A kind of second-order nonlinear optical test system that utilizes integrating sphere to realize
Technical field:
The present invention relates to a kind of new second-order nonlinear optical test system that utilizes integrating sphere to realize.
Background technology:
Nonlinear optics is a frontier of contemporary optics, is the research response of material and science of the nonlinear relationship that light intensity presents under the high light effect.In numerous nonlinear optical effects, second order nonlinear optical effect (frequency-doubled effect) be the most noticeable also be the nonlinear effect of studying at most.The spectral range of utilizing second order nonlinear optical effect can the expanded laser light frequency to cover.
At present, the second order nonlinear optical effect test macro is not seen yet ripe commercial machine product, especially carries out accurate quantitative analysis.For overcoming this problem, we have set up a cover to frequency doubled light high resolving power, high sensitivity, and easily distinguish and discern the second order nonlinear optical effect test macro of frequency doubled light and non-frequency doubled light, patent applied for: 200710008880.7.In this cover system, the collection of frequency doubled light is seemed most important, aspect quantitative test, frequency doubled light collection analysis fully is the key of quantitative test especially.Therefore, a kind of mode that can rationally collect frequency doubled light of design is very meaningful.
Summary of the invention:
The objective of the invention is the optical integration ball part is installed in the novel second order nonlinear optical effect test macro of our development, thereby make it can fully collect frequency doubled light, carry out the test of qualitative and quantitative second order nonlinear optical effect more easily.
A kind of second-order nonlinear optical test system based on integrating sphere, in this system, LASER Light Source 1 emitted laser irradiation sample 2, sample 2 places the center of integrating sphere 3 or places the back side of integrating sphere incident light window, integrating sphere 3 is collected the frequency doubled light that sample produces, output to spectrometer 4, after spectrometer 4 beam split light is outputed to detector 5, signal is outputed to instrument control with detector 5 and data analysis system 6 carries out data analysis.
Described LASER Light Source 1 adopts the electric-optically Q-switched solid state laser of output 1.06um laser, or adopts the laser of other wavelength of OPO technology modulation output.
The light-emitting window of described integrating sphere 3 is directly aimed at the slit of spectrometer 4.
Described frequency doubled light is transmitted to spectrometer 4 with optical fiber 7.
The major function of integrating sphere is a light collector, and the light that is collected can be used as diffuse reflection light source or measured source, has been widely used in the multiple optic testing system.Adding integrating sphere in the former patent " second-order nonlinear optical test system " (200710008880.7) is exactly as a light collector and measured source with it.Frequency doubled light repeatedly after the diffuse reflection, evenly distributes the illumination on the whole ball wall through integrating sphere ball wall, so be mapped to the luminous flux that luminous flux on the detector is proportional to frequency doubled light by the window on the ball wall.Therefore, by making comparisons with the test of standard model, the frequency doubled light of tested sample is through integrating sphere, spectrometer beam split, and the luminous flux to the detector just can carry out the size of quantitative test sample frequency-doubled effect again.
When the advantage of sample chamber placement integrating sphere was to use integrating sphere to come the measuring light flux in this test macro, measurement result was very reliable.Integrating sphere can reduce and remove the measuring error that diverse location responsiveness difference is caused on shape, dispersion angle and the detector of light.And integrating sphere also can be thought a kind of light intensity decays device, can reduce strong frequency doubled light may damage detector.This cover test macro makes full use of the advantage of integrating sphere, accurately realizes the qualitative and quantitative test to the frequency-doubled effect of sample.
Description of drawings:
Accompanying drawing 1 is not for using the placement synoptic diagram based on the second-order nonlinear optical test system of integrating sphere of optical fiber, accompanying drawing 2 is for using the placement synoptic diagram based on the second-order nonlinear optical test system of integrating sphere of optical fiber, comprise: LASER Light Source 1, sample 2, integrating sphere 3, spectrometer 4, detector 5, instrument control and data analysis system 6, optical fiber 7.
Before LASER Light Source is positioned at sample, sample is positioned at the back side of integrating sphere center or integrating sphere incident light window, connect the slit of the light-emitting window of integrating sphere and spectrometer or the light-emitting window of integrating sphere is directly aimed at the slit of spectrometer with optical fiber, connect detector behind the spectrometer, detector is connected to instrument control and data analysis system.
Accompanying drawing 3,4 is respectively the frequency multiplication peak figure of nonlinear optical crystal potassium titanium oxide phosphate under 1.06um that instrument control and data gathering system capture and the 1.94um laser.
Embodiment:
Be somebody's turn to do the specific embodiments of invention below in conjunction with description of drawings.
The LASER Light Source that the present invention adopts: adopt electric-optically Q-switched solid state laser output 1.06um laser, or adopt the laser of other wavelength of OPO technology modulation output.Use optical filter, can use wherein a kind of laser of wavelength respectively; Or use the laser of two kinds of wavelength simultaneously.
The integrating sphere that the present invention adopts is general integrating sphere, places the sample chamber, is used to collect the frequency doubled light that sample produces.Sample or place the integrating sphere center or place the back side of integrating sphere incident light window.
Spectrometer preferred resolution≤0.2nm that the present invention adopts, wavelength accuracy≤0.5nm, wavelength repeatable accuracy≤0.3nm.The light-emitting window of integrating sphere is directly aimed at the slit of spectrometer 3.
The detector that the present invention adopts can be selected array type detector for use.
Instrument control and data analysis system that the present invention adopts are used for data acquisition and analysis.
The optical fiber that the present invention adopts is used to connect the light-emitting window of integrating sphere and the slit of spectrometer, and the light that integrating sphere is come out is transmitted to spectrometer.
Embodiment:
Use respectively 1.06um and 1.94um laser testing classical nonlinear optical crystal potassium titanium oxide phosphate (KTiOPO
4, frequency-doubled effect KTP).
Adopt electric-optically Q-switched solid state laser output 1.06um laser, or adopt the laser of OPO technology modulation output 1.94um, add optical filter respectively, make the laser radiation of having only a kind of wave band to sample.Collect the light that sample produces with integrating sphere, be transmitted to the slit of Edinburgh FLS920 spectrometer with optical fiber, spectrometer with frequency doubled light and other veiling glare separately outputs to ANDOR with light
TMThe iDus ccd detector.Instrument control and data gathering system (main frame: intel Pentium Dual-Core Inside
TM) captured the frequency multiplication peak well.Frequency multiplication peak figure under two wavelength sees accompanying drawing 3,4, wherein Fig. 3 be test under the 1.06um arrive at the frequency multiplication peak of 0.532um, Fig. 4 is the frequency multiplication peak at 0.97um that the test under the 1.94um is arrived.