CN102097588A - Method for preparing molecular junction by polydimethylsiloxane stencil printing - Google Patents
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Abstract
一种聚二甲基硅氧烷模板印刷制备分子结的方法,清洗Si基片后进行光刻,制备下电极,在Au下电极表面制备分子自组装薄膜,制备聚二甲基硅氧烷模板,制备聚二甲基硅氧烷印章,制备上电极,然后进行上电极印刷,得到十字交叉分子结。本发明提供了一种有机分子层交叉分子结上电极的无损制备方法,避免了直接将Au膜沉积到有机分子层上时,由于少量金属颗粒渗入分子间孔隙而导致的上下电极短路或蒸发沉积热致烧蚀破坏带来的弊端。本发明方法有效避免了金属/分子接触界面之间的严重不确定性。
A method for preparing molecular junctions by polydimethylsiloxane template printing, cleaning the Si substrate and performing photolithography to prepare the lower electrode, preparing a molecular self-assembled film on the surface of the Au lower electrode, and preparing a polydimethylsiloxane template , to prepare a polydimethylsiloxane stamp, prepare the upper electrode, and then print the upper electrode to obtain a cross molecular junction. The invention provides a non-destructive preparation method for the upper electrode of an organic molecular layer cross molecular junction, which avoids the short circuit of the upper and lower electrodes or evaporation deposition caused by a small amount of metal particles penetrating into the inter-molecular pores when the Au film is directly deposited on the organic molecular layer. Disadvantages of thermally induced ablation damage. The method of the invention effectively avoids serious uncertainty between metal/molecular contact interfaces.
Description
技术领域 technical field
本发明属于电子器件技术领域,涉及分子电子器件技术,特别涉及一种聚二甲基硅氧烷模板印刷制备分子结的方法。 The invention belongs to the technical field of electronic devices, relates to molecular electronic device technology, in particular to a method for preparing molecular junctions by polydimethylsiloxane template printing.
背景技术 Background technique
在分子电子器件领域,实现对若干分子聚集体或单层分子薄膜光电特性的测控与其器件的高度集成及微纳化,是未来电子电路超微型化发展的趋势之一。而构筑分子电子器件的基本思路是制备具有金属-分子-金属结构的分子结,然而在一定有限面积的基底上实现简单、 廉价、高效地构筑微纳分子结依然是一项巨大的挑战。目前一种设备简单、成本低廉、效率比较高的制备方法是用PDMS模板印刷方法制备分子结。它主要是通过具有所需微纳图案的PDMS印章作为上部金属电极转移的媒介,使之与下电极上的有机分子层缓慢接触粘附而构成分子结。由于PDMS是一种弹性材料,对所制备器件的成品率有很大影响,易使图形结构在重力和表面张力作用下发生变形、粘结和上下电极短路等问题。通常模板印刷法制备的分子结,其功能薄膜介质的厚度约为50~250nm,对于单分子层薄膜(厚度在10纳米以下)其成功几率非常低,故需要进一步的改进,以获得具有更佳性质的单分子层器件。 In the field of molecular electronic devices, it is one of the trends in the development of ultra-miniaturization of electronic circuits in the future to realize the measurement and control of the photoelectric properties of several molecular aggregates or single-layer molecular thin films and the high integration and micronanoization of their devices. The basic idea of building molecular electronic devices is to prepare molecular junctions with a metal-molecule-metal structure. It is still a great challenge to construct micro-nano molecular junctions cheaply and efficiently. At present, a preparation method with simple equipment, low cost and high efficiency is to use PDMS template printing method to prepare molecular junctions. It mainly uses the PDMS stamp with the required micro-nano pattern as the medium for the transfer of the upper metal electrode, so that it slowly contacts and adheres to the organic molecular layer on the lower electrode to form a molecular junction. Since PDMS is an elastic material, it has a great influence on the yield of the prepared device, and it is easy to cause problems such as deformation, adhesion, and short circuit of the upper and lower electrodes of the graphic structure under the action of gravity and surface tension. Usually, the molecular junction prepared by stencil printing method has a thickness of about 50-250nm as a functional thin film medium. For monolayer thin films (thickness below 10nm), the probability of success is very low, so further improvement is needed to obtain better performance. properties of monolayer devices.
发明内容 Contents of the invention
针对上述现有技术的不足之处,本发明提供一种聚二甲基硅氧烷模板印刷制备分子结的方法,解决金属/分子接触界面之间的严重不确定性问题。 Aiming at the shortcomings of the above-mentioned prior art, the present invention provides a method for preparing molecular junctions by polydimethylsiloxane template printing, which solves the serious uncertainty problem between metal/molecular contact interfaces.
本发明方法步骤如下。 The method steps of the present invention are as follows.
(1)清洗Si基片 (1) Cleaning the Si substrate
在纯Si(100)基片的上下两面,用干氧氧化方法在1100~1200℃下生长200~300 nm厚的SiO2层,氧化时间4~6小时。将切好尺寸的Si基片浸入50~80℃的piranha溶液中,10~20分钟后取出,再依次浸入去离子水、丙酮和酒精中分别以超声波清洗3~5分钟。 On the upper and lower sides of the pure Si (100) substrate, a 200-300 nm thick SiO 2 layer is grown at 1100-1200 ° C by dry oxygen oxidation, and the oxidation time is 4-6 hours. Dip the cut Si substrate into a piranha solution at 50-80°C, take it out after 10-20 minutes, and then immerse it in deionized water, acetone and alcohol in sequence and clean it with ultrasonic waves for 3-5 minutes respectively.
需注意的是:piranha溶液为纯H2SO4和质量浓度30% 的H2O2按体积比4:1的比例混合的混合物,是一种高氧化活性的腐蚀性溶液,有可能与有机材料发生剧烈的反应,操作人员要注意身体的防护(需穿戴护目镜、实验服、橡胶手套,并在化学通风厨内操作)。 It should be noted that the piranha solution is a mixture of pure H 2 SO 4 and H 2 O 2 with a mass concentration of 30% in a volume ratio of 4:1. The material reacts violently, and the operator should pay attention to the protection of the body (goggles, lab coats, rubber gloves are required, and the operation should be carried out in a chemical fume hood).
(2)光刻 (2) Photolithography
在步骤(1)处理后的Si基片上旋涂正胶S1813,旋涂量为0.7~3μm/cm2,以3~4千转/分钟的速度匀胶30~60s,随后放在加热板上在110~120℃下软烘30~60s,取出后自然冷却到室温。再用PGMEA(1,2-Propanediol monomethyl ether acetate1,2-丙二醇甲醚乙酸酯)或EGMEA(Methoxyethyl acetate醋酸-2-甲氧基乙酯)去边溶剂将Si基片边缘的光刻胶去除。接下来将预先设计的下电极掩膜对准盖在Si基片上曝光60~90 s。然后将Si基片前烘180~300s,温度控制为110~120℃,再自然冷却到室温,取出后放在正胶显影液中显影30~ 60s,最后用去离子水进行清洗并干燥。 Spin-coat positive resist S1813 on the Si substrate treated in step (1), with a spin-coating amount of 0.7-3μm/cm 2 , spread the glue at a speed of 3-4 thousand rpm for 30-60 seconds, and then place it on a heating plate Soft-bake at 110-120°C for 30-60s, take it out and cool to room temperature naturally. Then use PGMEA (1,2-Propanediol monomethyl ether acetate1,2-propylene glycol methyl ether acetate) or EGMEA (Methoxyethyl acetate-2-methoxyethyl acetate) edge removal solvent to remove the photoresist on the edge of the Si substrate . Next, align and cover the pre-designed lower electrode mask on the Si substrate for exposure for 60-90 s. Then pre-bake the Si substrate for 180-300s, the temperature is controlled at 110-120°C, and then naturally cool to room temperature, take it out and develop it in a positive photolithographic developer for 30-60s, and finally wash it with deionized water and dry it.
(3)制备下电极 (3) Prepare the lower electrode
在以上光刻后的Si基片上蒸发沉积5~10nm厚的Cr薄膜粘附层,然后在其基础上以0.3~0.5nm/s的速率蒸发沉积80~100nm厚的Au薄膜,目的是让沉积的Au电极更牢固的与基片结合。将基片上的光刻胶和无关的杂质用丙酮清洗掉(清洗可借助借助超声波震荡5~15 s)。 取出后,用流动的丙酮、无水乙醇和去离子水依次冲洗,干燥后得到突出的Cr-Au薄膜图案,形成下电极。 Evaporate and deposit a 5-10nm thick Cr film adhesion layer on the Si substrate after the above photolithography, and then evaporate and deposit an 80-100nm thick Au film at a rate of 0.3-0.5nm/s on the basis of it, the purpose is to make the deposition The Au electrode is more firmly bonded to the substrate. Clean the photoresist and irrelevant impurities on the substrate with acetone (cleaning can be done by ultrasonic vibration for 5-15 s). After taking it out, wash it with flowing acetone, absolute ethanol and deionized water in sequence, and obtain a prominent Cr-Au thin film pattern after drying to form the lower electrode.
(4)在Au下电极表面制备分子自组装薄膜 (4) Preparation of molecular self-assembled films on the surface of the Au bottom electrode
将以上带有Au下电极的Si基片用无水乙醇清洗,并进行干燥,然后将Si基片浸泡在目标分子的无水乙醇或四氢呋喃(THF,tetrahydrofuran)溶液中22~26小时,溶液浓度为1~2毫摩尔/升,在Au薄膜表面生成一层分子自组装薄膜,目标分子的无水乙醇或四氢呋喃溶液盛装在玻璃容器中。目标分子选用正十二硫醇、1-癸硫醇或正辛硫醇。 The above Si substrate with the Au lower electrode was cleaned with absolute ethanol, and dried, and then the Si substrate was soaked in the target molecule in absolute ethanol or tetrahydrofuran (THF, tetrahydrofuran) solution for 22 to 26 hours, the solution concentration A molecular self-assembled film is formed on the surface of the Au film, and the absolute ethanol or tetrahydrofuran solution of the target molecule is contained in a glass container. The target molecule is n-dodecanethiol, 1-decanethiol or n-octyl mercaptan.
(5)制备聚二甲基硅氧烷(PDMS)模板 (5) Preparation of polydimethylsiloxane (PDMS) template
在另一块相同的经步骤(1)处理的Si基片上旋涂光刻负胶SU-8,以3~4千转/分钟的速度匀胶70~100s,随后放在加热板上于60~80℃软烘120~150 s,再将温度升到80~100°C软烘300~500 s,取出后自然冷却到室温,再用PGMEA或EGMEA去边溶剂将Si基片边缘的光刻胶去除。接下来将预先设计的上电极掩膜对准并盖在基片上,曝光80~100s。然后将基片在60~80℃下硬烘60~120s,升温到80~100℃接着硬烘120~150s,再自然冷却到室温。将基片放在负胶显影液中显影80~100s。最后用去离子水清洗基片,去除杂质并吹干,获得期望的模板图案。 Spin-coat photoresist negative resist SU-8 on another same Si substrate treated in step (1), uniformize the glue at a speed of 3-4 thousand rpm for 70-100 s, and then place it on a heating plate at 60-60 s. Soft bake at 80°C for 120-150 s, then raise the temperature to 80-100°C for 300-500 s, take it out and cool it to room temperature naturally, then use PGMEA or EGMEA edge removal solvent to remove the photoresist on the edge of the Si substrate remove. Next, align and cover the pre-designed upper electrode mask on the substrate, and expose for 80-100s. Then hard-bake the substrate at 60-80°C for 60-120s, raise the temperature to 80-100°C, then hard-bake for 120-150s, and then cool naturally to room temperature. Put the substrate in the negative film developing solution and develop for 80-100s. Finally, the substrate is washed with deionized water to remove impurities and dried to obtain the desired template pattern.
(6)制备聚二甲基硅氧烷(PDMS)印章 (6) Preparation of polydimethylsiloxane (PDMS) stamp
将步骤(5)制作的Si基片粘贴在一个玻璃培养皿底部。将PDMS与固化剂按(8~12):1的体积比混合,搅拌均匀后将PDMS与固化剂的混合物注入敞口容器中并使混合物的高度为3~5mm,然后将装有PDMS与固化剂的混合物的敞口容器放到一个封闭容器内抽真空,使真空度≤103Pa,以除去搅拌过程中混入PDMS聚合物中的气泡。取出装有PDMS与固化剂的混合物的敞口容器,放在烘干箱内在65~75℃静置15~24h,PDMS即固化,用刀片划割一块与Si基片尺寸相同的PDMS区块,并取下该PDMS区块(可用一镊子夹住切下的PDMS区块的边缘使之脱模,与容器分离),得到PDMS印章。 Paste the Si substrate produced in step (5) on the bottom of a glass petri dish. Mix PDMS and curing agent at a volume ratio of (8-12): 1, stir evenly, pour the mixture of PDMS and curing agent into an open container and make the height of the mixture 3-5mm, then put PDMS and curing agent Put the open container of the mixture of reagents into a closed container to evacuate to make the vacuum degree ≤10 3 Pa, so as to remove the air bubbles mixed into the PDMS polymer during the stirring process. Take out the open container containing the mixture of PDMS and curing agent, put it in a drying box and let it stand at 65-75°C for 15-24 hours, the PDMS will be cured, and cut a PDMS block with the same size as the Si substrate with a blade. And remove the PDMS block (you can use a pair of tweezers to clamp the edge of the cut PDMS block to release it from the mold and separate it from the container) to get the PDMS stamp.
固化剂采用聚有机硅灌封胶。 The curing agent is polysilicone potting glue.
(7)制备上电极 (7) Prepare the upper electrode
用一中间开有小口的薄铝片(厚度0.1~1mm)盖住上一步所得PDMS印章,只通过该小口留出中间需要沉积Au电极的一块矩形区域(该矩形区域能够露出完整的上电极形状)。通过该小口在PDMS印章上真空蒸发沉积一层15~25nm厚的Au薄膜,沉积速率为0.3~0.5nm/s。沉积前,需用液氮冷却PDMS印章,降低沉积过程中金属与PDMS间的热致粘附效应,控制冷却温度为-170℃~-180℃,时间为10~15分钟,冷却完再进行沉积。沉积完成后,待基片温度自然升到室温,打开真空室取出带有金膜的PDMS印章,进行下一步的印刷工作。 Cover the PDMS stamp obtained in the previous step with a thin aluminum sheet (thickness 0.1-1mm) with a small opening in the middle, leaving only a rectangular area in the middle where the Au electrode needs to be deposited through the small opening (the rectangular area can reveal the complete shape of the upper electrode ). A layer of Au film with a thickness of 15-25 nm is vacuum evaporated and deposited on the PDMS stamp through the small opening, and the deposition rate is 0.3-0.5 nm/s. Before deposition, it is necessary to cool the PDMS stamp with liquid nitrogen to reduce the thermal adhesion effect between the metal and PDMS during the deposition process. Control the cooling temperature at -170°C to -180°C for 10 to 15 minutes, and then deposit after cooling . After the deposition is completed, wait for the temperature of the substrate to rise to room temperature naturally, open the vacuum chamber and take out the PDMS stamp with the gold film for the next step of printing.
(8)上电极印刷 (8) Upper electrode printing
将带有金膜的PDMS印章置于载玻片上(将不带Au电极的一侧与载玻片接触),在光学显微镜下,通过移动载玻片,将PDMS印章上的Au电极(上电极)与步骤(4)制备的Si基片上带有自组装膜的Au电极(下电极)接触,使上电极搭接区搭在下电极搭接区上,且上电极分子结区(即图3所示的上电极的四个平行的小条)与下电极分子结区(即图3所示的下电极的四个平行的小条)十字交叉接触。由于弹性PDMS模板的浸润性,较轻的Si基片自然被吸附在PDMS模板上。然后,立即将此装置(载玻片上的PDMS印章和步骤(4)制备的Si基片)置于真空室内,通过液氮冷却到-150℃~-180℃并持续10~15分钟。待自然升到室温时,打开真空室,将PDMS印章剥落,上电极被印刷到硅基片上,因而得到十字交叉分子结。用蘸有镓铟液滴的钨针尖扎透上电极搭接区与下电极搭接区接触的区域形成欧姆接触。 Place the PDMS stamp with the gold film on the glass slide (put the side without the Au electrode in contact with the slide glass), and move the Au electrode on the PDMS stamp (upper electrode) under the optical microscope by moving the slide glass. ) is in contact with the Au electrode (lower electrode) with a self-assembled film on the Si substrate prepared in step (4), so that the upper electrode overlapping area overlaps the lower electrode overlapping area, and the molecular junction area of the upper electrode (that is, as shown in Figure 3 The four parallel strips of the upper electrode shown) cross contact with the molecular junction region of the lower electrode (ie, the four parallel strips of the lower electrode shown in Figure 3). Due to the wettability of the elastic PDMS template, the lighter Si substrate was naturally adsorbed on the PDMS template. Then, the device (PDMS stamp on glass slide and Si substrate prepared in step (4)) was immediately placed in a vacuum chamber and cooled to -150°C to -180°C by liquid nitrogen for 10 to 15 minutes. When it naturally rises to room temperature, the vacuum chamber is opened, the PDMS stamp is peeled off, and the upper electrode is printed on the silicon substrate, thus obtaining a cross molecular junction. Use a tungsten needle tip dipped in a gallium indium droplet to pierce through the contact area between the upper electrode overlapping area and the lower electrode overlapping area to form an ohmic contact.
利用半导体参数分析仪测试所得分子结的光电特性,测试系统由变温真空伏安特性测试台、所制备的带有交叉分子结的Si基片和半导体参数分析仪及数据采集计算机共同组成。采用循环伏安法对器件进行电学特性测试,循环次数可根据需要确定。将样品放置在变温真空伏安特性测试台上,通过细金线与分子结的芯片焊盘连接,并通过真空电极引线引出真空室,与半导体参数分析测试仪连接,测试相应分子结的伏安特性曲线。若该分子结在测试前即已短路或者断路,需将测试电极换接到另外一个分子结上,重复以上动作(注意:本发明所制备分子结是可寻址的,每个分子结均可反复测试)。当需要测试分子结器件的变温伏安特性时,需控制真空室样品台的温度,通过液氮冷却获得90K至300K温度范围的无光照条件下的分子结电学伏安特性曲线。 The optoelectronic properties of the obtained molecular junctions were tested with a semiconductor parameter analyzer. The test system consisted of a variable temperature vacuum volt-ampere characteristic test bench, the prepared Si substrate with crossed molecular junctions, a semiconductor parameter analyzer and a data acquisition computer. The electrical characteristics of the device are tested by cyclic voltammetry, and the number of cycles can be determined as required. Place the sample on the temperature-variable vacuum volt-ampere characteristic test bench, connect it to the chip pad of the molecular junction through a thin gold wire, and lead it out of the vacuum chamber through the vacuum electrode lead, connect it to a semiconductor parameter analysis tester, and test the volt-ampere of the corresponding molecular junction characteristic curve. If the molecular junction has been short-circuited or disconnected before the test, the test electrode needs to be switched to another molecular junction, and the above actions should be repeated (note: the molecular junction prepared in the present invention is addressable, and each molecular junction can be repeated testing). When it is necessary to test the temperature-variable volt-ampere characteristics of molecular junction devices, it is necessary to control the temperature of the sample stage in the vacuum chamber, and obtain the molecular junction electrical volt-ampere characteristic curve under the condition of no light in the temperature range of 90K to 300K through liquid nitrogen cooling.
本发明提供了一种有机分子层交叉分子结上电极的无损制备方法,通过调整沉积速率和控制沉积时间将Au膜快速沉积在PDMS印章上,然后借助弹性模板印刷方法制备分子结上电极,避免了直接将Au膜沉积到有机分子层上时,由于少量金属颗粒渗入分子间孔隙而导致的上下电极短路或蒸发沉积热致烧蚀破坏带来的弊端。本发明方法制备的金属—分子—金属结构分子结,为研究分子电子器件的电荷输运特性方面提供了一种简单、有效、低成本的测试平台,它有效避免了金属/分子接触界面之间的严重不确定性。相对于常规的汞滴或扫描探针显微镜针尖法,本发明制备的交叉分子结还可实现寻址功能,而且这种可寻址的交叉分子结为获取低频交流电压驱动的光电开关和晶体管提供了一种简单的方法。另外,本发明的模板印刷技术为发展具有开关、晶体管、光传感等特性的新型分子结器件提供了一种技术路径。 The invention provides a non-destructive preparation method of an organic molecular layer intersecting the molecular junction upper electrode, by adjusting the deposition rate and controlling the deposition time, the Au film is quickly deposited on the PDMS stamp, and then the molecular junction upper electrode is prepared by means of an elastic template printing method, avoiding When the Au film is directly deposited on the organic molecular layer, the disadvantages caused by the short circuit of the upper and lower electrodes or the thermal ablation damage caused by evaporation deposition due to the infiltration of a small amount of metal particles into the intermolecular pores are eliminated. The metal-molecule-metal structure molecular junction prepared by the method of the present invention provides a simple, effective and low-cost test platform for studying the charge transport characteristics of molecular electronic devices, and it effectively avoids the gap between metal/molecular contact interfaces. serious uncertainty. Compared with the conventional mercury drop or scanning probe microscope tip method, the intersecting molecular junction prepared by the present invention can also realize the addressing function, and this addressable crossing molecular junction provides an opportunity to obtain photoelectric switches and transistors driven by low-frequency AC voltage. a simple method. In addition, the stencil printing technology of the present invention provides a technical path for developing novel molecular junction devices with characteristics such as switches, transistors, and light sensing.
附图说明 Description of drawings
图1为上电极的掩膜设计图案; Fig. 1 is the mask design pattern of upper electrode;
图2为下电极的掩膜设计图案; Fig. 2 is the mask design pattern of lower electrode;
图3为分子结的器件结构示意图; Figure 3 is a schematic diagram of the device structure of the molecular junction;
图4为薄铝片结构示意图; Fig. 4 is a schematic diagram of the structure of a thin aluminum sheet;
图5为实施例1制备的分子结电学伏安特性曲线;
Fig. 5 is the electrical volt-ampere characteristic curve of the molecular junction prepared in
图中:1上电极搭接区;2下电极搭接区;3镓铟液滴;4Si基片,5上电极分子结区,6下电极分子结区,7薄铝片,8小口。 In the figure: 1 upper electrode overlapping area; 2 lower electrode overlapping area; 3 gallium indium droplet; 4 Si substrate, 5 upper electrode molecular junction area, 6 lower electrode molecular junction area, 7 thin aluminum sheet, 8 small opening.
具体实施方式 Detailed ways
实施例1Example 1
聚二甲基硅氧烷模板印刷制备分子结的方法步骤如下。 The steps of the method for preparing molecular knots by polydimethylsiloxane template printing are as follows.
(1)清洗Si基片 (1) Cleaning the Si substrate
在纯Si(100)基片的上下两面,用干氧氧化方法在1150℃下生长250 nm厚的SiO2层,氧化时间5小时。将切好尺寸的Si基片浸入65℃的piranha溶液中,15分钟后取出,再依次浸入去离子水、丙酮和酒精中分别以超声波清洗4分钟。 On the upper and lower sides of the pure Si (100) substrate, a 250 nm thick SiO 2 layer was grown at 1150 ° C by dry oxygen oxidation method, and the oxidation time was 5 hours. Dip the cut-sized Si substrate into the piranha solution at 65°C, take it out after 15 minutes, and then immerse it in deionized water, acetone and alcohol successively and clean it with ultrasonic wave for 4 minutes respectively.
需注意的是:piranha溶液为纯H2SO4和质量浓度30% 的H2O2按体积比4:1的比例混合的混合物,是一种高氧化活性的腐蚀性溶液,有可能与有机材料发生剧烈的反应,操作人员要注意身体的防护(需穿戴护目镜、实验服、橡胶手套,并在化学通风厨内操作)。 It should be noted that the piranha solution is a mixture of pure H 2 SO 4 and H 2 O 2 with a mass concentration of 30% in a volume ratio of 4:1. The material reacts violently, and the operator should pay attention to the protection of the body (goggles, lab coats, rubber gloves are required, and the operation should be carried out in a chemical fume hood).
(2)光刻 (2) Photolithography
在步骤(1)处理后的Si基片上旋涂正胶S1813,旋涂量为1.8μm/cm2,以3.5千转/分钟的速度匀胶45s,随后放在加热板上在115℃下软烘45s,取出后自然冷却到室温。再用PGMEA(1,2-Propanediol monomethyl ether acetate1,2-丙二醇甲醚乙酸酯)去边溶剂将Si基片边缘的光刻胶去除。接下来将预先设计的下电极掩膜对准盖在Si基片上曝光75 s。然后将Si基片前烘240s,温度控制为115℃,再自然冷却到室温,取出后放在正胶显影液中显影45s,最后用去离子水进行清洗并干燥。 Spin-coat the positive resist S1813 on the Si substrate treated in step (1), with a spin-coating amount of 1.8 μm/cm 2 , uniform the glue at a speed of 3.5 thousand revolutions/min for 45 seconds, and then place it on a heating plate at 115°C for soft coating. Bake for 45s, take it out and cool to room temperature naturally. Then use PGMEA (1,2-Propanediol monomethyl ether acetate) edge removal solvent to remove the photoresist on the edge of the Si substrate. Next, align and cover the pre-designed lower electrode mask on the Si substrate for exposure for 75 s. Then the Si substrate was pre-baked for 240s, the temperature was controlled at 115°C, and then cooled to room temperature naturally. After taking it out, it was developed in a positive resist developer for 45s, and finally cleaned with deionized water and dried.
(3)制备下电极 (3) Prepare the lower electrode
在以上光刻后的Si基片上蒸发沉积7.5nm厚的Cr薄膜粘附层,然后在其基础上以0.4nm/s的速率蒸发沉积90nm厚的Au薄膜,目的是让沉积的Au电极更牢固的与基片结合。将基片上的光刻胶和无关的杂质用丙酮清洗掉。 取出后,用流动的丙酮、无水乙醇和去离子水依次冲洗,干燥后得到突出的Cr-Au薄膜图案,形成下电极。 Evaporate and deposit a 7.5nm-thick Cr film adhesion layer on the Si substrate after the above photolithography, and then evaporate and deposit a 90nm-thick Au film at a rate of 0.4nm/s on the basis of it, in order to make the deposited Au electrode stronger combined with the substrate. The photoresist and irrelevant impurities on the substrate were cleaned with acetone. After taking it out, wash it with flowing acetone, absolute ethanol and deionized water in sequence, and obtain a prominent Cr-Au thin film pattern after drying to form the lower electrode.
(4)在Au下电极表面制备分子自组装薄膜 (4) Preparation of molecular self-assembled films on the surface of the Au bottom electrode
将以上带有Au下电极的Si基片用无水乙醇清洗,并进行干燥,然后将Si基片浸泡在目标分子的无水乙醇溶液中24小时,溶液浓度为1.5毫摩尔/升,在Au薄膜表面生成一层分子自组装薄膜,目标分子的无水乙醇溶液盛装在玻璃容器中。目标分子选用正十二硫醇。 The above Si substrate with the Au lower electrode was cleaned with absolute ethanol, and dried, and then the Si substrate was soaked in the absolute ethanol solution of the target molecule for 24 hours, the solution concentration was 1.5 mmol/L, and the Au A molecular self-assembled film is formed on the surface of the film, and the absolute ethanol solution of the target molecule is contained in a glass container. The target molecule is n-dodecanethiol.
(5)制备聚二甲基硅氧烷(PDMS)模板 (5) Preparation of polydimethylsiloxane (PDMS) template
在另一块相同的经步骤(1)处理的Si基片上旋涂光刻负胶SU-8,以3.5千转/分钟的速度匀胶85s,随后放在加热板上于70℃软烘135 s,再将温度升到90℃软烘400 s,取出后自然冷却到室温,再用PGMEA去边溶剂将Si基片边缘的光刻胶去除。接下来将预先设计的上电极掩膜对准并盖在基片上,曝光90s。然后将基片在70℃下硬烘90s,升温到90℃接着硬烘135s,再自然冷却到室温。将基片放在负胶显影液中显影90s。最后用去离子水清洗基片,去除杂质并吹干,获得期望的模板图案。 Spin-coat photoresist negative resist SU-8 on another same Si substrate treated in step (1), uniformize the glue at a speed of 3.5 thousand rpm for 85 s, and then place it on a heating plate at 70 ° C for 135 s , and then raise the temperature to 90°C for soft baking for 400 s, take it out and cool it to room temperature naturally, and then remove the photoresist on the edge of the Si substrate with PGMEA edge removal solvent. Next, align and cover the pre-designed upper electrode mask on the substrate, and expose for 90s. Then hard-bake the substrate at 70°C for 90s, raise the temperature to 90°C and then hard-bake for 135s, and then naturally cool to room temperature. The substrate was developed in a negative film developer for 90 s. Finally, the substrate is washed with deionized water to remove impurities and dried to obtain the desired template pattern.
(6)制备聚二甲基硅氧烷(PDMS)印章 (6) Preparation of polydimethylsiloxane (PDMS) stamp
将步骤(5)制作的Si基片粘贴在一个玻璃培养皿底部。将PDMS与固化剂按10:1的体积比混合,搅拌均匀后将PDMS与固化剂的混合物注入敞口容器中并使混合物的高度为4mm,然后将装有PDMS与固化剂的混合物的敞口容器放到一个封闭容器内抽真空,使真空度≤103Pa,以除去搅拌过程中混入PDMS聚合物中的气泡。取出装有PDMS与固化剂的混合物的敞口容器,放在烘干箱内在70℃静置20h,PDMS即固化,用刀片划割一块与Si基片尺寸相同的PDMS区块,并取下该PDMS区块(用一镊子夹住切下的PDMS区块的边缘使之脱模,与容器分离),得到PDMS印章。 Paste the Si substrate produced in step (5) on the bottom of a glass petri dish. Mix PDMS and curing agent at a volume ratio of 10:1, stir evenly, pour the mixture of PDMS and curing agent into an open container and make the height of the mixture 4mm, and then open the container containing the mixture of PDMS and curing agent The container is placed in a closed container and vacuumed so that the vacuum degree is ≤10 3 Pa, so as to remove the air bubbles mixed into the PDMS polymer during the stirring process. Take out the open container containing the mixture of PDMS and curing agent, put it in a drying box and let it stand at 70°C for 20h, the PDMS will be cured, use a blade to cut a PDMS block with the same size as the Si substrate, and remove the PDMS block (use a pair of tweezers to clamp the edge of the cut PDMS block to release it from the container), and obtain a PDMS stamp.
固化剂采用聚有机硅灌封胶,道康宁Sylgard® 186有机硅弹性体。 The curing agent is polysilicone potting compound, Dow Corning Sylgard® 186 silicone elastomer.
(7)制备上电极 (7) Prepare the upper electrode
用一中间开有小口的薄铝片盖住上一步所得PDMS印章,只通过该小口留出中间需要沉积Au电极的一块矩形区域(该矩形区域能够露出完整的上电极形状)。通过该小口在PDMS印章上真空蒸发沉积一层20nm厚的Au薄膜,沉积速率为0.4nm/s。沉积前,需用液氮冷却PDMS印章,降低沉积过程中金属与PDMS间的热致粘附效应,控制冷却温度为-175℃,时间为12分钟,冷却完再进行沉积。沉积完成后,待基片温度自然升到室温,打开真空室取出带有金膜的PDMS印章,进行下一步的印刷工作。 Cover the PDMS stamp obtained in the previous step with a thin aluminum sheet with a small opening in the middle, and only leave a rectangular area in the middle where the Au electrode needs to be deposited through the small opening (the rectangular area can expose the complete shape of the upper electrode). A 20 nm thick Au film was vacuum evaporated and deposited on the PDMS stamp through the small opening at a deposition rate of 0.4 nm/s. Before deposition, the PDMS stamp needs to be cooled with liquid nitrogen to reduce the thermally induced adhesion effect between the metal and PDMS during the deposition process. The cooling temperature is controlled at -175°C for 12 minutes, and the deposition is performed after cooling. After the deposition is completed, wait for the temperature of the substrate to rise to room temperature naturally, open the vacuum chamber and take out the PDMS stamp with the gold film for the next step of printing.
(8)上电极印刷 (8) Upper electrode printing
将带有金膜的PDMS印章置于载玻片上(将不带Au电极的一侧与载玻片接触),在光学显微镜下,通过移动载玻片,将PDMS印章上的Au电极(上电极)与步骤(4)制备的Si基片上带有自组装膜的Au电极(下电极)接触,使上电极搭接区搭在下电极搭接区上,且上电极分子结区(即图3所示的上电极的四个平行的小条)与下电极分子结区(即图3所示的下电极的四个平行的小条)十字交叉接触。由于弹性PDMS模板的浸润性,较轻的Si基片自然被吸附在PDMS模板上。然后,立即将此装置(载玻片上的PDMS印章和步骤(4)制备的Si基片)置于真空室内,通过液氮冷却到-165℃并持续12分钟。待自然升到室温时,打开真空室,将PDMS印章剥落,上电极被印刷到硅基片上,因而得到十字交叉分子结。用蘸有镓铟液滴的钨针尖扎透上电极搭接区与下电极搭接区接触的区域形成欧姆接触。 Place the PDMS stamp with the gold film on the glass slide (put the side without the Au electrode in contact with the slide glass), and move the Au electrode on the PDMS stamp (upper electrode) under the optical microscope by moving the slide glass. ) is in contact with the Au electrode (lower electrode) with a self-assembled film on the Si substrate prepared in step (4), so that the upper electrode overlapping area overlaps the lower electrode overlapping area, and the molecular junction area of the upper electrode (that is, as shown in Figure 3 The four parallel strips of the upper electrode shown) cross contact with the molecular junction region of the lower electrode (ie, the four parallel strips of the lower electrode shown in Figure 3). Due to the wettability of the elastic PDMS template, the lighter Si substrate was naturally adsorbed on the PDMS template. Then, this device (PDMS stamp on glass slide and Si substrate prepared in step (4)) was immediately placed in a vacuum chamber and cooled to −165 °C by liquid nitrogen for 12 min. When it naturally rises to room temperature, the vacuum chamber is opened, the PDMS stamp is peeled off, and the upper electrode is printed on the silicon substrate, thus obtaining a cross molecular junction. Use a tungsten needle tip dipped in a gallium indium droplet to pierce through the contact area between the upper electrode overlapping area and the lower electrode overlapping area to form an ohmic contact.
利用半导体参数分析仪测试所得分子结的光电特性,测试系统由变温真空伏安特性测试台、所制备的带有交叉分子结的Si基片和半导体参数分析仪及数据采集计算机共同组成。采用循环伏安法对器件进行电学特性测试,循环次数可根据需要确定。将样品放置在变温真空伏安特性测试台上,通过细金线与分子结的芯片焊盘连接,并通过真空电极引线引出真空室,与半导体参数分析测试仪连接,测试相应分子结的伏安特性曲线。若该分子结在测试前即已短路或者断路,需将测试电极换接到另外一个分子结上,重复以上动作(注意:本发明所制备分子结是可寻址的,每个分子结均可反复测试)。当需要测试分子结器件的变温伏安特性时,需控制真空室样品台的温度,通过液氮冷却获得90K至300K温度范围的无光照条件下的分子结电学伏安特性曲线,如图5所示. The optoelectronic properties of the obtained molecular junctions were tested with a semiconductor parameter analyzer. The test system consisted of a variable temperature vacuum volt-ampere characteristic test bench, the prepared Si substrate with crossed molecular junctions, a semiconductor parameter analyzer and a data acquisition computer. The electrical characteristics of the device are tested by cyclic voltammetry, and the number of cycles can be determined as required. Place the sample on the temperature-variable vacuum volt-ampere characteristic test bench, connect it to the chip pad of the molecular junction through a thin gold wire, and lead it out of the vacuum chamber through the vacuum electrode lead, connect it to a semiconductor parameter analysis tester, and test the volt-ampere of the corresponding molecular junction characteristic curve. If the molecular junction has been short-circuited or disconnected before the test, the test electrode needs to be switched to another molecular junction, and the above actions should be repeated (note: the molecular junction prepared in the present invention is addressable, and each molecular junction can be repeated testing). When it is necessary to test the temperature-variable volt-ampere characteristics of molecular junction devices, it is necessary to control the temperature of the sample stage in the vacuum chamber, and obtain the molecular junction electrical volt-ampere characteristic curve under the condition of no light in the temperature range of 90K to 300K through liquid nitrogen cooling, as shown in Figure 5 Show.
实施例2Example 2
聚二甲基硅氧烷模板印刷制备分子结的方法步骤如下。 The steps of the method for preparing molecular knots by polydimethylsiloxane template printing are as follows.
(1)清洗Si基片 (1) Cleaning the Si substrate
在纯Si(100)基片的上下两面,用干氧氧化方法在1200℃下生长300 nm厚的SiO2层,氧化时间6小时。将切好尺寸的Si基片浸入80℃的piranha溶液中,10分钟后取出,再依次浸入去离子水、丙酮和酒精中分别以超声波清洗5分钟。 On the upper and lower sides of the pure Si (100) substrate, a 300 nm thick SiO 2 layer was grown at 1200 ° C by dry oxygen oxidation method, and the oxidation time was 6 hours. Dip the cut-sized Si substrate into piranha solution at 80°C, take it out after 10 minutes, and then immerse it in deionized water, acetone and alcohol successively and clean it with ultrasonic wave for 5 minutes respectively.
需注意的是:piranha溶液为纯H2SO4和质量浓度30% 的H2O2按体积比4:1的比例混合的混合物,是一种高氧化活性的腐蚀性溶液,有可能与有机材料发生剧烈的反应,操作人员要注意身体的防护(需穿戴护目镜、实验服、橡胶手套,并在化学通风厨内操作)。 It should be noted that the piranha solution is a mixture of pure H 2 SO 4 and H 2 O 2 with a mass concentration of 30% in a volume ratio of 4:1. The material reacts violently, and the operator should pay attention to the protection of the body (goggles, lab coats, rubber gloves are required, and the operation should be carried out in a chemical fume hood).
(2)光刻 (2) Photolithography
在步骤(1)处理后的Si基片上旋涂正胶S1813,旋涂量为3μm/cm2,以4千转/分钟的速度匀胶60s,随后放在加热板上在120℃下软烘30s,取出后自然冷却到室温。再用EGMEA(Methoxyethyl acetate醋酸-2-甲氧基乙酯)去边溶剂将Si基片边缘的光刻胶去除。接下来将预先设计的下电极掩膜对准盖在Si基片上曝光90 s。然后将Si基片前烘300s,温度控制为110℃,再自然冷却到室温,取出后放在正胶显影液中显影60s,最后用去离子水进行清洗并干燥。 Spin-coat positive resist S1813 on the Si substrate treated in step (1), with a spin-coating amount of 3 μm/cm 2 , spread the glue at a speed of 4,000 rpm for 60 seconds, and then put it on a heating plate and bake it at 120°C for soft drying 30s, take it out and let it cool down to room temperature naturally. Then use EGMEA (Methoxyethyl acetate-2-methoxyethyl acetate) edge removal solvent to remove the photoresist on the edge of the Si substrate. Next, align and cover the pre-designed lower electrode mask on the Si substrate for exposure for 90 s. Then the Si substrate was pre-baked for 300s, the temperature was controlled at 110°C, and then cooled to room temperature naturally. After taking it out, it was developed in a positive photolithographic developer for 60s, and finally cleaned with deionized water and dried.
(3)制备下电极 (3) Prepare the lower electrode
在以上光刻后的Si基片上蒸发沉积10nm厚的Cr薄膜粘附层,然后在其基础上以0.5nm/s的速率蒸发沉积100nm厚的Au薄膜,目的是让沉积的Au电极更牢固的与基片结合。将基片上的光刻胶和无关的杂质用丙酮清洗掉(清洗借助借助超声波震荡10 s)。 取出后,用流动的丙酮、无水乙醇和去离子水依次冲洗,干燥后得到突出的Cr-Au薄膜图案,形成下电极。 Evaporate and deposit a 10nm thick Cr film adhesion layer on the Si substrate after the above photolithography, and then evaporate and deposit a 100nm thick Au film at a rate of 0.5nm/s on the basis of it, in order to make the deposited Au electrode more firm bonded to the substrate. The photoresist and irrelevant impurities on the substrate were cleaned with acetone (cleaned by ultrasonic vibration for 10 s). After taking it out, wash it with flowing acetone, absolute ethanol and deionized water in sequence, and obtain a prominent Cr-Au thin film pattern after drying to form the lower electrode.
(4)在Au下电极表面制备分子自组装薄膜 (4) Preparation of molecular self-assembled films on the surface of the Au bottom electrode
将以上带有Au下电极的Si基片用无水乙醇清洗,并进行干燥,然后将Si基片浸泡在目标分子的四氢呋喃(THF,tetrahydrofuran)溶液中26小时,溶液浓度为2毫摩尔/升,在Au薄膜表面生成一层分子自组装薄膜,目标分子的四氢呋喃溶液盛装在玻璃容器中。目标分子选用1-癸硫醇。 The above Si substrate with the Au lower electrode was cleaned with absolute ethanol, and dried, and then the Si substrate was soaked in a tetrahydrofuran (THF, tetrahydrofuran) solution of the target molecule for 26 hours, and the solution concentration was 2 mmol/L , A molecular self-assembled film is formed on the surface of the Au film, and the tetrahydrofuran solution of the target molecule is contained in a glass container. The target molecule is 1-decanethiol.
(5)制备聚二甲基硅氧烷(PDMS)模板 (5) Preparation of polydimethylsiloxane (PDMS) template
在另一块相同的经步骤(1)处理的Si基片上旋涂光刻负胶SU-8,以4千转/分钟的速度匀胶100s,随后放在加热板上于80℃软烘120 s,再将温度升到100℃软烘300 s,取出后自然冷却到室温,再用EGMEA去边溶剂将Si基片边缘的光刻胶去除。接下来将预先设计的上电极掩膜对准并盖在基片上,曝光100s。然后将基片在80℃下硬烘60s,升温到100℃接着硬烘120s,再自然冷却到室温。将基片放在负胶显影液中显影100s。最后用去离子水清洗基片,去除杂质并吹干,获得期望的模板图案。 Spin-coat photoresist negative resist SU-8 on another same Si substrate treated in step (1), uniformize the glue at a speed of 4,000 rpm for 100 s, and then place it on a heating plate at 80°C for soft baking for 120 s , then raise the temperature to 100°C for soft baking for 300 s, take it out and cool it down to room temperature naturally, and then use EGMEA edge removal solvent to remove the photoresist on the edge of the Si substrate. Next, align and cover the pre-designed upper electrode mask on the substrate, and expose for 100s. Then hard-bake the substrate at 80°C for 60s, raise the temperature to 100°C, then hard-bake for 120s, and then cool naturally to room temperature. The substrate was developed in a negative film developing solution for 100 s. Finally, the substrate is washed with deionized water to remove impurities and dried to obtain the desired template pattern.
(6)制备聚二甲基硅氧烷(PDMS)印章 (6) Preparation of polydimethylsiloxane (PDMS) stamp
将步骤(5)制作的Si基片粘贴在一个玻璃培养皿底部。将PDMS与固化剂按12:1的体积比混合,搅拌均匀后将PDMS与固化剂的混合物注入敞口容器中并使混合物的高度为5mm,然后将装有PDMS与固化剂的混合物的敞口容器放到一个封闭容器内抽真空,使真空度≤103Pa,以除去搅拌过程中混入PDMS聚合物中的气泡。取出装有PDMS与固化剂的混合物的敞口容器,放在烘干箱内在75℃静置15h,PDMS即固化,用刀片划割一块与Si基片尺寸相同的PDMS区块,并取下该PDMS区块(用一镊子夹住切下的PDMS区块的边缘使之脱模,与容器分离),得到PDMS印章。 Paste the Si substrate produced in step (5) on the bottom of a glass petri dish. Mix PDMS and curing agent at a volume ratio of 12:1, stir evenly, pour the mixture of PDMS and curing agent into an open container and make the height of the mixture 5mm, and then open the container containing the mixture of PDMS and curing agent The container is placed in a closed container and vacuumed so that the vacuum degree is ≤10 3 Pa, so as to remove the air bubbles mixed into the PDMS polymer during the stirring process. Take out the open container containing the mixture of PDMS and curing agent, put it in a drying oven and let it stand at 75°C for 15 hours, the PDMS will be cured, cut a PDMS block with the same size as the Si substrate with a blade, and remove the PDMS block (use a pair of tweezers to clamp the edge of the cut PDMS block to release it from the container), and obtain a PDMS stamp.
固化剂采用聚有机硅灌封胶,道康宁Sylgard® 186有机硅弹性体。 The curing agent is polysilicone potting compound, Dow Corning Sylgard® 186 silicone elastomer.
(7)制备上电极 (7) Prepare the upper electrode
用一中间开有小口的薄铝片盖住上一步所得PDMS印章,只通过该小口留出中间需要沉积Au电极的一块矩形区域(该矩形区域能够露出完整的上电极形状)。通过该小口在PDMS印章上真空蒸发沉积一层25nm厚的Au薄膜,沉积速率为0.5nm/s。沉积前,需用液氮冷却PDMS印章,降低沉积过程中金属与PDMS间的热致粘附效应,控制冷却温度为-180℃,时间为10分钟,冷却完再进行沉积。沉积完成后,待基片温度自然升到室温,打开真空室取出带有金膜的PDMS印章,进行下一步的印刷工作。 Cover the PDMS stamp obtained in the previous step with a thin aluminum sheet with a small opening in the middle, and only leave a rectangular area in the middle where the Au electrode needs to be deposited through the small opening (the rectangular area can expose the complete shape of the upper electrode). A 25 nm thick Au film was vacuum evaporated and deposited on the PDMS stamp through the small opening at a deposition rate of 0.5 nm/s. Before deposition, the PDMS stamp needs to be cooled with liquid nitrogen to reduce the heat-induced adhesion effect between the metal and PDMS during the deposition process. The cooling temperature is controlled at -180°C for 10 minutes, and the deposition is performed after cooling. After the deposition is completed, wait for the temperature of the substrate to rise to room temperature naturally, open the vacuum chamber and take out the PDMS stamp with the gold film for the next step of printing.
(8)上电极印刷 (8) Upper electrode printing
将带有金膜的PDMS印章置于载玻片上(将不带Au电极的一侧与载玻片接触),在光学显微镜下,通过移动载玻片,将PDMS印章上的Au电极(上电极)与步骤(4)制备的Si基片上带有自组装膜的Au电极(下电极)接触,使上电极搭接区搭在下电极搭接区上,且上电极分子结区(即图3所示的上电极的四个平行的小条)与下电极分子结区(即图3所示的下电极的四个平行的小条)十字交叉接触。由于弹性PDMS模板的浸润性,较轻的Si基片自然被吸附在PDMS模板上。然后,立即将此装置(载玻片上的PDMS印章和步骤(4)制备的Si基片)置于真空室内,通过液氮冷却到-180℃并持续10分钟。待自然升到室温时,打开真空室,将PDMS印章剥落,上电极被印刷到硅基片上,因而得到十字交叉分子结。用蘸有镓铟液滴的钨针尖扎透上电极搭接区与下电极搭接区接触的区域形成欧姆接触。 Place the PDMS stamp with the gold film on the glass slide (put the side without the Au electrode in contact with the slide glass), and move the Au electrode on the PDMS stamp (upper electrode) under the optical microscope by moving the slide glass. ) is in contact with the Au electrode (lower electrode) with a self-assembled film on the Si substrate prepared in step (4), so that the upper electrode overlapping area overlaps the lower electrode overlapping area, and the molecular junction area of the upper electrode (that is, as shown in Figure 3 The four parallel strips of the upper electrode shown) cross contact with the molecular junction region of the lower electrode (ie, the four parallel strips of the lower electrode shown in Figure 3). Due to the wettability of the elastic PDMS template, the lighter Si substrate was naturally adsorbed on the PDMS template. Then, this device (PDMS stamp on glass slide and Si substrate prepared in step (4)) was immediately placed in a vacuum chamber and cooled to −180 °C by liquid nitrogen for 10 min. When it naturally rises to room temperature, the vacuum chamber is opened, the PDMS stamp is peeled off, and the upper electrode is printed on the silicon substrate, thus obtaining a cross molecular junction. Use a tungsten needle tip dipped in a gallium indium droplet to pierce through the contact area between the upper electrode overlapping area and the lower electrode overlapping area to form an ohmic contact.
实施例3Example 3
聚二甲基硅氧烷模板印刷制备分子结的方法步骤如下。 The steps of the method for preparing molecular knots by polydimethylsiloxane template printing are as follows.
(1)清洗Si基片 (1) Cleaning the Si substrate
在纯Si(100)基片的上下两面,用干氧氧化方法在1100℃下生长200nm厚的SiO2层,氧化时间4小时。将切好尺寸的Si基片浸入50℃的piranha溶液中, 20分钟后取出,再依次浸入去离子水、丙酮和酒精中分别以超声波清洗3分钟。 On the upper and lower sides of the pure Si (100) substrate, a 200nm thick SiO 2 layer was grown at 1100° C. by dry oxygen oxidation, and the oxidation time was 4 hours. Dip the cut Si substrate into the piranha solution at 50°C, take it out after 20 minutes, and then immerse it in deionized water, acetone and alcohol successively and clean it with ultrasonic wave for 3 minutes respectively.
需注意的是:piranha溶液为纯H2SO4和质量浓度30% 的H2O2按体积比4:1的比例混合的混合物,是一种高氧化活性的腐蚀性溶液,有可能与有机材料发生剧烈的反应,操作人员要注意身体的防护(需穿戴护目镜、实验服、橡胶手套,并在化学通风厨内操作)。 It should be noted that the piranha solution is a mixture of pure H 2 SO 4 and H 2 O 2 with a mass concentration of 30% in a volume ratio of 4:1. The material reacts violently, and the operator should pay attention to the protection of the body (goggles, lab coats, rubber gloves are required, and the operation should be carried out in a chemical fume hood).
(2)光刻 (2) Photolithography
在步骤(1)处理后的Si基片上旋涂正胶S1813,旋涂量为0.7μm/cm2,以3千转/分钟的速度匀胶30s,随后放在加热板上在110℃下软烘60s,取出后自然冷却到室温。再用PGMEA(1,2-Propanediol monomethyl ether acetate1,2-丙二醇甲醚乙酸酯)去边溶剂将Si基片边缘的光刻胶去除。接下来将预先设计的下电极掩膜对准盖在Si基片上曝光60 s。然后将Si基片前烘180s,温度控制为120℃,再自然冷却到室温,取出后放在正胶显影液中显影30s,最后用去离子水进行清洗并干燥。 Spin-coat positive resist S1813 on the Si substrate treated in step (1), with a spin-coating amount of 0.7 μm/cm 2 , uniformly coat the glue at a speed of 3,000 rpm for 30 seconds, and then place it on a heating plate at 110°C for soft coating. Bake for 60s, take it out and cool to room temperature naturally. Then use PGMEA (1,2-Propanediol monomethyl ether acetate) edge removal solvent to remove the photoresist on the edge of the Si substrate. Next, align and cover the pre-designed lower electrode mask on the Si substrate for exposure for 60 s. Then the Si substrate was pre-baked for 180s, the temperature was controlled at 120°C, and then cooled to room temperature naturally. After taking it out, it was developed in a positive resist developer for 30s, and finally cleaned with deionized water and dried.
(3)制备下电极 (3) Prepare the lower electrode
在以上光刻后的Si基片上蒸发沉积5nm厚的Cr薄膜粘附层,然后在其基础上以0.3nm/s的速率蒸发沉积80nm厚的Au薄膜,目的是让沉积的Au电极更牢固的与基片结合。将基片上的光刻胶和无关的杂质用丙酮清洗掉(清洗借助借助超声波震荡15 s)。 取出后,用流动的丙酮、无水乙醇和去离子水依次冲洗,干燥后得到突出的Cr-Au薄膜图案,形成下电极。 Evaporate and deposit a 5nm thick Cr film adhesion layer on the Si substrate after the above photolithography, and then evaporate and deposit an 80nm thick Au film at a rate of 0.3nm/s on the basis of it, in order to make the deposited Au electrode more firm bonded to the substrate. The photoresist and irrelevant impurities on the substrate were cleaned with acetone (cleaned by ultrasonic vibration for 15 s). After taking it out, wash it with flowing acetone, absolute ethanol and deionized water in sequence, and obtain a prominent Cr-Au thin film pattern after drying to form the lower electrode.
(4)在Au下电极表面制备分子自组装薄膜 (4) Preparation of molecular self-assembled films on the surface of the Au bottom electrode
将以上带有Au下电极的Si基片用无水乙醇清洗,并进行干燥,然后将Si基片浸泡在目标分子的无水乙醇溶液中22小时,溶液浓度为1毫摩尔/升,在Au薄膜表面生成一层分子自组装薄膜,目标分子的无水乙醇溶液盛装在玻璃容器中。目标分子选用正辛硫醇。 The above Si substrate with the Au lower electrode was cleaned with absolute ethanol, and dried, and then the Si substrate was soaked in the absolute ethanol solution of the target molecule for 22 hours, the solution concentration was 1 mmol/L, and the Au A molecular self-assembled film is formed on the surface of the film, and the absolute ethanol solution of the target molecule is contained in a glass container. The target molecule is n-octyl thiol.
(5)制备聚二甲基硅氧烷(PDMS)模板 (5) Preparation of polydimethylsiloxane (PDMS) template
在另一块相同的经步骤(1)处理的Si基片上旋涂光刻负胶SU-8,以3千转/分钟的速度匀胶70s,随后放在加热板上于60℃软烘150 s,再将温度升到80℃软烘500 s,取出后自然冷却到室温,再用PGMEA去边溶剂将Si基片边缘的光刻胶去除。接下来将预先设计的上电极掩膜对准并盖在基片上,曝光80s。然后将基片在60℃下硬烘120s,升温到80℃接着硬烘150s,再自然冷却到室温。将基片放在负胶显影液中显影80s。最后用去离子水清洗基片,去除杂质并吹干,获得期望的模板图案。 Spin-coat photoresist negative resist SU-8 on another same Si substrate treated in step (1), uniformize the glue at a speed of 3,000 rpm for 70 s, and then place it on a heating plate at 60°C for soft baking for 150 s , and then raise the temperature to 80°C for soft baking for 500 s, take it out and cool it to room temperature naturally, and then use PGMEA edge removal solvent to remove the photoresist on the edge of the Si substrate. Next, align and cover the pre-designed upper electrode mask on the substrate, and expose for 80s. Then hard-bake the substrate at 60°C for 120s, raise the temperature to 80°C and then hard-bake for 150s, and then naturally cool to room temperature. The substrate was developed in a negative film developer for 80 s. Finally, the substrate is washed with deionized water to remove impurities and dried to obtain the desired template pattern.
(6)制备聚二甲基硅氧烷(PDMS)印章 (6) Preparation of polydimethylsiloxane (PDMS) stamp
将步骤(5)制作的Si基片粘贴在一个玻璃培养皿底部。将PDMS与固化剂按8:1的体积比混合,搅拌均匀后将PDMS与固化剂的混合物注入敞口容器中并使混合物的高度为3mm,然后将装有PDMS与固化剂的混合物的敞口容器放到一个封闭容器内抽真空,使真空度≤103Pa,以除去搅拌过程中混入PDMS聚合物中的气泡。取出装有PDMS与固化剂的混合物的敞口容器,放在烘干箱内在65℃静置24h,PDMS即固化,用刀片划割一块与Si基片尺寸相同的PDMS区块,并取下该PDMS区块(用一镊子夹住切下的PDMS区块的边缘使之脱模,与容器分离),得到PDMS印章。 Paste the Si substrate produced in step (5) on the bottom of a glass petri dish. Mix PDMS and curing agent at a volume ratio of 8:1, stir evenly, pour the mixture of PDMS and curing agent into an open container and make the height of the mixture 3mm, and then open the container containing the mixture of PDMS and curing agent The container is placed in a closed container and vacuumed so that the vacuum degree is ≤10 3 Pa, so as to remove the air bubbles mixed into the PDMS polymer during the stirring process. Take out the open container containing the mixture of PDMS and curing agent, put it in a drying oven at 65°C for 24 hours, and the PDMS will be cured. Use a blade to cut a PDMS block with the same size as the Si substrate, and remove the PDMS block (use a pair of tweezers to clamp the edge of the cut PDMS block to release it from the container), and obtain a PDMS stamp.
固化剂采用聚有机硅灌封胶,道康宁Sylgard® 186有机硅弹性体。 The curing agent is polysilicone potting compound, Dow Corning Sylgard® 186 silicone elastomer.
(7)制备上电极 (7) Prepare the upper electrode
用一中间开有小口的薄铝片盖住上一步所得PDMS印章,只通过该小口留出中间需要沉积Au电极的一块矩形区域(该矩形区域能够露出完整的上电极形状)。通过该小口在PDMS印章上真空蒸发沉积一层15nm厚的Au薄膜,沉积速率为0.3nm/s。沉积前,需用液氮冷却PDMS印章,降低沉积过程中金属与PDMS间的热致粘附效应,控制冷却温度为-170℃,时间为15分钟,冷却完再进行沉积。沉积完成后,待基片温度自然升到室温,打开真空室取出带有金膜的PDMS印章,进行下一步的印刷工作。 Cover the PDMS stamp obtained in the previous step with a thin aluminum sheet with a small opening in the middle, and only leave a rectangular area in the middle where the Au electrode needs to be deposited through the small opening (the rectangular area can expose the complete shape of the upper electrode). A 15 nm thick Au film was vacuum evaporated and deposited on the PDMS stamp through the small opening at a deposition rate of 0.3 nm/s. Before deposition, the PDMS stamp needs to be cooled with liquid nitrogen to reduce the heat-induced adhesion effect between the metal and PDMS during the deposition process. The cooling temperature is controlled at -170°C for 15 minutes, and the deposition is performed after cooling. After the deposition is completed, wait for the temperature of the substrate to rise to room temperature naturally, open the vacuum chamber and take out the PDMS stamp with the gold film for the next step of printing.
(8)上电极印刷 (8) Upper electrode printing
将带有金膜的PDMS印章置于载玻片上(将不带Au电极的一侧与载玻片接触),在光学显微镜下,通过移动载玻片,将PDMS印章上的Au电极(上电极)与步骤(4)制备的Si基片上带有自组装膜的Au电极(下电极)接触,使上电极搭接区搭在下电极搭接区上,且上电极分子结区(即图3所示的上电极的四个平行的小条)与下电极分子结区(即图3所示的下电极的四个平行的小条)十字交叉接触。由于弹性PDMS模板的浸润性,较轻的Si基片自然被吸附在PDMS模板上。然后,立即将此装置(载玻片上的PDMS印章和步骤(4)制备的Si基片)置于真空室内,通过液氮冷却到-150℃并持续15分钟。待自然升到室温时,打开真空室,将PDMS印章剥落,上电极被印刷到硅基片上,因而得到十字交叉分子结。用蘸有镓铟液滴的钨针尖扎透上电极搭接区与下电极搭接区接触的区域形成欧姆接触。 Place the PDMS stamp with the gold film on the glass slide (put the side without the Au electrode in contact with the slide glass), and move the Au electrode on the PDMS stamp (upper electrode) under the optical microscope by moving the slide glass. ) is in contact with the Au electrode (lower electrode) with a self-assembled film on the Si substrate prepared in step (4), so that the upper electrode overlapping area overlaps the lower electrode overlapping area, and the molecular junction area of the upper electrode (that is, as shown in Figure 3 The four parallel strips of the upper electrode shown) cross contact with the molecular junction region of the lower electrode (ie, the four parallel strips of the lower electrode shown in Figure 3). Due to the wettability of the elastic PDMS template, the lighter Si substrate was naturally adsorbed on the PDMS template. Then, this device (PDMS stamp on glass slide and Si substrate prepared in step (4)) was immediately placed in a vacuum chamber and cooled to −150 °C by liquid nitrogen for 15 min. When it naturally rises to room temperature, the vacuum chamber is opened, the PDMS stamp is peeled off, and the upper electrode is printed on the silicon substrate, thus obtaining a cross molecular junction. Use a tungsten needle tip dipped in a gallium indium droplet to pierce through the contact area between the upper electrode overlapping area and the lower electrode overlapping area to form an ohmic contact.
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