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CN101540465B - chip socket - Google Patents

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Publication number
CN101540465B
CN101540465B CN2008100827875A CN200810082787A CN101540465B CN 101540465 B CN101540465 B CN 101540465B CN 2008100827875 A CN2008100827875 A CN 2008100827875A CN 200810082787 A CN200810082787 A CN 200810082787A CN 101540465 B CN101540465 B CN 101540465B
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chip
socket
carrier socket
platform
chip carrier
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CN101540465A (en
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林源记
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King Yuan Electronics Co Ltd
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King Yuan Electronics Co Ltd
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Abstract

The invention relates to a chip socket, which can contain a chip, and comprises: a base, a floating platform, a plurality of probes and a fixing device. The base can be connected to a chip tester: the floating platform is arranged on the base and comprises a positioning surface, and the positioning surface is provided with a plurality of positioning holes; the probe is arranged in the positioning hole; the fixing device is used for fixing the chip. By the chip socket, the chip can be flatly attached to a positioning surface, so that the contact condition of the contact point of the chip and the contact condition of the probe are consistent, the test stability can be improved, meanwhile, the chip socket can fix the chip, the chip can be prevented from being taken up by a chip taking and placing head, and the chip socket is very practical.

Description

芯片插座 chip socket

技术领域technical field

本发明涉及一种芯片插座,特别是涉及一种可以增加测试的稳定度,还能够避免芯片被芯片取放头带起的芯片插座。The invention relates to a chip socket, in particular to a chip socket which can increase the stability of the test and can also prevent the chip from being picked up by the chip pick-and-place head.

背景技术Background technique

随着半导体科技的日益进步,小型化与轻量化的电子元件已经逐渐成为未来电子元件的主流。然而电子元件的小型化与轻量化,也造成电子元件测试制程的诸多问题。With the advancement of semiconductor technology, miniaturized and lightweight electronic components have gradually become the mainstream of future electronic components. However, the miniaturization and weight reduction of electronic components also cause many problems in the testing process of electronic components.

请参阅图1所示,是显示现有习知的芯片插座的侧视示意图。该芯片(芯片即晶片,本文均称为芯片)插座100,包含基座110、定位框120以及复数的探针(pogopin)130。该定位框120设置于基座110上,用以定位芯片50的位置,该复数的探针130设置于基座110上,一端可接触芯片50的接点51,一端连接至测试仪器。其中,该芯片50的取放是由芯片取放头60藉由真空吸力进行,将芯片50移至芯片插座100进行测试,待测试完成后,再将芯片50移出芯片插座100。Please refer to FIG. 1 , which is a schematic side view showing a conventional chip socket. The chip (a chip is a chip, referred to herein as a chip) socket 100 includes a base 110 , a positioning frame 120 and a plurality of probes (pogopins) 130 . The positioning frame 120 is disposed on the base 110 for positioning the position of the chip 50 . The plurality of probes 130 are disposed on the base 110 , one end can contact the contact 51 of the chip 50 , and the other end is connected to a testing instrument. Wherein, the pick-and-place of the chip 50 is carried out by the chip pick-and-place head 60 by vacuum suction, and the chip 50 is moved to the chip socket 100 for testing. After the test is completed, the chip 50 is moved out of the chip socket 100 .

随着电子元件的小型化与轻量化,利用上述芯片插座100进行测试,容易出现不稳定的问题,上述芯片插座100是利用定位框120的穴型与芯片50的外型进行定位,待完成芯片50的定位后,再对芯片50进行测试,由于芯片50无法平贴,因此容易造成芯片50的接点51与探针130的接触状况不一致,进而造成测试的不稳定;例如,当芯片50封装形式为球状阵列型(BGA type)时,采用芯片50外型进行定位的方式,很容易造成测试的不稳定;另外,当芯片50尺寸较小时,芯片取放头60容易将芯片50带起而造成测试的不稳定。Along with the miniaturization and weight reduction of electronic components, using the above-mentioned chip socket 100 for testing is prone to unstable problems. The above-mentioned chip socket 100 is positioned by using the hole shape of the positioning frame 120 and the shape of the chip 50. The chip to be completed After the location of 50, chip 50 is tested again, because chip 50 can't flat paste, therefore easily cause the contacts 51 of chip 50 and the contact condition of probe 130 to be inconsistent, and then cause the instability of test; For example, when chip 50 packaging forms When it is a ball array type (BGA type), it is easy to cause unstable testing by adopting the shape of the chip 50 for positioning; in addition, when the size of the chip 50 is small, the chip pick-and-place head 60 will easily lift the chip 50 and cause The test is unstable.

由此可见,上述现有的芯片插座在结构与使用上,显然仍存在有不便与缺陷,而亟待加以进一步改进。为了解决上述存在的问题,相关厂商莫不费尽心思来谋求解决之道,但是长久以来一直未见适用的设计被发展完成,而一般产品又没有适切结构能够解决上述问题,此显然是相关业者急欲解决的问题。鉴于上述现有技术存在的缺点,有必要提出一种芯片插座,芯片可以平贴于一定位面,使芯片的接点与探针的接触状况一致,可以增加测试的稳定度,同时芯片插座可固定芯片,避免芯片被芯片取放头带起。因此如何能创设一种符合需求的新型结构的芯片插座,实属当前重要研发课题之一,亦成为当前业界极需改进的目标。It can be seen that the above-mentioned existing chip socket obviously still has inconvenience and defects in structure and use, and needs to be further improved urgently. In order to solve the above-mentioned problems, the relevant manufacturers have tried their best to find a solution, but for a long time no suitable design has been developed, and the general products do not have a suitable structure to solve the above-mentioned problems. urgent problem to be solved. In view of the shortcomings of the above prior art, it is necessary to propose a chip socket, the chip can be flatly attached to a positioning surface, so that the contacts of the chip and the probes are in the same contact state, which can increase the stability of the test. At the same time, the chip socket can be fixed chip, to prevent the chip from being picked up by the chip pick and place head. Therefore, how to create a chip socket with a new structure that meets the needs is one of the current important research and development topics, and has become a goal that the industry needs to improve.

有鉴于上述现有的芯片插座存在的缺陷,本发明人基于从事此类产品设计制造多年丰富的实务经验及专业知识,并配合学理的运用,积极加以研究创新,以期创设一种新型结构的芯片插座,能够改进一般现有的芯片插座,使其更具有实用性。经过不断的研究、设计,并经过反复试作样品及改进后,终于创设出确具实用价值的本发明。In view of the defects of the above-mentioned existing chip sockets, the inventor actively researches and innovates based on years of rich practical experience and professional knowledge engaged in the design and manufacture of such products, and cooperates with the application of academic theories, in order to create a chip with a new structure The socket can improve the general existing chip socket to make it more practical. Through continuous research, design, and after repeated trial samples and improvements, the present invention with practical value is finally created.

发明内容Contents of the invention

本发明的目的在于,克服现有的芯片插座存在的缺陷,而提供一种新型结构的芯片插座,所要解决的技术问题是使芯片可以平贴于一定位面,使芯片的接点与探针的接触状况一致,藉此可以增加测试的稳定度,同时芯片插座可以固定芯片,能够避免芯片被芯片取放头带起,非常适于实用。The purpose of the present invention is to overcome the defects of the existing chip socket and provide a chip socket with a new structure. The technical problem to be solved is to make the chip flat on a positioning surface, so that the contact of the chip and the probe The contact status is consistent, which can increase the stability of the test. At the same time, the chip socket can fix the chip and prevent the chip from being picked up by the chip pick-and-place head, which is very suitable for practical use.

本发明的目的及解决其技术问题是采用以下技术方案来实现的。依据本发明提出的一种芯片插座,该芯片插座可以容纳一芯片,该芯片插座包含:一基座,该基座可连接至一芯片测试机:一平台,该平台是设置于该基座,该平台包含一定位面,该定位面具有复数的定位孔;复数的探针,该等探针设置于该定位孔内;以及一固定装置,用以固定该芯片。The purpose of the present invention and the solution to its technical problems are achieved by adopting the following technical solutions. According to a chip socket proposed by the present invention, the chip socket can accommodate a chip, and the chip socket includes: a base, the base can be connected to a chip testing machine; a platform, the platform is set on the base, The platform includes a positioning surface, the positioning surface has a plurality of positioning holes; a plurality of probes, the probes are arranged in the positioning holes; and a fixing device is used to fix the chip.

本发明的目的及解决其技术问题还可采用以下技术措施进一步实现。The purpose of the present invention and its technical problems can also be further realized by adopting the following technical measures.

前述的芯片插座,其中所述的芯片可平贴该定位面。In the aforementioned chip socket, the chip can be flatly attached to the positioning surface.

前述的芯片插座,其中所述的定位孔的位置是对应该芯片的一接点。In the aforementioned chip socket, the position of the positioning hole corresponds to a contact point of the chip.

前述的芯片插座,其中所述的芯片包含复数的球状接点,该等球状接点可容纳于该等定位孔内。In the aforementioned chip socket, the chip includes a plurality of ball joints, and the ball joints can be accommodated in the positioning holes.

前述的芯片插座,其中所述的平台为一浮动式平台,该浮动式平台与该基座间设置有复数个弹性元件。In the aforementioned chip socket, the platform is a floating platform, and a plurality of elastic elements are arranged between the floating platform and the base.

前述的芯片插座,其中所述的固定装置包含至少一滑块,该滑块可推顶该芯片。In the aforementioned chip socket, the fixing device includes at least one slider, and the slider can push the chip.

前述的芯片插座,其中所述的滑块的一侧设置有至少一弹性元件,该弹性元件可提供该滑块顶推该芯片的力量。In the aforementioned chip socket, at least one elastic element is provided on one side of the slider, and the elastic element can provide the force for the slider to push the chip.

前述的芯片插座,其中所述的固定装置包含一释放孔,当一释放柱插入该释放孔时,该固定装置可释放该芯片。In the aforementioned chip socket, the fixing device includes a release hole, and when a release column is inserted into the release hole, the fixing device can release the chip.

前述的芯片插座,其中所述的释放柱是设置于一芯片取放头,该芯片取放头是用以取放该芯片。In the above-mentioned chip socket, the release post is arranged on a chip pick-and-place head, and the chip pick-and-place head is used to pick and place the chip.

本发明与现有技术相比具有明显的优点和有益效果。由以上可知,为达到上述目的,本发明提供了一种芯片插座,该芯片插座可容纳一芯片,该芯片插座包含:一基座、一浮动式平台以及复数的探针(pogopin)。该基座可连接至一芯片测试机:该浮动式平台设置于该基座,该浮动式平台包含一定位面,该定位面具有复数的定位孔;该探针设置于该定位孔内。Compared with the prior art, the present invention has obvious advantages and beneficial effects. As can be seen from the above, in order to achieve the above purpose, the present invention provides a chip socket, which can accommodate a chip, and the chip socket includes: a base, a floating platform and a plurality of pogopins. The base can be connected to a chip testing machine: the floating platform is set on the base, the floating platform includes a positioning surface, and the positioning surface has a plurality of positioning holes; the probe is set in the positioning hole.

根据本发明的一实施例,前述复数的定位孔,用以容纳芯片的球状接点,藉以进行定位,由于芯片可以平贴于前述的定位面,因此可使芯片的接点与探针的接触状况一致;另外芯片插座包含固定装置,用以固定芯片,可以避免芯片被芯片取放头带起。According to an embodiment of the present invention, the plurality of positioning holes are used to accommodate the ball joints of the chip for positioning. Since the chip can be flatly attached to the aforementioned positioning surface, the contact conditions of the chip contacts and the probes can be consistent. ; In addition, the chip socket includes a fixing device for fixing the chip, which can prevent the chip from being picked up by the chip pick-and-place head.

借由上述的技术方案,本发明芯片插座至少具有下列的优点及有益效果:藉由本发明的芯片插座,芯片可以平贴于一定位面,使芯片的接点与探针的接触状况一致,藉此能够增加测试的稳定度,同时芯片插座可以固定芯片,能够避免芯片被芯片取放头带起,非常适于实用。With the above-mentioned technical solution, the chip socket of the present invention has at least the following advantages and beneficial effects: With the chip socket of the present invention, the chip can be flatly attached to a positioning surface, so that the contact state of the chip and the probe are consistent, thereby It can increase the stability of the test, and at the same time, the chip socket can fix the chip, which can prevent the chip from being picked up by the chip pick-and-place head, which is very suitable for practical use.

综上所述,本发明是有关一种芯片插座,该芯片插座可容纳一芯片,该芯片插座包含:一基座、一浮动式平台、复数的探针以及一固定装置。该基座可连接至一芯片测试机:该浮动式平台设置于该基座,该浮动式平台包含一定位面,该定位面具有复数的定位孔;该探针设置于该定位孔内;该固定装置是用以固定该芯片。本发明可以增加测试的稳定度,同时芯片插座可以固定芯片,能够避免芯片被芯片取放头带起,非常适于实用。本发明具有上述诸多优点及实用价值,其不论在产品结构或功能上皆有较大改进,在技术上有显著的进步,并产生了好用及实用的效果,且较现有的芯片插座具有增进的突出功效,从而更加适于实用,诚为一新颖、进步、实用的新设计。To sum up, the present invention relates to a chip socket, which can accommodate a chip. The chip socket includes: a base, a floating platform, a plurality of probes and a fixing device. The base can be connected to a chip testing machine: the floating platform is set on the base, the floating platform includes a positioning surface, and the positioning surface has a plurality of positioning holes; the probes are set in the positioning holes; The fixing device is used to fix the chip. The invention can increase the stability of the test, and at the same time, the chip socket can fix the chip, which can prevent the chip from being picked up by the chip pick-and-place head, and is very suitable for practical use. The present invention has the above-mentioned many advantages and practical value, it has great improvement no matter in product structure or function, has remarkable progress in technology, and has produced easy-to-use and practical effects, and has more advantages than existing chip sockets. The outstanding function of promotion is more suitable for practical use, and it is a novel, progressive and practical new design.

上述说明仅是本发明技术方案的概述,为了能够更清楚了解本发明的技术手段,而可依照说明书的内容予以实施,并且为了让本发明的上述和其他目的、特征和优点能够更明显易懂,以下特举较佳实施例,并配合附图,详细说明如下。The above description is only an overview of the technical solution of the present invention. In order to better understand the technical means of the present invention, it can be implemented according to the contents of the description, and in order to make the above and other purposes, features and advantages of the present invention more obvious and understandable , the following preferred embodiments are specifically cited below, and are described in detail as follows in conjunction with the accompanying drawings.

附图说明Description of drawings

图1是显示现有习知的芯片插座的侧视示意图。FIG. 1 is a schematic side view showing a conventional chip socket.

图2A与图2B是显示根据本发明一较佳实施例芯片插座的立体示意图及立体剖面示意图。FIG. 2A and FIG. 2B are a schematic perspective view and a schematic perspective cross-sectional view showing a chip socket according to a preferred embodiment of the present invention.

图2C是显示图2A中芯片插座的剖面示意图。FIG. 2C is a schematic cross-sectional view showing the chip socket in FIG. 2A .

50:芯片        51:接点50: Chip 51: Contact

60:芯片取放头  61:释放柱60: chip pick and place head 61: release column

100:芯片插座   110:基座100: chip socket 110: base

120:定位框     130:探针120: Positioning frame 130: Probe

200:芯片插座   210:基座200: chip socket 210: base

220:浮动式平台 221:定位面220: floating platform 221: positioning surface

222:定位孔     230:探针222: positioning hole 230: probe

240:固定装置   241:滑块240: Fixture 241: Slider

242:弹簧       243:释放孔242: Spring 243: Release hole

具体实施方式Detailed ways

为更进一步阐述本发明为达成预定发明目的所采取的技术手段及功效,以下结合附图及较佳实施例,对依据本发明提出的芯片插座其具体实施方式、结构、特征及其功效,详细说明如后。In order to further explain the technical means and effects of the present invention to achieve the intended purpose of the invention, the specific implementation, structure, features and effects of the chip socket proposed according to the present invention will be described in detail below in conjunction with the accompanying drawings and preferred embodiments. The description is as follows.

有关本发明的前述及其他技术内容、特点及功效,在以下配合参考图式的较佳实施例的详细说明中将可清楚呈现。通过具体实施方式的说明,当可对本发明为达成预定目的所采取的技术手段及功效得一更加深入且具体的了解,然而所附图式仅是提供参考与说明之用,并非用来对本发明加以限制。The aforementioned and other technical contents, features and effects of the present invention will be clearly presented in the following detailed description of preferred embodiments with reference to the drawings. Through the description of the specific implementation mode, when the technical means and functions adopted by the present invention to achieve the predetermined purpose can be obtained a deeper and more specific understanding, but the accompanying drawings are only for reference and description, and are not used to explain the present invention be restricted.

本发明的一些实施例将详细描述如下。然而,除了如下描述外,本发明还可以广泛地在其他的实施例施行,且本发明的范围并不受实施例的限定,其以专利范围为准。再者,为提供更清楚的描述及更易理解本发明,图式内各部分并没有依照其相对尺寸绘图,某些尺寸与其他相关尺度相比已经被夸张;不相关的细节部分也未完全绘出,以求图式的简洁。Some embodiments of the present invention will be described in detail as follows. However, in addition to the following descriptions, the present invention can also be widely implemented in other embodiments, and the scope of the present invention is not limited by the embodiments, and the patent scope shall prevail. Furthermore, in order to provide a clearer description and a better understanding of the present invention, various parts in the drawings have not been drawn according to their relative sizes, and some dimensions have been exaggerated compared with other relevant dimensions; irrelevant details have not been fully drawn. out, in order to simplify the schema.

请参阅图2A与图2B所示,是显示根据本发明一较佳实施例芯片插座的立体示意图及立体剖面示意图。该芯片插座200,可容纳一芯片,该芯片插座200包含:一基座210、浮动式平台220、复数的探针230以及固定装置240。Please refer to FIG. 2A and FIG. 2B , which are a schematic perspective view and a schematic perspective cross-sectional view of a chip socket according to a preferred embodiment of the present invention. The chip socket 200 can accommodate a chip, and the chip socket 200 includes: a base 210 , a floating platform 220 , a plurality of probes 230 and a fixing device 240 .

上述的基座210,可连接至一芯片测试机;The above-mentioned base 210 can be connected to a chip testing machine;

上述的浮动式平台220,设置于该基座210,该浮动式平台220与基座210之间设置有复数的弹簧(图中未示),使得在该芯片测试机下压对芯片进行测试时,该浮动式平台220能与芯片保持紧密接触。该浮动式平台220包含一定位面221,该定位面221具有复数的定位孔222;The above-mentioned floating platform 220 is arranged on the base 210, and a plurality of springs (not shown) are arranged between the floating platform 220 and the base 210, so that when the chip testing machine is pressed down to test the chip , the floating platform 220 can keep in close contact with the chip. The floating platform 220 includes a positioning surface 221, and the positioning surface 221 has a plurality of positioning holes 222;

上述的探针230,设置于该定位孔222内,前述复数的定位孔222,是用以容纳芯片的球状接点,藉以进行定位;The above-mentioned probes 230 are arranged in the positioning holes 222, and the aforementioned plurality of positioning holes 222 are used to accommodate the ball joints of the chip for positioning;

上述的固定装置240,是用以固定该芯片。The above-mentioned fixing device 240 is used to fix the chip.

如图2B所示,是显示图2A图中芯片插座的立体剖面示意图。其中该探针230设置于该定位孔222内,当芯片容纳于该芯片插座200时,芯片可平贴于定位面221;定位孔222的位置是对应该芯片的一接点,当芯片封装形式为球状阵列型(BGA type)时,芯片包含复数的球状接点,该等球状接点容纳于该等定位孔222内。As shown in FIG. 2B , it is a perspective cross-sectional view showing the chip socket in FIG. 2A . Wherein the probe 230 is arranged in the positioning hole 222, when the chip is accommodated in the chip socket 200, the chip can be flatly attached to the positioning surface 221; the position of the positioning hole 222 is a contact point corresponding to the chip, when the chip packaging form is In the BGA type, the chip includes a plurality of ball joints, and the ball joints are accommodated in the positioning holes 222 .

该固定装置240,包含至少一滑块241以及一弹簧242;该弹簧242设置于该滑块241的一端,用以将该滑块241朝芯片的方向推顶,使得该滑块241可推顶芯片的侧边,藉以固定该芯片。该滑块241包含一释放孔243,当一释放柱(图中未示)插入该释放孔243时,该滑块241可朝外移动,而释放该芯片。The fixing device 240 includes at least one slide block 241 and a spring 242; the spring 242 is arranged at one end of the slide block 241 to push the slide block 241 towards the direction of the chip, so that the slide block 241 can be pushed up The side of the chip, so as to fix the chip. The slider 241 includes a release hole 243 , and when a release post (not shown) is inserted into the release hole 243 , the slider 241 can move outward to release the chip.

根据本实施例,该滑块241是设置于该芯片的两侧,但是并不以此为限,滑块241也可以设置于该芯片的四周,藉由推顶芯片的侧边而固定该芯片。According to this embodiment, the slider 241 is arranged on both sides of the chip, but it is not limited thereto. The slider 241 can also be arranged around the chip to fix the chip by pushing the side of the chip .

请参阅图2C所示,是显示图2A中芯片插座的剖面示意图。其中芯片取放头60包含至少一释放柱61,芯片50是一球状阵列型芯片,该芯片50包含复数的球状接点51。Please refer to FIG. 2C , which is a schematic cross-sectional view of the chip socket shown in FIG. 2A . The chip pick-and-place head 60 includes at least one release column 61 , the chip 50 is a ball array chip, and the chip 50 includes a plurality of ball contacts 51 .

现将本发明以芯片插座200,进行芯片50的测试步骤具体说明如下:Now with the chip socket 200 of the present invention, the test steps of the chip 50 are specifically described as follows:

首先,藉由芯片取放头60的真空吸力,将芯片50移至芯片插座200的上方;其次,将芯片取放头60的释放柱61插入滑块241的释放孔243内,使得滑块241朝外移动,而露出可容纳芯片50的空间;接着,芯片取放头60向下移动,将芯片50置入容纳芯片50的空间,此时芯片50的球状接点容纳于定位孔222内,藉以进行定位,当芯片50平贴于定位面221时,芯片取放头60停止向下移动,由于芯片50平贴于定位面221,因此芯片50的球状接点与探针230产生稳定的接触;最后,芯片取放头60取消真空吸力并向上移动,当芯片取放头60的释放柱61脱离释放孔243时,滑块241藉由弹簧242的力量推顶芯片50的侧边,藉以固定芯片50,能够避免芯片50被芯片取放头60带起。First, move the chip 50 to the top of the chip socket 200 by the vacuum suction of the chip pick-and-place head 60; secondly, insert the release post 61 of the chip pick-and-place head 60 into the release hole 243 of the slider 241, so that the slider 241 Move outwards, and expose the space that can accommodate chip 50; Then, chip pick-and-place head 60 moves down, and chip 50 is placed into the space that accommodates chip 50, and the ball joint of chip 50 is accommodated in the positioning hole 222 at this moment, thereby Carry out positioning, when the chip 50 is flat on the positioning surface 221, the chip pick-and-place head 60 stops moving downward, because the chip 50 is flat on the positioning surface 221, so the ball joint of the chip 50 and the probe 230 produce stable contact; finally , the chip pick-and-place head 60 cancels the vacuum suction and moves upward. When the release column 61 of the chip pick-and-place head 60 breaks away from the release hole 243, the slider 241 pushes the side of the chip 50 by the force of the spring 242, thereby fixing the chip 50 , can prevent the chip 50 from being taken up by the chip pick-and-place head 60 .

当芯片50完成测试后,芯片取放头60的释放柱61插入滑块241的释放孔243内,使得滑块241朝外移动,使得滑块241与芯片50之间具有一适当的空隙,再由芯片取放头60以真空吸力将芯片50吸起。After the chip 50 is tested, the release column 61 of the chip pick-and-place head 60 is inserted into the release hole 243 of the slide block 241, so that the slide block 241 moves outward, so that there is an appropriate gap between the slide block 241 and the chip 50, and then The chip 50 is sucked up by the chip pick-and-place head 60 with vacuum suction.

藉由本发明的芯片插座,芯片可以平贴于一定位面,使芯片的接点与探针的接触状况一致,藉此可以增加测试的稳定度,同时芯片插座还可以固定芯片,能够避免芯片被芯片取放头带起。With the chip socket of the present invention, the chip can be flatly attached to a positioning surface, so that the contacts of the chip and the probes are in the same contact state, thereby increasing the stability of the test. At the same time, the chip socket can also fix the chip, which can prevent the chip from being caught by the chip. Take and put the headband up.

以上所述,仅是本发明的较佳实施例而已,并非对本发明作任何形式上的限制,虽然本发明已以较佳实施例揭露如上,然而并非用以限定本发明,任何熟悉本专业的技术人员,在不脱离本发明技术方案范围内,当可利用上述揭示的技术内容作出些许更动或修饰为等同变化的等效实施例,但凡是未脱离本发明技术方案的内容,依据本发明的技术实质对以上实施例所作的任何简单修改、等同变化与修饰,均仍属于本发明技术方案的范围内。The above description is only a preferred embodiment of the present invention, and does not limit the present invention in any form. Although the present invention has been disclosed as above with preferred embodiments, it is not intended to limit the present invention. Anyone familiar with this field Those skilled in the art, without departing from the scope of the technical solution of the present invention, can use the technical content disclosed above to make some changes or modify equivalent embodiments with equivalent changes, but all the content that does not depart from the technical solution of the present invention, according to the present invention Any simple modifications, equivalent changes and modifications made to the above embodiments by the technical essence still belong to the scope of the technical solutions of the present invention.

Claims (8)

1. chip carrier socket, this chip carrier socket can hold a chip, it is characterized in that this chip carrier socket comprises:
One pedestal, this pedestal can be connected to a chip testing machine:
One platform, this platform is arranged at this pedestal, and this platform comprises a locating surface, and this locating surface has the location hole of plural number;
The probe of plural number, these probes are arranged in this location hole; And
One fixture, in order to fix this chip, wherein, this fixture comprises at least one slide block, but this this chip of slide block ejection.
2. chip carrier socket according to claim 1 is characterized in that wherein said chip can smooth this locating surface.
3. chip carrier socket according to claim 1, the position that it is characterized in that wherein said location hole are to a contact that should chip.
4. chip carrier socket according to claim 1 is characterized in that wherein said chip comprises the spherical contact of plural number, and these spherical contacts can be contained in these location holes.
5. chip carrier socket according to claim 1 is characterized in that wherein said platform is a floating type platform, is provided with a plurality of flexible members between this floating type platform and this pedestal.
6. chip carrier socket according to claim 1 is characterized in that a side of wherein said slide block is provided with at least one flexible member, and this flexible member can provide the strength of this this chip of slide block pushing tow.
7. chip carrier socket according to claim 1 is characterized in that wherein said fixture comprises a release aperture, and when a release post inserted this release aperture, this fixture can discharge this chip.
8. chip carrier socket according to claim 7 is characterized in that wherein said release post is to be arranged at a chip to pick and place head, and it is in order to pick and place this chip that this chip picks and places head.
CN2008100827875A 2008-03-19 2008-03-19 chip socket Expired - Fee Related CN101540465B (en)

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CN101710659B (en) * 2009-12-11 2011-07-27 安拓锐高新测试技术(苏州)有限公司 Test jack for reactive controllable chip
CN102109537A (en) * 2009-12-23 2011-06-29 致茂电子(苏州)有限公司 Radio shielding test socket and testing machine using radio shielding test sockets
CN104764909B (en) * 2015-04-09 2018-06-22 中国计量科学研究院 Convenient chip test base available for extremely low temperature measurement
CN109884503A (en) * 2019-03-14 2019-06-14 环维电子(上海)有限公司 A kind of test nesting, test fixture and the method for chip testing
CN111293454B (en) * 2020-03-02 2021-08-06 瑞声精密制造科技(常州)有限公司 Transmission line testing device
CN114646784A (en) * 2022-03-16 2022-06-21 苏州艾方芯动自动化设备有限公司 Test seat capable of being accurately positioned

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