CN101430348B - State detection device and state detection method - Google Patents
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- CN101430348B CN101430348B CN2007101669709A CN200710166970A CN101430348B CN 101430348 B CN101430348 B CN 101430348B CN 2007101669709 A CN2007101669709 A CN 2007101669709A CN 200710166970 A CN200710166970 A CN 200710166970A CN 101430348 B CN101430348 B CN 101430348B
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Abstract
本发明提供了一种状态检测装置，包括：探针组、处理器以及显示模块。探针组具有多个探针，用以探测待测电压。处理器用以监测探针组所探测到的待测电压的电平变化，并根据监测到的待测电压的电平变化来判断待测电压是否为正常工作状态。显示模块用以显示出各个待测电压的相对时序图及工作状态信息。本发明的状态检测装置可同时对多个电压进行测试，并可在显示幕上显示出直观的时序图。
The present invention provides a state detection device, comprising: a probe group, a processor and a display module. The probe group has a plurality of probes for detecting a voltage to be tested. The processor is used to monitor the level change of the voltage to be tested detected by the probe group, and judge whether the voltage to be tested is in a normal working state according to the monitored level change of the voltage to be tested. The display module is used to display the relative timing diagram and working state information of each voltage to be tested. The state detection device of the present invention can test multiple voltages at the same time, and can display an intuitive timing diagram on a display screen.
Description
Technical field
The invention relates to a kind of voltage tester instrument, and particularly relevant for a kind of voltage tester instrument that can test a plurality of voltage signals simultaneously.
Background technology
In the server hardware test process, generally include the power-on time that adopts testing tool to go to change voltage for the detection of voltage sequential (PowerSequence) and concern whether system can bear the error in the allowed band, and go to measure actual voltage sequential by oscillograph, to detect its voltage signal whether within standard.
The TaiWan, China patent No. is that the patent of invention of TW00564957 discloses a kind of mainboard and electrically measures tool; discern the conducting situation of its circuit by light emitting diode (LED); utilize the protection diode characteristic and the circuit theory of chipset (CHIPSET) again; see through mainboard and electrically measure tool; make direct supply; led state display unit and mainboard to be measured need to form various loops according to measuring, and the open circuit/short circuit condition in its loop is differentiated in the back according to the luminous situation of LED.Simultaneously, each pin position one electrical specification classification of maintenance reference can be arranged on the panel, be beneficial to further service work.
The mainboard of foregoing invention is electrically measured tool is differentiated each parts according to the luminous situation of light emitting diode duty, can not reflect the timing variations of voltage intuitively by sequential chart, thereby also be not easy the voltage sequential of different circuit is compared.And the measurement tool of foregoing invention only is applicable to the measurement that mainboard is electrical, and is not suitable for the voltage timing sequence test of other equipment.
Yet, directly go the voltage sequential of measuring equipment reality by oscillograph, whether detected state the method for the test voltage sequential this commonly used within standard, can see the voltage sequential chart intuitively though adopt oscillograph, and compare more or less freely to the voltage of different sequential, but if need the voltage quantity of test more, then adopt oscillograph to realize comparatively trouble of test, because only having four frequencies, oscillograph shows, on so the relation between every pair or certain several voltage need measured respectively is could complete reflection whole/sequential relationship of electricity down, so its testing efficiency is lower.
Summary of the invention
The invention provides a kind of condition checkout gear, can't test the technological deficiency of a plurality of voltages and display voltage situation of change directly perceived simultaneously to solve existing measuring technology.
The invention provides a kind of condition detection method, can't test the technological deficiency of a plurality of voltages and display voltage situation of change directly perceived simultaneously to solve existing measuring technology.
The present invention proposes a kind of condition checkout gear, and in order to a plurality of voltages to be measured are detected, this condition checkout gear comprises probe groups, processor, display module and load module.Probe groups has a plurality of probes, in order to survey voltage to be measured.Processor has a plurality of I/O interfaces, and a probe links to each other with an I/O interface, this processor changes in order to the level of each voltage to be measured that the monitoring probe group is detected, and writes down the level transformation period point of each voltage to be measured, and judges whether each voltage to be measured is normal operating conditions.Display module links to each other with processor, and the level change information of each voltage to be measured that monitors in order to receiving processor and processor be to the judged result of each voltage power supply state to be measured, and demonstrates the time sequence information and the work state information of voltage to be measured.Load module links to each other with processor, be used to import the configuration information of the equipment that voltage to be measured is provided, so that processor judges relatively according to the configuration information that level changes and load module is imported of the voltage to be measured that monitors whether voltage to be measured is normal operating conditions.
According to the described condition checkout gear of preferred embodiment of the present invention, above-mentioned display module also comprises display screen, driver element and indicative control unit.Display screen is in order to show the relative timing figure and the work state information of each voltage level change to be measured.Driver element is connected in display screen, in order to drive display screen and to make it show the relative timing figure and the work state information of each voltage level change to be measured.Indicative control unit is connected in driver element, the level change information of the voltage to be measured that monitors in order to receiving processor and processor be to the judged result of voltage power supply state to be measured, and make display screen demonstrate the relative timing figure and the work state information of each voltage level change to be measured by driver element.Display module also comprises storage unit, in order to store the relative timing information of each voltage to be measured, for post analysis.This condition checkout gear also comprises the current potential modular converter, and the current potential modular converter is connected between processor and the probe groups, carries out dividing potential drop in order to the voltage to be measured that exceeds the processor measurement range that probe groups is detected, to satisfy the requirement of processor to voltage measurement.This condition checkout gear also comprises protection module, and protection module is connected between processor and the probe groups, is used for cutting off the path between probe and I/O interface when the probe of probe groups and the voltage between processor I/O interface are excessive.Processor is single-chip microcomputer or ARM microprocessor.
The present invention also proposes a kind of condition detection method, in order to a plurality of voltages to be measured are detected, this condition detection method may further comprise the steps: at first, to the configuration information of condition checkout gear input Devices to test, the level that voltage to be measured is connected probe and monitor each voltage to be measured changes.Secondly, relatively judge with configuration information whether voltage to be measured is normal operating conditions according to the level variation of each voltage to be measured that monitors.Then, if level changes the time sequence information that normally then demonstrates each voltage level change to be measured, if level changes wrong time sequence information and wrong concrete condition and the time of taking place that then demonstrates each voltage level change to be measured.
Therefore the present invention can detect a plurality of voltages to be measured simultaneously because of adopting condition checkout gear.And the level that can demonstrate each voltage to be measured changes relative timing figure and work state information, need not be as oscillograph the restriction of tested person quantity, improved testing efficiency and reduced the workload of testing tool.
For above-mentioned and other purposes, feature and advantage of the present invention can be become apparent, preferred embodiment cited below particularly, and conjunction with figs. is described in detail below.
Description of drawings
Fig. 1 illustrates the structural drawing into a kind of condition checkout gear of the embodiment of the invention.
Fig. 2 illustrates the structural drawing into a kind of condition checkout gear of another embodiment of the present invention.
Fig. 3 illustrates the process flow diagram into a kind of condition detection method of the embodiment of the invention.
Fig. 4 illustrates the process flow diagram into a kind of condition detection method of another embodiment of the present invention.
Embodiment
See also Fig. 1, it is the structural drawing of a kind of condition checkout gear of the embodiment of the invention.
The present invention proposes a kind of condition checkout gear 101, in order to a plurality of voltages to be measured are detected, for example in the server hardware test process, the voltage sequential of a plurality of different electrical power is detected, this condition checkout gear 101 comprises: probe groups 105, processor 103 and display module 109.Probe groups 105 has a plurality of probes 107, in order to survey voltage to be measured.Voltage to be measured can be as input voltages such as supply voltages, also can be the output voltage behind the equipment work, as boosting through device interior or the output voltage of step-down etc.Voltage to be measured also can be connected in one on the equipment voltage or be connected in the voltage of distinct device.Processor 103 has a plurality of I/O interfaces 111, and a probe 107 links to each other with an I/O interface 111, this processor 103 changes in order to the level of each voltage to be measured that monitoring probe group 105 is detected, and write down the level transformation period point of each voltage to be measured, and judge whether each voltage to be measured is normal operating conditions.Processor 103 can be single-chip microcomputer or ARM microprocessor etc.Display module 109 links to each other with processor 103, the level change information of each voltage to be measured that monitors in order to receiving processor 103 and processor 103 be to the judged result of each voltage power supply state to be measured, and demonstrate the time sequence information and the work state information of voltage to be measured.
See also Fig. 2, it is the structural drawing of a kind of condition checkout gear of another embodiment of the present invention.
The condition checkout gear 219 of present embodiment, in order to a plurality of voltages to be measured are detected, this condition checkout gear 219 comprises: probe groups 105, processor 215, display module 217, load module 201, protection module 211 and current potential modular converter 213.Probe groups 105 has a plurality of probes 107, in order to survey voltage to be measured.Voltage to be measured can be as input voltages such as supply voltages, also can be the output voltage behind the equipment work, as boosting through device interior or the output voltage of step-down etc.Voltage to be measured also can be connected in one on the equipment voltage or be connected in the voltage of distinct device.Processor has a plurality of I/O interfaces 111, and a probe 107 links to each other with an I/O interface 111, this processor 215 changes in order to the level of each voltage to be measured that monitoring probe group 105 is detected, and write down the level transformation period point of each voltage to be measured, and judge whether each voltage to be measured is normal operating conditions.Processor 215 can be single-chip microcomputer or ARM microprocessor etc.Display module 217 links to each other with processor 215, the level change information of each voltage to be measured that monitors in order to receiving processor 215 and processor 215 be to the judged result of each voltage power supply state to be measured, and demonstrate the time sequence information and the work state information of voltage to be measured.Display module 217 also comprises display screen 203, driver element 205, indicative control unit 207 and storage unit 209.Display screen 203 is in order to show the relative timing figure and the work state information of each voltage level change to be measured.Driver element 205 is connected in display screen 203, in order to drive display screen 203 and to make it show the relative timing figure and the work state information of each voltage level change to be measured.Indicative control unit 207 is connected in driver element 205, the level change information of the voltage to be measured that monitors in order to receiving processor 215 and the judged result of 215 pairs of voltage power supply states to be measured of processor, and make display screen 203 demonstrate the relative timing figure and the work state information of each voltage level change to be measured by driver element 205.Behind the level change information of storage unit 209 in order to the voltage to be measured that monitors at display module 217 receiving processors 215, the relative timing information of storing each voltage to be measured is for post analysis.Load module 201 links to each other with processor 215, be used to import the configuration information of the equipment that voltage to be measured is provided, so that processor 215 judges relatively according to the configuration information that level changes and load module 201 is imported of the voltage to be measured that monitors whether voltage to be measured is normal operating conditions.Temporal characteristics when configuration information is used for the voltage normal operating conditions to be measured of define equipment in the present embodiment, promptly how definition status pick-up unit 219 detects voltage to be measured.Current potential modular converter 213 is connected between processor 215 and the probe groups 105, carry out dividing potential drop in order to the voltage to be measured that exceeds processor 215 measurement ranges that probe groups 105 is detected, to satisfy the requirement of 215 pairs of voltage measurements of processor, its dividing potential drop method can adopt electric resistance partial pressure etc.Protection module 211 is connected between processor 215 and the probe groups 105; be used for when the voltage of 111 of the I/O interfaces of the probe 107 of probe groups 105 and processor 215 is excessive; cut off the path of 111 of probe 107 and I/O interfaces, to play the effect of protection processor 215.
See also Fig. 3, it is the process flow diagram of a kind of condition detection method of the embodiment of the invention.
S301, connect probe and survey level and change.The voltage to be measured a plurality of to be measured of one or more equipment is linked to each other with a plurality of probes, and probe is in order to the level of the voltage to be measured of detecting devices.Voltage to be measured can be as input voltages such as supply voltages, also can be the output voltage of equipment work, as boosting through device interior or the output voltage of step-down etc.
S303, check the duty of each voltage to be measured whether normal.The level of the voltage to be measured that reads according to probe is monitored its level and is changed and note its transformation period point.And judge whether voltage to be measured is normal operating conditions.If voltage power supply state to be measured is normal, then enter step S305, if voltage power supply status error to be measured then enters step S307.
S305, demonstration relative timing figure.According to the level change information of a plurality of voltages to be measured that monitor, the sequential of each voltage and all are concerned that relative timing between voltage converges wholely be uniform data format, and on liquid crystal screen, demonstrate the relative timing figure of each voltage.
S307, demonstration relative timing figure and wrong situation and time of taking place.Level change information and work state information according to a plurality of voltages to be measured that monitor, the sequential of each voltage and all are concerned that relative timing between voltage converges wholely be uniform data format, and a situation arises and the time to demonstrate the relative timing figure of each voltage and the mistake of voltage on liquid crystal screen.
See also Fig. 4, it is the process flow diagram of a kind of condition detection method of another embodiment of the present invention.
S401, the suitable configuration information of input equipment.In addition, also can store the configuration information of various model device in advance, and to the model of load module input equipment, the configuration information of fetch equipment again.Temporal characteristics when configuration information is used for the voltage normal operating conditions to be measured of define equipment in the present embodiment, i.e. how definition detects voltage to be measured.
S403, off-limits voltage to be measured is carried out dividing potential drop.When the level of monitoring voltage to be measured changes, because measure the variation that only needs level, so can carry out dividing potential drop to the excessive voltage that voltage to be measured or probe groups detect, with the measurement range of coincidence measurement instrument, its dividing potential drop method can adopt electric resistance partial pressure etc.
The path at S405, cut-out excessive voltage place.When detecting excessive voltage, cut off its path, place, to play the effect of protection survey instrument.
S407, connect probe and survey level and change.The voltage to be measured a plurality of to be measured of one or more equipment is linked to each other with a plurality of probes, and probe is in order to the level of the voltage to be measured of detecting devices.Voltage to be measured can be as input voltages such as supply voltages, also can be the output voltage of equipment work, as boosting through device interior or the output voltage of step-down etc.
Whether S409, test status be normal.Checkout procedure can be finished by processors such as single-chip microcomputer or ARM microprocessors.Check the duty of each voltage to be measured whether normal.The level of the voltage to be measured that reads according to probe is monitored its level and is changed and note its transformation period point.And judge whether voltage to be measured is normal operating conditions.If voltage power supply state to be measured is normal, then enter step S411, if voltage power supply status error to be measured then enters step S413.
S411, demonstration relative timing figure.Level change information according to a plurality of voltages to be measured that monitor, the sequential of each voltage and all are concerned that relative timing between voltage converges the whole uniform data format that is, and demonstrate the relative timing figure of each voltage on liquid crystal screen, and storage relative timing data are for post analysis.
S413, demonstration relative timing figure and wrong situation and time of taking place.Level change information and work state information according to a plurality of voltages to be measured that monitor, the sequential of each voltage and all are concerned that relative timing between voltage converges the whole uniform data format that is, and a situation arises and the time to demonstrate the relative timing figure of each voltage and the mistake of voltage on liquid crystal screen, and storage relative timing data are for post analysis.
Therefore in sum, after the present invention adopts condition checkout gear, can be simultaneously the voltage a plurality of to be measured of equipment be detected.And relative timing figure and work state information that the level that can demonstrate each voltage to be measured changes, need not be as oscillograph the restriction of tested person quantity, improved testing efficiency and reduced the workload of testing tool.In addition, display module of the present invention has memory function, makes the tester can check historical data, thereby can more easily carry out Macro or mass analysis to data, makes test job become simpler.Load module of the present invention can be regulated the display format of sequential chart on display screen according to tester's needs, makes the more directly perceived and hommization of inspection work of data.The present invention has also adopted when tested voltage is excessive dividing potential drop and safeguard measure such as has blocked, and makes testing tool can not occur measuring situations such as inaccurate because of voltage is excessive.Therefore condition checkout gear of the present invention is a testing tool that practicality is high.
Though the present invention discloses as above with preferred embodiment; right its is not in order to limiting the present invention, anyly has the knack of this skill person, without departing from the spirit and scope of the present invention; when can doing a little change and retouching, so protection scope of the present invention is when with being as the criterion that claim was defined.
Claims (10)
1. condition checkout gear, in order to a plurality of voltages to be measured are detected, this condition checkout gear comprises:
One probe groups has a plurality of probes, in order to survey those voltage to be measured;
One processor, it has a plurality of I/O interfaces, and a probe links to each other with an I/O interface, this processor changes in order to the level of each voltage to be measured of monitoring this probe groups and detecting, and write down the level transformation period point of each voltage to be measured, and judge whether each voltage to be measured is normal operating conditions;
One display module, link to each other with this processor, in order to the level change information that receives each voltage to be measured that this processor monitors and processor judged result, and demonstrate the time sequence information and the work state information of those voltages to be measured to each voltage power supply state to be measured; And
One load module, link to each other with this processor, be used to import the configuration information of the equipment that those voltages to be measured are provided, so that this processor judges relatively according to the configuration information that level changes and this load module is imported of this voltage to be measured that monitors whether this voltage to be measured is normal operating conditions.
2. condition checkout gear as claimed in claim 1 is characterized in that, this display module also comprises:
One display screen is in order to show the relative timing figure and the work state information of each voltage level change to be measured;
One driver element is connected in this display screen, in order to drive this display screen and to make it show the relative timing figure and the work state information of each voltage level change to be measured; And
One indicative control unit, be connected in this driver element, in order to the level change information that receives this voltage to be measured that this processor monitors and processor judged result, and make this display screen demonstrate the relative timing figure and the work state information of each voltage level change to be measured by this driver element to this voltage power supply state to be measured.
3. condition checkout gear as claimed in claim 2 is characterized in that this display module also comprises a storage unit, in order to store the relative timing information of each voltage to be measured, for post analysis.
4. condition checkout gear as claimed in claim 1, it is characterized in that, this condition checkout gear also comprises a current potential modular converter, this current potential modular converter is connected between this processor and this probe groups, carry out dividing potential drop in order to the voltage to be measured that exceeds the processor measurement range that this probe groups is detected, to satisfy of the requirement of this processor to voltage measurement.
5. condition checkout gear as claimed in claim 1; it is characterized in that; this condition checkout gear also comprises a protection module; this protection module is connected between this processor and this probe groups; be used for when a probe of this probe groups and the voltage between this processor one I/O interface are excessive, cutting off the path between this probe and this I/O interface.
6. condition checkout gear as claimed in claim 1 is characterized in that, this processor is a single-chip microcomputer or an ARM microprocessor.
7. condition detection method, in order to a plurality of voltages to be measured are detected, this condition detection method may further comprise the steps:
Configuration information to the condition checkout gear input equipment;
The level that those voltages to be measured is connected probe and monitor each voltage to be measured changes;
Level variation according to above-mentioned each voltage to be measured that monitors judges relatively with this configuration information whether this voltage to be measured is normal operating conditions; And
If level changes the time sequence information that normally then demonstrates each voltage level change to be measured, if level changes wrong time sequence information and wrong concrete condition and the time of taking place that then demonstrates each voltage level change to be measured.
8. condition detection method as claimed in claim 7 is characterized in that, this time sequence information of storage after demonstrating the time sequence information of each voltage to be measured.
9. condition detection method as claimed in claim 7 is characterized in that, also comprises: the voltage to be measured that exceeds measurement range is carried out judging whether voltage to be measured is normal operating conditions after the voltage division processing again.
10. condition detection method as claimed in claim 7 is characterized in that, also comprises: cut off this path, tested voltage place when a tested voltage is excessive.
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| CN2007101669709A CN101430348B (en) | 2007-11-08 | 2007-11-08 | State detection device and state detection method |
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| CN2007101669709A CN101430348B (en) | 2007-11-08 | 2007-11-08 | State detection device and state detection method |
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| CN101430348A CN101430348A (en) | 2009-05-13 |
| CN101430348B true CN101430348B (en) | 2011-01-05 |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102749496A (en) * | 2012-07-11 | 2012-10-24 | 沈阳维深自动识别技术研究院有限公司 | Multi-functional digital electronic detonator current detection device |
| CN104297664A (en) * | 2013-07-19 | 2015-01-21 | 鸿富锦精密工业(武汉)有限公司 | Mainboard time sequence measuring device and method |
| WO2018014185A1 (en) * | 2016-07-19 | 2018-01-25 | 张升泽 | Voltage storage method and system for electronic chip |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2457608Y (en) * | 2000-12-08 | 2001-10-31 | 英业达股份有限公司 | signal detection stick |
| US6624829B1 (en) * | 1999-10-29 | 2003-09-23 | Agilent Technologies, Inc. | System and method for specifying trigger conditions of a signal measurement system using hierarchical structures on a graphical user interface |
| CN1936614A (en) * | 2005-08-15 | 2007-03-28 | 特克特朗尼克公司 | Drop and drag logic analyzer trigger |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6624829B1 (en) * | 1999-10-29 | 2003-09-23 | Agilent Technologies, Inc. | System and method for specifying trigger conditions of a signal measurement system using hierarchical structures on a graphical user interface |
| CN2457608Y (en) * | 2000-12-08 | 2001-10-31 | 英业达股份有限公司 | signal detection stick |
| CN1936614A (en) * | 2005-08-15 | 2007-03-28 | 特克特朗尼克公司 | Drop and drag logic analyzer trigger |
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