The VD testing circuit that is used for power factor correction control circuit
Technical field
The present invention relates to a kind of voltage detecting circuit, relate in particular to a kind of VD testing circuit that is used for part chopper-type power factor correction control circuit.
Technical background
In recent years, along with development of electronic technology, various electronic equipments, issuable current harmonics of household electrical appliance and reactive power also more and more cause people's attention to the pollution of electrical network, the existence of harmonic wave, not only greatly reduce the power factor of input circuit, and can pollute the detonator circuit fault the public power system.At present, in order effectively to improve power factor, reduction is to the requirement of components and parts and the loss of the components and parts that take effect, can adopt the chopping way of part copped wave in each voltage cycle to control, this part chopper-type power factor correction control circuit must adopt a kind of simple VD testing circuit, therefore, the application's applicant is devoted to study a kind of VD testing circuit that simply is applicable to part chopper-type power factor correction control circuit.
Summary of the invention
The object of the present invention is to provide a kind of VD testing circuit that is used for part chopper-type power factor correction control circuit, it has advantage of simple structure, can detect the VD value.
The technical scheme that realizes above-mentioned purpose is: a kind of VD testing circuit that is used for power factor correction control circuit, described power factor correction control circuit includes a central processing unit, wherein, it comprises a voltage transformer (VT) T, be connected with diode D1 in turn on the output loop of this voltage sensor T, second resistance R 2, comparer D, the 5th resistance R 5 and optocoupler, be connected with the 6th resistance R 6 and the 7th resistance R 7 on one output terminal of optocoupler, the 7th resistance R 7 links to each other with another output terminal of optocoupler and ground connection by one second capacitor C 2, an end that links to each other with the 7th resistance R 7 of second capacitor C 2 links to each other with described central processing unit, also comprise first resistance R 1, first capacitor C 1, the 3rd resistance R 3 and the 4th resistance R 4, wherein:
One end of described first resistance R 1 links to each other with the output terminal of described diode D1, and the other end links to each other with the output terminal of described voltage transformer (VT) T and ground connection;
One end of described first capacitor C 1 links to each other with described comparer D, and the other end links to each other with the output terminal of described voltage transformer (VT) T;
One end of described the 4th resistance R 4 links to each other with the output terminal of described comparer D, and the other end links to each other with the output terminal of described voltage transformer (VT) T;
One end of described the 3rd resistance R 3 links to each other another termination power with the output terminal of described comparer D.
The above-mentioned VD testing circuit that is used for power factor correction control circuit wherein, connects the power supply of 5V on described the 6th resistance R 6, connect the power supply of 15V on described the 3rd resistance R 3.
The invention has the beneficial effects as follows: the present invention compares the alternating voltage half-wave voltage signal of taking-up and the voltage division signal of output dc voltage by comparer, handle by central processing unit, can obtain the interchange and the dc voltage value of required measurement, this circuit has advantage simple in structure, practical.
Description of drawings
Fig. 1 is the circuit diagram of VD testing circuit of the present invention.
Embodiment
The invention will be further described below in conjunction with accompanying drawing.
See also Fig. 1, there is shown a kind of alternating current input voltage magnitude testing circuit that is used for power factor correction control circuit of the present invention, power factor correction control circuit includes a central processing unit 2, the present invention includes a voltage transformer (VT) T, be connected with diode D1 in turn on the output loop of this voltage sensor T, second resistance R 2, comparer D, the 5th resistance R 5 and optocoupler 1, be connected with the 6th resistance R 6 and the 7th resistance R 7 on one output terminal of optocoupler 1, the 7th resistance R 7 links to each other with another output terminal of optocoupler 1 and ground connection by one second capacitor C 2, an end that links to each other with the 7th resistance R 7 of second capacitor C 2 links to each other with central processing unit 2, also comprise first resistance R 1, first capacitor C 1, the 3rd resistance R 3 and the 4th resistance R 4, wherein:
One end of first resistance R 1 links to each other with the output terminal of diode D1, and the other end links to each other with the output terminal of voltage transformer (VT) T and ground connection;
One end of first capacitor C 1 links to each other with comparer D, and the other end links to each other with the output terminal of voltage transformer (VT) T;
One end of the 4th resistance R 4 links to each other with the output terminal of comparer D, and the other end links to each other with the output terminal of voltage transformer (VT) T;
One end of the 3rd resistance R 3 links to each other with the output terminal of comparer D, the power supply of another termination 15V;
Connect the power supply of 5V on the 6th resistance R 6.
The principle of work of circuit is: the voltage division signal Uo that voltage transformer (VT) T takes out alternating voltage half-wave voltage signal and output dc voltage compares, when the instantaneous value of alternating voltage is slightly larger than the VD value, export a negative edge signal to central processing unit 2, after central processing unit 2 captures this signal, the record current time of synchro timer, simultaneously the instantaneous voltage of AC-input voltage output element is sampled, then this value is converted accordingly, can obtain the interchange and the dc voltage value of required measurement.
Need to prove: above only unrestricted technical scheme of the present invention in order to explanation, although the present invention is had been described in detail with reference to the foregoing description, those of ordinary skill in the art is to be understood that: still can make amendment or be equal to replacement the present invention, and not breaking away from any modification or partial replacement of the spirit and scope of the present invention, it all should be encompassed in the middle of the claim scope of the present invention.