[go: up one dir, main page]

CN101469415B - Plasma-assisted organic thin film deposition device - Google Patents

Plasma-assisted organic thin film deposition device Download PDF

Info

Publication number
CN101469415B
CN101469415B CN2007103023630A CN200710302363A CN101469415B CN 101469415 B CN101469415 B CN 101469415B CN 2007103023630 A CN2007103023630 A CN 2007103023630A CN 200710302363 A CN200710302363 A CN 200710302363A CN 101469415 B CN101469415 B CN 101469415B
Authority
CN
China
Prior art keywords
plasma
thin film
organic thin
film deposition
chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2007103023630A
Other languages
Chinese (zh)
Other versions
CN101469415A (en
Inventor
黄国兴
林东颖
张均豪
王家宏
王登彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Industrial Technology Research Institute ITRI
Original Assignee
Industrial Technology Research Institute ITRI
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Industrial Technology Research Institute ITRI filed Critical Industrial Technology Research Institute ITRI
Priority to CN2007103023630A priority Critical patent/CN101469415B/en
Publication of CN101469415A publication Critical patent/CN101469415A/en
Application granted granted Critical
Publication of CN101469415B publication Critical patent/CN101469415B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Physical Vapour Deposition (AREA)
  • Chemical Vapour Deposition (AREA)

Abstract

本发明提供一种等离子体辅助有机薄膜沉积装置,其主要由一等离子体产生室及一沉积室构成,该等离子体产生室可等离子体热裂解该等离子体产生室内的可聚合材料气体;该沉积室与该等离子体产生室连通,用以接收该热裂解的可聚合材料气体,该沉积室包括一基板装置,该基板装置可供该热裂解的可聚合材料气体沉积于其上以形成有机薄膜;由于等离子体产生室与沉积室分离,因此可提供一低温薄膜沉积工艺,并可避免等离子体离子直接撞击基板;另可于该等离子体产生室的出口端设置导流装置,对可聚合材料气体产生导流或扰流作用,避免过度集中于出口端或基板中心,可有效改善有机薄膜表面粗糙度并提升其均匀性。

The invention provides a plasma-assisted organic thin film deposition device, which is mainly composed of a plasma generating chamber and a deposition chamber. The plasma generating chamber can thermally decompose polymerizable material gas in the plasma generating chamber by plasma; the deposition chamber is connected with the plasma generating chamber to receive the thermally decomposed polymerizable material gas, and the deposition chamber comprises a substrate device, on which the thermally decomposed polymerizable material gas can be deposited to form an organic thin film; since the plasma generating chamber is separated from the deposition chamber, a low-temperature thin film deposition process can be provided, and plasma ions can be prevented from directly impacting the substrate; in addition, a flow guide device can be arranged at the outlet end of the plasma generating chamber to generate a flow guide or turbulence effect on the polymerizable material gas to prevent excessive concentration at the outlet end or the center of the substrate, thereby effectively improving the surface roughness of the organic thin film and enhancing its uniformity.

Description

等离子体辅助有机薄膜沉积装置 Plasma Assisted Organic Thin Film Deposition Device

技术领域technical field

本发明关于一种等离子体辅助有机薄膜沉积装置,尤其涉及一种等离子体产生室与沉积室分离的有机薄膜沉积装置。The invention relates to a plasma-assisted organic thin film deposition device, in particular to an organic thin film deposition device in which a plasma generation chamber is separated from a deposition chamber.

背景技术Background technique

由于OLED(有机发光二极体)显示面板极易吸收空气中的水分而致其使用寿命短暂,无法与LCD面板抗衡,导致OLED产品在市场拓展上普遍存在障碍;而高分子有机薄膜与无机薄膜搭配构筑多层膜后,可有效降低水气进入机率,使OLED产品寿命延长。Because the OLED (Organic Light Emitting Diode) display panel easily absorbs moisture in the air, its service life is short, and it cannot compete with LCD panels, resulting in widespread obstacles in the market expansion of OLED products; while polymer organic films and inorganic films With the construction of multi-layer film, it can effectively reduce the chance of moisture ingress and prolong the life of OLED products.

聚对二甲苯(Parylene)有机薄膜可形成无针孔膜层,有极好的阻水氧的特性,材料无色且高透明度,具有极高的绝缘强度,抵抗生锈、腐蚀、风化等;目前一般的聚对二甲苯(Parylene)镀膜方式是将粉末状的材料,经过汽化(150℃)与裂解(650℃)的过程后,导入沉积室中,在室温下以气相沉积(CVD)的方式沉积在基板表面;但是,此种方式形成的有机薄膜表面均匀度与粗糙度不均。Parylene organic film can form a pinhole-free film layer, which has excellent water and oxygen blocking characteristics. The material is colorless and highly transparent, has extremely high dielectric strength, and is resistant to rust, corrosion, weathering, etc.; At present, the general parylene (Parylene) coating method is to introduce the powdery material into the deposition chamber after vaporization (150°C) and cracking (650°C), and vapor deposition (CVD) at room temperature However, the surface uniformity and roughness of the organic thin film formed in this way are not uniform.

针对专利而言,如美国发明专利早期公开US 20050000435号“Reactor forproducing reactive intermediates for low dielectric constant polymer thin films”,及美国发明专利US 5958510号“Method and apparatus for forming a thinpolymer layer on an integrated circuit structure”,该两项专利所提出的有机薄膜工艺,在薄膜沉积腔室外部进行裂解,而后再于薄膜沉积腔室内部以等离子体打断链结,其主要功效在于制造低介电系数的有机薄膜、提升薄膜沉积速度与改善薄膜的热机械性质,但并未提及改善有机薄膜的均匀度与粗糙度;而值得注意的是,其等离子体辅助工艺在薄膜沉积的基板与腔室内进行,不仅薄膜沉积工艺温度高,且由于等离子体离子直接撞击基板,而影响有机薄膜成型品质及寿命。For patents, such as the early publication of US Patent No. US 20050000435 "Reactor for producing reactive intermediates for low dielectric constant polymer thin films", and US Patent No. 5958510 "Method and apparatus for forming a thin polymer layer on an integrated circuit strategy" , the organic thin film process proposed by these two patents is cracked outside the thin film deposition chamber, and then the plasma is used to break the chain inside the thin film deposition chamber. Its main function is to manufacture organic thin films with low dielectric coefficient, Increase the film deposition rate and improve the thermomechanical properties of the film, but did not mention improving the uniformity and roughness of the organic film; it is worth noting that the plasma-assisted process is carried out in the substrate and chamber of the film deposition, not only the film The temperature of the deposition process is high, and because the plasma ions directly hit the substrate, the quality and life of the organic thin film are affected.

发明内容Contents of the invention

本发明的目的在于提出一种等离子体辅助有机薄膜沉积装置,可避免等离子体离子直接撞击基板,并可提供低温薄膜沉积工艺,以有效改善有机薄膜表面粗糙度、提升其均匀性。The purpose of the present invention is to provide a plasma-assisted organic thin film deposition device, which can avoid direct impact of plasma ions on the substrate, and can provide a low-temperature thin film deposition process to effectively improve the surface roughness and uniformity of the organic thin film.

为实现上述目的,本发明提出一种等离子体辅助有机薄膜沉积装置,其主要由一等离子体产生室及一沉积室构成,该等离子体产生室可等离子体热裂解该等离子体产生室内的可聚合材料气体;该沉积室与该等离子体产生室连通,用以接收该热裂解的可聚合材料气体,该沉积室包括一基板装置,该基板装置可供该热裂解的可聚合材料气体沉积于其上以形成有机薄膜。In order to achieve the above object, the present invention proposes a plasma-assisted organic thin film deposition device, which is mainly composed of a plasma generation chamber and a deposition chamber, the plasma generation chamber can plasma thermally crack the polymerizable material gas; the deposition chamber communicates with the plasma generation chamber to receive the thermally decomposed polymerizable material gas, the deposition chamber includes a substrate device, and the substrate device can deposit the thermally decomposed polymerizable material gas on it to form an organic thin film.

本发明的有益效果在于,通过将等离子体产生室与沉积室分离,提供一低温薄膜沉积工艺,并可避免等离子体离子直接撞击基板,可有效改善有机薄膜表面粗糙度并提升其均匀性。The beneficial effect of the present invention is that by separating the plasma generation chamber from the deposition chamber, a low-temperature thin film deposition process is provided, and plasma ions are prevented from directly hitting the substrate, and the surface roughness and uniformity of the organic thin film can be effectively improved.

下面结合附图和具体实施例对本发明进行详细描述,但不作为对本发明的限定。The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments, but not as a limitation of the present invention.

附图说明Description of drawings

图1为本发明的一实施例结构示意图;Fig. 1 is a schematic structural view of an embodiment of the present invention;

图2为本发明的导流装置配合等离子体产生室的立体示意图;Fig. 2 is a three-dimensional schematic view of the flow guiding device of the present invention in cooperation with the plasma generation chamber;

图3为未设置导流装置的长圆筒状等离子体产生室的立体示意图;3 is a schematic perspective view of a long cylindrical plasma generation chamber without a guide device;

图4为未设置导流装置的矩形等离子体产生室的立体示意图;4 is a schematic perspective view of a rectangular plasma generation chamber without a guide device;

图5为本发明的等离子体产生室不同形状的出口端在基板的浓度差异率比较图;Fig. 5 is a comparison diagram of the concentration difference ratio of different outlet ports of the plasma generation chamber of the present invention on the substrate;

图6为本发明另一实施例结构示意图。Fig. 6 is a schematic structural diagram of another embodiment of the present invention.

其中,附图标记Among them, reference signs

1、1a、1b、1c-等离子体产生室1, 1a, 1b, 1c - plasma generation chamber

11-进气装置11-Intake device

12、12a、12b、12c-出口端12, 12a, 12b, 12c - outlet port

14、14a、14b、14c-导流装置14, 14a, 14b, 14c - deflector

141、141a-内缩端141, 141a-retracted end

142、142a-扩张端142, 142a-expansion end

2-沉积室2- Deposition chamber

21-基板装置21- Substrate device

211-支撑器件211-support device

212-转轴212-shaft

213-驱动马达213-Drive motor

3-蒸发室3- Evaporation chamber

31-输入管道31 - input pipeline

4-质量流率控制4- Mass flow rate control

5-射频(RF)发生器5- Radio Frequency (RF) Generator

6-工作气体进气装置6- Working gas intake device

61、62、63-输入管道61, 62, 63 - input pipeline

611、621、631-流量控制器611, 621, 631-flow controller

7-基板7-substrate

8-泵装置8-pump device

9-冷却阻却器9- Cooling resistor

10-裂解室10- Lysis chamber

具体实施方式Detailed ways

为使对本发明的目的、构造、特征、及其功能有进一步的了解,将参照附图并配合实施例详细说明如下,但以下附图及实施例仅为辅助说明,本发明并不限于附图及实施例。In order to have a further understanding of the purpose, structure, features, and functions of the present invention, it will be described in detail below with reference to the accompanying drawings and examples, but the following drawings and examples are only for auxiliary illustrations, and the present invention is not limited to the accompanying drawings and examples.

请参阅图1所示实施例,本发明提供的等离子体辅助有机薄膜沉积装置,其主要包括一等离子体产生室1及一沉积室2。Please refer to the embodiment shown in FIG. 1 , the plasma-assisted organic thin film deposition device provided by the present invention mainly includes a plasma generation chamber 1 and a deposition chamber 2 .

该等离子体产生室1连通一蒸发室3,该蒸发室3具有一输入管道31,可通过该输入管道31输入氩(Ar),用以携带蒸发后的聚对二甲苯(parylene)、对二甲苯(paraxylylene)或聚对亚苯基二亚甲基(PPX)等可聚合材料进入该等离子体产生室1内,该可聚合材料于该蒸发室3内蒸发为可聚合材料气体输入该等离子体产生室1内,通常,该蒸发室3内的工作温度约为摄氏130~170度;可于该蒸发室3与该等离子体产生室1之间设置一质量流率控制器4,用以控制该蒸发室3所蒸发的可聚合材料气体流入该等离子体产生室1的流率。The plasma generation chamber 1 communicates with an evaporation chamber 3, and the evaporation chamber 3 has an input pipe 31 through which argon (Ar) can be input to carry evaporated parylene, para Polymerizable materials such as toluene (paraxylylene) or poly-p-phenylene dimethylene (PPX) enter the plasma generation chamber 1, and the polymerizable material is evaporated in the evaporation chamber 3 into a polymerizable material gas input into the plasma In the generation chamber 1, usually, the operating temperature in the evaporation chamber 3 is about 130-170 degrees Celsius; a mass flow rate controller 4 can be set between the evaporation chamber 3 and the plasma generation chamber 1 to control The flow rate of the vaporized polymerizable material gas in the evaporation chamber 3 flowing into the plasma generation chamber 1 .

在该等离子体产生室1设有一进气装置11以及一出口端12,该进气装置11设置于一导流装置14的中心下方,该进气装置11为一陶瓷管中空管,该陶瓷管套设于该导流装置14内下方,有关该导流装置14的作用将说明于后;该进气装置11与该等离子体产生室1内部以及该出口端12形成一通路;再者,该等离子体产生室1连接一射频(RF)发生器5以及一工作气体进气装置6,由该射频(RF)发生器5供给能量,使工作气体进气装置6内的气体进入等离子体产生室形成产生等离子体源,该射频(RF)发生器5可提供能量给电感耦合式等离子体源(ICP),等离子体形成区域涵盖进气装置11,如图所示,该工作气体进气装置6具有三输入管道61、62、63,且该三输入管道61、62、63分别连接一流量控制器611、621、631,借此可输入不同工作流体,例如氩(Ar)、氧气(O2)及氮气(N2)等等,并通过相对应的流量控制器611、621、631控制工作流体流率;当可聚合材料气体经蒸发室3加热蒸发,通过输入管道31中的氩气携带后,通过质量流率控制器4控制气体流入进气装置11的流量,因为等离子体形成区域包含进气装置11,进气装置11被等离子体轰击产生高温,因此通入进气装置11的气体在此高温下被裂解,并且气体于该等离子体产生室1内进行等离子体热解离。The plasma generation chamber 1 is provided with an air inlet device 11 and an outlet port 12, the air inlet device 11 is arranged under the center of a flow guiding device 14, the air inlet device 11 is a hollow ceramic tube, the ceramic The tube is sleeved at the bottom of the flow guide device 14, and the function of the flow guide device 14 will be described later; the air inlet device 11 forms a passage with the inside of the plasma generation chamber 1 and the outlet port 12; moreover, The plasma generation chamber 1 is connected with a radio frequency (RF) generator 5 and a working gas inlet device 6, and the energy is supplied by the radio frequency (RF) generator 5, so that the gas in the working gas inlet device 6 enters the plasma to generate The chamber is formed to generate a plasma source, and the radio frequency (RF) generator 5 can provide energy to an inductively coupled plasma source (ICP), and the plasma formation area covers an inlet device 11, as shown in the figure, the working gas inlet device 6 has three input pipelines 61, 62, 63, and the three input pipelines 61, 62, 63 are respectively connected to a flow controller 611, 621, 631, so that different working fluids can be input, such as argon (Ar), oxygen (O2 ) and nitrogen (N2), etc., and control the flow rate of the working fluid through the corresponding flow controllers 611, 621, 631; , the flow rate of gas flowing into the intake device 11 is controlled by the mass flow rate controller 4, because the plasma formation area includes the intake device 11, and the intake device 11 is bombarded by plasma to generate high temperature, so the gas passing into the intake device 11 is The gas is cracked at this high temperature, and the gas undergoes plasma thermal dissociation in the plasma generation chamber 1 .

关于该沉积室2,其设置于该等离子体产生室1上方并与该等离子体产生室1相互连通,可用以接收该等离子体产生室1所热裂解的可聚合材料气体;该沉积室2包括一基板装置21,该基板装置21包含一支撑器件211、一转轴212,该支撑器件211的底部用以设置成型有机薄膜的基板7,该转轴212连接一驱动马达213,由该驱动马达213驱动该转轴212旋转,可同步带动该基板7旋转,于此同时,该等离子体产生室1所热裂解的可聚合材料气体上升至基板7时,即可于该基板7表面沉积形成有机薄膜;必须说明的是,该支撑器件211不拘泥于某种特定型态,足以使该基板7设置于其底部即可,而该转轴212及驱动马达213所构成的旋转装置,其目的在于驱动该支撑器件211旋转,进而带动基板7同步旋转,因此,该转轴212及驱动马达213可以其他器件替代,例如驱动马达213可以履带、皮带或齿轮替代,而转轴212可以相对的履带轮、皮带轮或齿轮替代,凡可实现驱动该支撑器件211旋转的目的即可,此为相关技术领域人员熟悉的公知技术,在此不予赘述。Regarding the deposition chamber 2, it is arranged above the plasma generation chamber 1 and communicates with the plasma generation chamber 1, and can be used to receive the polymerizable material gas thermally decomposed by the plasma generation chamber 1; the deposition chamber 2 includes A substrate device 21, the substrate device 21 includes a supporting device 211, a rotating shaft 212, the bottom of the supporting device 211 is used to set the substrate 7 for forming an organic thin film, the rotating shaft 212 is connected to a driving motor 213, driven by the driving motor 213 The rotation of the rotating shaft 212 can synchronously drive the rotation of the substrate 7. At the same time, when the polymerizable material gas thermally decomposed by the plasma generation chamber 1 rises to the substrate 7, an organic film can be deposited on the surface of the substrate 7 to form an organic film; It is noted that the supporting device 211 is not limited to a specific type, it is sufficient to allow the substrate 7 to be disposed at the bottom thereof, and the rotating device formed by the rotating shaft 212 and the driving motor 213 is intended to drive the supporting device 211 to rotate, and then drive the base plate 7 to rotate synchronously, therefore, the rotating shaft 212 and the drive motor 213 can be replaced by other devices, such as the drive motor 213 can be replaced by crawlers, belts or gears, and the rotating shaft 212 can be replaced by relative track wheels, pulleys or gears, As long as the purpose of driving the supporting device 211 to rotate can be achieved, this is a well-known technology familiar to those skilled in the art, and will not be repeated here.

该沉积室2又连通一泵装置8,通过该泵装置8对该沉积室2及该等离子The deposition chamber 2 communicates with a pump device 8 again, and the deposition chamber 2 and the plasma

经上述结构,可归纳出本发明沉积有机薄膜方法的主要包含以下两步骤:Through the above structure, it can be concluded that the method for depositing an organic thin film of the present invention mainly includes the following two steps:

一、进气装置11被等离子体离子撞击,将可聚合材料气体送入该等离子体产生室1内进行等离子体热裂解;进气装置11可被等离子体加热至摄氏约600~900度进行热裂解,热裂解后的材料利用等离子体内带能量的粒子与电子不规则的打断材料的键结,再送入该沉积室2;1. The gas inlet device 11 is impacted by plasma ions, and the polymerizable material gas is sent into the plasma generation chamber 1 for plasma pyrolysis; the gas inlet device 11 can be heated to about 600-900 degrees Celsius by the plasma for thermal Cracking, the material after thermal cracking uses the particles with energy in the plasma and the electrons to break the bond of the material irregularly, and then send it into the deposition chamber 2;

二、热裂解后的可聚合材料气体进入该沉积室2,于基板7上沉积有机薄膜;由于该等离子体产生室1与该沉积室2分离的两腔室,该薄膜沉积工艺远离该等离子体热裂解工艺,因此可控制该沉积室2内的工作环境温度约为摄氏80~100度,亦即最适合有机薄膜沉积的低温工艺温度,同时可避免等离子体离子直接撞击基板7;至于该沉积室2内所设置的可旋转的基板装置21,则有利于改善薄膜粗糙度及均匀度。2. The polymerizable material gas after thermal cracking enters the deposition chamber 2 and deposits an organic thin film on the substrate 7; due to the separation of the plasma generation chamber 1 and the deposition chamber 2, the thin film deposition process is far away from the plasma pyrolysis process, so the temperature of the working environment in the deposition chamber 2 can be controlled at about 80-100 degrees Celsius, which is the most suitable low-temperature process temperature for organic film deposition, and at the same time can avoid direct impact of plasma ions on the substrate 7; as for the deposition The rotatable substrate device 21 provided in the chamber 2 is beneficial to improve the roughness and uniformity of the film.

关于上述改善薄膜粗糙度及均匀度问题,另可通过控制由该等离子体产生室1的出口端12送出的可聚合材料气体的均匀度而实现;如图1所示,在该等离子体产生室1的出口端12设有一导流装置14,该导流装置14的中心下方设置该进气装置11,该导流装置14为一锥状器件,该锥状器件具有一内缩端141以及一扩张端142,该内缩端141朝向该等离子体产生室1,该扩张端142朝向该沉积室2;当经过进气装置11热裂解与等离子体室1的可聚合材料气体经出口端12进入沉积室2通过该导流装置14时,可通过该扩张端142的设置调整该可聚合材料气体的气流角度,将聚合材料气体导向四周,避免集中于该出口端12的中心喷向基板7,同时再配合该可旋转的基板装置21,即可有效改善有机薄膜沉积的均匀度;必须说明的是,该进气装置11的设置位置并不限定于该导流装置14中心下方,只要能够避开该出口端12且可顺利输入该等离子体产生室1内即可。Regarding the above-mentioned problem of improving film roughness and uniformity, it can also be achieved by controlling the uniformity of the polymerizable material gas sent out from the outlet end 12 of the plasma generation chamber 1; as shown in Figure 1, in the plasma generation chamber The outlet end 12 of 1 is provided with a guide device 14, the air inlet device 11 is arranged below the center of the guide device 14, the guide device 14 is a cone-shaped device, and the cone-shaped device has a retracted end 141 and a The expansion end 142, the retracting end 141 faces the plasma generation chamber 1, and the expansion end 142 faces the deposition chamber 2; when the polymerizable material gas passing through the thermal cracking of the inlet device 11 and the plasma chamber 1 enters through the outlet port 12 When the deposition chamber 2 passes through the flow guiding device 14, the gas flow angle of the polymerizable material gas can be adjusted through the setting of the expansion end 142, so that the polymerizable material gas can be guided around, avoiding being concentrated in the center of the outlet end 12 and sprayed toward the substrate 7, At the same time, with the rotatable substrate device 21, the uniformity of organic thin film deposition can be effectively improved; It is sufficient to open the outlet port 12 and be able to smoothly enter the plasma generation chamber 1 .

关于上述该导流装置的立体实施态样,可参阅图2所示实施例,该导流装置14a具有一内缩端141a以及一扩张端142a,与该导流装置14a配合的等离子体产生室1a呈现长圆筒状,其出口端12a设置导流装置14a,该导流装置14a的中心下方设置有一进气装置11a连通该等离子体产生室1a内部以及该出口端12a;将图2所示该等离子体产生室1a产生的圆筒状等离子体,其出口端12a设置有导流装置14a,与图3所示等离子体产生室1b产生的圆筒状等离子体,其出口端12b未设置有导流装置14a,以及图4所示该等离子体产生室1c产生的矩形等离子体,其出口端12c未设置有导流装置14a相互比较,该等离子体产生室1b具有圆形出口端12b,该等离子体产生室1c具有长条形出口端12c;经由实验证明,在相同聚合材料气体流率下,设有导流装置14a的等离子体产生室1a具有较平均的浓度差异率。如图5所示,曲线A代表图2所示设有导流装置14a的等离子体产生室1a,曲线B代表图3所示具有圆形出口端12b的等离子体产生室1b,曲线C代表图3所示具有长条形出口端12c的等离子体产生室1c;其中,该曲线A显示于基板中心(X轴原点)至距离基板0.2米的宽度中,可维持较为平缓的浓度差异率;而该曲线B则显示圆形孔出口端的浓度差异率高于该曲线C的方形出口端;必须说明的是,有关本发明的等离子体产生室的出口端形式并无限定,可为圆形、长条形或任意几何形状,该导流装置的型态也不限定为锥状,重点在于通过导流装置的设置对可聚合材料气体产生导流或扰流作用,避免过度集中于出口端或基板中心即可。For the three-dimensional implementation of the above-mentioned flow guiding device, please refer to the embodiment shown in FIG. 1a is in the shape of a long cylinder, and its outlet end 12a is provided with a guide device 14a, and an air inlet device 11a is arranged below the center of the guide device 14a to communicate with the inside of the plasma generation chamber 1a and the outlet end 12a; The cylindrical plasma generated by the plasma generation chamber 1a has a guide device 14a at its outlet end 12a, and the cylindrical plasma generated by the plasma generation chamber 1b shown in Figure 3 has no guide device 14a at its outlet end 12b. The flow device 14a, and the rectangular plasma generated by the plasma generation chamber 1c shown in FIG. The plasma generating chamber 1c has a strip-shaped outlet 12c; experiments have proved that at the same flow rate of the polymeric material gas, the plasma generating chamber 1a provided with the flow guiding device 14a has a relatively average concentration difference rate. As shown in Figure 5, the curve A represents the plasma generation chamber 1a that is provided with the flow guiding device 14a as shown in Figure 2, the curve B represents the plasma generation chamber 1b with the circular outlet end 12b as shown in Figure 3, and the curve C represents the plasma generation chamber 1b shown in Figure 3. 3 shows a plasma generation chamber 1c with a strip-shaped outlet end 12c; wherein, the curve A is shown in the width from the center of the substrate (the origin of the X-axis) to 0.2 meters from the substrate, and can maintain a relatively gentle concentration difference rate; and The curve B then shows that the concentration difference rate at the outlet end of the circular hole is higher than that at the square outlet end of the curve C; Strip shape or any geometric shape, the shape of the flow guide device is not limited to cone shape, the focus is to guide or disturb the flow of polymerizable material gas through the setting of the flow guide device, so as to avoid excessive concentration on the outlet end or the substrate center.

综上所述,本发明提供的等离子体辅助有机薄膜沉积装置,其特点在于将等离子体产生室与沉积室分离,因此可提供一低温薄膜沉积工艺,并可避免等离子体离子直接撞击基板,可有效改善有机薄膜表面粗糙度并提升其均匀性;再者,本发明的另一特点在于利用等离子体对可聚合材料气体进行热裂解,因此可省略裂解室的设置,简化设备,但基于等离子体解离速度的考虑,亦可依所需再设置一裂解室,请参阅图6所示实施例,其特点在于该蒸发室3与该质量流率控制器4之间设置有一裂解室10,通过该裂解室10接收该蒸发室3所蒸发可聚合材料气体,并对该可聚合材料气体进行早期裂解,其作用在于可提高裂解速度,缩短有机薄膜沉积时间;至于其他组成构件的作用及其所能实现的功效与图1所示实施例相同,可参阅图1实施例的说明。In summary, the plasma-assisted organic thin film deposition device provided by the present invention is characterized in that the plasma generation chamber is separated from the deposition chamber, so a low-temperature thin film deposition process can be provided, and plasma ions can be avoided from directly hitting the substrate, which can Effectively improve the surface roughness of the organic film and enhance its uniformity; moreover, another feature of the present invention is to use plasma to thermally crack the polymerizable material gas, so the setting of the cracking chamber can be omitted, and the equipment can be simplified. Considering the dissociation speed, a cracking chamber can also be set as required, please refer to the embodiment shown in Figure 6, which is characterized in that a cracking chamber 10 is arranged between the evaporation chamber 3 and the mass flow rate controller 4, through The cracking chamber 10 receives the evaporated polymerizable material gas from the evaporation chamber 3, and performs early cracking of the polymerizable material gas. Its effect is to increase the cracking speed and shorten the deposition time of the organic film; The effect that can be realized is the same as that of the embodiment shown in FIG. 1 , and reference may be made to the description of the embodiment in FIG. 1 .

当然,本发明还可有其他多种实施例,在不背离本发明精神及其实质的情况下,熟悉本领域的技术人员可根据本发明作出各种相应的改变和变形,但这些相应的改变和变形都应属于本发明所附的权利要求的保护范围。Certainly, the present invention also can have other multiple embodiments, without departing from the spirit and essence of the present invention, those skilled in the art can make various corresponding changes and deformations according to the present invention, but these corresponding changes All changes and modifications should belong to the scope of protection of the appended claims of the present invention.

Claims (16)

1. a plasma auxiliary organic thin film deposition apparatus is characterized in that, comprises:
One plasma body generating chamber is in order to carry out thermo-cracking to the polymerizable material gas in this plasma body generating chamber;
One sediment chamber, separate setting with this plasma body generating chamber connection and with this plasma body generating chamber, in order to receive this polymerizable material gas of thermo-cracking, this sediment chamber comprises a board device, this board device has a rotatable substrate, and this board device can supply the polymerizable material gas aggradation of this thermo-cracking thereon to form organic film;
Wherein, this plasma body generating chamber has an exit end, this exit end is provided with a guiding device, this guiding device is a taper device, this taper device has contract in one end and an expansion end, and the end that contracts in this is towards this plasma body generating chamber, and this expansion end is towards this sediment chamber, and this exit end can for the polymerizable material gas of this thermo-cracking by and flow into this sediment chamber, the cross section of this exit end can be rounded, long strip shape or random geometry.
2. plasma auxiliary organic thin film deposition apparatus according to claim 1 is characterized in that, this plasma body generating chamber is communicated with an evaporator room, and it is polymerizable material gas that this evaporator room can evaporate polymerizable material.
3. plasma auxiliary organic thin film deposition apparatus according to claim 1, it is characterized in that, this plasma body generating chamber is communicated with a working gas diffuser, and this working gas diffuser is imported this plasma body generating chamber in order to the working gas that the plasma body thermo-cracking is required.
4. plasma auxiliary organic thin film deposition apparatus according to claim 1 is characterized in that, this plasma body generating chamber connects a radio frequency generators, supplies with plasma source by this radio frequency generators, makes plasma source import this plasma body generating chamber.
5. plasma auxiliary organic thin film deposition apparatus according to claim 1 is characterized in that, the board device of this sediment chamber comprises:
One supporting device, its bottom be in order to being provided with this rotatable substrate of moulding organic film, and this plasma body generating chamber of this substrate distance and this sediment chamber are communicated with place's certain distance;
One swivel arrangement is connected with this supporting device, in order to drive this supporting device rotation of this supporting device.
6. plasma auxiliary organic thin film deposition apparatus according to claim 1 is characterized in that this sediment chamber is communicated with a pumping unit, and this pumping unit is in order to produce suction force to this sediment chamber and this plasma body generating chamber.
7. plasma auxiliary organic thin film deposition apparatus according to claim 1 is characterized in that, is provided with a cooling between this pumping unit and this sediment chamber and hinders but device, in order to catch not film forming polymerizable material gas residual in this sediment chamber.
8. plasma auxiliary organic thin film deposition apparatus according to claim 1 is characterized in that, this polymerizable material can be polyphenylene ethyl, p-Xylol or polyparaphenylene dimethylene.
9. plasma auxiliary organic thin film deposition apparatus according to claim 2, it is characterized in that, be provided with a mass flow rate controller between this evaporator room and this plasma body generating chamber, in order to control the flow rate that polymerizable material gas that this evaporator room evaporates flows into these gas ions generating chamber.
10. plasma auxiliary organic thin film deposition apparatus according to claim 9, it is characterized in that, be provided with a cracking room between this evaporator room and this mass flow rate controller, this cracking room can receive this evaporator room and evaporate polymerizable material gas, and this polymerizable material gas is carried out early stage cracking.
11. plasma auxiliary organic thin film deposition apparatus according to claim 2 is characterized in that, the working temperature in this evaporator room is about 130~170 degree Celsius.
12. plasma auxiliary organic thin film deposition apparatus according to claim 1 is characterized in that, this guiding device is in order to adjust the air-flow angle of this polymerizable material gas.
13. plasma auxiliary organic thin film deposition apparatus according to claim 3 is characterized in that, this working gas comprises argon, oxygen and nitrogen.
14. plasma auxiliary organic thin film deposition apparatus according to claim 3 is characterized in that, this diffuser is a vitrified pipe.
15. plasma auxiliary organic thin film deposition apparatus according to claim 5 is characterized in that, this swivel arrangement comprises:
One rotating shaft connects this supporting device;
One CD-ROM drive motor is in order to drive this rotating shaft rotation.
16. plasma auxiliary organic thin film deposition apparatus according to claim 7 is characterized in that, cooling hinders but that device is a freezing trap.
CN2007103023630A 2007-12-25 2007-12-25 Plasma-assisted organic thin film deposition device Expired - Fee Related CN101469415B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2007103023630A CN101469415B (en) 2007-12-25 2007-12-25 Plasma-assisted organic thin film deposition device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2007103023630A CN101469415B (en) 2007-12-25 2007-12-25 Plasma-assisted organic thin film deposition device

Publications (2)

Publication Number Publication Date
CN101469415A CN101469415A (en) 2009-07-01
CN101469415B true CN101469415B (en) 2010-08-25

Family

ID=40827212

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2007103023630A Expired - Fee Related CN101469415B (en) 2007-12-25 2007-12-25 Plasma-assisted organic thin film deposition device

Country Status (1)

Country Link
CN (1) CN101469415B (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI564427B (en) 2009-12-18 2017-01-01 財團法人工業技術研究院 Method for forming parylene film
CN102115876A (en) * 2009-12-31 2011-07-06 财团法人工业技术研究院 Chemical vapor deposition device and method for forming parylene film
CN102383106B (en) * 2010-09-03 2013-12-25 甘志银 Metal organic chemical vapour deposition reaction chamber for fast removing residual reaction gas
TWI458843B (en) * 2011-10-06 2014-11-01 Ind Tech Res Inst Evaporation apparatus and method of forminf organic film
KR102150625B1 (en) * 2013-03-15 2020-10-27 삼성디스플레이 주식회사 Coating apparatus
CN103896283B (en) * 2014-02-19 2016-03-30 上海璞泰来新能源科技股份有限公司 A kind of manufacture method of SiO powder and manufacturing installation
US10504741B2 (en) * 2017-02-28 2019-12-10 Tokyo Electron Limited Semiconductor manufacturing method and plasma processing apparatus
JP2019204815A (en) * 2018-05-21 2019-11-28 東京エレクトロン株式会社 Substrate processing method and substrate processing apparatus
US11898248B2 (en) * 2019-12-18 2024-02-13 Jiangsu Favored Nanotechnology Co., Ltd. Coating apparatus and coating method
CN116892131A (en) * 2023-05-16 2023-10-17 国网浙江省电力有限公司电力科学研究院 Nanometer coating method for improving ageing resistance of plant insulating oil

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5958510A (en) * 1996-01-08 1999-09-28 Applied Materials, Inc. Method and apparatus for forming a thin polymer layer on an integrated circuit structure

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5958510A (en) * 1996-01-08 1999-09-28 Applied Materials, Inc. Method and apparatus for forming a thin polymer layer on an integrated circuit structure

Also Published As

Publication number Publication date
CN101469415A (en) 2009-07-01

Similar Documents

Publication Publication Date Title
CN101469415B (en) Plasma-assisted organic thin film deposition device
TW200924255A (en) Plasma assisted apparatus for forming organic film
JP6513201B2 (en) Material deposition apparatus, vacuum deposition system, and material deposition method
CN103882412B (en) Method of preparing high-barrier film by adopting plasma jet
JP6657239B2 (en) Nozzle for dispensing assembly of material deposition source configuration, material deposition source configuration, vacuum deposition system, and method for depositing material
US20090191350A1 (en) Film forming apparatus and film forming method
CN103305794B (en) A kind of organic film plating device and method
CN104313538B (en) Evaporated device and evaporation coating method
CN101555588B (en) Low-temperature plasma system based on atmosphere pressure glow discharge
TWI824379B (en) PECVD coating system and coating method
WO2020047989A1 (en) Method for manufacturing organic light-emitting diode display
JP5907701B2 (en) Film member manufacturing method
KR101242591B1 (en) Deposition method of anti-finger layer
CN109546006A (en) Flexible OLED display panel and preparation method thereof
KR101631751B1 (en) Apparatus for Coating with Ag-nano wire by cold spray coating and method for controllling the apparatus
CN216404532U (en) Novel vacuum coating equipment
TWI685580B (en) Vacuum evaporation device, evaporation head and vacuum evaporation method
KR100748451B1 (en) Deposition apparatus of organic light emitting device
CN101294279A (en) A plasma coating device for particle surface modification
KR100685808B1 (en) Organics Evaporator
JP2014065259A (en) Film member and method for producing the same
US9359667B2 (en) Low temperature deposition apparatus
KR101541256B1 (en) HMDSO layer and AF layer coating method on aluminum metal layer with ion source
CN113913787A (en) Novel film preparation process and vacuum coating equipment
KR20150041376A (en) a chemical vapor deposition for flexible film

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20100825

CF01 Termination of patent right due to non-payment of annual fee