CN102130390B - Contact Electronic Inspection Module - Google Patents
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- CN102130390B CN102130390B CN 201010002403 CN201010002403A CN102130390B CN 102130390 B CN102130390 B CN 102130390B CN 201010002403 CN201010002403 CN 201010002403 CN 201010002403 A CN201010002403 A CN 201010002403A CN 102130390 B CN102130390 B CN 102130390B
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Abstract
Description
技术领域 technical field
本发明关于一种接触式电子检验模块,尤指一种应用在接触式集成电路(IC)及其它电子产品检验设备的接触式电子检验模块。The invention relates to a contact electronic inspection module, in particular to a contact electronic inspection module used in contact integrated circuit (IC) and other electronic product inspection equipment.
背景技术 Background technique
一般集成电路(IC)及其它电子产品制造完成时,必需经过多项检验,以确保产品的良率。现有的集成电路(IC)及其它电子产品的检验方式,主要分为非接触式检验及接触式检验二种,非接触式检验是应用光学设备检验,接触式检验则将集成电路或其它电子产品放置在检测装置上,通过检测装置的探针(端子)与集成电路或其它电子产品的接点作接触,藉此取得检验数据,用以验证其质量。When the general integrated circuit (IC) and other electronic products are manufactured, they must go through multiple inspections to ensure the yield rate of the products. The existing inspection methods for integrated circuits (IC) and other electronic products are mainly divided into two types: non-contact inspection and contact inspection. Non-contact inspection uses optical equipment inspection, and contact inspection uses integrated circuits or other electronic products. The product is placed on the testing device, and the probes (terminals) of the testing device are in contact with the contacts of integrated circuits or other electronic products, so as to obtain inspection data to verify its quality.
为了使接触式检验设备可以适应多种集成电路(IC)及其它电子产品,相关业者提出一种接触式检测装置(模块)。现有的接触式检测装置如图1所示,具有一矩形的载座10,在载座10设有多数个呈特定形式排列的通孔101,各通孔101中植入多数个金属球20,并在通孔101上端及下端分别设有一上导接部30及一下导接部40,上导接部30的端面镀设有金属膜301,下导接部40的端面结合有导电胶膜401。但,这种接触式检测装置,通过金属膜301与集成电路或其它电子产品的接点作接触,导致金属膜301容易被磨损;而且,当金属膜301使用一段时间被磨损时,不容易实施更换及修复,只能将整组检测装置淘汰,造成资源浪费、检验成本增加;另外,通过多数个金属球20接通上、下导接部30、40,容易产生多个缝隙而影响导电性,继而发生导电不良等问题,导致检测结果的信赖度不佳。In order to make the contact inspection equipment adaptable to various integrated circuits (IC) and other electronic products, related companies propose a contact inspection device (module). As shown in Figure 1, the existing contact detection device has a
如图2所示,现有的另一种接触式检测装置,采用冲压制成的金属探针50,并将金属探针50结合在载座10的通孔101中,使各个金属探针50上端501突出在载座10上,下端502与检验设备(例如计算机等)连接。这种金属探针50的上端501虽然不容易被磨损,而且可能可以被替换,但是金属探针50的弹性系数不足或结构设计不良,反而容易磨损集成电路或其它电子产品的接点(例如磨损用以增进导接性的镀层),甚至于破坏集成电路的接点。由此可见,现有应用在集成电路及其它电子产品的接触式检测装置,存在许多亟待改进的缺陷。As shown in Figure 2, another existing contact detection device adopts
因此,如何发明出一种接触式电子检验模块,可以应用在集成电路(IC)及其它电子产品的检验程序上,以使电子检验模块的导接端子达到可以防止被磨损、可以抽取替换、能保护集成电路及其它电子产品的接点、以及增进导电性的效果,现有技术中尚未提出有效的解决方案。Therefore, how to invent a contact electronic inspection module, which can be applied to the inspection procedures of integrated circuits (IC) and other electronic products, so that the conductive terminals of the electronic inspection module can prevent from being worn out, can be extracted and replaced, and can be replaced. To protect the contacts of integrated circuits and other electronic products, and to improve the conductivity, no effective solution has been proposed in the prior art.
发明内容 Contents of the invention
有鉴于上述现有技术的缺陷,本发明提供一种接触式电子检验模块,以期达到导接端子可以防止被磨损、导接端子可以抽取替换、保护集成电路及其它电子产品的接点、以及增进导电性的目的。In view of the above-mentioned defects in the prior art, the present invention provides a contact electronic inspection module, in order to prevent the conductive terminals from being worn out, to extract and replace the conductive terminals, to protect the contacts of integrated circuits and other electronic products, and to improve electrical conductivity. sexual purpose.
本发明的主要目的在提供一种接触式电子检验模块,其借着承载座及多数个导接端子的结构设计,致使其导接端子具有优良的弹性系数,可以与集成电路(IC)及其它电子产品的接点作接触,并具有可与承载座分离的卡合结构,进而达到导接端子可以防止被磨损、导接端子可以抽取替换、保护集成电路及其它电子产品的接点、以及增进导电性的目的。The main purpose of the present invention is to provide a contact type electronic inspection module, which can be used with integrated circuits (IC) and other The contacts of electronic products are in contact, and have a snap-fit structure that can be separated from the bearing seat, so that the conductive terminals can be prevented from being worn out, the conductive terminals can be extracted and replaced, the contacts of integrated circuits and other electronic products can be protected, and the conductivity can be improved. the goal of.
为达上述目的,本发明接触式电子检验模块的实施内容包含有:一承载座,该承载座上设有多数个端子孔;及多数个分别结合在端子孔中的导接端子,该导接端子的二端分别露出在承载座的上、下面,其中:该导接端子包含一弹性柱,及一条或一条以上埋设在弹性柱中央的导电丝,该导电丝包含中间的一段弹性部及二端的导接部,并使二端的导接部露出在弹性柱的二端。In order to achieve the above purpose, the implementation content of the contact type electronic inspection module of the present invention includes: a bearing seat, which is provided with a plurality of terminal holes; and a plurality of conducting terminals respectively combined in the terminal holes, the conducting terminals The two ends of the terminal are respectively exposed on the upper and lower sides of the bearing seat, wherein: the conductive terminal includes an elastic column, and one or more conductive wires embedded in the center of the elastic column, and the conductive wire includes a section of elastic part in the middle and two The leading part at the end, and the leading part at the two ends is exposed at the two ends of the elastic column.
上述该导接端子的导电丝的弹性部为螺旋状结构,该导接部分别弯折在弹性柱二端的片体;又,该导接端子的弹性柱为硅酮(Silicone)基质或高分子聚合物所构成;该导接端子的弹性柱为具有一上端面、一下端面及一侧面的柱体,该上端面露出在承载座上面,该下端面露出在承载座下面,该侧面设有一卡合在承载座端子孔中的凸部,如此使导电丝二端的导接部分别露出在弹性柱的上端面与下端面。另者,该承载座的端子孔靠近上端设有一往内缩的阶级面,该弹性柱的凸部下端抵靠在阶级面上;该承载座上面可结合有一固定组件,固定组件设有对应端子孔的通孔,使弹性柱的上端面穿过通孔露出在固定组件上面,并使该通孔的边缘抵压在弹性柱的凸部上端;该承载座上面设有一凹槽,使固定组件结合在凹槽中;该承载座上面可设有一定位凸部,该固定组件设有一与定位凸部结合的定位凹部。The elastic part of the conductive thread of the above-mentioned connecting terminal is a spiral structure, and the connecting part is respectively bent on the sheets at the two ends of the elastic column; in addition, the elastic column of the connecting terminal is made of a silicone (Silicone) matrix or a polymer Composed of polymers; the elastic column of the lead terminal is a column with an upper end surface, a lower end surface and a side surface, the upper end surface is exposed above the bearing seat, the lower end surface is exposed under the bearing seat, and a card is provided on the side surface The convex part fits in the terminal hole of the bearing seat, so that the leading parts at the two ends of the conductive wire are respectively exposed on the upper end surface and the lower end surface of the elastic column. In addition, the terminal hole of the bearing base is provided with a stepped surface that shrinks inward near the upper end, and the lower end of the convex part of the elastic column is against the stepped surface; a fixing component can be combined with the bearing base, and the fixing component is provided with a corresponding terminal. The through hole of the hole allows the upper end surface of the elastic column to pass through the through hole to expose on the fixing assembly, and make the edge of the through hole press against the upper end of the convex part of the elastic column; a groove is provided on the bearing seat to make the fixing assembly Combined in the groove; a positioning convex part can be provided on the bearing seat, and a positioning concave part combined with the positioning convex part can be provided on the fixing component.
综上,本发明的一种接触式电子检验模块,使导接端子可以防止被磨损、导接端子可以抽取替换、保护集成电路及其它电子产品的接点、以及增进导电性的功效。To sum up, the contact electronic inspection module of the present invention prevents the conductive terminals from being worn out, the conductive terminals can be extracted and replaced, protects the contacts of integrated circuits and other electronic products, and improves the conductivity.
附图说明 Description of drawings
图1为现有技术接触式检测装置的示意图;Fig. 1 is the schematic diagram of prior art contact detection device;
图2为现有技术另一种接触式检测装置的示意图;2 is a schematic diagram of another contact detection device in the prior art;
图3为本发明较佳实施例的组合立体图;Fig. 3 is a combined perspective view of a preferred embodiment of the present invention;
图4为本发明导接端子较佳实施例的剖面图;Fig. 4 is a sectional view of a preferred embodiment of the lead terminal of the present invention;
图5为本发明较佳实施例的分解立体图;Figure 5 is an exploded perspective view of a preferred embodiment of the present invention;
图6为本发明较佳实施例的组合侧视图;Figure 6 is a combined side view of a preferred embodiment of the present invention;
图7为本发明图6A部分的放大示意图;FIG. 7 is an enlarged schematic diagram of part of FIG. 6A of the present invention;
图8为本发明较佳实施例的分解侧视图;Figure 8 is an exploded side view of a preferred embodiment of the present invention;
图9为本发明图7B部分的放大示意图;Fig. 9 is an enlarged schematic diagram of part B of Fig. 7 of the present invention;
图10为本发明较佳实施例的应用状态示意图;Fig. 10 is a schematic diagram of the application state of a preferred embodiment of the present invention;
图11为本发明图10C部分的放大示意图。Fig. 11 is an enlarged schematic view of the part of Fig. 10C of the present invention.
【主要组件符号说明】[Description of main component symbols]
1承载座1 carrying seat
11端子孔11 terminal hole
12凹槽12 grooves
13阶级面13 class noodle
14定位凸部14 positioning convex part
2导接端子2 lead terminals
21弹性柱21 elastic column
211上端面211 upper end face
212下端面212 lower end face
213侧面213 side
214凸部214 Convex
22导电丝22 conductive wire
221弹性部221 elastic part
222导接部222 leading part
3固定组件3 fixed components
31通孔31 through holes
32定位凹部32 positioning recess
4集成电路4 integrated circuits
41接点41 contacts
具体实施方式 Detailed ways
为充分了解本发明的目的、特征及功效,兹藉由下述具体的实施例,并配合所附的图式,对本发明做一详细说明,说明如后:In order to fully understand the purpose, features and effects of the present invention, the present invention will be described in detail by the following specific embodiments and accompanying drawings, as follows:
参阅图3、图4及图5所示,本发明的接触式电子检验模块,较佳的实施例包含有:一承载座1,该承载座1为矩形或其它形状的绝缘座体,在承载座1上设有多数个排列的端子孔11,如图所示可以排列在承载座1上相应的二侧,亦可以采用其它几何形状的排列方式;及多数个分别结合在端子孔11中的导接端子2,使该导接端子2的二端分别露出在承载座1的上面与下面。如图4所示,该导接端子2包含有一弹性柱21,及一条或一条以上垂直埋设在弹性柱21中央的导电丝22,该导电丝22包含有中间的一段弹性部221及二端的导接部222,并使二端的导接部222露出在弹性柱21的二端,藉此组成接触式电子检验模块,提供集成电路(IC)及其它电子产品放置在承载座1上,使集成电路(IC)及其它电子产品的接点可以与导接端子2的上导接部222接触,再通过导接端子2的下导接部222连接到电子检验设备,以进行接触式的检验程序,确保质量良率。Referring to Fig. 3, Fig. 4 and Fig. 5, a preferred embodiment of the contact type electronic inspection module of the present invention includes: a bearing
又如图4所示,本发明导接端子2为了增进弹性系数,其较佳的实施例包含:该导接端子2的导电丝22的弹性部221为螺旋状结构或反复曲折结构,使弹性部221可以跟随着弹性柱21伸缩。该导接端子2的导电丝22二端的导接部222分别弯折在弹性柱二端的片体或其它足以作电性连接的结构。且该导电丝22可为金(Au)、银(Ag)、铜(Cu)或其合金所构成,具有高导电率、低电阻的特性。又,该导接端子2的弹性柱21为弹性系数较佳的硅酮(Silicone,俗称硅胶)基质添加硬化剂,或高分子聚合物等其它具有弹性的材质所构成。如图6及图7所示,本发明较佳的实施例更包含:该导接端子2的弹性柱21为构成有一上端面211、一下端面212及一侧面213的圆形或其它几何形状的柱体,该上端面211露出在承载座1上面,该下端面212露出在承载座1下面,该侧面213设有一卡合在承载座1端子孔11中的凸部214,并使上述该导电丝22二端的导接部222分别露出在弹性柱21的上端面211与下端面212,可以分别与集成电路(IC)及其它电子产品的接点,以及电子检验设备电性连接。As shown in Figure 4, in order to increase the elastic coefficient of the
如图7、图8及图9所示,本发明的承载座1为了使导接端子2可以替换,其较佳的实施例包含:该承载座1的端子孔11靠近上端设有一往内缩的阶级面13,如此使该导接端子2弹性柱21的凸部214下端抵靠在阶级面13上。该承载座1上面结合有一矩形片或其它形状的固定组件3,该固定组件3设有对应各端子孔11的通孔31,如此使该导接端子2弹性柱21上段的穿过通孔31,进而使上端面211及导电丝22的上导接部222露出在固定组件3上面,并利用该通孔31的边缘抵压在弹性柱21的凸部214上端,将导接端子2固定在各端子孔11中。又,该承载座1上面可以设有一凹槽12,使上述该端子孔11设置在凹槽12中,并使该固定组件3定位结合在凹槽12中。为了使承载座1与固定组件3可以精准定位结合,该承载座1上面可设有至少一定位凸部14,该定位凸部14可为圆柱;而该固定组件3设有至少一与定位凸部14结合的定位凹部32,该定位凹部32可为匹配圆柱的圆孔。As shown in Fig. 7, Fig. 8 and Fig. 9, in order to make the connecting
藉本发明上述的接触式电子检验模块设计,其应用实施成为集成电路(IC)及其它电子产品的接触式检验装置时,如图10及图11所示,可以将封装完成的集成电路4或其它电子产品放置在承载座1上,使集成电路4的接点41与导接端子2的导电丝22上端的导接部222形成电性连接,如此通过导电丝22下端的导接部222连接到检验设备(例如计算机等),就能进行集成电路4及其它电子产品的接触式检测程序。By means of the above-mentioned contact-type electronic inspection module design of the present invention, when its application is implemented as a contact-type inspection device for integrated circuits (IC) and other electronic products, as shown in Figure 10 and Figure 11, the
由于本发明该导接端子2的弹性柱21为硅酮(Silicone)基质或高分子聚合物等所构成,其具有良好的弹性系数特性,因此当导接端子2的上端面211及导电丝22上端的导接部222接触到集成电路4的接点41或其它电子产品时,将能形成收缩与缓冲的效果,降低操作人员或自动机器置放集成电路4的冲击力,藉此防止导电丝22上端的导接部222被磨损,并能避免导接端子2或导接部222磨损或破坏集成电路4的接点41。而且如图11所示,本发明导接端子2能够使弹性体21的上接触面211对集成电路4的接点41形成包覆接触及定位作用,藉此获致良好的电性导接效果。又,本发明利用金(Au)、银(Ag)、铜(Cu)或其合金构成导电丝22而作为导接的媒介,避免如图1所示现有技术可能发生缝隙的缺陷,因此能降低电阻、增进导电性,以确保检验数据的正确性与可信赖度,减少在进行功能性测试时产生误判,有效地避免瑕疵品流出市面。另外,本发明具有可替换导接端子2的结构设计,当有需要替换导接端子2时,可以将上述的固定组件3拆开,如此就能抽出使用寿命已达成的导接端子2,再替换新的导接端子2或重新矩阵排列,达到导接端子2可以抽取替换的功效,使得降低检验成本。Since the
如上所述,本发明完全符合专利三要件:新颖性、创造性和产业上的可实用性。以新颖性和创造性而言,本发明借着承载座及多数个导接端子的结构设计,致使其导接端子具有优良的弹性系数,可以与集成电路(IC)及其它电子产品的接点作接触,并具有可与承载座分离的卡合结构,进而达到导接端子可以防止被磨损、导接端子可以抽取替换、保护集成电路及其它电子产品的接点、以及增进导电性的效用。就产业上的可利用性而言,利用本发明所衍生的产品,当可充分满足目前市场的需求。As mentioned above, the present invention fully complies with the three requirements of a patent: novelty, creativity and industrial applicability. In terms of novelty and creativity, the present invention utilizes the structural design of the bearing seat and a plurality of conductive terminals, so that the conductive terminals have excellent elastic coefficients, and can be in contact with the contacts of integrated circuits (IC) and other electronic products , and has an engaging structure that can be separated from the bearing seat, thereby achieving the functions of preventing the lead terminals from being worn out, extracting and replacing the lead terminals, protecting the contacts of integrated circuits and other electronic products, and improving conductivity. In terms of industrial applicability, the products derived from the present invention should fully meet the needs of the current market.
本发明在上文中已以较佳实施例揭露,然本领域技术人员应理解的是,该实施例仅用于描绘本发明,而不应解读为限制本发明的范围。应注意的是,举凡与该实施例等效的变化与置换,均应设为涵盖于本发明的范畴内。因此,本发明的保护范围当以权利要求书所界定者为准。The present invention has been disclosed above with preferred embodiments, but those skilled in the art should understand that the embodiments are only for describing the present invention, and should not be construed as limiting the scope of the present invention. It should be noted that all changes and substitutions equivalent to this embodiment should be included in the scope of the present invention. Therefore, the protection scope of the present invention should be defined by the claims.
Claims (6)
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CN101334425A (en) * | 2007-06-29 | 2008-12-31 | 京元电子股份有限公司 | Integrated circuit element test socket, socket substrate, test machine and manufacturing method thereof |
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CN101334425A (en) * | 2007-06-29 | 2008-12-31 | 京元电子股份有限公司 | Integrated circuit element test socket, socket substrate, test machine and manufacturing method thereof |
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JP特开2000-322938A 2000.11.24 |
JP特开2004-296301A 2004.10.21 |
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