CN101769912B - Adjusting platform for in-situ test probe for whole satellite surface heat control material - Google Patents

Abstract

The invention relates to an adjustment platform for in-situ testing probes of thermal control materials on the surface of satellites. The adjustment platform can realize the switch by adjusting the height adjustment mechanism of the nut (7), the adjustment screw (8) and the slider (6). Accurate control of the distance between the adjustment plate (5) and the test probe. The adjustment platform can be used to complete the adjustment of the high-precision switch and the position of the test probe with high precision and high efficiency, thereby greatly shortening the preparation period for the in-situ measurement of the optical properties of the thermal control material on the satellite's entire surface, and for the timely, efficient and high-quality completion Strong support is provided for every measurement task.

Description

Probe adjustment platform for in-situ testing of thermal control materials on the entire satellite surface

technical field

The invention relates to a high-precision mechanical position control device, in particular to a rapid adjustment platform for an in-situ test probe of a thermal control material on the surface of a satellite.

Background technique

In order to grasp the changes in the performance of thermal control materials on the surface of satellites during the production process and before leaving the factory, so as to better determine and judge the performance of satellites, some satellites produced in my country have begun to use surface in-situ measurement technology to measure thermal control performance. Supervision and control. This test is mainly completed by in-situ test tooling for the entire satellite surface, and the test probe part is composed of a portable tester and a high-precision switch. In the measurement, the accuracy of the measurement is mainly guaranteed by the parallelism and distance between the small hole of the tester and the surface to be tested. In order to ensure the above two factors, it is currently done by controlling the positions of four high-precision switches around the test probe. The traditional method is to install the test probe on the test fixture, first determine the distance and parallelism between the test probe and the surface to be tested by comparing the test surface simulation board, and then repeatedly adjust the four high-precision switches until all high-precision switches are on the same proper plane. Because it is difficult to control the accuracy by directly adjusting the position of the switch near the simulated surface, and it is very difficult to make the four switch contacts on the same plane, so the adjustment efficiency and effect of the four high-precision switches are often not ideal.

Contents of the invention

The purpose of the present invention is to provide an adjustment platform, which can complete the adjustment of the position of the test probe and its four high-precision switches with high precision and high efficiency, thereby greatly shortening the preparation period for the in-situ measurement of the optical properties of the thermal control material on the surface of the satellite. , providing strong support for completing each measurement task on time, efficiently and with high quality.

The present invention can be accomplished by the following technical solutions:

An adjustment platform for in-situ testing probes of thermal control materials on the surface of satellites. The base plate of the adjustment platform is rectangular, and each corner is provided with an adjustment nut for height adjustment. A pair of opposite sides of the base plate Grooves are set on the base plate between the adjustment nuts, and two sliders are arranged in each groove, which are respectively located at both ends of the groove, and are connected with the adjacent adjustment nuts through the adjustment screw, and the four sliders support the switch. Adjust the flat plate, on the other pair of opposite sides of the substrate without grooves, a probe holder is provided, the two ends of the probe holder protrude vertically upwards to a certain height from the other pair of opposite sides of the substrate, and then the two ends are folded horizontally To the middle of the substrate, the two ends are connected to the opposite side of the substrate as a whole, buckled on the substrate in a door shape, and the switch adjustment plate is accommodated in the space formed by the probe bracket and the substrate, the probe bracket does not touch the switch adjustment plate, and the test probe is placed on the horizontal part of the probe holder.

Among them, the test probe is composed of an optical tester, a high-precision test switch bracket and a high-precision switch. A ring-shaped high-precision test switch bracket matching the external shape of the tester is installed horizontally below the optical tester. The lower surface of the switch bracket is vertical. There are multiple high-precision switches in the set, and the switches are evenly distributed on the switch bracket.

Wherein, the horizontal part of the probe holder does not touch the switch holder and multiple high-precision switches.

Among them, there are four high-precision switches.

Wherein, the slider is in the shape of a cube with missing corners, and the missing volume is also a cube.

The beneficial effects of the present invention are:

a. The probe is removed from the test fixture and adjusted separately, which avoids the difficulty of online adjustment and the danger of easily touching the surface to be tested;

b. The contact pin of the high-precision switch touches the switch adjustment plate, which can accurately determine the installation position of the high-precision switch;

c. The four-corner slope of the switch adjustment platform is slotted to ensure smooth fit with the slider slope, and can limit the lateral movement of the plate. The height adjustment uses the slider and threaded nut mechanism, and the smaller slope of the slider slope and the adjustment of the threaded nut are guaranteed. Precise controllability for adjusting the height of the deck.

Description of drawings

Figure 1 is a schematic diagram of the adjustment platform.

Among them, 1 is an optical tester, 2 is a high-precision test switch bracket, 3 is a high-precision switch, 4 is a probe bracket, 5 is a switch adjustment plate, 6 is a slider, and 7 is an adjustment nut.

Detailed ways

The present invention will be described in detail below in conjunction with the accompanying drawings.

A ring-shaped high-precision test switch bracket 2 matching the external shape of the tester 1 is installed horizontally below the optical tester 1, and a plurality of high-precision switches 3 are vertically arranged on the lower surface of the switch bracket 2, and the switches 3 are evenly distributed on the switch bracket 2 on. The optical tester 1, the high-precision test switch bracket 2 and the high-precision switch 3 together form a test probe. Usually four switches 3 are taken for testing.

The base plate of the adjustment platform is rectangular, and an adjustment nut 7 for adjusting the height is arranged on each corner of the base plate. A groove is arranged on the base plate surface between the adjustment nuts 7 on a pair of opposite sides of the base plate, and a groove is arranged on each groove. There are two sliders 6 inside, which are respectively located at the two ends of the groove, and are connected with the adjacent adjusting nut 7 through the adjusting screw 8 . Four sliders 6 support the switch to adjust the flat plate 5 . The slider 6 is in the shape of a cube with missing corners, and the missing volume is also a cube. This shape can limit the lateral movement of the switch adjustment panel 5 . Rotating the adjusting nuts 7 on the four corners can make the corresponding four slide blocks 6 slide in the grooves, so that the switch adjusting plate 5 can move up and down accordingly. On the other pair of opposite sides of the substrate without grooves, a probe holder 4 is provided, and the two ends of the probe holder 4 protrude vertically upwards to a certain height from the other pair of opposite sides of the substrate, and then fold horizontally toward the middle of the substrate , the two ends are integrated with the opposite side of the substrate, buckled on the substrate in a door shape, and the switch adjustment plate 5 is accommodated in the space formed by the probe bracket 4 and the substrate, but does not touch the switch adjustment plate 5.

Place the test probe on the probe bracket 4 so that the detection hole of the tester faces down, and the switch 3 and the switch bracket 2 are in a relaxed state. Then rotate the adjustment nuts 7 on the four corners, and in the process of moving up and down, detect the relative position between the aperture of the tester and the switch adjustment flat plate 5 until the switch adjustment flat plate 5 reaches a suitable position and then stops the adjustment. Then, make the contact pins of each high-precision switch 3 be in the position that just fits the switch adjustment plate 5, and then fix the switch 3, thereby completing the adjustment of the test probe. Finally, remove the test probe and install it on the satellite test fixture.

Although the specific embodiments of the present invention have been described and illustrated in detail above, it should be pointed out that we can make various equivalent changes and modifications to the above-mentioned embodiments according to the concept of the present invention, and the functional effects produced by it are still the same. Anything beyond the spirit contained in the specification and drawings shall fall within the protection scope of the present invention.

Claims (4)

1. the adjustment platform for whole satellite surface heat control material in-situ test probe, it is characterized in that, the substrate of adjusting platform is rectangle, on its each angle, be provided with one for adjusting the adjusting nut (7) of height, on real estate between the adjusting nut (7) of one opposite side of substrate, two grooves are set, in each groove, be provided with two slide blocks (6), two slide blocks (6) lay respectively at the two ends of groove, and be connected with contiguous adjusting nut (7) by adjusting screw rod (8), four slide blocks (6) supporting switch is adjusted dull and stereotyped (5), another of substrate that groove is not set to opposite side on, be provided with probe bracket (4), the two ends of probe bracket (4) from substrate described another to outstanding certain altitude vertically upward opposite side, then level is folded to substrate middle part, be linked to be entirety with the opposite side of substrate, in shaped door being buckled on substrate, switch adjustment dull and stereotyped (5) is contained in the space of probe bracket (4) and substrate formation, probe bracket (4) does not touch switch and adjusts dull and stereotyped (5), test probe is positioned on the horizontal component of probe bracket (4), wherein, slide block is unfilled corner cubic shaped.

2. adjustment platform as claimed in claim 1, it is characterized in that, test probe is made up of jointly optical tester (1), high precision measurement switch bracket (2) and high precision switch (3), the annular high precision measurement switch bracket (2) mating with optical tester (1) outer shape is installed to optical tester (1) lower horizontal, what the lower surface of high precision measurement switch bracket (2) was vertical is provided with multiple high precision switches (3), and high precision switch (3) is distributed on high precision measurement switch bracket (2).

3. adjustment platform as claimed in claim 2, is characterized in that, the horizontal component of probe bracket (4) is contact-making switch support (2) and multiple high precision switch (3) not.

4. adjust as claimed in claim 2 or claim 3 platform, it is characterized in that, high precision switch (3) is four.