CN102073430B - Method for capacitive screen to automatically adjust induction value - Google Patents
Method for capacitive screen to automatically adjust induction value Download PDFInfo
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- CN102073430B CN102073430B CN 201110025312 CN201110025312A CN102073430B CN 102073430 B CN102073430 B CN 102073430B CN 201110025312 CN201110025312 CN 201110025312 CN 201110025312 A CN201110025312 A CN 201110025312A CN 102073430 B CN102073430 B CN 102073430B
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- 230000006698 induction Effects 0.000 title claims abstract description 42
- 238000000034 method Methods 0.000 title claims abstract description 22
- 239000003990 capacitor Substances 0.000 abstract 1
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Abstract
The invention relates to a method for a capacitive screen to automatically adjust an induction value, which aims at a scanning method of two rows or two lines of scanning lines, and realizes the aim of adjusting the induction value of the capacitive screen by adjusting one of the scanning lines. The method of the invention is simple in steps, and overcomes defects in traditional manual adjustment of capacitors, so that engineers can operate more conveniently, accuracy of adjustment on induction quantity of the capacitive screen is improved, and operation efficiency of the whole capacitive screen is increased.
Description
Technical field
The present invention relates to capacitance plate and adjust the method for influence value, refer in particular to the method that capacitance plate is adjusted influence value automatically.
Background technology
High speed development along with science and technology, snafu variation has occured in electronic product, appearance along with recent touch control e series products, the touch-control product more and more is subject to pursuing of people, not only it can save the space, be convenient for carrying, but and the user by finger or pointer etc. direct control just, use comfortable, very convenient.For example, the common personal digital assistant (PDA) of existing market, touch-control class mobile phone, portable notebook computer etc. have all strengthened the input to touch technology, use so touch-control device must have more widely in every field in the future.
At present, capacitance type touch control screen is because wear-resistant, the advantages such as the life-span is long, so capacitance plate has been subject to pursuing of market recently, various capacitance touching control screen products emerge one after another, thereby the principle of work of capacitance plate generally is to come the capacitance variations of inductance capacitance screen to judge position and the action of finger by a kind of touch-control chip, but capacitance plate powers on rear because extraneous interference generally can not be accurate, judge fast the position of finger, so for position and the action of judging accurately finger, the capacitance plate rear general needs that power on are manually adjusted influence value on the sweep trace, guarantee that as far as possible the influence value when not having the touch object touching is minimum.So the influence value that produces when the touch object touching is arranged is larger, touch with regard to the relatively good touch object that judged whether.Adjust because adopt manually, so the slip-stick artist needs repeated multiple times debugging minimum to the variation to the induction amount, operation is not only lost time like this, has reduced efficient, and accuracy also decreases.
So we wish to provide a kind of brand-new method that can automatically adjust influence value on capacitance plate for the user.
Summary of the invention
The actual technical matters to be solved of the present invention is how to provide a kind of capacitance plate automatically to adjust the method for influence value.
In order to realize above-mentioned purpose of the present invention, the invention provides a kind of capacitance plate and automatically adjust the method for influence value, described capacitance plate be expert at and column direction on all be provided with some sweep traces, when the row on the capacitance plate or row are scanned, scan simultaneously two rows or two columns, its step is as follows at every turn: set the first threshold influence value, judge that whether the influence value of detecting is less than the first threshold influence value, if less than, then compare the induction difference on two sweep traces; Judge above-mentioned difference whether in the second threshold influence value, if not within it, then adjust wherein the capacitance on the sweep trace, to its difference less than described the second threshold influence value till, the scan mode of induction amount difference minimum behind the sweep trace adjusted in record; After the scan mode of induction amount difference minimum behind the sweep trace adjusted in described record, scan mode scanning capacitance screen before not adjusting with sweep trace first, whether the induction difference on judgement two sweep traces this moment is less than described the first threshold influence value, if less than, then with the scan mode scanning of sweep trace induction difference minimum after the above-mentioned adjustment, record the induction difference of this moment; If greater than described the first threshold influence value, then need to continue to scan until the induction difference that detects less than the first threshold influence value; After the above-mentioned induction difference of described record, again with the scan mode scanning capacitance screen before not adjusting, whether the induction difference on judgement two sweep traces this moment is less than described the first threshold influence value, if less than, the induction difference that then scan mode of induction amount difference minimum scans behind the storage adjustment sweep trace; If greater than described the first threshold influence value, then need to continue to scan until the induction difference that detects less than the first threshold influence value.
The method of on capacitance plate, automatically adjusting influence value of the present invention, not only step is simple, and owing to overcome the shortcoming of conventional manual adjustment electric capacity, the slip-stick artist is not only convenient when operation, also improve the accuracy of adjusting capacitance plate induction amount, increased the operating efficiency of whole capacitance plate.
Description of drawings
Fig. 1 is the method flow diagram that capacitance plate of the present invention is adjusted influence value automatically.
Embodiment
The present invention is further illustrated below in conjunction with drawings and Examples.
Please refer to shown in Figure 1, the sweep trace of capacitance plate of the present invention, be expert at and column direction on all be provided with some sweep traces, when to advancing during line scanning on the capacitance plate, scan simultaneously two rows or two columns at every turn.If wherein a sweep trace S as a reference, another root sweep trace R is as scanning, the difference of induction amount behind writing scan two sweep traces.Below we just concrete the discussion how automatically to add electric capacity by software at reference S or scanning R by the rear capacitance plate that powers at every turn, the scan mode when thereby best influence value adopted in record, and influence value that will this moment records, and just can realize self-adjusting purpose when all scanning in this way before the outage.
Set first the first threshold influence value N1, judged whether the finger touches capacitance plate; If the influence value of detecting greater than N1, then showing has finger touches, this moment just needn't do again the adjustment of back.But in the common operation, the size of described the first threshold influence value N1 namely can not too greatly can not be too little, if N1 is excessive, then the sensitivity meeting of capacitance plate reduces, and can not judge fast position and the action of finger; If N1 is too small, then the sensitivity meeting of capacitance plate increases, and a kind of situation is that touch object is not also run into capacitance plate such as finger and will be caused relevant gesture operation; Also having a kind of situation is that the interference of external environment also can directly affect touch-screen, therefore the first threshold value N1 determine just relatively to relatively be fit to.Setting first this scan mode of not adjusting before sweep trace R and the S is the scan mode of capacitance plate acquiescence.
And the influence value that only detects to some extent in above-mentioned just needs relatively with reference to the induction difference between S and the scanning R during less than described the first threshold influence value N1.Then judge above-mentioned induction difference whether in the second threshold influence value N2, described scan mode is that capacitance plate can be accepted scope if described difference, then shows this moment less than described the second threshold value N2; If described difference is greater than described N2, the less sweep trace of capacitance adds electric capacity among then giving above-mentioned sweep trace R and S by the chip on the capacitance plate, then the difference of sweep trace R and the rear induction amount of S adjustment is compared in continuation, until the difference of the rear sweep trace R of adjustment and S is less than described the second threshold influence value N2.The scan mode of induction amount difference minimum in sweep trace R or the S process adjusted in record at last.
Then described capacitance plate scans with the scan mode of acquiescence, namely use the scan mode scanning capacitance screen when not adjusting sweep trace R and S, whether the induction difference of judgement sweep trace R this moment and S is less than described the first threshold influence value N1, if greater than, then need to continue to scan until the influence value that detects less than the first threshold influence value N1; If less than, then continue the scan mode scanning with induction amount difference minimum after above-mentioned adjustment sweep trace S or the R process, record induction difference at this moment; Last again with the scan mode scanning of acquiescence, and judge this moment sweep trace R and the induction difference of S whether less than described the first threshold value N1, if greater than, then need to continue to scan until the influence value that detects less than the first threshold influence value N1; If less than, then store to adjust the induction difference that the scan mode of induction amount difference minimum in sweep trace S or the R process scans, finally finish the purpose of whole automatic adjustment influence value.
Capacitance plate of the present invention is adjusted the method for influence value automatically, and wherein said the first threshold influence value and described the second threshold influence value are empirical values, all can set in advance, and common engineering teacher just can draw above-mentioned optimal values by repeatedly debugging.
Claims (6)
1. a capacitance plate is adjusted the method for influence value automatically, described capacitance plate be expert at and column direction on all be provided with some sweep traces, when the row on the capacitance plate or row are scanned, scan simultaneously two rows or two columns at every turn, its step is as follows:
Set the first threshold influence value, whether judge the influence value of detecting less than the first threshold influence value, if less than, the induction difference on two sweep traces then compared;
Judge above-mentioned difference whether in the second threshold influence value, if not within it, then adjust wherein the capacitance on the sweep trace, to its difference less than described the second threshold influence value till, the scan mode of induction amount difference minimum behind the sweep trace adjusted in record;
After the scan mode of induction amount difference minimum behind the sweep trace adjusted in described record, scan mode scanning capacitance screen before not adjusting with sweep trace first, whether the induction difference on judgement two sweep traces this moment is less than described the first threshold influence value, if less than, then with the scan mode scanning of sweep trace induction difference minimum after the above-mentioned adjustment, record the induction difference of this moment; If greater than described the first threshold influence value, then need to continue to scan until the induction difference that detects less than the first threshold influence value;
After the above-mentioned induction difference of described record, again with the scan mode scanning capacitance screen before not adjusting, whether the induction difference on judgement two sweep traces this moment is less than described the first threshold influence value, if less than, the induction difference that then scan mode of induction amount difference minimum scans behind the storage adjustment sweep trace; If greater than described the first threshold influence value, then need to continue to scan until the induction difference that detects less than the first threshold influence value.
2. the method for claim 1 is characterized in that: if the influence value of detecting, then shows have touch object to touch described capacitance plate greater than the first threshold influence value; Described scan mode is that capacitance plate can be accepted scope if described induction difference in the second threshold influence value, then shows this moment.
3. method as claimed in claim 1 or 2, it is characterized in that: described the first threshold influence value and described the second threshold influence value are empirical values, can set in advance.
4. the method for claim 1 is characterized in that: if the influence value of detecting less than described the first threshold influence value, then showing does not have touch object to touch described capacitance plate.
5. the method for claim 1, it is characterized in that: a described adjustment wherein sweep trace refers to adjust that less root sweep trace of electric capacity.
6. such as claim 1 or 5 described methods, it is characterized in that: described adjustment sweep trace is by the chip adjustment on the capacitance plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN 201110025312 CN102073430B (en) | 2011-01-24 | 2011-01-24 | Method for capacitive screen to automatically adjust induction value |
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| Application Number | Priority Date | Filing Date | Title |
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| CN 201110025312 CN102073430B (en) | 2011-01-24 | 2011-01-24 | Method for capacitive screen to automatically adjust induction value |
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| CN102073430A CN102073430A (en) | 2011-05-25 |
| CN102073430B true CN102073430B (en) | 2013-03-13 |
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Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102236491A (en) * | 2011-07-22 | 2011-11-09 | 苏州瀚瑞微电子有限公司 | Scan configuration method and positioning method for capacitive sensor |
| CN102253751A (en) * | 2011-07-22 | 2011-11-23 | 苏州瀚瑞微电子有限公司 | Wiring structure and positioning method of single-layer ITO (Indium Tin Oxide) |
| CN102279679B (en) * | 2011-07-22 | 2013-07-31 | 苏州瀚瑞微电子有限公司 | Scanning configuration and positioning method of two-dimensional capacitive sensor |
| CN102253780A (en) * | 2011-07-22 | 2011-11-23 | 苏州瀚瑞微电子有限公司 | Method for positioning two-dimensional capacitance sensor |
| CN102368187A (en) * | 2011-09-30 | 2012-03-07 | 苏州瀚瑞微电子有限公司 | Anti-interference processing method of single ITO (Indium Tin Oxide) layer |
| CN102419653A (en) * | 2011-09-30 | 2012-04-18 | 苏州瀚瑞微电子有限公司 | Method for positioning single-layer indium tin oxide (ITO) |
| TWI502456B (en) * | 2013-03-18 | 2015-10-01 | Focaltech Systems Co Ltd | Mutual capacitance touch screen and touch-sensitive method |
| TW201531913A (en) * | 2014-04-21 | 2015-08-16 | Neolec Internat Inc | Adjustment method and adjustment apparatus for sensing capacitance in touch panel |
| CN104881174B (en) * | 2015-06-04 | 2018-01-23 | 广东欧珀移动通信有限公司 | A kind of method and device of dynamic adjustment sensitivity of touch screen |
| TWI712928B (en) * | 2019-05-15 | 2020-12-11 | 友達光電股份有限公司 | Touch display device |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201015412A (en) * | 2008-10-15 | 2010-04-16 | Ene Technology Inc | A method for automatically adjusting capacitance baseline of touch button |
| CN101770320A (en) * | 2010-01-28 | 2010-07-07 | 旭曜科技股份有限公司 | Method and system for differential detection capacitive touch control |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JP5157969B2 (en) * | 2009-03-09 | 2013-03-06 | ソニー株式会社 | Information processing apparatus, threshold setting method and program thereof |
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201015412A (en) * | 2008-10-15 | 2010-04-16 | Ene Technology Inc | A method for automatically adjusting capacitance baseline of touch button |
| CN101770320A (en) * | 2010-01-28 | 2010-07-07 | 旭曜科技股份有限公司 | Method and system for differential detection capacitive touch control |
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