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CN101579856A - Bad crystal grain selecting machine and method thereof - Google Patents

Bad crystal grain selecting machine and method thereof Download PDF

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Publication number
CN101579856A
CN101579856A CNA2008100978358A CN200810097835A CN101579856A CN 101579856 A CN101579856 A CN 101579856A CN A2008100978358 A CNA2008100978358 A CN A2008100978358A CN 200810097835 A CN200810097835 A CN 200810097835A CN 101579856 A CN101579856 A CN 101579856A
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crystal grain
bad
suction nozzle
bad crystal
contact
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张介舟
刘景男
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MPI Corp
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MPI Corp
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Abstract

The invention discloses a bad crystal grain selecting machine and a method thereof. The bad die sorting machine comprises an operation base, a sorting device and an exclusion device. The sorting device comprises a suction nozzle, the bad crystal grains arranged on the operation base are adsorbed in a vacuum adsorption mode, and then the bad crystal grains are removed through the removing device. The removing device is in a non-contact type and removes the bad grains in a fluid spraying mode, or in a contact type and removes the bad grains in a mode that a direct contactor and a suction nozzle are in mutual contact.

Description

不良晶粒挑选机及其方法 Defective die sorting machine and method thereof

技术领域 technical field

本发明涉及一种不良晶粒挑选机及其方法,特别涉及一种利用接触式或非接触式排除装置的不良晶粒挑选机及其方法。The invention relates to a bad grain sorting machine and a method thereof, in particular to a bad grain sorting machine and a method using a contact or non-contact elimination device.

背景技术 Background technique

晶粒(die)为电子产业中基本的电子零件,其通过半导体制程步骤进行磊晶及后续制程,成为市面上常见的产品。在晶粒制程中,需将晶圆切割成晶粒,以利后续的封装等处理,但在切割过程中,极可能对晶粒造成毁损,故需要将不良晶粒挑选并搜集,以进行后续废弃等处理。A die is a basic electronic component in the electronics industry. It undergoes epitaxy and subsequent processes through the semiconductor process steps, and has become a common product on the market. In the die manufacturing process, the wafer needs to be cut into dies to facilitate subsequent packaging and other processing. However, during the cutting process, the dies are likely to be damaged, so it is necessary to select and collect bad dies for subsequent processing. Disposal, etc.

传统的不良晶粒挑选方法采用人工挑选,通过对晶圆上各晶粒进行对比,将不良晶粒挑选出并废弃。然而,随着半导体制程的微小化,晶粒的尺寸越来越小,使得人工挑选的难度增加,而且针对一片晶圆作不良晶粒挑选的工时极长。The traditional bad die selection method adopts manual selection, and by comparing the dies on the wafer, the bad dies are sorted out and discarded. However, with the miniaturization of the semiconductor manufacturing process, the size of the grains is getting smaller and smaller, which makes manual selection more difficult, and it takes a long time to select bad grains for a wafer.

针对上述问题,公知技术提出一种晶粒挑选机,通过挑选机先挑选出不良晶粒后,通过一吸嘴吸附不良晶粒,并经过一吸收装置,例如通过真空吸收方式,将不良晶粒吸收。例如,中国台湾专利号M253466提出的晶粒挑选机的快速晶粒挑捡结构改良。然而,半导体制程的微小化,使晶粒重量变轻,以晶粒为例,其晶圆在切割成晶粒后,放置在一胶膜上,在吸嘴吸附不良晶粒的同时,晶粒残留的黏胶将同时被吸嘴吸附,故晶粒极易被胶膜残留的黏胶所黏附至吸嘴上,而增加不良晶粒排除的难度,而吸收装置只有吸收的功能,并没有将不良晶粒从吸嘴上排除的功能。因此,现今仍需一能解决上述问题的不良晶粒排除机制,以提高排除效率。In response to the above problems, the known technology proposes a grain sorting machine. After the bad grains are selected by the sorting machine, a suction nozzle is used to absorb the bad grains, and through an absorption device, for example, by vacuum absorption, the bad grains are removed. absorb. For example, Chinese Taiwan Patent No. M253466 proposes an improvement in the fast die picking structure of a die sorting machine. However, the miniaturization of the semiconductor manufacturing process has made the weight of the die lighter. Taking the die as an example, the wafer is placed on an adhesive film after being cut into dies. The residual adhesive will be absorbed by the suction nozzle at the same time, so the die is easily adhered to the suction nozzle by the residual adhesive of the film, which increases the difficulty of removing bad die. The absorption device only has the function of absorption and does not remove The function of removing bad die from the nozzle. Therefore, there is still a need for a mechanism for removing bad grains that can solve the above-mentioned problems, so as to improve the removal efficiency.

发明内容Contents of the invention

一方面,本发明提供一种能够提升不良晶粒排除效率的不良晶粒挑选机。On the one hand, the present invention provides a bad die sorting machine capable of improving the efficiency of removing bad dies.

为实现上述发明目的,本发明采用如下技术方案:In order to realize the above-mentioned purpose of the invention, the present invention adopts following technical scheme:

本发明提供的一种不良晶粒挑选机,包含操作基座,用以置放晶粒;拣选装置,包含吸嘴,其连接至真空源,用以吸附置于操作基座上的晶粒中的不良晶粒;以及非接触式排除装置,包含喷管连接至流体源,通过流体喷除吸嘴上的不良晶粒。上述非接触式排除装置包含静电去除装置。其中,静电去除装置包含静电枪或静电风扇。The present invention provides a bad grain sorting machine, which includes an operating base for placing grains; a sorting device, including a suction nozzle, which is connected to a vacuum source, and is used for absorbing the grains placed on the operating base bad grains; and a non-contact removal device, which includes a nozzle connected to a fluid source, and the bad grains on the suction nozzle are sprayed through the fluid. The above-mentioned non-contact type removal device includes a static electricity removal device. Wherein, the electrostatic removal device includes an electrostatic gun or an electrostatic fan.

本发明提供的另一种不良晶粒挑选机,包含操作基座,用以置放晶粒;拣选装置,包含吸嘴,其连接至真空源,用以吸附置于操作基座上的晶粒中的不良晶粒;以及接触式排除装置,包含直接接触器,通过直接接触器与吸嘴相互接触,以排除吸嘴上的不良晶粒。上述接触式排除装置包含静电去除装置。其中,静电去除装置包含静电枪或静电风扇。Another defective grain sorting machine provided by the present invention includes an operating base for placing grains; a sorting device includes a suction nozzle connected to a vacuum source for absorbing grains placed on the operating base The bad grains in it; and the contact removal device, which includes a direct contactor, through which the direct contactor and the suction nozzle are in contact with each other, so as to eliminate the bad grains on the suction nozzle. The above-mentioned contact type removal device includes a static electricity removal device. Wherein, the electrostatic removal device includes an electrostatic gun or an electrostatic fan.

另一方面,本发明提供一种能够提升不良晶粒排除效率的不良晶粒挑选方法。On the other hand, the present invention provides a method for selecting bad grains that can improve the efficiency of removing bad grains.

为实现上述发明目的,本发明采用如下技术方案:In order to realize the above-mentioned purpose of the invention, the present invention adopts following technical scheme:

本发明提供的一种不良晶粒挑选方法,包含备置操作基座,用以置放晶粒;通过拣选装置吸附操作基座上的晶粒中的不良晶粒;以及通过流体喷除拣选装置上的不良晶粒。此外,本不良晶粒挑选方法更包含去除拣选装置的静电。A method for selecting bad grains provided by the present invention includes preparing an operating base for placing grains; absorbing bad grains in the grains on the operating base through a sorting device; and removing the sorting device through fluid spraying bad grains on the In addition, the bad die sorting method further includes removing static electricity from the sorting device.

本发明提供的另一种不良晶粒挑选方法,包含备置操作基座,用以置放晶粒;通过拣选装置吸附操作基座上的晶粒中的不良晶粒;以及通过直接接触器与拣选装置的吸嘴相互接触,以排除吸嘴上的不良晶粒。此外,本不良晶粒挑选方法更包含去除直接接触器的静电。Another method for selecting bad grains provided by the present invention includes preparing an operation base for placing grains; adsorbing bad grains in the grains on the operation base by a sorting device; The suction nozzles of the picking device are in contact with each other to remove bad grains on the suction nozzles. In addition, the bad die selection method further includes removing static electricity from direct contacts.

附图说明 Description of drawings

本发明可通过说明书中若干较佳实施例及详细叙述以及附图得以了解。然而,本领域的技术人员应当理解所有本发明的较佳实施例用以说明而非用以限制本发明的权利要求,其中:The present invention can be understood through several preferred embodiments and detailed description in the specification and accompanying drawings. However, those skilled in the art should understand that all preferred embodiments of the present invention are used to illustrate rather than limit the claims of the present invention, wherein:

图1为本发明不良晶粒挑选机的操作示意图;Fig. 1 is the schematic diagram of operation of the bad grain sorting machine of the present invention;

图2为图1所示本发明不良晶粒挑选机的拣选装置的侧视图;Fig. 2 is a side view of the sorting device of the defective grain sorting machine of the present invention shown in Fig. 1;

图3为图1所示本发明不良晶粒挑选机的非接触式排除装置的侧视图;Fig. 3 is a side view of the non-contact elimination device of the bad grain sorting machine of the present invention shown in Fig. 1;

图4为本发明不良晶粒挑选机的接触式排除装置的一实施例的剖面图;Fig. 4 is a cross-sectional view of an embodiment of the contact type elimination device of the defective grain sorting machine of the present invention;

图5为本发明不良晶粒挑选机的接触式排除装置的另一实施例的剖面图;Fig. 5 is a cross-sectional view of another embodiment of the contact elimination device of the defective grain sorting machine of the present invention;

图6为本发明不良晶粒挑选机的接触式排除装置的又一实施例的剖面图;Fig. 6 is a cross-sectional view of another embodiment of the contact elimination device of the bad grain sorting machine of the present invention;

图7为图6所示不良晶粒挑选机的接触式排除装置的上视图;Fig. 7 is the upper view of the contact elimination device of the defective grain sorting machine shown in Fig. 6;

图8为本发明不良晶粒挑选方法的步骤示意图。FIG. 8 is a schematic diagram of the steps of the method for selecting bad grains of the present invention.

具体实施方式 Detailed ways

为了使本技术领域的人员更好地理解本发明的技术方案,并使本发明的上述目的、特征和优点能够更加明显易懂,下面结合附图和实施例对本发明作进一步详细的说明。In order to enable those skilled in the art to better understand the technical solution of the present invention, and to make the above-mentioned purpose, features and advantages of the present invention more obvious and understandable, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

如图1所示,本发明提供的不良晶粒挑选机的较佳实施例中,包含:操作基座101、拣选装置102以及排除装置,其中,排除装置为非接触式排除装置103、接触式排除装置104或包含两者;操作基座101的作用在于置放晶粒106,拣选装置102包含吸嘴1021,通过吸嘴1021连接至真空源111,以吸附在操作基座101上的不良晶粒;而排除装置主要通过非接触式排除装置103使用流体排除方式或通过接触式排除装置104使用直接接触器与吸嘴1021相互接触方式排除吸嘴1021上的不良晶粒。As shown in Figure 1, in the preferred embodiment of the bad grain sorting machine provided by the present invention, it includes: an operation base 101, a sorting device 102 and an exclusion device, wherein the exclusion device is a non-contact exclusion device 103, a contact type Exclude device 104 or comprise both; The effect of operation base 101 is to place grain 106, and picking device 102 comprises suction nozzle 1021, is connected to vacuum source 111 by suction nozzle 1021, to absorb the defective crystal on operation base 101 The removal device mainly removes bad grains on the suction nozzle 1021 through the non-contact removal device 103 using the fluid removal method or through the contact removal device 104 using the direct contactor and the suction nozzle 1021 to contact each other.

如图1所示,操作基座101用以置放晶粒,一般而言,用于置放承载晶粒106的胶膜107;操作基座101通过管线108连接至真空源109,通过真空吸附胶膜107方式,固定胶膜107在操作基座101上;本发明所提及的固定胶膜107的方式,也可以机械固定方式或其它方式完成。机械固定方式通过固定胶膜外围的扩张环在操作基座101上,即通过一环具环绕在扩张环外围,以由一组卡紧件缩减环具的环绕空间,以便固定胶膜107在环具内。As shown in FIG. 1 , the operation base 101 is used to place crystal grains, generally speaking, it is used to place the adhesive film 107 carrying the crystal grains 106; the operation base 101 is connected to a vacuum source 109 through a pipeline 108, and the The way of fixing the glue film 107 on the operating base 101 is to fix the glue film 107; the way of fixing the glue film 107 mentioned in the present invention can also be done by mechanical fixing or other ways. The mechanical fixing method fixes the expansion ring on the outer periphery of the adhesive film on the operation base 101, that is, a ring is used to surround the outer periphery of the expansion ring, so that the surrounding space of the ring is reduced by a set of clamping parts, so that the adhesive film 107 is fixed on the ring inside.

请同时参照图1及图2,拣选装置102包含吸嘴1021,通过管线110连接至真空源111,吸嘴1021至真空源111之间形成一真空路径,使吸嘴1021通过真空方式吸附操作基座101上的晶粒106;通过一判断装置,以确认各晶粒106完整或是不良品后,拣选装置102将配合顶针器105将不良晶粒106a吸附,移开操作基座101至一排除区;其中,排除区指排除及收取不良晶粒106a的区域,而排除装置即设置在排除区,在此,判断装置以视觉显示器,如电子显微镜、数字相机、数字显微相机、工业显微设备等,观察晶粒106的图案,配合微处理器分析以决定不良晶粒及其位置;而顶针器105紧贴胶膜107,在不良晶粒106a的位置处,通过顶针戳破胶膜107将不良晶粒106a移开胶膜107,顶针器105结构为现有技术在此省略顶针器105的相关详细叙述。胶膜107具有一定的黏性,故在顶针器105将不良晶粒106a移开胶膜107时,拣选装置102需同时通过吸嘴1021吸附不良晶粒106a,才能将不良晶粒106a准确地吸附于吸嘴1021。拣选装置102还包含机械手臂1022以及移动装置1023。在一实施例中,机械手臂1022由二关节以及三骨架所构成,用以将吸嘴1021移动,然其结构并非限于以上所述。移动装置1023用以控制机械手臂1022的垂直位置及水平位置,以利于三度空间动作。在一实施例中,移动装置1023包含二马达或其它驱动组件,马达如步进马达、伺服马达、音圈马达(voice coil motor)及直驱式马达(direct drive motor)等,其中一马达用以控制机械手臂1022的垂直位置,以于定点上升或下降,进而实行吸取或排除不良晶粒的动作。另一马达用以控制机械手臂1022的水平位置,在制程步骤中的若干装置例如排除装置及操作基座101之间移动,以利于连续进行连续的步骤。在吸嘴1021吸附不良晶粒106a之后,拣选装置102利用机械手臂1022将吸嘴1021及不良晶粒106a移动至排除区的排除装置。在操作基座101通过真空方式吸附胶膜107时,其通过管线108连接的真空源109,与真空源111为同一真空源,当然,在另一实施例中,真空源109与真空源111可为不同真空源。Please refer to FIG. 1 and FIG. 2 at the same time. The sorting device 102 includes a suction nozzle 1021, which is connected to a vacuum source 111 through a pipeline 110. A vacuum path is formed between the suction nozzle 1021 and the vacuum source 111, so that the suction nozzle 1021 absorbs the operating substrate by vacuum. Die 106 on the seat 101; through a judging device to confirm that each die 106 is complete or defective, the sorting device 102 will cooperate with the thimbler 105 to absorb the bad die 106a, and remove the operation base 101 to one for removal Area; Wherein, exclusion area refers to the area that gets rid of and collects bad grain 106a, and exclusion device promptly is arranged on exclusion area, and here, judging device is with visual display, as electron microscope, digital camera, digital microscope camera, industrial microscope Equipment, etc., observe the pattern of the grain 106, cooperate with the microprocessor analysis to determine the bad grain and its position; and the thimble device 105 is close to the adhesive film 107, and at the position of the bad grain 106a, the thimble punctures the adhesive film 107 The defective die 106 a is removed from the adhesive film 107 , and the structure of the ejector 105 is a prior art, and the detailed description of the ejector 105 is omitted here. The adhesive film 107 has a certain viscosity, so when the ejector 105 removes the defective die 106a from the adhesive film 107, the sorting device 102 needs to absorb the defective die 106a through the suction nozzle 1021 at the same time, so that the defective die 106a can be accurately adsorbed on the suction nozzle 1021. The picking device 102 also includes a robot arm 1022 and a moving device 1023 . In one embodiment, the robot arm 1022 is composed of two joints and three skeletons for moving the suction nozzle 1021 , but its structure is not limited to the above description. The moving device 1023 is used to control the vertical position and the horizontal position of the mechanical arm 1022, so as to facilitate three-dimensional movement. In one embodiment, the moving device 1023 includes two motors or other driving components, such as stepping motors, servo motors, voice coil motors (voice coil motors) and direct drive motors (direct drive motors), etc., one of which is used for The vertical position of the robot arm 1022 is controlled to rise or fall at a fixed point, and then perform the action of sucking or removing bad dies. Another motor is used to control the horizontal position of the robot arm 1022 to move between several devices in the process steps, such as the removal device and the operation base 101, so as to facilitate continuous steps. After the suction nozzle 1021 absorbs the bad die 106a, the sorting device 102 uses the robot arm 1022 to move the suction nozzle 1021 and the bad die 106a to the removal device in the removal area. When the operating base 101 absorbs the adhesive film 107 by vacuum, the vacuum source 109 connected to it through the pipeline 108 is the same vacuum source as the vacuum source 111. Of course, in another embodiment, the vacuum source 109 and the vacuum source 111 can be for different vacuum sources.

请参照图1,在吸嘴1021吸附不良晶粒106a时,不良晶粒106a常会携带胶膜上的残余黏胶,因此在吸嘴1021上容易附着残余黏胶,导致不良晶粒106a黏滞在吸嘴1021无法排除,故而需要通过排除装置将吸嘴1021上的不良晶粒106a甚至于残余黏胶加以排除。如前文所述,排除装置包含非接触式排除装置103(如图1的左上角部分所示),接触式排除装置104(如图1的右上角部分所示),或以上两者,以下将分别叙述非接触式排除装置103及接触式排除装置104的结构。在接触式或非接触式排除装置104或103将不良晶粒106a排除后,拣选装置102返回至操作基座101的位置,以重复上述相同步骤。Please refer to FIG. 1, when the suction nozzle 1021 absorbs the bad die 106a, the bad die 106a often carries the residual adhesive on the adhesive film, so the residual adhesive is easy to adhere to the suction nozzle 1021, causing the bad die 106a to stick to the suction nozzle 1021. The nozzle 1021 cannot be removed, so the bad die 106a and even the residual glue on the suction nozzle 1021 need to be removed by a removal device. As mentioned above, the removal device includes a non-contact removal device 103 (as shown in the upper left corner of Figure 1), a contact removal device 104 (as shown in the upper right corner of Figure 1), or both, and the following will The configurations of the non-contact type removal device 103 and the contact type removal device 104 will be described respectively. After the contact or non-contact removal device 104 or 103 removes the defective die 106a, the sorting device 102 returns to the position of the operating base 101 to repeat the same steps above.

图3为图1的非接触式排除装置的侧视图;请同时参照图1及图3,非接触式排除装置103包含喷管1031,喷管1031通过管线112连接至流体源113;当拣选装置102通过吸嘴1021吸附不良晶粒106a并移动至非接触式排除装置103时,流体源113提供喷管1031使用一流体,以排除吸嘴1021上的不良晶粒;流体源113为一气体源、一液体源或以上两者之一,通过流体源113所供给的气体或液体传送至喷管1031,通过喷管1031的出口喷出,进而将不良晶粒106a排除,以利于后续处理。在一实施例中,气体可为一般的空气、惰性气体或其它气体。在一实施例中,液体可为水或其它液体。Fig. 3 is the side view of the non-contact type removal device of Fig. 1; Please refer to Fig. 1 and Fig. 3 simultaneously, non-contact type removal device 103 comprises nozzle 1031, and nozzle pipe 1031 is connected to fluid source 113 by pipeline 112; When picking device 102, when the bad grains 106a are adsorbed by the suction nozzle 1021 and moved to the non-contact removal device 103, the fluid source 113 provides the nozzle 1031 with a fluid to get rid of the bad grains on the suction nozzle 1021; the fluid source 113 is a gas source 1. A liquid source or one of the above two, the gas or liquid supplied by the fluid source 113 is delivered to the nozzle 1031, and is sprayed out through the outlet of the nozzle 1031, and then the bad crystal grains 106a are removed to facilitate subsequent processing. In one embodiment, the gas may be general air, inert gas or other gases. In one embodiment, the liquid may be water or other liquids.

在另一实施例中,排除装置可为接触式排除装置104,如图1右上角部分所示;接触式排除装置104利用直接接触方式,例如以直接接触器与不良晶粒106a相互接触,使不良晶粒106a从吸嘴1021脱落;其中,直接接触器为毛刷10401、弹性软板或其它的弹性材料,以在与吸嘴1021接触时,避免破坏拣选装置102的结构。弹性软板为一橡胶软板、PU软板或其它同等材料的软板。图4到图6分别为接触式排除装置的三种实施示意图,在此,为了叙述方便,直接接触器以毛刷10401作为范例;请参照图1及图4,接触式排除装置104包含毛刷10401、基部10406及置放机构10408;基部10406具有两端,毛刷10401位于基部10406的一端上,而基部10406的另一端放置于置放机构10408的通孔上,以螺丝锁固、黏胶固定等方式固定,此外,基部10406与置放机构10408也可为一体成型制作;在吸嘴1021移动至排除区时,通过将置放机构10408放置在吸嘴1021移动轨迹上,使毛刷10401与吸嘴1021直接接触,以排除吸嘴1021上的不良晶粒106a。In another embodiment, the removal device can be a contact removal device 104, as shown in the upper right corner of FIG. The defective grains 106a fall off from the suction nozzle 1021 ; wherein, the direct contactor is a brush 10401 , an elastic soft board or other elastic materials, so as to avoid damaging the structure of the sorting device 102 when in contact with the suction nozzle 1021 . The elastic soft board is a soft board made of rubber, PU or other equivalent materials. Figures 4 to 6 are schematic diagrams of three implementations of the contact-type removal device. Here, for the convenience of description, the direct contactor uses a brush 10401 as an example; please refer to Figures 1 and 4, the contact-type removal device 104 includes a hair brush 10401, the base 10406 and the placement mechanism 10408; the base 10406 has two ends, the brush 10401 is located on one end of the base 10406, and the other end of the base 10406 is placed on the through hole of the placement mechanism 10408, locked with screws, glued In addition, the base 10406 and the placement mechanism 10408 can also be integrally formed; when the suction nozzle 1021 moves to the exclusion area, the placement mechanism 10408 is placed on the moving track of the suction nozzle 1021, so that the brush 10401 It is in direct contact with the suction nozzle 1021 to eliminate the bad crystal grains 106 a on the suction nozzle 1021 .

请参照图1及图5,接触式排除装置104包含毛刷10401、基部10406、滑轨10409及动子10410;基部10406具有两端,毛刷10401位于基部10406的一端上,而基部10406的另一端连接于动子10410的通孔10411上,以螺丝锁固、黏胶固定等方式,连接于动子10410上,此外,基部10406与动子10410也可为一体成型制作;动子10410套在滑轨10409外,限制动子10410在滑轨10409的水平方向(图5的箭头方向)移动,通过气压缸、电磁阀或其它水平移动的装置,使动子10410进行水平方向移动;在吸嘴1021移动至排除区时,通过动子10410在滑轨10409进行水平移动,带动毛刷10401至吸嘴1021的移动轨迹上,使毛刷10401与吸嘴1021直接接触,排除吸嘴1021上的不良晶粒106a。除了气压缸、电磁阀外,依照机构设计的多样性,也可以螺杆、皮带等连动装置,连接在一马达及动子10410之间,其中马达为步进马达、伺服马达,通过步进马达或伺服马达带动连动装置,进而带动毛刷10401作水平移动。Please refer to Fig. 1 and Fig. 5, contact-type removing device 104 comprises hairbrush 10401, base 10406, slide rail 10409 and mover 10410; One end is connected to the through hole 10411 of the mover 10410, and is connected to the mover 10410 by means of screw locking or glue fixing. In addition, the base 10406 and the mover 10410 can also be integrally formed; the mover 10410 is set on the Outside the slide rail 10409, the mover 10410 is restricted from moving in the horizontal direction of the slide rail 10409 (the direction of the arrow in Figure 5), and the mover 10410 is moved in the horizontal direction through a pneumatic cylinder, solenoid valve or other horizontally moving devices; When 1021 moves to the exclusion area, the mover 10410 moves horizontally on the slide rail 10409, driving the brush 10401 to the moving track of the suction nozzle 1021, so that the brush 10401 is in direct contact with the suction nozzle 1021, and the defective parts on the suction nozzle 1021 are eliminated. Die 106a. In addition to pneumatic cylinders and solenoid valves, according to the diversity of mechanism design, linkage devices such as screws and belts can also be connected between a motor and the mover 10410. The motors are stepping motors and servo motors. Or the servo motor drives the interlocking device, and then drives the brush 10401 to move horizontally.

图7为图6中接触式排除装置的上视图,请参照图1、图6及图7,接触式排除装置104包含毛刷10401、基部10406、外框10402、横杆10403、二连动螺丝10405及马达(未图示)。基部10406具有两端,毛刷10401位于基部10406的一端上,而基部10406的另一端连接在横杆10403的一通孔10404上,基部10406通过放置在通孔10404中,以螺丝锁固、黏胶固定等方式,连接于驱动装置横杆10403上,此外,基部10406与横杆10403也可为一体成型制作;外框10402具有两相对设置的支撑板,在支撑板上各具有一穿洞,将二连动螺丝10405穿设于两支撑板的穿洞,并锁固横杆10403的两端,以固定横杆10403于两支撑板之间。为了降低外框10402制作的复杂度,如图7所示,将外框10402设计成中空方形或矩形机构,以有效控制两支撑板的距离,将横杆10403置于外框10402内部。马达为步进马达、伺服马达,其连接至连动螺丝10405,通过马达带动连动螺丝10405呈顺时钟或逆时钟旋转。在吸嘴1021移动至排除区时,通过马达动作,连动螺丝10405呈顺时钟或逆时钟旋转,连带使毛刷10401在外框10402内呈顺时钟或逆时钟旋转,至吸嘴1021的移动轨迹上,使毛刷10401与吸嘴1021直接接触,以排除吸嘴1021上的不良晶粒106a。本实施例中,毛刷10401可为多个,通过马达带动多个毛刷10401进行顺时钟或逆时钟旋转,以排除吸嘴1021上的不良晶粒106a。多个毛刷10401分别置于多个基部10406一端上,通过将多个基部10406的另一端连接在横杆10403的通孔10404上,将毛刷10401及基部10406固定于横杆10403上。Fig. 7 is a top view of the contact removal device in Fig. 6, please refer to Fig. 1, Fig. 6 and Fig. 7, the contact removal device 104 includes a brush 10401, a base 10406, an outer frame 10402, a cross bar 10403, and two interlocking screws 10405 and motor (not shown). The base 10406 has two ends, the brush 10401 is located on one end of the base 10406, and the other end of the base 10406 is connected to a through hole 10404 of the crossbar 10403, the base 10406 is placed in the through hole 10404, and is locked by screws and adhesive Fixing and other methods are connected to the cross bar 10403 of the driving device. In addition, the base 10406 and the cross bar 10403 can also be integrally formed; The two interlocking screws 10405 pass through the holes of the two support plates, and lock the two ends of the cross bar 10403 to fix the cross bar 10403 between the two support plates. In order to reduce the complexity of making the outer frame 10402, as shown in Figure 7, the outer frame 10402 is designed as a hollow square or rectangular mechanism to effectively control the distance between the two support plates, and the cross bar 10403 is placed inside the outer frame 10402. The motor is a stepping motor or a servo motor, which is connected to the interlocking screw 10405, and the interlocking screw 10405 is driven by the motor to rotate clockwise or counterclockwise. When the suction nozzle 1021 moves to the exclusion area, the motor acts, and the interlocking screw 10405 rotates clockwise or counterclockwise, and the brush 10401 rotates clockwise or counterclockwise in the outer frame 10402, to the moving track of the suction nozzle 1021 Above, make the brush 10401 directly contact with the suction nozzle 1021 to remove the bad crystal grains 106a on the suction nozzle 1021. In this embodiment, there may be multiple brushes 10401 , and the motor drives the multiple brushes 10401 to rotate clockwise or counterclockwise, so as to remove the bad crystal grains 106 a on the suction nozzle 1021 . A plurality of brushes 10401 are placed on one end of the plurality of bases 10406 respectively, and the brushes 10401 and the bases 10406 are fixed on the cross bar 10403 by connecting the other ends of the plurality of bases 10406 to the through holes 10404 of the cross bar 10403 .

请参照图1,不良晶粒挑选机还包含一收取装置,收取装置作为不良晶粒收取之用,故在非接触式排除装置103与接触式排除装置104的功能均相同。以下仅以非接触式排除装置103为例说明,请同时参照图1及图3,收取装置114具有本体1141以及凹部1142,并放置在临近喷管1031处;凹部1142形成在本体1141的上表面,在喷管1031喷出流体排除吸嘴1021上的不良晶粒106a后,不良晶粒106a将掉落在凹部1142中。非接触式排除装置103及收取装置114可以分开,也可以设计成一体成型,如图3即是非接触式排除装置103及收取装置114一体成型的侧视图,喷管1031设置在凹部1142的侧壁上且位于凹部1142之中。Please refer to FIG. 1 , the bad grain sorting machine also includes a collecting device for collecting bad grains, so the functions of the non-contact removing device 103 and the contact removing device 104 are the same. In the following, only the non-contact removal device 103 is taken as an example. Please refer to FIG. 1 and FIG. 3 at the same time. The collection device 114 has a body 1141 and a recess 1142, and is placed near the nozzle 1031; the recess 1142 is formed on the upper surface of the body 1141. , after the nozzle 1031 ejects fluid to remove the defective die 106 a on the suction nozzle 1021 , the defective die 106 a will fall into the concave portion 1142 . The non-contact removal device 103 and the collection device 114 can be separated, or can be designed to be integrally formed. As shown in Figure 3, the side view of the non-contact removal device 103 and the collection device 114 is integrally formed. The nozzle 1031 is arranged on the side wall of the recess 1142 on and in the recess 1142 .

请参照图1,在吸嘴1021吸附不良晶粒106a,使其从胶膜107移除时,会使吸嘴1021及不良晶粒106a感应产生静电,此类静电极易造成不良晶粒106a更加难以从吸嘴1021排除,因此,在本发明的一实施例中,排除装置上可附加静电去除装置。Please refer to FIG. 1, when the suction nozzle 1021 absorbs the bad die 106a and removes it from the adhesive film 107, the suction nozzle 1021 and the bad die 106a will induce static electricity, and this type of static electrode will easily cause the bad die 106a to become more severe. It is difficult to remove from the suction nozzle 1021, therefore, in an embodiment of the present invention, a static elimination device can be added to the removal device.

请参照图1,以非接触式排除装置103为例,喷管1031所连接的流体源113,在使用气体源时,可设置一离子产生装置,以产生一离子气体作为流体源113所供应的流体,而离子气体除了排除吸嘴1021上不良晶粒106a以外,同时具有将吸嘴1021上的静电排除的功能。其中,离子产生装置为一具有带电荷的物体,例如离子针,通过静电枪或静电风扇等静电去除装置的原理,即当离子产生装置通过外接电源,使离子产生装置电晕放电,以使通过的气流电离为大量正负离子,使离子风快速吹向需除静电区域将静电中和。当然,在使用流体源113的同时,流体源113并非离子气体的状态下,不良晶粒挑选机也可使用静电枪或静电风扇等静电去除装置,对吸嘴1021进行静电排除。静电去除装置并没有特定的位置,只要吸嘴1021能接触静电去除装置所产生的离子气体即可。Please refer to Fig. 1, taking the non-contact type removal device 103 as an example, the fluid source 113 connected to the nozzle 1031, when using a gas source, an ion generating device can be set to generate an ion gas as the fluid source 113 supplies The fluid, and the ionic gas has the function of eliminating static electricity on the suction nozzle 1021 in addition to removing the bad crystal grains 106a on the suction nozzle 1021 . Among them, the ion generating device is a charged object, such as an ion needle, through the principle of electrostatic removal devices such as electrostatic guns or electrostatic fans, that is, when the ion generating device is connected to an external power supply, the ion generating device is corona discharged to make the ion generating device pass through The airflow ionized into a large number of positive and negative ions, so that the ion wind quickly blows to the area where static electricity needs to be removed to neutralize the static electricity. Certainly, while using the fluid source 113, when the fluid source 113 is not an ionic gas, the defective grain sorter can also use an electrostatic gun or an electrostatic fan to remove static electricity from the suction nozzle 1021. There is no specific location for the static removal device, as long as the suction nozzle 1021 can contact the ion gas generated by the static removal device.

请参照图4至图6,接触式排除装置104可附加接地线10407,将静电导离,接地线10407连接于不良晶粒挑选机的机台表面或电源插座的接地点,与接触式排除装置104之间。此外,不良晶粒挑选机可使用静电枪或静电风扇等静电去除装置,对吸嘴1021进行静电排除。静电去除装置并没有特定的位置,只要吸嘴1021接触静电去除装置所产生的离子气体即可。Please refer to Fig. 4 to Fig. 6, the ground wire 10407 can be attached to the contact type elimination device 104 to conduct away static electricity, and the ground wire 10407 is connected to the machine surface of the defective grain sorting machine or the grounding point of the power socket, and the contact type elimination device Between 104. In addition, the bad die sorting machine can use a static removal device such as an electrostatic gun or an electrostatic fan to remove static electricity from the suction nozzle 1021 . There is no specific location for the static removal device, as long as the suction nozzle 1021 contacts the ion gas generated by the static removal device.

在另一实施例中,如图8所示,本发明提供的一种不良晶粒挑选方法;在本发明的不良晶粒挑选方法中,首先在步骤201备置操作基座,用以置放多个晶粒在其上;之后,在步骤202通过拣选装置,吸附上述操作基座上晶粒中的不良晶粒;请参照图1,在此步骤中,不良晶粒需通过顶针器105戳破胶膜107以将不良晶粒106a顶起并同时配合拣选装置102吸附不良晶粒106a,才能将不良晶粒106a吸附至拣选装置102上;然后,可以进行步骤203或步骤204,在步骤203通过流体喷除拣选装置上的不良晶粒,而在步骤204通过直接接触器与拣选装置的吸嘴相互接触,以排除吸嘴上的不良晶粒,步骤203所述即是使用非接触式排除装置103,通过流体喷除拣选装置102上的不良晶粒106a,步骤204所述则是使用接触式排除装置104,通过直接接触器与拣选装置102的吸嘴1021相互接触,以排除拣选装置102上的不良晶粒106a。在步骤204中,直接接触器根据图4至图6,可有三种的实施方法,一是将直接接触器放置在一置放机构上,使直接接触器固定在置放机构上,并放置在吸嘴移动轨迹上,使直接接触器与吸嘴直接接触;第二种方法是将直接接触器连接在一动子上,通过驱动装置带动动子于滑轨上进行水平移动,进而带动直接接触器水平动作,以与吸嘴相互接触;第三种方法为将直接接触器连接于一横杆上,并在外框的二相对支撑板上形成二相对穿洞,再将二连动螺丝穿设穿洞并锁固横杆的两端,通过驱动装置带动连动螺丝转动,进而带动直接接触器转动,以与吸嘴相互接触。In another embodiment, as shown in FIG. 8 , a method for selecting bad grains provided by the present invention; A plurality of crystal grains are on it; afterward, in step 202, the bad grains in the grains on the above-mentioned operating base are adsorbed by the picking device; please refer to Fig. 1, in this step, the bad grains need to be poked by the thimbler 105 Break the adhesive film 107 to lift the bad grains 106a and at the same time cooperate with the sorting device 102 to absorb the bad grains 106a, so that the bad grains 106a can be adsorbed to the sorting device 102; then, step 203 or step 204 can be performed, and in step 203 The bad grains on the sorting device are removed by fluid spraying, and in step 204, the direct contactor and the suction nozzle of the sorting device are in contact with each other to eliminate the bad grains on the suction nozzle. The step 203 is to use non-contact elimination The device 103 removes the bad grains 106a on the sorting device 102 by spraying the fluid, and the step 204 uses the contact type removing device 104 to contact the suction nozzle 1021 of the picking device 102 through a direct contactor to eliminate the picking device 102 on the bad die 106a. In step 204, according to Fig. 4 to Fig. 6, there are three implementation methods for the direct contactor, one is to place the direct contactor on a placement mechanism, fix the direct contactor on the placement mechanism, and place it on On the moving track of the suction nozzle, the direct contactor is in direct contact with the suction nozzle; the second method is to connect the direct contactor to a mover, and drive the mover to move horizontally on the slide rail through the driving device, and then drive the direct contactor Horizontal action to make contact with the suction nozzle; the third method is to connect the direct contactor to a horizontal bar, and form two opposite holes on the two opposite support plates of the outer frame, and then pass two interlocking screws through them. hole and lock the two ends of the cross bar, and drive the interlocking screw to rotate through the driving device, and then drive the direct contactor to rotate to contact with the suction nozzle.

本发明提供的不良晶粒挑选机,在拣选不良晶粒的同时,通过接触式或非接触式的排除装置,克服因吸嘴上附着残余黏胶,导致不良晶粒黏滞在吸嘴上而无法排除的问题。而且,通过排除装置上所附加的静电去除装置将吸嘴上的静电去除,可提升不良晶粒的排除效率。此外,本发明的不良晶粒挑选机的接触式排除装置,通过直接接触器与吸嘴直接的相互接触,实际的排除能力较非接触式排除装置佳,可以提升排除效率。The bad grain sorting machine provided by the present invention, while sorting bad grains, through contact or non-contact exclusion device, overcomes the sticking of bad grains on the suction nozzle due to residual glue on the suction nozzle and cannot Excluded issues. Moreover, the static electricity on the suction nozzle can be removed by the static electricity removal device attached to the removal device, which can improve the removal efficiency of bad crystal grains. In addition, the contact type removal device of the bad grain sorting machine of the present invention directly contacts the suction nozzle through the direct contactor, and the actual removal ability is better than that of the non-contact type removal device, which can improve the removal efficiency.

以上所述,仅为本发明较佳的具体实施方式,但本发明的保护范围并不局限于此,任何熟悉本技术领域的技术人员在本发明揭露的技术范围内,可轻易想到的变化或替换,都应涵盖在本发明的保护范围的内。因此,本发明的保护范围应该以权利要求的保护范围为准。The above is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed in the present invention can easily think of changes or Replacement should be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention should be determined by the protection scope of the claims.

Claims (26)

1, a kind of bad crystal grain selector is characterized in that, comprises:
One operational base is in order to put crystal grain;
One sorting plant comprises a suction nozzle, and this suction nozzle is connected to a vacuum source, places the bad crystal grain of this crystal grain on this operational base in order to absorption; And
One contactless remover comprises a jet pipe and is connected to a fluid source, and the fluid that provides by this fluid source sprays the bad crystal grain that removes on the suction nozzle.
2, bad crystal grain selector according to claim 1 is characterized in that, described fluid source is a gas source or a fluid supply.
3, bad crystal grain selector according to claim 2 is characterized in that, described gas source is an ionized gas source.
4, bad crystal grain selector according to claim 1 is characterized in that, also comprises a collection apparatus, behind the bad crystal grain that removes by described fluid spray on the suction nozzle, collects the bad crystal grain that is removed by spray.
5, bad crystal grain selector according to claim 4 is characterized in that, described collection apparatus and this contactless remover are formed in one.
6, bad crystal grain selector according to claim 1 is characterized in that, also comprises a static removal device, removes the incidental static of this suction nozzle.
7, bad crystal grain selector according to claim 6 is characterized in that, described static removal device comprises a static gun or a static fan.
8, a kind of bad crystal grain selector is characterized in that, comprises:
One operational base is in order to put crystal grain;
One sorting plant comprises a suction nozzle, and this suction nozzle is connected to a vacuum source, places the bad crystal grain of this crystal grain on this operational base in order to absorption; And
One contact remover comprises a direct contactor, is in contact with one another by this direct contactor and this suction nozzle, to get rid of the bad crystal grain on the suction nozzle.
9, bad crystal grain selector according to claim 8 is characterized in that, described direct contactor is a hairbrush or an elasticity soft board.
10, bad crystal grain selector according to claim 9 is characterized in that, described elasticity soft board is a rubbery flexible sheet or a PU soft board.
11, bad crystal grain selector according to claim 8 is characterized in that, described contact remover comprises one and puts mechanism, and directly contactor is positioned over and puts in the mechanism.
12, bad crystal grain selector according to claim 8, it is characterized in that, described contact remover comprises a mover, a slide rail and a drive unit, this direct contactor is connected on this mover, driving this mover by this drive unit moves horizontally on this slide rail, and then drive this direct contactor horizontal balance, be in contact with one another with this suction nozzle.
13, bad crystal grain selector according to claim 12 is characterized in that, described drive unit comprises a stepper motor or a servo motor or a pneumatic cylinder or a magnetic valve.
14, bad crystal grain selector according to claim 8, it is characterized in that, described contact remover comprises a cross bar, a housing, two interlock screws and a drive unit, this direct contactor is connected on this cross bar, this housing comprises two relative gripper shoes, it has two relative Durchgangshohle and is formed at wherein, this interlock screw wears the two ends of this Durchgangshohle and this cross bar that locks, driving this interlock screw by this drive unit rotates, and then drive this direct contactor rotation, be in contact with one another with this suction nozzle.
15, bad crystal grain selector according to claim 14 is characterized in that, described drive unit comprises a stepper motor or a servo motor.
16, bad crystal grain selector according to claim 8 is characterized in that, also comprises a static removal device, removes the incidental static of this suction nozzle.
17, bad crystal grain selector according to claim 16 is characterized in that, described static removal device comprises a static gun or a static fan.
18, bad crystal grain selector according to claim 16, it is characterized in that described static removal device comprises a conductor and an earth connection, this conductor electrically connects this earth connection, be in contact with one another by this direct contactor and this conductor, to remove the incidental static of direct contactor.
19, a kind of bad crystal grain selection method is characterized in that, comprises:
Purchase an operational base, in order to put crystal grain;
Adsorb bad crystal grain in this crystal grain on this operational base by a sorting plant; And
Spray the bad crystal grain that removes on the sorting plant by a fluid.
20, bad crystal grain selection method according to claim 19 is characterized in that, also comprises the static of removing this sorting plant.
21, a kind of bad crystal grain selection method is characterized in that, comprises:
Purchase an operational base, in order to put crystal grain;
Adsorb the bad crystal grain in the crystal grain on this operational base by a sorting plant; And
Suction nozzle by a direct contactor and this sorting plant is in contact with one another, to get rid of the bad crystal grain on the suction nozzle.
22, bad crystal grain selection method according to claim 21 is characterized in that, also comprises the static of removing described direct contactor.
23, bad crystal grain selection method according to claim 21 is characterized in that, the step that the suction nozzle of described direct contactor and sorting plant is in contact with one another, and the suction nozzle that comprises with a hairbrush or an elasticity soft board and sorting plant is in contact with one another.
24, bad crystal grain selection method according to claim 21 is characterized in that, the step that the suction nozzle of described direct contactor and sorting plant is in contact with one another comprises and direct contactor is placed on one puts in the mechanism.
25, bad crystal grain selection method according to claim 21, it is characterized in that, the step that the suction nozzle of described direct contactor and sorting plant is in contact with one another, comprise and to be connected on the mover by direct contactor, driving this mover by a drive unit moves horizontally on a slide rail, and then drive direct contactor horizontal balance, be in contact with one another with suction nozzle.
26, bad crystal grain selection method according to claim 21, it is characterized in that, the step that the suction nozzle of described direct contactor and sorting plant is in contact with one another, comprise and to be connected on the cross bar by direct contactor, and on two relative gripper shoes of a housing, form two relative Durchgangshohle, and again two interlock screws are worn the two ends of this Durchgangshohle and this cross bar that locks, drive this interlock screw by a drive unit and rotate, and then drive direct contactor rotation, be in contact with one another with suction nozzle.
CNA2008100978358A 2008-05-16 2008-05-16 Bad crystal grain selecting machine and method thereof Pending CN101579856A (en)

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Application Number Priority Date Filing Date Title
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Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104550054A (en) * 2014-12-29 2015-04-29 苏州凯锝微电子有限公司 Grain crystal sorting device
CN104550055A (en) * 2014-12-30 2015-04-29 苏州凯锝微电子有限公司 Crystal grain sorting machine
CN106269585A (en) * 2016-07-14 2017-01-04 无锡宏纳科技有限公司 The instrument of defective crystal grain is selected by photographic head
CN106328555A (en) * 2016-08-26 2017-01-11 扬州杰盈汽车芯片有限公司 Magnetic force ink jet test technology applied to semiconductor
CN107556571A (en) * 2016-07-01 2018-01-09 兴美实业公司 Rubber product, suction nozzle thereof and preparation process
CN110211898A (en) * 2019-05-08 2019-09-06 深圳市中科智诚科技有限公司 A kind of stable type chip sorting equipment with function of eliminating static
CN110538811A (en) * 2018-05-29 2019-12-06 惠特科技股份有限公司 Automatic edge-emitting laser dual-temperature synchronous detection and classification equipment
CN112110192A (en) * 2019-06-20 2020-12-22 矽电半导体设备(深圳)股份有限公司 LED core particle sorting method
CN112317339A (en) * 2020-09-10 2021-02-05 中国石油大学(华东) A kind of LED chip sorting system and sorting method
TWI743870B (en) * 2020-07-06 2021-10-21 友達光電股份有限公司 Mapping arrangement mechanism

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104550054A (en) * 2014-12-29 2015-04-29 苏州凯锝微电子有限公司 Grain crystal sorting device
CN104550055A (en) * 2014-12-30 2015-04-29 苏州凯锝微电子有限公司 Crystal grain sorting machine
CN107556571A (en) * 2016-07-01 2018-01-09 兴美实业公司 Rubber product, suction nozzle thereof and preparation process
CN106269585A (en) * 2016-07-14 2017-01-04 无锡宏纳科技有限公司 The instrument of defective crystal grain is selected by photographic head
CN106328555A (en) * 2016-08-26 2017-01-11 扬州杰盈汽车芯片有限公司 Magnetic force ink jet test technology applied to semiconductor
CN110538811A (en) * 2018-05-29 2019-12-06 惠特科技股份有限公司 Automatic edge-emitting laser dual-temperature synchronous detection and classification equipment
CN110211898A (en) * 2019-05-08 2019-09-06 深圳市中科智诚科技有限公司 A kind of stable type chip sorting equipment with function of eliminating static
CN110211898B (en) * 2019-05-08 2021-06-04 常州市工业互联网研究院有限公司 A stable chip sorting device with static elimination function
CN112110192A (en) * 2019-06-20 2020-12-22 矽电半导体设备(深圳)股份有限公司 LED core particle sorting method
TWI743870B (en) * 2020-07-06 2021-10-21 友達光電股份有限公司 Mapping arrangement mechanism
CN112317339A (en) * 2020-09-10 2021-02-05 中国石油大学(华东) A kind of LED chip sorting system and sorting method

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Open date: 20091118