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CN101666923B - Method and system for processing defects of liquid crystal display panel and maintenance equipment - Google Patents

Method and system for processing defects of liquid crystal display panel and maintenance equipment Download PDF

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Publication number
CN101666923B
CN101666923B CN200810119543XA CN200810119543A CN101666923B CN 101666923 B CN101666923 B CN 101666923B CN 200810119543X A CN200810119543X A CN 200810119543XA CN 200810119543 A CN200810119543 A CN 200810119543A CN 101666923 B CN101666923 B CN 101666923B
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defect
image
maintenance
liquid crystal
display panel
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CN101666923A (en
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吕志超
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BOE Technology Group Co Ltd
Beijing BOE Optoelectronics Technology Co Ltd
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Beijing BOE Optoelectronics Technology Co Ltd
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Abstract

The invention provides a method and a system for processing defects of a liquid crystal display panel and maintenance equipment. The method for processing the defects of the liquid crystal display panel comprises the following steps: collecting a defect image of a defect area on a liquid crystal display panel; analyzing the defect image and judging the defect type; and searching a corresponding maintenance scheme according to the defect type. The system for processing the defects of the liquid crystal display panel comprises an image acquisition module, a defect judgment module and a maintenance selection module. The maintenance equipment for the defects of the liquid crystal display panel comprises the processing system, a laser system, an electromechanical system and at least one control host. According to the processing method, the processing system and the maintenance equipment for the defects of the liquid crystal display panel, provided by the invention, the defect type is judged by analyzing the defect image, and then the liquid crystal display panel is maintained according to the corresponding maintenance scheme, so that the accuracy of judging the defect type can be improved, and the maintenance efficiency is improved.

Description

The disposal route of defects of liquid crystal display panel, disposal system and maintenance of equipment
Technical field
The present invention relates to the manufacturing field of LCD, relate in particular to a kind of disposal route, disposal system and maintenance of equipment of defects of liquid crystal display panel.
Background technology
In the manufacture process of Thin Film Transistor-LCD (Thin Film Transistor Liquid CrystalDisplay is hereinafter to be referred as TFT-LCD), may make product produce defective owing to clean room foreign matter, technological parameter are provided with problem.Detection to defective at present generally has three kinds of methods; First kind is artificial vision's detection method (Human Visual Ins pection); Second kind is Machine Vision Detection method (Machine Visual Inspection), and the third is electrical parameter detection method (ElectricalParameter Inspection).Present most of producer still uses first kind of detection method, and the shortcoming of this method is that the subjectivity with detection person has much relations, and detection can cause the fatigue of human eye and influence the accuracy of testing result for a long time.
Detecting operator completion defects detection; After confirming defective locations; Maintenance activity person at first finds defective locations, carries out type identification according to characteristics such as the actual form of defective, position, brightness, sizes, confirms defect type; For example picture element flaw or signal line imperfection manually select corresponding maintenance program to keep in repair at last.General maintenance all be to use laser maintaining equipment to the defective generation area cut, technologies such as welding or chemical gaseous phase deposition repair defective, and get into subsequent processing through detecting qualified back again according to normal article.
This shows; Differentiation defect type of the prior art and maintenance program such as confirm at process a large amount of human factor of having mixed; Require maintenance activity person very familiar to undesirable feature and genesis mechanism on the one hand, also need more practical experience be arranged to operation of equipment and parameter, the accuracy rate that causes defect type to judge on the other hand is lower; Maintenance efficiency is lower, and the equipment mobility is lower.
Summary of the invention
The objective of the invention is provides a kind of disposal route, disposal system and maintenance of equipment of defects of liquid crystal display panel in order to overcome the shortcoming that the type judging nicety rate is lower, maintenance efficiency is lower of defects of liquid crystal display panel in the prior art.
For realizing above-mentioned purpose, the invention provides a kind of disposal route of defects of liquid crystal display panel, comprising:
The defect image of defect area on step 1, the collection display panels;
Step 2, said defect image is analyzed and judged defect type;
Step 3, search corresponding maintenance program according to said defect type.
Above-mentioned steps 2 is specially:
After defect image carried out Filtering Processing, to carrying out dividing processing through the defect image after the Filtering Processing;
Defect image after the dividing processing is carried out binary conversion treatment, extract the image of each layer in the defect image;
Textural characteristics and edge continuity characteristic to each tomographic image are analyzed;
From textural characteristics and the undesirable extracted region defect characteristic of edge continuity characteristic;
Obtain corresponding defect type according to said defect characteristic.
Can also comprise after the above-mentioned steps 3:
Step 4, keep in repair according to the defect area of said maintenance program to display panels.
A kind of disposal system of defects of liquid crystal display panel is characterized in that, comprising:
Image capture module is used to obtain the defect image of defect area on the display panels;
The defective discrimination module is connected with said image capture module, is used for said defect image is analyzed and judged defect type;
Module is selected in maintenance; Be connected with said defective discrimination module; Simultaneously with the memory module connection that stores various defect types and corresponding maintenance program; Be used for selecting maintenance program according to said defect type, the maintenance program in the said memory module comes from the graphical user interface typing or programmable device is downloaded.
Above-mentioned defective discrimination module can comprise:
Feature extraction unit is connected with said image capture module, is used for extracting defect characteristic from said defect image;
The defective judgement unit is connected with said feature extraction unit, is used for judging defect type according to said defect characteristic;
Defected memory cell is connected with said defective judgement unit, is used to write down the defect characteristic of various defect types.
Above-mentioned feature extraction unit comprises:
The image filtering subelement is used for the defect image that obtains is carried out filtering;
The image segmentation subelement is connected with said image filtering subelement, is used for filtered defect image is carried out dividing processing;
Tomographic image extracts subelement, is connected with said image segmentation subelement, is used for the image after the said dividing processing is carried out binary conversion treatment, extracts the image of each layer of thin film transistor (TFT);
The feature extraction subelement extracts subelement with tomographic image and is connected, and analyzes through image texture features and edge continuity characteristic to said each layer, from textural characteristics and the undesirable zone of edge continuity characteristic, extracts defect characteristic.
A kind of maintenance of equipment of defects of liquid crystal display panel of the disposal system that comprises above-mentioned defects of liquid crystal display panel comprises:
Laser system is used for according to maintenance program defects of liquid crystal display panel being carried out laser maintaining;
Mechatronic Systems is used to provide gas and uses electric control, assists the disposal system of laser system and defects of liquid crystal display panel to accomplish defect image collection and defective maintenance;
At least one main control system, the disposal system that is used to described Mechatronic Systems, laser system and defects of liquid crystal display panel provides operations necessary instruction and software support.
Above-mentioned laser system comprises:
Laser instrument is used to provide maintenance laser;
Wavelength selector is arranged in the delivery optics of keeping in repair laser, and contiguous said laser instrument is used for selecting the maintenance Wavelength of Laser;
Many multiplying powers eyepiece group is arranged in the delivery optics of maintenance laser, and contiguous the display panels that will keep in repair is used to guide said maintenance laser that display panels is keeped in repair;
Transmitted light source is positioned at below the board of placing the display panels that institute will keep in repair, for maintenance provides background illumination with backlight.
Above-mentioned Mechatronic Systems comprises the horizontal support that is positioned on the board, is fixed on the horizontal support and the longitudinal carrier vertical with horizontal support, is equipped with the disposal system of said laser system and defects of liquid crystal display panel on the longitudinal carrier.
The disposal system of above-mentioned defects of liquid crystal display panel also comprises:
Input/output module is used for getting in touch with main control system.
The invention provides a kind of disposal route, disposal system and maintenance of equipment of defects of liquid crystal display panel,, defect image analysis is obtained defect characteristic through gathering defect image; Differentiate defect type according to defect characteristic, make that the differentiation of defect type is more accurate, according to the selected maintenance program of defect type; Under the control of main control system; Accomplish the maintenance to the defective liquid crystal panel by Mechatronic Systems, laser system, improve maintenance efficiency, the mobility of maintenance of equipment also is improved.
Through accompanying drawing and embodiment, technical scheme of the present invention is done further detailed description below.
Description of drawings
Fig. 1 is the process flow diagram of the disposal route embodiment one of defects of liquid crystal display panel of the present invention;
Fig. 2 is the process flow diagram of the disposal route embodiment two of defects of liquid crystal display panel of the present invention;
Fig. 3 is the structural representation of the disposal system embodiment of defects of liquid crystal display panel of the present invention;
Fig. 4 is the structural representation of defective discrimination module among the disposal system embodiment of defects of liquid crystal display panel of the present invention;
Fig. 5 is the structural representation of the maintenance of equipment embodiment of defects of liquid crystal display panel of the present invention;
Fig. 6 forms synoptic diagram for laser system among the maintenance of equipment embodiment of defects of liquid crystal display panel of the present invention;
Fig. 7 is a defect type synoptic diagram one in the embodiment of the invention;
Fig. 8 is a defect type synoptic diagram two in the embodiment of the invention;
Fig. 9 is a maintenance program typing schematic flow sheet in the embodiment of the invention;
Figure 10 is the practical implementation process flow diagram when in the embodiment of the invention liquid crystal panel defective being keeped in repair.
Embodiment
The TFT device of the TFT-LCD that laser maintaining equipment in the embodiment of the invention is keeped in repair is multilayer, many cross-like normally; The figure complexity is high; The characteristic of defective also has diversity and complicacy; But the liquid crystal panel device architecture basically identical of while same model, the TFT figure has stronger repeatability.The genesis mechanism difference of every kind of defective may need different maintenance programs, and the technical scheme that the embodiment of the invention provides can be judged defective automatically and select maintenance program to keep in repair according to defect type.
Fig. 1 comprises the steps: for the process flow diagram of the disposal route embodiment one of defects of liquid crystal display panel of the present invention
The defect image of defect area on step 101, the collection display panels;
Step 102, defect image is analyzed and judged defect type;
Step 103, search corresponding maintenance program according to defect type.
In the present embodiment defect image is analyzed and judged that defect type is specially: after defect image is carried out Filtering Processing, carrying out dividing processing through the defect image after the Filtering Processing; Image after the dividing processing is carried out binary conversion treatment, extract the image of each layer in the defect image; Textural characteristics and edge continuity characteristic to each tomographic image are analyzed; From textural characteristics and the undesirable extracted region defect characteristic of edge continuity characteristic; Obtain corresponding defect type according to said defect characteristic.The module that stores the maintenance program corresponding with defect type is set simultaneously, can directly searches corresponding maintenance program according to defect type.The step of in the present embodiment defect image analysis being obtained defect characteristic can realize through special IC or universal integrated circuit.
Can analyze through defect image in the present embodiment defect area; Judge defect type; Automatically select maintenance program according to defect characteristic then, can improve the accuracy that defect type is differentiated, confirm maintenance program; And can further increase the maintenance step, according to maintenance program display panels is keeped in repair.Fig. 2 is for the process flow diagram of the disposal route embodiment two of defects of liquid crystal display panel of the present invention, and is as shown in Figure 2, comprises the steps:
The defect image of defect area on step 201, the collection display panels;
Step 202, defect image is analyzed and judged defect type;
Step 203, from logging modle, search corresponding maintenance program according to defect type;
Step 204, keep in repair according to maintenance program.
Present embodiment is on the basis of the foregoing description, has increased the step of defects of liquid crystal display panel being keeped in repair according to maintenance program.
Can be in the present embodiment through gathering defect image, then the defect image of gathering is analyzed and judged defect type, search corresponding maintenance program according to defect type again, the accuracy of defects detection can be improved, and maintenance efficiency can be improved.
Fig. 3 is the structural representation of the disposal system embodiment of defects of liquid crystal display panel of the present invention; As shown in Figure 3; Disposal system comprises image capture module 1, defective discrimination module 2, maintenance selection module 3 and memory module 4, and wherein image capture module 1 is used to obtain the defect image of defect area on the display panels; Defective discrimination module 2 is connected with said image capture module 1, is used for said defect image is analyzed and judged defect type; Maintenance selects module 3 to be connected with defective discrimination module 2; Simultaneously with memory module 4 connections of various defect types of storage and corresponding maintenance program; Be used for selecting corresponding maintenance program according to said defect type; Maintenance program in the memory module 4 comes from graphical user interface (GUI) typing or programmable device is downloaded, and this memory module 4 is extraneous input for neural network structure can receive, also can self-teaching.
The disposal system of the defects of liquid crystal display panel in the present embodiment; Can differentiate defect type according to the defect image of the defect area that collects automatically; And can select and the corresponding maintenance program of this defect type, can improve the accuracy rate that defective is differentiated, improve maintenance efficiency.
Defective discrimination module in the present embodiment can further be divided according to function; Fig. 4 is the structural representation of defective discrimination module among the disposal system embodiment of defects of liquid crystal display panel of the present invention; As shown in Figure 4; Defective discrimination module 2 further comprises feature extraction unit 21, defective judgement unit 22 and defected memory cell 23; Feature extraction unit 21 is used for the defect image of defect area is analyzed, and extracts defect characteristic, and defective judgement unit 22 is used for differentiating defect type according to the record of the defect characteristic of 23 pairs of defect types of defected memory cell and correspondence thereof; Defected memory cell 23 is used for recording defect type and corresponding defect characteristic thereof, and present embodiment is that defect type and corresponding defect characteristic thereof are stored respectively with defect type and corresponding maintenance program thereof.
Wherein feature extraction unit 21 comprises that image filtering subelement 211, image segmentation subelement 212, tomographic image extract subelement 213, feature extraction subelement 214; Wherein image filtering subelement 211 is used for the defect image that obtains is carried out filtering; Image segmentation subelement 212 is connected with image filtering subelement 211; Be used for filtered defect image is cut apart; Tomographic image extracts subelement 213 and is used for the image after the dividing processing is carried out binary conversion treatment, extracts the image of each layer of thin film transistor (TFT); Feature extraction subelement 214 extracts subelement with tomographic image and is connected; Image texture features and edge continuity characteristic through to said each layer are analyzed; From textural characteristics and the undesirable zone of edge continuity characteristic, extract defect characteristic; Judge defect type by defective judgement unit 22 according to defect characteristic again, select module 3 from memory module 4, to select maintenance program by maintenance at last according to defect type.The function that feature extraction unit in the present embodiment is handled image can pass through special IC (ASIC) or universal integrated circuit is realized, also can be to realize through software.
The disposal system of the defects of liquid crystal display panel in the present embodiment can be obtained defect image, judges defect type according to defect image, searches corresponding maintenance program again, can improve the accuracy rate that defect type is differentiated, and searches corresponding maintenance program accurately.
Defect processing device in the present embodiment can use in the maintenance of equipment embodiment of following defects of liquid crystal display panel, also can carry out simultaneously the step among the disposal route embodiment of above-mentioned defects of liquid crystal display panel.
The present invention also provides a kind of maintenance of equipment of defects of liquid crystal display panel; The disposal system of the defects of liquid crystal display panel in comprising the foregoing description; Also comprise: laser system, Mechatronic Systems and main control system; Wherein the disposal system of defects of liquid crystal display panel can be judged defect type according to defect image, and judges maintenance program; Laser system is carried out laser maintaining according to selected maintenance program; Mechatronic Systems is used to provide gas and uses electric control, assists the disposal system of laser system and defects of liquid crystal display panel to carry out the defect image collection and display panels is carried out laser maintaining; The disposal system that main control system is used to laser system, Mechatronic Systems and defects of liquid crystal display panel provides operations necessary instruction and software support.
Mechatronic Systems in the present embodiment is the basis of maintenance of equipment, comprises the gas on basis and with indispensable parts such as electric control unit and sensors, Fig. 5 is the structural representation of the maintenance of equipment embodiment of defects of liquid crystal display panel of the present invention; As shown in Figure 5; Place liquid crystal panel 62 to be keeped in repair on the board 61 of maintenance of equipment, board can use the marble structure, and horizontal support 63 is fixed on the board; Horizontal support 63 comprises X axis linear motor and track; Longitudinal carrier 64 is fixed on the horizontal support 63, comprises Y axis linear motor and track, on longitudinal carrier 64, is equipped with the optical system 65 of the disposal system formation of laser system and defects of liquid crystal display panel.Optical system 65 can be moved on the Z-direction vertical with liquid crystal panel, and its motion is controlled by Z axle step motor.Mechatronic Systems also is connected with main control system 7, and dotted line representes that main control system comes the CD-ROM drive motor motion through the total line traffic control motor driver of PLC, can also control the optical system 65 that is assemblied on the longitudinal carrier 64 simultaneously among the figure.
The maintenance of equipment of the defects of liquid crystal display panel that provides in the present embodiment can be classified to defective automatically, and selects corresponding maintenance program to keep in repair according to defect type, can improve the accuracy rate that defect type detects, and maintenance efficiency is provided.
Fig. 6 forms synoptic diagram for laser system among the maintenance of equipment embodiment of defects of liquid crystal display panel of the present invention; As shown in Figure 6; Laser system in the present embodiment comprises: other optical device in laser instrument 50, many multiplying powers eyepiece group 58, transmitted light source 521, reflection source 522, slit (Slit light source) 523 and the laser maintaining light path; Like deviation prism 53, frequency multiplier 54, wavelength selector 55, slit selector switch (Slit selector switch) 56, condenser lens 57, first spectroscope 591, second spectroscope 592, the 3rd spectroscope 593; Wherein laser instrument 50 is used to provide detection and maintenance laser; The principle of laser instrument is the pulse laser that the photon that produces stimulated radiation in the resonator cavity sends different wave length that acts on that gain medium receives the excitation pumping source; Also be provided with laser cooling device 51 in the present embodiment, come cooling laser device 50 with recirculated water.Light source comprises transmitted light source 521, reflection source 522 and slit 523; Transmitted light source 521 is positioned at the board below; For maintenance liquid crystal panel 62 provides background illumination with backlight, reflection source 522 is parts of laser optical path, for the CCD pickup image provides illumination; Slit 523 also is the part of laser optical path, and illumination is provided during for slit selector switch 56 adjustment shapes; Wherein deviation prism 53 makes laser accomplish the deflection of certain angle; Change the laser outbound course, frequency multiplier 54 is used for amplifying laser, and wavelength selector 55 can effectively be selected printing opacity laser; Slit selector switch 56 is used for controlling the shape that laser penetrates; Spectroscope can see through different light according to the refractive index difference of light, comprises 3 spectroscopes in the present embodiment light path, and wherein first spectroscope 591 light that reflection source 522 is sent is incorporated in the light path; Second spectroscope 592 outputs to defect image the disposal system 8 of defects of liquid crystal display panel; The light that the 3rd spectroscope 593 sends slit is incorporated in the light path, and the defect image of 57 pairs of picked-ups of condenser lens is assembled to obtain distinct image, and many multiplying powers eyepiece group 58 is made up of the camera lens of a plurality of multiplying powers; Comprise 5X, 20X, 50X, 100X in the present embodiment, the conversion of the camera lens of different multiplying is accomplished through the drive of eyepiece selector switch.The effect of 5X, 20X is to be used for observing object, confirms defect area; 50X, 100X can be used for amplifying defective and confirm characteristics such as defective border and form color, and can carry out laser maintaining by transmission laser.
The disposal system of the defects of liquid crystal display panel in the present embodiment wherein can also comprise the input/output module of getting in touch with main control system.
In the practical implementation process; The image information input is to be assembled through convergent lens by the defect image that the eyepiece group obtains; Be transferred to the ccd image acquisition module via the spectroscope reflected light path again, image capture module is gathered the signal that transmits with the light form and is obtained colored image information and send the defective discrimination module to.The defective discrimination module is divided into three unit, and first is a feature extraction unit, and its effect is that color image data is carried out analyzing and processing; Via image filtering filtering clutter, with certain proportion every width of cloth coloured image is carried out equal portions then and cut apart, dwindle process range; Again image is carried out image binaryzation, image binaryzation is meant that according to coloured image promptly each part of TFT device is of different shades; Like grid line layer is golden yellow, and the source-drain electrode layer is light yellow, sets gray threshold; Extract each layer; At last image is carried out rim detection, i.e. each tomographic image of Detection and Extraction and textural characteristics between each layer and edge continuity characteristic, the discontinuous or undesirable part of textural characteristics is carried out defect characteristic and is extracted for figure; The defect characteristic that extracts is input to the defective judgement unit; Carry out the judgement of defect type according to the record of defected memory cell by the defective judgement unit; The selected maintenance program of module is selected in maintenance, after input/output module is sent to main control system, has main control system control to accomplish further maintenance job; Store the defect characteristic of various defectives in the defected memory cell, have ability of self-teaching.
Also comprise a main control system in the embodiment of the invention, for the disposal system of Mechatronic Systems, laser system and defects of liquid crystal display panel provides operations necessary instruction and software support.Main control system can be through control able to programme (PLC) bus driver linear motor; (Cable) links to each other with optical system through cable; Realize relevant control of laser and image transmission result's transmission through user interface (UI), the defect characteristic of the various defectives of mentioning in the above-described embodiments and to maintenance program that should defective can be from main control system typing and be written to stored data base.
The maintenance of equipment of the defects of liquid crystal display panel that the embodiment of the invention provides; Can judge defect type according to the defect image of defect area; And search corresponding maintenance program panel of LCD is keeped in repair; This technical scheme has reduced the interference of human factor, has improved the accuracy rate and the maintenance efficiency of defects detection, and the equipment mobility is improved.
The picture element flaw that causes with grid line (Gate) layer metal residual now is that example describes disposal route involved in the present invention, disposal system and maintenance of equipment.Grid line layer metal residual defective can be like Fig. 7 and shown in Figure 8; The IT0 electrode 93, TFT device 94, the metal residual 95 that comprise grid line figure 91, data line figure 92, each color pixel correspondence among Fig. 7 on the display panels; The image that collects is carried out can obtaining image as shown in Figure 8 after the binary conversion treatment; Comprising normal binaryzation grid line figure 96 and binaryzation metal residual figure 98; Obtain maintenance program through handling, confirm and to implement excision (cutting) to metal residual, excise along the excision maintenance thread 97 shown in Fig. 7 during maintenance.
In order to use correct method for maintaining; Should be in defected memory cell the corresponding defect characteristic of defective of typing the type, select the typing maintenance program corresponding, i.e. some maintenance parameters in the module in maintenance with defect type; Detailed process is as shown in Figure 9, comprises the steps:
The title of step 301, typing defective and corresponding defect characteristic, to the grid line layer metal residual in the foregoing description, defect characteristic is the sudden change of grid line layer pattern edge gradient, and is discontinuous;
Step 302, selection maintenance laser parameter for example for the grid line layer metal residual, select to use the laser of 532nm, are shaped as linear laser;
The eyepiece multiple that step 303, selection are used, for example the eyepiece of 50X is used in selection;
Step 304, selection maintenance program are selected excision, and metal residual is implemented excision.
Finish the back as maintenance program one use for typing; Defective and maintenance program thereof for other types also can take same mode from the main control system typing; And final in memory module, form the defect characteristic corresponding with each defect type, and maintenance program accordingly, more than can pass through the main control system typing to the typing of defect characteristic and maintenance program; The parameter that maintenance parameter wherein is not limited only to enumerate in the above-mentioned steps also comprises for example parameter such as back light source brightness; Can be written in the random-access memory (ram) through software UI for maintenance program, or download, can applying neural network realize self-teaching, improve maintenance program from programmable device.
When the liquid crystal panel that has grid line layer metal residual defective is keeped in repair, shown in figure 10, comprise the steps:
Step 401, liquid crystal panel is put on the board; Utilize the CCD camera to carry out contraposition then; Read alignment mark and liquid crystal panel sign (Panel ID), utilize the liquid crystal panel sign can from factory's computing system, obtain to upload defective locations information by detecting operator;
Step 402, search the coordinate at zero point of liquid crystal panel through reading alignment mark;
Step 403, confirm behind above-mentioned defective locations and the zero point coordinate that Mechatronic Systems sends the instruction control linear motor and drive optical system and move to defective locations and gather defect image by eyepiece;
Step 404, image capture module obtain above-mentioned defect image and send the defective discrimination module to;
Step 405, defective discrimination module to the image that obtains carry out filtering, cut apart, binaryzation, rim detection and extract defect characteristic, this defect characteristic shows the sudden change of grid line layer pattern edge gradient, and is discontinuous;
Step 406, judge that according to defect characteristic defect type is the grid line layer metal residual, and execution in step 407, if do not judge the type of defective, then finish maintenance maintenance step;
Step 407, selecting the corresponding maintenance program of module searches by maintenance, is maintenance program one for the maintenance program of grid line layer metal residual as stated;
Step 408, if find corresponding maintenance program, then corresponding maintenance program is sent to main control system and execution in step 409 through input/output module, if do not find maintenance program then to finish to keep in repair step;
Step 409, main control system are accomplished the location according to maintenance program control motor driver and laser system; Adjust laser parameters simultaneously; For example use the laser of 532nm, use linear light sorurce, select the eyepiece of 50X; At last grid line layer metal residual part is excised along the grid line cabling, accomplish maintenance.
The disposal route of defects of liquid crystal display panel provided by the invention, disposal system and maintenance of equipment through gathering the defect area defect image, obtain defect characteristic to defect image analysis; Differentiate defect type according to defect characteristic, make that the differentiation of defect type is more accurate, according to the selected maintenance program of defect type; Under the control of main control system; Mechatronic Systems, laser system are accomplished the maintenance to the defective liquid crystal panel, have improved maintenance efficiency, and the mobility of maintenance of equipment also is improved.
What should explain at last is: above embodiment is only in order to technical scheme of the present invention to be described but not limit it; Although the present invention has been carried out detailed explanation with reference to preferred embodiment; Those of ordinary skill in the art is to be understood that: it still can make amendment or be equal to replacement technical scheme of the present invention, also can not make amended technical scheme break away from the spirit and the scope of technical scheme of the present invention and these are revised or be equal to replacement.

Claims (7)

1. the disposal route of a defects of liquid crystal display panel is characterized in that, comprising:
The defect image of defect area on step 1, the collection display panels;
Step 2, said defect image analyzed and judge specifically comprise defect type:
After defect image carried out Filtering Processing, to carrying out dividing processing through the defect image after the Filtering Processing;
Defect image after the dividing processing is carried out binary conversion treatment, extract the image of each layer in the defect image;
Textural characteristics and edge continuity characteristic to each tomographic image are analyzed;
From textural characteristics and the undesirable extracted region defect characteristic of edge continuity characteristic;
Obtain corresponding defect type according to said defect characteristic;
Step 3, search corresponding maintenance program according to said defect type.
2. the disposal route of defects of liquid crystal display panel according to claim 1 is characterized in that, also comprises after the said step 3:
Step 4, keep in repair according to the defect area of said maintenance program to display panels.
3. the disposal system of a defects of liquid crystal display panel is characterized in that, comprising:
Image capture module is used to obtain the defect image of defect area on the display panels;
The defective discrimination module is connected with said image capture module, is used for said defect image is analyzed and judged defect type, and said defective discrimination module specifically comprises:
Feature extraction unit is connected with said image capture module, is used for extracting defect characteristic from said defect image, and said feature extraction unit comprises:
The image filtering subelement is used for the defect image that obtains is carried out filtering;
The image segmentation subelement is connected with said image filtering subelement, is used for filtered defect image is carried out dividing processing;
Tomographic image extracts subelement, is connected with said image segmentation subelement, is used for the image after the said dividing processing is carried out binary conversion treatment, extracts the image of each layer of thin film transistor (TFT);
The feature extraction subelement extracts subelement with tomographic image and is connected, and analyzes through image texture features and edge continuity characteristic to said each layer, from textural characteristics and the undesirable zone of edge continuity characteristic, extracts defect characteristic;
The defective judgement unit is connected with said feature extraction unit, is used for judging defect type according to said defect characteristic;
Defected memory cell is connected with said defective judgement unit, is used to write down the defect characteristic of various defect types;
Module is selected in maintenance; Be connected with said defective discrimination module; Simultaneously with the memory module connection that stores various defect types and corresponding maintenance program; Be used for selecting maintenance program according to said defect type, the maintenance program in the said memory module comes from the graphical user interface typing or programmable device is downloaded.
4. the maintenance of equipment of the defects of liquid crystal display panel of a disposal system that comprises the described defects of liquid crystal display panel of claim 3 is characterized in that, comprising:
Laser system is used for according to maintenance program defects of liquid crystal display panel being carried out laser maintaining;
Mechatronic Systems is used to provide gas and uses electric control, assists the disposal system of laser system and defects of liquid crystal display panel to accomplish defect image collection and defective maintenance;
At least one main control system, the disposal system that is used to described Mechatronic Systems, laser system and defects of liquid crystal display panel provides operations necessary instruction and software support.
5. the maintenance of equipment of defects of liquid crystal display panel according to claim 4 is characterized in that, said laser system comprises:
Laser instrument is used to provide maintenance laser;
Wavelength selector is arranged in the delivery optics of said maintenance laser, and contiguous said laser instrument is used for selecting the maintenance Wavelength of Laser;
Many multiplying powers eyepiece group is arranged in the delivery optics of said maintenance laser, and contiguous the display panels that will keep in repair is used to guide said maintenance laser that display panels is keeped in repair;
Transmitted light source is positioned at below the board of placing the display panels that institute will keep in repair, for maintenance provides background illumination with backlight.
6. the maintenance of equipment of defects of liquid crystal display panel according to claim 4; It is characterized in that; Said Mechatronic Systems comprises the horizontal support that is positioned on the board; Be fixed on the horizontal support and the longitudinal carrier vertical, be equipped with the disposal system of said laser system and defects of liquid crystal display panel on the said longitudinal carrier with horizontal support.
7. the maintenance of equipment of defects of liquid crystal display panel according to claim 4 is characterized in that, the disposal system of said defects of liquid crystal display panel also comprises:
Input/output module is used for and said main control system contact.
CN200810119543XA 2008-09-02 2008-09-02 Method and system for processing defects of liquid crystal display panel and maintenance equipment Expired - Fee Related CN101666923B (en)

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Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101862900B (en) * 2010-05-28 2012-10-10 北京数码大方科技有限公司 Welding method and welding device
CN102626829A (en) 2011-08-16 2012-08-08 北京京东方光电科技有限公司 Laser repairing device and laser repairing method for substrate
CN103076344A (en) * 2012-12-27 2013-05-01 深圳市华星光电技术有限公司 Defect detection method and device for display panel
CN103257465B (en) * 2013-04-17 2015-11-11 合肥京东方光电科技有限公司 A kind of pick-up unit and detection method
CN104252056B (en) * 2014-09-18 2017-07-04 京东方科技集团股份有限公司 The detection method and device of a kind of substrate
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CN105163114A (en) * 2015-08-21 2015-12-16 深圳创维-Rgb电子有限公司 Method and system for detecting screen dead pixel based on camera
CN107402221A (en) * 2017-08-08 2017-11-28 广东工业大学 A kind of defects of display panel recognition methods and system based on machine vision
CN108332948A (en) * 2018-01-17 2018-07-27 深圳市绚视科技有限公司 The detecting system and detection method of equipment to be checked
CN110263941A (en) * 2018-03-12 2019-09-20 中国石油天然气股份有限公司 Equipment maintenance method and device
CN109521585A (en) * 2018-12-28 2019-03-26 深圳眼千里科技有限公司 A kind of laser repairing machine
CN109919908B (en) * 2019-01-23 2020-11-10 华灿光电(浙江)有限公司 Method and device for detecting defects of light-emitting diode chip
CN109683360B (en) * 2019-02-14 2022-02-22 宁波轻蜓视觉科技有限公司 Liquid crystal panel defect detection method and device
CN109814289A (en) * 2019-03-21 2019-05-28 深圳市华星光电技术有限公司 Method for repairing base plate
CN109903711A (en) * 2019-04-13 2019-06-18 陈波 Liquid crystal display defect automatic checkout system
CN109916597B (en) * 2019-04-18 2020-12-04 深圳市华星光电半导体显示技术有限公司 Optical detection device and optical detection method
WO2021125154A1 (en) * 2019-12-16 2021-06-24 三菱電機株式会社 Image good/defective learning device, image good/defective determination device, and image reading device
CN112394069A (en) * 2020-12-04 2021-02-23 深圳市华星光电半导体显示技术有限公司 Display panel abnormality detection method and device
CN119781195A (en) * 2024-12-18 2025-04-08 京东方科技集团股份有限公司 Product maintenance method and system, control device, storage medium and program product

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1103978A (en) * 1993-07-13 1995-06-21 夏普公司 A checking apparatus for flat type display panels
CN1339140A (en) * 1999-11-29 2002-03-06 奥林巴斯光学工业株式会社 defect inspection system
CN101183182A (en) * 2006-11-13 2008-05-21 东捷科技股份有限公司 Laser trimming system of liquid crystal panel

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1103978A (en) * 1993-07-13 1995-06-21 夏普公司 A checking apparatus for flat type display panels
CN1339140A (en) * 1999-11-29 2002-03-06 奥林巴斯光学工业株式会社 defect inspection system
CN101183182A (en) * 2006-11-13 2008-05-21 东捷科技股份有限公司 Laser trimming system of liquid crystal panel

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