CN101769986B - Test device and test method thereof - Google Patents
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- CN101769986B CN101769986B CN2009100018146A CN200910001814A CN101769986B CN 101769986 B CN101769986 B CN 101769986B CN 2009100018146 A CN2009100018146 A CN 2009100018146A CN 200910001814 A CN200910001814 A CN 200910001814A CN 101769986 B CN101769986 B CN 101769986B
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- 238000012360 testing method Methods 0.000 title claims abstract description 125
- 238000010998 test method Methods 0.000 title claims abstract description 11
- 239000004606 Fillers/Extenders Substances 0.000 claims description 26
- 239000000523 sample Substances 0.000 claims description 15
- 230000005540 biological transmission Effects 0.000 claims description 7
- 230000002093 peripheral effect Effects 0.000 claims description 3
- 238000009434 installation Methods 0.000 description 42
- CNQCVBJFEGMYDW-UHFFFAOYSA-N lawrencium atom Chemical compound [Lr] CNQCVBJFEGMYDW-UHFFFAOYSA-N 0.000 description 8
- 238000010586 diagram Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 6
- 230000006870 function Effects 0.000 description 5
- 230000000052 comparative effect Effects 0.000 description 4
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- NHDHVHZZCFYRSB-UHFFFAOYSA-N pyriproxyfen Chemical compound C=1C=CC=NC=1OC(C)COC(C=C1)=CC=C1OC1=CC=CC=C1 NHDHVHZZCFYRSB-UHFFFAOYSA-N 0.000 description 1
- 230000011664 signaling Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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Abstract
The invention provides a module test device and a test method thereof for testing a first connector of a mainboard, wherein the first connector is provided with a plurality of first pins. The module test device is coupled with a computer device and a multimeter and comprises a second connector with a plurality of second pins, a switch unit, a controller and a first pinboard. The module test device is directly inserted with a first connector or is inserted on the first connector through the first pinboard. The second connector is inserted on the first connector. The second pins are respectively coupled to first pins. One end of the first pinboard is adapted to the second connector, while the other end is adapted to the first connector. The switch unit is coupled with the second pins. The controller is coupled with the switch unit, receives a control signal derived from the computer device and controls the operation of the switch unit according to the control signal so that the test device is matched with the multimeter to test the first connector; and the multimeter provides a test value to the computer device.
Description
Technical field
The present invention is relevant for a kind of proving installation, and particularly relevant for a kind of proving installation and method of testing thereof.
Background technology
Motherboard is produced in the maintenance process, often needs to measure the quality of a plurality of connectors on the motherboard.Normally by measuring the protection diode values of signal on the connector, and with an on-gauge plate on the standard protection diode values of respective signal compare, thereby judge which or which signal is bad.
The protection diode is exactly the diode (Clamp Diode) that shields, and general IC chip has all designed some diode circuits in the non-core part of chip, and purpose is in order to protect the core of chip.
The concrete operations of measuring diode are exactly multimeter, utilize the probe that is connected with multimeter to record the resistance value of protection diode then.Utilize Ohm law, the impedance parallel impedance descends, and the impedance series impedance rises, and from the resistance value that records, judges signaling point receives whether open circuit or short circuit are arranged between each part.If whether the resistance value that records is too high or do not have resistance, be circuit open circuit or the empty weldering of assembly just can seek along circuit, if without any the problem of welding technology or pcb board itself, then may be bad for part.If the resistance value that records is low excessively, whether just seek and other signal shorts, judge whether to be part short circuit or PCB line short again.
Yet because PCI slot, PCIe X16 slot, and memory bank, the pin number of these slots all is more than 100, thinks to find out rapidly which or which bad relatively difficulty of signal quality, therefore cause servicing time longer, and operation steps is comparatively loaded down with trivial details.
Summary of the invention
The invention provides a kind of proving installation and method of testing thereof, to address the above problem.
Modular testing device with automatic switching function provided by the invention cooperates multimeter to come first connector of Test Host plate, and first connector has a plurality of first pins, and the modular testing device couples computer apparatus.The modular testing device comprises second connector, switch element, controller and first card extender with a plurality of second pins, and the modular testing device directly plugs first connector, or is inserted in first connector by first card extender.When second connector was inserted in first connector, described second pin coupled described first pin respectively, and an end and second connector of first card extender adapt, and the other end and first connector adapt, and switch element couples described second pin.Controller couples switch element, and receives the control signal come from computer apparatus, and controller comes the operation of gauge tap unit according to control signal, make proving installation cooperate multimeter to test first connector, and multimeter provides test value to computer apparatus.
A kind of method of testing that the present invention provides in addition is by first connector of modular testing device and multimeter Test Host plate.First connector has a plurality of first pins.The modular testing device comprises second connector, switch element, controller and first card extender with a plurality of second pins.When second connector is inserted in first connector, described second pin couples described first pin respectively, one end and second connector of other first card extender adapt, the other end and first connector adapt, and make the modular testing device directly be inserted in first connector or are inserted in first connector by first card extender.Switch element couples described second pin.Method of testing may further comprise the steps: receive control signal; Come the operation of gauge tap unit according to control signal, with those first pins of testing first connector respectively one of them, make proving installation cooperate multimeter to test first connector, multimeter provides test value; And compare test value and preset value.
Beneficial effect of the present invention is: the invention provides a kind of connector testing device, be connected on first connector to be tested.Proving installation comprises switch element, connects a plurality of second pins on the proving installation successively, to test a plurality of first pins on first connector respectively, has reached automatic switching function, has save manpower control, saves the test duration, has improved work efficiency.Proving installation provided by the invention has adopted modular design, and is simple in structure, easy operating.Proving installation can adopt card extender to be connected on polytype first connector, in order to test multiple first connector, saves testing expense.Proving installation has adopted the mode of imagery to show test results, and the display interface that provides the operator to be easy to identify allows the operator can realize unsanctioned first pin of test rapidly.
For above and other objects of the present invention, feature and advantage can be become apparent, preferred embodiment cited below particularly, and cooperate appended graphicly, be described in detail below.
Description of drawings
Fig. 1 is the function block schematic diagram of the proving installation of a preferred embodiment of the present invention.
Fig. 2 is the structural representation of the proving installation of a preferred embodiment of the present invention when using.
Structural representation when Fig. 3 uses for the proving installation of another preferred embodiment of the present invention.
Fig. 4 is the method for testing process flow diagram of a preferred embodiment of the present invention application testing device to test connector.
Fig. 5 is the detailed description of step S403 among Fig. 4.
Fig. 6 is the display interface synoptic diagram of test result in a preferred embodiment of the present invention.
Embodiment
Fig. 1 is the function block schematic diagram of the proving installation of a preferred embodiment of the present invention.
The proving installation 100 that present embodiment provides can be used to first connector 201 on the Test Host plate 200.First connector 201 can be memory bank, display card slot, expansion card slot or peripheral device adapter slot.
The proving installation 100 that present embodiment provides comprises second connector 101, switch element 103 and controller 104.Second connector 101 has a plurality of second pins 102, second connector 101 of proving installation 100 is matched with first connector 201 of motherboard 200, when second connector 101 was inserted on first connector 201, a plurality of second pins 102 coupled these first pins 202 respectively.
Switch element 103 couples these second pins 102, and switch element 103 preferably has the signal communication that 1031, one switch chips 1031 of a plurality of switch chips can be controlled a plurality of (such as 8) second pin 102 respectively.The art has knows that usually the knowledgeable can arrange a plurality of switch chips 1031 as required, will not limit in the present invention.
In the present embodiment, proving installation 100 also comprises interface 105, and interface 105 also couples switch element 103.Be communicated with a plurality of second pins 102 successively by switch element 103, interface 105 can be coupled to first pin 202 successively by second pin 102.Therefore, the current potential of interface 105 is identical with the current potential of following its first pin 202 that couples.
Fig. 2 is the structural representation of the proving installation of a preferred embodiment of the present invention when using.
In the present embodiment, proving installation 100 is on first connector 201 that directly is plugged on the motherboard 200.
Please in conjunction with reference to figure 1 and Fig. 2, computer apparatus 300 is connected to proving installation 100 by first transmission line 301, computer apparatus 300 also sends and controls signal to controller 104, makes controller 104 according to control signal gauge tap unit 103 automatic switching on and disconnection successively.
Proving installation 100 is connected to after first connector 201 of motherboard 200, uses multimeter 400 to obtain test value.Proving installation 100 couples computer apparatus 300 by multimeter 400 and one first probe (claiming black meter pen again) 402.First probe 402 couples proving installation 100 and multimeter 400 respectively, and wherein first probe 402 of multimeter 400 is coupled to the interface 105 (as shown in fig. 1) of proving installation 100.Multimeter 400 couples computer apparatus 300.Multimeter 400 also couples the earth point (earth terminal) that second probe (claiming red test pencil again), 401, the second probes 401 couple motherboard 200.
Structural representation when Fig. 3 uses for the proving installation of another preferred embodiment of the present invention.
In the present embodiment, proving installation 100 comprises first card extender 501 and second card extender 502.
Please in conjunction with reference to figure 1 and Fig. 3, in practical operation, first connector 201 of motherboard 200 can be plurality of specifications, and for example first connector 201 can be memory bank, display card slot, expansion card slot or peripheral device adapter slot.Proving installation 100 can utilize first card extender 501 or second card extender 502 to be plugged on the motherboard 200 according to the different size of first connector 201.
In the present embodiment, motherboard 200 comprises that the specification of first connector 201 and the 3rd connector 203, the three connectors 203 is different from first connector 201.One end gauage lattice and second connector 101 of first card extender 501 adapt, and other end specification and first connector 201 adapt; One end of second card extender 502 and second connector 101 adapt, and the other end and the 3rd connector 203 adapt.All have a plurality of electrical passage (not shown) in first card extender 501 and second card extender 502, be used for coupling the connector that its two ends connect.
In the time of need coupling first connector 201, second connector 101 of proving installation 100 utilizes first card extender 501 to couple first connector 201.Under the constant situation of the specification of second connector 101 of proving installation 100, in the time of need coupling the 3rd connector 203, proving installation 100 can be coupled to the 3rd connector 203 by second card extender 502.
Fig. 4 is the method for testing process flow diagram of a preferred embodiment of the present invention application testing device to test connector.
Please in conjunction with reference to figure 1, Fig. 2 and Fig. 4, the method for testing that present embodiment discloses may further comprise the steps:
Step S401: receive control signal.Proving installation 100 is coupled to computer apparatus 300 by first transmission line 301, and computer apparatus 300 transfers to control signal the controller 104 of proving installation 100.
Step S402: controller 104 comes the operation of gauge tap unit 103 according to control signal, make proving installation 100 cooperate multimeters 400 to test first connector 201, and multimeter 400 provides a test value to computer apparatus 300.That is controller 104 gauge tap unit 103 are communicated to one of second pin 102 successively.Control signal is switch chip 1031 opening and closing successively in the gauge tap unit 103 successively, being communicated to one of second pin 102 respectively, and sends a signal to the first coupled pin 202 by second pin 102 of above-mentioned connection.Thus, proving installation 100 is measured first pin 202 by multimeter 400, and to obtain test value, multimeter 400 provides above-mentioned test value to computer apparatus 300 again.That is multimeter 400 can be by the diode values of its corresponding first pin 202 that couples of institute of this second pin 102 tests, with the acquisition test value.
For instance, in the present embodiment, by the diode values of using multimeter 400 to test first pin of connecting 202.First probe 402 of multimeter 400 is coupled to interface 105, because interface 105 couples switch element 103 all the time, therefore when switch element 103 was switched on certain second pin 102, first probe 402 was coupled to first pin 202 that its correspondence couples by this second pin 102.
Test value in this step is the diode values of second pin, 102 correspondences.Multimeter 400 transfers to computer apparatus 300 by second transmission line 302 with test value.
Step S403: computer apparatus 300 is test value and the preset value of first pin, 202 correspondences relatively, and produces test result.Store the preset value (i.e. first pin, 202 standard diode values) of each first pin 202 in the computer apparatus 300.Receive after the test value, whether computer apparatus 300 compare test value and preset values meet technological requirement to judge first pin 202.Test result comprises position number and the comparative result of each first pin 202.
Detailed description about this step sees also Fig. 5.Fig. 5 is the detailed description of step S403 among Fig. 4.
S501: judge that the difference of test value and preset value is whether in preset range.Computer apparatus 300 is each first pin, 202 corresponding test diode value and preset values relatively successively, and within the specific limits whether the difference of judging test diode value and preset value.
Preset range can be set in (1-0.5%, the 1+0.5%) of preset value scope.When technological requirement was different, preset range can correspondingly change.
When the result of step S501 for not, first pin 202 of judging the test value correspondence for test by (step S502).When the result of step S501 for being, first pin 202 of judging the test value correspondence for test by (step S503).
Step S404: show test results.In the present embodiment, by the comparative result of computer apparatus 300 according to step S404, show test results.Computer apparatus 300 can show comparative result by color.For example, red expression test is not passed through, and green expression test is passed through.
Display packing about computer apparatus 300 sees also Fig. 6.
Fig. 6 is the display interface synoptic diagram of test result in a preferred embodiment of the present invention.Relevant its explanation please be in the lump with reference to Fig. 1.
Preferred embodiment of the present invention provides a kind of connector testing device, is connected on first connector to be tested.Proving installation comprises switch element, connects a plurality of second pins on the proving installation successively, to test a plurality of first pins on first connector respectively, has reached automatic switching function, has save manpower control, saves the test duration, has improved work efficiency.Proving installation provided by the invention has adopted modular design, and is simple in structure, easy operating.Proving installation can adopt card extender to be connected on polytype first connector, in order to test multiple first connector, saves testing expense.Proving installation has adopted the mode of imagery to show test results, and the display interface that provides the operator to be easy to identify allows the operator can realize unsanctioned first pin of test rapidly.
Though the present invention discloses as above with preferred embodiment; right its is not in order to limiting the present invention, anyly has the knack of this skill person, without departing from the spirit and scope of the present invention; when can doing a little change and retouching, so protection scope of the present invention is as the criterion when looking claims person of defining.
Claims (14)
1. a modular testing device cooperates multimeter to come first connector of Test Host plate, and above-mentioned first connector has a plurality of first pins, and above-mentioned modular testing device couples computer apparatus, it is characterized in that, above-mentioned modular testing device comprises:
Second connector has a plurality of second pins, and when above-mentioned second connector was inserted in above-mentioned first connector, above-mentioned a plurality of second pins coupled above-mentioned a plurality of first pin respectively;
Switch element couples above-mentioned a plurality of second pin;
Controller, couple above-mentioned switch element, and receive the control signal that comes from above-mentioned computer apparatus, above-mentioned controller is controlled the operation of above-mentioned switch element according to above-mentioned control signal, make above-mentioned modular testing device cooperate above-mentioned multimeter to try to survey above-mentioned first connector, and above-mentioned multimeter provide test value to above-mentioned computer apparatus; And
First card extender, an end of above-mentioned first card extender and above-mentioned second connector adapt, and the other end and above-mentioned first connector adapt,
Wherein, above-mentioned modular testing device directly plugs above-mentioned first connector, or is inserted in above-mentioned first connector by above-mentioned first card extender.
2. modular testing device according to claim 1, it is characterized in that, above-mentioned controller is controlled above-mentioned switch element and is communicated with above-mentioned a plurality of second pin successively, above-mentioned a plurality of second pins that are communicated with to pass through are tested corresponding above-mentioned a plurality of first pins of above-mentioned a plurality of second pin, make above-mentioned multimeter provide above-mentioned test value to above-mentioned computer apparatus.
3. modular testing device according to claim 1, it is characterized in that, above-mentioned computer apparatus also stores preset value, the more above-mentioned test value of above-mentioned computer apparatus and above-mentioned preset value, when the difference of above-mentioned test value and above-mentioned preset value in preset range, above-mentioned a plurality of first pins tests of then testing are passed through.
4. modular testing device according to claim 1 is characterized in that, above-mentioned controller couples above-mentioned computer apparatus by first transmission line, is used for receiving above-mentioned control signal.
5. modular testing device according to claim 1 is characterized in that, above-mentioned modular testing device couples above-mentioned computer apparatus by above-mentioned multimeter and first probe.
6. modular testing device according to claim 5 is characterized in that, above-mentioned first probe couples above-mentioned modular testing device and above-mentioned multimeter respectively, and above-mentioned multimeter couples above-mentioned computer apparatus.
7. modular testing device according to claim 1 is characterized in that, above-mentioned multimeter couples second probe, and above-mentioned second probe couples the earth point of above-mentioned motherboard.
8. modular testing device according to claim 1, it is characterized in that, above-mentioned modular testing device also comprises interface, above-mentioned interface couples above-mentioned switch element, above-mentioned modular testing device is measured the diode values of above-mentioned a plurality of first pins respectively to obtain above-mentioned test value by above-mentioned multimeter, first probe of above-mentioned multimeter couples above-mentioned interface, and second probe of above-mentioned multimeter couples the earth terminal of above-mentioned first connector.
9. modular testing device according to claim 8 is characterized in that, above-mentioned multimeter couples above-mentioned computer apparatus by second transmission line, so that above-mentioned test value is transferred to above-mentioned computer apparatus.
10. modular testing device according to claim 1, it is characterized in that, above-mentioned motherboard also comprises the 3rd connector, the specification of above-mentioned the 3rd connector is different with the specification of above-mentioned first connector, wherein above-mentioned modular testing device also comprises second card extender, above-mentioned a plurality of second pin couples above-mentioned the 3rd connector by above-mentioned second card extender, to test above-mentioned the 3rd connector.
11. modular testing device according to claim 1 is characterized in that, above-mentioned first connector is memory bank, display card slot, expansion card slot or peripheral device adapter slot.
12. method of testing, it is characterized in that, first connector by modular testing device and multimeter Test Host plate, above-mentioned first connector has a plurality of first pins, above-mentioned modular testing device comprises second connector, switch element, controller and first card extender, above-mentioned second connector has a plurality of second pins, when above-mentioned second connector is inserted in above-mentioned first connector, above-mentioned a plurality of second pin couples above-mentioned a plurality of first pin respectively, an end of above-mentioned first card extender and above-mentioned second connector adapt in addition, the other end and above-mentioned first connector adapt, make above-mentioned modular testing device directly be inserted in above-mentioned first connector, or be inserted in above-mentioned first connector by above-mentioned first card extender, above-mentioned switch element couples above-mentioned a plurality of second pin, and above-mentioned method of testing may further comprise the steps:
Receive control signal;
Control the operation of above-mentioned switch element according to above-mentioned control signal, with one of them of above-mentioned a plurality of first pins of testing above-mentioned first connector respectively, make above-mentioned modular testing device cooperate above-mentioned multimeter to test above-mentioned first connector, above-mentioned multimeter provides test value; And
More above-mentioned test value and preset value.
13. method of testing according to claim 12 is characterized in that, the difference of above-mentioned test value and above-mentioned preset value is in preset range, and above-mentioned a plurality of first pin tests of then testing are passed through.
14. method of testing according to claim 12 is characterized in that, above-mentioned modular testing device is measured above-mentioned a plurality of first pin by above-mentioned multimeter, to obtain above-mentioned test value.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009100018146A CN101769986B (en) | 2009-01-06 | 2009-01-06 | Test device and test method thereof |
| TW098100231A TWI418978B (en) | 2009-01-06 | 2009-01-06 | Testing device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009100018146A CN101769986B (en) | 2009-01-06 | 2009-01-06 | Test device and test method thereof |
| TW098100231A TWI418978B (en) | 2009-01-06 | 2009-01-06 | Testing device |
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| Publication Number | Publication Date |
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| CN101769986A CN101769986A (en) | 2010-07-07 |
| CN101769986B true CN101769986B (en) | 2013-08-14 |
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| CN2009100018146A Active CN101769986B (en) | 2009-01-06 | 2009-01-06 | Test device and test method thereof |
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| CN (1) | CN101769986B (en) |
| TW (1) | TWI418978B (en) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103000229A (en) * | 2011-09-09 | 2013-03-27 | 鸿富锦精密工业（深圳）有限公司 | Testing card |
| TWI432755B (en) * | 2012-01-13 | 2014-04-01 | Wistron Corp | Test system and test method for pcba |
| CN103729272A (en) * | 2012-10-12 | 2014-04-16 | 英业达科技有限公司 | Testing device with multiple connection ports |
| CN104280615B (en) * | 2013-07-10 | 2017-03-15 | 鸿富锦精密工业(武汉)有限公司 | Measurement apparatus |
| CN107340447B (en) * | 2016-05-03 | 2020-07-10 | 技嘉科技股份有限公司 | Test device and test method |
| CN107402346A (en) * | 2016-05-20 | 2017-11-28 | 致伸科技股份有限公司 | Circuit Board Test System |
| TWI756825B (en) * | 2020-09-16 | 2022-03-01 | 英業達股份有限公司 | Detection system for non-standard connection interface through adapter card |
| CN112345828A (en) * | 2020-09-25 | 2021-02-09 | 华东光电集成器件研究所 | Multi-row direct insertion type metal tube shell insulation resistance testing device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN2211621Y (en) * | 1994-08-30 | 1995-11-01 | 中国科学院沈阳计算技术研究所 | Feedback circuit board tester for computer coder |
| CN201145731Y (en) * | 2007-12-26 | 2008-11-05 | 比亚迪股份有限公司 | Apparatus for testing vehicle mounted acoustics system mainboard |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6344684B1 (en) * | 2000-07-06 | 2002-02-05 | Advanced Micro Devices, Inc. | Multi-layered pin grid array interposer apparatus and method for testing semiconductor devices having a non-pin grid array footprint |
| WO2008146407A1 (en) * | 2007-06-01 | 2008-12-04 | Advantest Corporation | Device socket, mother board and test device |
| TW200848754A (en) * | 2007-06-01 | 2008-12-16 | Wistron Corp | Test apparatus and method for a docking connector of a motherboard |
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2009
- 2009-01-06 TW TW098100231A patent/TWI418978B/en active
- 2009-01-06 CN CN2009100018146A patent/CN101769986B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2211621Y (en) * | 1994-08-30 | 1995-11-01 | 中国科学院沈阳计算技术研究所 | Feedback circuit board tester for computer coder |
| CN201145731Y (en) * | 2007-12-26 | 2008-11-05 | 比亚迪股份有限公司 | Apparatus for testing vehicle mounted acoustics system mainboard |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101769986A (en) | 2010-07-07 |
| TWI418978B (en) | 2013-12-11 |
| TW201027329A (en) | 2010-07-16 |
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