[go: up one dir, main page]

CN102313741B - Automatic optical detection system - Google Patents

Automatic optical detection system Download PDF

Info

Publication number
CN102313741B
CN102313741B CN 201010230593 CN201010230593A CN102313741B CN 102313741 B CN102313741 B CN 102313741B CN 201010230593 CN201010230593 CN 201010230593 CN 201010230593 A CN201010230593 A CN 201010230593A CN 102313741 B CN102313741 B CN 102313741B
Authority
CN
China
Prior art keywords
image
combined frame
automatic optical
detecting system
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN 201010230593
Other languages
Chinese (zh)
Other versions
CN102313741A (en
Inventor
林网生
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jochu Technology Co Ltd
Original Assignee
Jochu Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jochu Technology Co Ltd filed Critical Jochu Technology Co Ltd
Priority to CN 201010230593 priority Critical patent/CN102313741B/en
Publication of CN102313741A publication Critical patent/CN102313741A/en
Application granted granted Critical
Publication of CN102313741B publication Critical patent/CN102313741B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

The invention relates to an automatic optical detection system, which comprises a first image acquisition device, a database and a comparison unit. The first image capturing device is used for capturing a captured image of a combined frame, wherein the captured image comprises a joint area of the combined frame. The database is used for storing at least one reference image. The comparison unit is electrically connected with the first image capturing device and the database and used for comparing the captured image with the reference image and judging whether the combined frame has defects or not. The automatic optical detection system can shorten the time for detecting the combined frame and save the related labor cost.

Description

自动光学检测系统Automatic Optical Inspection System

技术领域 technical field

本发明有关一种自动光学检测系统,特别是有关一种检测组合式框架的接合品质的自动光学检测系统。The present invention relates to an automatic optical inspection system, in particular to an automatic optical inspection system for inspecting the bonding quality of a combined frame.

背景技术 Background technique

为了减少废料产生,目前平面显示器所使用的矩形框架大多是以多个构件所接合而成的组合式框架。举例而言,如图1a所示,组合式框架1是由二个L型构件11a、11b相对接合而成。请参照图1b至图1e,多个长条型构件12a~12d、L型构件13a、13b与长条型构件13c、等边U型构件14a、14b或不等边U型构件15a、15b亦可接合成所需的组合式框架。上述组合式框架的生产流程是先冲压出L型、长条型或U型构件,接着再以适当方法将构件接合,例如以焊接或铆合。为了确认接合品质,目前是以人力逐一检视组合式框架的接合部位,如此不仅降低生产速度,亦增加人力成本。In order to reduce the generation of waste, most of the rectangular frames currently used in flat panel displays are combined frames formed by joining multiple components. For example, as shown in FIG. 1a, the combined frame 1 is formed by joining two L-shaped components 11a and 11b. Please refer to FIG. 1b to FIG. 1e, a plurality of elongated members 12a-12d, L-shaped members 13a, 13b and elongated members 13c, equilateral U-shaped members 14a, 14b or unequal U-shaped members 15a, 15b also Can be jointed into required modular frames. The production process of the above combined frame is to punch out L-shaped, strip-shaped or U-shaped components first, and then join the components by appropriate methods, such as welding or riveting. In order to confirm the quality of joints, currently manpower is used to inspect the joints of the combined frame one by one, which not only reduces the production speed, but also increases labor costs.

综上所述,如何以较低的成本以及较快的速度即可确认组合式框架的接合区域的接合品质便是目前极需努力的目标。To sum up, how to confirm the bonding quality of the bonding area of the combined frame at a lower cost and faster speed is a goal that needs to be worked hard at present.

发明内容 Contents of the invention

本发明的目的是提供一种自动光学检测系统,其是以一影像撷取装置撷取组合式框架的影像,并将所撷取的影像与一参考影像比较,以自动化确认组合式框架的接合品质。The object of the present invention is to provide an automatic optical inspection system, which uses an image capture device to capture an image of a combined frame, and compares the captured image with a reference image to automatically confirm the joint of the combined frame quality.

根据本发明的一种自动光学检测系统包含一第一影像撷取装置、一数据库以及一比较单元。第一影像撷取装置用以撷取一组合式框架的一撷取影像,其中撷取影像包含组合式框架的接合区域。数据库用以储存至少一参考影像。比较单元与第一影像撷取装置以及数据库电性连接,用以比较撷取影像以及参考影像,并判定组合式框架是否存在缺陷。An automatic optical inspection system according to the present invention includes a first image capture device, a database and a comparison unit. The first image capturing device is used for capturing a captured image of a combined frame, wherein the captured image includes the joint area of the combined frame. The database is used for storing at least one reference image. The comparing unit is electrically connected with the first image capturing device and the database, and is used for comparing the captured image and the reference image, and determining whether the combined frame is defective.

本发明的有益技术效果是:本发明的自动光学检测系统能够以自动化的方式撷取组合式框架的影像,并将所撷取的影像与一参考影像比较以确认组合式框架的接合品质。因此,本发明的自动光学检测系统可大幅缩短检测以及生产组合式框架的时间,并节省检测组合式框架的接合品质的人力成本。The beneficial technical effect of the present invention is: the automatic optical inspection system of the present invention can automatically capture the image of the combined frame, and compare the captured image with a reference image to confirm the joining quality of the combined frame. Therefore, the automatic optical inspection system of the present invention can greatly shorten the time for inspecting and producing the combined frame, and save labor costs for testing the joint quality of the combined frame.

附图说明 Description of drawings

以下通过具体实施例配合附图对本发明进行详细说明,当更容易了解本发明的目的、技术内容、特点及其所达成的功效,其中:The present invention will be described in detail below through specific embodiments in conjunction with the accompanying drawings, when it is easier to understand the purpose, technical content, characteristics and effects of the present invention, wherein:

图1a至图1e为显示现有的组合式框架的示意图。1a to 1e are schematic diagrams showing a conventional combined frame.

图2为显示本发明一实施例的自动光学检测系统的示意图。FIG. 2 is a schematic diagram showing an automatic optical inspection system according to an embodiment of the present invention.

图3为显示本发明另一实施例的自动光学检测系统的影像撷取装置与组合式框架的相对位置的示意图。FIG. 3 is a schematic diagram showing the relative positions of the image capture device and the combined frame of the automatic optical inspection system according to another embodiment of the present invention.

具体实施方式 Detailed ways

请参照图2,本发明的一实施例的自动光学检测系统包含一第一影像撷取装置21a、一数据库22以及一比较单元23。第一影像撷取装置21a用以撷取一组合式框架1的一撷取影像。撷取影像包含组合式框架1的接合区域。组合式框架1是应用于一平面显示装置,其可由L型构件、长条型构件、U型构件或以上的组合所组成,如图1a至图1e。于一实施例中,第一影像撷取装置可为一电荷耦合元件(Charge Coupled Device,CCD)、互补式金属氧化物半导体(ComplementaryMetal-Oxide-Semiconductor,CMOS)传感器或接触式影像传感器(Contact ImageSensor,CIS)。数据库22用以储存至少一参考影像。比较单元23与第一影像撷取装置21a以及数据库22电性连接。比较单元23比较第一影像撷取装置21a所撷取的撷取影像以及数据库22中所储存的参考影像,并判定组合式框架1的接合区域是否存在缺陷。Please refer to FIG. 2 , an automatic optical inspection system according to an embodiment of the present invention includes a first image capture device 21 a , a database 22 and a comparison unit 23 . The first image capturing device 21 a is used for capturing a captured image of a combined frame 1 . The captured image includes the junction area of the composite frame 1 . The combined frame 1 is applied to a flat display device, which can be composed of L-shaped components, strip-shaped components, U-shaped components or a combination thereof, as shown in FIGS. 1a to 1e. In one embodiment, the first image capture device can be a charge coupled device (Charge Coupled Device, CCD), a complementary metal oxide semiconductor (Complementary Metal-Oxide-Semiconductor, CMOS) sensor or a contact image sensor (Contact ImageSensor , CIS). The database 22 is used for storing at least one reference image. The comparison unit 23 is electrically connected to the first image capturing device 21 a and the database 22 . The comparing unit 23 compares the captured image captured by the first image capturing device 21 a with the reference image stored in the database 22 , and determines whether there is a defect in the bonding area of the combined frame 1 .

于一实施例中,数据库22中所储存的参考影像可为具有缺陷的组合式框架的撷取影像。因此,当第一影像撷取装置21a所撷取的撷取影像与参考影像相同时,即可判定组合式框架具有缺陷而必须剔除。当撷取影像与参考影像不同时,组合式框架即判定为合格品。需注意者,判定为合格的组合式框架中可能包含新型态的缺陷,亦即其撷取影像与数据库22中的参考影像皆不相同。此时,将包含新型态缺陷的撷取影像储存于数据库中即可作为下次检测时的参考影像。In one embodiment, the reference images stored in the database 22 may be captured images of combined frames with defects. Therefore, when the captured image captured by the first image capture device 21 a is identical to the reference image, it can be determined that the combined frame has a defect and must be removed. When the captured image is different from the reference image, the combined frame is determined to be qualified. It should be noted that the combined frame determined to be qualified may contain a new type of defect, that is, the captured image is different from the reference image in the database 22 . At this point, storing the captured image containing the new type of defect in the database can be used as a reference image for the next inspection.

于另一实施例中,数据库22中所储存的参考影像可为合格的组合式框架的撷取影像。因此,当第一影像撷取装置21a所撷取的撷取影像与参考影像相同时,组合式框架即判定为合格品。当撷取影像与参考影像不同时,即可判定组合式框架具有缺陷而必须剔除。In another embodiment, the reference images stored in the database 22 may be captured images of qualified composite frames. Therefore, when the captured image captured by the first image capture device 21 a is identical to the reference image, the combined frame is determined to be a qualified product. When the captured image is different from the reference image, it can be determined that the combined frame has defects and must be removed.

请再参照图2,于一实施例中,本发明的自动光学检测系统包含一警示单元24,其与比较单元23电性连接。警示单元24可用以在比较单元23检测到具有缺陷的组合式框架时警示一操作者作适当的处理。举例而言,警示单元24可为一指示灯号或于一显示装置显示适当的警示信息。Please refer to FIG. 2 again. In one embodiment, the automatic optical inspection system of the present invention includes a warning unit 24 electrically connected to the comparison unit 23 . The warning unit 24 can be used to warn an operator to take appropriate action when the comparison unit 23 detects a defective composite frame. For example, the warning unit 24 can be an indicator light or display appropriate warning information on a display device.

请参照图3,于一实施例中,本发明的自动光学检测系统包含一第二影像撷取装置21b。第二影像撷取装置21b亦是用以撷取组合式框架的撷取影像,以供比较单元23将其与参考影像进行比较。于一实施例中,第二影像撷取装置21b可为一电荷耦合元件、互补式金属氧化物半导体传感器或接触式影像传感器。如图3所示,第一影像撷取装置21a是设置于组合式框架的上方,亦即第一影像撷取装置21a的撷取影像方向与组合式框架所在的平面垂直。第一影像撷取装置21a可用以撷取组合式框架的俯视影像。而第二影像撷取装置21b则设置于组合式框架的斜上方,亦即第二影像撷取装置21b的撷取影像方向与组合式框架所在的平面具有一夹角。第二影像撷取装置21b可用以撷取组合式框架的斜视影像。第一影像撷取装置21a所撷取的俯视影像可用以判定斜焊、偏焊、焊道不全或焊道破损等缺陷。第二影像撷取装置21b所撷取的斜视影像可用以判定构成组合式框架的构件未共面的缺陷,例如构件11a、11b在接合区域具有高度差,如图3所示。Please refer to FIG. 3 , in one embodiment, the automatic optical inspection system of the present invention includes a second image capture device 21b. The second image capture device 21b is also used to capture the captured image of the combined frame for the comparison unit 23 to compare it with the reference image. In one embodiment, the second image capture device 21b can be a charge-coupled device, a CMOS sensor or a contact image sensor. As shown in FIG. 3 , the first image capture device 21a is disposed above the combined frame, that is, the direction of the image captured by the first image capture device 21a is perpendicular to the plane where the combined frame is located. The first image capture device 21a can be used to capture a top view image of the combined frame. The second image capture device 21b is disposed obliquely above the combined frame, that is, the direction of capturing images by the second image capture device 21b has an included angle with the plane where the combined frame is located. The second image capture device 21b can be used to capture oblique images of the combined frame. The top-view image captured by the first image capture device 21 a can be used to determine defects such as skewed welding, offset welding, incomplete weld bead or weld bead damage. The oblique image captured by the second image capture device 21b can be used to determine the defect that the components constituting the combined frame are not coplanar, for example, the components 11a and 11b have a height difference in the joint area, as shown in FIG. 3 .

请再参照图3,于一实施例中,本发明的自动光学检测系统包含一第一光源25a,其设置于组合式框架的上表面侧。第一光源25a用以提供组合式框架的上表面的照明,以使第一影像撷取装置21a及/或第二影像撷取装置21b可撷取到较为清晰的撷取影像。于一实施例中,第一光源25a可为一环形光源,而第一影像撷取装置21a则通过环形光源的中央孔251撷取组合式框架的影像,以使组合式框架的上表面不会有照明以及撷取影像的死角。需注意的是,设置多个第一光源25a亦可达到与环形光源相同的效果。此外,于一实施例中,本发明的自动光学检测系统还包含一第二光源25b,其设置于组合式框架的下表面侧。如此,当焊道不全或焊道破损时,第二光源25b所发出的光线即会透过焊道的缺陷,而被第一影像撷取装置21a所撷取并呈现在撷取影像上,使比较单元25易于判定焊道不全或焊道破损等缺陷。需注意的是,第一光源25a及/或第二光源25b可包含多种发光色系。依据组合式框架的材料特性,操作者可选用适合色系的光源,使组合式框架产生适当的反射,以供影像撷取装置撷取影像。Please refer to FIG. 3 again. In one embodiment, the automatic optical inspection system of the present invention includes a first light source 25a disposed on the upper surface side of the combined frame. The first light source 25a is used to provide illumination on the upper surface of the combined frame, so that the first image capture device 21a and/or the second image capture device 21b can capture a clearer captured image. In one embodiment, the first light source 25a can be a ring light source, and the first image capture device 21a captures the image of the combined frame through the central hole 251 of the ring light source, so that the upper surface of the combined frame will not There are blind spots for lighting and capturing images. It should be noted that arranging multiple first light sources 25a can also achieve the same effect as the ring light source. In addition, in one embodiment, the automatic optical inspection system of the present invention further includes a second light source 25b disposed on the lower surface side of the combined frame. In this way, when the weld bead is incomplete or damaged, the light emitted by the second light source 25b will pass through the defect of the weld bead, and be captured by the first image capture device 21a and presented on the captured image, so that The comparison unit 25 is easy to determine defects such as incomplete weld bead or damaged weld bead. It should be noted that the first light source 25a and/or the second light source 25b may include various light emitting color systems. According to the material properties of the combined frame, the operator can select a light source with a suitable color system to make the combined frame generate proper reflection for the image capture device to capture images.

综合上述,本发明的自动光学检测系统能够以自动化的方式撷取组合式框架的影像,并将所撷取的影像与一参考影像比较以确认组合式框架的接合品质。因此,本发明的自动光学检测系统可大幅缩短检测以及生产组合式框架的时间,并节省检测组合式框架的接合品质的人力成本。To sum up the above, the automatic optical inspection system of the present invention can automatically capture the image of the combined frame, and compare the captured image with a reference image to confirm the joining quality of the combined frame. Therefore, the automatic optical inspection system of the present invention can greatly shorten the time for inspecting and producing the combined frame, and save labor costs for testing the joint quality of the combined frame.

以上所述的实施例仅是为说明本发明的技术思想及特点,其目的在使熟悉此项技术的人士能够了解本发明的内容并据以实施,当不能以其限定本发明的专利范围,即凡是根据本发明所揭示的精神所作的均等变化或修饰,仍应涵盖在本发明的专利范围内。The above-described embodiments are only for illustrating the technical idea and characteristics of the present invention, and its purpose is to enable those familiar with this technology to understand the content of the present invention and implement it accordingly. When it cannot limit the patent scope of the present invention, That is, all equivalent changes or modifications made according to the spirit disclosed in the present invention shall still fall within the patent scope of the present invention.

Claims (8)

1. an automatic optical detecting system is applied to use the fault detection at the combined frame of a flat display apparatus, it is characterized in that, comprises:
First image capture unit, in order to capturing the pick-up image of described combined frame, described pick-up image comprises the engaging zones of described combined frame and described pick-up image direction perpendicular to the plane at described combined frame place;
First light source is arranged at the upper surface side of described combined frame;
Secondary light source is arranged at the lower face side of described combined frame;
Database is in order to store at least one with reference to image; And
Comparing unit, described comparing unit and described first image capture unit and described database electrically connect, and in order to more described pick-up image and with reference to image, and judge whether described combined frame exists defective;
Second image capture unit, the plane at the pick-up image direction of described second image capture unit and described combined frame place has an angle, in order to capturing the stravismus image of described combined frame, and judge the not coplanar defective of member that constitutes described combined frame.
2. automatic optical detecting system according to claim 1 is characterized in that:
Described first light source comprises multiple luminous colour system.
3. automatic optical detecting system according to claim 1 is characterized in that:
Described first light source is annular light source.
4. automatic optical detecting system according to claim 1 is characterized in that:
Described secondary light source comprises multiple luminous colour system.
5. automatic optical detecting system according to claim 1 is characterized in that:
Described first image capture unit comprises Charged Coupled Device, CMOS semiconductor sensor or contact image sensor.
6. automatic optical detecting system according to claim 1 is characterized in that:
Described second image capture unit comprises Charged Coupled Device, CMOS semiconductor sensor or contact image sensor.
7. automatic optical detecting system according to claim 1 is characterized in that:
Also comprise: the caution unit,
Itself and described comparing unit electrically connect, and detect this combined frame with defective in order to warn the operator.
8. automatic optical detecting system according to claim 1 is characterized in that:
Described combined frame comprises L type member, long strip type member, U-shaped member or above combination.
CN 201010230593 2010-07-06 2010-07-06 Automatic optical detection system Active CN102313741B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201010230593 CN102313741B (en) 2010-07-06 2010-07-06 Automatic optical detection system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201010230593 CN102313741B (en) 2010-07-06 2010-07-06 Automatic optical detection system

Publications (2)

Publication Number Publication Date
CN102313741A CN102313741A (en) 2012-01-11
CN102313741B true CN102313741B (en) 2013-08-14

Family

ID=45427092

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 201010230593 Active CN102313741B (en) 2010-07-06 2010-07-06 Automatic optical detection system

Country Status (1)

Country Link
CN (1) CN102313741B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103344613B (en) * 2013-07-26 2016-09-28 杭州远方光电信息股份有限公司 A kind of material reflection characteristic measurement apparatus and method
CN104991047A (en) * 2015-07-30 2015-10-21 乔治费歇尔汽车产品(昆山)有限公司 Molten iron component confirmation method
US10365370B2 (en) * 2016-10-31 2019-07-30 Timothy Webster Wear tolerant hydraulic / pneumatic piston position sensing using optical sensors

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1996441A (en) * 2006-01-04 2007-07-11 台湾薄膜电晶体液晶显示器产业协会 Display multi-angle measurement system and method
CN101281358A (en) * 2007-04-04 2008-10-08 鸿富锦精密工业(深圳)有限公司 Camera module stain testing system and method
CN201145788Y (en) * 2006-10-24 2008-11-05 曹陵 LCD/LCM automatic optical detector
CN201352202Y (en) * 2008-12-24 2009-11-25 晶彩科技股份有限公司 Automatic optical detection device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100817131B1 (en) * 2002-03-15 2008-03-27 엘지.필립스 엘시디 주식회사 Inspection device and method of liquid crystal panel

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1996441A (en) * 2006-01-04 2007-07-11 台湾薄膜电晶体液晶显示器产业协会 Display multi-angle measurement system and method
CN201145788Y (en) * 2006-10-24 2008-11-05 曹陵 LCD/LCM automatic optical detector
CN101281358A (en) * 2007-04-04 2008-10-08 鸿富锦精密工业(深圳)有限公司 Camera module stain testing system and method
CN201352202Y (en) * 2008-12-24 2009-11-25 晶彩科技股份有限公司 Automatic optical detection device

Also Published As

Publication number Publication date
CN102313741A (en) 2012-01-11

Similar Documents

Publication Publication Date Title
JP5583102B2 (en) Glass substrate surface defect inspection apparatus and inspection method
JP4915991B2 (en) Solar cell defect inspection apparatus and method
EP1943502B1 (en) Apparatus and methods for inspecting a composite structure for defects
WO2014017066A1 (en) Method of inspecting liquid crystal display panel, and liquid crystal display panel inspection device
WO2013175703A1 (en) Display device inspection method and display device inspection device
CN103913459A (en) Lamp head tin scolding contact qualified rate detecting device and method
JP5384264B2 (en) Tire appearance inspection device
CN101464417A (en) Glass detection method and equipment
CN102313741B (en) Automatic optical detection system
CN106770367A (en) A kind of FPC solder joints detection method
US20050011815A1 (en) Apparatus for automatic nut inspection
WO2023164809A1 (en) Bubble detection method and detection system for curved substrate
JP2017090081A (en) Appearance inspection apparatus and appearance inspection method
KR101719470B1 (en) The electronic component testing apparatus and testing method
JP5959430B2 (en) Bottle cap appearance inspection device and appearance inspection method
TWM447988U (en) Inspection device
TWI448606B (en) Method and device for inspecting surface
JPS627588B2 (en)
JPH1196981A (en) Visual inspection method of battery and inspecting device
CN201513771U (en) Light source for detection and automatic detection equipment
CN115511791A (en) A liquid crystal grating function detection method and system
JP5679564B2 (en) Surface foreign matter inspection device
KR20110117371A (en) Pattern checker
CN219737320U (en) Coating film apron detection device
JP2013002985A (en) Weld inspection device

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant