CN102305906A - Chip testing method and device - Google Patents

Abstract

The embodiment of the invention discloses a chip testing method and device, which relate to the field of terminal testing, and can realize the testing of various chips and modules in one testing environment, so as to achieve the purpose of unified management of various chip testing. The method of the present invention includes: detecting whether there is an external device connected to the boot module: if it is detected that an external device is connected to the boot module, then detecting whether there is data input to the boot module; if it is detected that there is data input to the boot module , then read the input data, and judge whether the input data is a chip test mode start command; if the input data is a chip test mode start command, then enter the chip test mode interface and receive the chip test command input by the user , executing a corresponding chip test according to the chip test command, and outputting a chip test result. The embodiments of the present invention are mainly used in the chip testing process on terminal products.

Description

Chip testing method and device

technical field

The invention relates to the field of terminal testing, in particular to a chip testing method and device.

Background technique

In the process of product production, product software and hardware testing is a very important task. After the hardware circuit board of the product is pasted, some methods are needed to detect whether the various chips attached to the circuit board are working normally, such as various sensor chips, communication modules and various memories; during testing, Because the test items and test methods of each chip and module are different, the test environment of each chip and module cannot be unified, and it is often difficult to manage uniformly.

Contents of the invention

The embodiment of the present invention provides a chip testing method and device, which can realize the testing of various chips and modules in one testing environment, and achieve the purpose of unified management of various chip testing.

In order to achieve the above object, embodiments of the present invention adopt the following technical solutions:

A chip testing method, comprising:

Detect whether there is an external device connected to the boot module:

If it is detected that an external device is connected to the boot module, it is detected whether there is data input to the boot module;

If it is detected that there is data input to the boot module, then read the input data, and judge whether the input data is a chip test mode start command;

If the input data is a chip test mode start command, enter the chip test mode interface, receive the chip test command input by the user, execute the corresponding chip test according to the chip test command, and output the chip test result.

A chip testing device, comprising:

The first detection unit is used to detect whether there is an external device connected to the boot module:

The second detection unit is used to detect whether there is data input to the boot module when the first detection unit detects that an external device is connected to the boot module;

A data acquisition unit, configured to read input data when the second detection unit detects that data is input to the boot module;

A judging unit, configured to judge whether the input data acquired by the data acquisition unit is a chip test mode start command;

A starting unit, configured to enter the chip test mode interface when the judging unit determines that the input data is a chip test mode start command;

A command operation unit, configured to receive a chip test command input by a user, and execute a corresponding chip test according to the chip test command;

The result output unit is used for outputting the test result of the chip.

In the technical solution provided by the embodiments of the present invention, compared with the testing of each chip and module in the prior art through different test environments, the chip or module to be tested is connected to the boot module, and when the chip or module is determined to be tested , enter the chip test mode interface, receive the chip test command input by the user, and execute the corresponding chip test according to the chip test command, so that the test of various chips and modules can be realized in one test environment, and the unified management of various chip tests can be achieved Purpose.

Description of drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments of the present invention. Those skilled in the art can also obtain other drawings based on these drawings without creative work.

Fig. 1 is the flowchart of chip test method in the embodiment 1 of the present invention;

Fig. 2 is the flowchart of chip test method in the embodiment 2 of the present invention;

3 is a schematic diagram of a chip test mode menu in Embodiment 2 of the present invention;

Fig. 4 is the flow chart of the chip test result output method in the embodiment 2 of the present invention;

5 is a block diagram of a chip testing device in Embodiment 3 of the present invention;

6 is a block diagram of another chip testing device in Embodiment 3 of the present invention;

7 is a block diagram of another chip testing device in Embodiment 3 of the present invention;

FIG. 8 is a block diagram of another chip testing device in Embodiment 3 of the present invention.

Detailed ways

The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

Example 1

The embodiment of the present invention provides a chip testing method, as shown in Figure 1, the method includes:

101. Detect whether there is an external device connected to the boot module. Wherein, the external device may be a chip to be tested on the terminal product.

Wherein, when an external device is connected to the boot module, it needs to use a connection line to connect to the external interface of the boot module, so detecting whether there is an external device connected to the boot module can be realized through but not limited to the following methods, which include:

The first method is to detect the value of the flag bit of the register corresponding to the external interface of the boot module, and determine whether there is an external device connected to the boot module. It should be noted that the external interface of the boot module generally corresponds to a register, which is used to temporarily store the data input by the external device, and generally sets a flag bit for this register to identify whether there is an external device connected. When an external device is connected, the port can immediately know and modify the flag. For example, setting the value of the flag bit to 0 means that no external device is connected to the external interface; setting the value of the flag bit to 1 means that an external device is connected to the external interface. It only needs to be able to distinguish whether there is an external device connected to the external interface, and this embodiment of the present invention does not limit this, and any setting method belongs to the scope of protection of the embodiment of the present invention.

The second method is to detect the level change of the relevant pins of the external interface of the boot module to determine whether there is an external device connected to the boot module. It should be noted that the levels of the relevant pins of the external interface of the boot module are different when there is an external device connected and when no external device is connected. For example, when no external device is connected to the external interface, the level of the relevant pin of the external interface is high; when an external device is connected to the external interface, the level of the relevant pin of the external interface is low , when the level of the pin related to the external interface changes from a high level to a low level, it indicates that an external device is connected to the external interface of the boot module; of course, the setting of the pin level of the external interface is not limited to the above description, any The method for identifying the level of the relevant pins of the external interface belongs to the scope of protection of the embodiments of the present invention.

Wherein, the external interface of the boot module may be a serial port, but this is not limited in this embodiment of the present invention. When the external interface of the boot module is a serial port, the connection line connecting the boot module and the external device can be a USB-to-serial cable, that is, the interface on the chip to be tested on the corresponding terminal product (external device) is a USB interface, and the external connection of the boot module The access is a serial port, certainly the embodiment of the present invention does not limit the interface of the external device, it can also be other types of interfaces, but because the Universal Serial Bus (UniversalSerial BUS, USB) interface has the advantage of plug and play, preferred USB interface.

102. If it is detected that an external device is connected to the boot module, detect whether there is data input to the boot module.

Wherein, detecting whether there is data input to the boot module can determine whether there is data input to the boot module by but not limited to detecting whether there is data stored in the corresponding register; if there is data stored in the corresponding register, it is determined that there is data Input the boot module, if there is no data stored in the corresponding register, it is determined that no data is input into the boot module.

103. If it is detected that data is input to the boot module, read the input data, and judge whether the input data is a chip test mode startup command.

Wherein, after reading the input data, judging whether the input data is a chip test mode start command can be realized by but not limited to the following method, the method is: the input data and the preset chip test mode start command is compared, if the input data is consistent with the preset chip test mode start command, then determine that the input data is the chip test mode start command; if the input data is inconsistent with the preset chip test mode start command, Then it is determined that the input data is not a chip test mode start command.

104. If the input data is a chip test mode start command, enter the chip test mode interface, receive the chip test command input by the user, execute the corresponding chip test according to the chip test command, and output the chip test result.

In the embodiment of the present invention, the chip or module to be tested is connected to the boot module, and when the chip or module is determined to be tested, the chip test mode interface is entered, the chip test command input by the user is received, and the chip test command is executed according to the chip test command. The corresponding chip test enables the testing of various chips and modules in a test environment, and achieves the purpose of unified management of various chip tests.

Example 2

The embodiment of the present invention provides a chip testing method. The embodiment of the present invention takes the external interface of the boot module as a serial port as an example to illustrate the chip testing method. As shown in FIG. 2, the method includes:

201. When the boot module starts, first detect whether there is an external device connected to the boot module; if it is detected that an external device is connected to the boot module, then perform step 202; if it is detected that no external device is connected to the boot module, Then step 207 is executed.

Wherein, for a specific description of detecting whether there is an external device connected to the boot module, reference may be made to the corresponding description in step 101 of Embodiment 1, which will not be repeated here in this embodiment of the present invention.

202. Detect whether data is input to the boot module; if it is detected that data is input to the boot module, perform step 203; if it is detected that no data is input to the boot module, perform step 207.

Wherein, for the specific description of detecting whether there is data input to the boot module, reference may be made to the corresponding description in step 102 of Embodiment 1, which will not be repeated here in this embodiment of the present invention.

In addition, to realize the reading and writing of the serial port in the boot, the reading operation of the serial port has two situations, including: blocking type and non-blocking type. The blocking read operation is only when the input data is read from the serial port and the Enter key is pressed, and the reading process is completed once, otherwise the serial port will always be in the state of waiting for user input; and for non-blocking read operations, Regardless of whether there is data in the serial port, the reading process will return immediately.

203. Read the input data, and judge whether the input data is a chip test mode start command; if the input data is a chip test mode start command, perform step 204; if the input data is not a chip test mode start command; If the test mode starts command, step 203 is executed.

Wherein, after reading the input data, the specific description of judging whether the input data is a chip test mode start command can refer to the corresponding description in step 103 of Embodiment 1, which will not be repeated here in the embodiment of the present invention.

204. Display a predefined chip test mode menu, the chip test mode menu including a chip test mode and the number of the chip test mode, so that the user can select a corresponding chip test mode according to the chip test mode menu.

Wherein, the chip test mode menu is shown in FIG. 3 , which lists possible chip test modes for testing, for example, the Bluetooth test mode numbered 1 and the Compass mode numbered 2. The chip test mode menu can be edited according to the requirements of terminal product testing. When inputting the chip test mode, the user does not need to have too much professional knowledge, and can input the serial number corresponding to the chip test mode according to the menu records, which means the input corresponding chip test mode, which makes the operation easier.

205. Receive a chip test mode number input by the user, and enter a chip test process corresponding to the chip test mode number.

For example, as shown in FIG. 3 , if the user inputs number 2, it is determined that the user needs to test the electronic compass chip, and then enters the electronic compass chip testing process.

206. Receive a chip test command in the chip test mode input by the user, execute a corresponding chip test according to the chip test command, output a chip test result, and end the chip test process.

207. The boot module is started according to a common process.

Further, in order to facilitate the management of test results, the embodiment of the present invention also includes the following method, as shown in Figure 4, the method includes:

301. Determine whether a memory card exists in the test chip; if the memory card exists in the test chip, perform step 302; if the memory card does not exist in the test chip, perform step 303.

Wherein, determining whether there is a memory card in the test chip can be determined by, but not limited to, driving a memory card. Any determination of whether there is a memory card in the test chip belongs to the scope of protection of the embodiments of the present invention; when driving the memory card When the method is determined, it includes: if the memory card is driven successfully, it is determined that there is a memory card in the test chip, otherwise, it means that no memory card is inserted into the test chip.

In addition, the memory card can be a secure digital memory card (Secure Digital Memory Card, SD card), also can be a TF (TransFLash) card, can also be other memory cards that can temporarily store data, the embodiment of the present invention does not carry out this limited.

302. Display and output the test result of the chip and save it in the memory card.

303. Display and output the chip test result.

It should be noted that the step of determining whether there is a memory card in the test chip can be performed after starting the chip test mode interface, or can be determined before outputting the chip test result, which is not limited in the embodiment of the present invention. However, when reading the test results stored in the memory card, the source project EFSL file system must be transplanted to the boot module. After the file system is successfully transplanted, the files of the memory card can be read and written through the common file directory form to obtain Chip test results.

In the embodiment of the present invention, the chip or module to be tested is connected to the boot module, and when the chip or module is determined to be tested, the chip test mode interface is entered, the chip test command input by the user is received, and the chip test command is executed according to the chip test command. The corresponding chip test enables the testing of various chips and modules in a test environment, and achieves the purpose of unified management of various chip tests.

And, in the embodiment of the present invention, after entering the chip test mode interface, the predefined chip test mode menu is displayed, the chip test mode menu includes the numbering of the chip test mode and the chip test mode, and the user inputs the operation command At the same time, the corresponding chip test mode can be selected according to the number recorded in the chip test mode menu, so that the input of operation commands is simple, so that testers do not need to have strong professional knowledge, expanding the number of people who can perform chip test operations, saving The company's testing costs. And in this mode, the tester can select the chip item to be tested, input the test command of the chip and other operations, avoiding the shortcomings of separation of production software and system software and confusion of multiple chip test management.

Further, in the embodiment of the present invention, after the chip test result is obtained, if the test chip has a memory card, the chip test result is displayed and output while being stored in the memory card, which facilitates subsequent viewing of the chip test result.

Example 3

An embodiment of the present invention provides a chip testing device, as shown in FIG. 5 , the device includes: a first detection unit 41, a second detection unit 42, a data acquisition unit 43, a judgment unit 44, a start unit 45, and a command operation unit 46 , the result output unit 47 .

The first detection unit 41 is configured to detect whether an external device is connected to the boot module.

The second detection unit 42 is used to detect whether there is data input to the boot module when the first detection unit detects that an external device is connected to the boot module; wherein, the second detection unit 42 detects whether there is When data is input to the boot module, it is possible to determine whether there is data input to the boot module by but not limited to detecting whether data is stored in the corresponding register; if data is stored in the corresponding register, it is determined that there is data input to the boot module , if there is no data stored in the corresponding register, it is determined that no data is input to the boot module.

The data acquisition unit 43 is configured to read the input data when the second detection unit 42 detects that there is data input to the boot module.

A judging unit 44, configured to judge whether the input data acquired by the data acquiring unit 43 is a chip test mode start command; wherein, the judging unit 44 judges whether the input data acquired by the data acquiring unit 43 is a chip The test mode start command can be realized in the following manner, specifically: comparing the input data with the preset chip test mode start command, if the input data is consistent with the preset chip test mode start command, then determine The input data is a chip test mode start command; if the input data is inconsistent with the preset chip test mode start command, it is determined that the input data is not a chip test mode start command.

The starting unit 45 is configured to enter the chip test mode interface when the judging unit 44 judges that the input data is a chip test mode start command.

The command operation unit 46 is configured to receive a chip test command input by a user, and execute a corresponding chip test according to the chip test command.

The result output unit 47 is configured to output the chip test result.

Further optionally, as shown in FIG. 6 , the chip testing device further includes: a display unit 48 .

The display unit 48 is used to display the predefined chip test mode menu after entering the chip test mode interface. The chip test mode menu includes the chip test mode and the number of the chip test mode, so that the user can test according to the chip test mode. The mode menu selects the corresponding chip test mode; wherein, for the relevant description of displaying the predefined chip test mode menu by the display unit 48, you can refer to the corresponding description in step 204 in Embodiment 2, and the embodiment of the present invention will not Let me repeat.

The command operation unit 46 is also used to receive the chip test mode number input by the user, and enter the chip test process corresponding to the chip test mode number; receive the chip test command under the chip test mode input by the user, according to the The chip test command executes the corresponding chip test.

In order to facilitate the management of test results, further optionally, as shown in FIG. 7 , the chip testing device further includes: a determination unit 49 .

The determination unit 49 is used to determine whether there is a memory card in the test chip; wherein, the determination unit 49 determines whether there is a memory card in the test chip, which can be determined by but not limited to driving the memory card. Any determination of the test chip Whether there is a memory card in the test chip belongs to the scope of protection of the embodiments of the present invention; when determining by driving the memory card, it includes: if the memory card is driven successfully, then it is determined that there is a memory card in the test chip; otherwise, there is no memory card inserted the test chip. In addition, the memory card may be an SD card, a TF card, or other memory cards capable of temporarily storing data, which is not limited in this embodiment of the present invention.

The result output unit 47 is further configured to, when the determination unit 49 determines that the memory card exists in the test chip, display and output the test result of the chip and store it in the memory card. It should be noted that when reading the test results stored in the memory card, the EFSL file system of the source project must be transplanted to the boot module. After the file system is successfully transplanted, the memory card can be read and written through the common file directory form. file to obtain the test results of the chip.

The result output unit 47 is further configured to display and output the test result of the chip when the determining unit 49 determines that the memory card does not exist in the test chip.

Further optionally, as shown in FIG. 8 , the first detection unit 41 includes: a first detection module 411 and/or a second detection module 412

The first detection module 411 is used to detect the value of the sign bit of the corresponding register of the external interface of the boot module, and determines whether an external device is connected to the boot module; it should be noted that the external interface of the boot module generally corresponds to a register, It is used to temporarily store the data input by the external device, and generally set a flag bit for this register to identify whether there is an external device connected. When the external interface has an external device connected, the port can immediately know and modify the Flag bit. For example, setting the value of the flag bit to 0 means that no external device is connected to the external interface; setting the value of the flag bit to 1 means that an external device is connected to the external interface. It only needs to be able to distinguish whether there is an external device connected to the external interface. This embodiment of the present invention does not limit this, and any setting method belongs to the scope of protection of the embodiment of the present invention

The second detection module 412 is configured to detect the level change of the related pins of the external interface of the boot module, and determine whether there is an external device connected to the boot module. It should be noted that the levels of the relevant pins of the external interface of the boot module are different when connected with an external device and without an external device. For example, when no external device is connected to the external interface, the level of the relevant pin of the external interface is high; when an external device is connected to the external interface, the level of the relevant pin of the external interface is low , when the level of the pin related to the external interface changes from a high level to a low level, it indicates that an external device is connected to the external interface of the boot module; of course, the setting of the pin level of the external interface is not limited to the above description, any The method for identifying the level of the relevant pins of the external interface belongs to the scope of protection of the embodiments of the present invention.

Wherein, the external interface of the boot module may be a serial port, but this is not limited in this embodiment of the present invention. When the external interface of the boot module is a serial port, the connection line connecting the boot module and the external device can be a USB-to-serial cable, that is, the interface on the chip to be tested on the corresponding terminal product (external device) is a USB interface, and the external connection of the boot module The access is a serial port. Of course, the embodiment of the present invention does not limit the interface of the external device, and other types of interfaces can also be used. However, because the USB interface has the advantage of plug and play, the USB interface is preferred.

In the embodiment of the present invention, the chip or module to be tested is connected to the boot module, and when the chip or module is determined to be tested, the chip test mode interface is entered, the chip test command input by the user is received, and the chip test command is executed according to the chip test command. The corresponding chip test enables the testing of various chips and modules in a test environment, and achieves the purpose of unified management of various chip tests.

And, in the embodiment of the present invention, after entering the chip test mode interface, the predefined chip test mode menu is displayed, the chip test mode menu includes the numbering of the chip test mode and the chip test mode, and the user inputs the operation command At the same time, the corresponding chip test mode can be selected according to the number recorded in the chip test mode menu, so that the input of operation commands is simple, so that testers do not need to have strong professional knowledge, expanding the number of people who can perform chip test operations, saving The company's testing costs. And in this mode, the tester can select the chip item to be tested, input the test command of the chip and other operations, avoiding the shortcomings of separation of production software and system software and confusion of multiple chip test management.

Further, in the embodiment of the present invention, after the chip test result is obtained, if the test chip has a memory card, the chip test result is displayed and output while being stored in the memory card, which facilitates subsequent viewing of the chip test result.

Through the description of the above embodiments, those skilled in the art can clearly understand that the present invention can be realized by means of software plus necessary general-purpose hardware, and of course also by hardware, but in many cases the former is a better embodiment . Based on this understanding, the essence of the technical solution of the present invention or the part that contributes to the prior art can be embodied in the form of a software product, and the computer software product is stored in a readable storage medium, such as a floppy disk of a computer , a hard disk or an optical disk, etc., including several instructions for enabling a computer device (which may be a personal computer, server, or network device, etc.) to execute the methods described in various embodiments of the present invention.

The above is only a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Anyone skilled in the art can easily think of changes or substitutions within the technical scope disclosed in the present invention. Should be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention should be determined by the protection scope of the claims.

Claims (10)

1. a chip detecting method is characterized in that, comprising:

Whether detect has external equipment to insert the boot module;

Whether if having detected external equipment inserts said boot module, then detecting has data to import said boot module;

If having detected data imports said boot module, then read the data of input, and judge whether the data of said input are chip testing pattern startup command;

If the data of said input are chip testing pattern startup command, then get into the chip testing mode interface, receive the chip testing order of user's input, test according to said chip testing command execution relevant chip, and the chip testing result is exported.

2. chip detecting method according to claim 1 is characterized in that, after getting into the chip testing mode interface, also comprises:

Predefined chip testing pattern menu is shown that said chip testing pattern menu comprises the numbering of chip testing pattern and said chip testing pattern, so that user's chip testing pattern corresponding according to said chip testing pattern menu pick;

Receive the chip testing pattern numbering of user's input, get into and the corresponding chip testing process of said chip testing pattern numbering;

The chip testing order of said reception user input according to said chip testing command execution relevant chip test is: the chip testing order under this chip testing pattern of reception user input, and according to said chip testing command execution relevant chip test.

3. chip detecting method according to claim 1 is characterized in that, also comprises:

Confirm whether there is storage card in the said test chip;

Said the chip testing result is output as:, then the chip testing result is shown output and be kept in the said storage card if having said storage card in the said test chip; If do not have said storage card in the said test chip, then the chip testing result shown output.

4. according to each described chip detecting method among the claim 1-3, it is characterized in that whether said detection has external equipment to insert the boot module comprises:

Detect the value of zone bit of the corresponding register of external interface of said boot module, determined whether that external equipment inserts the boot module; Perhaps

The level of relevant stitch that detects the external interface of said boot module changes, and has determined whether that external equipment inserts the boot module.

5. chip detecting method according to claim 4 is characterized in that, the external interface of said boot module is a serial ports.

6. an apparatus for testing chip is characterized in that, comprising:

First detecting unit is used for detecting whether external equipment access boot module is arranged:

Second detecting unit is used in said first detection when having external equipment to insert said boot module, and whether detect has data to import said boot module;

Data capture unit is used in said second detection reading the data of input when having data to import said boot module;

Judging unit, whether the data of the said input that is used to judge that said data capture unit obtains are chip testing pattern startup command;

Start unit is used for when said judging unit judges that the data of said input are chip testing pattern startup command, gets into the chip testing mode interface;

The command operation unit is used to receive the chip testing order of user's input, according to said chip testing command execution relevant chip test;

Output unit is used for the chip testing result is exported as a result.

7. apparatus for testing chip according to claim 6 is characterized in that, also comprises:

Display unit; Be used for after getting into the chip testing mode interface; Predefined chip testing pattern menu is shown; Said chip testing pattern menu comprises the numbering of chip testing pattern and said chip testing pattern, so that user's chip testing pattern corresponding according to said chip testing pattern menu pick;

Said command operation unit also is used for, and receives the chip testing pattern numbering of user's input, gets into and the corresponding chip testing process of said chip testing pattern numbering; Chip testing order under this chip testing pattern of reception user input is according to said chip testing command execution relevant chip test.

8. apparatus for testing chip according to claim 6 is characterized in that, also comprises:

Confirm the unit, be used for confirming whether said test chip exists storage card;

Said output unit as a result also is used for, when confirming to have said storage card in the said test chip in said definite unit, with the chip testing result show output and be kept in the said storage card;

Said output unit as a result also is used for, and when confirming not have said storage card in the said test chip in said definite unit, said chip testing result is shown output.

9. according to each described apparatus for testing chip among the claim 6-8, it is characterized in that said first detecting unit comprises:

First detection module is used to detect the value of zone bit of the corresponding register of external interface of said boot module, has determined whether that external equipment inserts the boot module; Perhaps

Second detection module, the level of relevant stitch that is used to detect the external interface of said boot module changes, and has determined whether that external equipment inserts the boot module.

10. apparatus for testing chip according to claim 9 is characterized in that, the external interface of said boot module is a serial ports.

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