000000523 sample Substances 0.000 claims abstract description 5
- 238000001514 detection method Methods 0.000 claims description 3
- 238000012216 screening Methods 0.000 abstract 1
- 238000004020 luminiscence type Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 238000004134 energy conservation Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000012353 t test Methods 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
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Abstract
The invention relates to a vertical testing scheme of a light emitting diode, which comprises the steps of: firstly, screening the light emitting diode through a vertical vibration disk to ensure that the light emitting surface of the light emitting diode upwards enters the most front end of the vibration disk; secondly, sucking the vertical light emitting diode from the most front end of the vibration disk through a feeding device, placing in a suction nozzle of a rotary working table, sucking and attaching the light emitting diode on the suction nozzle from the lateral side by the suction nozzle in vacuum; and finally, clamping a pin of the light emitting diode from the lateral surface by a horizontally clamped probe, electrifying, and detecting. The testing mode is consistent with the testing mode of other types of light emitting diodes, thus a testing device of the light emitting diode with a lateral light emitting is better exchanged with testing devices of other types of light emitting diodes.
Description
Technical field
The present invention relates to a kind of LED test scheme, further relate to a kind of by changing the testing scheme of light emitting diode placement location.
Background technology
Several aspects important in the optical parametric of LED are exactly: luminous flux, luminescence efficiency, luminous intensity, light distribution, wavelength.Luminescence efficiency has characterized the energy conservation characteristic of light source, and this is an important indicator weighing modern light source performance.Therefore, before dispatching from the factory, must test diode by diode.
The testing scheme of existing market upside light emitting-type patch light-emitting diode all is by suction nozzle light emitting diode to be adsorbed on the disk, then disk integral body is pressed down, the pin that makes light emitting diode contacts with following probe assembly, thereby make the light emitting diode electrified light emitting, with the pick-up unit that install the side light emitting diode is tested.
The shortcoming of existing scheme is, the patch light-emitting diode that this kind testing scheme can only the offside light emitting-type is effective, can't test for the light emitting diode that accounts for the very big top emission type of the market share.
Summary of the invention
In view of above content, be necessary to provide a kind of compatibility test scheme of testing side and top light emitting diode simultaneously.
The invention provides the vertical testing scheme of a kind of led of side view type, this scheme comprises:
At first: by upright removing from mould vibrating disc light emitting diode is screened, side light-emitting diode (led) light-emitting area is being stood up entered vibrating disc foremost;
The side light-emitting diode (led) that will stand by feeding device is put in the suction nozzle of rotation work dish from vibrating disc sucking-off foremost then, by suction nozzle light emitting diode is adsorbed from the side to be close on the suction nozzle;
By the probe of level clamping, clamp the pin of side light-emitting diode (led) from the side at last, energising, detection.
The present invention puts into suction nozzle by side light emitting-type patch light-emitting diode is being stood, make side light emitting-type patch light-emitting diode light emission direction up, thereby well make it consistent with the test mode of top emission type light emitting diode, thereby the interchangeability of the checkout equipment of the checkout equipment of side light-emitting diode (led) and top emission type light emitting diode is strengthened greatly.
Compared with prior art, the invention has the advantages that:
Because this kind test mode is consistent with the test mode of other types light emitting diode, so can make side light emitting-type testing apparatus and the fine exchange of other types LED test equipment.
The invention will be further described in conjunction with the embodiments with reference to the accompanying drawings.
Description of drawings
Fig. 1 is the process flow diagram of the vertical testing scheme of light emitting diode of the present invention.
Embodiment
See also Fig. 1, the vertical testing scheme of a kind of light emitting diode of preferred embodiment provided by the present invention, this scheme comprises:
At first: by side light emitting-type vibrating disc light emitting diode is screened, side light-emitting diode (led) light-emitting area is being stood up entered vibrating disc foremost;
The side light-emitting diode (led) that will stand by feeding device is put in the suction nozzle of rotation work dish from vibrating disc sucking-off foremost then, by suction nozzle the side light-emitting diode (led) is adsorbed from the side to be close on the suction nozzle;
By the probe of level clamping, clamp the pin of side light-emitting diode (led) from the side at last, energising, detection.
The present invention is primarily aimed at the improvement that the LED test scheme is carried out, the above only is preferred embodiment of the present invention, non-so namely limit to claim of the present invention, so simple and easy variation and the equivalent transformation of doing with instructions of the present invention and graphic content all should be contained in the claim of the present invention such as.
Claims (1)
1. vertical testing scheme of light emitting diode, this scheme comprises:
At first: by upright removing from mould vibrating disc light emitting diode is screened, lumination of light emitting diode is faced up upright enter vibrating disc foremost;
The light emitting diode that will stand by feeding device is put in the suction nozzle of rotation work dish from vibrating disc sucking-off foremost then, by suction nozzle light emitting diode is adsorbed from the side to be close on the suction nozzle;
By the probe of level clamping, clamp the pin of light emitting diode from the side at last, energising, detection.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011102740420A CN102323043B (en) | 2011-09-15 | 2011-09-15 | Vertical testing scheme of light emitting diode |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011102740420A CN102323043B (en) | 2011-09-15 | 2011-09-15 | Vertical testing scheme of light emitting diode |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102323043A CN102323043A (en) | 2012-01-18 |
| CN102323043B true CN102323043B (en) | 2013-08-14 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011102740420A Active CN102323043B (en) | 2011-09-15 | 2011-09-15 | Vertical testing scheme of light emitting diode |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102323043B (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102914424A (en) * | 2012-11-14 | 2013-02-06 | 深圳市华腾半导体设备有限公司 | Bottom testing method |
| CN103245901A (en) * | 2013-04-26 | 2013-08-14 | 东莞市福地电子材料有限公司 | A flip-chip LED chip testing machine and testing method |
| CN103983350B (en) * | 2014-05-13 | 2016-06-01 | 保定维特瑞交通设施工程有限责任公司 | The device of test traffic display unit parallel optical axis luminous intensity variations |
| CN104635180A (en) * | 2015-02-05 | 2015-05-20 | 深圳市华腾半导体设备有限公司 | Vacuum suction test method for electronic component |
| CN110189669B (en) * | 2019-06-12 | 2022-07-12 | 深圳市华星光电半导体显示技术有限公司 | Lighting test fixture and test method |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI236530B (en) * | 2004-07-29 | 2005-07-21 | Chroma Ate Inc | Automatic optical characteristics testing apparatus and method for light emitting device |
| CN201713110U (en) * | 2010-05-27 | 2011-01-19 | 广州敏瑞汽车零部件有限公司 | Rivet conveyer |
| JP2011033508A (en) * | 2009-08-03 | 2011-02-17 | Showa Denko Kk | Device and method of measuring characteristic of measured object, program and light-emitting body |
| CN201886118U (en) * | 2010-06-01 | 2011-06-29 | 展晶科技(深圳)有限公司 | Light-emitting diode (LED) test jig |
| CN102118960A (en) * | 2010-12-27 | 2011-07-06 | 东莞市新泽谷机械有限公司 | Irregular component plug-in machine |
-
2011
- 2011-09-15 CN CN2011102740420A patent/CN102323043B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI236530B (en) * | 2004-07-29 | 2005-07-21 | Chroma Ate Inc | Automatic optical characteristics testing apparatus and method for light emitting device |
| JP2011033508A (en) * | 2009-08-03 | 2011-02-17 | Showa Denko Kk | Device and method of measuring characteristic of measured object, program and light-emitting body |
| CN201713110U (en) * | 2010-05-27 | 2011-01-19 | 广州敏瑞汽车零部件有限公司 | Rivet conveyer |
| CN201886118U (en) * | 2010-06-01 | 2011-06-29 | 展晶科技(深圳)有限公司 | Light-emitting diode (LED) test jig |
| CN102118960A (en) * | 2010-12-27 | 2011-07-06 | 东莞市新泽谷机械有限公司 | Irregular component plug-in machine |
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| Publication number | Publication date |
|---|---|
| CN102323043A (en) | 2012-01-18 |
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