CN101303384B - A test device and test method for fast response to the response speed of electronic devices - Google Patents

Abstract

The invention discloses a device for testing the response speed of quick response electronic devices and a testing method thereof. The device for testing the response speed of the invention comprises a power control circuit, at least two response modules of the electronic devices to be tested and a timer; the power control circuit is electrically connected with the power source end of the response modules; all modules are connected in series; the startup trigger signal of the timer synchronizes the trigger signal of the first response module; the shutoff trigger signal of the timer synchronizes the output signal of the last response module. The testing device and the testing method of the invention aim at overcoming the defects of the high cost and low measurement precision of the testing the response speed of the quick response electronic devices, measure the total response time by connecting a plurality of devices to be tested in series, obtain the response time of each group of devices by calculation, require no application of the display instruments of high cost and can obtain a high-precision testing result of electronic devices of the same type at the same time.

Description

A test device and test method for fast response to the response speed of electronic devices

technical field

The invention relates to a test device and a test method thereof, in particular to a device for testing the response speed of fast-response electronic devices and a test method thereof.

Background technique

In recent years, with the rapid development of electronic devices such as semiconductors, the performance and response speed of various electronic devices have been greatly improved. Correspondingly, the device performance testing equipment is also developing rapidly. At present, the response speed of various fast-response electronic devices, such as high-performance photocoupler devices, has reached the nanometer level, and the test accuracy of the test equipment is far from meeting the requirements. The test work is only the result of rough tests, or Testing with expensive equipment costs a lot of money, and the cost is too high.

In addition, organic electroluminescent displays (OLEDs), which have emerged in recent years, have a series of advantages such as self-luminescence, low-voltage DC drive, full curing, wide viewing angles, and rich colors. Compared with liquid crystal displays, OLEDs do not require backlights. Source, large viewing angle, low power, especially its response speed can reach 1000 times that of liquid crystal display, but the manufacturing cost is lower than that of liquid crystal display with the same resolution. Therefore, organic electroluminescent display has broad application prospects.

At present, the response speed of the OLED screen is basically tested by using a photoelectric sensing element. The photoelectric sensing element is placed on the light-emitting surface of the OLED screen. The photoelectric sensing element is connected to an amplifier and a shaping circuit, followed by an oscilloscope. By observing the time difference of the rising edge of the waveform on the oscilloscope, the response time of the OLED screen can be estimated.

The old-fashioned test has the following flaws;

1. Because the response time of the OLED screen is very short, a high-speed oscilloscope is required to observe the waveform, and the instrument cost is high;

2. Such a fast waveform is fleeting on the oscilloscope, which cannot be carefully observed and studied, which affects the measurement accuracy;

3. The response speed of the photoelectric sensing element and the time delay of the amplification and shaping circuit cannot be determined, and these factors will overwhelm or greatly affect the response speed of the OLED screen.

Contents of the invention

The object of the present invention is to provide a response speed testing device capable of accurately measuring the response speed of fast-response electronic devices and having low cost.

Another object of the present invention is to provide a method for testing the response speed of an electronic device using the above testing device.

The object of the present invention is achieved by the following technical solutions: the response speed testing device of the present invention includes a power control circuit, at least two groups of response modules of electronic devices to be tested, and a timer; the power control circuit and the response module power supply The terminals are electrically connected, the response modules are connected in series, the trigger on signal of the timer is synchronized with the trigger signal of the first group of response modules, and the trigger off signal of the timer is synchronized with the output signal of the last group of response modules.

The trigger on signal of the timer and the trigger signal of the first group of response modules may be the same trigger signal.

The trigger off signal of the timer and the output signal of the last group of response modules may be the same signal.

The response module can be a photoelectric response module, an electrical response module or an acoustic-electric response module.

The response module may also include amplification and shaping and switch trigger circuits.

The electronic device under test is electrically connected to the input end of the amplification shaping and switch trigger circuit, and the output end of the amplification shaping and switching trigger circuit is electrically connected to the trigger end of the next group of electronic device under test or the trigger shutdown end of the timer.

The response module also includes a photoelectric sensing element or an acoustic and electric sensing element.

Light insulation or sound insulation can be used between the response modules.

The photoelectric sensing element or the acoustic and electric sensing element is electrically connected to the input end of the amplification shaping and switching trigger circuit, and the output end of the amplification shaping and switching triggering device is electrically connected to the trigger end of the next group of electronic devices under test or the trigger shutdown end of the timer.

Another object of the present invention is achieved through the following technical solutions: the method for testing the response speed of fast-response electronic devices of the present invention includes the following steps;

(1) adopt the test device to measure the total response time T of N (N≥2) groups of response modules;

(2) Use formula ① or formula ②, formula ③ to calculate the response time T _i of each electronic device under test;

T＝(T _i +T _K )N ①

T＝(T _i +T _K +T _G )×N ②

T＝T _i ×N ③

In the formula, T _K is the response time of the amplification and shaping and switch trigger circuit, and T _G is the response time of the photoelectric sensing element or the acoustic and electric sensing element, where T _G is known.

The step (2) also includes testing the response time T _K of the amplification shaping and switching trigger circuit.

The test amplification shaping and switch trigger circuit response time T _K is to connect the trigger opening and trigger closing of the timer with the input and output terminals of the amplification shaping and switch trigger circuit respectively, and test the amplification shaping and switch trigger circuit response time T _K.

The present invention aims at the existing defects of high response speed test cost and low measurement accuracy of fast-response electronic devices, adopts multiple groups of tested devices to measure the total response time in series, and obtains the response time of each group of devices through calculation, without expensive use The display instrument can obtain high-precision test results of the response speed of the same type of electronic device at the same time.

Description of drawings

Fig. 1 is the structural representation of the electronic device response speed testing device of the present invention;

Fig. 2 is a schematic structural diagram of an organic electroluminescent device response speed testing device in Example 1 of the present invention;

Fig. 3 is a structural schematic diagram of a triode response speed testing device in Embodiment 2 of the present invention;

FIG. 4 shows the response time T _K of the test amplification shaping and switch trigger circuit in Embodiment 1 of the present invention.

Detailed ways

The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

Refer to Figure 1. The test device of the fast response electronic device response speed of the present invention comprises a power control circuit 1, at least two response modules 2 of electronic devices 5 to be tested, and a timer 3; the power control circuit 1 is electrically connected to the power supply terminals of the response module 2, The response modules 2 are connected in series, the trigger on signal of the timer 3 is synchronized with the trigger signal of the first group of response modules 2 , and the trigger off signal of the timer 3 is synchronized with the output signal of the last group of response modules 2 . When the output signal of the electronic device 5 under test is weak or irregular, the output signal needs to be amplified and reshaped, as shown in Figure 1, each group of response modules 2 is added with an amplified and reshaped and switch trigger circuit 4 to The output signal is output to the next group of response module 2. Since the response time of the amplification shaping and switch trigger circuit 4 can be measured, it has no influence on the response speed test of the electronic device under test 5 , and only needs to subtract this part of the response time from the total response time.

The trigger on signal of the timer 3 and the trigger signal of the first group of response modules 2 may be the same trigger signal, therefore, the trigger on signal of the electronic device 5 under test and the timer 3 are provided by the same trigger circuit. The trigger off signal of the timer 3 and the output signal of the last group of response modules 2 can be the same signal, that is, the output of the last group of response module 2 is directly connected as the trigger off signal of the timer 3 .

The response module 2 can be a photoelectric response module, an electrical response module or an acoustic-electric response module. For example, the response speed test can be performed on organic electroluminescent display devices (OLED) and triodes with fast response speeds. If the response speed of the photoelectric device or the acoustoelectric device is tested, the response module 2 also includes a photoelectric sensing element or an acoustoelectric sensing element, such as a photoelectric sensor 6 or an acoustoelectric sensor. At the same time, each response module 2 needs to adopt Light isolation or sound isolation to prevent interference between groups, resulting in increased test errors.

For the situation that the output signal of the electronic device 5 under test is weak or irregular, the electronic device 5 under test is electrically connected to the input end of the amplification shaping and switching trigger circuit 4, and the output end of the amplification shaping and switching trigger circuit 4 is connected to the next group of tested The trigger terminal of the electronic device 5 or the trigger-off terminal of the timer 3 are electrically connected. For the electronic device 5 under test is a photoelectric device or an acoustic electric device, and at the same time, the output signal is weak or irregular, its photoelectric sensing element or acoustic electric sensing element is electrically connected to the input end of the amplification and shaping and switch trigger circuit 4, and the amplification and shaping And the output end of the switch trigger circuit 4 is electrically connected with the trigger end of the next group of electronic devices under test 5 or the trigger off end of the timer 3 .

Example 1

Refer to Figure 2. The tested electronic device of this embodiment is an organic electroluminescence display device (OLED) 5-1, which is a photoelectric device, and the test needs to convert its response speed into an electrical signal, and increase the photoelectric sensor 6. At the same time, due to the output of the photoelectric sensor 6 The signal is weak, and its output signal terminal needs to be connected with the amplification shaping and switching trigger circuit 4, and the output terminal of this circuit triggers the response of the next group of OLED5-1. In this embodiment, 20 groups of OLED5-1 response modules are connected in series to test the overall response time. Use the testing device shown in Figure 2. Proceed as follows:

(1) Measure the total response time T of 20 groups of response modules by using the test device. First, the power supply control circuit—trigger circuit 1 provides the same trigger signal to the first group of OLED response modules 2 and timer 3 at the same time, and the timer 3 starts counting, and the first group of OLED response modules 2 OLED The screen body 5-1 emits light, and the photoelectric sensor 3 converts the sensed light signal into an electrical signal, and transmits it to the amplification and shaping and switching trigger circuit 1. After the signal is amplified and shaped, the circuit outputs a trigger signal to the next group The OLED screen body 5-1 of the OLED response module 2, ..., so, until the last group of response module 2's amplification and shaping and switch trigger circuit 4 sends the trigger signal to the timer 3, the timer 3 is closed, and records the time T.

(2) Test the response time T _K of the amplification shaping and switching trigger circuit 4 . As shown in Figure 4, this step only connects the trigger circuit 1, timer 3, and 20 groups of amplification and shaping and switch trigger circuits 4 into the circuit in series, and operates as in step (1) until the timer 3 is turned off, and records the time T _K .

(3) Utilize formula (2) to calculate the response time T _i of each tested OLED screen body 5-1;

T＝(T _i +T _K +T _G )×N ②

Among them, this test uses photoelectric sensor 6 model HS0038A2, according to the factory data provided by the manufacturer, its response speed is lns, that is, T _G in formula ② is 1; N=20. By calculating the above data, it is obtained that the response time T _i of each tested OLED panel 5-1 is T/20-T _K -1 (the values of T and T _K have been measured according to the above test steps).

Example 2

Refer to Figure 3. The tested electronic device of this embodiment is a triode 5-2, and the test does not need a sensor. In addition, because the triode emitter output signal is stronger and more stable, it is not necessary to add an amplification and shaping and switch trigger circuit 4 to connect, and the triode 5-2 The emitter e is directly connected to the base b of the next group of triodes 5-2 to be tested, and the signal of the emitter e of the last group of triodes 5-2 triggers the timer 3 to be turned off. In this embodiment, 20 sets of triode response modules 2 are connected in series to test the overall response time. Use the testing device shown in Figure 3.

Proceed as follows:

(1) Measure the total response time T of 20 groups of triode response modules 2 by using the test device. First, the triode 5-2 is set to a saturated state, and the same trigger signal is provided by the trigger circuit to the base b of the first group of triode response module 2 and the trigger of the timer 3 at the same time, and the timer 3 starts counting, and the first group The current in the triode 5-2 is from the base b to the emitter e, and then flows from the emitter e of the group of triodes 5-2 to the base b of the next group of triodes, ..., so, until the last group of triodes 5-2 emits The pole e transmits the trigger signal to the timer 3, the timer 3 is closed, and the time T is recorded.

(2) Utilize formula 3. to calculate the response time T _i of each triode 5-2 to be tested;

T＝T _i ×N ③

By calculating the above data, it is obtained that the response time T _i of each triode 5-2 under test is T/N.

Although the present invention has been disclosed above with preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore , the scope of protection of the present invention should be defined by the patent scope of the application.

Claims (11)

1. A test device for fast response to the response speed of an electronic device, characterized in that it includes a power control circuit, at least two groups of response modules of the electronic device under test, a timer, and the power control circuit and the response module power supply end circuit connection, each response module is connected in series, the trigger on signal of the timer is synchronized with the trigger signal of the first group of response modules, and the trigger off signal of the timer is synchronized with the output signal of the last group of response modules. 2. the test device of fast response electronic device response speed according to claim 1, is characterized in that, the trigger open signal of described timer and the trigger signal of the first group of response modules are identical trigger signal, and described timer The trigger off signal of the trigger is the same as the output signal of the last group of response modules. 3. The device for testing the response speed of fast-response electronic devices according to claim 1 or 2, wherein the response module is a photoelectric response module or an electrical response module or an acoustic-electric response module. 4. The device for testing the response speed of fast-response electronic devices according to claim 1 or 2, characterized in that, the response module further includes amplification and shaping and switch trigger circuits. 5. the test device of the fast response electronic device response speed according to claim 4, it is characterized in that, described electronic device under test is electrically connected with amplification shaping and switch trigger circuit input end, amplification shaping and switch trigger circuit output end is connected with The trigger terminal of the next group of electronic devices under test or the timer trigger shutdown terminal are electrically connected. 6 . The testing device for responding quickly to the response speed of electronic devices according to claim 3 , wherein the response module further includes a photoelectric sensing element or an acoustic and electric sensing element. 7 . 7. The device for testing the response speed of fast-response electronic devices according to claim 6, characterized in that light isolation or acoustic isolation is adopted between the response modules. 8. according to the test device of claim 6 or 7 described quick-response electronic device response speeds, it is characterized in that, described photoelectric induction element or acoustic electric induction element are electrically connected with amplification shaping and switch trigger circuit input end, amplification shaping and The output terminal of the switch trigger circuit is electrically connected with the trigger terminal of the next group of electronic devices under test or the trigger shutdown terminal of the timer. 9. A test method adopting the test device as claimed in claim 1 to the speed of response of the fast response electronic device, the steps comprising: (1) adopt the test device to measure the total response time T of N groups of response modules, N≥2; (2) Use formula ① or formula ②, formula ③ to calculate the response time T _i of each electronic device under test; T＝(T _i +T _K )×N ① T＝(T _i +T _K +T _G )×N ② T＝T _i ×N ③ In the formula, T _K is the response time of the amplification and shaping and switch trigger circuit, and T _G is the response time of the photoelectric sensing element or the acoustic and electric sensing element, where T _G is known. 10 . The method for testing the response speed of fast-response electronic devices according to claim 9 , wherein the step (2) further includes testing the response time T _K of the amplification and shaping and switch trigger circuit. 11 . 11. the method for testing of fast response electronic device response speed according to claim 10, it is characterized in that, described test amplification shaping and switch trigger circuit response time T _K are the trigger opening of timer, trigger off respectively with amplification shaping and the input terminal and output terminal of the switch trigger circuit are electrically connected, and the amplification and shaping and the response time T _K of the switch trigger circuit are tested.

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