CN101806897B - Photoelectric distance measuring method and device - Google Patents
Photoelectric distance measuring method and device Download PDFInfo
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Abstract
The invention relates to a photoelectric distance measuring method, comprising the following steps: a high-frequency signal fHAnd a low-frequency mixing signal fLModulated in a frequency modulator to a first high-frequency modulated signal fH+fLAnd a second high-frequency modulation signal fH-fLSeparately using the first high-frequency modulation signal fH+fLAnd a second high frequency modulation signal fH-fLThe measuring beam is modulated, correspondingly, a first low-frequency measuring signal and a second low-frequency measuring signal are respectively generated in the photoelectric receiving and converting device, the first low-frequency measuring signal comprises first phase information, the second low-frequency measuring signal comprises second phase information, and the measured distance is determined by processing the first phase information and the second phase information. The photoelectric distance measuring method disclosed by the invention does not need to adopt an additional internal reference light path and a mechanical conversion device, thereby greatly simplifying the structure of the distance measuring device, simplifying the control method of the distance measuring device and simultaneously reducing the manufacturing cost.
Description
Technical field
The present invention relates to a kind of electro-optical distance measurement method and device thereof, relate in particular to a kind of electro-optical distance measurement method and device thereof based on phase measurement principle.
Background technology
Electro-optical distance measurement device is widely used in fields such as building, indoor decoration owing to its measuring accuracy is high.Transmitter is launched modulated beam of light to testee, and photelectric receiver receives by the modulated beam of light of testee reflected back, and the phase differential when being transmitted and received by modulated beam of light confirms that electro-optical distance measurement device is to the distance the testee.
The measuring accuracy of this electro-optical distance measurement device receives the influence of environment and device itself, environment temperature alternate for example, the temperature drift of photelectric receiver.In the prior art, eliminate and above-mentioned float the phase drift that produces because of variation of ambient temperature or the temperature of photelectric receiver through an internal reference light path with predetermined length is set in distance measuring equipment.A mechanical switching device is set on the emission light path of modulated beam of light to be used for externally measuring between light path and the internal reference light path and to switch.Photelectric receiver successively receives through the modulation measuring light signal of externally measured light path propagation with through modulation reference light signal and priority that the internal reference light path is propagated and produces a low frequency measurement signal and a low-frequency calibration signal respectively; Subtracting each other of the phase place through the low frequency measurement signal and the phase place of low-frequency calibration signal eliminated the measuring error of distance measuring equipment.Making measuring-signal and reference signal alternately arrive photelectric receiver through mechanical switch can repeatedly carry out in a ranging process, and still, this mechanical switch can produce big mechanical load and parts can wear and tear in this process, and is fragile.Mechanical switching device and interior light channel structure make the inner structure of distance measuring equipment and control method complicated again in addition, increased distance measuring equipment manufacturing cost, increased volume and weight, be unfavorable for the miniaturization development of distance measuring equipment.
The distance measuring equipment that also has then adopts two photelectric receivers to receive reflection measurement light signal and reference optical signal simultaneously, and expensive photelectric receiver makes the manufacturing cost of distance measuring equipment greatly improve.
Summary of the invention
The shortcoming that the objective of the invention is to overcome above-mentioned prior art provides a kind of and need not to use the internal reference light path and have than the electro-optical distance measurement method of high measurement accuracy and based on the measurement mechanism of this method.
In order to achieve this end; Optoelectronic distance measuring method of the present invention comprises step: a high-frequency signal fH and a low frequency mix fL are modulated into one first high-frequency modulation signal fH+fL and one second high-frequency modulation signal fH-fL in a frequency modulator; A branch of measuring beam is emitted on the testee; Receive by testee reflection or back scattered measuring beam with a photoelectricity reception and conversion equipment; Confirm a tested distance through handling phase information; It is characterized in that: among described first high-frequency modulation signal fH+fL and the described second high-frequency modulation signal fH-fL one modulates described measuring beam; Described measuring beam is emitted on the said testee; Received and convert to one first high frequency reflection measurement signal from said testee reflection or back scattered measuring beam by said photoelectricity reception and conversion equipment; Described first high frequency reflection measurement signal and said high-frequency signal fH carry out mixing and produce one first low frequency measurement signal in described photoelectricity reception and conversion equipment; The described first low frequency measurement signal comprises first phase information; Among described first high-frequency modulation signal fH+fL and the described second high-frequency modulation signal fH-fL another modulated described measuring beam; Described measuring beam is emitted on the said testee; Received and convert to one second high frequency reflection measurement signal from said testee reflection or back scattered measuring beam by described photoelectricity reception and conversion equipment; Described second high frequency reflection measurement signal and said high-frequency signal fH described photoelectricity receive and conversion equipment in carry out mixing and produce one second low frequency measurement signal, the described second low frequency measurement signal comprises second phase information, through handling described first phase information and described second phase information is confirmed said tested distance.
Disclosed optoelectronic distance measuring method; Adopt high-frequency modulation signal fH+fL and fH-fL that measuring beam is modulated respectively; And obtain the first low frequency measurement signal and second a low frequency measurement signal that comprises second phase information that comprises first phase information respectively, through handling first phase information and second phase information obtains tested distance value.Than prior art; Disclosed optoelectronic distance measuring method need not to adopt extra internal reference light path and mechanical switching device, thereby has simplified the structure of distance measuring equipment greatly; Simplify the control method of distance measuring equipment, reduced manufacturing cost simultaneously.
Description of drawings
Below in conjunction with accompanying drawing and embodiment the present invention is done further detailed explanation.
Fig. 1 is the system chart of the electro-optical distance measurement device in a kind of first-selected embodiment of the present invention.
Fig. 2 is the process flow diagram that electro-optical distance measurement device carries out range observation among Fig. 1.
Embodiment
Existing with reference to Fig. 1; The electro-optical distance measurement device of a kind of first-selected embodiment of the present invention mainly comprises a PLL phase-locked loop circuit 11; The quadrature modulator 13 that can high-frequency signal be modulated into the measuring light modulation signal; 15, one photoelectricity of an optical signal transmitter receive and conversion equipment 17 and a MCU microprocessor 12.
PLL phase-locked loop circuit 11 produces a high-frequency signal fH, and this high-frequency signal fH is transferred in the quadrature modulator 13 through transmission line.Simultaneously; MCU microprocessor 12 is to low frequency mix fL of quadrature modulator 13 outputs; High-frequency signal fH and low frequency mix fL are synthesized in quadrature modulator 13; Produce the high-frequency modulation signal of a measuring light, this high-frequency modulation signal outputs on the optical signal transmitter 15 measuring light that transmitter sent is carried out high frequency modulated, and the measuring light of process high frequency modulated shines on the testee 16.Photoelectricity receives and conversion equipment 17 receives the high frequency modulated reflection measurement light by testee 16 reflected backs, and converts corresponding high frequency reflection measurement signal to.The high-frequency signal fH that PLL phase-locked loop circuit 11 produces tell one the tunnel and be imported into that photoelectricity receives and conversion equipment 17 in and therein with high frequency reflection measurement signal mixing; One of generation comprises the low frequency measurement signal of the phase information that is used for definite distance after transreactance amplifier 18 amplifications and low-pass filter 19 filtering, this low frequency measurement signal is input to handle among the MCU12 obtain electro-optical distance measurement device to the distance between the testee.
In the present invention; High-frequency signal fH and low frequency mix fL warp in quadrature modulator 13 is synthetic; Can produce two kinds of different high-frequency modulation signals is fH+fL, fH-fL, is taken up in order of priority and with these two kinds of high-frequency modulation signal fH+fL and fH-fL the measuring light that transmitter sent is carried out high frequency modulated.Here, low frequency mix fL is lower than the frequency of high-frequency signal fH, and the frequency between fL and the fH differs more than 1,000 times usually, and when the short distance range finding of carrying out hundreds of rice, the additional phase shift that fL produces can be ignored, and can not influence the precision of range observation.
Fig. 2 shows the method for range observation of the present invention.At first; With high-frequency modulation signal fH+fL the measuring light that transmitter sent is carried out high frequency modulated; Emission is through on measuring light to the testee 16 of high frequency modulated; Photoelectricity receives and conversion equipment 17 receives by testee 16 reflections or back scattered high frequency modulated reflection measurement light and convert corresponding high frequency modulated reflection measurement signal fH+fL to, and high frequency modulated reflection measurement signal fH+fL and high-frequency signal fH produce a low frequency measurement signal f1 after the mixing in photoelectricity reception and conversion equipment 17, and low frequency measurement signal f1 comprises phase information A0+A1; Wherein A0 is an initial phase information, and A1 is a Measurement Phase information.Then; With high-frequency modulation signal fH-fL the measuring light that transmitter sent is carried out high frequency modulated again; Accordingly; Obtain a high frequency modulated reflection measurement signal fH-fL, produce a low frequency measurement signal f2 after high frequency modulated reflection measurement signal fH-fL and the high-frequency signal fH mixing, low frequency measurement signal f2 comprises phase information A0-A1.At last, in MCU12, the low frequency measurement signal f1 that obtains for twice and the phase information of f2 are carried out calculation process, two kinds of arithmetic processing methods are arranged: first kind; The phase information of the low frequency measurement signal f1 that obtains for twice and f2 is added average calculating operation to be handled; Be about to the phase information addition of f1 and f2, cancellation A1 obtains 2 times A0; Divided by the value that obtains A0 after 2, try to achieve the value of A1 again according to the value of A0; Second kind; The phase information of the low frequency measurement signal f1 that obtains for twice and f2 is subtracted average calculating operation handle, the phase information that is about to f1 and f2 is subtracted each other cancellation A0; Obtain 2 times A1; Divided by the value that obtains A1 after 2, these two kinds of methods can obtain the value of Measurement Phase A1 easily, obtain tested distance value by the value of Measurement Phase A1.Because the phase drift that variation of ambient temperature and components and parts itself are produced is present among the initial phase A0, does not comprise additional phase shift information among the Measurement Phase A1, so can obtain the higher tested distance value of precision by the value of Measurement Phase A1.
Certainly; The invention is not restricted to high-frequency modulation signal fH+fL the measuring light that transmitter sent carried out high frequency modulated earlier; Also can adopt high-frequency modulation signal fH-fL that the measuring light that transmitter sent is carried out high frequency modulated earlier, and then the measuring light that transmitter sent carried out high frequency modulated with high-frequency modulation signal fH+fL.
Below only the circuit part of electro-optical distance measurement device of the present invention is described, the opticator that it adopted comprises emission light path and receiving light path, all is content of the prior art, repeats no more at this.
Embodiment described above is just set forth design of the present invention and principle, does not really want content of the present invention is limited.Those of ordinary skill in the art can recognize that except the embodiment of above-mentioned first-selection, the present invention also has much other embodiments that substitute or that revise, and these embodiments of perhaps revising that substitute are still within scope of the present invention.Protection scope of the present invention is confirmed by claim.
Claims (6)
1. optoelectronic distance measuring method comprises step:
With a high-frequency signal f
HWith a low frequency mix f
LIn a frequency modulator, be modulated into one first high-frequency modulation signal f
H+ f
LWith one second high-frequency modulation signal f
H-f
L
A branch of measuring beam is emitted on the testee;
Receive by testee reflection or back scattered measuring beam with a photoelectricity reception and conversion equipment;
Confirm a tested distance through handling phase information, it is characterized in that:
The described first high-frequency modulation signal f
H+ f
LWith the described second high-frequency modulation signal f
H-f
LIn one described measuring beam modulated; Described measuring beam is emitted on the said testee; Received and convert to one first high frequency reflection measurement signal, described first high frequency reflection measurement signal and said high-frequency signal f from said testee reflection or back scattered measuring beam by said photoelectricity reception and conversion equipment
HIn described photoelectricity reception and conversion equipment, carry out mixing and produce one first low frequency measurement signal, the described first low frequency measurement signal comprises first phase information, the described first high-frequency modulation signal f
H+ f
LWith the described second high-frequency modulation signal f
H-f
LIn another described measuring beam is modulated; Described measuring beam is emitted on the said testee; Received and convert to one second high frequency reflection measurement signal, described second high frequency reflection measurement signal and said high-frequency signal f from said testee reflection or back scattered measuring beam by described photoelectricity reception and conversion equipment
HIn described photoelectricity reception and conversion equipment, carry out mixing and produce one second low frequency measurement signal; The described second low frequency measurement signal comprises second phase information, through handling described first phase information and described second phase information is confirmed said tested distance.
2. the optoelectronic distance measuring method described in claim 1 is characterized in that, described first phase information and described second phase information are added the average calculating operation processing.
3. the optoelectronic distance measuring method described in claim 1 is characterized in that, described first phase information and described second phase information are subtracted the average calculating operation processing.
4. like each described optoelectronic distance measuring method among the claim 1-3, it is characterized in that described low frequency mix f
LWith described high-frequency signal f
HFrequency differ more than 1,000 times.
5. the optoelectronic distance measuring method described in claim 4 is characterized in that, described frequency modulator is a quadrature modulator.
6. the optoelectronic distance measuring method described in claim 4 is characterized in that, described photoelectricity receives and conversion equipment is an avalanche photodide.
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| CN2009100244382A CN101806897B (en) | 2009-02-17 | 2009-02-17 | Photoelectric distance measuring method and device |
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| CN2009100244382A CN101806897B (en) | 2009-02-17 | 2009-02-17 | Photoelectric distance measuring method and device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| DE112011101915T5 (en) * | 2011-11-11 | 2013-07-11 | Mileseey Technology Inc. | A distance measurement method and system |
| WO2016136371A1 (en) * | 2015-02-23 | 2016-09-01 | 三菱電機株式会社 | Movement distance measuring device |
| CN109164455A (en) * | 2018-10-17 | 2019-01-08 | 杭州隆硕科技有限公司 | A kind of phase distancemeter |
| JP2020067385A (en) | 2018-10-25 | 2020-04-30 | ソニーセミコンダクタソリューションズ株式会社 | Arithmetic processing apparatus, ranging apparatus, and arithmetic processing method |
| CN112526546B (en) * | 2021-02-09 | 2021-08-17 | 深圳市汇顶科技股份有限公司 | Depth information determination method and device |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1825138A (en) * | 2006-04-07 | 2006-08-30 | 哈尔滨工业大学 | Multi-frequency synchronous modulation large-scale high-precision fast laser ranging method and device |
| CN101349757A (en) * | 2008-09-10 | 2009-01-21 | 哈尔滨工业大学 | Active cooperative phase laser ranging method and device |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1825138A (en) * | 2006-04-07 | 2006-08-30 | 哈尔滨工业大学 | Multi-frequency synchronous modulation large-scale high-precision fast laser ranging method and device |
| CN101349757A (en) * | 2008-09-10 | 2009-01-21 | 哈尔滨工业大学 | Active cooperative phase laser ranging method and device |
Non-Patent Citations (3)
| Title |
|---|
| JP特开2001-183458A 2001.07.06 |
| 张志勇等.一种基于相位测量的激光测距方法.《光电工程》.2006,第33卷(第08期),75-78、122. * |
| 张慧.提高相位激光测距精确度的研究.《精密制造与自动化》.2007,(第01期),24-26. * |
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