CN101847628A - display device - Google Patents
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- CN101847628A CN101847628A CN200910048490A CN200910048490A CN101847628A CN 101847628 A CN101847628 A CN 101847628A CN 200910048490 A CN200910048490 A CN 200910048490A CN 200910048490 A CN200910048490 A CN 200910048490A CN 101847628 A CN101847628 A CN 101847628A
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- 238000007689 inspection Methods 0.000 claims abstract description 26
- 229910000583 Nd alloy Inorganic materials 0.000 claims description 8
- 239000000463 material Substances 0.000 claims description 8
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 claims description 7
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 4
- LGQLWSVDRFRGCP-UHFFFAOYSA-N [Mo].[Nd] Chemical compound [Mo].[Nd] LGQLWSVDRFRGCP-UHFFFAOYSA-N 0.000 claims description 4
- 229910052782 aluminium Inorganic materials 0.000 claims description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 4
- UBSJOWMHLJZVDJ-UHFFFAOYSA-N aluminum neodymium Chemical compound [Al].[Nd] UBSJOWMHLJZVDJ-UHFFFAOYSA-N 0.000 claims description 4
- 229910052750 molybdenum Inorganic materials 0.000 claims description 4
- 239000011733 molybdenum Substances 0.000 claims description 4
- 230000003068 static effect Effects 0.000 abstract description 26
- 230000005611 electricity Effects 0.000 abstract description 24
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- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
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- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
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- 230000000007 visual effect Effects 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 description 1
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Abstract
本发明提供了一种显示装置,包括:由显示像素构成的有效显示部分,与有效显示部分电连接的信号线以及检查装置,所述检查装置包括间隔排放的短路棒,所述各短路棒分别与不同的信号线电连接,并且所述短路棒的一端具有测试衬垫,所述检查装置还包括分别与短路棒电连接的尖峰凸起,从而解决了由于静电引起的短路棒与信号线的连接位置的过孔区容易被烧毁的问题。
The present invention provides a display device, comprising: an effective display part composed of display pixels, a signal line electrically connected to the effective display part, and an inspection device, the inspection device includes short-circuit bars arranged at intervals, and each short-circuit bar is respectively It is electrically connected with different signal lines, and one end of the shorting bar has a test pad, and the inspection device also includes spike protrusions that are electrically connected with the shorting bar respectively, thereby solving the problem of the shorting bar and the signal line caused by static electricity. The problem that the via area at the connection position is easily burned.
Description
技术领域technical field
本发明涉及显示装置领域,特别涉及一种具有检查装置的显示装置。The invention relates to the field of display devices, in particular to a display device with an inspection device.
背景技术Background technique
显示装置具备轻薄、节能、无辐射等诸多优点,因此已经逐渐取代传统的阴极射线管(CRT)显示器。目前显示装置广泛应用于高清晰数字电视、台式计算机、个人数字助理(PDA)、笔记本电脑、移动电话、数码相机等电子设备中。The display device has many advantages such as light and thin, energy saving, and no radiation, so it has gradually replaced the traditional cathode ray tube (CRT) display. Currently, display devices are widely used in electronic equipment such as high-definition digital televisions, desktop computers, personal digital assistants (PDAs), notebook computers, mobile phones, and digital cameras.
显示装置具有矩阵状的显示像素构成的有效显示部分。该有效显示部分具有沿显示像素的行方向延伸的多条扫描线和沿显示像素的列方向延伸的多条数据线。在扫描线和数据线相交叉的地方设置开关元件,例如薄膜晶体管(TFT),以及与开关元件连接的像素电极等。各扫描线和数据线引出到有效显示部分的外围部分,例如将引出的扫描线和数据线与驱动电路电连接。这些扫描线、数据线以及其它的电路连接线统称为信号线。The display device has an effective display portion composed of display pixels in a matrix. The effective display portion has a plurality of scan lines extending in a row direction of display pixels and a plurality of data lines extending in a column direction of display pixels. A switch element, such as a thin film transistor (TFT), and a pixel electrode connected to the switch element are arranged at the intersection of the scan line and the data line. Each scanning line and data line is led out to the peripheral part of the effective display part, for example, the drawn-out scanning line and data line are electrically connected to the driving circuit. These scan lines, data lines and other circuit connection lines are collectively referred to as signal lines.
由于随着显示像素的增加,在有效显示部分及其外围部分的扫描线和数据线等各种信号线的线宽越来越细,而且间隔越来越小,因此断线、短路等各种布线不良的情况也越来越多,因此为了及时发现布线不良的情况,防止大规模不良发生以及不良品流入下一工序造成浪费,在布线之后需要对扫描线、数据线及其它的信号线进行检查,从而判断是否存在布线不良的情况。As the number of display pixels increases, the line widths of various signal lines such as scanning lines and data lines in the effective display part and its peripheral parts become thinner and the intervals become smaller and smaller, so various disconnections, short circuits, etc. There are more and more cases of poor wiring. Therefore, in order to detect poor wiring in time, prevent large-scale defects from occurring and waste of defective products flowing into the next process, scanning lines, data lines and other signal lines need to be checked after wiring. Check to determine whether there is a bad wiring.
如图1所示的一种设置检查装置的显示装置的结构示意图,有效显示部分11通过信号线1005与外围驱动电路(图未示)相连,所述信号线1005连接有检查装置20。所述检查装置20由4根短路棒(shorting bar)1001、1002、1003、1004构成,各短路棒1001、1002、1003、1004分别与信号线1005-1、1005-2、1005-3相连,所述信号线可以是扫描线、数据线或者其它信号线。各短路棒1001、1002、1003、1004与信号线1005-1、1005-2、1005-3的连接位置为过孔区。所述过孔区具有接触孔1000和连接导电层1006,部分连接导电层1006填充在接触孔1000内用于将短路棒和信号线相电连接,连接导电层1006一般为氧化铟锡(ITO)或者氧化铟锌(IZO)层。在短路棒的一端连接有测试衬垫(visual test pad)1007,通过给测试衬垫1007加上电压信号,就能进行电性测试。图2为图1所示的显示装置的有效显示部分和检查装置连接位置的放大图,其中虚线框10a所示的为短路棒与信号线的连接位置的过孔区。As shown in FIG. 1 , a schematic structural diagram of a display device provided with an inspection device, the effective display part 11 is connected to a peripheral driving circuit (not shown) through a
由于在制造过程中,容易产生静电,从而容易因为静电引起过孔区的被烧毁。图3为图2所示的显示装置中过孔区被烧毁部位的放大图,其中虚线框10b所示为被烧毁部位。尤其因为静电电荷容易聚集在过孔区,因此在过孔区容易产生较大的静电从而使接触孔被烧毁。通常,由于整个图1的结构表面被一层或者两层透明的绝缘层覆盖(图中未标出),一般为氮化硅或氧化硅。如果在制造工艺过程中,例如制盒工序的取向膜涂布以及取向膜摩擦工序,由于静电过大,会将过孔区的连接导电层1006烧毁,导致接触孔被烧毁,从而电性测试不能进行,就会出现不良现象。Since static electricity is easily generated during the manufacturing process, it is easy to burn the via area due to static electricity. FIG. 3 is an enlarged view of the burnt part of the via hole area in the display device shown in FIG. 2 , where the
发明内容Contents of the invention
本发明的目的是提供一种显示装置,从而解决由于静电引起的过孔区容易被烧毁的问题。The purpose of the present invention is to provide a display device so as to solve the problem that the via area is easily burned due to static electricity.
本发明提供的一种显示装置,包括:由显示像素构成的有效显示部分,与有效显示部分电连接的信号线以及检查装置,所述检查装置包括间隔排放的短路棒;所述各短路棒分别通过过孔区与不同的信号线电连接,并且所述短路棒的一端具有测试衬垫,所述检查装置还包括与短路棒电连接的尖峰凸起。A display device provided by the present invention includes: an effective display part composed of display pixels, a signal line electrically connected to the effective display part, and an inspection device, wherein the inspection device includes short-circuit bars arranged at intervals; the short-circuit bars are respectively The via area is electrically connected to different signal lines, and one end of the shorting bar has a test pad, and the inspection device also includes a spike protrusion electrically connected to the shorting bar.
优选的,所述尖峰凸起位于所述短路棒的不具有测试衬垫的一端。Preferably, the peak protrusion is located at one end of the shorting bar without a test pad.
优选的,同一所述短路棒的不具有测试衬垫的一端具有一个所述尖峰凸起。Preferably, one end of the same short-circuit bar without the test liner has one sharp protrusion.
优选的,连接不同信号线的所述短路棒的不具有测试衬垫的一端的尖峰凸起的尖端相对。Preferably, the tips of the spikes at the end without the test pad of the short-circuit bar connected to different signal lines are opposite to each other.
优选的,所述尖峰凸起位于所述短路棒的测试衬垫上。Preferably, the spiked protrusion is located on the test pad of the shorting bar.
优选的,连接不同信号线的所述短路棒的测试衬垫上的尖峰凸起的尖端相对。Preferably, the tips of the spikes on the test pads of the shorting bars connected to different signal lines are opposite to each other.
优选的,在所述短路棒的测试衬垫上具有所述尖峰凸起。Preferably, the test pads of the shorting bars have the spiked protrusions.
优选的,连接不同信号线的所述短路棒的不具有测试衬垫的一端的尖峰凸起的尖端相对。Preferably, the tips of the spikes at the end without the test pad of the short-circuit bar connected to different signal lines are opposite to each other.
优选的,连接不同信号线的所述短路棒的测试衬垫上的尖峰凸起的尖端相对。Preferably, the tips of the spikes on the test pads of the shorting bars connected to different signal lines are opposite to each other.
优选的,连接不同信号线的所述短路棒的测试衬垫上的尖峰凸起的尖端相对。Preferably, the tips of the spikes on the test pads of the shorting bars connected to different signal lines are opposite to each other.
优选的,所述尖峰凸起位于所述过孔区旁。Preferably, the peak protrusion is located next to the via area.
优选的,在所述短路棒靠近相邻的两侧短路棒的侧面上分别具有所述尖峰凸起,并且相邻的短路棒上的尖峰凸起的尖端相对。Preferably, the side surfaces of the shorting bars close to the adjacent shorting bars on both sides have the peak protrusions respectively, and the tips of the peak protrusions on the adjacent shorting bars are opposite to each other.
优选的,所述尖峰凸起的尖部为角状或锥状。Preferably, the tip of the peak protrusion is horn-shaped or cone-shaped.
优选的,所述短路棒与所述尖峰凸起位于同一层。Preferably, the shorting bar and the peak protrusion are located on the same layer.
优选的,所述尖峰凸起的材料为铝、铝钕合金、钼、钼钕合金中的一种或者多种。Preferably, the materials of the peak protrusions are one or more of aluminum, aluminum neodymium alloy, molybdenum, and molybdenum neodymium alloy.
优选的,所述尖峰凸起的材料为氧化铟锡。Preferably, the material of the peak protrusions is indium tin oxide.
优选的,所述信号线靠近相邻的两侧信号线的侧面上均设置有所述尖峰凸起,且相邻的所述信号线上的所述尖峰凸起均相对设置。Preferably, the side surfaces of the signal lines close to the adjacent signal lines on both sides are provided with the peak protrusions, and the peak protrusions on the adjacent signal lines are oppositely arranged.
优选的,所述尖峰凸起的相对侧另外设置有一附属尖端区,所述附属尖端区位于所述有效显示部分外,且具有一个或者多个尖端与所述尖峰凸起相对应。Preferably, an auxiliary pointed area is additionally provided on the opposite side of the peaked protrusion, the auxiliary pointed area is located outside the effective display part, and has one or more pointed points corresponding to the pointed protrusion.
优选的,所述附属尖端区设置在公共电极上。Preferably, the auxiliary tip region is arranged on the common electrode.
优选的,所述信号线与所述尖峰凸起位于同一层。Preferably, the signal lines and the spikes are located on the same layer.
优选的,所述过孔区旁的尖峰凸起为与短路棒连接的信号线向该短路棒外侧的延伸部分。Preferably, the peak protrusion next to the via hole area is an extension of the signal line connected to the shorting bar to the outside of the shorting bar.
优选的,在所述过孔区旁还具有与所述短路棒位于同一层的尖峰凸起,与信号线位于同一层的尖峰凸起和与短路棒位于同一层的尖峰凸起的尖端相对。Preferably, beside the via hole area, there are also sharp protrusions on the same layer as the shorting bar, opposite to the sharp peaks on the same layer as the signal line and the sharp peaks on the same layer as the shorting bar.
优选的,所述尖峰凸起的尖部为角状或锥状。Preferably, the tip of the peak protrusion is horn-shaped or cone-shaped.
本发明的显示装置具有检查装置,所述检查装置包括间隔排放的短路棒;所述各短路棒分别通过过孔区与不同的信号线电连接,并且所述短路棒的一端具有测试衬垫,所述检查装置还包括:与短路棒电连接的尖峰凸起。。在制造过程中,一旦静电过大,过孔区积累的电荷就会立即往尖峰凸起移动,在尖峰凸起尖端形成尖端放电,大大降低了静电对过孔的损坏,使得电性测试正常进行,因此和现有技术相比本发明降低了由于静电引起过孔区容易被烧毁的可能性。The display device of the present invention has an inspection device, the inspection device includes short-circuit bars arranged at intervals; each of the short-circuit bars is electrically connected to different signal lines through the via hole area, and one end of the short-circuit bars has a test pad, The inspection device also includes: a spike protrusion electrically connected with the shorting bar. . During the manufacturing process, once the static electricity is too large, the accumulated charges in the via area will immediately move to the peaks, forming a sharp discharge at the tip of the peaks, which greatly reduces the damage to the vias caused by static electricity, so that the electrical test can be carried out normally. Therefore, compared with the prior art, the present invention reduces the possibility that the via area is easily burned due to static electricity.
附图说明Description of drawings
通过附图中所示的本发明的优选实施例的更具体说明,本发明的上述及其它目的、特征和优势将更加清晰。在全部附图中相同的附图标记指示相同的部分。并未刻意按实际尺寸等比例缩放绘制附图,重点在于示出本发明的主旨。The above and other objects, features and advantages of the present invention will be more apparent by a more specific description of preferred embodiments of the present invention shown in the accompanying drawings. Like reference numerals designate like parts throughout the drawings. The drawings are not intentionally scaled according to the actual size, and the emphasis is on illustrating the gist of the present invention.
图1为一种现有的设置检查装置的显示装置的结构示意图;Fig. 1 is a structural schematic diagram of an existing display device provided with an inspection device;
图2为图1所示的显示装置的有效显示部分和检查装置连接位置的放大图;Fig. 2 is an enlarged view of the effective display part of the display device shown in Fig. 1 and the connection position of the inspection device;
图3为图2所示的显示装置中过孔区被烧毁部位的放大图;FIG. 3 is an enlarged view of the burnt part of the via area in the display device shown in FIG. 2;
图4为本发明的显示装置实施例一的结构示意图;FIG. 4 is a schematic structural diagram of Embodiment 1 of a display device of the present invention;
图5为本发明的显示装置实施例二中检测装置及信号线的结构示意图;5 is a schematic structural diagram of a detection device and a signal line in Embodiment 2 of a display device of the present invention;
图6为本发明的显示装置实施例三中检测装置及信号线的结构示意图;6 is a schematic structural diagram of a detection device and a signal line in Embodiment 3 of a display device of the present invention;
图7为本发明的显示装置实施例四中检测装置及信号线的结构示意图;7 is a schematic structural diagram of a detection device and a signal line in Embodiment 4 of a display device of the present invention;
图8为本发明的显示装置实施例五中检测装置及信号线的结构示意图;8 is a schematic structural diagram of a detection device and a signal line in Embodiment 5 of a display device of the present invention;
图9为本发明的显示装置实施例六中检测装置及信号线的结构示意图;9 is a schematic structural diagram of a detection device and a signal line in Embodiment 6 of a display device of the present invention;
图10为本发明的显示装置实施例七中检测装置及信号线的结构示意图;10 is a schematic structural diagram of a detection device and a signal line in Embodiment 7 of a display device of the present invention;
图11为本发明的显示装置实施例八中检测装置及信号线的结构示意图;11 is a schematic structural diagram of a detection device and a signal line in Embodiment 8 of a display device of the present invention;
图12为本发明的显示装置实施例九中检测装置及信号线的结构示意图;12 is a schematic structural diagram of a detection device and a signal line in Embodiment 9 of a display device of the present invention;
图13为本发明的显示装置实施例十中检测装置及信号线的结构示意图;13 is a schematic structural diagram of a detection device and a signal line in
图14为本发明的显示装置实施例十一中检测装置及信号线的结构示意图。FIG. 14 is a schematic structural diagram of a detection device and a signal line in Embodiment 11 of a display device of the present invention.
具体实施方式Detailed ways
为使本发明的上述目的、特征和优点能够更加明显易懂,下面结合附图对本发明的具体实施方式做详细的说明。In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings.
在下面的描述中阐述了很多具体细节以便于充分理解本发明。但是本发明能够以很多不同于在此描述的其它方式来实施,本领域技术人员可以在不违背本发明内涵的情况下做类似推广,因此本发明不受下面公开的具体实施例的限制。In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar extensions without violating the connotation of the present invention, so the present invention is not limited by the specific embodiments disclosed below.
其次,本发明利用示意图进行详细描述,在详述本发明实施例时,为便于说明,表示器件结构的剖面图会不依一般比例作局部放大,而且所述示意图只是实例,其在此不应限制本发明保护的范围。此外,在实际制作中应包含长度、宽度及深度的三维空间尺寸。Secondly, the present invention is described in detail using schematic diagrams. When describing the embodiments of the present invention in detail, for the convenience of explanation, the cross-sectional view showing the device structure will not be partially enlarged according to the general scale, and the schematic diagram is only an example, and it should not be limited here. The protection scope of the present invention. In addition, the three-dimensional space dimensions of length, width and depth should be included in actual production.
本发明提供的一种显示装置,包括:由显示像素构成的有效显示部分,与有效显示部分电连接的信号线以及检查装置,所述检查装置包括间隔排放的短路棒;所述各短路棒分别通过过孔区与不同的信号线电连接,并且所述短路棒的一端具有测试衬垫,所述检查装置还包括与短路棒电连接的尖峰凸起。A display device provided by the present invention includes: an effective display part composed of display pixels, a signal line electrically connected to the effective display part, and an inspection device, wherein the inspection device includes short-circuit bars arranged at intervals; the short-circuit bars are respectively The via area is electrically connected to different signal lines, and one end of the shorting bar has a test pad, and the inspection device also includes a spike protrusion electrically connected to the shorting bar.
优选的,所述尖峰凸起位于所述短路棒的不具有测试衬垫的一端。Preferably, the peak protrusion is located at one end of the shorting bar without a test pad.
优选的,同一根所述短路棒的不具有测试衬垫的一端具有一个所述尖峰凸起。Preferably, one end of the same shorting bar without the test liner has one sharp protrusion.
优选的,连接不同信号线的所述短路棒的不具有测试衬垫的一端的尖峰凸起的尖端相对。Preferably, the tips of the spikes at the end without the test pad of the short-circuit bar connected to different signal lines are opposite to each other.
优选的,所述尖峰凸起位于所述短路棒的测试衬垫上。Preferably, the spiked protrusion is located on the test pad of the shorting bar.
优选的,连接不同信号线的所述短路棒的测试衬垫上的尖峰凸起的尖端相对。Preferably, the tips of the spikes on the test pads of the shorting bars connected to different signal lines are opposite to each other.
优选的,在所述短路棒的测试衬垫上具有所述尖峰凸起。Preferably, the test pads of the shorting bars have the spiked protrusions.
优选的,连接不同信号线的所述短路棒的不具有测试衬垫的一端的尖峰凸起的尖端相对。Preferably, the tips of the spikes at the end without the test pad of the short-circuit bar connected to different signal lines are opposite to each other.
优选的,连接不同信号线的所述短路棒的测试衬垫上的尖峰凸起的尖端相对。Preferably, the tips of the spikes on the test pads of the shorting bars connected to different signal lines are opposite to each other.
优选的,连接不同信号线的所述短路棒的测试衬垫上的尖峰凸起的尖端相对。Preferably, the tips of the spikes on the test pads of the shorting bars connected to different signal lines are opposite to each other.
优选的,所述尖峰凸起位于所述过孔区旁。Preferably, the peak protrusion is located next to the via area.
优选的,在所述短路棒靠近相邻的两侧短路棒的侧面上分别具有所述尖峰凸起,并且相邻的短路棒上的尖峰凸起的尖端相对。Preferably, the side surfaces of the shorting bars close to the adjacent shorting bars on both sides have the peak protrusions respectively, and the tips of the peak protrusions on the adjacent shorting bars are opposite to each other.
优选的,所述尖峰凸起的尖部为角状或锥状。Preferably, the tip of the peak protrusion is horn-shaped or cone-shaped.
优选的,所述短路棒与所述尖峰凸起位于同一层。Preferably, the shorting bar and the peak protrusion are located on the same layer.
优选的,所述尖峰凸起的材料为铝、铝钕合金、氧化铟锡、钼、钼钕合金中的一种或者多种。Preferably, the material of the peak protrusions is one or more of aluminum, aluminum neodymium alloy, indium tin oxide, molybdenum, and molybdenum neodymium alloy.
优选的,所述尖峰凸起的材料为氧化铟锡。Preferably, the material of the peak protrusions is indium tin oxide.
优选的,所述信号线靠近相邻的两侧信号线的侧面上均设置有所述尖峰凸起,且相邻的所述信号线上的所述尖峰凸起均相对设置。Preferably, the side surfaces of the signal lines close to the adjacent signal lines on both sides are provided with the peak protrusions, and the peak protrusions on the adjacent signal lines are oppositely arranged.
优选的,所述尖峰凸起的相对侧另外设置有一附属尖端区,所述附属尖端区位于所述有效显示部分外,且具有一个或者多个尖端与所述尖峰凸起相对应。Preferably, an auxiliary pointed area is additionally provided on the opposite side of the peaked protrusion, the auxiliary pointed area is located outside the effective display part, and has one or more pointed points corresponding to the pointed protrusion.
优选的,所述附属尖端区设置在公共电极上。Preferably, the auxiliary tip region is arranged on the common electrode.
优选的,所述信号线与所述尖峰凸起位于同一层。Preferably, the signal lines and the spikes are located on the same layer.
优选的,所述过孔区旁的尖峰凸起为与短路棒连接的信号线向该短路棒外侧的延伸部分。Preferably, the peak protrusion next to the via hole area is an extension of the signal line connected to the shorting bar to the outside of the shorting bar.
优选的,在所述过孔区旁还具有与所述短路棒位于同一层的尖峰凸起,与信号线位于同一层的尖峰凸起和与短路棒位于同一层的尖峰凸起的尖端相对。Preferably, beside the via hole area, there are also sharp protrusions on the same layer as the shorting bar, opposite to the sharp peaks on the same layer as the signal line and the sharp peaks on the same layer as the shorting bar.
优选的,所述尖峰凸起的尖部为角状或锥状。Preferably, the tip of the peak protrusion is horn-shaped or cone-shaped.
在制造过程中一旦静电过大,在短路棒上以及短路棒与信号线的连接部位,例如过孔区处积累的电荷就会立即往尖峰凸起移动,在尖峰凸起尖端形成尖端放电,大大降低了静电对过孔的损坏,使得电性测试正常进行,因此和现有技术相比本发明降低了由于静电引起的过孔区被烧毁的可能性。Once the static electricity is too large in the manufacturing process, the charge accumulated on the shorting bar and the connection part between the shorting bar and the signal line, such as the via hole area, will immediately move to the peak protrusion, forming a tip discharge at the tip of the peak protrusion, greatly The damage to the via hole caused by static electricity is reduced, so that the electrical test can be carried out normally. Therefore, compared with the prior art, the present invention reduces the possibility of the via hole region being burned due to static electricity.
实施例一Embodiment one
图4为本发明的显示装置实施例一的结构示意图。下面结合图4对本发明的显示装置进行说明。FIG. 4 is a schematic structural diagram of Embodiment 1 of a display device of the present invention. The display device of the present invention will be described below with reference to FIG. 4 .
本实施例中显示装置包括:显示像素构成的有效显示部分10;与有效显示部分10电连接的信号线1005和检查装置20,其中信号线1005可以为数据线、扫描线、栅极线等连接线,具体地,在本实施例子中以数据线为例进行介绍。In this embodiment, the display device includes: an
如图4所示,所述检查装置20包括间隔排放的短路棒,例如图4示出了4根短路棒分别为短路棒101-104,短路棒101-103分别与数据线1005-1、1005-2、1005-3通过过孔区电连接,短路棒104和栅极线或者扫描线(图中未标出)通过过孔区电连接。其中,过孔区具有接触孔106和连接导电层107,部分连接导电层107填充在接触孔106内用于将短路棒和信号线相电连接。在短路棒101-104的一端具有用于电性测试的测试衬垫109,在本实施方式中,测试衬垫109可以为方块形状。其中所述测试衬垫109的宽度大于所述短路棒104的宽度,以便于电性测试。当然,所述测试衬垫的形状可以为圆形、梯形、五边形、六边形等其他任意可等同的形状。As shown in FIG. 4, the
在本发明的某些其他的具体实施方式中,所述信号线上还可具有开关元件以便在检查装置检测完成后将信号线与短路棒断开。但优选地,本实施方式中信号线上不具有开关元件。这主要是因为,如果在所述信号线上制造所述开关元件,则在制造工艺过程中,可能会造成电荷在所述开关元件区或者所述过孔区的大量积聚,从而使得所述开关元件或者所述过孔区烧毁,造成所述信号线与所述短路棒不能电连接,最终影响电性测试。In some other specific embodiments of the present invention, the signal line may also have a switch element so as to disconnect the signal line from the shorting bar after the detection by the inspection device is completed. But preferably, there is no switching element on the signal line in this embodiment. This is mainly because, if the switch element is manufactured on the signal line, a large amount of charge may be accumulated in the switch element region or the via hole region during the manufacturing process, so that the switch The component or the via area is burned, causing the signal line and the short-circuit bar to be electrically disconnected, which ultimately affects the electrical test.
所述检查装置20还包括与短路棒101-104电连接的尖峰凸起108。The
优选的,尖峰凸起108位于短路棒101-104的不具有测试衬垫109的一端。Preferably, the
优选地,本发明的所述短路棒101-104可以位于同一层中,也可以位于不同层中。具体地,当所述短路棒位于同一层时,所述短路棒可以与扫描线或者数据线一同制造,并与所述扫描线或者数据线位于同一层;当所述短路棒位于不同层时,其中部分短路棒可以与数据线一同制造,并与所述数据线位于同一层中,其余部分短路棒可以与扫描线一同制造,并与扫描线位于同一层中。但是,当所述短路棒位于不同层时,在形成所述短路棒与所述信号线的过孔区时工艺较复杂,因此最佳地,在本实施方式中所述短路棒在同一层中。Preferably, the shorting bars 101-104 of the present invention may be located in the same layer or in different layers. Specifically, when the shorting bar is located on the same layer, the shorting bar can be manufactured together with the scanning line or data line, and is located on the same layer as the scanning line or data line; when the shorting bar is located on a different layer, Some of the shorting bars can be manufactured together with the data lines and located in the same layer as the data lines, and the rest of the shorting bars can be manufactured together with the scanning lines and located in the same layer as the scanning lines. However, when the shorting bar is located in a different layer, the process of forming the via area of the shorting bar and the signal line is relatively complicated, so it is best that the shorting bar is in the same layer in this embodiment .
优选的,尖峰凸起108和短路棒101-104位于同一层。具体的,尖峰凸起108为短路棒101-104的延伸部分,也就是将短路棒101-104的一端设计成角状或锥状的尖峰凸起108。当然,在其他的实施例中,尖峰凸起108也可以和短路棒位于不同层。Preferably, the
优选地,所述每一短路棒101-104均仅有一个尖端为角状或锥状尖峰凸起。这是因为,在每一短路棒101-104均仅有一个尖峰凸起相较于同一短路棒的尖端具有多个角状或锥状的尖峰凸起可以降低制程精度;而且短路棒不需要做的太宽,特别适合于现在的面板设计中的高密度排版;而且可以提高玻璃的利用率;同时这样设置使得在制作过程中对曝光掩模板的图形精度要求不高。Preferably, each of the shorting bars 101-104 has only one tip that is horn-shaped or cone-shaped. This is because there is only one spike on each shorting bar 101-104 compared to having multiple angular or conical peaks at the tip of the same shorting bar can reduce process accuracy; and the shorting bar does not need to be made It is too wide, which is especially suitable for high-density typesetting in current panel designs; and it can improve the utilization rate of glass; at the same time, this setting makes it less demanding on the graphic accuracy of the exposure mask during the production process.
优选的,尖峰凸起的尖端部位没有绝缘层,也或是尖端部分的绝缘层在制造过程中被刻蚀掉,这样可进一步提高放电的效率,降低过孔区被烧毁的风险。Preferably, there is no insulating layer at the tip of the peak protrusion, or the insulating layer at the tip is etched away during the manufacturing process, which can further improve the discharge efficiency and reduce the risk of burning the via area.
如图4所示,尖峰凸起108直接暴露在空气中,因此一旦制造过程中静电过大,在短路棒101-104上以及接触孔106处积累的电荷就会立即往尖峰凸起108部位移动,在其尖端直接对空气放电,大大降低了静电对过孔区,尤其是接触孔106的损坏,使得电性测试正常进行。As shown in FIG. 4, the
此外,在本发明中,还可以在所述尖峰凸起108的相对侧另外设置有一附属尖端区(图未示),所述附属尖端区位于所述有效显示部分外,且具有一个或者多个尖端与所述尖峰凸起108相对应,以利于尖端对尖端放电,增强放电效果。所述附属尖端区不与短路棒电连接,且优选地,所述附属尖端区可以设置在公共电极上(图未示)。In addition, in the present invention, an auxiliary pointed area (not shown) may be additionally provided on the opposite side of the
实施例二Embodiment two
图5为本发明的显示装置实施例二中检测装置及信号线的结构示意图。下面结合图5所示的检测装置及信号线的结构,对本发明的显示装置进行说明。FIG. 5 is a schematic structural diagram of a detection device and a signal line in Embodiment 2 of a display device of the present invention. The display device of the present invention will be described below in conjunction with the structure of the detection device and the signal line shown in FIG. 5 .
第二实施例和第一实施例的相同部分不再赘述,在本实施方式中:The same parts of the second embodiment and the first embodiment will not be repeated, in this embodiment:
如图5所示,在短路棒201-204不具有测试衬垫209的一端没有尖峰凸起,而在测试衬垫209上具有尖峰凸起100。As shown in FIG. 5 , there are no spikes at the ends of the shorting bars 201 - 204 that do not have the
优选的,尖峰凸起100和测试衬垫209位于同一层。具体的,尖峰凸起100为测试衬垫209的延伸部分,也就是将测试衬垫209的一端设计成角状或锥状的尖峰凸起100。当然,在其他的实施例中,尖峰凸起100也可以和测试衬垫209位于不同层。Preferably, the
实施例三Embodiment three
图6为本发明的显示装置实施例三中检测装置及信号线的结构示意图。下面结合图6所示的检测装置及信号线的结构,对本发明的显示装置进行说明。FIG. 6 is a schematic structural diagram of a detection device and a signal line in Embodiment 3 of a display device of the present invention. The display device of the present invention will be described below in conjunction with the structure of the detection device and the signal line shown in FIG. 6 .
第三实施例和第一实施例的相同部分不再赘述,在本实施方式中:The same parts of the third embodiment and the first embodiment will not be repeated, in this embodiment:
如图6所示,不仅在短路棒301-304不具有测试衬垫309的一端具有尖峰凸起,另外在测试衬垫309上也具有尖峰凸起300。由于短路棒两端均有尖峰凸起,静电荷可以快速向两尖峰凸起端移动,大大降低了过孔区被烧毁的风险。As shown in FIG. 6 , not only the ends of the shorting bars 301 - 304 without the
优选的,同一根所述短路棒的不具有测试衬垫的一端具有一个所述尖峰凸起。Preferably, one end of the same shorting bar without the test liner has one sharp protrusion.
优选的,尖峰凸起300和测试衬垫309位于同一层,具体的,尖峰凸起300为测试衬垫309的延伸部分,也就是将测试衬垫309的一端设计成尖部为角状或锥状的尖峰凸起300。当然,在其他的实施例中,尖峰凸起300也可以和测试衬垫309位于不同层。Preferably, the
实施例四Embodiment four
图7为本发明的显示装置实施例四中检测装置及信号线的结构示意图。下面结合图7所示的检测装置及信号线的结构,对本发明的显示装置进行说明。FIG. 7 is a schematic structural diagram of a detection device and a signal line in Embodiment 4 of a display device of the present invention. The display device of the present invention will be described below in conjunction with the structure of the detection device and the signal line shown in FIG. 7 .
第四实施例和第一实施例的相同部分不再赘述,在本实施方式中:The same parts of the fourth embodiment and the first embodiment will not be repeated. In this embodiment:
如图7所示,短路棒401-404不具有测试衬垫409的一端具有尖峰凸起408。并且,位于连接不同信号线的短路棒上的尖峰凸起408的尖端相对设置。其中,所述尖峰凸起可以位于同一层中也可以位于不同层中。当所述尖峰凸起位于不同层时,所述尖峰凸起之间除了相对设置外,还可允许有部分交叠。As shown in FIG. 7 , the ends of the shorting bars 401 - 404 without the test pad 409 have spiked protrusions 408 . Moreover, the pointed ends of the peak protrusions 408 on the shorting bars connected to different signal lines are oppositely arranged. Wherein, the peak protrusions may be located in the same layer or in different layers. When the peaks are located on different layers, in addition to being oppositely arranged, partial overlap is allowed between the peaks.
优选的,同一根所述短路棒的不具有测试衬垫的一端具有一个所述尖峰凸起。Preferably, one end of the same shorting bar without the test liner has one sharp protrusion.
当然,在其他的实施例中,也可以尖峰凸起408中的两个或者三个形成尖端与尖端相对的结构,例如尖峰凸起408-1、408-3的尖端相对设置,尖峰凸起408-1、408-2、408-3的尖端相对设置。Of course, in other embodiments, two or three of the peak protrusions 408 may also form a structure in which the tips are opposite to each other. The tips of -1, 408-2, 408-3 are set relative to each other.
具体的,在尖峰凸起408表面可以没有绝缘层,从而提高了放电的效率,降低了静电对过孔区的损坏。Specifically, there may be no insulating layer on the surface of the peak protrusion 408, thereby improving the discharge efficiency and reducing damage to the via area by static electricity.
如图7所示,因为尖峰凸起408的尖端相对设置,因此制造过程中即使静电过大,在短路棒401-404上以及过孔区处积累的电荷都会立即往尖峰凸起408部位移动,因此使得尖端对尖端放电,大大降低了静电对过孔区的损坏,使得电性测试正常进行。As shown in FIG. 7 , because the tips of the peak protrusions 408 are arranged oppositely, even if the static electricity is too large during the manufacturing process, the charges accumulated on the shorting bars 401-404 and the via area will immediately move to the peak protrusions 408, Therefore, the tip-to-tip discharge is made, which greatly reduces the damage to the via area caused by static electricity, so that the electrical test can be carried out normally.
实施例五Embodiment five
图8为本发明的显示装置实施例五中检测装置及信号线的结构示意图。下面结合图8所示的检测装置及信号线的结构,对本发明的显示装置进行说明。FIG. 8 is a schematic structural diagram of a detection device and a signal line in Embodiment 5 of a display device of the present invention. The display device of the present invention will be described below in conjunction with the structure of the detection device and the signal line shown in FIG. 8 .
第五实施例和第四实施例的相同部分不再赘述,在本实施方式中:The same parts of the fifth embodiment and the fourth embodiment will not be repeated. In this embodiment:
在短路棒501-504的一端具有用来电性测试的测试衬垫509,并且测试衬垫509上具有尖峰凸起500。There are test pads 509 at one end of the shorting bars 501-504 for electrical testing, and the test pads 509 have sharp protrusions 500 thereon.
优选的,同一根所述短路棒的不具有测试衬垫的一端具有一个所述尖峰凸起。Preferably, one end of the same shorting bar without the test liner has one sharp protrusion.
由于在短路棒的不具有测试衬垫一端,以及测试衬垫上都设置尖峰凸起,因此静电荷可以快速向两端尖峰凸起端移动,大大降低了过孔区被烧毁的风险。Since the short-circuit bar has no test pads at one end and the test pads are provided with spikes, the electrostatic charge can quickly move to the spikes at both ends, which greatly reduces the risk of burning the via area.
实施例六Embodiment six
图9为本发明的显示装置实施例六中检测装置及信号线的结构示意图。下面结合图9所示的检测装置及信号线的结构,对本发明的显示装置进行说明。FIG. 9 is a schematic structural diagram of a detection device and a signal line in Embodiment 6 of a display device of the present invention. The display device of the present invention will be described below in conjunction with the structure of the detection device and the signal line shown in FIG. 9 .
第六实施例和第五实施例的相同部分不再赘述,在本实施方式中:The same parts of the sixth embodiment and the fifth embodiment will not be repeated. In this embodiment:
在短路棒601-604的一端具有用来电性测试的测试衬垫609,并且测试衬垫609上具有尖峰凸起600,具体的将测试衬垫609的一端设计成尖部为角状或锥状的尖峰凸起600。并且,连接不同信号线的短路棒上的所述各尖峰凸起600的尖端也相对设置,例如尖峰凸起609-1,609-2,609-3,609-4相对设置,也可以其中的两个或3个尖峰凸起相对设置。One end of the shorting bars 601-604 has a
当然,在其他的实施例中,也可以仅将测试衬垫上的尖峰凸起尖端相对设置,而短路棒的不具有测试衬垫409一端不设置尖端相对的尖峰凸起,或者不设置尖峰凸起。Of course, in other embodiments, it is also possible to only set the peaks on the test liner opposite to each other, and the end of the shorting bar not having the test liner 409 is not provided with the peaks opposite to each other, or the peaks are not provided. rise.
由于在本实施例子中的短路棒两端均有尖峰凸起,静电荷可以快速向两尖峰凸起端移动,而且两端的尖峰凸起都设置为尖端相对的结构,从而通过尖端对尖端放电,加快了静电荷的释放,因此大大降低了过孔区被烧毁的风险。Since both ends of the shorting bar in this embodiment have spikes, the static charge can quickly move to the ends of the two spikes, and the spikes at both ends are arranged in a structure where the tips are opposite, so that the tip is discharged through the tip, The release of electrostatic charge is accelerated, thus greatly reducing the risk of burning the via area.
实施例七Embodiment seven
图10为本发明的显示装置实施例七中检测装置及信号线的结构示意图。下面结合图10所示的检测装置及信号线的结构,对本发明的显示装置进行说明。FIG. 10 is a schematic structural diagram of a detection device and a signal line in Embodiment 7 of a display device of the present invention. The display device of the present invention will be described below in conjunction with the structure of the detection device and the signal line shown in FIG. 10 .
第七实施例和上述实施例的相同部分不再赘述,在本实施方式中:The same parts of the seventh embodiment and the foregoing embodiments will not be repeated, and in this implementation manner:
如图10所示,短路棒701-704靠近与信号线电连接的位置,例如短路棒701-704与信号线通过过孔区电连接,在过孔区旁,也即在接触孔106旁具有一个或者多个尖峰凸起708,所述尖峰凸起708可以位于短路棒上,也可以位于信号线上。所述尖峰凸起708可以如图10所示的位于短路棒的同一侧,也可以位于短路棒的不同侧,或者在每一短路棒靠近相邻的两侧短路棒的侧面上均设置有尖峰凸起,且各短路棒之间的尖峰凸起均相对设置。As shown in Figure 10, the shorting bar 701-704 is close to the position electrically connected with the signal line, for example, the shorting bar 701-704 is electrically connected with the signal line through the via area, and beside the via area, that is, beside the
优选的,尖峰凸起708和短路棒701-704位于同一层,具体的,尖峰凸起708的尖部为角状或锥状。Preferably, the
具体的,在短路棒701-704的测试衬垫709的部分,以及短路棒701-704的尖峰凸起708的尖端部分的表面不具有绝缘层。Specifically, there is no insulating layer on the surface of the
当然,在其他实施例中,所述测试衬垫709上也可以具有上述实施例中的尖峰凸起。Certainly, in other embodiments, the
如图10所示,因为尖峰凸起708设置在过孔区旁,并且尖峰凸起708直接暴露在空气中,因此一旦工艺过程中静电过大,在过孔区处积累的电荷就会立即往尖峰凸起708部位移动,在其尖端直接对空气放电,大大降低了静电对过孔区的损坏,使得电性测试正常进行,因为过孔区容易因为静电被损坏影响电性测试,因此优选的将尖峰凸起708设置在过孔区旁可以有效的防止静电对过孔区造成的损坏。As shown in FIG. 10 , because the
实施例八Embodiment eight
图11为本发明的显示装置实施例八中检测装置及信号线的结构示意图。下面结合图11所示的检测装置及信号线的结构,对本发明的显示装置进行说明。FIG. 11 is a schematic structural diagram of a detection device and a signal line in Embodiment 8 of a display device of the present invention. The display device of the present invention will be described below in conjunction with the structure of the detection device and the signal line shown in FIG. 11 .
第八实施例和第七实施例的相同部分不再赘述,在本实施方式中:The same parts of the eighth embodiment and the seventh embodiment will not be repeated. In this embodiment:
所述尖峰凸起808与信号线位于相同的层,例如与数据线位于相同的层,并且位于数据线的顶端,为数据线向短路棒外侧的延伸部分。本实施例中尖峰凸起808与信号线位于相同的层,从而使得刻蚀形成尖峰凸起的工艺步骤更简单。此外,在每一所述信号线靠近相邻的两侧信号线的侧面上均设置有所述尖峰凸起,且相邻的所述信号线的所述尖峰凸起均相对设置。The
实施例九Embodiment nine
图12为本发明的显示装置实施例九中检测装置及信号线的结构示意图。下面结合图12所示的检测装置及信号线的结构,对本发明的显示装置进行说明。FIG. 12 is a schematic structural diagram of a detection device and a signal line in Embodiment 9 of a display device of the present invention. The display device of the present invention will be described below in conjunction with the structure of the detection device and the signal line shown in FIG. 12 .
第九实施例和第八实施例的相同部分不再赘述,在本实施方式中:The same parts of the ninth embodiment and the eighth embodiment will not be repeated. In this embodiment:
在短路棒上,除了位于信号线顶端的尖峰凸起808之外,在过孔区旁还具有另一尖峰凸起711,尖峰凸起711和短路棒位于同一层,并且尖峰凸起711为角状或锥状。On the shorting bar, in addition to the
实施例十Embodiment ten
图13为本发明的显示装置实施例十中检测装置及信号线的结构示意图。下面结合图13所示的检测装置及信号线的结构,对本发明的显示装置进行说明。FIG. 13 is a schematic structural diagram of the detection device and the signal line in
第十实施例和第九实施例的相同部分不再赘述,在本实施方式中:The same parts of the tenth embodiment and the ninth embodiment will not be repeated. In this embodiment:
同一短路棒上的尖峰凸起808和尖峰凸起711的尖端部分设计成尖端相对的结构。因为尖峰凸起808的尖端和尖峰凸起711的尖端相对设置,因此制造过程中静电过大,积累的电荷就会立即往尖峰凸起808和711上移动,从而尖端对尖端放电。The tip portions of the
实施例十一Embodiment Eleven
图14为本发明的显示装置实施例十一中检测装置及信号线的结构示意图。下面结合图14所示的检测装置及信号线的结构,对本发明的显示装置进行说明。FIG. 14 is a schematic structural diagram of a detection device and a signal line in Embodiment 11 of a display device of the present invention. The display device of the present invention will be described below in conjunction with the structure of the detection device and the signal line shown in FIG. 14 .
第十一实施例和上述实施例的相同部分不再赘述,在本实施方式中:The same parts of the eleventh embodiment and the above-mentioned embodiments will not be repeated, and in this implementation manner:
如图14所示,所述短路棒和信号线连接位置旁设置有尖峰凸起713和714,尖峰凸起713和714分别位于短路棒靠近相邻的两侧短路棒的两侧面上,并且短路棒的尖峰凸起713和其相邻的短路棒上的尖峰凸起714的尖端相对设置。As shown in FIG. 14 , there are
另外在每个实施例中尖峰凸起的设置可以任意组合。在此不再一一列出。所以上述实施例中,一旦制造过程中静电过大,在短路棒上和接触孔处积累的电荷就会立即往尖端部位移动,在尖端形成尖端放电,大大降低了静电对过孔区的损坏,使得电性测试正常进行。In addition, in each embodiment, the settings of the peaks and protrusions can be combined arbitrarily. They are not listed here. Therefore, in the above embodiment, once the static electricity is too large during the manufacturing process, the charge accumulated on the shorting bar and the contact hole will immediately move to the tip, forming a tip discharge at the tip, which greatly reduces the damage of the static electricity to the via hole area. Make the electrical test go on normally.
本发明的图10-14的尖峰凸起设计在过孔区旁边,可以快速放电。本发明的尖端上面没有绝缘层,以及尖端与尖端之间没有绝缘层,提高了放电的效率;静电放电效果明显。此外,本发明的所述尖峰凸起的材料可以为铝、铝钕合金、氧化铟锡、钼、钼钕合金等中的一种或者多种,优先的,本发明中的所述尖峰凸起的材料为氧化铟锡,因其具有较强的抗腐蚀性。10-14 of the present invention are designed with peaks and protrusions next to the via area, which can discharge quickly. There is no insulating layer on the tip of the invention, and no insulating layer between the tips, which improves the discharge efficiency and has obvious electrostatic discharge effect. In addition, the material of the peak protrusions in the present invention can be one or more of aluminum, aluminum neodymium alloy, indium tin oxide, molybdenum, molybdenum neodymium alloy, etc., preferably, the peak protrusions in the present invention The material used is indium tin oxide because of its strong corrosion resistance.
以上所述,仅是本发明的较佳实施例而已,并非对本发明作任何形式上的限制。The above descriptions are only preferred embodiments of the present invention, and do not limit the present invention in any form.
虽然本发明已以较佳实施例披露如上,然而并非用以限定本发明。任何熟悉本领域的技术人员,在不脱离本发明技术方案范围情况下,都可利用上述揭示的方法和技术内容对本发明技术方案作出许多可能的变动和修饰,或修改为等同变化的等效实施例。因此,凡是未脱离本发明技术方案的内容,依据本发明的技术实质对以上实施例所做的任何简单修改、等同变化及修饰,均仍属于本发明技术方案保护的范围内。Although the present invention has been disclosed above with preferred embodiments, it is not intended to limit the present invention. Any person familiar with the art, without departing from the scope of the technical solution of the present invention, can use the methods and technical content disclosed above to make many possible changes and modifications to the technical solution of the present invention, or modify it into an equivalent implementation of equivalent changes example. Therefore, any simple modifications, equivalent changes and modifications made to the above embodiments according to the technical essence of the present invention, which do not deviate from the technical solution of the present invention, still fall within the protection scope of the technical solution of the present invention.
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