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CN102021524B - Device for separating ions with different masses in plasma immersion ion implantation - Google Patents

Device for separating ions with different masses in plasma immersion ion implantation Download PDF

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CN102021524B
CN102021524B CN2009100938834A CN200910093883A CN102021524B CN 102021524 B CN102021524 B CN 102021524B CN 2009100938834 A CN2009100938834 A CN 2009100938834A CN 200910093883 A CN200910093883 A CN 200910093883A CN 102021524 B CN102021524 B CN 102021524B
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ion implantation
spherical chamber
immersion ion
shaped electrodes
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刘杰
汪明刚
夏洋
李超波
陈瑶
赵丽莉
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Institute of Microelectronics of CAS
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Abstract

The invention discloses a device for separating ions with different masses in plasma immersion ion implantation, which comprises a spherical cavity, a substrate table, a high-frequency electric field in the spherical cavity and a constant magnetic field in the spherical cavity, wherein: the spherical cavity is composed of two symmetrical D-shaped electrodes, the straight edges of the two D-shaped electrodes are superposed and vertically overlapped, the two D-shaped electrodes are non-conductive at the joint, and the two D-shaped electrodes are separated by an insulating material; a high-frequency electric field in the spherical cavity, which is generated by the two D-shaped electrodes; a constant magnetic field in the spherical chamber is generated by adding a permanent magnet outside the spherical chamber; the substrate stage is positioned at a position perpendicular to the magnetic field plane and close to the inner wall of the spherical chamber. By utilizing the invention, the automatic phase stabilization principle is applied to the plasma immersion ion implantation technology, thereby realizing the quality separation of immersion ion implantation and solving the problem that single ion single energy implantation can not be realized by immersion ion implantation.

Description

在等离子体浸没离子注入中对不同质量离子分离的装置Device for separating ions of different masses in plasma immersion ion implantation

技术领域 technical field

本发明涉及等离子体浸没离子注入技术领域,尤其涉及一种在等离子体浸没离子注入中对不同质量离子分离的装置。The invention relates to the technical field of plasma immersion ion implantation, in particular to a device for separating ions of different masses in plasma immersion ion implantation.

背景技术 Background technique

在半导体制造工艺中,主流的杂质掺杂技术是传统的束线离子注入技术,此方法是由离子源产生等离子体(由混合离子、电子、中性粒子组成),等离子经过分析磁体等质能分离系统对等离子体进行质量和能量的分离,得到单一质量单一能量的离子,接着通过加速管对分离后的离子进行加速,加速后的离子高速注入到基片中(如硅片)。关于注入基片的注入情况需借助扫描系统进行扫描。可见这种方法需要复杂的质谱分析和扫描装置,注入效率低,结构复杂,成本很高。In the semiconductor manufacturing process, the mainstream impurity doping technology is the traditional beamline ion implantation technology. This method generates plasma (composed of mixed ions, electrons, and neutral particles) from an ion source, and the plasma is analyzed by magnets and other mass-energy The separation system separates the mass and energy of the plasma to obtain ions of single mass and single energy, and then accelerates the separated ions through the acceleration tube, and the accelerated ions are implanted into the substrate (such as a silicon wafer) at high speed. The implantation of the implanted substrate needs to be scanned by means of a scanning system. It can be seen that this method requires complex mass spectrometry and scanning devices, low injection efficiency, complex structure, and high cost.

随着集成电路特征尺寸的缩小,结深的减小需要进一步降低离子注入能量(<1keV),束线离子注入束能降低会出现束流分散、均匀性变差、效率进一步降低等缺陷,这呼唤新技术的出现。等离子体浸没离子注入(PIII)技术能够有效避免以上问题。With the reduction of the feature size of integrated circuits, the reduction of junction depth requires further reduction of ion implantation energy (<1keV), and the reduction of beamline ion implantation beam energy will lead to defects such as beam dispersion, poor uniformity, and further reduction in efficiency. Call for the emergence of new technologies. Plasma immersion ion implantation (PIII) technology can effectively avoid the above problems.

PIII技术是将基片放置在阴极的电极上,并在该电极上加负偏压,向注入系统工作腔室内引入需要的气体,并对系统加功率源,通过感性耦合、容性耦合等放电方法使被引入腔室的气体起辉,形成等离子体。由于在阴极上加有负偏压,这样在基片附近就会有负偏压鞘层存在,在此鞘层的高电压加速下,鞘层中的正离子会穿过鞘层并注入到基片中。PIII technology is to place the substrate on the electrode of the cathode, and apply a negative bias to the electrode, introduce the required gas into the working chamber of the injection system, and add a power source to the system, and discharge through inductive coupling, capacitive coupling, etc. The method ignites a gas introduced into a chamber to form a plasma. Since there is a negative bias voltage on the cathode, there will be a negative bias sheath near the substrate. Under the acceleration of the high voltage of the sheath, the positive ions in the sheath will pass through the sheath and inject into the substrate. in the film.

如图3所示,图3是未加自动稳相原理的PIII系统示意图,此时的腔室是圆柱形,基片台的位置是放在腔室的中央有利于注入的均匀性。该方法具有如下优点:As shown in Figure 3, Figure 3 is a schematic diagram of the PIII system without the principle of automatic phase stabilization. At this time, the chamber is cylindrical, and the substrate stage is placed in the center of the chamber to facilitate the uniformity of injection. This method has the following advantages:

1)、无需从离子源中抽取离子、对离子进行质谱分析和线性加速,使得注入设备的结构大为简化,节省大量成本;1) There is no need to extract ions from the ion source, perform mass spectrometry analysis and linear acceleration on the ions, which greatly simplifies the structure of the implantation equipment and saves a lot of cost;

2)、该技术采用鞘层加速机理,注入过程为整片注入,与基片尺寸无关,所以该技术产率极高。2) This technology adopts the sheath acceleration mechanism, and the injection process is the whole wafer injection, which has nothing to do with the size of the substrate, so the yield of this technology is extremely high.

可见,PIII技术是一种有望取代束线离子注入的新型注入技术。然而PIII时所有的离子都会被加速注入到基片中,如何实现注入离子质量和能量的分离,即如何实现单一能量单一离子的注入一直是PIII的一大问题,其严重影响了PIII技术的发展和推广。It can be seen that PIII technology is a new type of implantation technology that is expected to replace beamline ion implantation. However, in PIII, all ions will be accelerated and implanted into the substrate. How to achieve the separation of implanted ion mass and energy, that is, how to realize the implantation of a single ion with a single energy has always been a major problem in PIII, which seriously affects the development of PIII technology. and promotion.

发明内容 Contents of the invention

(一)要解决的技术问题(1) Technical problems to be solved

有鉴于此,本发明的主要目的在于提供一种在等离子体浸没离子注入中对不同质量离子分离的装置,以将自动稳相原理应用到等离子体浸没离子注入技术中,实现浸没离子注入的质量分离,解决浸没离子注入无法实现单一离子单一能量注入的问题。In view of this, the main purpose of the present invention is to provide a device for separating ions of different masses in plasma immersion ion implantation, so as to apply the principle of automatic phase stabilization to plasma immersion ion implantation technology, and realize the quality of immersion ion implantation. Separation, to solve the problem that immersion ion implantation cannot achieve single ion single energy implantation.

(二)技术方案(2) Technical solutions

为达到上述目的,本发明提供了一种在等离子体浸没离子注入中对不同质量离子分离的装置,该装置包括球形腔室、基片台、球形腔室内的高频电场和球形腔室内的恒定磁场,其中:To achieve the above object, the present invention provides a device for separating ions of different masses in plasma immersion ion implantation, the device comprises a spherical chamber, a substrate stage, a high-frequency electric field in the spherical chamber and a constant magnetic field, where:

球形腔室由两个对称的D形电极构成,该两个D形电极直边重合、上下叠加,且在连接处不导电,中间通过绝缘材料隔开;The spherical chamber is composed of two symmetrical D-shaped electrodes, the two D-shaped electrodes are overlapped on the straight sides, stacked up and down, and are not conductive at the connection, and separated by insulating materials in the middle;

球形腔室内的高频电场,由所述两个D形电极产生;A high-frequency electric field in the spherical chamber, generated by the two D-shaped electrodes;

球形腔室内的腔室内恒定磁场,通过在所述球形腔室外侧加永磁铁而产生;The constant magnetic field in the chamber in the spherical chamber is generated by adding a permanent magnet outside the spherical chamber;

基片台位于垂直于磁场平面靠近球形腔室内壁的位置。The substrate stage is located perpendicular to the magnetic field plane and close to the inner wall of the spherical chamber.

上述方案中,所述球形腔室内的高频电场通过在所述两个D形电极上加高频电压而产生。In the above solution, the high-frequency electric field in the spherical chamber is generated by applying a high-frequency voltage to the two D-shaped electrodes.

上述方案中,所述球形腔室内的恒定磁场通过在所述球形腔室外侧加左右对称的永磁铁产生。In the above solution, the constant magnetic field in the spherical chamber is generated by adding left-right symmetrical permanent magnets outside the spherical chamber.

上述方案中,所述基片台的位于垂直于磁场平面靠近腔室内壁的位置。In the above solution, the substrate stage is located at a position perpendicular to the magnetic field plane and close to the inner wall of the chamber.

(三)有益效果(3) Beneficial effects

本发明提供的在等离子体浸没离子注入中对不同质量离子分离的装置,将自动稳相原理应用到等离子体浸没离子注入技术中,从而实现浸没离子注入的质量分离,解决了浸没离子注入无法实现单一离子单一能量注入的问题。The device for separating different masses of ions in plasma immersion ion implantation provided by the present invention applies the principle of automatic phase stabilization to plasma immersion ion implantation technology, thereby realizing the mass separation of immersion ion implantation and solving the problem that immersion ion implantation cannot be realized The problem of single ion single energy implantation.

附图说明 Description of drawings

图1是本发明提供的在等离子体浸没离子注入中对不同质量离子分离的装置的结构示意图;Fig. 1 is a schematic structural diagram of a device for separating ions of different masses in plasma immersion ion implantation provided by the present invention;

图2是D形电极的结构示意图;Fig. 2 is a structural schematic diagram of a D-shaped electrode;

图3现有技术中未加自动稳相原理的PIII系统示意图。Fig. 3 is a schematic diagram of a PIII system without an automatic phase stabilization principle in the prior art.

具体实施方式 Detailed ways

为使本发明的目的、技术方案和优点更加清楚明白,以下结合具体实施例,并参照附图,对本发明进一步详细说明。In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

自动稳相原理最先被用在加速器上,稳相加速器采用D形电极来加速粒子,可为简化单个D极结构(如图2所示),图2是D形结构示意图及其电势幅值分布,这样的电势分布使得其在腔室内产生的电场分布均匀。The principle of automatic phase stabilization was first used in accelerators. Phase stabilization accelerators use D-shaped electrodes to accelerate particles, which can simplify a single D-pole structure (as shown in Figure 2). Figure 2 is a schematic diagram of the D-shaped structure and its potential amplitude Distribution, such a potential distribution makes the distribution of the electric field generated in the chamber uniform.

在稳相加速器中粒子的回旋频率或周期随时间的变化关系:In a steady-phase accelerator, the cyclotron frequency or period of particles varies with time:

Figure G2009100938834D00031
Figure G2009100938834D00031

Figure G2009100938834D00032
Figure G2009100938834D00032

如果相位

Figure G2009100938834D00033
为一固定值
Figure G2009100938834D00034
且高频频率在开始时与粒子的回旋频率相同,以后随时间的变化率又严格遵循以上关系,那么粒子就能始终保持与高频电场相同的频率旋转,以固定的相位
Figure G2009100938834D00035
被同步加。这个粒子被称为理想粒子,称为平衡相位。可见只有注入相位
Figure G2009100938834D00037
与平衡相位
Figure G2009100938834D00038
相同,并且注入能量εi等于粒子静止能量时的粒子才是“理想粒子”。if phase
Figure G2009100938834D00033
to a fixed value
Figure G2009100938834D00034
And the high-frequency frequency is the same as the whirling frequency of the particle at the beginning, and the rate of change over time strictly follows the above relationship, then the particle can always keep rotating at the same frequency as the high-frequency electric field, with a fixed phase
Figure G2009100938834D00035
is added synchronously. This particle is called an ideal particle, called the equilibrium phase. It can be seen that only the injected phase
Figure G2009100938834D00037
phase with balance
Figure G2009100938834D00038
The same, and the particle when the injected energy ε i is equal to the rest energy of the particle is the "ideal particle".

然而并不是只有“理想粒子”才能被最终加速至终能量,原苏联的维克斯勒尔和美国的麦克米伦各自独立地于1944年和1945年分别提出自动稳相原理:在一些共振加速器中,通过某些加速器参数的调制,便可使处在某种平衡相位下加速的理想粒子的运动与高频电场完全同步,能量连续增长;而在相位和能量在一定范围内偏离理想粒子的非理想粒子则将围绕理想粒子作相振动,最后同理想离子一起被加速至终能量。However, it is not only "ideal particles" that can be finally accelerated to the final energy. Veksler of the former Soviet Union and Macmillan of the United States independently proposed the principle of automatic phase stabilization in 1944 and 1945: in some resonant accelerators Among them, through the modulation of some accelerator parameters, the motion of the ideal particle accelerated in a certain equilibrium phase can be completely synchronized with the high-frequency electric field, and the energy can increase continuously; while the phase and energy deviate from the ideal particle within a certain range The non-ideal particles will vibrate around the ideal particles, and finally be accelerated to the final energy together with the ideal ions.

对于εi=εis的非理想粒子来说,只有当处在区间内时,粒子才能通过稳定的相振荡而被加速到最终能量.反之粒子不能被稳定加速至最终能量.For non-ideal particles with ε i = ε is , only when in the interval When the particle is inside, the particle can be accelerated to the final energy through stable phase oscillation. Otherwise, the particle cannot be accelerated to the final energy stably.

对εi在εis附近的非理想粒子进行相似的分析后仍会得到相同的

Figure G2009100938834D00043
为稳定的初始相位区的结论。A similar analysis for non-ideal particles with εi around εis still yields the same
Figure G2009100938834D00043
The conclusion for the stable initial phase region.

将自动稳相原理用到PIII中,等离子体中离子的频率与离子质量有关: &omega; pi = ( e 2 n 0 &epsiv; 0 M ) 1 / 2 即等离子的频率跟离子质量的开平方成反比,而相位与频率ωpi成正比。因此相位

Figure G2009100938834D00046
与离子质量M有关,即被加速的离子相位区间
Figure G2009100938834D00047
对应一个离子质量区间(M,M′)。只有质量在这个区间的离子才能被加速注入到基片中从而从一定程度上实现浸没离子注入的质量分离。Applying the principle of automatic phase stabilization to PIII, the frequency of ions in the plasma is related to the mass of ions: &omega; p = ( e 2 no 0 &epsiv; 0 m ) 1 / 2 That is, the frequency of the plasma is inversely proportional to the square root of the ion mass, and the phase It is proportional to the frequency ω pi . Therefore the phase
Figure G2009100938834D00046
It is related to the ion mass M, that is, the accelerated ion phase interval
Figure G2009100938834D00047
Corresponds to an ion mass interval (M, M'). Only the ions whose mass is in this range can be accelerated into the substrate so as to realize the mass separation of immersion ion implantation to a certain extent.

如图1所示,图1是本发明提供的在等离子体浸没离子注入中对不同质量离子分离的装置的结构示意图,该装置包括球形腔室、基片台、球形腔室内的高频电场和球形腔室内的恒定磁场,其中:As shown in Figure 1, Figure 1 is a schematic structural view of a device for separating ions of different masses in plasma immersion ion implantation provided by the present invention, the device includes a spherical chamber, a substrate stage, a high-frequency electric field in the spherical chamber and A constant magnetic field inside a spherical chamber where:

球形腔室由两个对称的D形电极构成,该两个D形电极直边重合、上下叠加,且在连接处不导电,中间通过绝缘材料隔开;The spherical chamber is composed of two symmetrical D-shaped electrodes, the two D-shaped electrodes are overlapped on the straight sides, stacked up and down, and are not conductive at the connection, and separated by insulating materials in the middle;

球形腔室内的高频电场,由所述两个D形电极产生;A high-frequency electric field in the spherical chamber, generated by the two D-shaped electrodes;

球形腔室内的腔室内恒定磁场,通过在所述球形腔室外侧加永磁铁而产生;The constant magnetic field in the chamber in the spherical chamber is generated by adding a permanent magnet outside the spherical chamber;

基片台位于垂直于磁场平面靠近球形腔室内壁的位置。The substrate stage is located perpendicular to the magnetic field plane and close to the inner wall of the spherical chamber.

其中,所述球形腔室内的高频电场通过在所述两个D形电极上加高频电压而产生。所述球形腔室内的恒定磁场通过在所述球形腔室外侧加左右对称的永磁铁产生。所述基片台的位于垂直于磁场平面靠近腔室内壁的位置,基片台的位置放在腔室的最左侧或最右侧有利于更好地筛选离子。Wherein, the high-frequency electric field in the spherical chamber is generated by applying high-frequency voltage to the two D-shaped electrodes. The constant magnetic field in the spherical chamber is generated by adding left-right symmetrical permanent magnets outside the spherical chamber. The substrate stage is located perpendicular to the magnetic field plane and close to the inner wall of the chamber, and the substrate stage is placed on the leftmost or rightmost side of the chamber to facilitate better screening of ions.

本发明提出将自动稳相原理应用到等离子体浸没离子注入技术中,从而实现浸没离子注入的质量分离,解决了浸没离子注入无法实现单一离子单一能量注入的问题。把自动稳向原理应用到浸没离子注入中需在腔室内纵向加高频电场,在腔室内横向加恒定的磁场。纵向高频电场通过D行电极结构加高频电压获得。恒定磁场通过加永磁铁获得。The invention proposes to apply the principle of automatic phase stabilization to the plasma immersion ion implantation technology, so as to realize the mass separation of the immersion ion implantation, and solve the problem that the immersion ion implantation cannot realize single ion single energy implantation. Applying the principle of automatic orientation stabilization to immersion ion implantation needs to apply a high-frequency electric field longitudinally in the chamber and a constant magnetic field laterally in the chamber. The vertical high-frequency electric field is obtained by applying high-frequency voltage to the D row electrode structure. A constant magnetic field is obtained by adding a permanent magnet.

以上所述的具体实施例,对本发明的目的、技术方案和有益效果进行了进一步详细说明,所应理解的是,以上所述仅为本发明的具体实施例而已,并不用于限制本发明,凡在本发明的精神和原则之内,所做的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。The specific embodiments described above have further described the purpose, technical solutions and beneficial effects of the present invention in detail. It should be understood that the above descriptions are only specific embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention shall be included within the protection scope of the present invention.

Claims (3)

1.一种在等离子体浸没离子注入中对不同质量离子分离的装置,其特征在于,该装置包括球形腔室、基片台、球形腔室内的高频电场和球形腔室内的恒定磁场,其中:1. A device for separating different mass ions in plasma immersion ion implantation, characterized in that the device comprises a spherical chamber, a substrate stage, a high-frequency electric field in the spherical chamber and a constant magnetic field in the spherical chamber, wherein : 球形腔室由两个对称的D形电极构成,该两个D形电极直边重合、上下叠加,且在连接处不导电,中间通过绝缘材料隔开;The spherical chamber is composed of two symmetrical D-shaped electrodes, the two D-shaped electrodes are overlapped on the straight sides, stacked up and down, and are not conductive at the connection, and separated by insulating materials in the middle; 球形腔室内的高频电场,由所述两个D形电极产生;A high-frequency electric field in the spherical chamber, generated by the two D-shaped electrodes; 球形腔室内的腔室内恒定磁场,通过在所述球形腔室外侧加永磁铁而产生;The constant magnetic field in the chamber in the spherical chamber is generated by adding a permanent magnet outside the spherical chamber; 基片台位于垂直于磁场平面靠近球形腔室内壁的位置。The substrate stage is located perpendicular to the magnetic field plane and close to the inner wall of the spherical chamber. 2.如权利要求1所述的在等离子体浸没离子注入中对不同质量离子分离的装置,其特征在于,所述球形腔室内的高频电场通过在所述两个D形电极上加高频电压而产生。2. The device for separating different mass ions in plasma immersion ion implantation as claimed in claim 1, wherein the high-frequency electric field in the spherical chamber is obtained by adding a high-frequency electric field on the two D-shaped electrodes. voltage is generated. 3.如权利要求1所述的在等离子体浸没离子注入中对不同质量离子分离的装置,其特征在于,所述球形腔室内的恒定磁场通过在所述球形腔室外侧加左右对称的永磁铁产生。3. The device for separating different mass ions in plasma immersion ion implantation as claimed in claim 1, wherein the constant magnetic field in the spherical chamber is obtained by adding left-right symmetrical permanent magnets outside the spherical chamber. produce.
CN2009100938834A 2009-09-23 2009-09-23 Device for separating ions with different masses in plasma immersion ion implantation Expired - Fee Related CN102021524B (en)

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CN103866394B (en) * 2012-12-11 2016-08-17 中国科学院微电子研究所 Plasma immersion ion implantation system

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5289010A (en) * 1992-12-08 1994-02-22 Wisconsin Alumni Research Foundation Ion purification for plasma ion implantation
CN1906324A (en) * 2004-01-06 2007-01-31 理想星株式会社 Ion implantation method and ion implantation device
CN1953129A (en) * 2005-10-20 2007-04-25 日新意旺机械股份有限公司 Method of operating ion source and ion implanting apparatus

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5289010A (en) * 1992-12-08 1994-02-22 Wisconsin Alumni Research Foundation Ion purification for plasma ion implantation
CN1906324A (en) * 2004-01-06 2007-01-31 理想星株式会社 Ion implantation method and ion implantation device
CN1953129A (en) * 2005-10-20 2007-04-25 日新意旺机械股份有限公司 Method of operating ion source and ion implanting apparatus

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
JP特开2001-267266A 2001.09.28
毛国强等.等离子体表面技术的研究与应用.《航空精密制造技术》.2002,第38卷(第4期),参见期刊第7-11页. *
汪明刚等.等离子体浸没注入超低能注入掺杂研究.《核聚变与等离子体物理》.2010,第30卷(第4期),参见期刊第373-373页. *

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