CN101416294B - 微细金属凸点的形成方法 - Google Patents
微细金属凸点的形成方法 Download PDFInfo
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- CN101416294B CN101416294B CN2007800117738A CN200780011773A CN101416294B CN 101416294 B CN101416294 B CN 101416294B CN 2007800117738 A CN2007800117738 A CN 2007800117738A CN 200780011773 A CN200780011773 A CN 200780011773A CN 101416294 B CN101416294 B CN 101416294B
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- metal
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- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
提供能够使用气相沉积法,稳定地工业化地在形成于基板的一面侧的金属部件的规定位置形成微细的金属凸点的微细金属凸点的形成方法。该方法的特征在于,在被覆形成有布线图形(12)的基板(10)的一面侧的掩模层(30)形成直形凹部(34),该凹部在底面露出布线图形(12)的规定位置,并且内壁面垂直于基板(10)的一面侧且出口角部有棱角,然后在基板(10)的另一面侧设置面积大于基板(10)的金属板作为散热片,接着将基板(10)和金属板放置在真空气氛中,通过气相沉积法在露出于直形凹部(34)的底面的布线图形(12)的露出面上形成尖细状的金属凸点(14),同时利用作为散热片的金属板将基板冷却在低于形成掩模层(30)的树脂的耐热温度,保持直形凹部(34)的形状,上述气相沉积法是由喷嘴喷射使金属蒸发而得的金属微粒和载气、堆积在规定位置的方法,然后,从基板的一面侧剥离掩模层(30),在布线图形(12)的规定位置形成尖细状的金属凸点(14)。
Description
技术领域
本发明涉及微细金属凸点(bump)的形成方法,更具体涉及在形成于基板的一面侧的金属部件的规定位置形成微细的尖细状金属凸点的微细金属凸点的形成方法。
背景技术
半导体装置等的电子元件为了与其它电子元件连接,有时在由铜形成的布线图形的各端部形成由金等金属构成的尖细状的金属凸点,上述布线图形形成于树脂或陶瓷等制成的基板的一面侧。例如在下述专利文献1中提出了使用气相沉积法形成该尖细状金属凸点的形成方法。
该形成方法如图14所示。图14所示的金属凸点的形成方法中,如图14A所示,对被覆形成于基板200的一面侧的布线图形202,202··的由树脂构成的掩模层204施以图案化,形成在底面露出布线图形202的凹部206后,将基板载置在移动式工作台208上。
接着,如图14A所示,将移动式工作台208在箭头X方向移动,同时将由气相沉积装置生成的金属微粒从口径大于凹部206的开口径的大口径喷嘴210向凹部206,206··喷射。
从喷嘴210喷射的金属微粒堆积在掩模层204上,形成堆积层212,同时堆积在凹部206,206··的各底面上,形成上表面近似平坦的金属凸点214。
然后,停止从大口径喷嘴210喷射金属微粒,如图14B所示,从口径小于凹部206的开口径的小口径喷嘴216向形成于凹部206,206··中的规定的凹部206内的金属凸点214的上表面喷射金属微粒,该凹部206形成于基板200的一面侧,该基板200处于静止状态。来自该小口径喷嘴216的金属微粒呈尖细状地堆积在金属凸点218的近似平坦的上表面,可形成尖细状的金属凸点218。
专利文献1:日本专利特开平2002-184804号公报
发明的揭示
通过图14所示的金属凸点的形成方法,可以在布线图形202的规定位置形成尖细状金属凸点218。
但是,图14所示的金属凸点的形成方法中,想要在形成于掩模层204的各个凹部206,206··形成尖细状金属凸点218时,必须从小口径喷嘴216向各个凹部206,206··喷射金属微粒。
这里,使用一根小口径喷嘴216,在形成于基板200的布线图形202,202··的各个凹部206,206··依次形成尖细状的金属凸点218的做法由于极其费时,因此不适合于工业生产。
另外,如果想要使用多根小口径喷嘴216,216··,在多个凹部206,206··内同时形成尖细状的金属凸点218,则必须要使从多根小口径喷嘴216,216··喷出的金属微粒的喷出量一致,但这是极其困难的。因此,所形成的尖细状的金属凸点218,218··的形状及高度往往不一致。
而且,象目前的半导体装置这样,需要形成极其微细的金属凸点的情况下,要形成口径小于凹部206的开口径的小口径喷嘴216本身就很困难。
因此,本发明的目的是解决使用喷射金属微粒和载气堆积金属微粒的气相沉积法的以往的微细金属凸点的形成方法难以工业化稳定地在形成于基板的一面侧的金属部件的规定位置形成微细的金属凸点的课题,提供能够使用气相沉积法工业化稳定地在形成于基板的一面侧的金属部件的规定位置形成微细的金属凸点的微细金属凸点的形成方法。
本发明者进行了如下的尝试:如图14所示,在基板200的形成有布线图形202的一面侧形成掩模层204,在掩模层204形成底面露出布线图形202的凹部206后,采用使用了一种喷嘴的气相沉积法看能否形成尖细状金属凸点。
首先,如图15A和图15B所示,形成被覆基板10的布线图形12,12··的由树脂构成的掩模层30,对该掩模层30施以激光加工,形成在底面露出布线图形12的规定位置的凹部100〔图15C〕。
如图16所示,图15C所示的凹部100是布线图形12的规定位置露出的底面面积小于开口于掩模层30的表面的开口面积的锥状的凹部。
接着,将由气相沉积装置加热蒸发金属而得的金属微粒与作为载气的氦气一起由喷嘴25向图15C所示的基板10喷射。该喷嘴25的口径大于凹部100的开口径。
从喷嘴25喷出的金属微粒也堆积在从凹部100的底面露出的布线图形12的露出面、凹部100的内壁面及掩模层30的表面。因此,经过规定时间后停止从喷嘴25喷射金属微粒和氦气时,金属微粒堆积于布线图形12的规定位置而形成的突起部102和堆积于掩模层30的表面的堆积层32如图17所示,通过金属微粒堆积于凹部100的内壁面而形成的堆积层103连接。该状态下,将掩模层30从基板10剥离时,突起部102随掩模层30一起被从布线图形12的规定位置剥离。
另一方面,如图18所示,将形成于掩模层30的凹部构成为其内壁面与基板10的一面侧垂直且出口角部104a为圆形的凹部104时,如果通过气相沉积法在凹部104内形成金属凸点14,则如图18所示,堆积于掩模层30的表面的堆积层32的前端从凹部104的开口边缘突出,同时在凹部104内形成尖细状的金属凸点14。但是,所形成的尖细状的金属凸点14与堆积层32的前端相接合。在该状态下,将掩模层30从基板10剥离时,尖细状的金属凸点14随掩模层30一起被从布线图形12的规定位置剥离。
与此相对,如图19所示,将形成于掩模层30的凹部构成为布线图形12的形成位置露出的底面面积大于开口于掩模层30的表面的开口面积的倒锥状凹部106时,如果通过气相沉积法在倒锥状凹部106内形成尖细状的金属凸点14,则如图19所示,所形成的尖细状的金属凸点14没有与堆积层32的前端相接,而是独立形成,该堆积层32堆积于掩模层30的表面并且从倒锥状凹部106的开口边缘突出。因此,通过将掩模层30从基板10剥离,可以在布线图形12的规定位置形成尖细状的金属凸点14。
但是,在被覆基板10的一面侧的掩模层30工业化地形成倒锥状凹部106是困难的。
为此,本发明者进行了如下的研究:能否在可通过对由光致抗蚀剂构成的掩模层30实施曝光及显影而容易地形成的图18所示的凹部104内,利用气相沉积法形成独立于堆积在掩模层30的表面的堆积层32的尖细状金属凸点14。
根据该项研究,发现了在由喷嘴25将金属微粒和氦气喷射向凹部104的底面而形成尖细状的金属凸点14时,通过将凹部104的出口角部104a保持在有棱角的状态(以下,有时称为尖角的形状),可以在凹部104内形成独立于堆积在掩模层30的表面的堆积层32的尖细状金属凸点14,从而完成了本发明。
即,本发明涉及微细金属凸点的形成方法,该方法的特征在于,在被覆形成有金属部件的基板的一面侧的由树脂构成的掩模层形成直形凹部,该凹部在底面露出上述金属部件的规定位置,并且内壁面垂直于上述基板的一面侧且出口角部有棱角,然后在上述基板的另一面侧设置冷却手段,接着将上述基板和冷却手段放置在真空气氛中,通过气相沉积法在露出于上述直形凹部的底面的金属部件的露出面上形成横截面从底面部向前端部逐渐变小的尖细状的金属凸点,同时用上述冷却手段将基板冷却在低于形成掩模的树脂的耐热温度,保持上述直形凹部的形状,上述气相沉积法是由喷嘴喷射使金属蒸发而得的金属微粒和载气、堆积在规定位置的方法,然后,从基板的一面侧剥离上述掩模层,在上述金属部件的规定位置形成尖细状的金属凸点。
本发明中,以能够保持上述直形凹部的出口角部的形状的温度加热处理掩模层,使其密合于上述基板的一面侧,藉此可以将待实施气相沉积法的形成于基板的掩模层的直形凹部的出口角部形成尖角的形状,上述掩模层是通过对在基板的一面侧形成的规定厚度的光致抗蚀剂层实施感光及显影而形成了直形凹部的掩模层。该加热处理的温度优选100℃以下。
还有,通过使用金属制的散热片作为冷却手段,可以容易地进行基板的冷却。
这里,尖细状的金属凸点可优选形成为圆锥状或多角锥状的金属凸点。
此外,通过在同一掩模层形成内径不同的多个直形凹部,即使是同一厚度的掩模层,也可以同时形成高度不同的尖细状的金属凸点。
另外,本发明所采用的气相沉积法较好是使用金作为蒸发的金属,并且使用氦气作为载气。
采用本发明的微细金属凸点的形成方法,在被覆形成有金属部件的基板的一面侧的由树脂构成的掩模层形成在底面露出金属部件的规定位置的直形凹部,在保持该直形凹部的形状的同时,由一种喷嘴向直形凹部喷射微细金属粒子,藉此金属微粒在掩模层的表面形成堆积层,同时也堆积在露出于直形凹部的底面的金属部件的露出面上。
如果再继续从喷嘴喷射金属微粒,则掩模层的表面的堆积层的厚度增加,并且堆积层的前端从直形凹部的开口边缘逐渐突出。因此,直形凹部的开口径逐渐缩小,堆积于在直形凹部内露出的金属部件的露出面上的金属微粒量也从直形凹部的内周缘向中心逐渐减少,形成尖细状的金属凸点。
最终,直形凹部的开口部被形成于掩模层上的堆积层完全闭塞,即使继续由喷嘴喷射金属微粒,金属微粒也不会再堆积在直形凹部内,直形凹部内尖细状金属凸点以独立的状态被保存。
而且,本发明中,用冷却手段冷却基板的同时,通过气相沉积法形成尖细状的金属凸点,因此可以保持出口角部有棱角的直形凹部的形状,形成尖细状的金属凸点。因而,可以防止象出口角部为圆形的凹部那样,从凹部的开口边缘突出的堆积部的前端与形成于凹部内的尖细状的金属凸点相接合的现象。
其结果是,可以不与堆积于掩模层的表面的堆积层接触而形成尖细状的金属凸点,可以从基板的一面侧只剥离掩模层及堆积层。
附图的简单说明
图1A和图1B是说明本发明所用的基板及金属板的主视图和剖视图。
图2A~图2F是说明使用图1所示的基板及金属板的本发明的微细金属凸点的形成方法的一例的示意图。
图3是说明形成图2所示的微细金属凸点时所用的气相沉积装置的简图。
图4是用于说明堆积层的前端从形成于掩模层的直形凹部的开口边缘突出的现象的示意图。
图5A和图5B是表示在形成于基板的一面侧的布线图形的规定位置形成了圆锥状的金属凸点的状态的立体图和局部放大立体图。
图6A和图6B是形成于掩模层的直形凹部的形状的其它示例的电子显微镜照片。
图7A和图7B是使用形成有图4所示形状的直形凹部的掩模层形成的金属凸点的电子显微镜照片。
图8A和图8B是形成于掩模层的直形凹部的出口角部为圆形的凹部的形状的电子显微镜照片。
图9A和图9B是使用形成有图6所示形状的凹部的掩模层形成的金属凸点的电子显微镜照片。
图10A和图10B是将后烘(post-baked)的温度设为80℃时,加热处理后的形成于掩模层的凹部形状的电子显微镜照片。
图11A和图11B是将后烘的温度设为90℃时,加热处理后的形成于掩模层的凹部形状的电子显微镜照片。
图12A和图12B是将后烘的温度设为100℃时,加热处理后的形成于掩模层的凹部形状的电子显微镜照片。
图13A~图13D是说明在同一掩模层形成内径不同的多个直形凹部,可形成高度不同的尖细状金属凸点的示意图。
图14A和图14B是说明使用气相沉积法在基板形成尖细状的金属凸点的现有方法的示意图。
图15A~图15C是说明在形成于基板的一面侧的掩模层形成凹部的工序的工序图。
图16是说明在形成于基板的一面侧的、具备锥状的凹部的掩模层的表面,由气相沉积装置的喷嘴喷射金属微粒的状态的局部剖视图。
图17是说明通过图16所示的气相沉积法,在掩模层的表面堆积了金属微粒的状态的局部剖视图。
图18是说明在形成于基板的一面侧的、具备出口角部为圆形的凹部的掩模层的表面通过气相沉积法堆积了金属微粒时的堆积状态的局部剖视图。
图19是说明在形成于基板的一面侧的、具备倒锥状的凹部的掩模层的表面通过气相沉积法堆积了金属微粒时的堆积状态的局部剖视图。
实施发明的最佳方式
本发明的微细金属凸点的形成方法的一例示于图1~图2。图1A所示的基板10如作为其横向剖视图的图1B所示,在基板10的一面侧形成有作为金属部件的布线图形12,12··,布线图形12,12··被由树脂构成的掩模层30被覆。在该掩模层30,以在底面露出布线图形12,12··的各个规定位置的条件形成凹部34。如图1A所示,该凹部34的开口形状为圆形。此外,凹部34的纵横比(凹部34的深度/凹部34的口径)为1。该凹部34的深度等于掩模层30的厚度。
如图1A和图1B所示,该基板10的另一面侧载置在比基板10面积大且厚的由具备优良的热传导率的铝或铜制的金属板35上。该金属板35如后所述,用作作为冷却手段的散热片来冷却基板10。
该凹部34如作为其放大剖视图的图2A所示,是在底面露出布线图形12的规定位置,并且内壁面垂直于基板10的一面侧且出口角部有棱角的直形凹部(以下,有时简称为直形凹部34)。
图2A所示的在掩模层30形成有直形凹部34,34··的基板10以载置在金属板35上的状态置于气相沉积装置的真空气氛中,在露出于直形凹部34,34··的各底面的布线图形的露出面上,通过气相沉积法形成微细的金属凸点,该气相沉积法是由喷嘴25喷射使金属蒸发而得的金属微粒和载气、堆积于规定位置的方法。
作为该气相沉积装置可以使用图3所示的气相沉积装置。在图3所示的气相沉积装置中,将载置在呈真空状态的室18内的坩锅20内的作为金属22的金加热至1500℃,加热蒸发形成金属微粒,所述真空状态是通过设有过滤器16的吸引管17抽吸而形成的。该金属微粒与被作为载气供给到室18内的氦气一起经转移管24吸引,被输送到真空状态的室26内。
如图2B所示,在室26内插入了在掩模层30形成有直形凹部34,34··的基板10,在该凹部的底面露出布线图形12。由喷嘴25将氦气和金属微粒喷向掩模层30的表面,该喷嘴朝向上述直形凹部34,34··、形成于转移管24的前端。该喷嘴25被加热至300℃,喷嘴25的开口径大于直形凹部34。
从喷嘴25喷入室26内的金属微粒如图2C所示,堆积在从直形凹部34的底面露出的布线图形12的露出面上,形成金属凸点14,同时也堆积在掩模层30的表面形成堆积层32,氦气被吸引管27抽吸排出。
从该喷嘴25喷出的金属微粒被加热至300℃以上,因此掩模层30也被蓄积在表面的金属微粒加热。如果来自该金属微粒的热量被蓄积在掩模层30内,则掩模层30的温度会升温至形成掩模层30的树脂的耐热温度以上,直形凹部34的出口角部塌落,象图18所示的凹部104的出口角部那样变圆。在该近似于图18所示的凹部104的形状的凹部内,即使继续堆积金属微粒,也如图18所示,形成于凹部内的金属凸点14与从凹部的开口边缘突出的堆积于掩模层30的表面的堆积层32的前端相接。在该状态下,从基板10剥离掩模层30时,金属凸点14和掩模层30一起被从布线图形12的规定位置剥离。
针对这一点,如图1A和图1B所示,通过将基板10的另一面侧载置在用作作为冷却手段的散热片的比基板10面积大且厚的金属板35上,从蓄积在表面的金属微粒传导至掩模层30的热量被金属板35迅速放热。由此,可以使掩模层30的温度低于形成掩模层30的树脂的耐热温度,可以在保持直形凹部34的有棱角的角部形状的同时,从喷嘴25喷射金属微粒和载气。
这样,如果在保持直形凹部34的有棱角的角部形状的同时,继续从喷嘴25喷射金属微粒和载气,则如图2C及图2D所示,形成堆积在从直形凹部34的底面露出的布线图形12的露出面的金属凸点14a的同时,堆积在掩模层30上的堆积层32的前端从凹部34的开口边缘突出,直形凹部34的开口部也变窄。因此,堆积在从直形凹部34内露出的布线图形12的露出面上的金属微粒量也从直形凹部34的内周缘向中心逐渐减小,形成圆锥台状的金属凸点14a。
这里,如果在保持直形凹部34的有棱角的角部形状的同时,继续从喷嘴25喷射金属微粒和载气,则堆积在掩模层30上的堆积层32的前端从直形凹部34的开口边缘突出的现象如下推断。
即认为:如图4所示,与金属微粒一起被喷入直形凹部34内的氦气在直形凹部34内反转至与金属微粒的喷射方向相反的方向流出,因此直形凹部34的内压高于掩模层30的表面侧。因而,直形凹部34的开口边缘附近的金属微粒无法进入直形凹部34内,而是附着于直形凹部34的开口边缘附近,堆积层32的前端从直形凹部34的开口边缘突出。
如果再继续从喷嘴25喷射金属微粒和载气,则如图2E所示,直形凹部34的开口部被堆积在掩模层30上的堆积层32的前端部完全闭塞。这时,在从直形凹部34的底面露出的布线图形12的露出面上形成不与堆积层32接触的独立的圆锥状的金属凸点14。
因此,停止从喷嘴25喷射金属粒子和氦气,如图2F所示,将基板10从气相沉积装置取出,可以在保持圆锥状的金属凸点14的形状的状态下,从基板10的一面侧机械剥离掩模层30及堆积层32。剥离了掩模层30的布线图形12上除了形成有金属凸点14的位置外无金属微粒附着。
其结果如图5A所示,沿基板10的外周缘形成金属凸点14,14··。该金属凸点14,14··的局部放大立体图示于图5B。金属凸点14,14··在布线图形12,12··的各规定位置形成为圆锥状的金属凸点14。
在形成于基板10的多个布线图形12,12··的每个图形形成金属凸点14时,如图2B所示,通过基板10或喷嘴25向左右方向(箭头A方向)移动,可以在各配线图形12形成形状和高度一致的圆锥状的金属凸点14。
因此,通过基板10或喷嘴25沿图5A所示的基板10的外周缘移动,如图5A所示,可以沿基板10的外周缘同时形成金属凸点14,14··。这时,从喷嘴25喷出的被加热至300℃以上的金属微粒不附着于基板10的中心附近而是附着于基板10的周缘部。因而,可以在不会对形成于基板10的中心附近的半导体元件等造成热损伤的前提下形成金属凸点14,14··。
图1~图5所示的形成于掩模层30的直形凹部34的开口形状为圆形形状,但是通过如图6AB所示将形成于掩模层30的直形凹部34的开口形状构成为四角形形状,藉此可如图7A和图7B所示,形成四方锥状的金属凸点14。图6B是图6A的放大图,图7B是图7A的放大图。
掩模层30必须密合于基板10的一面侧而形成,通常对在形成于基板10的一面侧的规定厚度的光致抗蚀剂层施以感光及显影形成了直形凹部34的掩模层30进行加热处理,使其密合于基板10的一面侧。
这时,如果为了充分地密合于基板10的一面侧而提高加热处理温度,则如图8A和图8B(图8B是图8A的放大图)所示,直形凹部34变成其出口角部变圆的近似于图18所示的凹部104的形状的凹部。由此,如图9A和图9B所示,在形成有图8A和图8B所示的形状的凹部的掩模层30中形成形状不一致的金属凸点。
因此,对在形成于基板10的一面侧的规定厚度的光致抗蚀剂层施以感光及显影形成了直形凹部34的掩模层30进行加热处理时,较好是以能够保持直形凹部34的出口角部的形状的温度进行加热处理。该加热处理温度特别优选100℃以下。
该情况示于图10~图12。各图的B为A的立体图。形成图10~图12所示的掩模层30时,首先使用旋涂法将光致抗蚀剂(科莱恩公司(ClariantCorporation)制的AZ4903)涂布于形成基板10的晶片的一面侧而形成光致抗蚀剂层。这时的旋涂的转数为3500rpm,旋涂时间为30秒。
为了使光致抗蚀剂层中的溶剂蒸发,提高与晶片的密合性,以100℃对光致抗蚀剂层施以5分钟的前烘(pre-baked)。
接着,对光致抗蚀剂层进行照射紫外线(g线;波长437nm)的曝光和显影,形成图6所示的尖角的直形凹部34。该曝光量设为800mJ/cm2。显影是在室温下将曝光完成后的晶片浸渍于显影液(AZ4903和纯水为1:4的稀释液)3分钟后,用纯水冲洗。
其后,为了从形成有直形凹部34的光致抗蚀剂层除去溶剂和水分,提高与晶片的密合性,在80~120℃的加热处理温度下实施5分钟的后烘。
该后烘后的形成于掩模层30的凹部的形状示于图10~图12。各图的后烘的温度是,图10为80℃、图11为90℃、图12为100℃。这样,后烘的温度为100℃以下时,可以保持直形凹部34的出口角部的形状。
另一方面,后烘的温度超过100℃时,直形凹部34的出口角部如图8A和图8B所示变成圆形。
在以上的说明中,插入图3所示的气相沉积装置的室18的坩锅20内的金属22使用金,但也可以使用其它金属,例如钯、铂、银、镍或铜。
这里,如果由2根以上的喷嘴25各自依次喷出不同金属的微细金属粒子,则可以形成由多种金属构成的金属凸点14,例如在由镍构成的基部上形成了由金构成的上部的金属凸点14,藉此可以调整金属凸点14的硬度等,且可以实现金属凸点14的制造成本的降低。
另外,以载置在金属板35上的状态将插入气相沉积装置的室26内的基板10放置在X-Y工作台上,通过控制使得金属微粒从喷嘴25喷向规定的直形凹部34,藉此可以提高形成于直形凹部34内的金属凸点14的形状的均一性,还可以防止掩模层30的温度上升。
这样,通过使用X-Y工作台在基板10形成多个直形凹部34,34··时,可以控制金属粒子从喷嘴25只喷向需要形成金属凸点14的直形凹部34,从而可以缩短金属微粒的堆积时间和提高所形成的金属凸点14的形状等的均一性。
此外,可以用冷却水等冷媒或珀尔帖(Peltier)元件等冷却手段来冷却载置着基板10的作为散热片的金属板35。这样,通过冷却金属板35,可以使金属微粒的堆积温度稳定化,也可以防止掩模层30的升温。
还有,掩模层30的剥离通过机械剥离进行,但也可以通过化学蚀刻除去掩模层30。当然,必须预先确认该化学蚀刻不会对形成于凹部34内的金属凸点14造成损伤。
形成于掩模层30的直形凹部34的内径和所能够形成的尖细状的金属凸点14的高度相关,例如,内径5μm的直形凹部34可以形成高5μm的尖细状的金属凸点14,内径3μm的直形凹部34可以形成高度3μm的尖细状的金属凸点14。
因此,如图13所示,通过在同一掩模层内形成内径不同的多个直形凹部,可以形成高度不同的尖细状的金属凸点。
首先,如图13A所示,在形成于基板10的一面侧的同一掩模层30形成内径不同的多个直形凹部34a,34b,34c(内径:34a>34b>34c)。直形凹部34a,34b,34c的各纵横比为1(直形凹部34a)、2(直形凹部34b)、3(直形凹部34c)。
从喷嘴25向这些直形凹部34a,34b,34c喷射金属微粒。这时,将基板10向左右方向移动。
如果从喷嘴25向直形凹部34a,34b,34c喷射金属微粒,则如图13B所示,金属微粒堆积在从直形凹部34a,34b,34c的各底面露出的布线图形12(图13中省略)的露出面上,形成圆锥台状的金属凸点14a。这时,金属微粒也堆积在掩模层30的表面形成堆积层32,堆积层32的前端从直形凹部34a,34b,34c的各开口边缘突出。
如果再继续从喷嘴25向直形凹部34a,34b,34c喷射金属微粒,则如图13C所示,内径最小的直形凹部34c的开口部被闭塞,中间内径的直形凹部34b的开口部也明显变窄。
其后,即使仍继续从喷嘴25向直形凹部34a,34b,34c喷射金属微粒,如图13D所示,开口部被堆积层32闭塞的内径最小的直形凹部34c内的圆锥状的金属凸点14也保持其形状。另一方面,开口部明显变窄的直形凹部34b的开口部被堆积层32闭塞后,直形凹部34b内的圆锥状的金属凸点保持其形状。
此外,内径最大的直形凹部34a内的圆锥台状的金属凸点14a的高度一直升高至其开口部被堆积层32闭塞为止。因此,直形凹部34a的开口部被堆积层32封闭时,形成于直形凹部34a,34b,34c的各个圆锥状的金属凸点14,14,14可以形成为近似等于直形凹部34a,34b,34c的内径的高度。
Claims (8)
1.一种形成微细金属凸点的方法,其特征在于,在被覆形成有金属部件的基板的一面侧的由树脂构成的掩模层形成直形凹部,该凹部在底面露出所述金属部件的规定位置,并且内壁面垂直于所述基板的一面侧且出口角部有棱角,然后在所述基板的另一面侧设置冷却手段,
接着将所述基板和冷却手段放置在真空气氛中,通过气相沉积法在露出于所述直形凹部的底面的金属部件的露出面上形成横截面从底面部向前端部逐渐变小的尖细状的金属凸点,同时用所述冷却手段将基板冷却在低于形成掩模的树脂的耐热温度,保持所述直形凹部的形状,所述气相沉积法是由喷嘴喷射使金属蒸发而得的金属微粒和载气、堆积在规定位置的方法,
喷射金属微粒和载气的喷嘴的开口径大于直形凹部;
继续从喷嘴喷射金属微粒和载气,被堆积在掩模层上的堆积层的前端从直形凹部的开口边缘突出,直形凹部的开口部变窄,堆积在直形凹部底面的金属微粒量也从直形凹部的内周缘向中心逐渐减少,形成尖细状的金属凸点,在直形凹部内形成规定高度的尖细状的金属凸点后,通过不接触尖细状的金属凸点,而在掩模层上堆积的堆积层闭塞直形凹部的开口部,即使继续从喷嘴喷射金属微粒,在直形凹部内也不堆积金属微粒;
然后,从基板的一面侧剥离所述掩模层,在所述金属部件的规定位置形成尖细状的金属凸点;上述冷却手段是散热片。
2.如权利要求1所述的方法,其特征在于,
以沿着基板面移动喷嘴的方式使基板或者喷嘴移动,同时从喷嘴喷射金属微粒和载气到形成在掩模层上的多个直形凹部内,在基板上形成多个尖细状的金属凸点,这样可在基板上稳定地同时形成多个规定高度的尖细状的金属凸点。
3.如权利要求1所述的方法,其特征在于,
与金属微粒一起被喷入直形凹部内的载气,在直形凹部内被反转至与金属微粒的喷射方向相反的方向,从开口边缘附近流出,金属微粒附着在直形凹部的开口边缘附近而形成的堆积层的前端从直形凹部的开口边缘向中心部突出,在直形凹部内堆积金属微粒而形成尖细状的金属凸点。
4.如权利要求1所述的方法,其特征在于,以能够保持直形凹部的出口角部的形状的温度,加热处理对形成于基板的一面侧的规定厚度的光致抗蚀剂层实施感光及显影而形成了直形凹部的掩模层,使其密合于所述基板的一面侧。
5.如权利要求4所述的方法,其特征在于,将加热处理的温度设为100℃以下。
6.如权利要求1所述的方法,其特征在于,作为尖细状的金属凸点形成圆锥状或多角锥状的金属凸点。
7.如权利要求1所述的方法,其特征在于,在同一掩模层形成内径不同的多个直形凹部,同时形成高度不同的尖细状的金属凸点。
8.如权利要求1所述的方法,其特征在于,在气相沉积法中,蒸发的金属使用金,载气使用氦气。
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JP3147424B2 (ja) * | 1991-08-15 | 2001-03-19 | オムロン株式会社 | 電子回路部品 |
US5529634A (en) * | 1992-12-28 | 1996-06-25 | Kabushiki Kaisha Toshiba | Apparatus and method of manufacturing semiconductor device |
JP3283977B2 (ja) | 1993-10-18 | 2002-05-20 | 三菱電機株式会社 | 半導体装置およびその製造方法 |
JPH11260848A (ja) * | 1998-03-10 | 1999-09-24 | Nippon Hoso Kyokai <Nhk> | 電極形成方法 |
JPH11312711A (ja) * | 1998-04-30 | 1999-11-09 | Murata Mfg Co Ltd | 電子部品の接続方法 |
JP3559013B2 (ja) | 2001-10-16 | 2004-08-25 | 株式会社ルネサステクノロジ | 半導体装置 |
KR100685924B1 (ko) * | 2002-07-29 | 2007-02-23 | 엘지.필립스 엘시디 주식회사 | 액정표시장치의 제조방법 |
US7122872B2 (en) * | 2003-05-20 | 2006-10-17 | Lucent Technologies Inc. | Control of stress in metal films by controlling the atmosphere during film deposition |
JP3947144B2 (ja) * | 2003-09-11 | 2007-07-18 | 田中貴金属工業株式会社 | 半導体素子又は配線基板へのバンプ形成方法 |
-
2007
- 2007-03-30 JP JP2008508641A patent/JP4826924B2/ja active Active
- 2007-03-30 WO PCT/JP2007/057031 patent/WO2007114314A1/ja active Application Filing
- 2007-03-30 US US12/225,741 patent/US7767574B2/en active Active
- 2007-03-30 CN CN2007800117738A patent/CN101416294B/zh not_active Expired - Fee Related
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CN101416294A (zh) | 2009-04-22 |
JP4826924B2 (ja) | 2011-11-30 |
JPWO2007114314A1 (ja) | 2009-08-20 |
US20090104766A1 (en) | 2009-04-23 |
WO2007114314A1 (ja) | 2007-10-11 |
US7767574B2 (en) | 2010-08-03 |
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