CN101676704A - distortion tester - Google Patents
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- CN101676704A CN101676704A CN200810151034A CN200810151034A CN101676704A CN 101676704 A CN101676704 A CN 101676704A CN 200810151034 A CN200810151034 A CN 200810151034A CN 200810151034 A CN200810151034 A CN 200810151034A CN 101676704 A CN101676704 A CN 101676704A
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- distortion
- turntable
- light source
- imaging system
- tester
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- 230000003287 optical effect Effects 0.000 claims abstract description 34
- 238000003384 imaging method Methods 0.000 claims abstract description 19
- 230000004304 visual acuity Effects 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 13
- 230000006870 function Effects 0.000 abstract description 3
- 238000012360 testing method Methods 0.000 description 11
- 238000000034 method Methods 0.000 description 10
- 238000009434 installation Methods 0.000 description 5
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- 238000004458 analytical method Methods 0.000 description 3
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- 238000013461 design Methods 0.000 description 2
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- 230000004075 alteration Effects 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
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Abstract
本发明涉及一种畸变测试仪,包括转台,该测试仪还包括光源以及显微成像系统;光源以及显微成像系统处于同一光轴上并置于转台两侧。本发明提供了一种测量精度高、效率高、结构稳定且功能可以扩展的畸变测试仪。
The invention relates to a distortion tester, which includes a turntable. The tester also includes a light source and a microscopic imaging system. The light source and the microscopic imaging system are on the same optical axis and placed on both sides of the turntable. The invention provides a distortion tester with high measurement precision, high efficiency, stable structure and expandable functions.
Description
Claims (9)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN2008101510345A CN101676704B (en) | 2008-09-19 | 2008-09-19 | A Distortion Tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN2008101510345A CN101676704B (en) | 2008-09-19 | 2008-09-19 | A Distortion Tester |
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CN101676704A true CN101676704A (en) | 2010-03-24 |
CN101676704B CN101676704B (en) | 2011-05-25 |
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CN2008101510345A Expired - Fee Related CN101676704B (en) | 2008-09-19 | 2008-09-19 | A Distortion Tester |
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Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104034514A (en) * | 2014-06-12 | 2014-09-10 | 中国科学院上海技术物理研究所 | Large visual field camera nonlinear distortion correction device and method |
CN104406770A (en) * | 2014-10-27 | 2015-03-11 | 中国科学院上海光学精密机械研究所 | Distortion measuring apparatus of wave aberration measuring module, and distortion correction method |
CN104502065A (en) * | 2014-12-09 | 2015-04-08 | 中国科学院西安光学精密机械研究所 | Wide-angle lens distortion testing device and sampling determination method |
CN105547658A (en) * | 2015-12-05 | 2016-05-04 | 中国航空工业集团公司洛阳电光设备研究所 | Scanning speed uniformity test method and scanning speed uniformity test system |
CN105758623A (en) * | 2016-04-05 | 2016-07-13 | 中国科学院西安光学精密机械研究所 | TDI-CCD-based large-caliber long-focal-length remote sensing camera distortion measuring device and method |
CN107153000A (en) * | 2017-06-20 | 2017-09-12 | 中国地质大学(武汉) | A kind of portable filter optical performance detecting device and its detection method |
CN108765301A (en) * | 2018-03-27 | 2018-11-06 | 长春理工大学 | A kind of optical system and its distortion correction method and system |
CN109596319A (en) * | 2018-11-26 | 2019-04-09 | 歌尔股份有限公司 | The detection system and method for optics module parameter |
CN113340567A (en) * | 2021-04-30 | 2021-09-03 | 北京控制工程研究所 | System and method for testing angular magnification and consistency of beam-expanding optical system |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2558982Y (en) * | 2002-08-16 | 2003-07-02 | 中国科学院西安光学精密机械研究所 | Distortion measuring device for ultra-wide view field optical system |
CN201255686Y (en) * | 2008-09-19 | 2009-06-10 | 中国科学院西安光学精密机械研究所 | A Distortion Tester |
-
2008
- 2008-09-19 CN CN2008101510345A patent/CN101676704B/en not_active Expired - Fee Related
Cited By (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104034514A (en) * | 2014-06-12 | 2014-09-10 | 中国科学院上海技术物理研究所 | Large visual field camera nonlinear distortion correction device and method |
CN104406770A (en) * | 2014-10-27 | 2015-03-11 | 中国科学院上海光学精密机械研究所 | Distortion measuring apparatus of wave aberration measuring module, and distortion correction method |
CN104406770B (en) * | 2014-10-27 | 2017-12-01 | 中国科学院上海光学精密机械研究所 | The distortion measurement device and distortion correction method of wave aberration measurement module |
CN104502065A (en) * | 2014-12-09 | 2015-04-08 | 中国科学院西安光学精密机械研究所 | Wide-angle lens distortion testing device and sampling determination method |
CN104502065B (en) * | 2014-12-09 | 2017-06-27 | 中国科学院西安光学精密机械研究所 | Wide-angle lens distortion test device and sampling determination method |
CN105547658B (en) * | 2015-12-05 | 2019-01-29 | 中国航空工业集团公司洛阳电光设备研究所 | A kind of scanning speed homogeneity testing method and system |
CN105547658A (en) * | 2015-12-05 | 2016-05-04 | 中国航空工业集团公司洛阳电光设备研究所 | Scanning speed uniformity test method and scanning speed uniformity test system |
CN105758623A (en) * | 2016-04-05 | 2016-07-13 | 中国科学院西安光学精密机械研究所 | TDI-CCD-based large-caliber long-focal-length remote sensing camera distortion measuring device and method |
CN105758623B (en) * | 2016-04-05 | 2018-04-10 | 中国科学院西安光学精密机械研究所 | TDI-CCD-based large-caliber long-focal-length remote sensing camera distortion measuring device and method |
CN107153000A (en) * | 2017-06-20 | 2017-09-12 | 中国地质大学(武汉) | A kind of portable filter optical performance detecting device and its detection method |
CN107153000B (en) * | 2017-06-20 | 2023-10-31 | 中国地质大学(武汉) | A portable filter optical performance detection device and its detection method |
CN108765301A (en) * | 2018-03-27 | 2018-11-06 | 长春理工大学 | A kind of optical system and its distortion correction method and system |
CN108765301B (en) * | 2018-03-27 | 2020-08-07 | 长春理工大学 | An optical system and its distortion correction method and system |
CN109596319A (en) * | 2018-11-26 | 2019-04-09 | 歌尔股份有限公司 | The detection system and method for optics module parameter |
CN113340567A (en) * | 2021-04-30 | 2021-09-03 | 北京控制工程研究所 | System and method for testing angular magnification and consistency of beam-expanding optical system |
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Publication number | Publication date |
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CN101676704B (en) | 2011-05-25 |
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Owner name: XI'AN CHINA SCIENCES GROUP BUFFING MACHINE INVESTM Free format text: FORMER OWNER: XI-AN INST. OF OPTICS AND FINE MECHANICS, CHINESE ACADEMY OF SCIENCES Effective date: 20131206 |
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Effective date of registration: 20131206 Address after: 710119, Shaanxi Province, Xi'an hi tech Zone, new industrial park, 17 information Avenue, ancestral building on the third floor, room 323 Patentee after: XI'AN INSTITUTE OF OPTICS AND PRECISION MECHANICSOF CAS Address before: 710119 Xi'an province high tech Zone New Industrial Park Information Avenue, No. 17 Patentee before: XI'AN INSTITUTE OF OPTICS AND PRECISION MECHANICS OF CAS |
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Owner name: XI'AN ZHONGKE LICHI PHOTOVOLTAICS TECHNOLOGY CO., Free format text: FORMER OWNER: XI'AN CHINA SCIENCES GROUP BUFFING MACHINE INVESTMENT HOLDING CO., LTD. Effective date: 20150128 |
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Effective date of registration: 20150128 Address after: 710119, Shaanxi province hi tech Zone, Xi'an new industrial park, 17 information Avenue, the same floor, three floor Patentee after: Xi'an center Photoelectric Technology Co.,Ltd. Address before: 710119, Shaanxi Province, Xi'an hi tech Zone, new industrial park, 17 information Avenue, ancestral building on the third floor, room 323 Patentee before: XI'AN INSTITUTE OF OPTICS AND PRECISION MECHANICSOF CAS |
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Effective date of registration: 20160217 Address after: 710000, 204, arc building, No. 60, West Avenue, new industrial park, Shaanxi, Xi'an Patentee after: Shaanxi optoelectronic integrated circuit pilot Technology Research Institute Co.,Ltd. Address before: 710119, Shaanxi province hi tech Zone, Xi'an new industrial park, 17 information Avenue, the same floor, three floor Patentee before: Xi'an center Photoelectric Technology Co.,Ltd. |
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Granted publication date: 20110525 |