CN102253345A - Device and method for measuring ideality factors of solar cells by utilizing electroluminescence intensity - Google Patents
Device and method for measuring ideality factors of solar cells by utilizing electroluminescence intensity Download PDFInfo
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- CN102253345A CN102253345A CN2011101493021A CN201110149302A CN102253345A CN 102253345 A CN102253345 A CN 102253345A CN 2011101493021 A CN2011101493021 A CN 2011101493021A CN 201110149302 A CN201110149302 A CN 201110149302A CN 102253345 A CN102253345 A CN 102253345A
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- 238000000034 method Methods 0.000 title claims abstract description 25
- 238000005401 electroluminescence Methods 0.000 title claims abstract description 5
- 238000012360 testing method Methods 0.000 claims description 7
- 238000009795 derivation Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 abstract description 5
- 239000000523 sample Substances 0.000 description 12
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000010977 jade Substances 0.000 description 1
- 230000009897 systematic effect Effects 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
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Abstract
The invention provides a device and method for measuring ideality factors of solar cells by utilizing electroluminescence intensity. The device is characterized in that a direct current signal source is connected with solar cell samples on a sample holder; and the infrared intensity subjected to direct current bias of the solar cell samples is input into an infrared intensity detector. Compared with the traditional measurement modes, the device and the method have the following characteristics: 1. the method has higher precision compared with the common methods for extracting parameters according to current-voltage characteristic curve fitting; 2. the method has a specific range of application; and 3. the device is simple and is easy to implement.
Description
Technical field
The present invention relates to a kind of technical field of measurement and test of extracting the solar cell ideal factor, relate in particular to a kind of device and method that utilizes electroluminescent fluorescent ionization meter solar cell ideal factor.
Background technology
The solar cell ideal factor is an important parameter of weighing the solar cell performance.Usual way is to extract ideal factor [look into jade pendant etc., solar energy journal, 2007.28(9): 992] according to volt-ampere characteristic match under the solar cell illumination.But comprise a plurality of parameters such as reverse saturation current, photocurrent and ideal factor owing to describe the theoretical equation of solar cell under the illumination, easily cause the fitting result error bigger.
Thus, people have proposed by measuring the family curve of solar cell electroluminescence intensity and dc bias current, extract ideal factor parameter [Takashi Fuyuki et al.. Journal of Applied Physics, 2007.101:023711.] according to the theoretical formula match.But this method exists measurement mechanism to make challenge, for example needs problems such as infrared filter and low temperature detector; And for theoretical fitting formula applicable elements problems such as unclear are described, for example to the size and the test condition of direct current biasing.So at this, we propose a kind of device and method that utilizes electroluminescent fluorescent ionization meter solar cell ideal factor.
Summary of the invention
The purpose of this invention is to provide a kind of device and method that utilizes electroluminescent fluorescent ionization meter solar cell ideal factor, for present solar cell ideal factor provides a valid approach.
The present invention is achieved in that a kind of device that utilizes electroluminescent fluorescent ionization meter solar cell ideal factor, and it comprises:
One direct current current signal source (101) is for sample provides dc bias current;
One specimen holder (102) is used for installing and fixing the solar cell sample;
One infrared intensity detector (103) is measured the infrared light intensity under the solar cell sample direct current biasing;
It is characterized in that the dc current signal source connects the solar cell sample on the specimen holder, the infrared light intensity under the solar cell sample direct current biasing is input to the infrared intensity detector.
A kind of method of utilizing electroluminescent fluorescent ionization meter solar cell ideal factor is characterized in that, this method comprises the steps: that (1) dc current signal source (101) connects specimen holder (102) and goes up the sample two end electrodes; (2) sample is launched Infrared under the effect in dc current signal source, and Infrared intensity is measured by infrared intensity detector (103); (3) the infrared light intensity and the DC current characteristic of employing theoretical formula match solar cell obtain the solar cell ideal factor.
In the step (3), the theoretical fitting formula that is adopted is meant according to single diode model derive the solar cell electroluminescence intensity that draws and the relation of dc bias current.
Test environment is the darkroom, and probe temperature is a room temperature.
Realization utilizes in the device and method of electroluminescent fluorescent ionization meter solar cell ideal factor, solar cell electroluminescent fluorescent intensity
With dc bias current
Theory relation be:
This physical relation scope of application: (1) is based on solar cell list diode model with co-relation and derives; (2) require solar cell dc offset voltage (the also voltage that promptly produces) much larger than thermal noise voltage with co-relation by dc bias current; (3) requiring test environment with co-relation is the darkroom, and probe temperature is a room temperature.
Therefore, can be according to solar cell electroluminescent fluorescent intensity and dc bias current feature data under logarithmic coordinate, just can utilize the sunny battery ideal factor of top theoretical formula linear fit, i.e. the slope of matched curve.
Device and method of the present invention and traditional metering system relatively have following characteristics:
1, than common current-voltage characteristic curve match extracting parameter method higher precision is arranged.
2, this method has the clear and definite scope of application.
3, this measurement mechanism is simple, realizes easily.
Description of drawings
Fig. 1 is a measurement mechanism connection diagram of the present invention;
Fig. 2 is data under solar cell electroluminescent fluorescent intensity and the dc bias current feature logarithmic coordinate, and the linear fit curve map.
Embodiment
The present invention is a kind of device and method that utilizes electroluminescent fluorescent ionization meter solar cell ideal factor.This device comprises: dc current signal source (101), specimen holder (102), infrared intensity detector (103).As shown in Figure 1, this method comprises the steps: 1) the last sample two end electrodes of dc current signal source (101) connection specimen holders (102); 2) sample is launched Infrared under the effect in dc current signal source, and Infrared intensity is measured by infrared intensity detector (103); 3) the infrared light intensity and the DC current characteristic of employing theoretical formula match solar cell obtain the solar cell ideal factor.
As an example, the electricity photoluminescent property under we have utilized this systematic survey photoelectric cell (2CU006) the sample forward voltage.Test result such as Fig. 2; Fig. 2 be under the logarithmic coordinate dc bias current when 0.15A changes to 0.25A, the electroluminescent fluorescent intensity data.Utilize above theoretical formula match experimental data, result such as Fig. 2; Obtaining ideal factor is 1.26158, is in the theoretical scope.
Above example illustrates that the device and method that utilizes electroluminescent fluorescent ionization meter solar cell ideal factor that we design is correct; And the characteristics with a highly significant are utilized this method exactly, and we can simulate the solar cell ideal factor simply fast.
The above; only be the embodiment among the present invention, but protection scope of the present invention is not limited thereto, anyly is familiar with the people of this technology in the disclosed technical scope of the present invention; the conversion that can expect easily or replacement all should be encompassed in of the present invention comprising within the scope.Therefore, protection scope of the present invention should be as the criterion with the protection domain of claims.
Claims (4)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011101493021A CN102253345A (en) | 2011-06-04 | 2011-06-04 | Device and method for measuring ideality factors of solar cells by utilizing electroluminescence intensity |
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| CN2011101493021A CN102253345A (en) | 2011-06-04 | 2011-06-04 | Device and method for measuring ideality factors of solar cells by utilizing electroluminescence intensity |
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| CN102253345A true CN102253345A (en) | 2011-11-23 |
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| CN2011101493021A Pending CN102253345A (en) | 2011-06-04 | 2011-06-04 | Device and method for measuring ideality factors of solar cells by utilizing electroluminescence intensity |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61158866A (en) * | 1984-12-28 | 1986-07-18 | 株式会社東芝 | Ceramic sintered body and manufacture |
| CN1331488A (en) * | 2000-07-04 | 2002-01-16 | 佳能株式会社 | Method and device for measuring photoelectric translating characteristic |
| US20090128157A1 (en) * | 2006-02-27 | 2009-05-21 | Kouki Moriya | Abnormality Determination Device of Power Supply and Abnormality Determination Method Thereof |
-
2011
- 2011-06-04 CN CN2011101493021A patent/CN102253345A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61158866A (en) * | 1984-12-28 | 1986-07-18 | 株式会社東芝 | Ceramic sintered body and manufacture |
| CN1331488A (en) * | 2000-07-04 | 2002-01-16 | 佳能株式会社 | Method and device for measuring photoelectric translating characteristic |
| US20090128157A1 (en) * | 2006-02-27 | 2009-05-21 | Kouki Moriya | Abnormality Determination Device of Power Supply and Abnormality Determination Method Thereof |
Non-Patent Citations (1)
| Title |
|---|
| TAKASHI FUYUKI. ELC: "Analytic findings in the electroluminescence characterization of crystalline silicon solar cells", 《JOURNAL OF APPLIED PHYSICS》 * |
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Application publication date: 20111123 |