CN101425115B - 高速时钟检测电路 - Google Patents
高速时钟检测电路 Download PDFInfo
- Publication number
- CN101425115B CN101425115B CN2008102108231A CN200810210823A CN101425115B CN 101425115 B CN101425115 B CN 101425115B CN 2008102108231 A CN2008102108231 A CN 2008102108231A CN 200810210823 A CN200810210823 A CN 200810210823A CN 101425115 B CN101425115 B CN 101425115B
- Authority
- CN
- China
- Prior art keywords
- circuit
- signal
- clock
- delay
- speed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Manipulation Of Pulses (AREA)
Abstract
Description
Claims (2)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007283196 | 2007-10-31 | ||
JP2007283196A JP4388571B2 (ja) | 2007-10-31 | 2007-10-31 | 高速クロック検知回路 |
JP2007-283196 | 2007-10-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101425115A CN101425115A (zh) | 2009-05-06 |
CN101425115B true CN101425115B (zh) | 2012-11-28 |
Family
ID=40582034
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2008102108231A Expired - Fee Related CN101425115B (zh) | 2007-10-31 | 2008-08-20 | 高速时钟检测电路 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7714619B2 (zh) |
JP (1) | JP4388571B2 (zh) |
KR (1) | KR101440403B1 (zh) |
CN (1) | CN101425115B (zh) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7622961B2 (en) * | 2005-09-23 | 2009-11-24 | Intel Corporation | Method and apparatus for late timing transition detection |
JP5241450B2 (ja) | 2008-11-27 | 2013-07-17 | ルネサスエレクトロニクス株式会社 | 半導体装置及びその異常検出方法 |
WO2010076667A1 (en) * | 2009-01-05 | 2010-07-08 | Freescale Semiconductor, Inc. | Clock glitch detection circuit |
EP2382711A4 (en) | 2009-01-27 | 2013-10-09 | Agere Systems Inc | CRITICAL PATH CIRCUIT FOR PERFORMANCE MONITORING |
US8519768B2 (en) | 2009-03-31 | 2013-08-27 | Freescale Semiconductor, Inc. | Clock glitch detection |
TWI347752B (en) * | 2009-04-30 | 2011-08-21 | Nat Chip Implementation Ct Nat Applied Res Lab | Edge-missing detector structure |
US8378710B1 (en) * | 2011-09-20 | 2013-02-19 | Nxp B.V. | Secure device anti-tampering circuit |
US8525597B2 (en) | 2011-11-03 | 2013-09-03 | Freescale Semiconductor, Inc | Clock frequency overshoot detection circuit |
CN104378111B (zh) * | 2013-08-12 | 2017-11-14 | 龙芯中科技术有限公司 | 计数器和锁相环 |
CN104777378A (zh) * | 2015-03-09 | 2015-07-15 | 国核自仪系统工程有限公司 | Fpga时钟信号自我检测方法 |
JP2018085587A (ja) * | 2016-11-22 | 2018-05-31 | ルネサスエレクトロニクス株式会社 | 半導体装置及び測定方法 |
WO2018188127A1 (zh) * | 2017-04-14 | 2018-10-18 | 华为技术有限公司 | 存储接口、时序控制方法及存储系统 |
JP2020190828A (ja) * | 2019-05-20 | 2020-11-26 | ローム株式会社 | 周波数異常保護回路 |
US10897225B1 (en) | 2019-09-26 | 2021-01-19 | International Business Machines Corporation | Oscillator failure detection circuit |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1514255A (zh) * | 2002-12-25 | 2004-07-21 | 恩益禧电子股份有限公司 | 频率检测电路和数据处理装置 |
CN1925387A (zh) * | 2005-08-29 | 2007-03-07 | 中兴通讯股份有限公司 | 一种数据时钟恢复电路 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07151839A (ja) | 1993-11-30 | 1995-06-16 | Ando Electric Co Ltd | 半導体試験装置 |
JPH07273642A (ja) * | 1994-03-29 | 1995-10-20 | Nec Corp | 非同期式カウンタのテスト回路 |
JPH07280857A (ja) * | 1994-04-05 | 1995-10-27 | Sony Corp | パルス幅測定回路 |
JPH08201467A (ja) * | 1995-01-31 | 1996-08-09 | Ando Electric Co Ltd | 動作検知回路 |
US6002733A (en) * | 1995-12-23 | 1999-12-14 | Lg Semicon Co., Ltd. | Universal asynchronous receiver and transmitter |
US7042250B1 (en) * | 2004-11-03 | 2006-05-09 | Texas Instruments Incorporated | Synchronization of clock signals in a multi-clock domain |
-
2007
- 2007-10-31 JP JP2007283196A patent/JP4388571B2/ja active Active
-
2008
- 2008-08-20 CN CN2008102108231A patent/CN101425115B/zh not_active Expired - Fee Related
- 2008-09-08 KR KR1020080088094A patent/KR101440403B1/ko not_active Expired - Fee Related
- 2008-09-16 US US12/211,429 patent/US7714619B2/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1514255A (zh) * | 2002-12-25 | 2004-07-21 | 恩益禧电子股份有限公司 | 频率检测电路和数据处理装置 |
CN1925387A (zh) * | 2005-08-29 | 2007-03-07 | 中兴通讯股份有限公司 | 一种数据时钟恢复电路 |
Non-Patent Citations (1)
Title |
---|
JP特开2005-182349A 2005.07.07 |
Also Published As
Publication number | Publication date |
---|---|
KR20090044995A (ko) | 2009-05-07 |
US7714619B2 (en) | 2010-05-11 |
KR101440403B1 (ko) | 2014-09-15 |
US20090108878A1 (en) | 2009-04-30 |
CN101425115A (zh) | 2009-05-06 |
JP4388571B2 (ja) | 2009-12-24 |
JP2009111824A (ja) | 2009-05-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN101425115B (zh) | 高速时钟检测电路 | |
US11355457B2 (en) | Fully digital glitch detection mechanism with process and temperature compensation | |
US7590880B1 (en) | Circuitry and method for detecting and protecting against over-clocking attacks | |
US8466727B2 (en) | Protection against fault injections of an electronic circuit with flip-flops | |
JP6968234B2 (ja) | 相対遅延を伴うフリップフロップを用いてデータサンプリング完全性チェックを行う電子デバイスおよびその方法 | |
US7239187B2 (en) | Reset circuit and digital communication apparatus | |
EP1237282B1 (en) | Circuit for the detection of clock signal period abnormalities | |
US9124258B2 (en) | Integrated circuit device, electronic device and method for detecting timing violations within a clock signal | |
JP5987292B2 (ja) | 半導体集積回路装置及びそれを用いた電子機器 | |
CN112462160B (zh) | 时脉突波检测电路 | |
US11181940B2 (en) | Device for detecting a fault in circuit propagating a clock signal, and corresponding method | |
CN114064332B (zh) | 时钟检测方法、装置及时钟安全系统 | |
US8400188B2 (en) | Methods, systems and arrangements for edge detection | |
TWI782841B (zh) | 用於透過脈波調變信號進行控制的電路系統的事件偵測控制器與方法 | |
US8762764B2 (en) | Method to detect clock tampering | |
US20240340157A1 (en) | Low power and area clock monitoring circuit using ring delay arrangement for clock signal having phase-to-phase variation | |
US20240337690A1 (en) | Low power and area clock monitoring circuit using ring delay arrangement | |
JP7053710B2 (ja) | 電子回路 | |
JP5171379B2 (ja) | 周波数異常検出回路 | |
US20230213578A1 (en) | System on chip including a pvt sensor and corresponding pvt sensing method | |
JP2008042501A (ja) | 電子回路装置 | |
CN118897182A (zh) | 时钟故障检测方法、时钟故障检测电路和集成电路系统 | |
CN112688670A (zh) | 具有抗噪性和毛刺事件跟踪的去抖动电路 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: OKI SEMICONDUCTOR CO., LTD. Free format text: FORMER OWNER: OKI ELECTRIC INDUSTRY CO., LTD. Effective date: 20131111 |
|
C41 | Transfer of patent application or patent right or utility model | ||
C56 | Change in the name or address of the patentee | ||
CP01 | Change in the name or title of a patent holder |
Address after: Kanagawa Patentee after: LAPIS SEMICONDUCTOR Co.,Ltd. Address before: Kanagawa Patentee before: Oki Semiconductor Co.,Ltd. |
|
TR01 | Transfer of patent right |
Effective date of registration: 20131111 Address after: Kanagawa Patentee after: Oki Semiconductor Co.,Ltd. Address before: Tokyo, Japan Patentee before: Oki Electric Industry Co.,Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20121128 Termination date: 20160820 |
|
CF01 | Termination of patent right due to non-payment of annual fee |