CN102016610A - Storage device testing - Google Patents
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- CN102016610A CN102016610A CN2009801023239A CN200980102323A CN102016610A CN 102016610 A CN102016610 A CN 102016610A CN 2009801023239 A CN2009801023239 A CN 2009801023239A CN 200980102323 A CN200980102323 A CN 200980102323A CN 102016610 A CN102016610 A CN 102016610A
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- 238000012360 testing method Methods 0.000 title claims abstract description 293
- 238000012546 transfer Methods 0.000 claims abstract description 69
- 238000000034 method Methods 0.000 claims description 32
- 238000011990 functional testing Methods 0.000 claims description 19
- 230000006870 function Effects 0.000 claims description 12
- 238000004891 communication Methods 0.000 claims description 7
- 208000002925 dental caries Diseases 0.000 claims description 4
- 230000002950 deficient Effects 0.000 claims description 3
- 230000001105 regulatory effect Effects 0.000 claims description 2
- 230000003213 activating effect Effects 0.000 claims 1
- 238000012797 qualification Methods 0.000 claims 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical class C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 4
- 230000003139 buffering effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229940074869 marquis Drugs 0.000 description 2
- 230000002175 menstrual effect Effects 0.000 description 2
- VBUNOIXRZNJNAD-UHFFFAOYSA-N ponazuril Chemical compound CC1=CC(N2C(N(C)C(=O)NC2=O)=O)=CC=C1OC1=CC=C(S(=O)(=O)C(F)(F)F)C=C1 VBUNOIXRZNJNAD-UHFFFAOYSA-N 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- UEKHZPDUBLCUHN-UHFFFAOYSA-N 2-[[3,5,5-trimethyl-6-[2-(2-methylprop-2-enoyloxy)ethoxycarbonylamino]hexyl]carbamoyloxy]ethyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCCOC(=O)NCCC(C)CC(C)(C)CNC(=O)OCCOC(=O)C(C)=C UEKHZPDUBLCUHN-UHFFFAOYSA-N 0.000 description 1
- 239000007853 buffer solution Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000013016 damping Methods 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 208000004141 microcephaly Diseases 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000002085 persistent effect Effects 0.000 description 1
- 229920003225 polyurethane elastomer Polymers 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000007790 scraping Methods 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 229920001169 thermoplastic Polymers 0.000 description 1
- 239000004416 thermosoftening plastic Substances 0.000 description 1
- 238000010200 validation analysis Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B33/00—Constructional parts, details or accessories not provided for in the other groups of this subclass
- G11B33/12—Disposition of constructional parts in the apparatus, e.g. of power supply, of modules
- G11B33/125—Disposition of constructional parts in the apparatus, e.g. of power supply, of modules the apparatus comprising a plurality of recording/reproducing devices, e.g. modular arrangements, arrays of disc drives
- G11B33/127—Mounting arrangements of constructional parts onto a chassis
- G11B33/128—Mounting arrangements of constructional parts onto a chassis of the plurality of recording/reproducing devices, e.g. disk drives, onto a chassis
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- Automatic Disk Changers (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
A storage device testing system (100) includes at least one robotic arm (200) defining a first axis (205) substantially normal to a floor surface (10). The robotic arm is operable to rotate through a predetermined arc about and extend radially from the first axis. Multiple racks (300) are arranged around the robotic arm for servicing by the robotic arm. Each rack houses multiple test slots (310) that are each configured to receive a storage device transporter (550) configured to carry a storage device (500) for testing. A transfer station (400) is arranged for servicing by the robotic arm. The transfer station includes multiple tote receptacles (420) that are each configured to receive a storage device tote (450).
Description
Technical field
Present disclosure relates to the memory device test.
Background technology
Disk drive makers is tested the compatibility of the disc driver and the demand collection of manufacturing usually.Have the proving installation and the technology that are used for a large amount of disc drivers of serial or parallel ground test.Manufacturer tends to test simultaneously in batches a large amount of disc drivers.The disk drive test system generally includes one or more frames (rack), and this frame has a plurality of test trough of holding the disc driver that will test.
Regulate the disc driver test environment in nearly week closely.For the safety of accurate test condition and disc driver, the minimum temperature fluctuation in the test environment is very crucial.Have high power capacity more, faster rotating speed and more the latest generation disc driver in microcephaly gap is more responsive to vibration.Excessive vibration can influence the integrality of reliability of testing result and electrical connection.Under test condition, driver itself can arrive adjacent cells with vibration propagation by supporting construction or anchor clamps.This vibration " is crosstalked " and is caused together with the external vibration source that bump is wrong, primary drying hits and beat (NRRO) with non-repeatability, and this may cause lower test yield and increase manufacturing cost.
Current disk drive test system adopts automatic structuring back-up system, and it causes vibration in the system excessive and/or require big floor area.Current disk drive test system also uses operator or travelling belt, respectively disc driver is transported to test macro to be used for test.
Summary of the invention
In one aspect, the memory device test macro comprises at least one robots arm, and this at least one robots arm limits and the vertical substantially first axle of floor surface.The robots arm can be operable to around first axle revolved predetermined arc (for example 360 °) and radially extended from this first axle.A plurality of frames are arranged in around the robots arm, are used for providing service by the robots arm.Each frame is held a plurality of test trough, and each all is configured to accommodate a memory device conveyer described a plurality of test trough, and this memory device conveyer is configured to carry the memory device that will test.Be furnished with transfer station (transfer station), be used for providing service by the robots arm.This transfer station comprises a plurality of storage tank holders, and each all is configured to accommodate a memory device storage tank (tote) described a plurality of storage tank holders.
The embodiment of present disclosure can comprise one or more in the following characteristics.In some embodiments, the robots arm comprises mechanical arm, and this mechanical arm is configured to engage with the memory device conveyer of a test trough.The robots arm can be operable to the memory device in the memory device conveyer is transported to test trough to test.The robots arm limits the working envelope body (envelope volume) of substantial cylindrical, and described frame and transfer station are arranged in this working envelope body, are used for providing service by the robots arm.In some instances, frame and transfer station are arranged to partially enclosed at least polygon around robots arm's first axle.Frame can radially equidistantly or with different distance be arranged apart from robots arm's first axle.
In some embodiments, transfer station can be operable to around limits by transfer station, rotate with the vertical substantially longitudinal axis of floor surface.Transfer station comprises the transfer station housing, this transfer station housing limit opposing face to the first and second storage tank holders.In some instances, transfer station comprises: the housing of standing, and this station housing limits longitudinal axis; And a plurality of storage tank receptacles, described a plurality of storage tank receptacles rotatably are mounted to around the rotation of this longitudinal axis, each storage tank receptacle all can be independent of other storage tank receptacles rotations, and limit opposing face to the first and second storage tank holders.In some instances, the storage tank receptacle is rotatably installed on the main shaft that the slave station base portion extends substantially straight up.
The robots arm can come to provide service for each test trough independently by transmitting memory device between the memory device storage tank of accommodating at the quilt of test trough and transfer station.In some embodiments, the memory device storage tank comprises the storage tank body, and this storage tank body limits a plurality of memory device holders, and described a plurality of memory device holders are configured to hold respectively memory device.Each memory device holder all limits the memory device support, and this memory device support is configured to support the middle body of the memory device of being accommodated, to allow operating this memory device along non-middle body.In some instances, the memory device storage tank comprises: the storage tank body, and this storage tank body limits a plurality of column cavitys; And a plurality of cantilever-shaped memory device support that is arranged in each column cavity (for example, stretch out from the rear wall of this column cavity), described a plurality of cantilever-shaped memory device support is divided into a plurality of memory device holders with the column cavity, and each all is configured to accommodate a memory device described a plurality of memory device holders.Each memory device support all is configured to support the middle body of the memory device of being accommodated, to allow operating this memory device along non-middle body.
In some embodiments, the memory device test macro comprises at least one computing machine of communicating by letter with test trough.Electric system is to memory device test macro power supply and the power of the memory device that can be configured to monitor and/or regulate that the quilt in the test trough is accommodated.Temperature control system is controlled the temperature of each test trough.This temperature control system can comprise fan blower (for example fan), and this fan blower can be operable to and air was stimulated the menstrual flow at the test trough upper reaches and/or pass this test trough.Vibration control system control frame vibration (for example via passive buffering).Data-interface is communicated by letter with each test trough, and be configured to and the memory device conveyer of accommodating by test trough in memory device communication.
Each frame can comprise at least one self-testing system of communicating by letter with at least one test trough.This self-testing system comprises: cluster control unit; The connecting interface circuit, this connecting interface circuit and the memory device telecommunication that is housed in the test trough; And with the piece interface circuit of this connecting interface circuit telecommunication.This piece interface circuit is configured to control the power and the temperature of test trough.Connecting interface circuit and piece interface circuit are configured to test at least one functions of components (for example, test is when test trough this test trough functional during maybe when the memory device that accommodates by the maintenance of memory device conveyer when empty) of described memory device test macro.
In some embodiments, each frame comprises at least one function test system of communicating by letter with at least one test trough.This function test system comprises: cluster control unit; At least one functional interface circuit, this at least one functional interface circuit and cluster control unit telecommunication; And the connecting interface circuit, this connecting interface circuit and functional interface circuit and the memory device telecommunication that is housed in the test trough.The functional interface circuit arrangement becomes the functional test routine is sent to memory device.In some instances, this function test system comprises Ethernet switch, and being used for provides telecommunication between cluster control unit and at least one functional interface circuit.
The memory device test macro comprises the vision system that is positioned on the robots arm sometimes, so that help this robots arm of guiding when transporting memory device.Especially, this vision system can be used for guiding the mechanical arm of the gripping memory device conveyer on this robots arm, so that memory device conveyer safety is inserted in a test trough or the memory device storage tank.This vision system aims at calibration machine people arm by making the robots arm with the collimation mark on frame, test trough, transfer station and/or memory device storage tank.
On the other hand, the memory device storage tank comprises the storage tank body, and this storage tank body limits a plurality of memory device holders, and described a plurality of memory device holders are configured to hold respectively memory device.Each memory device holder limits the memory device support, and this memory device support is configured to support the middle body of the memory device of being accommodated, to allow operating this memory device along non-middle body.
Aspect another, the memory device storage tank comprises: the storage tank body, and this storage tank body limits a plurality of column cavitys; And a plurality of cantilever-shaped memory device support (for example the rear wall from the column cavity stretches out) that is arranged in each column cavity, described a plurality of cantilever-shaped memory device support is divided into a plurality of memory device holders with the column cavity, and each all is configured to accommodate a memory device described a plurality of memory device holders.Each memory device support all is configured to into the middle body of the memory device that support accommodates, to allow operating this memory device along non-middle body.
On the other hand, the method for execution memory device test comprises: a plurality of memory devices are loaded in the memory device holder that is limited by the memory device storage tank; And the memory device storage tank is loaded in the storage tank holder that is limited by transfer station.This method comprises: activate the robots arm and take out the memory device conveyer with the test trough from be contained in frame; And activate the robots arm with from the memory device conveyer also packed this memory device into by memory device of transfer station taking-up.This robots arm can be operable to around limit by the robots arm, revolved predetermined arc with the vertical substantially first axle of floor surface and radially extended from this first axle.This method comprises: activate the robots arm and be delivered to test trough with the memory device conveyer that will carry memory device; And the memory device that holds to test trough with by the memory device conveyer of being accommodated is carried out functional test.Then, this method comprises: activate the robots arm to carry the memory device conveyer of surveying memory device from the test trough taking-up and this to have been surveyed memory device sent transfer station back to.
In some instances, this method comprises: activate the robots arm the memory device conveyer is placed in the test trough (after for example in will surveying the memory device holder that memory device is placed on the memory device storage tank).In some instances, the memory device conveyer is delivered to test trough comprises: the memory device conveyer that will carry memory device is inserted in the test trough in the frame, is electrically connected thereby set up between this memory device and frame.
This method can comprise: make memory device storage tank that the quilt in the transfer station accommodates in service position (for example can by operator access's position) and can rotate between the test position by robots arm's access.Transfer station comprise sometimes limit opposing face to the transfer station housing of the first and second storage tank holders, each storage tank holder all is configured to accommodate a memory device storage tank.
In some embodiments, memory device is loaded in the memory device storage tank comprises: memory device is placed on the memory device support in the memory device holder that the storage tank body by the memory device storage tank limits, this memory device support is configured to support the middle body of the memory device of being accommodated, to allow operating this memory device along non-middle body.In some instances, this method further comprises: activate the robots arm and be delivered to the product that the return storage tank that is held by transfer station so that will survey memory device selectively, when surveying memory device successfully by functional test, the robots arm will survey memory device and be delivered to the qualified memory device holder that returns the product storage tank, and when surveying memory device and fail by functional test, the robots arm will survey memory device and be delivered to the defective memory device holder that returns the product storage tank.
In some embodiments, the memory device of being accommodated is carried out functional test comprise: when this memory device of operation, regulate the temperature of test trough.And the operation memory device of being accommodated can comprise that execution is to the data read of memory device with write.In some instances, one or more during this method may further comprise the steps: air is circulated on test trough and/or pass this test trough to control the temperature of this test trough; Monitor/or the power that provides to the memory device of being accommodated is provided; And utilize the self-testing system of holding by frame that test trough is carried out self-test, to verify the functional of this test trough.
This method can comprise: communicate by letter with the vision system on being positioned at the robots arm, to help this robots arm of guiding when transporting memory device.This method can also comprise: calibrate this robots arm by making the robots arm with can being aimed at by this vision system collimation mark identification, on frame, test trough, transfer station and/or transfer station storage tank.
Set forth the details of one or more embodiments of present disclosure in the the accompanying drawings and the following description.From this instructions, accompanying drawing and claim, other features, purpose and advantage will be apparent.
Description of drawings
Fig. 1 is the skeleton view of memory device test macro.
Fig. 2 is the vertical view of memory device test macro.
Fig. 3 is the skeleton view of memory device test macro.
Fig. 4-the 5th has the vertical view of the memory device test macro of the frame of different size and floor area.
Fig. 6 is the skeleton view of memory device test macro.
Fig. 7 is the side view the robots arm of vertical and horizontal actuation support upper support.
Fig. 8 is the skeleton view with memory device test macro of two robots arms.
Fig. 9 is the vertical view of memory device test macro that is included in the robots arm of runing rest upper support.
Figure 10 is the skeleton view of transfer station.
Figure 11 is the skeleton view that is limited with the storage tank of a plurality of memory device holders.
Figure 12 is the skeleton view with storage tank of cantilever-shaped memory device support.
Figure 13 is the skeleton view of memory device conveyer.
Figure 14 is the skeleton view that carries the memory device conveyer of described memory device.
Figure 15 is the bottom perspective view that carries the memory device conveyer of described memory device.
Figure 16 is the skeleton view that carries the memory device conveyer of described memory device, and this memory device conveyer is aligned to be inserted in the test trough.
Figure 17 is the synoptic diagram of memory device test macro.
Figure 18 is the synoptic diagram with memory device test macro of self-test and functional test ability.
Same reference numerals among each figure is represented similar elements.
Embodiment
With reference to figure 1-3, in some embodiments, memory device test macro 100 comprises at least one robots arm 200, and this robots arm 200 defines the first axle 205 vertical substantially with floor surface 10.Robots arm 200 can be operable to around first axle 205 revolved predetermined arc and radially extended from first axle 205.In some instances, robots arm 200 can be operable to around 360 ° of first axle 205 rotations and comprise the mechanical arm 212 of the far-end that is arranged on robots arm 200, with conveyance memory device 500 and/or carry the memory device conveyer 550 (for example, referring to Figure 13-14) of this memory device 500.In robots arm's 200 arranged around a plurality of frames 300 are arranged, be used for providing service by robots arm 200.Each frame 300 is all held a plurality of test trough 310, and this test trough 310 is configured to accommodate the memory device 500 that will test.Robots arm 200 limits the working envelope body 210 of substantial cylindrical, and frame 300 is arranged in the working envelope body 210 (referring to Figure 4 and 5), makes that each test trough 310 can be approaching, so that provide service by robots arm 200.The working envelope body 210 of substantial cylindrical provides little floor area and capacity only to be subjected to highly constrained restriction usually.
Memory device comprises disc driver, solid-state drive, memory device and any equipment of the asynchronous test that need be used to verify as used in this.Disc driver is normally at the non-volatile memory device with storage digital coding data on the fast rotational disc of magnetic surface.Solid state drive (SSD) is to use solid-state memory to store the data storage device of persistent data.Use the SSD of SRAM or DRAM (replacement flash memory) to be commonly referred to ram driver.Term " solid-state " makes a distinction solid electronic device and electromechanical equipment usually.
Robots arm independently 200 is isolated the vibration control that helps frame 300 with frame 300, and its only shared floor surface 10 (for example, referring to Figure 10) is as common support structure.In other words, robots arm 200 separates with frame 300 and only shared floor surface 10 as the unique means that are connected between these two structures.In other examples, each frame 300 is all held about 480 test trough 310.In other examples, the size of frame 300 is different with test trough quantity.
In the example shown in Fig. 1-3, frame 300 is radially equidistantly arranged apart from robots arm 200 first axle 205.Yet in working envelope body 210, frame 300 can be arranged with any pattern and any distance around robots arm 200.Frame 300 is arranged to partially enclosed at least polygon around robots arm 200 first axle 205, and for example octagon, square, triangle, trapezoidal or other polygons that open wide or seal have illustrated its example among Fig. 4-5.Frame 300 can be configured to different size and dimensions, to be fit to specific floor area.Frame 300 can be a symmetry or asymmetric around robots arm 200 arrangement.
In the example shown in Fig. 3 and 6, robots arm 200 is promoted and is supported on this pedestal or the lift 250 by pedestal on the floor surface 10 or lift 250.Pedestal or lift 250 provide service by allowing robots arm 200 not only upwards but also downwards to extend to described test trough 310, thereby increase the height of working envelope body 210.By being that pedestal or lift 250 increase vertical actuator and this vertical actuator configurations one-tenth is supported robots arm 200 vertical actuation support 252, can further increase the height of working envelope body 210, as shown in Figure 7.Vertically actuation support 252 can be operable to robots arm 200 is vertically moved with respect to floor surface 10.In some instances, vertically actuation support 252 is constructed to support this robots arm's 200 vertical track and comprises and be used to actuator (for example, driven ball-screw or band) that robots arm 200 is vertically moved along this track.Also as shown in Figure 7, horizontal actuation support 254 (for example linear-motion actuator) can be used for supporting this robots arm 200 and can be operable to robots arm 200 is moved horizontally along floor surface 10.In an example shown, from vertical view, the combination of supporting robots arm 200 vertical and horizontal actuation support 252,254 provides the working envelope body 210 of the expansion of the substantially elliptical profile with lengthening.
In example shown in Figure 8, memory device test macro 100 comprises two robots arm 200A and 200B, and both are all around first axle 205 rotations.A robots arm 200A is supported on the floor surface 10, and another robots arm 200B is from ceiling structure 12 suspentions.Similarly, in example shown in Figure 7, other robots arm 200 can vertically operate on the actuation support 252.
In example shown in Figure 9, memory device test macro 100 comprises rotatable 260 that supports robots arm 200.Can be operable to for rotatable 260 make robots arm 200 around with vertical substantially second axis 262 rotation of floor surface 10, provide thus than only around the bigger working envelope body 210 of the robots arm 200 of first axle 205 rotations.
Refer again to Fig. 7-8, in some embodiments, memory device test macro 100 comprises the vision system 270 that is arranged on the robots arm 200.Vision system 270 is configured to help guided robot arm 200 when transporting memory device 500.Especially, vision system 270 helps to aim at the memory device conveyer 550 that is grasped by mechanical arm 212, is used for being inserted in test trough 310 and/or storage tank 450.Vision system 270 can by make on robots arm 200 and the frame 300, preferably with test trough 310 on collimation mark 314 aim at calibration machine people arm 200.In some instances, collimation mark 314 is near " L " shape marks in bight that are positioned at the opening 312 of the test trough 310 on the frame 300.Before test trough 310 is carried out access (for example pick up or place memory device conveyer 550, it can carry memory device 500), robots arm 200 makes and himself aims at collimation mark 314.Robots arm's successive alignment has increased robots arm 200 precision and superiority, make simultaneously the memory device conveyer 550 that carries memory device 500 to misplace (this may cause damage to memory device 500 and/or memory device test macro 100) minimum.
In some embodiments, memory device test macro 100 comprises transfer station 400, shown in Fig. 1-3 and 10.And in other embodiments, memory device test macro 100 can comprise travelling belt (not shown) or the operator who memory device 500 is supplied to robots arm 200.In the example that comprises transfer station 400, robots arm 200 comes to provide service to each test trough 310 independently by transmit memory device 500 between transfer station 400 and test trough 310.Transfer station 400 comprises a plurality of storage tank holders 430, and each storage tank holder 430 all is configured to hold storage tank 450.Storage tank 450 defines memory device holder 454, and this memory device holder 454 holds the memory device 500 that will test and/or deposit.In each memory device holder 454, the memory device 500 that is held is supported by memory device support 456.Robots arm 200 is configured to utilize mechanical arm 212 that memory device conveyer 550 is shifted out from a test trough 310, utilize memory device conveyer 550 from a memory device holder 454 of transfer station 400, to pick up memory device 500 then, make the memory device conveyer 550 that has memory device 500 in it turn back to test trough 310 then, be used to test this memory device 500.After test, robots arm 200 comes to have surveyed memory device 500 from test trough 310 taking-ups as follows: will carry the memory device conveyer 550 of having surveyed memory device 500 and remove (promptly utilizing mechanical arm 212) from test trough 310; The memory device of survey 500 in the memory device conveyer 550 is transported to transfer station 400; And, operate this memory device conveyer 500, make and surveyed the memory device holder 454 that memory device 500 turns back to transfer station 400.On robots arm 200, comprise in the embodiment of vision system 270, can near one or more memory device holders 454, collimation mark 314 be set, to help guiding this robots arm to take out or put down memory device 500 at transfer station 400 places.
In some instances, transfer station 400 comprises the station housing 410 that limits longitudinal axis 415.One or more storage tank receptacles 420 are rotatably installed in the housing 410 of station, for example on the main shaft 412 that axis 415 extends along the longitudinal.Each storage tank receptacle 420 can rotate on main shaft 412 or the shared main shaft 412 separately.Each storage tank receptacle 420 all limit opposing face to first and second storage tank holder 430A and the 430B.In an example shown, transfer station 400 comprises three storage tank receptacles 420 that are stacked on the main shaft 412.Each storage tank receptacle 420 all can be independent of the rotation of other storage tank receptacles and can make the memory device storage tank 450 of being accommodated in service position (for example can by the operator access) and can rotate between the test position by robots arm's 200 accesses.In an example shown, each storage tank receptacle 420 can rotate between the primary importance (for example service position) and the second place (test position).In primary importance, the operator can carry out access to the first storage tank holder 430A, and at opposition side, robots arm 200 can carry out access to the second storage tank holder 430B.In the second place, robots arm 200 can carry out access to the first storage tank holder 430A, and at opposition side, the operator can carry out access to the second storage tank holder 430B.Therefore, the operator can serve this transfer station 400 by the storage tank holder 430 on the side that storage tank 450 is loaded into transfer station 400 or from these storage tank holder 430 unloadings, and robots arm 200 can carry out access to the storage tank in the storage tank holder 430 on the opposition side that is contained in transfer station 400 450, is used for load/unload memory device 500.
In some examples, transfer station 400 comprises station indicator 418, this indicator 418 provide transfer station 400 one or more states visual, can listen or other discernible indications.In an example, station indicator 418 comprises lamp (for example LED lamp), and it indicates one or more storage tank receptacles 420 when to need service (for example from specific storage tank receptacle 420 load/unload storage tanks 450).In another example, station indicator 418 comprises one or more audio frequency apparatuses, is used to provide one or more earcons (for example chirp, crack or the like), so that inform the operator transfer station 400 is served.As shown in the figure, station indicator 418 longitudinally axis 415 is placed, or is placed on other parts of station housing 410.
In example shown in Figure 11, storage tank 450A comprises the storage tank body 452A that limits a plurality of memory device holder 454A.Each memory device holder 454A all is configured to hold memory device 500.In this example, each memory device holder 454A includes memory device support 456A, and this memory device support 456A is configured to support the middle body 502 of the memory device 500 of being accommodated, to allow operating this memory device 500 along non-middle body.For from memory device holder 454A, removing the memory device 500 that is held, memory device 500 belows (for example by robots arm 200) that memory device conveyer 550 is positioned among the memory device holder 454A also promote, so that memory device 500 is lifted from this memory device support 456A.Then, memory device conveyer 550 is removed from memory device holder 454A when having carried memory device 500, and for delivery to the purpose object, for example test trough 310.
In example shown in Figure 12, storage tank 450B comprises storage tank body 452B, and this storage tank body 452B limits column cavity 453B, and this column cavity 453B is divided into a plurality of memory device holder 454B by a plurality of memory device support 456B.Memory device support 456B is cantilever-shaped from the rear wall 457B of column cavity 453B and stretches out.Memory device support 456B is configured to support the middle body 502 of the memory device 500 of being accommodated, to allow operating this memory device 500 along non-middle body.By (for example with memory device conveyer 550, as shown in figure 13) lift to remove memory device 500 from memory device holder 454B from this memory device support 456B among the memory device holder 454B of the sky under being inserted into and with memory device 500, cantilever-shaped memory device support 456B allows to take out memory device 500 from storage tank 450B.If memory device 500 will be placed among the storage tank 450B, then repeat same steps as on the contrary.As shown in the figure, the bottom memory device holder 454B among each column cavity 453B remains sky, so that remove the memory device 500 among the memory device holder 454B that holds above it.Therefore, memory device 500 in order load/unload in particular column; Yet, compare with storage tank solution shown in Figure 11, realized bigger storage density.
With reference to figure 13-16, in some instances, test trough 310 is configured to accommodate memory device conveyer 550.Memory device conveyer 550 is configured to accommodate memory device 500 and by robots arm's 200 conveyances.In use, utilize robot 200 from a test trough 310, to remove a memory device conveyer 550 (for example, come grasping or engage the recess 552 of this conveyer 550) by the mechanical arm 212 that utilizes robot 200.As shown in figure 13, memory device conveyer 550 comprises framework 560, this framework 560 limits the opening 561 of the roughly U-shaped that is formed by sidewall 562,564 and substrate 566, sidewall 562,564 and substrate 566 be common to allow frameworks 560 to be assemblied in around the memory device support 456 in the storage tank 450, makes memory device conveyer 550 can move to the position that (for example via robots arm 200) is contained in memory device 500 belows in the memory device holder 454 of storage tank 450.Then, this memory device conveyer 550 can be elevated to (for example by robots arm 200) and the position that memory device 500 engages, be used for the memory device support 456 of this memory device from storage tank 450 moved apart.
Be positioned under the situation of appropriate location in the framework 560 of memory device conveyer 550 at memory device 500, memory device conveyer 550 and memory device 500 can be moved together by robots arm 200, are used to be placed in the test trough 310, as shown in figure 16.Mechanical arm 212 also is configured to begin to activate the clamping device 570 that is arranged in memory device conveyer 550.This allows to move with respect to memory device conveyer 550 with forbidden storage equipment 500 during moving at this making conveyer 550 activate this clamping device 570 earlier before moving to test trough 310 from storage tank 450.Before in being inserted into test trough 310, mechanical arm 212 can activate this clamping device 570 once more, to be released in the memory device 500 in the framework 560.This permission is inserted into memory device conveyer 550 in the test trough 310, is in the test position that memory device connector 510 engages with test trough connector (not shown) up to memory device 500.Engage with test trough 310 when clamping device 570 also can be configured in being contained in test trough 310, move with respect to test trough 310 with forbidden storage equipment delivery device 550.In these embodiments,, then engage this clamping device 570 (for example by mechanical arm 212) once more, move with respect to test trough 310 with forbidden storage equipment delivery device 550 as long as memory device 500 is in test position.Clamping conveyer 550 can help to reduce the vibration of test period in this way.In some instances, after inserting, memory device conveyer 550 and carry in this memory device conveyer 550 memory device 500 the two be combined or clamping or be fixed in the test trough 310 individually.Submit on Dec 18th, 2007, denomination of invention is the U.S. Patent application No.11/959 of " DISK DRIVETRANSPORT; CLAMPING AND TESTING (conveying of disc driver, clamping and test) ", can find the detailed description of clamping device 570 and other details and the feature that can combine with details described here and feature in 133, the full content of above-mentioned U. S. application is incorporated into by the mode of introducing at this.
500 pairs of vibration sensings of memory device.In single test chassis 300, pack into a plurality of memory devices 500 and move these memory devices 500 (for example at test period) and each test trough 310 from test chassis 300 to remove and insert memory device conveyer 550 (it carries memory device 500 respectively alternatively) may be the vibration source of not expecting.For example, in some cases, a memory device 500 may just carry out test operation in a test trough 310, and other memory devices 500 are just shifting out or be inserted into the adjacent test trough 310 in the same test chassis 300.As mentioned above, by contact and the scraping between restriction memory device conveyer 550 in the insertion of memory device conveyer 550 and during shifting out and the test trough 310, after memory device conveyer 550 being inserted into fully in the test trough 310, memory device conveyer 550 is clamped in and helps in the test trough 310 to reduce or constrained vibration.
With reference to Figure 17, in some embodiments, memory device test macro 100 comprises at least one computing machine 320 of communicating by letter with test trough 310.The automatic interface that computing machine 320 can be configured to provide stock's control of memory device 500 and/or is used for control store device test system 100.Electric system 330 is to 100 power supplies of memory device test macro.Electric system 330 can monitor and/or be adjusted in the power of the memory device 500 of accommodating in the test trough 310.The temperature of temperature control system 340 each test trough 310 of control.Temperature control system 340 can be fan blower 342 (a for example fan), and this fan blower 342 can be operable to and air was stimulated the menstrual flow at these test trough 310 upper reaches and/or pass this test trough 310.In some instances, fan blower 342 is positioned at test trough 310 outsides.The vibration of vibration control system 350 each test trough 310 of control, for example active or passive buffering.In some instances, vibration control system 350 comprises passive buffer system, and wherein, the parts of test trough 310 connect via the damping collar (grommet isolator) (for example thermoplastic polyvinyl chloride) and/or elastic base (for example polyurethane elastomer).In some instances, vibration control system 350 comprise have spring, the ACTIVE CONTROL system of damper and control loop, the vibration in this control loop control frame 300 and/or the test trough 310.Data-interface 360 is communicated by letter with each test trough 310.Data-interface 360 is configured to communicate by letter with the memory device 500 of being accommodated by test trough 310.
In example shown in Figure 180, each frame 300 comprises at least one self-testing system 600 of communicating by letter with at least one test trough 310.Self-testing system 600 test storage device test systems 100 and/or such as the particular subsystem of test trough 310 operate as normal whether.Self-testing system 600 comprise cluster control unit 610, be housed in the connecting interface circuit 620 of memory device 500 telecommunications in the test trough 310, and with the piece interface circuit 630 of connecting interface circuit 620 telecommunications.Cluster control unit 610 can be configured to move one or more test procedures, for example to a plurality of self-tests of test trough 310 and/or to the functional test of memory device 500.Connecting interface circuit 620 and piece interface circuit 630 can be configured to self-test.In some instances, self-testing system 600 comprises self testing circuit 660, and this self testing circuit 660 is configured to carry out and control the self-test routine to one or more parts of memory device test macro 100.For example, self testing circuit 600 can be configured to one or more parts of memory device test macro 100 are carried out " memory device " type and/or " only test trough " type self-test.Cluster control unit 610 can be communicated by letter with self testing circuit 640 via Ethernet (for example gigabit Ethernet), and this self testing circuit 640 can be communicated by letter with piece interface circuit 630 via UART Universal Asynchronous Receiver Transmitter (UART) serial link and also and then with connecting interface circuit 620 be communicated by letter with memory device 500.UART is single integrated circuit (or its part) normally, is used for carrying out serial communication on computing machine or peripherals serial ports.Piece interface circuit 630 is configured to control the power and the temperature of test trough 310, and can control a plurality of test trough 310 and/or memory device 500.
In some instances, each frame 300 comprises at least one function test system 650 of communicating by letter with at least one test trough 310.Function test system 650 test is kept by memory device conveyer 550 and/or is supported on whether operate as normal of memory device in the test trough 310, that accommodated 500.Functional test can comprise electric weight, the running temperature that test receives by memory device 500, the ability that reads and write data, and the ability that reads and write data under different temperatures (for example, the marquis reads and writes cold time marquis when in heat, or conversely).Functional test can test storage equipment 500 each memory sector or stochastic sampling only.Functional test can test storage equipment 500 running temperature and the data integrity of communicating by letter with memory device 500.Function test system 650 comprise cluster control unit 610 and with at least one functional interface circuit 660 of this cluster control unit 610 telecommunications.Connecting interface circuit 620 is communicated by letter with memory device 500 and functional interface circuit 660 in being housed in test trough 310.Functional interface circuit 660 is configured to the functional test routine is sent to memory device 500.Function test system 650 can comprise communication switchboard 670 (for example gigabit ethernet switch), to provide telecommunication between cluster control unit 610 and one or more functional interface circuit 660.Preferably, computing machine 320, communication switchboard 670, cluster control unit 610 and functional interface circuit 660 are communicated by letter on ethernet network.Yet, also can use other forms of communication.Functional interface circuit 660 can be communicated by letter with connecting interface circuit 620 via parallel AT annex (hard-disk interface is also referred to as IDE, ATA, ATAPI, UDMA and PATA), SATA or SAS (Serial Attached SCSI (SAS)).
The method of carrying out the memory device test comprises a plurality of memory devices 500 is loaded in the transfer station 400 (for example, by memory device 500 being loaded in the memory device holder 454 that is limited by memory device storage tank 450; And memory device storage tank 450 is loaded in the storage tank holder 430 that is limited by transfer station 400).This method comprises: activate robots arm 200 and take out memory device conveyer 550 with the test trough from be contained in frame 300 310; And, activate robots arm 200 to take out a memory device 500 from transfer station 400 and memory device 500 is packed into the memory device conveyer 550.Robots arm 200 can be operable to around 200 that limit by the robots arm, revolved predetermined arc with the vertical substantially first axle 205 of floor surface 10 and radially extended from this first axle 205.This method comprises: activate robots arm 200 and be delivered to test trough 310 with the memory device conveyer 550 that will carry memory device 500; And, the memory device 500 that the memory device conveyer 550 of being accommodated by test trough 310 and quilt holds is carried out functional tests.Then, this method comprises: activate robots arm 200 to carry the memory device conveyer 550 of surveying memory device 500 from test trough 310 taking-ups and will survey memory device 500 and send transfer station 400 back to.In some embodiments, providing for test trough 310 under the situation of dissimilar test, frame 300 and two or more correlative measurement experimental tanks 310 are configured in inside memory device 500 be moved to another test trough 310 from a test trough 310.
In some instances, this method comprises: activate robots arm 200, after in will surveying the memory device holder 454 that memory device 500 is placed on memory device storage tank 450, memory device conveyer 550 is placed in the test trough 310, or repeats this method by from another memory device holder 454 of memory device storage tank 450, taking out another memory device 500 that to test.In some instances, memory device conveyer 550 is delivered to test trough 310 to be comprised: the memory device conveyer 550 that will carry memory device 500 is inserted in the test trough 310 in the frame 300, is electrically connected thereby set up between memory device 500 and frame 300.
In some embodiments, this method comprises carries out functional test to the memory device 500 of being accommodated, and this comprises: the temperature of regulating test trough 310 when this memory device 500 of operation.The operation memory device 500 of being accommodated comprises: carry out the data read of memory device 500 and write.This method also comprises and ventilates test trough 310 tops or pass test trough 310, with the temperature of control test trough 310; And, monitor and/or regulate the power that provides to memory device 500.
In some instances, this method comprises: utilize the self-testing system of being held by frame 300 600 to come test trough 310 is carried out " memory device " type and/or " only test trough " type self-tests, functional with validation test groove 310." memory device " type self-test utilization is kept and/or is supported on memory device 500 in the test trough 310, that accommodated testing the functional of this memory device test macro by memory device conveyer 550.This test trough 310 functional when empty tested in " only test trough " type self-test.
In some instances, this method comprises: communicate by letter with the vision system 270 on being positioned at robots arm 200, to help guided robot arm 200 when transporting the memory device 500 that may be carried by memory device conveyer 550.This method comprises: aim at calibration machine people arm 200 by making robots arm 200 with the collimation mark on frame 300, test trough 310, transfer station 400 and/or storage tank 450 that is identified by vision system 270.
Other details that can combine with details described here and feature and feature can be submitted on Dec 18th, 2007, denomination of invention is the U.S. Patent application 11/958 of " DISK DRIVE TESTING (disk drive test) ", find in 788, the full content of above-mentioned U. S. application is incorporated into by the mode of introducing at this.
A plurality of embodiments have been described.Needless to say, will be understood that, under the situation of the spirit and scope that do not depart from present disclosure, can make various modifications.Therefore, other embodiments also within the scope of the appended claims.
Claims (30)
1. a memory device test macro (100) comprising:
At least one robots arm (200), described at least one robots arm (200) limits and the vertical substantially first axle (205) of floor surface (10), and described robots arm (200) can be operable to around described first axle (205) revolved predetermined arc and radially extend from described first axle (205);
A plurality of frames (300), described a plurality of frames (300) are arranged in described robots arm (200) on every side, and being used for provides service by described robots arm (200);
By a plurality of test trough (310) that each frame (300) is held, each test trough (310) all is configured to accommodate a memory device conveyer (550), and described memory device conveyer (550) is configured to carry the memory device (500) that will test; And
Transfer station (400), described transfer station (400) is arranged to provide service by described robots arm (200), described transfer station (400) comprises a plurality of storage tank holders (430), and each all is configured to accommodate a memory device storage tank (450) described a plurality of storage tank holders (430).
2. memory device test macro as claimed in claim 1 (100), wherein, described robots arm (200) comprises mechanical arm (212), described mechanical arm (212) is configured to engage with the memory device conveyer (550) of a described test trough (310), and described robots arm (200) can be operable to the memory device (500) in the described memory device conveyer (550) is transported to described test trough (310) to test.
3. each described memory device test macro (100) in the claim as described above, wherein, described robots arm (200) limits the working envelope body (210) of substantial cylindrical, described frame (300) and described transfer station (400) are arranged in the described working envelope body (210), be used for providing service by described robots arm (200), and preferably, described frame (300) and described transfer station (400) are arranged to partially enclosed at least polygon around the first axle (205) of described robots arm (200).
4. each described memory device test macro (100) in the claim as described above, wherein, described transfer station (400) can be operable to around limits by described transfer station (400), rotate with the vertical substantially longitudinal axis (415) of floor surface (10).
5. each described memory device test macro (100) in the claim as described above, wherein, described transfer station (400) comprises transfer station housing (410), described transfer station housing (410) limit opposing face to the first and second storage tank holders (430,430A, 430B).
6. each described memory device test macro (100) in the claim as described above, wherein, described transfer station (400) comprising:
The housing (410) of standing, described station housing (410) limits longitudinal axis (415); And
A plurality of storage tank receptacles (420), described a plurality of storage tank receptacles (420) are mounted to revolvably around described longitudinal axis (415) and rotate, each storage tank receptacle (420) all can be independent of other storage tank receptacle rotations, and limit opposing face to the first and second storage tank holders (430,430A, 430B).
7. each described memory device test macro (100) in the claim as described above, wherein, described robots arm (200) comes to provide service for each test trough (310) independently by transmitting described memory device (500) between the memory device storage tank (450) of accommodating at the quilt of described test trough (310) and described transfer station (400).
8. each described memory device test macro (100) in the claim as described above, wherein, memory device storage tank (450) comprises storage tank body (452A, 452B), described storage tank body (452A, 452B) limit a plurality of memory device holders (454A, 454B), (454A 454B) is configured to hold respectively memory device (500) to described a plurality of memory device holder.
9. memory device test macro as claimed in claim 8 (100), wherein, each memory device holder (454A, 454B) limit memory device support (456A, 456B), (456A 456B) is configured to support the middle body (502) of the memory device (500) of being accommodated to described memory device support, to allow operating described memory device (500) along non-middle body.
10. each described memory device test macro (100) in the claim as described above, wherein, memory device storage tank (450) comprising:
Storage tank body (452B), described storage tank body (452B) limits a plurality of column cavitys (453B); And
Be arranged in a plurality of cantilever-shaped memory device support (456B) of each column cavity (453B), described a plurality of cantilever-shaped memory device supports (456B) are divided into a plurality of memory device holders (454B) with described column cavity (453B), and each all is configured to accommodate a memory device (500) described a plurality of memory device holders (454B);
Wherein, each memory device support (456B) all is configured to support the middle body of the memory device (500) of being accommodated, to allow operating described memory device (500) along non-middle body.
11. the described memory device test macro of each in the claim (100) as described above further comprises:
At least one computing machine (320) of communicating by letter with described test trough (310);
Electric system (330), described electric system (330) are used for powering to described memory device test macro (100);
Temperature control system (340), described temperature control system (340) is used to control the temperature of each test trough (310);
Vibration control system (350), described vibration control system (350) is used to control frame vibration; And
The data-interface (360) of communicating by letter with each test trough (310), described data-interface (360) are configured to communicate by letter with the memory device (500) in the described memory device conveyer (550) of being accommodated by described test trough (310).
12. memory device test macro as claimed in claim 11 (100), wherein, the power of the memory device (500) that described electric system (330) is configured to monitor and/or regulate that the quilt in the described test trough (310) is accommodated.
13. as claim 11 or the described memory device test macro of claim 12 (100), wherein, described temperature control system (340) comprises fan blower (342), described fan blower (342) can be operable to ventilate and pass described test trough (310).
14. the described memory device test macro of each in the claim (100) as described above, wherein, each frame (300) comprises at least one self-testing system (600) of communicating by letter with at least one test trough (310), and described self-testing system (600) comprising:
Cluster control unit (610);
Connecting interface circuit (620), described connecting interface circuit (620) and memory device (500) telecommunication that is housed in the described test trough (310); And
With the piece interface circuit (630) of described connecting interface circuit (620) telecommunication, described interface circuit (630) is configured to control the power and the temperature of described test trough (310);
Wherein, described connecting interface circuit (620) and described interface circuit (630) at least one functions of components of being configured to test described memory device test macro (100).
15. the described memory device test macro of each in the claim (100) as described above, wherein, each frame (300) comprises at least one function test system (650) of communicating by letter with at least one test trough (310), and described function test system (650) comprising:
Cluster control unit (610);
At least one functional interface circuit (660), described at least one functional interface circuit (660) and described cluster control unit (610) telecommunication; And
Connecting interface circuit (620), described connecting interface circuit (620) and described at least one functional interface circuit (660) and be housed in memory device (500) telecommunication in the described test trough (310), wherein, described at least one functional interface circuit (660) is configured to the functional test routine is sent to described memory device (500).
16. memory device test macro as claimed in claim 15 (100), wherein, described function test system (650) further comprises communication switchboard (670), described communication switchboard (670) is preferably Ethernet switch, to provide telecommunication between described cluster control unit (610) and described at least one functional interface circuit (660).
17. the described memory device test macro of each in the claim (100) as described above, further comprise the vision system (270) that is positioned on the described robots arm (200), described vision system (270) helps guiding described robots arm (200) when transporting memory device (500), and by making described robots arm (200) aim at collimation mark (314), preferably aim at the collimation mark (314) in one of described frame (300) and/or the described transfer station (400) and calibrate described robots arm (200).
18. memory device storage tank (450,450A, 450B), described memory device storage tank comprises a plurality of memory device holder (454A of qualification, storage tank body (452A 454B), 452B), described a plurality of memory device holder (454A, 454B) be configured to hold respectively memory device (500), (454A 454B) all has memory device support (456A to each memory device holder, 456B), (456A 456B) is configured to support the middle body (502) of the memory device (500) of being accommodated to described memory device support, to allow operating described memory device (500) along non-middle body.
19. a memory device storage tank (450,450B), comprising:
Storage tank body (452B), described storage tank body (452B) limits a plurality of column cavitys (453B); And
Be arranged in a plurality of cantilever-shaped memory device support (456B) of each column cavity (453B), described a plurality of cantilever-shaped memory device supports (456B) are divided into a plurality of memory device holders (454B) with described column cavity (453B), and each all is configured to accommodate a memory device (500) described a plurality of memory device holders (454B);
Wherein, each memory device support (456B) all is configured to support the middle body of the memory device (500) of being accommodated, to allow operating described memory device (500) along non-middle body.
20. a method of carrying out the memory device test comprises:
With a plurality of memory devices (500) be loaded into by the memory device storage tank (450,450A, 450B) the memory device holder of Xian Dinging (454A, 454B) in;
(450,450A 450B) is loaded in the storage tank holder (430) that is limited by transfer station (400) with described memory device storage tank;
Activate robots arm (200) and take out memory device conveyer (550) with the test trough (310) from be contained in frame (300);
Activate described robots arm (200) taking out a described memory device (500) from described transfer station (400) and described memory device (500) is packed into the described memory device conveyer (550), described robots arm (200) can be operable to around limit by described robots arm (200), revolved predetermined arc with the vertical substantially first axle (205) of floor surface (10) and radially extended from described first axle (205);
Activate described robots arm (200) and be delivered to described test trough (310) with the described memory device conveyer (550) that will carry memory device (500);
Carry out functional test to described test trough (310) with by the memory device (500) that the memory device conveyer (550) of being accommodated holds; And
Activating described robots arm (200) carries the described memory device conveyer (550) of surveying memory device (500) and sends the described memory device (500) of having surveyed back to described transfer station (400) to take out from described test trough (310).
21. method as claimed in claim 20 further comprises: activate described robots arm (200) and be placed in the described test trough (310) with memory device conveyer (550) with sky.
22. as claim 20 or the described method of claim 21, wherein, the described memory device conveyer (550) that will carry memory device (500) is delivered to described test trough (310) and comprises: described memory device conveyer (550) is inserted in the test trough (310) in the described frame (300), is electrically connected thereby set up between described memory device (500) and described frame (300).
23. as each the described method among the claim 20-22, further comprise: the memory device storage tank (450 that the quilt in the described transfer station (400) is accommodated, 450A is 450B) in service position and can rotate between the test position by described robots arm (200) access.
24. as each the described method among the claim 20-23, wherein, memory device (500) is loaded into described memory device storage tank (450,450A, comprise 450B): described memory device (500) is placed on by described memory device storage tank (450,450A, storage tank body (452A 450B), 452B) memory device holder (the 454A of Xian Dinging, memory device support 454B) (456A, 456B) on, described memory device support (456A, 456B) be configured to support the middle body (502) of the memory device (500) of being accommodated, to allow operating described memory device (500) along non-middle body.
25. as each the described method among the claim 20-24, further comprise: activate described robots arm (200) so that will survey memory device (500) selectively and be delivered to the product that the return storage tank (450 that holds by described transfer station (400), 450A, 450B), when described when having surveyed memory device (500) successfully by functional test, described robots arm (200) is delivered to the qualified product storage tank (450 that returns with the described memory device (500) of having surveyed, 450A, memory device holder (454A 450B), 454B), and when surveying disc driver (500) and fail by functional test, described robots arm (200) is delivered to the defective product storage tank (430 that returns with the described memory device (500) of having surveyed, 430A, and memory device holder 430B) (454A, 454B).
26. as each the described method among the claim 20-25, wherein, the memory device (500) of being accommodated is carried out functional test to be comprised: when operation described memory device (500), particularly carry out to the data read of described memory device (500) and write fashionable, the temperature of regulating described test trough (310).
27. each the described method as among the claim 20-26 further comprises: ventilate and pass described test trough (310), to control the temperature of described test trough (310).
28. each the described method as among the claim 20-27 further comprises: monitor and/or regulate the power that the described memory device (500) in being housed in described test trough (310) provides.
29. each the described method as among the claim 20-28 further comprises: utilize the self-testing system of holding by described frame (300) (600) to come described test trough (310) is carried out self-test, to verify the functional of described test trough (310).
30. as each the described method among the claim 20-29, further comprise: communicate by letter with the vision system (270) on being positioned at described robots arm (200), when transporting described memory device (500), to help guiding described robots arm (200) and/or to calibrate described robots arm (200) by described robots arm (200) is aimed at the collimation mark (314) on the described frame (300).
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/US2009/040800 WO2010120302A1 (en) | 2009-04-16 | 2009-04-16 | Storage device testing |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102016610A true CN102016610A (en) | 2011-04-13 |
Family
ID=42982760
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009801023239A Pending CN102016610A (en) | 2009-04-16 | 2009-04-16 | Storage device testing |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP2012517655A (en) |
| KR (1) | KR20120013178A (en) |
| CN (1) | CN102016610A (en) |
| WO (1) | WO2010120302A1 (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107850622A (en) * | 2015-08-31 | 2018-03-27 | 泰拉丁公司 | Conductibility temperature control |
| CN109563457A (en) * | 2016-05-27 | 2019-04-02 | 生物梅里埃有限公司 | The system and method for sample container are transported between detecting instrument |
| CN113228845A (en) * | 2018-12-21 | 2021-08-06 | 迈康尼股份公司 | SMT supply storage unit |
| CN118393184A (en) * | 2024-06-25 | 2024-07-26 | 珠海博杰电子股份有限公司 | Safety regulation testing equipment and testing method |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017087306A (en) * | 2015-11-02 | 2017-05-25 | セイコーエプソン株式会社 | Robot and robot system |
| JP2019066399A (en) * | 2017-10-04 | 2019-04-25 | 三菱電機株式会社 | Semiconductor device classification system and semiconductor device |
| KR102624542B1 (en) * | 2018-09-04 | 2024-01-12 | 주식회사 아도반테스토 | Automated handling of different form factor devices under test in test cell |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5485436A (en) * | 1993-05-24 | 1996-01-16 | National Film Board Of Canada | System and method for accessing information on stored optical discs |
| JP2001023270A (en) * | 1999-07-09 | 2001-01-26 | Matsushita Electric Ind Co Ltd | Cassette transfer device |
| US7435046B2 (en) * | 2005-05-24 | 2008-10-14 | Aries Innovations | Dynamic carousel robotic workcell |
-
2009
- 2009-04-16 KR KR1020107013047A patent/KR20120013178A/en not_active Withdrawn
- 2009-04-16 JP JP2011550106A patent/JP2012517655A/en not_active Withdrawn
- 2009-04-16 WO PCT/US2009/040800 patent/WO2010120302A1/en active Application Filing
- 2009-04-16 CN CN2009801023239A patent/CN102016610A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107850622A (en) * | 2015-08-31 | 2018-03-27 | 泰拉丁公司 | Conductibility temperature control |
| CN109563457A (en) * | 2016-05-27 | 2019-04-02 | 生物梅里埃有限公司 | The system and method for sample container are transported between detecting instrument |
| CN113228845A (en) * | 2018-12-21 | 2021-08-06 | 迈康尼股份公司 | SMT supply storage unit |
| CN118393184A (en) * | 2024-06-25 | 2024-07-26 | 珠海博杰电子股份有限公司 | Safety regulation testing equipment and testing method |
| CN118393184B (en) * | 2024-06-25 | 2024-11-01 | 珠海博杰电子股份有限公司 | Safety regulation testing equipment and testing method |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20120013178A (en) | 2012-02-14 |
| JP2012517655A (en) | 2012-08-02 |
| WO2010120302A1 (en) | 2010-10-21 |
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Application publication date: 20110413 |